JPWO2020170069A1 - - Google Patents
Info
- Publication number
- JPWO2020170069A1 JPWO2020170069A1 JP2021501130A JP2021501130A JPWO2020170069A1 JP WO2020170069 A1 JPWO2020170069 A1 JP WO2020170069A1 JP 2021501130 A JP2021501130 A JP 2021501130A JP 2021501130 A JP2021501130 A JP 2021501130A JP WO2020170069 A1 JPWO2020170069 A1 JP WO2020170069A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/12015—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising clock generation or timing circuitry
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/025—Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B99/00—Subject matter not provided for in other groups of this subclass
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4097—Bit-line organisation, e.g. bit-line layout, folded bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0403—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals during or with feedback to manufacture
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0411—Online error correction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/70—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates the floating gate being an electrode shared by two or more components
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Security & Cryptography (AREA)
- Semiconductor Memories (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019030525 | 2019-02-22 | ||
PCT/IB2020/051043 WO2020170069A1 (ja) | 2019-02-22 | 2020-02-11 | エラー検出機能を有する記憶装置、半導体装置、および、電子機器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2020170069A1 true JPWO2020170069A1 (ja) | 2020-08-27 |
JPWO2020170069A5 JPWO2020170069A5 (ja) | 2023-01-31 |
Family
ID=72144818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021501130A Pending JPWO2020170069A1 (ja) | 2019-02-22 | 2020-02-11 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20220085019A1 (ja) |
JP (1) | JPWO2020170069A1 (ja) |
KR (1) | KR20210130734A (ja) |
CN (1) | CN113424310A (ja) |
WO (1) | WO2020170069A1 (ja) |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012256821A (ja) | 2010-09-13 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 記憶装置 |
KR101912223B1 (ko) * | 2011-08-16 | 2019-01-04 | 삼성전자주식회사 | 적층 자기 램 장치 및 이를 포함하는 메모리 시스템 |
US9013921B2 (en) * | 2012-12-06 | 2015-04-21 | Samsung Electronics Co., Ltd. | Semiconductor memory device |
US9424953B2 (en) * | 2013-06-20 | 2016-08-23 | Samsung Electronics Co., Ltd. | Semiconductor memory device including repair circuit |
US9362007B2 (en) * | 2013-06-20 | 2016-06-07 | Samsung Electronics Co., Ltd. | Semiconductor memory device |
JP2015053096A (ja) * | 2013-09-09 | 2015-03-19 | マイクロン テクノロジー, インク. | 半導体装置、及び誤り訂正方法 |
US9583177B2 (en) * | 2014-12-10 | 2017-02-28 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and semiconductor device including memory device |
KR20230003301A (ko) * | 2015-02-26 | 2023-01-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 메모리 시스템 및 정보 처리 시스템 |
US9728243B2 (en) * | 2015-05-11 | 2017-08-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device or electronic component including the same |
JP6901831B2 (ja) * | 2015-05-26 | 2021-07-14 | 株式会社半導体エネルギー研究所 | メモリシステム、及び情報処理システム |
KR102336458B1 (ko) * | 2015-07-30 | 2021-12-08 | 삼성전자주식회사 | 고속으로 결함 비트 라인을 검출하는 불휘발성 메모리 장치 및 그것의 테스트 시스템 |
KR102424702B1 (ko) * | 2015-11-19 | 2022-07-25 | 삼성전자주식회사 | 불휘발성 메모리 모듈 및 이를 포함하는 전자 장치 |
US10097207B2 (en) * | 2016-03-10 | 2018-10-09 | Toshiba Memory Corporation | ECC circuit, storage device and memory system |
KR102636039B1 (ko) * | 2016-05-12 | 2024-02-14 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 그것의 읽기 방법 및 카피백 방법 |
US10263119B2 (en) * | 2016-09-23 | 2019-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Programmable device with high reliability for a semiconductor device, display system, and electronic device |
KR102648774B1 (ko) * | 2016-11-10 | 2024-03-19 | 에스케이하이닉스 주식회사 | 랜더마이즈 동작을 수행하는 반도체 메모리 장치 |
-
2020
- 2020-02-11 KR KR1020217028191A patent/KR20210130734A/ko unknown
- 2020-02-11 JP JP2021501130A patent/JPWO2020170069A1/ja active Pending
- 2020-02-11 CN CN202080014345.6A patent/CN113424310A/zh active Pending
- 2020-02-11 WO PCT/IB2020/051043 patent/WO2020170069A1/ja active Application Filing
- 2020-02-11 US US17/419,745 patent/US20220085019A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2020170069A1 (ja) | 2020-08-27 |
US20220085019A1 (en) | 2022-03-17 |
KR20210130734A (ko) | 2021-11-01 |
CN113424310A (zh) | 2021-09-21 |
Similar Documents
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