WO2018033011A1 - 阵列基板的制作方法及显示面板、显示装置 - Google Patents

阵列基板的制作方法及显示面板、显示装置 Download PDF

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WO2018033011A1
WO2018033011A1 PCT/CN2017/096775 CN2017096775W WO2018033011A1 WO 2018033011 A1 WO2018033011 A1 WO 2018033011A1 CN 2017096775 W CN2017096775 W CN 2017096775W WO 2018033011 A1 WO2018033011 A1 WO 2018033011A1
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semiconductor layer
source
forming
layer
contact
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PCT/CN2017/096775
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English (en)
French (fr)
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陈江博
杜建华
王国英
刘威
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京东方科技集团股份有限公司
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Priority to US15/737,277 priority Critical patent/US10644162B2/en
Publication of WO2018033011A1 publication Critical patent/WO2018033011A1/zh

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    • H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
    • H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
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    • H01L27/1259—Multistep manufacturing methods
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    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
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    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
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    • H01L29/78633—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device with a light shield
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    • H01L29/78693—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate the semiconducting oxide being amorphous
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    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
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Definitions

  • the present disclosure relates to the field of display technologies, and in particular, to a method for fabricating an array substrate, a display panel, and a display device.
  • oxide transistor technology has the characteristics of high mobility and good uniformity.
  • the intermediate dielectric layer is dry etched to form via holes for connecting the semiconductor layers, and source and drain electrodes connected to the semiconductor layer through the via holes are formed.
  • the third is to increase the number of via holes;
  • the fourth is to insert a transition layer on the semiconductor layer;
  • the fifth is to replace the material of the source and drain electrodes.
  • the situation that the design of the via holes in the array substrate has been determined cannot be improved by the above three methods; the method of inserting the transition layer not only increases the risk of affecting the yield, but also increases the production cost accordingly;
  • the material for replacing the source and drain electrodes for the medium and large size AMOLED driven display device, the aluminum wire or the copper Cu is generally used for the wiring, so that there are very few materials to be replaced. Therefore, the prior art cannot improve the resistance generated by the contact of the source/drain electrode with the semiconductor layer in the case where the design for the via hole and the material of the source and drain electrodes are both determined.
  • Embodiments of the present disclosure provide an improved method of fabricating an array substrate, a display panel, and a display device.
  • an embodiment of the present disclosure provides a method of fabricating an array substrate, including:
  • a source/drain electrode connected to the semiconductor layer through the via hole is formed on the intermediate dielectric layer.
  • the exposed regions of the semiconductor layer are subjected to plasma bombardment through the via holes, so that oxygen atoms in the semiconductor layer are bombarded by atomic impact of the plasma to form more oxygen.
  • the vacancy defect increases the concentration of electron carriers and reduces the resistance generated by the contact between the source and drain electrodes formed later and the semiconductor layer, thereby increasing the on-state current of the transistor.
  • the material forming the semiconductor layer is determined according to a preset contact resistance, wherein the contact resistance is a resistance generated by contact of the source drain electrode with the semiconductor layer.
  • the semiconductor layer can be formed by using a material having a low oxygen content, thereby further reducing the electric resistance generated by the contact of the source/drain electrode with the semiconductor layer.
  • the time of the plasma bombardment is inversely related to the contact resistance, wherein the contact resistance is a resistance generated by contact of the source drain electrode with the semiconductor layer.
  • the flow rate of the plasma bombardment is inversely related to the contact resistance, wherein the contact resistance is a resistance generated by contact of the source drain electrode with the semiconductor layer.
  • the intensity of the plasma bombardment is inversely related to the contact resistance, wherein the contact resistance is a resistance generated by contact of the source drain electrode with the semiconductor layer.
  • the resistance of the plasma bombardment process can be increased by increasing the time of plasma bombardment, increasing the intensity of the plasma bombardment process, and further reducing the resistance generated by the contact of the source and drain electrodes with the semiconductor layer.
  • the semiconductor layer is formed of amorphous InGaZnO, and the oxygen content of the amorphous InGaZnO is negatively correlated with the contact resistance, wherein the contact resistance is a resistance generated by contact of the source/drain electrode with the semiconductor layer .
  • the gas used for the plasma bombardment is helium, nitrogen, Ammonia or hydrogen.
  • the plasma bombardment process is helium plasma bombardment
  • the helium plasma bombardment free radical will not diffuse into the channel region of the semiconductor layer, so the plasma bombards the diffusion of the radical in the semiconductor layer after plasma bombardment.
  • the problem is greatly reduced, thereby further reducing the resistance generated by the contact of the source and drain electrodes with the semiconductor layer.
  • forming vias in the intermediate dielectric layer includes dry etching the intermediate dielectric layer by carbon tetrafluoride and oxygen.
  • the intermediate dielectric layer is formed to have a thickness greater than or equal to about 100 nanometers and less than or equal to about 500 nanometers.
  • the method further comprises: forming a source-drain region in the uncovered region of the semiconductor layer, the source-drain region leaking through the source The pole receives an external electrical signal.
  • the method prior to forming the semiconductor layer, the method further includes forming a light shielding layer on the base substrate.
  • the method before forming the semiconductor layer and after forming the light shielding layer, the method further includes forming a buffer layer on the light shielding layer.
  • the method further includes forming a passivation layer on the source and drain electrodes.
  • an embodiment of the present disclosure provides a display panel including: an array substrate fabricated by the above method.
  • the exposed regions of the semiconductor layer are subjected to plasma bombardment through the via holes, so that oxygen atoms in the semiconductor layer are bombarded by atomic impact of the plasma to form more Oxygen vacancy defects, thereby increasing the concentration of electron carriers, reducing the resistance generated by the contact between the source and drain electrodes formed later and the semiconductor layer, thereby increasing the on-state current of the transistor.
  • an embodiment of the present disclosure provides a display device including the above display panel.
  • the exposed regions of the semiconductor layer are subjected to plasma bombardment through the via holes, so that oxygen atoms in the semiconductor layer are bombarded by atomic impact of the plasma to form more Oxygen vacancy defects, thereby increasing the concentration of electron carriers, reducing the resistance generated by the contact between the source and drain electrodes formed later and the semiconductor layer, thereby increasing the on-state current of the transistor.
  • FIG. 1 is a schematic flow chart of a method for fabricating an array substrate according to an embodiment of the present disclosure
  • FIG. 2 is a schematic structural view of an array substrate after forming a semiconductor layer in a preparation process according to an embodiment of the present disclosure
  • FIG. 3 is a schematic structural view of an array substrate after forming a gate metal layer in a preparation process according to an embodiment of the present disclosure
  • FIG. 4 is a schematic structural view of an array substrate after forming an intermediate dielectric layer and via holes in a preparation process according to an embodiment of the present disclosure
  • FIG. 5 is a schematic structural diagram of an array substrate according to an embodiment of the present disclosure.
  • Embodiments of the present disclosure provide a method for fabricating an array substrate, a display panel, and a display device, wherein a plasma bombardment is performed on a region exposed by the semiconductor layer through the via hole before the source/drain electrode is formed, so that an atomic impact by the plasma is performed. Oxygen atoms in the semiconductor layer are bombarded to form more oxygen vacancy defects, thereby increasing the concentration of electron carriers, reducing the resistance generated by the contact between the source-drain electrodes and the semiconductor layer formed later, thereby increasing the transistor On-state current.
  • an embodiment of the present disclosure provides a method for fabricating an array substrate, the method comprising:
  • step S101 a semiconductor layer, a gate insulating layer, a gate electrode, and an intermediate dielectric layer are sequentially formed on the base substrate;
  • step S102 a via hole is formed in the intermediate dielectric layer to expose a portion of the semiconductor layer
  • step S103 a portion of the exposed semiconductor layer in the via is subjected to plasma bombardment
  • step S104 source and drain electrodes connected to the semiconductor layer through the via holes are formed on the intermediate dielectric layer.
  • step S101 includes:
  • a Shield Layer 202 is deposited by a sputtering method or an evaporation method, and the light shielding layer 202 is patterned as needed, wherein the thickness of the light shielding layer is greater than or equal to 50 Nano and less than or equal to 400 nanometers;
  • a buffer layer 203 is formed on the formed light shielding layer 202 by a plasma enhanced chemical vapor deposition (PECVD) process, wherein the buffer layer has a thickness greater than or equal to 100 nm and less than Or equal to 500 nanometers;
  • PECVD plasma enhanced chemical vapor deposition
  • the semiconductor layer 204 is deposited by a sputtering process, and the formed semiconductor layer 204 is patterned as needed, wherein the thickness of the semiconductor layer 204 is greater than or equal to 10 nm and less than or equal to 100.
  • a gate insulating layer 205 is formed by a plasma enhanced chemical vapor deposition process, wherein the thickness of the gate insulating layer is greater than or equal to 100 nm and less than or equal to 500 nm, and a gate is formed
  • the material of the insulating layer is silicon oxide SiOx;
  • a gate metal layer 206 is deposited by a sputtering method or an evaporation method, and the formed gate metal layer 206 is patterned as needed, wherein the thickness of the gate metal layer Is greater than or equal to 50 nanometers and less than or equal to 400 nanometers;
  • the gate insulating layer 205 and the gate metal layer 206 are patterned, and the exposed region of the semiconductor layer 204 is processed to obtain the source and drain regions 2041 of the thin film transistor, which are blocked by the gate insulating layer 205 and the gate metal layer 206.
  • the area of the unprocessed semiconductor layer 204 is the channel region 2042 of the thin film transistor. This treatment may include ion implantation or plasma bombardment or the like.
  • the ratio of the flow rate of oxygen to the sum of the flow rates of oxygen and argon is in the range of 0% to 50%, and the thickness of the deposited semiconductor layer ranges from 2 nm to ⁇ . 200 nanometers. Specifically, when the ratio of the flow rate of oxygen to the sum of the flow rates of oxygen and argon is 5%, the deposited semiconductor layer is optimal, and deposited at this time. The thickness of the obtained semiconductor layer was 40 nm.
  • the thickness of the deposited semiconductor layer is related to the pressure, power, and number of deposition scans of the chamber in which the film is deposited.
  • the pressure of the cavity of the device for depositing the film is 0.63 Pa (Pa)
  • the power of the device is 4500 watts (W)
  • the number of deposition scans is 5, and the flow rate of argon is set to 100 mL per minute (SCCM).
  • SCCM the thickness of the semiconductor layer is 40 nm, that is, the optimum thickness.
  • the chamber of the apparatus for depositing the film has a pressure in the range of 0.01 Pa to 100 Pa, the power of the apparatus ranges from 1 kW to 10 kW, and the number of deposition scans ranges from 1 to 30 times.
  • the argon flow rate is set to range from 0 ml per minute to 500 ml per minute, and the oxygen flow rate is set to range from 0 ml per minute to 500 ml per minute, and the above parameters are all related to the equipment for depositing the film.
  • step S102 includes:
  • an intermediate dielectric layer 207 is formed by a plasma enhanced chemical vapor deposition process, and the intermediate dielectric layer 207 is patterned as needed, wherein the intermediate medium
  • the thickness of the layer is greater than or equal to 100 nanometers and less than or equal to 500 nanometers, and the material forming the intermediate dielectric layer is silicon oxide SiOx;
  • the intermediate dielectric layer 207 is dry etched using carbon tetrafluoride and oxygen until portions of the semiconductor layer 204 are exposed, thereby forming vias 208.
  • the electrical properties of the underlying semiconductor layer 204 will be reduced such that the contact resistance when contacted with the source and drain electrodes is increased, and therefore, the semiconductor layer 204 needs to be further advanced. deal with.
  • a portion of the exposed semiconductor layer 204 is subjected to a plasma bombardment process through the via 208, that is, step S103 is performed.
  • the plasma bombardment process is helium (He) plasma bombardment or nitrogen (N 2 ) plasma bombardment or ammonia gas (NH 3 ) plasma bombardment or hydrogen (H 2 ) plasma bombardment.
  • step S104 includes:
  • source and drain electrode metal is deposited by sputtering, and source and drain electrode metal is patterned as needed to form source and drain electrode 209, and source and drain electrode 209 passes through via 208 and source of semiconductor layer 204.
  • the drain region 2041 is connected, wherein the source leakage
  • the thickness of the pole is greater than or equal to 50 nanometers and less than or equal to 400 nanometers.
  • the method may further include:
  • a passivation layer 210 is formed on the source/drain electrode 209 by plasma enhanced chemical vapor deposition, and the passivation layer 210 is patterned as needed, wherein the passivation layer has a thickness greater than or equal to 200 nm and less than Or equal to 400 nm, and the material forming the passivation layer is silicon oxide SiOx or silicon nitride SiNx.
  • Plasma treatment is a plasma bombardment process; Different is a specific operating condition; Slot is the experimental number; Avg. is the average value of the contact resistance; Max is the maximum value of the contact resistance; Min is the minimum value of the contact resistance; Uniformity is uniformity, Used to indicate the stability of the process steps; 3 ⁇ is the derived value of the experimental data; CF4+02 is the dry etching of the intermediate dielectric layer with carbon tetrafluoride and oxygen; OE 30s is treated by dry etching for 30 seconds; He used a helium plasma bombardment process to treat the exposed portion of the semiconductor layer in the via; InGaZnO 20% 10s is a helium gas bombardment process for the semiconductor layer for 10 seconds, wherein the material of the semiconductor layer is oxygen content 20% amorphous InGaZnO.
  • the contact resistance of the source/drain electrode 209 and the overetched region 301 is greater than or equal to 15570. Ohmic, and less than or equal to 16410 ohms, and the average value of the contact resistance is 16064 ohms.
  • the intermediate dielectric layer is dry etched for 30 seconds, a portion of the exposed semiconductor layer 204 in the via hole is subjected to helium plasma bombardment treatment through the via 208 for 10 seconds, at which time the source drain electrode 209 and the overetch region 301
  • the contact resistance is greater than or equal to 1425 ohms and less than or equal to 1494 ohms, and the average contact resistance is 1460 ohms.
  • the contact resistance between the source/drain electrode and the semiconductor layer is reduced by an order of magnitude compared to the contact resistance when no helium gas bombardment is performed. This increases the on-state current of the transistor.
  • the contact resistance between the source/drain electrode 209 and the overetch region 301 is greater than or Equal to 997 ohms and less than or equal to 1078 ohms, and the average value of the contact resistance is 1026 ohms.
  • the time during which the semiconductor layer is subjected to the plasma bombardment process through the via exposed region is negatively correlated with the contact resistance within a certain range.
  • the time of the plasma bombardment process ranges from 0 seconds to 300 seconds, wherein the contact resistance is a resistance generated by contact of the source/drain electrodes with the semiconductor layer. It has been confirmed that the plasma bombardment process works best when the plasma bombardment process is performed for a portion of the exposed semiconductor layer in the via hole for 40 seconds, that is, after the plasma bombardment process, the contact between the source and drain electrodes and the semiconductor layer is generated. The resistance is minimal.
  • the same dry etching is performed for 30 seconds, and the portion of the semiconductor layer exposed in the via hole is also subjected to helium gas bombardment treatment for 30 seconds through the via hole, but the oxygen content of the amorphous InGaZnO for forming the semiconductor layer is different, The contact resistance between the source/drain electrode 209 and the overetched region 301 will also be different.
  • the oxygen content of the amorphous InGaZnO for forming the semiconductor layer is negatively correlated with the contact resistance in a range, wherein the contact resistance is a resistance generated by the contact of the source/drain electrode with the semiconductor layer. .
  • the contact resistance is also inversely related to the flow rate of the plasma bombardment process, wherein the flow rate of the helium plasma bombardment process ranges from 0 ml per minute to 500 ml per minute. When the flow rate of the helium plasma bombardment process is 200 ml per minute, the resistance generated by the contact of the source and drain electrodes with the semiconductor layer is minimized.
  • the chamber of the apparatus for reactive ion etching has a pressure in the range of 0 mTorr to 1000 mTorr and a power range of 0 watts to 1000 watts.
  • the plasma bombardment process has the best effect, that is, after the plasma bombardment process, the contact between the source and drain electrodes and the semiconductor layer is generated.
  • the resistance is minimal.
  • the amorphous InGaZnO is a wide band gap oxide semiconductor material
  • the resistance generated by contact with the source/drain electrodes is a Schottky contact, and the contact resistance is large.
  • the exposed portion of the semiconductor layer is subjected to plasma bombardment through via holes in the intermediate dielectric layer, so that oxygen atoms inside the amorphous InGaZnO are bombarded by atomic impact of the plasma to form more oxygen vacancy defects. Since the oxygen vacancy defect in the oxide is a donor defect, an increase in oxygen vacancies increases the concentration of electron carriers, thereby reducing the resistance generated by the contact of the source and drain electrodes with the semiconductor layer, thereby increasing the on-state current of the transistor.
  • Embodiments of the present disclosure provide a display panel including: an array substrate fabricated by the above method.
  • a display device provided by an embodiment of the present disclosure includes the above display panel.
  • the embodiments of the present disclosure provide a method for fabricating an array substrate, a display panel, and a display device, wherein plasma bombardment is performed on a portion of the exposed semiconductor layer in the via hole through a via hole in the intermediate dielectric layer, so that plasma is passed through the plasma.
  • the atomic impact of the body bombards the oxygen atoms in the semiconductor layer to form more oxygen vacancy defects, thereby increasing the concentration of electron carriers and reducing the resistance generated by the contact between the source and drain electrodes and the semiconductor layer, thereby increasing The on-state current of the transistor.
  • embodiments of the present disclosure can be provided as a method, system, or computer program product. Accordingly, the present disclosure may take the form of an entirely hardware embodiment, an entirely software embodiment, or a combination of software and hardware aspects. Moreover, the present disclosure may take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage and optical storage, etc.) including computer usable program code.
  • the computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture comprising the instruction device.
  • the apparatus implements the functions specified in one or more blocks of a flow or a flow and/or block diagram of the flowchart.
  • These computer program instructions can also be loaded onto a computer or other programmable data processing device such that a series of operational steps are performed on a computer or other programmable device to produce computer-implemented processing for execution on a computer or other programmable device.
  • the instructions provide steps for implementing the functions specified in one or more of the flow or in a block or blocks of a flow diagram.

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Abstract

一种阵列基板的制作方法及显示面板、显示装置，制作方法包括：在衬底基板（201）上依次形成半导体层（204）、栅极绝缘层（205）、栅极（206）以及中间介质层（207）；在中间介质层（207）中形成过孔（208）以暴露半导体层（204）的部分；对过孔（208）内暴露的半导体层（204）的部分进行等离子轰击；在中间介质层（207）上形成通过过孔（208）与半导体层（204）相连的源漏极（209）。

Description

阵列基板的制作方法及显示面板、显示装置
相关申请
本申请要求享有2016年8月19日提交的中国专利申请No.201610696449.5的优先权，其全部公开内容通过引用并入本文。
技术领域
本公开涉及显示技术领域，尤其涉及阵列基板的制作方法及显示面板、显示装置。
背景技术
氧化物晶体管技术作为现阶段的一个技术热点，具有迁移率高、均匀性好等特点。然而，在制作包括氧化物晶体管的阵列基板时，会对中间介质层进行干法刻蚀以形成用于连接半导体层的过孔，并且形成通过该过孔与半导体层相连的源漏电极。目前改善由源漏电极与半导体层的接触所产生的电阻的方式主要有以下几种，其一为改变过孔的大小；其二为改变过孔的形状；其三为增加过孔的数量；其四为在所述半导体层上插入过渡层；其五为更换源漏电极的材料。
然而，对于阵列基板中的过孔的设计方案已确定的情况，均无法通过上述前三种方法改善；插入过渡层的方法不仅将增大影响良率的风险，也会相应地提高生产成本；而更换源漏电极的材料的改善方法，对于中大尺寸的AMOLED驱动的显示装置，走线一般选用铝Al或铜Cu，因此可供选择更换的材料非常少。因此，现有技术无法在针对过孔的设计方案与源漏电极的材料均已确定的情况下，对由源漏电极与半导体层的接触所产生的电阻进行改善。
发明内容
本公开实施例提供了一种改进的阵列基板的制作方法及显示面板、显示装置。
根据本公开的一方面，本公开实施例提供了一种阵列基板的制作方法，包括：
在衬底基板上依次形成半导体层、栅极绝缘层、栅极以及中间介 质层；
在所述中间介质层中形成过孔以暴露所述半导体层的部分；
对所述过孔内暴露的半导体层的部分进行等离子轰击；
在所述中间介质层上形成通过所述过孔与所述半导体层相连的源漏电极。
本公开实施例中，在形成源漏电极之前，通过过孔对半导体层暴露的区域进行等离子轰击，使得通过等离子体的原子撞击，将半导体层中的氧原子轰击出来，以形成更多的氧空位缺陷，从而提高电子载流子的浓度，降低由之后形成的源漏电极与半导体层的接触所产生的电阻，因而增大晶体管的开态电流。
根据一些实施例，形成所述半导体层的材料根据预设的接触电阻来确定，其中，所述接触电阻为由所述源漏电极与所述半导体层的接触所产生的电阻。
在本公开实施例中，可通过采用含氧量低的材料来形成半导体层，从而进一步降低由源漏电极与半导体层的接触产生的电阻。
根据一些实施例，所述等离子轰击的时间与接触电阻呈负相关，其中，所述接触电阻为由所述源漏电极与所述半导体层的接触产生的电阻。
根据一些实施例，所述等离子轰击的流量与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
根据一些实施例，所述等离子轰击的强度与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
在本公开实施例中，可通过延长等离子轰击的时间，增大等离子轰击工艺的流量，增加等离子轰击工艺的强度，进一步实现降低由源漏电极与半导体层的接触产生的电阻。
根据一些实施例，半导体层由非晶体InGaZnO形成，并且非晶体InGaZnO的含氧量与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
根据一些实施例，所述等离子轰击所采用的气体为氦气、氮气、 氨气或氢气。
在本公开实施例中，若等离子轰击工艺为氦气等离子轰击，则氦气等离子轰击自由基将不会扩散到半导体层的沟道区，因此等离子轰击后等离子轰击自由基在半导体层中的扩散问题会大大减弱，从而进一步降低由源漏电极与半导体层的接触产生的电阻。
根据一些实施例，在所述中间介质层中形成过孔，包括：通过四氟化碳和氧气对所述中间介质层进行干法刻蚀。
根据一些实施例，形成的所述中间介质层的厚度大于或等于大约100纳米且小于或等于大约500纳米。
根据一些实施例，在形成栅极之后并且在形成中间介质层之前，该方法还包括：在所述半导体层中未被覆盖的区域中形成源漏区，所述源漏区通过所述源漏电极接收外部电信号。
根据一些实施例，在形成半导体层之前，该方法还包括：在所述衬底基板上，形成遮光层。
根据一些实施例，在形成半导体层之前并且在形成遮光层之后，该方法还包括：在所述遮光层上，形成缓冲层。
根据一些实施例，在形成源漏电极之后，该方法还包括：在所述源漏电极上，形成钝化层。
根据本公开的另一方面，本公开实施例提供了一种显示面板，包括：通过上述的方法制作的阵列基板。
在本公开实施例中，在形成源漏电极之前，通过过孔对半导体层暴露的区域进行等离子轰击，使得通过等离子体的原子撞击，将半导体层中的氧原子轰击出来，以形成更多的氧空位缺陷，从而提高电子载流子的浓度，降低由之后形成的源漏电极与半导体层的接触产生的电阻，因而增大晶体管的开态电流。
根据本公开的又一方面，本公开实施例提供了一种显示装置，包括：上述的显示面板。
在本公开实施例中，在形成源漏电极之前，通过过孔对半导体层暴露的区域进行等离子轰击，使得通过等离子体的原子撞击，将半导体层中的氧原子轰击出来，以形成更多的氧空位缺陷，从而提高电子载流子的浓度，降低由之后形成的源漏电极与半导体层的接触产生的电阻，因而增大晶体管的开态电流。
附图说明
图1为本公开实施例提供的一种阵列基板的制作方法的流程示意图；
图2为本公开实施例提供的阵列基板在制备过程中形成半导体层后的结构示意图；
图3为本公开实施例提供的阵列基板在制备过程中形成栅极金属层后的结构示意图；
图4为本公开实施例提供的阵列基板在制备过程中形成中间介质层和过孔后的结构示意图；
图5为本公开实施例提供的一种阵列基板的结构示意图。
具体实施方式
本公开实施例提供了一种阵列基板的制作方法及显示面板、显示装置，其中，在形成源漏电极之前，通过过孔对半导体层暴露的区域进行等离子轰击，使得通过等离子体的原子撞击，将半导体层中的氧原子轰击出来，以形成更多的氧空位缺陷，从而提高电子载流子的浓度，降低由之后形成的源漏电极与半导体层的接触产生的电阻，因而增大晶体管的开态电流。
下面将结合本公开实施例中的附图，对本公开中的技术方案进行清楚、完整地描述，显然，所描述的实施例是本公开一部分实施例，而不是全部的实施例。基于本公开中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本公开保护的范围。
参见图1，本公开实施例提供了一种阵列基板的制作方法，该方法包括：
在步骤S101中，在衬底基板上依次形成半导体层、栅极绝缘层、栅极以及中间介质层；
在步骤S102中，在所述中间介质层中形成过孔以暴露所述半导体层的部分；
在步骤S103中，对所述过孔内暴露的半导体层的部分进行等离子 轰击；
在步骤S104中，在所述中间介质层上形成通过所述过孔与所述半导体层相连的源漏电极。
具体地，参见图2和图3，步骤S101包括：
通过标准方法对衬底基板(例如，玻璃衬底)201进行清洗；
在所述衬底基板201上，通过溅射法或蒸镀法沉积遮光层(Shield Layer)202，并根据需要对遮光层202进行图案化，其中，所述遮光层的厚度为大于或等于50纳米且小于或等于400纳米；
在形成的遮光层202上，利用等离子体增强化学气相沉积(Plasma Enhanced Chemical Vapor Deposition，PECVD)工艺形成缓冲层(Buffer Layer)203，其中，所述缓冲层的厚度为大于或等于100纳米且小于或等于500纳米；
在形成的缓冲层203上，利用溅射工艺沉积半导体层204，并根据需要对形成的半导体层204进行图案化，其中，所述半导体层204的厚度为大于或等于10纳米且小于或等于100纳米；
在形成的半导体层204上，利用等离子体增强化学气相沉积工艺形成栅极绝缘层205，其中，所述栅极绝缘层的厚度为大于或等于100纳米且小于或等于500纳米，并且形成栅极绝缘层的材料为氧化硅SiOx；
在形成的栅极绝缘层205上，通过溅射法或蒸镀法沉积栅极金属层206，并根据需要对形成的栅极金属层206进行图案化，其中，所述栅极金属层的厚度为大于或等于50纳米且小于或等于400纳米；
对栅极绝缘层205与栅极金属层206进行图案化，并对半导体层204的裸露区域进行处理，从而得到薄膜晶体管的源漏区2041，由栅极绝缘层205与栅极金属层206遮挡的、未被处理的半导体层204的区域为薄膜晶体管的沟道区2042。该处理可以包括离子注入或等离子轰击等。
在示例性实施例中，在进行半导体层沉积时，氧气的流量与氧气和氩气流量的总和的比值的范围为0％～50％，此时沉积得到的半导体层的厚度范围为2纳米～200纳米。具体地，当氧气的流量与氧气和氩气流量的总和的比值为5％时，沉积得到的半导体层最佳，此时沉积得 到的半导体层的厚度为40纳米。
此外，沉积得到的半导体层的厚度与沉积成膜的设备的腔体的压强、功率，以及沉积扫描的次数相关。当沉积成膜的设备的腔体的压强为0.63帕(Pa)，设备的功率为4500瓦(W)，且沉积扫描的次数为5次，氩气流量设定为100毫升每分钟(SCCM)，氧气流量设定为0.13毫升每分钟(SCCM)时，半导体层的厚度为40纳米，即最佳厚度。在示例性实施例中，沉积成膜的设备的腔体的压强的范围为0.01帕～100帕，设备的功率的范围为1千瓦～10千瓦，沉积扫描的次数的范围为1次～30次，设定氩气流量的范围为0毫升每分钟～500毫升每分钟，设定氧气流量的范围为0毫升每分钟～500毫升每分钟，且上述参数均与沉积成膜的设备相关。
参见图4，步骤S102包括：
在所述栅极金属层206上，利用等离子体增强化学气相沉积工艺形成中间介质层207(Inter-Layer Insulators，ILD)，并根据需要对中间介质层207进行图案化，其中，所述中间介质层的厚度为大于或等于100纳米且小于或等于500纳米，并且形成中间介质层的材料为氧化硅SiOx；
在对中间介质层207进行图案化之后，采用四氟化碳和氧气对中间介质层207进行干法刻蚀，直至暴露所述半导体层204的部分，从而形成过孔208。
在形成中间介质层207和过孔208的过程中，下层的半导体层204的电学性质将有所降低，使得当与源漏电极接触时的接触电阻增大，因此，需要对半导体层204进行进一步处理。
具体地，在形成过孔208后，通过所述过孔208对暴露的半导体层204的部分(即图4中的圆圈301处)进行等离子轰击工艺，即执行步骤S103。所述等离子轰击工艺为氦气(He)等离子轰击或氮气(N2)等离子轰击或氨气(NH3)等离子轰击或氢气(H2)等离子轰击。
参见图5，步骤S104包括：
在中间介质层207上，通过溅射法沉积得到源漏电极金属，并根据需要对源漏电极金属进行图案化以形成源漏电极209，源漏电极209通过过孔208与半导体层204的源漏区2041相连，其中，所述源漏电 极的厚度为大于或等于50纳米且小于或等于400纳米。
在步骤S104之后，如图5所示，该方法还可以包括：
在源漏电极209上，利用等离子体增强化学气相沉积法形成钝化层210，并根据需要对钝化层210进行图案化，其中，所述钝化层的厚度为大于或等于200纳米且小于或等于400纳米，并且形成钝化层的材料为氧化硅SiOx或者氮化硅SiNx。
为便于理解，下面将通过实施例进一步对本公开的方案进行解释。
假设用于制备半导体层的材料为非晶体InGaZnO。具体实验数据参见以下的表1：
Figure PCTCN2017096775-appb-000001
表1
其中，Plasma treatment为等离子轰击工艺；Different为具体操作条件；Slot为实验编号；Avg.为接触电阻的平均值；Max为接触电阻的最大值；Min为接触电阻的最小值；Uniformity为均一性，用于表示工艺步骤的稳定性；3σ为实验数据的导出值；CF4+02为采用四氟化碳和氧气对中间介质层进行干法刻蚀；OE 30s为通过干法刻蚀处理30秒；He为采用氦气等离子轰击工艺对过孔内暴露的半导体层的部分进行处理；InGaZnO 20％10s为对半导体层进行氦气等离子轰击工艺10秒，其中，该半导体层的材料为含氧量为20％的非晶体InGaZnO。
若在对中间介质层进行图案化之后，只采用四氟化碳和氧气对中间介质层进行干法刻蚀30秒，则此时源漏电极209与过刻区域301的接触电阻大于或等于15570欧姆，且小于或等于16410欧姆，并且接触电阻的平均值为16064欧姆。
若在对中间介质层进行干法刻蚀30秒后，通过过孔208对过孔内暴露的半导体层204的部分进行氦气等离子轰击处理10秒，此时源漏电极209与过刻区域301的接触电阻大于或等于1425欧姆，且小于或等于1494欧姆，并且接触电阻的平均值为1460欧姆。
由此可知，通过对过孔内暴露的半导体层的部分进行氦气等离子轰击，源漏电极与半导体层之间的接触电阻相比未进行氦气等离子轰击时的接触电阻成数量级的减小，因而增大晶体管的开态电流。
针对相同的半导体层204，若通过过孔208对过孔内暴露的半导体层204的部分进行氦气等离子轰击处理30秒，此时源漏电极209与过刻区域301之间的接触电阻大于或等于997欧姆，且小于或等于1078欧姆，并且接触电阻的平均值为1026欧姆。
由此可知，对所述半导体层通过过孔暴露的区域进行等离子轰击工艺的时间与接触电阻在一定范围内负相关。具体地，等离子轰击工艺的时间的范围为0秒～300秒，其中所述接触电阻为由所述源漏电极与所述半导体层的接触产生的电阻。已经证实，当对过孔内暴露的半导体层的部分进行等离子轰击工艺的时间为40秒时等离子轰击工艺的效果最佳，即经过等离子轰击工艺后，由源漏电极与半导体层的接触产生的电阻最小。
若同样干法刻蚀30秒，且同样通过过孔对过孔内暴露的半导体层的部分进行氦气等离子轰击处理30秒，但用于形成半导体层的非晶体InGaZnO的含氧量不同，则源漏电极209与过刻区域301之间的接触电阻也将不同。实验证明，在上述工艺条件下，当非晶体InGaZnO的含氧量为20％时，接触电阻大于或等于997欧姆，且小于或等于1078欧姆，并且接触电阻的平均值为1026欧姆；当非晶体InGaZnO的含氧量为10％时，接触电阻大于或等于923.2欧姆，且小于或等于1038欧姆，并且接触电阻的平均值为963欧姆；当非晶体InGaZnO的含氧量为5％时，接触电阻大于或等于845欧姆，且小于或等于883.7欧姆，并且接触电阻的平均值为862欧姆。
由此可知，用于形成半导体层的非晶体InGaZnO的含氧量与接触电阻在一定范围内负相关，其中，所述接触电阻为由所述源漏电极与所述半导体层的接触产生的电阻。
接触电阻还与等离子轰击工艺的流量在一定范围内负相关，其中，氦气等离子轰击工艺的流量范围为0毫升每分钟～500毫升每分钟。当氦气等离子轰击工艺的流量为200毫升每分钟时，由源漏电极与半导体层的接触产生的电阻最小。
接触电阻与等离子轰击强度在一定范围内也负相关，即在一定范 围内随着反应离子刻蚀的设备的腔体的压强、功率的增大，由源漏电极与半导体层的接触产生的电阻将减小。具体地，反应离子刻蚀的设备的腔体的压强范围为0毫托～1000毫托，功率范围为0瓦～1000瓦。已经证实，当反应离子刻蚀的设备的腔体的压强为50毫托，功率为600瓦时等离子轰击工艺的效果最佳，即经过等离子轰击工艺后，由源漏电极与半导体层的接触产生的电阻最小。
在上述实施例中，由于非晶体InGaZnO为宽禁带氧化物半导体材料，因此与源漏电极接触产生的电阻为肖特基接触，接触电阻较大。通过中间介质层中的过孔对半导体层的暴露的部分进行等离子轰击，使得通过等离子体的原子撞击，将非晶体InGaZnO内部的氧原子轰击出来，形成更多的氧空位缺陷。由于氧化物中氧空位缺陷是施主缺陷，因此氧空位的增多将提高电子载流子的浓度，从而降低由源漏电极与半导体层的接触产生的电阻，因而增大晶体管的开态电流。
本公开实施例提供了一种显示面板，包括：通过上述的方法制作的阵列基板。
本公开实施例提供的一种显示装置，包括：上述的显示面板。
综上所述，本公开实施例提供了阵列基板的制作方法及显示面板、显示装置，其中通过通过中间介质层中的过孔对过孔内暴露的半导体层的部分进行等离子轰击，使得通过等离子体的原子撞击，将半导体层中的氧原子轰击出来，以形成更多的氧空位缺陷，从而提高电子载流子的浓度，降低由源漏电极与半导体层的接触产生的电阻，因而增大晶体管的开态电流。
本领域内的技术人员应明白，本公开的实施例可提供为方法、系统、或计算机程序产品。因此，本公开可采用完全硬件实施例、完全软件实施例、或结合软件和硬件方面的实施例的形式。而且，本公开可采用在一个或多个其中包含有计算机可用程序代码的计算机可用存储介质(包括但不限于磁盘存储器和光学存储器等)上实施的计算机程序产品的形式。
本公开是参照根据本公开实施例的方法、设备(系统)、和计算机程序产品的流程图和/或方框图来描述的。应理解可由计算机程序指令实现流程图和/或方框图中的每一流程和/或方框、以及流程图和/或方框图中的流程和/或方框的结合。可提供这些计算机程序指 令到通用计算机、专用计算机、嵌入式处理机或其他可编程数据处理设备的处理器以产生一个机器，使得通过计算机或其他可编程数据处理设备的处理器执行的指令产生用于实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的装置。
这些计算机程序指令也可存储在能引导计算机或其他可编程数据处理设备以特定方式工作的计算机可读存储器中，使得存储在该计算机可读存储器中的指令产生包括指令装置的制造品，该指令装置实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能。
这些计算机程序指令也可装载到计算机或其他可编程数据处理设备上，使得在计算机或其他可编程设备上执行一系列操作步骤以产生计算机实现的处理，从而在计算机或其他可编程设备上执行的指令提供用于实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的步骤。
显然，本领域的技术人员可以对本公开进行各种改动和变型而不脱离本公开的精神和范围。这样，倘若本公开的这些修改和变型属于本公开权利要求及其等同技术的范围之内，则本公开也意图包含这些改动和变型在内。

Claims (15)

  1. 一种阵列基板的制作方法，包括：
    在衬底基板上依次形成半导体层、栅极绝缘层、栅极以及中间介质层；
    在所述中间介质层中形成过孔以暴露所述半导体层的部分；
    对所述过孔内暴露的半导体层的部分进行等离子轰击；
    在所述中间介质层上形成通过所述过孔与所述半导体层相连的源漏电极。
  2. 根据权利要求1所述的方法，其中，形成所述半导体层的材料根据预设的接触电阻来确定，其中，所述接触电阻为由所述源漏电极与所述半导体层的接触产生的电阻。
  3. 根据权利要求1所述的方法，其中，所述等离子轰击的时间与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
  4. 根据权利要求1所述的方法，其中，半导体层由非晶体InGaZnO形成，并且非晶体InGaZnO的含氧量与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
  5. 根据权利要求1所述的方法，其中，所述等离子轰击的流量与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
  6. 根据权利要求1所述的方法，其中，所述等离子轰击的强度与接触电阻呈负相关，其中，所述接触电阻为所述源漏电极与所述半导体层的接触产生的电阻。
  7. 根据权利要求1所述的方法，其中，所述等离子轰击所采用的气体为氦气、氮气、氨气或氢气。
  8. 根据权利要求1所述的方法，其中，在所述中间介质层中形成过孔，包括：
    通过四氟化碳和氧气对所述中间介质层进行干法刻蚀。
  9. 根据权利要求1所述的方法，其特征在于，形成的所述中间介质层的厚度大于或等于大约100纳米且小于或等于大约500纳米。
  10. 根据权利要求1所述的方法，其中，在形成栅极之后，并且在形成中间介质层之前，该方法还包括：
    在所述半导体层中未被覆盖的区域中形成源漏区，所述源漏区通过所述源漏电极接收外部电信号。
  11. 根据权利要求1所述的方法，其中，在形成半导体层之前，该方法还包括：在所述衬底基板上，形成遮光层。
  12. 根据权利要求11所述的方法，其中，在形成半导体层之前并且在形成遮光层之后，该方法还包括：在所述遮光层上，形成缓冲层。
  13. 根据权利要求1所述的方法，其中，在形成源漏电极之后，该方法还包括：在所述源漏电极上，形成钝化层。
  14. 一种显示面板，包括：通过权利要求1-13任一项所述的方法制作的阵列基板。
  15. 一种显示装置，包括：权利要求14所述的显示面板。
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