WO2017166387A1 - 显示基板、点灯设备及点灯测试探针对位检测方法 - Google Patents

显示基板、点灯设备及点灯测试探针对位检测方法 Download PDF

Info

Publication number
WO2017166387A1
WO2017166387A1 PCT/CN2016/082051 CN2016082051W WO2017166387A1 WO 2017166387 A1 WO2017166387 A1 WO 2017166387A1 CN 2016082051 W CN2016082051 W CN 2016082051W WO 2017166387 A1 WO2017166387 A1 WO 2017166387A1
Authority
WO
WIPO (PCT)
Prior art keywords
test pads
probe
test
lighting
misalignment
Prior art date
Application number
PCT/CN2016/082051
Other languages
English (en)
French (fr)
Inventor
曲毅
张国庆
孙志刚
杨红霞
包珊珊
王军
梁团
Original Assignee
京东方科技集团股份有限公司
鄂尔多斯市源盛光电有限责任公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 京东方科技集团股份有限公司, 鄂尔多斯市源盛光电有限责任公司 filed Critical 京东方科技集团股份有限公司
Priority to US15/515,280 priority Critical patent/US10670629B2/en
Publication of WO2017166387A1 publication Critical patent/WO2017166387A1/zh

Links

Images

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44—Testing lamps

Definitions

  • the present disclosure relates to the field of display technologies, and in particular, to a display substrate, a lighting device, and a lighting test probe alignment detecting method.
  • a display panel such as a liquid crystal display (LCD) display panel or an active-matrix organic light emitting diode (AMOLED) display panel needs to perform a plurality of inspection procedures during the production process.
  • a very important inspection procedure is to test the finished display substrate (Cell Test, ET) to confirm the presence of defects in the display substrate. ET is performed before the display substrate is not attached with a driver chip and a flexible circuit board for inputting a display signal.
  • the test process usually inputs a test signal to the display substrate through a lighting device to make the pixels appear color, and then observes each pixel one by one through the defect detecting device. This process is called a Light-on Test.
  • a test pad is generally disposed on the display substrate (usually an array substrate), and when the detection, the test probe of the lighting device is used to contact the test point on the test pad, and the The test point is connected to the signal line, so that the test probe and the test point can input a detection signal into the signal line to detect whether the display substrate has a defect.
  • a driving chip is disposed on an edge region of the display substrate, and a signal line connecting the driving chip and the pixel unit of the display substrate is disposed; a test pad is disposed on both sides of the driving chip, and the test pad is connected to the signal line .
  • Pin Miss is a device anomaly that often occurs when lighting is detected. Since the single lighting phenomenon cannot be distinguished as a display substrate product itself (display abnormality) or probe alignment abnormality, In the production, there are problems such as misjudgment and misjudgment of good products as defective products.
  • the method of confirming the misalignment of the probe is such that when the display image quality abnormality occurs, the inspector usually removes the display substrate from the machine, repositions it a plurality of times, and confirms whether the probe alignment is abnormal.
  • This method is time consuming and has low accuracy and is greatly affected by personnel proficiency.
  • the purpose of the present disclosure is to provide a display substrate, a lighting device, and a lighting test probe alignment detection method, which can increase the reliability without requiring additional inspection time, and reduce the risk of static electricity and product damage. .
  • a display substrate including: a display driving signal line; and at least one set of test pads, wherein each set of test pads includes: sequentially arranged and connected to the display driving signal line a plurality of lighting test pads; and two probes that are not connected to the display driving signal lines are misaligned with test pads, and the two probes are misaligned between the test pads. Further, the two probe misalignment test pads are respectively disposed at positions of both ends of the plurality of lighting test pads located in the same set of test pads.
  • the two probe misalignment test pads are disposed between two lighted test pads that are in an intermediate position with the same set of test pads.
  • a spacing between at least a portion of the test pads of the same set of test pads is a first pitch; and the probe is offset from the test pad and the closest test pad of the same set of test pads The spacing between the first spacing is the first spacing.
  • the at least one set of test pads includes a first set of test pads and a second set of test pads
  • the two probe misalignment test pads of the first set of test pads are respectively disposed at two ends of the plurality of lighting test pads of the first set of test pads; and the second group Two probe misalignment test pads in the test pads are disposed between the two lighting test pads in the middle of the second set of test pads.
  • test pads are misaligned and the test pads are connected by a metal film.
  • a lighting apparatus including at least one set of probes a pin for performing a lighting test on the display substrate as described above, each set of probes comprising: a lighting test probe for connecting to a plurality of lighting test pads included in a set of test pads; and A set of test pad includes a probe misalignment test pad connected probe misalignment detection probe, wherein each set of probes is arranged in the same manner as a corresponding set of test pads.
  • the lighting device further includes: a signal providing circuit connected to the probe misalignment detecting probe for supplying electrical signals of different voltages to two of the same set of test pads .
  • the lighting device includes: a signal generator with an overcurrent protection function connected to the lighting test probe and the probe misalignment detecting probe.
  • the electrical signal is a transient signal.
  • a lighting test probe alignment detecting method which performs a lighting test probe alignment detection on a display substrate as described above using a lighting device as described above; Methods include:
  • two probes electrically connected to the same set of test pads are misaligned on the test pads to simultaneously apply electrical signals of different voltages for a predetermined time. To detect if there is current passing between the two probe misalignment test pads in the same set of test pads;
  • electrical signals of different voltages are respectively applied to the two probe misalignment test pads of the short circuit connection in the same set of test pads, including:
  • One of the two probe misalignment test pads in the same set of test pads is misaligned.
  • One of the probes is placed on the test pad.
  • the electrical signal applied to the test pad is 0 volts, and a voltage is applied to the other probe misalignment test pad.
  • the electrical signal is 1 to 2 volts.
  • a signal generator with an overcurrent protection function in the lighting device is used to detect whether there is current passing between the two probe misalignment test pads of the short circuit connection in the same set of test pads;
  • the electrical signal is a transient signal
  • the preset time is an application time of the transient signal
  • the signal generator is coupled to the lighting test probe and the probe misalignment detection probe.
  • FIG. 1 is a schematic diagram showing the distribution structure of test pads of a display substrate provided by an embodiment of the present disclosure.
  • the display substrate, the lighting device, and the lighting test probe alignment are provided in the embodiment of the present disclosure for the technical problem that the probe misalignment abnormality cannot be accurately determined and time-consuming.
  • the detection method can automatically determine whether there is an abnormality of the probe pair dislocation and improve the inspection accuracy.
  • the display substrate 1 provided in the embodiment of the present disclosure includes: a display driving signal line and at least one set of test pads (Pad), wherein a plurality of test pads of the same group of test pads are sequentially arranged, for example, A plurality of test pads of the same set of test pads shown in FIG. 1 may be sequentially arranged along a predetermined direction; each set of test pads includes: a plurality of lighting test pads connected to the display driving signal lines (ET Pad) 100; each set of test pads further includes: two probe misalignment test pads (Dummy Pads) 200 not connected to the display driving signal lines, and electrical connections between the two probe misalignment test pads 200 .
  • E Pad display driving signal lines
  • Dummy Pads two probe misalignment test pads
  • the lighting device includes: at least one set of probes for performing a lighting test on the display substrate as described above, each set of probes including: lighting for connecting with the plurality of lighting test pads 100 The test probe 11; and the probe misalignment detection probe 12 for connection with the probe misalignment test pad 200; wherein each set of probes is arranged in the same manner as a corresponding set of test pads.
  • the lighting device further includes: connected to the probe misalignment detecting probe 12, A signal supply circuit that supplies electrical signals of different voltages to the two probes in the same set of test pads. It should be noted that, in FIG. 1, for the sake of clarity, only the two probe misalignment detecting probes 12 on the lower side are shown connected to the signal supply circuit, but virtually all of the probe misalignment detection probes 12 are Connected to the signal supply circuit.
  • the conventional display substrate and the lighting device are improved.
  • two additional test pins are provided in each of the original test pads for detecting whether the probe is misaligned.
  • the probe misplaces the test pad 200, and the probe misalignment test pad 200 is suspended, does not introduce the display area as a driving signal, and electrically connects the two probes in the same set of test pads to the test pad 200.
  • the lighting device has been improved, and a probe misalignment detecting probe 12 for corresponding connection with the probe misalignment test pad 200 is added to each of the original sets of probes of the lighting device and used for the same group.
  • the two probes in the test pad are misaligned.
  • the test pads 200 provide signal supply circuits for electrical signals of different voltages.
  • the arrangement of the probes on the lighting device is the same as the arrangement of the corresponding test pads on the display substrate, if the probe misalignment detection probe 12 and the probe misalignment detection pad are aligned correctly, It is determined that the lighting test probe 11 and the lighting test pad 100 are aligned normally. If the probe misalignment detecting probe 12 and the probe misalignment detecting pad are abnormally aligned, the lighting test probe 11 and the lighting test pad 100 may be determined. The bit is abnormal, that is, there is a problem of misalignment of the probe.
  • the display substrate provided by the embodiment of the present disclosure is subjected to probe alignment detection by using the lighting device provided by the embodiment of the present disclosure, and the specific method is:
  • the probe misalignment detecting probe 12 connected to the probe misalignment test pad 200 is used, and the two probes electrically connected to the same set of test pads are misaligned on the test pad 200 for a preset time simultaneously.
  • An electrical signal of a different voltage is applied to detect the presence of current between the two probe misalignment test pads 200 of the shorted connection in the same set of test pads.
  • the probe misalignment detecting probe 12 and the probe misalignment detecting pad 200 are aligned correctly, the probe misalignment detecting probe 12 and the probe misalignment detecting pad are normally connected, thereby, due to two of the same set of test pads
  • the probe misalignment detection pads 200 are electrically connected to each other, and a large current is passed between the two probe misalignment detection pads of different voltages.
  • the lighting device does not provide any display driving signal to the probe misalignment test pad 200, and the shorting design of the two probe misalignment test pads 200 has no effect on the lighting test.
  • the present disclosure improves the product design of the display substrate and the lighting device, and can automatically determine whether there is an abnormality of the misalignment of the probe by loading the electrical signal of the voltage, and prompting the misalignment of the probe when the probe is misaligned.
  • the inspector re-aligns the position, thereby eliminating the detection error caused by the misalignment of the probe, improving the inspection accuracy, enabling no additional inspection time during the lighting test, high reliability, and requiring no personnel to touch the display substrate. Operation to reduce the risk of static electricity and product damage.
  • the electrical signals of different voltages are simultaneously applied to the two probe misalignment test pads 200 that are short-circuited in the same set of test pads, specifically, One of the two probe misalignment test pads in the same set of test pads is misplaced.
  • One of the probe misalignment test pads 200 is applied with a voltage of 0 volts applied to the other probe misalignment test pad 200.
  • the electrical signal of the voltage is 1 to 2 volts.
  • the electrical signals of the voltages applied on the two probes misaligned on the test pads 200 in the same set of test pads may not be limited to the electrical signals of the above voltages, and only need to ensure short-circuit connections in the same set of test pads.
  • the two probes are misaligned to test that the electrical signals applied to the pads 200 are different in electrical signals.
  • the pre- The set time is the application time of a transient signal, and since the transient signal supply time is very short, it does not cause a short circuit effect on the display substrate and the lighting device.
  • a signal generator Power Generator Over Current Protection, PG OCP
  • the signal generator with overcurrent protection function is connected to the lighting test probe 11 and the probe misalignment detection probe 12, and can directly monitor the probe alignment detection by using the signal generator alarm with overcurrent protection function.
  • a signal generator with an overcurrent protection function in the lighting device is used to detect whether there is current passing between the two probe misalignment test pads 200 of the short circuit connection in the same set of test pads; When the signal generator with overcurrent protection alarms, it is judged that there is current passing between the two probe misalignment test pads 200 in the same set of test pads; when the signal with overcurrent protection function occurs When the device is not alarming, it is judged that no current flows between the two probe misalignment test pads 200 of the short circuit connection in the same group of test pads. It should be noted that, in FIG.
  • a lighting generator connected to a probe is generally provided in the lighting device of the related art, and the signal generator can protect the circuit from overcurrent.
  • the probe alignment detection when the probe alignment detection is performed, the abnormal event of whether the signal generator overcurrent is alarmed is directly converted into information on whether the probe alignment is accurate; specifically, in the probe alignment detection process If the overcurrent alarm occurs in the signal generator, the probe alignment is accurate, and if there is no overcurrent alarm, the probe is misaligned. In this case, the alignment accuracy of the probe can be realized without adding other additional components. Judgment.
  • a signal providing circuit for providing electrical signals of different voltages to two of the same set of test pads may be provided by the signal generator. That is, the signal generator can be directly utilized to provide electrical signals of different voltages to the two probe misalignment test pads; or, alternatively, for exploring two of the same set of test pads
  • the signal supply circuit for providing the electrical signals of different voltages by the needle misalignment test pads is separately disposed in the lighting device; or, the external circuit can be directly used to provide the two probe misalignment test pads of the same set of test pads. Electrical signals of different voltages.
  • two probe misalignment test pads 200 are respectively disposed on a plurality of lighting test pads located in the same set of test pads. The position of both ends of 100.
  • the probe of the lighting device is an integral structure, when the probe misalignment occurs abnormally, if there is no rotational offset between each probe of the lighting device and each pad on the display substrate, The offset of the needle misalignment is the same at the edge and the middle of each set of test pads, and if there is a rotational offset, the offset of the probe is offset at the edge of each set of test pads. It should be the biggest.
  • the position of the ends of each set of test pads is as If the probe misalignment abnormality does not occur, it is considered that the alignment between the intermediate test pad and the probe is normal, so that the two probe misalignment test pads 200 are disposed at both ends of each set of test pads to Pin Miss. Abnormal detection results are more accurate.
  • two probe misalignment test pads 200 may also be disposed at other locations of each set of test pads, depending on actual needs.
  • the two probe misalignment test pads 200 may also be disposed at two lighting test pads located in the middle of the same set of test pads. Between 100.
  • FIG. 1 is a schematic diagram of a display substrate provided in an embodiment of the present disclosure. As an example, only the distribution of the two sets of test pads in the display substrate is shown in FIG. It should be understood that in practical applications, there may be multiple sets of test pads on the display substrate.
  • the display substrate includes a first set of test pads 10 and a second set of test pads 20; wherein two of the first set of test pads 10 are misaligned by test pads 200 respectively Positioned at both ends of the plurality of lighting test pads 100 in the first set of test pads 10; two of the second set of test pads 20 are disposed in the first test pad The two sets of test pads 20 are between the two test pads 100 in the middle position.
  • two probe misalignment test pads 200 of the first set of test pads 10 are respectively disposed at both ends of the plurality of lighting test pads 100 in the first set of test pads 10, and second Two probe misalignment test pads 200 in the set of test pads 20 are disposed between the two lighting test pads 100 in the intermediate position of the second set of test pads 20, that is, in different sets of tests
  • the probe misalignment test pads are disposed at different positions of the pads, and the probe misalignment test pads are disposed only at positions of both ends of each set of test pads or only in the middle of each set of test pads In comparison, the probe can be more accurately detected for dislocation anomaly.
  • the spacing between at least part of the test pads 100 of the same set of test pads is a first pitch;
  • the spacing between the pin misalignment test pad 200 and the nearest lighted test pad 100 in the same set of test pads is the first pitch.
  • the size of the probe misalignment test pad 200 and the spacing between it and the lighting test pad 100 are respectively different from the size of the lighting test pad 100 and the pitch of the lighting test pad 100. Consistent, so that the probe of the lighting device can be simplified in production.
  • the size of the probe misalignment test pad 200 and the spacing between it and the lighting test pad 100 can be designed according to actual needs, and are not limited herein.
  • test pads 200 are misaligned between the test pads 200 by a metal film connection.
  • a lighting test probe alignment detecting method performed in an embodiment of the present disclosure performs a lighting test probe alignment detection on a display substrate as described above by using a lighting device as described above; the method includes:
  • the probes connected to the probe misalignment test pad 200 are used to simultaneously apply different voltages to the two probe misalignment test pads 200 electrically connected to the same set of test pads for a preset time. a signal that detects if there is current flow between the two probe misalignment test pads 200 of the shorted connection in the same set of test pads;
  • the two probes of the two test probes electrically connected to the same set of test pads are simultaneously applied with electrical signals of different voltages within a preset time, which specifically includes:
  • One of the two probe misalignment test pads in the same set of test pads is misaligned.
  • One of the probe misalignment test pads 200 has an electrical signal applied to the test pad 200 at 0 volts, and the other probe is misaligned on the test pad 200.
  • the electrical signal to which the voltage is applied is 1 to 2 volts.
  • the electrical signals of the voltages applied on the two probes misaligned on the test pads 200 in the same set of test pads may not be limited to the electrical signals of the above voltages, and only need to be guaranteed.
  • the electrical signals of the voltages applied to the two probes misaligned on the test pads 200 in the same set of test pads may be different.
  • the two probes that are short-circuited to the same set of test pads are misaligned.
  • An electrical signal of a different voltage is simultaneously applied to the test pad 200 for a preset time.
  • the electrical signal is a transient signal.
  • the preset time is the application time of the transient signal. Since the transient signal is provided for a very short time, the display is not displayed. The substrate and lighting equipment cause a short circuit.
  • a signal generator with an overcurrent protection function in the lighting device is used to detect whether there is current passing between the two probe misalignment test pads 200 of the short circuit connection in the same set of test pads;
  • the signal generator alarm with overcurrent protection function in the lighting device can be directly used for monitoring the probe alignment detection.

Abstract

一种显示基板（1）、点灯设备及点灯测试探针（11,12）对位检测方法。所述显示基板（1）包括：显示驱动信号线；以及至少一组测试焊盘（100,200），其中每组测试焊盘（100,200）包括：依次排列并且与所述显示驱动信号线连接的多个点灯测试焊盘（100）；以及与所述显示驱动信号线不连接的两个探针错位测试焊盘（200），且所述两个探针错位测试焊盘（200）之间电连接。

Description

显示基板、点灯设备及点灯测试探针对位检测方法
相关申请的交叉引用
本申请主张在2016年3月31日在中国提交的中国专利申请No.201610197453.7的优先权，其全部内容通过引用包含于此。
技术领域
本公开文本涉及显示技术领域，尤其涉及一种显示基板、点灯设备及点灯测试探针对位检测方法。
背景技术
液晶显示器(Liquid Crystal Display，LCD)显示面板、有源矩阵有机发光二极体(Active-matrix organic light emitting diode，AMOLED)显示面板等显示面板在制作的过程中，需要进行多个检验程序，其中一个很重要的检验程序就是对切割完成的显示基板进行测试(Cell Test，ET)，以确认显示基板是否存在缺陷。ET为显示基板未贴附驱动芯片以及输入显示信号用的柔性电路板之前进行。
该测试过程通常是通过点灯设备对显示基板输入测试信号，使其像素呈现色彩，接着通过缺陷检测装置逐一观察各个像素是否良好，此过程称为点灯测试(Light-on Test)。
其中，为便于进行检测，一般在显示基板(通常为阵列基板)上设置测试焊盘(pad)，在检测时，使用点灯设备的测试探针与测试焊盘上的测试点接触，而所述测试点与信号线连接，从而，通过测试探针、测试点可以向信号线中输入检测信号，检测显示基板是否存在缺陷。
显示基板的边缘区域设置有驱动芯片，驱动芯片与显示基板的像素单元之间设置有将其连接的信号线；在驱动芯片的两侧设置有测试焊盘，所述测试焊盘与信号线连接。
探针对位错位(Pin Miss)是点灯检测时经常发生的设备异常。由于单从点灯现象无法区分为显示基板产品本身不良(显示异常)或是探针对位异常， 在生产中存在判断失误、将良品误判为缺陷品等问题。
目前相关技术中的确认探针对位错位的方法是，在发生显示画质异常时，通常由检查员将显示基板从机台上取下，重新放置多次并确认探针对位是否异常。该方式耗费时间，且准确性较低，受人员熟练度影响较大。
发明内容
本公开文本的目的在于提供一种显示基板、点灯设备及点灯测试探针对位检测方法，能够不增加额外的检查时间，可靠性高，不需要人员接触显示基板操作，降低静电和产品破损风险。
根据本公开文本的一个方面，公开了一种显示基板，包括：显示驱动信号线；以及至少一组测试焊盘，其中每组测试焊盘包括：依次排列并且与所述显示驱动信号线连接的多个点灯测试焊盘；以及与所述显示驱动信号线不连接的两个探针错位测试焊盘，且所述两个探针错位测试焊盘之间电连接。进一步地，两个探针错位测试焊盘分别设置在与其位于同一组测试焊盘中的多个点灯测试焊盘的两端位置。
进一步地，两个探针错位测试焊盘设置在与其位于同一组测试焊盘中处于中间位置的两个点灯测试焊盘之间。
进一步地，同一组测试焊盘中至少部分点灯测试焊盘之间的间距为第一间距；且所述探针错位测试焊盘和与其位于同一组测试焊盘中距离最近的点灯测试焊盘之间的间距为所述第一间距。
进一步地，所述至少一组测试焊盘包括第一组测试焊盘和第二组测试焊盘；
其中，所述第一组测试焊盘中的两个探针错位测试焊盘分别设置在所述第一组测试焊盘中的多个点灯测试焊盘的两端位置；以及所述第二组测试焊盘中的两个探针错位测试焊盘设置在所述第二组测试焊盘中处于中间位置的两个点灯测试焊盘之间。
进一步地，同一组测试焊盘中的两个探针错位测试焊盘之间通过金属薄膜连接。
根据本公开文本的另一个方面，公开了一种点灯设备，包括至少一组探 针，用于对如上所述的显示基板进行点灯测试，每组探针包括：用于与一组测试焊盘包括的多个点灯测试焊盘连接的点灯测试探针；以及，用于与所述一组测试焊盘包括的探针错位测试焊盘连接的探针错位检测探针，其中每组探针的排列方式和与其对应的一组测试焊盘的排列方式相同。
进一步地，所述点灯设备还包括：与所述探针错位检测探针连接的，用于向同一组测试焊盘中的两个探针错位测试焊盘提供不同电压的电信号的信号提供电路。
进一步地，所述点灯设备包括：与所述点灯测试探针和所述探针错位检测探针连接的带有过电流保护功能的信号发生器。
进一步地，所述电信号是瞬时信号。
根据本公开文本的又一个方面，公开了一种点灯测试探针对位检测方法，所述方法利用如上所述的点灯设备对如上所述的显示基板进行点灯测试探针对位检测；所述方法包括：
将点灯设备中的一组探针包括的点灯测试探针和探针错位检测探针分别与显示基板上的对应的一组测试焊盘包括的点灯测试焊盘和探针错位测试焊盘连接；
在点灯测试之前，利用与探针错位测试焊盘连接的探针，向同一组测试焊盘中电连接的两个探针错位测试焊盘上在预设时间内同时施加不同电压的电信号，以检测同一组测试焊盘中短路连接的两个探针错位测试焊盘之间是否有电流通过；
若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘之间有电流通过时，则判断探针对位正确；以及
若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘之间无电流通过时，则判断探针对位错位。
进一步地，在点灯测试之前，向同一组测试焊盘中短路连接的两个探针错位测试焊盘上分别施加不同电压的电信号，具体包括：
向同一组测试焊盘中短路连接的两个探针错位测试焊盘中的一个探针错位测试焊盘上施加电压的电信号为0伏，并且向另一个探针错位测试焊盘上施加电压的电信号为1～2伏。
进一步地，利用点灯设备内的带有过电流保护功能的信号发生器来检测同一组测试焊盘中短路连接的两个探针错位测试焊盘之间是否有电流通过；
当所述带有过电流保护功能的信号发生器报警时，则判断同一组测试焊盘中短路连接的两个探针错位测试焊盘之间有电流通过；
当所述带有过电流保护功能的信号发生器未报警时，则判断同一组测试焊盘中短路连接的两个探针错位测试焊盘之间无电流通过。
进一步地，所述电信号是瞬时信号，并且所述预设时间是瞬时信号的施加时间。
进一步地，所述信号发生器与所述点灯测试探针和所述探针错位检测探针连接。
本公开文本的有益效果如下：在上述方案中，对显示基板以及点灯设备进行了产品设计改进，通过加载电压的电信号的方式自动判断是否存在探针对位错位异常，在发生探针对位错位时，提示检查员进行重新对位，从而消除因探针对位错位造成的检测失误等情况，提升检查准确性，可以在点灯测试时能够不增加额外的检查时间，可靠性高，并且不需要人员接触显示基板操作，降低静电和产品破损风险。
附图说明
为了更清楚地说明本申请实施例的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请中记载的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。以下附图并未刻意按实际尺寸等比例缩放绘制，重点在于示出本申请的主旨。
图1表示本公开文本实施例所提供的显示基板的测试焊盘的分布结构示意图。
具体实施方式
为使本公开文本实施例的目的、技术方案和优点更加清楚，下面将结合本公开文本实施例的附图，对本公开文本实施例的技术方案进行清楚、完整 地描述。显然，所描述的实施例是本公开文本的一部分实施例，而不是全部的实施例。基于所描述的本公开文本的实施例，本领域普通技术人员所获得的所有其他实施例，都属于本公开文本保护的范围。
除非另作定义，此处使用的技术术语或者科学术语应当为本公开所属领域内具有一般技能的人士所理解的通常意义。本公开专利申请说明书以及权利要求书中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性，而只是用来区分不同的组成部分。同样，“一个”或者“一”等类似词语也不表示数量限制，而是表示存在至少一个。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接，而是可以包括电性的连接，不管是直接的还是间接的。“上”、“下”、“左”、“右”等仅用于表示相对位置关系，当被描述对象的绝对位置改变后，则该相对位置关系也相应地改变。
为了相关技术中对显示基板进行点灯测试时对于探针对位错位异常不能准确判断且耗时等技术问题，本公开文本实施例中提供了一种显示基板、点灯设备以及点灯测试探针对位检测方法，能够自动判断是否存在探针对位错位异常，提升检查准确性。
如图1所示，本公开文本实施例中所提供的显示基板1包括：显示驱动信号线及至少一组测试焊盘(Pad)，同一组测试焊盘中多个测试焊盘依次排列，例如图1中所示同一组测试焊盘中的多个测试焊盘可以沿一预设方向依次排列；每组测试焊盘包括：与所述显示驱动信号线连接的多个点灯测试焊盘(ET Pad)100；每组测试焊盘还包括：与所述显示驱动信号线不连接的两个探针错位测试焊盘(Dummy Pad)200，且两个探针错位测试焊盘200之间电连接。需要注意的是，在图1中，为清晰起见，仅示出了左下侧的两个点灯测试焊盘100连接有显示驱动信号线，但实际上所有的点灯测试焊盘100均各自连接有一条显示驱动信号线。
本公开文本实施例中提供的点灯设备包括：至少一组探针，用于对如上所述的显示基板进行点灯测试，每组探针包括：用于与多个点灯测试焊盘100连接的点灯测试探针11；以及，用于与探针错位测试焊盘200连接的探针错位检测探针12；其中每组探针的排列方式和与其对应的一组测试焊盘的排列方式相同。所述点灯设备还包括：与所述探针错位检测探针12连接的、用于 向同一组测试焊盘中的两个探针错位测试焊盘200提供不同电压的电信号的信号提供电路。需要注意的是，在图1中，为清晰起见，仅示出了下侧的两个探针错位检测探针12连接到该信号提供电路，但实际上所有的探针错位检测探针12均连接到该信号提供电路。
上述方案中，对传统的显示基板和点灯设备都进行了改进，其中在显示基板制造(Array Mask设计)时，在原有的每组测试焊盘中增设两个用于检测探针是否对位错位的探针错位测试焊盘200，且探针错位测试焊盘200悬空设计，并不引入显示区作为驱动信号，并将同一组测试焊盘内的两个探针错位测试焊盘200进行电连接；相应地，对点灯设备进行了改进，在点灯设备原有的每组探针中增设了用于与探针错位测试焊盘200对应连接的探针错位检测探针12以及用于向同一组测试焊盘中的两个探针错位测试焊盘200提供不同电压的电信号的信号提供电路。
由于点灯设备上各组探针的排列方式与显示基板上的对应的各组测试焊盘的排列方式相同，因此若探针错位检测探针12与探针错位检测焊盘对位正常，则可以确定点灯测试探针11与点灯测试焊盘100对位正常，若探针错位检测探针12与探针错位检测焊盘对位异常，则可以确定点灯测试探针11与点灯测试焊盘100对位异常，即存在探针对位错位问题。
因此，利用本公开文本实施例提供的点灯设备对本公开文本实施例提供的显示基板进行探针对位检测，具体的方法为：
在点灯测试之前，利用与探针错位测试焊盘200连接的探针错位检测探针12，向同一组测试焊盘中电连接的两个探针错位测试焊盘200上在预设时间内同时施加不同电压的电信号，检测同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间是否有电流通过。若探针错位检测探针12与探针错位检测焊盘200对位正确，探针错位检测探针12与探针错位检测焊盘会正常连接，从而，由于同一组测试焊盘内的两个探针错位检测焊盘200之间进行电连接，不同电压的两个探针错位检测焊盘之间会有大电流经过。因此，若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间有电流通过，则判断同一组中的两个探针错位检测探针12对位正确，相应地与上述两个探针错位检测探针12属于同一组的其他探针对位正确；若检测到同一组测试焊盘 中短路连接的两个探针错位测试焊盘200之间无电流通过，则判断探针对位错位。
并且，在正常点灯测试时，点灯设备对探针错位测试焊盘200不提供任何显示驱动信号，两个探针错位测试焊盘200的短接设计对点灯测试无任何影响。
由此可见，本公开文本通过对显示基板以及点灯设备进行产品设计改进，通过加载电压的电信号的方式即可自动判断是否存在探针对位错位异常，在发生探针对位错位时，提示检查员进行重新对位，从而消除因探针对位错位造成的检测失误等情况，提升检查准确性，能够在点灯测试时不增加额外的检查时间，可靠性高，并且不需要人员接触显示基板操作，降低静电和产品破损风险。
其中，需要说明的是，在上述方案中，在点灯测试之前，向同一组测试焊盘中短路连接的两个探针错位测试焊盘200上同时施加不同电压的电信号，具体可以为，向同一组测试焊盘中短路连接的两个探针错位测试焊盘200中的一个探针错位测试焊盘200上施加电压的电信号为0伏，向另一个探针错位测试焊盘200上施加电压的电信号为1～2伏。
其中，同一组测试焊盘中短路连接的两个探针错位测试焊盘200上所施加的电压的电信号可以并不局限于上述电压的电信号，只需保证同一组测试焊盘中短路连接的两个探针错位测试焊盘200上所施加的电压的电信号不同即可。
此外，在点灯测试之前，向同一组测试焊盘中短路连接的两个探针错位测试焊盘200上在预设时间内同时施加不同电压的电信号，该电信号为瞬时信号，所述预设时间为一瞬时信号的施加时间，由于瞬时信号提供时间非常短，不会对显示基板和点灯设备造成短路影响。
此外，通常，在点灯设备中设置有与探针连接的带有过电流保护功能的信号发生器(Pattern Generator Over Current Protection，PG OCP)，在本公开文本实施例所提供的点灯设备中，将带有过电流保护功能的信号发生器与点灯测试探针11以及探针错位检测探针12均连接，可以直接利用带有过电流保护功能的信号发生器报警来进行探针对位检测的监控。具体地，在进行探 针对位检测时，利用点灯设备内的带有过电流保护功能的信号发生器来检测同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间是否有电流通过；当所述带有过电流保护功能的信号发生器报警时，判断同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间有电流通过；当所述带有过电流保护功能的信号发生器未报警时，则判断同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间无电流通过。需要注意的是，在图1中，为清晰起见，仅示出了最右侧下部的一个点灯测试探针11和最右侧上部的一个探针错位检测探针12连接到该信号发生器，但实际上所有的点灯测试探针11和所有的探针错位检测探针12均连接到该信号发生器。
相关技术中的点灯设备中一般都设置有与探针连接的信号发生器，该信号发生器可以对电路进行过电流保护。在本公开文本中，在进行探针对位检测时，直接利用信号发生器过电流是否报警这一异常事件，转化为探针对位是否准确的信息；具体地，在探针对位检测过程中，如果信号发生器出现过电流报警则说明探针对位准确，而如果没有出现过电流报警则说明探针对位错位，此时无需增加其他额外的部件即可实现探针对位准确性的判断。
此外，在此需要说明的是，用于向所述同一组测试焊盘中的两个探针错位测试焊盘提供不同电压的电信号的信号提供电路可以是由所述信号发生器来提供。也就是说，可以直接利用所述信号发生器来向两个探针错位测试焊盘提供不同电压的电信号；或者，也可以是，用于向所述同一组测试焊盘中的两个探针错位测试焊盘提供不同电压的电信号的信号提供电路单独设置在点灯设备内；或者，还可以是，直接利用外界电路来向同一组测试焊盘中的两个探针错位测试焊盘提供不同电压的电信号。
在本公开文本实施例所提供的显示基板中，可选地，如图1所示，两个探针错位测试焊盘200分别设置在与其位于同一组测试焊盘中的多个点灯测试焊盘100的两端位置。上述方案中，由于点灯设备的探针为一个整体结构，探针对位错位异常发生时，若点灯设备的各探针与显示基板上的各焊盘之间不存在旋转偏移的情况，探针错位的偏移量在每组测试焊盘的边缘和中间位置的偏移量相同，而若存在旋转偏移的情况下，则探针错位的偏移量在每组测试焊盘的边缘位置应该是最大的。因此，在每组测试焊盘的两端点位置如 果没有发生探针对位错位异常，则认为中间的测试焊盘与探针的对位正常，从而将两个探针错位测试焊盘200设置在每组测试焊盘的两端位置对Pin Miss异常检测结果更为准确。
当然可以理解的是，在本公开文本的其他实施例中，根据实际需要，两个探针错位测试焊盘200也可以设置在每组测试焊盘的其他位置上。
在本公开文本实施例所提供的显示基板中，如图1所示，两个探针错位测试焊盘200还可以设置在与其位于同一组测试焊盘中处于中间位置的两个点灯测试焊盘100之间。
图1为本公开文本实施例中提供的一种显示基板的示意图。作为一个示例，在图1中仅示出了显示基板中的两组测试焊盘的分布状况。应当理解的是，在实际应用中，所述显示基板上的测试焊盘可以有多组。如图1所示，所述显示基板包括第一组测试焊盘10和第二组测试焊盘20；其中，所述第一组测试焊盘10中的两个探针错位测试焊盘200分别设置在所述第一组测试焊盘10中的多个点灯测试焊盘100的两端位置；所述第二组测试焊盘20中的两个探针错位测试焊盘200设置在所述第二组测试焊盘20中处于中间位置的两个点灯测试焊盘100之间。
采用上述方案，第一组测试焊盘10中两个探针错位测试焊盘200分别设置在所述第一组测试焊盘10中的多个点灯测试焊盘100的两端位置，而第二组测试焊盘20中的两个探针错位测试焊盘200设置在所述第二组测试焊盘20中处于中间位置的两个点灯测试焊盘100之间，也就是说，在不同组测试焊盘的不同位置点上设置所述探针错位测试焊盘，与仅在每组测试焊盘的两端位置或仅在每组测试焊盘的中间位置设置所述探针错位测试焊盘相比，可以使得探针对位错位异常检测更为准确。
此外，本公开文本实施例中提供的显示基板中，可选地，如图1所示，同一组测试焊盘中至少部分点灯测试焊盘100之间的间距为第一间距；且所述探针错位测试焊盘200和与其位于同一组测试焊盘中距离最近的点灯测试焊盘100之间的间距为所述第一间距。
采用上述方案，探针错位测试焊盘200的尺寸以及其与点灯测试焊盘100之间的间距分别与点灯测试焊盘100的尺寸以及点灯测试焊盘100的间距保 持一致，如此，可以使得点灯设备的探针在制作上比较简化。
应当理解的是，在实际应用中，探针错位测试焊盘200的尺寸以及其与点灯测试焊盘100之间的间距可以根据实际需求来进行设计，在此并不做局限。
此外，同一组测试焊盘中的两个探针错位测试焊盘200之间通过金属薄膜连接。
本公开文本实施例中提供的一种点灯测试探针对位检测方法，利用如上所述的点灯设备对如上所述的显示基板进行点灯测试探针对位检测；所述方法包括：
将点灯设备上的探针与显示基板上的多个测试焊盘连接；
在点灯测试之前，利用与探针错位测试焊盘200连接的探针，向同一组测试焊盘中电连接的两个探针错位测试焊盘200上在预设时间内同时施加不同电压的电信号，检测同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间是否有电流通过；
若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间有电流通过时，则判断探针对位正确；
若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间无电流通过时，则判断探针对位错位。
其中，在上述方案中，在点灯测试之前，向同一组测试焊盘中电连接的两个探针错位测试焊盘200上在预设时间内同时施加不同电压的电信号，具体包括：
向同一组测试焊盘中短路连接的两个探针错位测试焊盘200中的一个探针错位测试焊盘200上施加电压的电信号为0伏，向另一个探针错位测试焊盘200上施加电压的电信号为1～2伏。
需要说明的是，在上述方案中，同一组测试焊盘中短路连接的两个探针错位测试焊盘200上所施加的电压的电信号可以并不局限于上述电压的电信号，只需保证同一组测试焊盘中短路连接的两个探针错位测试焊盘200上所施加的电压的电信号不同即可。
并且，在点灯测试之前，向同一组测试焊盘中短路连接的两个探针错位 测试焊盘200上在预设时间内同时施加不同电压的电信号，该电信号为瞬时信号，该预设时间为该瞬时信号的施加时间，由于瞬时信号提供时间非常短，因此不会对显示基板和点灯设备造成短路影响。
进一步地，利用点灯设备内的带有过电流保护功能的信号发生器来检测同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间是否有电流通过；
当所述带有过电流保护功能的信号发生器报警时，则判断同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间有电流通过；
当所述带有过电流保护功能的信号发生器未报警时，则判断同一组测试焊盘中短路连接的两个探针错位测试焊盘200之间无电流通过。
采用上述方案，可以直接利用点灯设备内的带有过电流保护功能的信号发生器报警来进行探针对位检测的监控。
以上所述仅是本公开文本的可选实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本公开文本技术原理的前提下，还可以做出若干改进和替换，这些改进和替换也应视为本公开文本的保护范围。

Claims (15)

  1. 一种显示基板，包括：
    显示驱动信号线；以及
    至少一组测试焊盘，
    其中每组测试焊盘包括：依次排列并且与所述显示驱动信号线连接的多个点灯测试焊盘；以及与所述显示驱动信号线不连接的两个探针错位测试焊盘，且所述两个探针错位测试焊盘之间电连接。
  2. 根据权利要求1所述的显示基板，其中
    所述两个探针错位测试焊盘分别设置在与其位于同一组测试焊盘中的多个点灯测试焊盘的两端位置。
  3. 根据权利要求1所述的显示基板，其中
    所述两个探针错位测试焊盘设置在与其位于同一组测试焊盘中处于中间位置的两个点灯测试焊盘之间。
  4. 根据权利要求1所述的显示基板，其中
    同一组测试焊盘中至少部分点灯测试焊盘之间的间距为第一间距；以及
    所述探针错位测试焊盘和与其位于同一组测试焊盘中距离最近的点灯测试焊盘之间的间距为所述第一间距。
  5. 根据权利要求1所述的显示基板，其中
    所述至少一组测试焊盘包括第一组测试焊盘和第二组测试焊盘；
    其中，所述第一组测试焊盘中的两个探针错位测试焊盘分别设置在所述第一组测试焊盘中的多个点灯测试焊盘的两端位置；以及所述第二组测试焊盘中的两个探针错位测试焊盘设置在所述第二组测试焊盘中处于中间位置的两个点灯测试焊盘之间。
  6. 根据权利要求1所述的显示基板，其中
    同一组测试焊盘中的两个探针错位测试焊盘之间通过金属薄膜连接。
  7. 一种用于对权利要求1至6中任一项所述的显示基板进行点灯测试的点灯设备，所述点灯设备包括至少一组探针，其中每组探针包括：用于与一组测试焊盘包括的多个点灯测试焊盘连接的点灯测试探针；以及，用于与所 述一组测试焊盘包括的探针错位测试焊盘连接的探针错位检测探针，其中每组探针的排列方式和与其对应的一组测试焊盘的排列方式相同。
  8. 根据权利要求7所述的点灯设备，还包括：
    与所述探针错位检测探针连接的、用于向同一组测试焊盘中的两个探针错位测试焊盘提供不同电压的电信号的信号提供电路。
  9. 根据权利要求7所述的点灯设备，还包括：与所述点灯测试探针和所述探针错位检测探针连接的带有过电流保护功能的信号发生器。
  10. 根据权利要求8所述的点灯设备，其中所述电信号是瞬时信号。
  11. 一种点灯测试探针对位检测方法，所述方法利用如权利要求7至10中任一项所述的点灯设备对如权利要求1至6中任一项所述的显示基板进行点灯测试探针对位检测，所述方法包括：
    将点灯设备中的一组探针包括的点灯测试探针和探针错位检测探针分别与显示基板上的对应的一组测试焊盘包括的点灯测试焊盘和探针错位测试焊盘连接；
    在点灯测试之前，利用与探针错位测试焊盘连接的探针，向同一组测试焊盘中电连接的两个探针错位测试焊盘上在预设时间内同时施加不同电压的电信号，以检测同一组测试焊盘中短路连接的两个探针错位测试焊盘之间是否有电流通过；
    若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘之间有电流通过时，则判断探针对位正确；以及
    若检测到同一组测试焊盘中短路连接的两个探针错位测试焊盘之间无电流通过时，则判断探针对位错位。
  12. 根据权利要求11所述的方法，其中
    所述向同一组测试焊盘中电连接的两个探针错位测试焊盘上在预设时间内同时施加不同电压的电信号，具体包括：
    向同一组测试焊盘中短路连接的两个探针错位测试焊盘中的一个探针错位测试焊盘上施加电压的电信号为0伏，并且向另一个探针错位测试焊盘上施加电压的电信号为1～2伏。
  13. 根据权利要求11所述的方法，其中利用点灯设备内的带有过电流保 护功能的信号发生器来检测同一组测试焊盘中短路连接的两个探针错位测试焊盘之间是否有电流通过，其中
    当所述带有过电流保护功能的信号发生器报警时，判断同一组测试焊盘中短路连接的两个探针错位测试焊盘之间有电流通过；以及
    当所述带有过电流保护功能的信号发生器未报警时，判断同一组测试焊盘中短路连接的两个探针错位测试焊盘之间无电流通过。
  14. 根据权利要求11所述的方法，其中所述电信号是瞬时信号，并且所述预设时间是瞬时信号的施加时间。
  15. 根据权利要求13所述的方法，其中所述信号发生器与所述点灯测试探针和所述探针错位检测探针连接。
PCT/CN2016/082051 2016-03-31 2016-05-13 显示基板、点灯设备及点灯测试探针对位检测方法 WO2017166387A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/515,280 US10670629B2 (en) 2016-03-31 2016-05-13 Display substrate, light-on device and method for testing alignment of light-on testing pin

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610197453.7 2016-03-31
CN201610197453.7A CN105785607A (zh) 2016-03-31 2016-03-31 显示基板、点灯设备及点灯测试探针对位检测方法

Publications (1)

Publication Number Publication Date
WO2017166387A1 true WO2017166387A1 (zh) 2017-10-05

Family

ID=56395513

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2016/082051 WO2017166387A1 (zh) 2016-03-31 2016-05-13 显示基板、点灯设备及点灯测试探针对位检测方法

Country Status (3)

Country Link
US (1) US10670629B2 (zh)
CN (1) CN105785607A (zh)
WO (1) WO2017166387A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110288929A (zh) * 2018-03-19 2019-09-27 三星显示有限公司 平板显示器

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106405965A (zh) * 2016-10-26 2017-02-15 京东方科技集团股份有限公司 阵列基板和阵列基板的测试方法、显示装置
CN106841991A (zh) * 2017-02-16 2017-06-13 深圳市燕麦科技股份有限公司 一种针模与电路板的对位检测方法、装置和对位系统
CN109754732B (zh) 2017-11-01 2021-01-22 京东方科技集团股份有限公司 基板、面板、检测装置以及对准检测方法
CN108681116B (zh) * 2018-05-21 2021-02-26 京东方科技集团股份有限公司 一种显示面板、检测治具及检测控制方法
CN108806565B (zh) * 2018-06-01 2020-08-04 武汉华星光电半导体显示技术有限公司 显示屏点灯测试装置及方法
CN108957807A (zh) * 2018-08-08 2018-12-07 昆山龙腾光电有限公司 一种绑定检测系统及显示面板
CN109523943B (zh) * 2018-12-28 2023-06-20 厦门天马微电子有限公司 显示面板和显示装置
CN110045223B (zh) * 2019-04-28 2021-09-07 云谷（固安）科技有限公司 一种显示面板及其测试方法、显示装置
CN111896819A (zh) * 2020-04-17 2020-11-06 重庆京东方光电科技有限公司 一种触控面板、触控面板检测装置和检测方法
CN112164359B (zh) * 2020-10-26 2024-04-05 京东方科技集团股份有限公司 一种显示装置及其检测方法
CN112599057A (zh) * 2020-12-02 2021-04-02 广州国显科技有限公司 用于显示组件的检测装置及显示组件

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0149325B1 (ko) * 1995-05-17 1998-12-01 김광호 프루브 조정 방법
JP2000258744A (ja) * 1999-03-08 2000-09-22 Ricoh Co Ltd 状態検出機構及び方法
JP2011175298A (ja) * 2011-06-02 2011-09-08 Micronics Japan Co Ltd 液晶パネル点灯検査装置
CN103345077A (zh) * 2013-06-19 2013-10-09 深圳市华星光电技术有限公司 液晶显示模组的质量检测装置及其使用方法
CN203365611U (zh) * 2013-08-16 2013-12-25 京东方科技集团股份有限公司 一种测试夹具及显示面板
CN105204198A (zh) * 2015-10-15 2015-12-30 武汉华星光电技术有限公司 一种显示面板及显示面板测试系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4342957A (en) * 1980-03-28 1982-08-03 Honeywell Information Systems Inc. Automatic test equipment test probe contact isolation detection apparatus and method
JP4803692B2 (ja) * 2001-07-31 2011-10-26 オプトレックス株式会社 液晶表示パネルの点灯検査方法
JP4281337B2 (ja) * 2002-11-20 2009-06-17 パナソニック株式会社 ディスプレイパネルの点灯検査装置
TWI641620B (zh) * 2013-08-21 2018-11-21 再生元醫藥公司 抗－ｐｒｌｒ抗體及其用途
CN203616553U (zh) * 2013-12-19 2014-05-28 Tcl显示科技（惠州）有限公司 软性印刷电路板、触控板、液晶面板以及液晶显示屏
CN104950484B (zh) * 2014-03-25 2018-05-11 夏普株式会社 基板检查探测装置和基板检查方法
US10060981B2 (en) * 2014-12-03 2018-08-28 Power ProbeTeK, LLC Diagnostic circuit test device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0149325B1 (ko) * 1995-05-17 1998-12-01 김광호 프루브 조정 방법
JP2000258744A (ja) * 1999-03-08 2000-09-22 Ricoh Co Ltd 状態検出機構及び方法
JP2011175298A (ja) * 2011-06-02 2011-09-08 Micronics Japan Co Ltd 液晶パネル点灯検査装置
CN103345077A (zh) * 2013-06-19 2013-10-09 深圳市华星光电技术有限公司 液晶显示模组的质量检测装置及其使用方法
CN203365611U (zh) * 2013-08-16 2013-12-25 京东方科技集团股份有限公司 一种测试夹具及显示面板
CN105204198A (zh) * 2015-10-15 2015-12-30 武汉华星光电技术有限公司 一种显示面板及显示面板测试系统

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110288929A (zh) * 2018-03-19 2019-09-27 三星显示有限公司 平板显示器
KR20190110164A (ko) * 2018-03-19 2019-09-30 삼성디스플레이 주식회사 평판표시장치
KR102484450B1 (ko) * 2018-03-19 2023-01-05 삼성디스플레이 주식회사 평판표시장치
KR20230010182A (ko) * 2018-03-19 2023-01-18 삼성디스플레이 주식회사 표시 장치
KR102578737B1 (ko) 2018-03-19 2023-09-18 삼성디스플레이 주식회사 표시 장치
CN110288929B (zh) * 2018-03-19 2024-04-05 三星显示有限公司 平板显示器

Also Published As

Publication number Publication date
CN105785607A (zh) 2016-07-20
US20180188289A1 (en) 2018-07-05
US10670629B2 (en) 2020-06-02

Similar Documents

Publication Publication Date Title
WO2017166387A1 (zh) 显示基板、点灯设备及点灯测试探针对位检测方法
TWI743067B (zh) 便於檢測包括複數個面板之受測試裝置之系統及方法
CN110444135B (zh) 一种显示装置及其检测方法和覆晶薄膜
KR101113340B1 (ko) 액정 표시장치 및 그의 검사방법
TWI633300B (zh) 薄膜電晶體面板缺陷之檢測方法及其裝置
TWI578059B (zh) 一種用於檢測陣列繞線之母基板及其檢測方法
US8508111B1 (en) Display panel and method for inspecting thereof
CN109754732B (zh) 基板、面板、检测装置以及对准检测方法
JP5352066B2 (ja) 電子回路基板の製造装置
US20140266244A1 (en) Systems and methods for real-time monitoring of displays during inspection
TWI539166B (zh) Check the wafer and test system
KR101469481B1 (ko) 표시장치용 표시패널 및 표시장치용 신호라인의 불량 검출방법
KR100897982B1 (ko) 프로브카드 니들과 패드간의 미스 얼라인 방지 패턴 및 그방법
KR101233070B1 (ko) 비접촉 프로브
US10663815B2 (en) Inspection method and inspection system for wiring path of substrate
US9761162B2 (en) Array substrate for display panel and method for inspecting array substrate for display panel
KR102016076B1 (ko) 평판 표시 소자의 검사 장치 및 검사 방법
JP2011215007A (ja) 試験装置及び試験方法
US20210123951A1 (en) Short-circuit probe card, wafer test system, and fault detection method for the wafer test system
JP2005300240A (ja) 回路配線検査方法およびその装置
TWI661189B (zh) 薄膜電晶體面板缺陷之檢測方法及其裝置
TWI392911B (zh) 顯示面板及其線路檢查方法
KR20110062573A (ko) 오토 프로브 검사 장치 및 오토 프로브 검사 방법
JP2006234392A (ja) 半導体検査装置及び半導体検査装置の不具合特定方法
KR20180003749A (ko) 패널의 배선패턴 검사장치 및 배선패턴 검사방법

Legal Events

Date Code Title Description
NENP Non-entry into the national phase

Ref country code: DE

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 16896163

Country of ref document: EP

Kind code of ref document: A1

122 Ep: pct application non-entry in european phase

Ref document number: 16896163

Country of ref document: EP

Kind code of ref document: A1

32PN Ep: public notification in the ep bulletin as address of the adressee cannot be established

Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 112(1) EPC (EPO FORM 1205A DATED 18/02/2019)

122 Ep: pct application non-entry in european phase

Ref document number: 16896163

Country of ref document: EP

Kind code of ref document: A1