WO2017041480A1 - 显示基板及其测试方法、显示装置 - Google Patents

显示基板及其测试方法、显示装置 Download PDF

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Publication number
WO2017041480A1
WO2017041480A1 PCT/CN2016/077344 CN2016077344W WO2017041480A1 WO 2017041480 A1 WO2017041480 A1 WO 2017041480A1 CN 2016077344 W CN2016077344 W CN 2016077344W WO 2017041480 A1 WO2017041480 A1 WO 2017041480A1
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Prior art keywords
electrode
test
display substrate
electrode block
display
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PCT/CN2016/077344
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English (en)
French (fr)
Inventor
李彦辰
王攀华
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京东方科技集团股份有限公司
北京京东方光电科技有限公司
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Priority to US15/324,796 priority Critical patent/US10416812B2/en
Publication of WO2017041480A1 publication Critical patent/WO2017041480A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/13338—Input devices, e.g. touch panels
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412—Digitisers structurally integrated in a display
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0443—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a single layer of sensing electrodes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof

Definitions

  • the present invention belongs to the field of display technologies, and in particular, to a display substrate, a test method thereof, and a display device.
  • the In-Cell touch scheme in which the touch function is embedded in the liquid crystal display panel has been widely concerned, and the In-Cell touch scheme usually includes a self-capacitance mode and a mutual capacitance mode.
  • the In-Cell touch scheme of the self-capacity mode is specifically as shown in FIG. 1 , and the liquid crystal display panel is used as a common electrode.
  • the metal layer is divided into a plurality of blocks (ie, the electrode block 1) insulated from each other as a touch sensor unit, and the touch sensor unit is connected to the driving IC through a specific metal trace, and when the finger touches the liquid crystal display panel, the corresponding position is caused.
  • the change of the capacitance value of the touch sensor unit (it can also be said that the change of the voltage value of the common electrode at the corresponding position), the drive IC determines the position of the touch point by detecting the change of the capacitance value, thereby implementing the touch function.
  • an electric test (Electric Test, ET for short) is required for the touch display panel.
  • ET Electric Test
  • ET Electric Test
  • the existing ET structure can only load the same test signal to all the touch sensor units at the same time by controlling the test switch, and the short circuit between the different touch sensor units cannot be tested.
  • the touch sensor unit will be in a floating state and cannot load the test signal, and has an indeterminate small voltage value near the initial zero potential.
  • the loaded test signal is 0V voltage
  • the loaded test signal is 0V voltage
  • the display area corresponding to the sensor unit and the display area corresponding to other normal touch sensor units may have brightness differences on the display, but the brightness difference may be very small, which may cause the human eye to be indistinguishable, and eventually may cause a possible open circuit failure.
  • TDDI Touch & Display Driver IC
  • the ET design scheme of the existing ADSDS self-capacitive touch display panel cannot detect the short circuit fault between the different touch sensor units, and cannot ensure that the open sensor of the touch sensor unit is completely detected. Inaccurate, the detection rate of defective products is low; if there is a bad touch display panel entering the module process, it will further cause a large loss of materials such as polarizer POL, driver IC, flexible circuit board FPC, etc., and increase production cost. It can be seen that there is a need for a technical solution capable of accurately detecting a poor open circuit or a short circuit of the touch display panel, thereby improving test accuracy, improving the detection rate of defective products, and reducing production costs.
  • embodiments of the present invention provide a display substrate, a test method thereof, and a display device, which can accurately detect open circuit defects or short circuit defects existing in a display substrate, improve test accuracy, and improve Good product detection rate and reduced production costs.
  • a display substrate comprising a plurality of pixel regions arranged in a matrix and a test unit, each of the pixel regions being provided with a first electrode
  • the test unit comprises at least two sub- a test unit, wherein the first electrode disposed in a plurality of the pixel regions adjacent to each other corresponds to an electrode block, and each of the electrode blocks is electrically isolated from each other, and the electrode block is divided into At least two test groups having the same number of sub-test units, the electrode blocks belonging to the same test group are spaced apart in the row direction and the column direction, and all the electrode blocks and one in the same test group are The test unit is connected.
  • the test unit may include a driving signal point and the number of the sub-test units The same test signal point and a plurality of switching thin film transistors having the same number of the electrode blocks, the test signal points are in one-to-one correspondence with the test group, and the gates of all the switching thin film transistors may be combined with the driving a signal point is connected, a source of each of the switching thin film transistors may be connected to one of the electrode blocks, and a drain thereof may be connected to a test signal point corresponding to a source of the switching thin film transistor One of the test groups to which the electrode block is connected.
  • the display substrate may include a display area and a non-display area surrounding the periphery of the display area, the plurality of pixel areas may be located in the display area, the test unit may be disposed in the non-display area, the electrode
  • the block may be connected to the source of the switching thin film transistor through a metal trace.
  • the test unit may include a first sub-test unit and a second sub-test unit, and the test group may include a first test group and a second test group, and the electrode blocks may be separated by one at a row direction and a column direction.
  • the remaining electrode blocks may be set as the second test group; each of the electrode blocks in the first test group may be electrically connected to the first sub-test unit, Each of the electrode blocks in the second test group may be electrically connected to the second sub-test unit.
  • adjacent sides of the electrode block in the first test group in the row direction and the column direction may be all described in the second test group
  • the electrode block, the adjacent sides of the electrode block in the second test group in the row direction and the column direction may be the electrode blocks in the first test group.
  • Each of the electrode blocks may have a size comparable to a finger touch area.
  • Each of the electrode blocks may have a size of 4 mm x 4 mm.
  • Each of the electrode blocks can form a touch sensor unit.
  • Each of the pixel regions may include three sub-pixel regions or four sub-pixel regions, and the plurality of the pixel regions may share the first electrode, and the first electrode may be a common electrode.
  • a display device comprising the above display substrate.
  • a test method for displaying a substrate includes a plurality of pixel regions arranged in a matrix and a test unit, each of the pixel regions is provided with a first electrode, and the test unit includes at least two sub-test units, a plurality of the pixels adjacent to each other.
  • the first electrode disposed in the region corresponds to an electrode block, and each of the electrode blocks is electrically isolated from each other, and the electrode block is divided into at least two test groups having the same number as the sub-test unit according to the set position.
  • the electrode blocks belonging to the same test group are spaced apart in the row direction and the column direction, and all the electrode blocks in the same test group are connected to one of the sub-test units; the method includes:
  • the test unit may include a driving signal point, a test signal point having the same number as the sub-test unit, and a plurality of switching thin film transistors having the same number as the electrode block, the test signal point and the test group being one by one
  • the gates of all the switching thin film transistors may be connected to the driving signal points
  • the source of each of the switching thin film transistors may be connected to one of the electrode blocks
  • the drain thereof is connected to a test signal.
  • a voltage is applied to a gate of the switching thin film transistor by the driving signal point to make the switching thin film transistor in an on state; and a plurality of different test signal points are respectively Applying the same voltage signal or different voltage signals to the drain of the switching thin film transistor to test the display performance of the display substrate and the short circuit fault or open circuit fault of the self-capacitive touch electrode formed by the electrode block .
  • the method may include: maintaining the switching thin film transistor in an on state, applying the same voltage to the electrode blocks of two test groups through different test signal points, respectively, when corresponding to each electrode block
  • the display substrate display function is normal and the electrical performance of the self-capacitive touch electrode formed by the electrode block is normal; when corresponding to any electrode block
  • the self-capacitive touch electrode formed by the electrode block has an open circuit defect.
  • the electrode block may be divided into two test groups, and the setting mode is a normally black mode, when voltage signals are not applied to the electrode blocks of the two test groups and data signals are not applied to the plurality of pixel regions.
  • the corresponding pixel area displays a black screen; the method may include:
  • the second voltage is higher than the first voltage.
  • the method may include: maintaining the switching thin film transistor in an on state, applying different voltages to the electrode blocks of two test groups through different test signal points, respectively, when corresponding to each electrode block
  • the pixel area displays a color corresponding to the setting mode, determining that the electrical performance of the self-capacitive touch electrode formed by the electrode block is normal; when the pixel area corresponding to any electrode block displays a color that does not correspond to the setting mode
  • the self-capacitive touch electrode formed by the electrode block and the self-capacitive touch electrode formed by the adjacent electrode block are short-circuited.
  • the electrode block may be divided into two test groups, the setting mode is a normally black mode, and when a voltage signal is not applied to the electrode blocks of the two test groups, a corresponding pixel area displays a black picture;
  • Methods can include:
  • the first voltage may be 0V and the second voltage may be 5V.
  • the preliminary test of the touch performance is realized by the same means as the test display function, and the corresponding display substrate can be During the test process, the existing display function can be tested, and the touch performance of the display substrate can be initially tested, and the short circuit fault and the open circuit fault of the self-capacitive touch electrode formed by the electrode block can be detected.
  • the product yield of the display substrate is improved, thereby further ensuring the effective use of materials in the module process stage and reducing the material caused by defects in the module process stage. Loss, reduce production costs, and increase production profits.
  • FIG. 1 is a schematic view showing the arrangement of electrode blocks in a display substrate of the prior art
  • FIG. 2A is a schematic view showing a test group arrangement of electrode blocks in a display substrate according to Embodiment 1 of the present invention
  • FIG. 2B is a partial schematic view showing an ET structure of a display substrate according to Embodiment 1 of the present invention.
  • 3A-3C are timing diagrams showing a test method of a display substrate in Embodiment 1 of the present invention.
  • 4A-4E are schematic diagrams showing different test results of a test method for a display substrate in Embodiment 1 of the present invention.
  • 1-electrode block 110-first electrode block; 120-second electrode block; 2-switched thin film transistor; 3-drive signal point; 4-test signal point.
  • the embodiment provides a display substrate.
  • the display unit is provided with a test unit for testing the display performance of the display substrate and the electrical performance of the self-capacitive touch electrode.
  • the test unit can accurately test the test unit.
  • the open circuit fault or the short circuit fault existing in the touch electrode of the display substrate improves the test accuracy and improves the detection rate of the defective product, thereby reducing the production cost.
  • the display substrate includes a plurality of pixel regions arranged in a matrix and a test unit, each of the pixel regions is provided with a first electrode, wherein the test unit includes at least two sub-test units, and a plurality of the pixel regions adjacent to each other are disposed
  • the first electrode corresponds to an electrode block, and each electrode block is electrically isolated from each other.
  • the electrode block is divided into at least two test groups having the same number as the subtest unit according to the set position, and the electrode blocks belonging to the same test group are in the row direction. It is spaced apart from the column direction, and all the electrode blocks in the same test group are connected to a sub-test unit.
  • each pixel region includes three sub-pixel regions or four sub-pixel regions, each of the sub-pixel regions includes a second electrode, the second electrode is a pixel electrode, and the pixel electrode has a plate-like structure;
  • the plurality of pixel regions share the first electrode, and the first electrode is a common electrode.
  • the common electrode is a slit structure and is located above the pixel electrode. That is, the example display substrate in this embodiment is an advanced super-dimensional field conversion (ADSDS) mode display substrate, which generates an electric field generated by the edge of the slit electrode in the same plane and between the slit electrode layer and the plate electrode layer.
  • ADSDS advanced super-dimensional field conversion
  • the electric field forms a multi-dimensional electric field, so that all the aligned liquid crystal molecules between the slit electrodes in the liquid crystal cell and directly above the slit electrode can be rotated, thereby improving the working efficiency of the liquid crystal and increasing the light transmission efficiency, and the high-resolution, high-permeability Over-rate, low power consumption, wide viewing angle, high aperture ratio, low chromatic aberration, and no push mura.
  • each of the electrode blocks forms a touch sensor unit, that is, a self-capacitive touch electrode.
  • the common electrodes in the effective display region are divided into a plurality of electrode blocks 1 electrically insulated from each other in two directions perpendicular to each other (for example, in the horizontal direction and the vertical direction), and each electrode block 1 is Self-capacitive touch electrode.
  • the common electrode is divided into M ⁇ N fixed-size square regions, and each square region serves as an electrode block 1 to form a self-capacitive touch electrode.
  • 2A is an example in which the common electrode is divided into M of 9 and N is 6 total of 54 electrode blocks 1.
  • the ET structure will be described in detail by selecting an area having a size of 3 ⁇ 3 in the broken line frame in Fig. 2A.
  • the test unit includes a driving signal point 3, a test signal point 4 having the same number as the sub-test unit, and a plurality of switching thin film transistors 2 having the same number as the electrode block 1, the test signal point and
  • the test groups are in one-to-one correspondence, wherein the gates of all the switching thin film transistors 2 are connected to the driving signal point 3, the source of each switching thin film transistor 2 is connected to an electrode block 1, and the drain thereof is connected to one of the above
  • the signal point 4 is tested, which corresponds to the test group to which the electrode block 1 connected to the source of the switching thin film transistor 2 belongs.
  • the display substrate includes a display area and a non-display area surrounding the periphery of the display area, the plurality of pixel areas are located in the display area, the test unit is disposed in the non-display area, and the electrode block 1 passes through the metal trace and the switch film.
  • the source of the transistor 2 is connected.
  • the test unit may include a first sub-test unit and a second sub-test unit
  • the test group may include a first test group and a second test group
  • the electrode block 1 is separated by one in the row direction and the column direction.
  • the remaining electrode blocks 1 are set as the second test group; each electrode block 1 in the first test group (ie, the first electrode block 110 in FIG. 2A) is electrically connected to the first sub-test unit, and second Each of the electrode blocks 1 in the test group (i.e., the second electrode block 120 in Fig. 2A) is electrically connected to the second sub-test unit.
  • first electrode block 110 in the first test group and the second electrode block 120 in the second test group are distributed in a matrix as a whole, except for the electrode block at the edge of the display area of the display substrate, in the first test group
  • the adjacent sides of the first electrode block 110 in the row direction and the column direction are the second electrode block 120 in the second test group, and the second electrode block 120 in the second test group is in the row direction and the column direction.
  • the adjacent two sides are the first electrode block 110 in the first test group.
  • Each of the electrode blocks 1 corresponds to a plurality of pixel regions.
  • the size of each electrode block 1 is equivalent to the finger touch area.
  • the size of each electrode block 1 is 4 mm ⁇ 4mm for balance between touch accuracy and reduced circuitry.
  • the electrode blocks 1 forming the self-capacitive touch electrodes are divided into two groups (the electrode blocks 1 in FIG. 2B are in a specific two-digit identification order, and the first number identifies the row, The second number identifies the column in which it is located: the first test group includes the electrode block 11, the electrode block 13, the electrode block 22, the electrode block 31, and the electrode block 33; the second test group includes the electrode block 12, the electrode block 21, and the electrode block 23 , electrode block 32.
  • the electrode blocks in each group are not adjacent to each other in the row direction and the column direction.
  • the electrode blocks in the first test group are connected to the first test signal point 4 (ie, DTX-1) through the corresponding switch thin film transistor 2, and the electrode blocks in the second test group are connected to the second through the corresponding switch thin film transistor 2.
  • the gate of each of the switching thin film transistors 2 is connected to the driving signal point 3 (i.e., SW) to control the opening and closing of the switching thin film transistor 2.
  • the division method for the electrode block 1 in the above display substrate is simple, easy to process, the structure of the test unit is simple, and the reliability of the test result can be ensured.
  • the embodiment further provides a test method for displaying a substrate, wherein the test method corresponds to the display substrate, that is, the display substrate includes a plurality of pixel regions arranged in a matrix and a test unit, and each pixel region is provided with a first
  • the electrode unit includes at least two sub-test units, and the first electrode disposed in the plurality of pixel regions adjacent to each other corresponds to an electrode block 1, and the electrode blocks 1 are electrically isolated from each other, and the electrode block 1 is electrically disposed according to the set position.
  • the method includes:
  • the test unit may include a driving signal point 3, a test signal point 4 of the same number as the sub-test unit, and a plurality of switching thin film transistors 2 of the same number as the electrode block 1, wherein the gates of all the switching thin film transistors 2 are
  • the driving signal point 3 is connected, the source of each switching thin film transistor 2 is connected to an electrode block 1, and the drain thereof is connected to a test signal point 4, and the test signal point 4 corresponds to the switching thin film crystal
  • the test group to which the electrode block 1 of the tube 2 is connected; the method may include:
  • a voltage is applied to the gate of the switching thin film transistor 2 by driving the signal point 3, so that the switching thin film transistor 2 is turned on; respectively, passing different test signal points 4 (for example, the first test signal point 4) (ie, DTX-1) and the second test signal point 4 (ie, DTX-2)) apply the same voltage signal or different voltage signals to the drains of the plurality of switching thin film transistors 2 to display performance of the display substrate and The self-capacitive touch electrode formed by the electrode block 1 is tested for short-circuit failure or poor open circuit.
  • the gates of the rows of pixel thin film transistors are sequentially loaded with a 15V in one frame time.
  • a square wave signal (depending on actual needs) is used to open a pixel thin film transistor in a corresponding row of pixel regions, and the data signal Data of the source of each row of pixel thin film transistors can be subdivided into red (red) signals, green (Green) Signal, blue (Blue) signal, for convenience of explanation, the Data signal in Figures 3A - 3C is not subdivided.
  • the SW signal is always loaded with a voltage of 15V (depending on actual needs) for one frame time to control the output voltage of the pixel thin film transistor connected to the data signal Data and the first test signal point DTX-1 and the second test signal point.
  • the first test signal point DTX-1 and the second test signal point DTX-2 may be loaded with zero voltage or high voltage according to the test environment.
  • test signal point of the data signal Data is set (with the first test signal point DTX) -1 and the second test signal point DTX-2 have the same structure, not shown in FIG. 2B), so as to input the Data signal; at the same time, each electrode block 1 is input and displayed through a single metal trace.
  • the common voltage Vcom is required to ensure normal display function.
  • a test environment is to keep the switching thin film transistor 2 in an on state, respectively passing different test signal points 4 (ie, the first test signal point DTX-1 and the second test signal point DTX-2) to the two test groups.
  • the electrode block 1 applies the same voltage; when the pixel area corresponding to each electrode block 1 displays a color corresponding to the set mode, It is judged that the display function of the display substrate is normal and the electrical performance of the self-capacitive touch electrode formed by the electrode block 1 is normal; when the pixel area corresponding to a certain electrode block 1 displays a color that does not correspond to the setting mode, the electrode block is judged.
  • the self-capacitive touch electrode formed by 1 has a poor open circuit.
  • the electrode block 1 is divided into two test groups, the setting mode is a normally black mode, and voltage signals are not applied to the electrode blocks 1 of the two test groups, and the When the data signal Data is applied to the pixel area, the corresponding pixel area displays a black picture; the method includes:
  • a positive voltage of 15 V is applied to the SW to turn on all the switching thin film transistors 2; the first test signal point DTX-1 and the second test signal point DTX-2 are in one frame time.
  • the voltage of 0V is always loaded, and the voltage of 0V is applied to the electrode block 1 so that all the self-capacitive touch electrodes are at 0V.
  • the gate gate or gate drive circuit GOA signal
  • the source or source drive circuit signal
  • the voltage signal can realize the display of red (Red), green (Green), blue (Blue) and gray scale pictures in the corresponding pixel area, thereby realizing the display-related bad test.
  • the display substrate is displayed as a black screen as shown in FIG. 4A; when the timing waveform diagram as shown in FIG. 3A is loaded, the display substrate is displayed as shown in FIG. 4B according to the voltage magnitude of the data signal Data.
  • the data signal Data, the signal of the first test signal point DTX-1, and the signal of the second test signal point DTX-2 are respectively loaded with a positive voltage of 5V (Depending on the actual needs), if there is no open circuit fault in the self-capacitive touch electrode, since the voltages of the pixel electrode and the common electrode are both 5V, there is no voltage difference between the two, so the display substrate is displayed as a black screen, as shown in the figure. 4A is shown.
  • the electrode block 22 has an open circuit failure, the electrode block 22 is in a floating state, the potential of the electrode block 22 is maintained at about 0 V, and the data signal Data applied to the pixel electrode in the electrode block 22 is 5 V, so the electrode block 22 corresponds to The pixel area will be displayed as a white screen, as shown in FIG. 4C, so that the open defect of the self-capacitive touch electrode in the display substrate can be tested.
  • Another test environment is to keep the switching thin film transistor 2 in an on state, apply different voltages to the electrode blocks 1 of the two test groups through different test signal points 4, and display corresponding colors in the corresponding pixel regions corresponding to the set mode.
  • the electrical performance of the self-capacitive touch electrode formed by the electrode block 1 is normal; when the corresponding pixel area displays a color that does not correspond to the setting mode, the self-capacitive touch electrode formed by the electrode block 1 is determined.
  • the self-capacitive touch electrode formed by the adjacent electrode block has a short circuit defect.
  • the electrode block 1 is divided into two test groups, and the setting mode is the normally black mode as an example.
  • the voltage signal is not applied to the electrode blocks 1 of the two test groups and the data signals are not applied to the plurality of pixel regions, the corresponding pixel regions are used. Displaying a black screen; the method can include:
  • a voltage of 0 V and a voltage of 5 V are respectively applied to the electrode blocks 1 of the two test groups by different test signal points 4, and a data signal Data of 5 V is applied to the plurality of pixel regions, if the pixels corresponding to the adjacent electrode blocks 1 If the corresponding black and white images are respectively displayed, it is determined that there is no short circuit defect between the self-capacitive touch electrodes formed by the electrode block 1; if the pixel regions corresponding to the adjacent electrode blocks 1 all display a black image, the determination electrode There is a short circuit defect between the self-capacitive touch electrodes formed by the block 1.
  • the signals of the data signal Data and the first test signal point DTX-1 are respectively loaded with a positive voltage of 5V (depending on actual needs), and Signal loading of the second test signal point DTX-2 A 0V voltage signal.
  • the voltage of the pixel electrode and the common electrode of the first group of self-capacitive touch electrodes is 5V, and there is no voltage difference between the two, so the first group
  • the pixel area corresponding to the capacitive touch electrode is displayed as a black screen; and the second set of self-capacitive touch electrodes has a voltage difference of 5V between the pixel electrode and the common electrode, so the second group of self-capacitive touch electrodes
  • the corresponding pixel area is displayed as a white screen, and the entire display substrate displays a black and white picture as shown in FIG. 4D.
  • the potential of the electrode block 23 is pulled up to about 5 V by the electrode block 22, so that the pixel area corresponding to the electrode block 23 which is to display the white screen is displayed in black. As shown in FIG. 4E, the short circuit fault existing between adjacent self-capacitive touch electrodes in the display substrate can be tested.
  • the test process of the liquid crystal display panel and the electrical performance of the touch electrode are described. It is easy to understand that the first test signal point DTX-1 and the second test signal point DTX- 2
  • the adjustment of the loading voltage for example, loading the same voltage or a different voltage on the first test signal point DTX-1 and the second test signal point DTX-2, and the normal white mode can also be tested, which is not limited herein.
  • the switching thin film transistor may be either P-type or N-type, as long as the required control mode can be satisfied, which is not limited herein.
  • the ADSDS mode liquid crystal display substrate has been described as an example.
  • the display substrate may be a VA mode or the like, which is not limited herein.
  • the preliminary test of the touch performance is realized by the same method as the test display function, and the corresponding display substrate can be During the test process, the existing display function can be tested, and the touch performance of the display substrate can be initially tested, and the short circuit fault and the open circuit fault of the self-capacitive touch electrode formed by the electrode block can be detected.
  • the product yield of the display substrate is improved, thereby further ensuring the effective use of materials in the module process stage and reducing the material loss caused by defects in the module stage. Reduce production costs and increase production profits.
  • the embodiment provides a display device, which includes the display substrate in Embodiment 1, and tests the display function and the touch performance thereof by using a corresponding test method.
  • the display device adopts the above-mentioned high-yield display substrate, it has better display and touch effects, and the performance is more stable.

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Abstract

一种显示基板及其测试方法、显示装置。该显示基板包括呈矩阵排列的多个像素区以及测试单元，每一所述像素区均设置有第一电极，其中，所述测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的所述第一电极对应一电极块（1），各所述电极块（1）之间彼此电性隔离，所述电极块（1）根据设置位置划分为与所述子测试单元数量相同的至少两个测试组，属于同一所述测试组中的所述电极块（1）在行方向和列方向上均为间隔设置，同一所述测试组中所有所述电极块与一所述子测试单元连接。该测试单元能精确地测试出显示基板中存在的开路不良或短路不良，提高测试准确度并降低生产成本。

Description

显示基板及其测试方法、显示装置 技术领域
本发明属于显示技术领域，具体涉及一种显示基板及其测试方法、显示装置。
背景技术
为了实现触控显示面板的薄型化和轻量化，将触控面板和液晶显示面板一体化的研究日渐盛行。其中，将触控功能嵌入到液晶显示面板内部的In-Cell触控方案受到人们的广泛关注，In-Cell触控方案通常包括自容方式和互容方式。
对于高级超维场转换(ADvanced Super Dimension Switch，简称ADSDS)模式的液晶显示面板，自容方式的In-Cell触控方案具体为：如图1所示，将液晶显示面板上用作公共电极的金属层分割成彼此绝缘的若干方块(即电极块1)作为触控传感器单元，触控传感器单元通过特定的金属走线与驱动IC连接，当手指触碰液晶显示面板时即会引起相应位置处触控传感器单元的电容值的变化(也可以说，相应位置处公共电极的电压值的变化)，驱动IC通过检测电容值的变化来确定触碰点的位置，从而实现触控功能。
为确认产品质量，需对触控显示面板进行电测试(Electric Test，简称ET)。为了精简结构并提高测试效率，目前出现了采用同一结构对触控显示面板的显示功能和触控功能进行电测试的方法。但现有的ET结构，只能通过控制测试开关给所有触控传感器单元同时加载相同的测试信号，对于不同触控传感器单元之间的短路(short)不良无法测试。同时，当某一个触控传感器单元发生开路(open)不良时，此触控传感器单元会处于悬浮状态而不能加载测试信号，并具有初始零电位附近一个不确定的小电压值。因此，在对触控显示面板的显示功能进行测试，并且加载的测试信号为0V电压的情况下，虽然此(具有开路不良的)触控传 感器单元对应的显示区域和其他正常的触控传感器单元对应的显示区域在显示上会存在亮度差异，但是这种亮度差异可能非常微小，导致人眼无法分辨，最终导致可能存在的开路不良无法检出。
而且，采用自容式In-Cell设计需配合使用成本高昂的TDDI(Touch&Display Driver IC)部件，因此需尽量提高触控显示面板在模组工艺前的不良检出率，以最大程度地降低模组工艺阶段因触控显示面板不良造成的物料损失，特别是TDDI部件的损失。
但是，针对现有ADSDS型自容式触控显示面板的ET设计方案，无法检出不同触控传感器单元之间的短路不良，同时也不能确保完全检出触控传感器单元的开路不良，测试结果不准确，不良品检出率低；如果存在不良的触控显示面板进入到模组工艺环节，会进一步造成偏光片POL、驱动IC、柔性线路板FPC等物料的大量损失，增加生产成本。可见，对能精确地测试出触控显示面板的开路不良或短路不良，从而提高测试准确度、提高不良品检出率并降低生产成本的技术方案存在需求。
发明内容
针对现有技术中存在的上述不足，本发明实施例提供一种显示基板及其测试方法、显示装置，能精确地测试出显示基板中存在的开路不良或短路不良，提高测试准确度、提高不良品检出率并降低生产成本。
根据本发明的实施例，提供了一种显示基板，包括呈矩阵排列的多个像素区以及测试单元，每一所述像素区均设置有第一电极，其中，所述测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的所述第一电极对应一电极块，各所述电极块之间彼此电性隔离，所述电极块根据设置位置划分为与所述子测试单元数量相同的至少两个测试组，属于同一所述测试组中的所述电极块在行方向和列方向上均为间隔设置，同一所述测试组中所有所述电极块与一所述子测试单元连接。
所述测试单元可以包括一驱动信号点、与所述子测试单元数 量相同的测试信号点和与所述电极块数量相同的多个开关薄膜晶体管，所述测试信号点与所述测试组一一对应，所有所述开关薄膜晶体管的栅极可以均与所述驱动信号点连接，每一所述开关薄膜晶体管的源极可以与一所述电极块连接，其漏极可以连接至一所述测试信号点，该测试信号点对应于与该开关薄膜晶体管的源极相连接的一所述电极块所属的一所述测试组。
所述显示基板可以包括显示区以及包围在所述显示区外围的非显示区，所述多个像素区可以位于所述显示区，所述测试单元可以设置于所述非显示区，所述电极块可以通过金属走线与所述开关薄膜晶体管的源极连接。
所述测试单元可以包括第一子测试单元和第二子测试单元，所述测试组可以包括第一测试组和第二测试组，在行方向和列方向上每相隔一个的所述电极块可以设置为所述第一测试组，其余的所述电极块可以设置为所述第二测试组；所述第一测试组中的各所述电极块可以与所述第一子测试单元电连接，所述第二测试组中的各所述电极块可以与所述第二子测试单元电连接。
除处于所述显示基板边沿的所述电极块，所述第一测试组中的所述电极块在行方向和列方向上的相邻两侧可以均为所述第二测试组中的所述电极块，所述第二测试组中的所述电极块在行方向和列方向上的相邻两侧可以均为所述第一测试组中的所述电极块。
每一所述电极块的尺寸可以与手指触控面积相当。
每一所述电极块的尺寸可以为4mm×4mm。
每一所述电极块可形成一个触控传感器单元。
每一所述像素区可以包括三个子像素区或四个子像素区，多个所述像素区可以共用所述第一电极，所述第一电极可以为公共电极。
根据本发明的实施例，还提供了一种显示装置，包括上述的显示基板。
根据本发明的实施例，还提供了一种显示基板的测试方法， 所述显示基板包括呈矩阵排列的多个像素区以及测试单元，每一所述像素区均设置有第一电极，所述测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的所述第一电极对应一电极块，各所述电极块之间彼此电性隔离，所述电极块根据设置位置划分为与所述子测试单元数量相同的至少两个测试组，属于同一所述测试组中的所述电极块在行方向和列方向上均为间隔设置，同一所述测试组中所有所述电极块与一所述子测试单元连接；所述方法包括：
在属于不同所述测试组的所述电极块上分别施加相同的电压或不同的电压，通过所述显示基板中的像素区显示的颜色判断所述显示基板的显示性能以及由所述电极块形成的自容式触控电极的电性性能。
所述测试单元可以包括一驱动信号点、与所述子测试单元数量相同的测试信号点和与所述电极块数量相同的多个开关薄膜晶体管，所述测试信号点与所述测试组一一对应，所有所述开关薄膜晶体管的栅极可以均与所述驱动信号点连接，每一所述开关薄膜晶体管的源极可以与一所述电极块连接，其漏极连接至一所述测试信号点，该测试信号点对应于与该开关薄膜晶体管的源极相连接的一所述电极块所属的一所述测试组；所述方法包括：
根据所述开关薄膜晶体管的类型，通过所述驱动信号点对所述开关薄膜晶体管的栅极施加电压，使所述开关薄膜晶体管处于开启状态；以及分别通过不同的所述测试信号点对多个所述开关薄膜晶体管的漏极施加相同的电压信号或不同的电压信号，以对所述显示基板的显示性能以及由所述电极块形成的自容式触控电极的短路不良或开路不良进行测试。
所述方法可以包括：保持所述开关薄膜晶体管处于开启状态，分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加相同的电压，当对应于每个电极块的像素区显示与设定模式相应的颜色时，判断所述显示基板显示功能正常并且所述电极块形成的自容式触控电极的电性性能正常；当对应于任一电极块的 像素区显示与设定模式不对应的颜色时，判断该电极块形成的自容式触控电极存在开路不良。
所述电极块可以划分为两个测试组，所述设定模式为常黑模式，在不对两个所述测试组的所述电极块施加电压信号且不对所述多个像素区施加数据信号时，对应的像素区显示黑画面；所述方法可以包括：
分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加第一电压，并且对所述多个像素区施加第二电压的数据信号，若对应于每个电极块的像素区显示灰阶白画面，则判断所述显示基板的显示功能正常；
分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加第二电压，并且对所述多个像素区施加第二电压的数据信号，若对应于每个电极块的像素区显示黑画面，则判断所述电极块形成的自容式触控电极不存在开路不良；若对应于任一电极块的像素区显示白画面，则判断该电极块形成的自容式触控电极存在开路不良；
其中，所述第二电压高于所述第一电压。
所述方法可以包括：保持所述开关薄膜晶体管处于开启状态，分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加不同的电压，当对应于每个电极块的像素区显示与设定模式相应的颜色时，判断所述电极块形成的自容式触控电极的电性性能正常；当对应于任一电极块的像素区显示与设定模式不对应的颜色时，判断该电极块形成的自容式触控电极与相邻的所述电极块形成的自容式触控电极存在短路不良。
所述电极块可以划分为两个测试组，所述设定模式为常黑模式，在不对两个所述测试组的所述电极块施加电压信号时，对应的像素区显示黑画面；所述方法可以包括：
通过不同的所述测试信号点在两个所述测试组的所述电极块上分别施加第一电压和第二电压，若相邻的所述电极块对应的所述像素区分别显示相应的黑画面和白画面，则判断所述电极块形 成的自容式触控电极之间不存在短路不良；若相邻的所述电极块对应的所述像素区均显示黑画面，则判断所述电极块形成的自容式触控电极之间存在短路不良。
所述第一电压可以为0V，所述第二电压可以为5V。
根据本发明实施例提供的显示基板，通过测试单元结构的改进，并配合相应的显示基板的测试方法，通过与测试显示功能相同的手段实现了触控性能的初步测试，可在相应的显示基板的测试过程中，既可以实现现有显示功能的测试，同时还可以对显示基板的触控性能进行初步测试，对电极块形成的自容式触控电极存在的短路不良和开路不良进行检出，以最大程度的提高模组工艺阶段前的不良检出率，提高了显示基板的产品良率，从而能进一步保证模组工艺阶段中物料的有效利用，降低模组工艺阶段因不良造成的物料损失，降低生产成本，提高生产利润。
附图说明
图1为现有技术显示基板中电极块的排列示意图；
图2A为本发明实施例1显示基板中电极块的测试组排列示意图；
图2B为本发明实施例1中显示基板的ET结构的局部示意图；
图3A-图3C为本发明实施例1中显示基板的测试方法的时序图；
图4A-图4E为示出本发明实施例1中显示基板的测试方法的不同测试结果的示意图；
图中：
1－电极块；110－第一电极块；120－第二电极块；2－开关薄膜晶体管；3－驱动信号点；4－测试信号点。
具体实施方式
为使本领域技术人员更好地理解本发明的技术方案，下面结合附图和具体实施方式对本发明实施例提供的显示基板及其测试 方法、显示装置作进一步详细描述。
[实施例1]
本实施例提供一种显示基板，该显示基板中设置有测试单元，测试单元用于对显示基板的显示性能以及自容式触控电极的电性性能进行测试，该测试单元能精确地测试出显示基板的触控电极中存在的开路不良或短路不良，提高测试准确度，提高不良品检出率，从而降低生产成本。
该显示基板包括呈矩阵排列的多个像素区以及测试单元，每一像素区均设置有第一电极，其中，测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的第一电极对应一电极块，各电极块之间彼此电性隔离，电极块根据设置位置划分为与子测试单元数量相同的至少两个测试组，属于同一测试组中的电极块在行方向和列方向上均间隔设置，同一测试组中所有电极块与一子测试单元连接。
在本实施例的显示基板中，每一像素区包括三个子像素区或四个子像素区，每一子像素区均包括有一第二电极，第二电极为像素电极，像素电极为板状结构；多个像素区共用第一电极，第一电极为公共电极，在像素区域，公共电极为狭缝结构且位于像素电极的上方。也即，本实施例中的示例显示基板为高级超维场转换(ADSDS)模式显示基板，其通过同一平面内狭缝电极边缘所产生的电场以及狭缝电极层与板状电极层间产生的电场形成多维电场，使液晶盒内狭缝电极间、狭缝电极正上方所有取向液晶分子都能够产生旋转，从而提高了液晶工作效率并增大了透光效率，其具有高分辨率、高透过率、低功耗、宽视角、高开口率、低色差、无挤压水波纹(push Mura)等优点。
本实施例的显示基板中，每一电极块形成一触控传感器单元，即，自容式触控电极。如图2A所示，沿互相垂直的两个方向(例如沿水平方向和竖直方向)，将有效显示区内的公共电极分割为彼此电绝缘的若干个电极块1，每一电极块1即为一个自容式触控 电极。例如，将公共电极分割为M×N个固定大小方形区域，每一方形区域作为一个电极块1即形成一自容式触控电极。图2A以公共电极分割为M为9，N为6共54个电极块1作为示例。在本实施例下述的说明中，选取图2A中虚线框内大小为3×3的区域对ET结构进行详细说明。
具体的，如图2B所示，测试单元包括一驱动信号点3、与子测试单元数量相同的测试信号点4和与电极块1数量相同的多个开关薄膜晶体管2，所述测试信号点与所述测试组一一对应，其中，所有开关薄膜晶体管2的栅极均与驱动信号点3连接，每一开关薄膜晶体管2的源极与一电极块1连接，其漏极连接至一所述测试信号点4，该测试信号点4对应于与该开关薄膜晶体管2的源极相连接的所述电极块1所属的那个测试组。
在本实施例中，所述显示基板包括显示区以及包围在显示区外围的非显示区，多个像素区位于显示区，测试单元设置于非显示区，电极块1通过金属走线与开关薄膜晶体管2的源极连接。
作为一个示例，测试单元可以包括第一子测试单元和第二子测试单元，测试组可以包括第一测试组和第二测试组，在行方向和列方向上每相隔一个的电极块1设置为第一测试组，其余的电极块1设置为第二测试组；第一测试组中的各电极块1(即图2A中的第一电极块110)与第一子测试单元电连接，第二测试组中的各电极块1(即图2A中的第二电极块120)与第二子测试单元电连接。
也即，第一测试组中的第一电极块110和第二测试组中的第二电极块120整体上为矩阵分布，除处于显示基板的显示区边沿的电极块，第一测试组中的第一电极块110在行方向和列方向上的相邻两侧均为第二测试组中的第二电极块120，第二测试组中的第二电极块120在行方向和列方向上的相邻两侧均为第一测试组中的第一电极块110。
每一电极块1对应着多个像素区，例如，每一电极块1的尺寸与手指触控面积相当，例如，每一电极块1的尺寸为4mm× 4mm，以获得触控精度与精简电路的平衡。
如图2B所示的显示基板中，形成自容式触控电极的电极块1分为两组(图2B中各电极块1以具体的二位数标识顺序，第一数字标识其所在行，第二数字标识其所在列)：第一测试组包括电极块11、电极块13、电极块22、电极块31、电极块33；第二测试组包括电极块12、电极块21、电极块23、电极块32。每一组内的电极块在行方向和列方向上互不相邻。第一测试组内的电极块通过相应的开关薄膜晶体管2连接到第一测试信号点4(即DTX-1)上，第二测试组内的电极块通过相应的开关薄膜晶体管2连接到第二测试信号点4(即DTX-2)上，每一个开关薄膜晶体管2的栅极均与驱动信号点3(即SW)连接，以控制开关薄膜晶体管2的打开与关闭。
上述显示基板中针对电极块1的划分方法简单，易加工，测试单元的结构简单，并且能保证测试结果的可靠性。
相应的，本实施例还提供一种显示基板的测试方法，该测试方法对应着上述显示基板，即显示基板包括呈矩阵排列的多个像素区以及测试单元，每一像素区均设置有第一电极，测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的第一电极对应一电极块1，各电极块1之间彼此电性隔离，电极块1根据设置位置划分为与子测试单元数量相同的至少两个测试组，属于同一测试组中的电极块1在行方向和列方向上均间隔设置，同一测试组中所有电极块1与一子测试单元连接；所述方法包括：
在属于不同测试组的电极块1上分别施加相同的电压或不同的电压，通过显示基板中的像素区显示的颜色判断显示基板的显示性能以及电极块1形成的自容式触控电极的电性性能。
例如，测试单元可以包括一驱动信号点3、与子测试单元数量相同的测试信号点4和与电极块1数量相同的多个开关薄膜晶体管2，其中，所有开关薄膜晶体管2的栅极均与驱动信号点3连接，每一开关薄膜晶体管2的源极与一电极块1连接，其漏极连接至一测试信号点4，该测试信号点4对应于与该开关薄膜晶体 管2的源极相连接的一所述电极块1所属的那个测试组；所述方法可以包括：
根据开关薄膜晶体管2的类型，通过驱动信号点3对开关薄膜晶体管2的栅极施加电压，使开关薄膜晶体管2处于开启状态；分别通过不同的测试信号点4(例如，第一测试信号点4(即DTX-1)和第二测试信号点4(即DTX-2))对多个开关薄膜晶体管2的漏极施加相同的电压信号或不同的电压信号，以对显示基板的显示性能以及由电极块1形成的自容式触控电极的短路不良或开路不良进行测试。
参考图3A-图3C，在电测试过程中，在一帧的时间里各行像素薄膜晶体管的栅极(即，Gate-1、Gate-2、Gate-3直至Gate-n)分别依次加载一个15V(视实际需要而定)的方波信号，以打开相应的一行像素区内的像素薄膜晶体管，各行像素薄膜晶体管的源极的数据信号Data可以细分为红(Red)信号、绿(Green)信号、蓝(Blue)信号，为便于说明，图3A-图3C中的Data信号不做细分。SW信号在一帧时间内始终加载15V(视实际需要而定)的电压，以控制与数据信号Data连接的像素薄膜晶体管的输出电压以及与第一测试信号点DTX-1和第二测试信号点DTX-2连接的开关薄膜晶体管2的输出电压。第一测试信号点DTX-1和第二测试信号点DTX-2根据测试环境，可以加载零电压或高电压。
这里应该理解的是，通常情况下，对于显示功能，在电测试(ET)阶段尚未进行驱动IC的焊接，为了检测显示不良，会设置数据信号Data的测试信号点(与第一测试信号点DTX-1和第二测试信号点DTX-2相同的结构，在图2B中未标出)，以便于对Data信号进行输入；同时，每一电极块1均通过单独一根金属走线来输入显示需要的公共电压Vcom，以保证正常的显示功能。
一种测试环境为，保持开关薄膜晶体管2处于开启状态，分别通过不同的测试信号点4(即，第一测试信号点DTX-1和第二测试信号点DTX-2)对两个测试组的电极块1施加相同的电压；当对应于每个电极块1的像素区显示与设定模式相应的颜色时， 判断显示基板显示功能正常并且电极块1形成的自容式触控电极的电性性能正常；当对应于某个电极块1的像素区显示与设定模式不对应的颜色时，判断该电极块1形成的自容式触控电极存在开路不良。
例如，与图2A所示的显示基板的结构对应，电极块1划分为两个测试组，设定模式为常黑模式，在不对两个测试组的电极块1施加电压信号且不对所述多个像素区施加数据信号Data时，对应的像素区显示黑画面；所述方法包括：
分别通过不同的测试信号点4(即，第一测试信号点DTX-1和第二测试信号点DTX-2)对两个测试组的电极块1施加0V电压，并且对所述多个像素区施加5V的数据信号Data，若对应的像素区显示灰阶白画面，则判断显示基板的显示功能正常；
分别通过不同的测试信号点4(即，第一测试信号点DTX-1和第二测试信号点DTX-2)对两个测试组的电极块1施加5V电压，并且对所述多个像素区施加5V的数据信号Data，若对应于每个电极块1的像素区显示黑画面，则判断电极块1形成的自容式触控电极不存在开路不良；若对应于某个电极块1的像素区显示白画面，则判断该电极块1形成的自容式触控电极存在开路不良。
具体的，如图3A的时序波形图所示，在SW上加载15V的正电压，打开所有开关薄膜晶体管2；第一测试信号点DTX-1和第二测试信号点DTX-2在一帧时间里始终加载0V的电压，在电极块1上加载0V的电压，以使所有自容式触控电极都处于0V。在上述电极块1对应的像素区内，通过栅极Gate(或栅极驱动电路GOA信号)和源极(或源极驱动电路信号)为像素薄膜晶体管(图2B中未示出)加载适当的电压信号，即可实现对应像素区中红(Red)、绿(Green)、蓝(Blue)及灰阶画面的显示，从而实现对显示相关的不良的测试。不加载信号时，显示基板显示为如图4A所示的黑画面；当加载如图3A所示的时序波形图时，根据数据信号Data的电压大小不同，显示基板显示为如图4B所示 的具有一定灰阶的白画面。
如图3B所示的时序波形图，在一帧时间内，数据信号Data、第一测试信号点DTX-1的信号及第二测试信号点DTX-2的信号均分别加载一个5V的正电压(视实际需要而定)，若自容式触控电极不存在开路不良，由于像素电极和公共电极的电压都为5V，两者之间不存在电压差，因此显示基板显示为黑画面，如图4A所示。若电极块22存在开路不良，则电极块22处于悬浮状态，电极块22的电位会保持在0V左右，由于施加至电极块22内的像素电极的数据信号Data为5V，因此电极块22对应的像素区将显示为白画面，如图4C所示，以此，便能测试出显示基板中自容式触控电极存在的开路不良。
另一种测试环境是，保持开关薄膜晶体管2处于开启状态，通过不同的测试信号点4对两个测试组的电极块1施加不同的电压，当对应的像素区显示与设定模式相应的颜色时，判断电极块1形成的自容式触控电极的电性性能正常；当对应的像素区显示与设定模式不对应的颜色时，判断电极块1形成的自容式触控电极与相邻的电极块形成的自容式触控电极存在短路不良。
同样以电极块1划分为两个测试组，设定模式为常黑模式作为示例，在不对两个测试组的电极块1施加电压信号且不对多个像素区施加数据信号时，对应的像素区显示黑画面；所述方法可以包括：
通过不同的测试信号点4在两个测试组的电极块1上分别施加0V电压和5V电压，并且对所述多个像素区施加5V的数据信号Data，若相邻的电极块1对应的像素区分别显示相应的黑画面和白画面，则判断电极块1形成的自容式触控电极之间不存在短路不良；若相邻的电极块1对应的像素区均显示黑画面，则判断电极块1形成的自容式触控电极之间存在短路不良。
具体地，如图3C所示的时序波形图，在一帧时间内，数据信号Data、第一测试信号点DTX-1的信号均分别加载一个5V的正电压(视实际需要而定)，而第二测试信号点DTX-2的信号加载 一个0V的电压信号。如果自容式触控电极之间不存在短路不良，则第一组自容式触控电极由于像素电极和公共电极的电压都为5V，两者之间不存在电压差，因此第一组自容式触控电极所对应的像素区显示为黑画面；而第二组自容式触控电极由于像素电极和公共电极之间存在5V的电压差，因此第二组自容式触控电极所对应的像素区显示为白画面，整个显示基板显示如图4D所示的黑白相间的画面。若电极块22和电极块23之间存在短路不良，则电极块23的电位会被电极块22上拉到5V左右，从而使得对应于电极块23的本该显示白画面的像素区显示黑画面，如图4E所示，以此，便能测试出显示基板中相邻自容式触控电极之间存在的短路不良。
以上以常黑模式为例，对液晶显示面板的显示功能和触控电极电性性能的测试过程进行说明，容易理解的是，通过第一测试信号点DTX-1与第二测试信号点DTX-2加载电压的调整，例如在第一测试信号点DTX-1和第二测试信号点DTX-2上加载相同的电压或不同的电压，同样可以对常白模式进行测试，这里不做限定。
本实施例的显示基板的测试方法中，开关薄膜晶体管为P型或N型均可，只要能满足要求的控制模式即可，这里不做限定。
本实施例中以ADSDS模式液晶显示基板为例进行了说明，但是该显示基板也可以为VA模式等类似显示基板，这里不做限定。
在本实施例的显示基板中，通过对测试单元结构进行改进，并配合相应的显示基板的测试方法，通过与测试显示功能相同的手段实现了触控性能的初步测试，可在相应的显示基板的测试过程中，既可以实现现有显示功能的测试，同时还可以对显示基板的触控性能进行初步测试，对电极块形成的自容式触控电极存在的短路不良和开路不良进行检出，以最大程度的提高模组工艺阶段前的不良检出率，提高了显示基板的产品良率，从而能进一步保证模组工艺阶段中物料的有效利用，降低模组阶段因不良造成的物料损失，降低生产成本，提高生产利润。
[实施例2]
本实施例提供一种显示装置，该显示装置包括实施例1中的显示基板，并采用对应的测试方法对其中的显示功能和触控性能进行测试。
该显示装置由于采用了上述高良率的显示基板，因此具有更好的显示和触控效果，性能更稳定。
可以理解的是，以上实施方式仅仅是为了说明本发明的原理而采用的示例性实施方式，然而本发明并不局限于此。对于本领域内的普通技术人员而言，在不脱离本发明的精神和实质的情况下，可以做出各种变型和改进，这些变型和改进也视为本发明的保护范围。

Claims (17)

  1. 一种显示基板，包括呈矩阵排列的多个像素区以及测试单元，每一所述像素区均设置有第一电极，其中，所述测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的所述第一电极对应一电极块，各所述电极块之间彼此电性隔离，所述电极块根据设置位置划分为与所述子测试单元数量相同的至少两个测试组，属于同一所述测试组中的所述电极块在行方向和列方向上均为间隔设置，同一所述测试组中所有所述电极块与一所述子测试单元连接。
  2. 根据权利要求1所述的显示基板，其中，所述测试单元包括一驱动信号点、与所述子测试单元数量相同的测试信号点和与所述电极块数量相同的多个开关薄膜晶体管，所述测试信号点与所述测试组一一对应，所有所述开关薄膜晶体管的栅极均与所述驱动信号点连接，每一所述开关薄膜晶体管的源极与一所述电极块连接，其漏极连接至一所述测试信号点，该测试信号点对应于与该开关薄膜晶体管的源极相连接的一所述电极块所属的一所述测试组。
  3. 根据权利要求2所述的显示基板，其中，所述显示基板包括显示区以及包围在所述显示区外围的非显示区，所述多个像素区位于所述显示区，所述测试单元设置于所述非显示区，所述电极块通过金属走线与所述开关薄膜晶体管的源极连接。
  4. 根据权利要求2所述的显示基板，其中，所述测试单元包括第一子测试单元和第二子测试单元，所述测试组包括第一测试组和第二测试组，在行方向和列方向上每相隔一个的所述电极块设置为所述第一测试组，其余的所述电极块设置为所述第二测试组；所述第一测试组中的各所述电极块与所述第一子测试单元电 连接，所述第二测试组中的各所述电极块与所述第二子测试单元电连接。
  5. 根据权利要求4所述的显示基板，其中，除处于所述显示基板边沿的所述电极块，所述第一测试组中的所述电极块在行方向和列方向上的相邻两侧均为所述第二测试组中的所述电极块，所述第二测试组中的所述电极块在行方向和列方向上的相邻两侧均为所述第一测试组中的所述电极块。
  6. 根据权利要求1所述的显示基板，其中，每一所述电极块的尺寸与手指触控面积相当。
  7. 根据权利要求1所述的显示基板，其中，每一所述电极块的尺寸为4mm×4mm。
  8. 根据权利要求1所述的显示基板，其中，每一所述电极块形成一个触控传感器单元。
  9. 根据权利要求1所述的显示基板，其中，每一所述像素区包括三个子像素区或四个子像素区，多个所述像素区共用所述第一电极，所述第一电极为公共电极。
  10. 一种显示装置，包括权利要求1-9任一项所述的显示基板。
  11. 一种显示基板的测试方法，所述显示基板包括呈矩阵排列的多个像素区以及测试单元，每一所述像素区均设置有第一电极，所述测试单元包括至少两个子测试单元，位置相邻的多个所述像素区中设置的所述第一电极对应一电极块，各所述电极块之间彼此电性隔离，所述电极块根据设置位置划分为与所述子测试 单元数量相同的至少两个测试组，属于同一所述测试组中的所述电极块在行方向和列方向上均为间隔设置，同一所述测试组中所有所述电极块与一所述子测试单元连接；所述方法包括：
    在属于不同所述测试组的所述电极块上分别施加相同的电压或不同的电压，通过所述显示基板中的像素区显示的颜色判断所述显示基板的显示性能以及由所述电极块形成的自容式触控电极的电性性能。
  12. 根据权利要求11所述的显示基板的测试方法，其中，所述测试单元包括一驱动信号点、与所述子测试单元数量相同的测试信号点和与所述电极块数量相同的多个开关薄膜晶体管，所述测试信号点与所述测试组一一对应，所有所述开关薄膜晶体管的栅极均与所述驱动信号点连接，每一所述开关薄膜晶体管的源极与一所述电极块连接，其漏极连接至一所述测试信号点，该测试信号点对应于与该开关薄膜晶体管的源极相连接的一所述电极块所属的一所述测试组；所述方法包括：
    根据所述开关薄膜晶体管的类型，通过所述驱动信号点对所述开关薄膜晶体管的栅极施加电压，使所述开关薄膜晶体管处于开启状态；以及
    分别通过不同的所述测试信号点对多个所述开关薄膜晶体管的漏极施加相同的电压信号或不同的电压信号，以对所述显示基板的显示性能以及由所述电极块形成的自容式触控电极的短路不良或开路不良进行测试。
  13. 根据权利要求12所述的显示基板的测试方法，包括：
    保持所述开关薄膜晶体管处于开启状态，分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加相同的电压，
    当对应于每个电极块的像素区显示与设定模式相应的颜色时，判断所述显示基板显示功能正常并且所述电极块形成的自容式触控电极的电性性能正常；以及
    当对应于任一电极块的像素区显示与设定模式不对应的颜色时，判断该电极块形成的自容式触控电极存在开路不良。
  14. 根据权利要求13所述的显示基板的测试方法，其中，所述电极块划分为两个测试组，所述设定模式为常黑模式，在不对两个所述测试组的所述电极块施加电压信号且不对所述多个像素区施加数据信号时，对应的像素区显示黑画面；所述方法包括：
    分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加第一电压，并且对所述多个像素区施加第二电压的数据信号，若对应于每个电极块的像素区显示灰阶白画面，则判断所述显示基板的显示功能正常；
    分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加第二电压，并且对所述多个像素区施加第二电压的数据信号，若对应于每个电极块的像素区显示黑画面，则判断所述电极块形成的自容式触控电极不存在开路不良；若对应于任一电极块的像素区显示白画面，则判断该电极块形成的自容式触控电极存在开路不良，
    其中，所述第二电压高于所述第一电压。
  15. 根据权利要求12所述的显示基板的测试方法，包括：
    保持所述开关薄膜晶体管处于开启状态，分别通过不同的所述测试信号点对两个所述测试组的所述电极块施加不同的电压，
    当对应于每个电极块的像素区显示与设定模式相应的颜色时，判断所述电极块形成的自容式触控电极的电性性能正常；以及
    当对应于任一电极块的像素区显示与设定模式不对应的颜色时，判断该电极块形成的自容式触控电极与相邻的所述电极块形成的自容式触控电极之间存在短路不良。
  16. 根据权利要求15所述的显示基板的测试方法，其中，所 述电极块划分为两个测试组，所述设定模式为常黑模式，在不对两个所述测试组的所述电极块施加电压信号时，对应的像素区显示黑画面；所述方法包括：
    通过不同的所述测试信号点在两个所述测试组的所述电极块上分别施加第一电压和第二电压，
    若相邻的所述电极块对应的所述像素区分别显示相应的黑画面和白画面，则判断所述电极块形成的自容式触控电极之间不存在短路不良；以及
    若相邻的所述电极块对应的所述像素区均显示黑画面，则判断所述电极块形成的自容式触控电极之间存在短路不良。
  17. 根据权利要求14或16所述的显示基板的测试方法，其中，第一电压为0V，第二电压为5V。
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