WO2016003184A1 - Ensemble kit de sonde à del - Google Patents

Ensemble kit de sonde à del Download PDF

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Publication number
WO2016003184A1
WO2016003184A1 PCT/KR2015/006748 KR2015006748W WO2016003184A1 WO 2016003184 A1 WO2016003184 A1 WO 2016003184A1 KR 2015006748 W KR2015006748 W KR 2015006748W WO 2016003184 A1 WO2016003184 A1 WO 2016003184A1
Authority
WO
WIPO (PCT)
Prior art keywords
probe
pin
led
terminal
probe pin
Prior art date
Application number
PCT/KR2015/006748
Other languages
English (en)
Korean (ko)
Inventor
문용규
Original Assignee
(주)성진테크
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)성진테크 filed Critical (주)성진테크
Publication of WO2016003184A1 publication Critical patent/WO2016003184A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Definitions

  • the present invention relates to a probe kit for inspecting an LED for defects, and more particularly, a first terminal portion contacting an LED on a body and a probe pin provided on the body to inspect whether an LED is defective, and the first terminal portion. And a second terminal portion for transmitting electricity to the second terminal portion, and when the first terminal portion is worn out, the probe pin is turned over to maintain the second terminal portion as the first terminal portion and the existing first terminal portion as the second terminal portion.
  • the maintenance cost can be reduced, the service life can be extended, and the connection between the probe pin and the body through the tension means increases the service life, facilitates the movement of the probe pin, and improves the measurement accuracy.
  • An LED probe kit assembly may be provided.
  • a probe is provided to check whether the LED is defective.
  • the prior art includes a needle block having a plurality of needle pins protruding from an upper tip of the needle pin, and a probe substrate connected to a lower side of the needle block, wherein the plurality of needle pins come into contact with an LED in a wafer state.
  • An LED inspection probe card is provided, which is characterized in that it is possible.
  • the prior art uses a needle pin for large area inspection of the electrical performance of the LED.
  • the needle pin When the needle pin is broken by a large amount of LED inspection, the needle pin must be replaced with a new needle pin, thereby increasing maintenance costs. There is a problem.
  • the prior art relates to a movable member movable in one direction, a conductive member mounted on the movable member, at least a surface of which is configured to have electrical conductivity, and a lower surface of which is in contact with the surface of the conductive member and an upper surface of the LED device.
  • the second pad may be in contact, and when the contact is in contact with the second pad relates to an LED electrical inspection method comprising an elastic conductive sheet capable of electrically connecting the second pad and the conductive member to each other.
  • the first and second pads are used to provide an electric flow to the LEDs to check for defects.
  • the electrodes are contacted to provide the electric flows to the LED devices, the parts to which the electrodes are connected are worn out. In this case, there is a problem in that the maintenance cost increases due to a new replacement.
  • the present invention has been made to solve the above problems, in the LED probe kit assembly,
  • the objective is to provide an LED probe kit assembly that can be flipped over and reused.
  • the pair of probe pins are provided symmetrically with each other, but are configured to form a spaced portion between adjacent first terminal portions to prevent an electrical short caused by a short circuit between each probe pin through which different electrodes flow. Another purpose.
  • the probe pin further includes an extension part in the moving groove of the body to which the probe pin moves to reduce the frictional force when the probe pin moves, thereby preventing wear and breakage, and at the same time, easily reciprocating between the moving grooves by the reduced frictional force. It is an object of the present invention to provide an LED probe kit assembly.
  • a body provided with a pair of moving grooves
  • a head coupled to the body and covering the body
  • a pair of probe pins each comprising a body provided in the movable groove, and a terminal member including first and second terminal portions respectively provided at both ends of the body;
  • tensioning means including a fixing pin provided on the body, a tension pin provided on the probe pin, and an elastic body connecting the fixing pin and the tension pin.
  • the first terminal part and the second terminal part of the probe pin may be used by inverting the probe pins.
  • the LED probe pin assembly includes a pair of probe pins provided on the body, the head covering the body, and the body to perform a reciprocating motion and to impart an electric flow to the LED to inspect the LED for defects.
  • the first terminal part is worn, the first terminal part and the second terminal part are provided at both ends of the probe pin, and the probe pin is turned upside down so that the first terminal part and the second terminal part cross each other. Maintenance costs can be reduced by flipping over without having to replace a new one.
  • a terminal member consisting of the first terminal portion and the second terminal portion is provided at both ends of the probe pin in a Y-shape, respectively, so that when the first terminal portion is worn, it can be used four times by turning it horizontally or vertically. Can improve durability, prolong the service life,
  • the life of the probe can be extended, the movement can be made faster, and the accuracy can be improved than the conventional methods such as the piston and the compression method.
  • FIG. 1 is a perspective view of an LED probe kit assembly according to the present invention
  • FIG. 2 is an exploded perspective view of the LED probe kit assembly according to the invention
  • FIG. 3 is a cross-sectional view of an LED probe kit assembly according to the present invention.
  • FIG. 4 is a first embodiment of an LED probe kit assembly according to the present invention.
  • FIG. 5 is a second embodiment of an LED probe kit assembly according to the present invention.
  • probe pin 31 body
  • terminal member 331 first terminal portion
  • the same reference numerals in particular, the tens and ones digits, or the same digits, tens, ones, and alphabets refer to members having the same or similar functions, and unless otherwise specified, each member in the figures The member referred to by the reference numeral may be regarded as a member conforming to these criteria.
  • the LED probe kit assembly A is provided in the body 10, the head 20 covering the body 10, and the body 10. It consists of a probe pin 30 for inspecting whether the LED is imparted by electrical flow.
  • the body 10 is provided with a plurality of coupling holes 12 for coupling with the head 20.
  • the head 20 is provided with a corresponding coupling hole 21 corresponding to the coupling hole 12, the fixing hole is formed separately as the screw thread is formed in the coupling hole 12 or the corresponding coupling hole 21 Fixing bolts to the head 20 and the body 10 by using a bolt to be firmly fixed by screwing the coupling hole 12 and the corresponding coupling hole 21.
  • the body 10 and the head 20 are provided with first and second fixing holes 14 and 23 penetrating at corresponding positions, respectively, which are the first and second fixing holes 14 ( 23) through the fixing bolt penetrating the first and second through-holes to the inspection device for inspecting the LED (10)-head (20) assembly of the LED failure.
  • the rear surface of the body 10 is preferably provided with a positioning hole different in shape or diameter from each other, so that it can be coupled to maintain the orientation to the inspection device.
  • a moving groove 11 is provided in the body 10 of the LED probe kit assembly A according to the present invention, and the moving groove 11 is an upper portion of the body 10. Two is provided in a pair, the moving groove 11 is configured to be larger than the width of the moving portion 111 and the moving portion 111 is configured to be the same as the width of the probe pin (30)
  • the moving part 111 is composed of a plurality of expansion portion 112 is provided. Accordingly, when the probe pin 30 is seated in the movable groove 11, the probe pin 30 may reciprocate without shaking by the moving part 111, and the extension part 112 may be provided.
  • the moving groove 11 is preferably formed symmetrically about the center of the center of the body 10, the distance between each moving groove 11 is the first terminal portion 331 of the probe pin 30 to be described later Is preferably kept at a distance not in contact with each other.
  • the moving groove 11 is provided with a probe pin 30 for imparting electrical flow to the LED
  • the probe pin 30 is provided in each of the pair of moving grooves 11, the structure is symmetrical with each other It is to be coupled, for the convenience of the description will be described based on the probe pin 30 provided in one moving groove 11 and should not be limited to the scope of this right.
  • the probe pin 30 may include a body 31 provided in the moving groove 11 and a first terminal part 331 respectively provided at both ends of the body 31. ) And the second terminal portion 333. More specifically, the probe pin 30 is provided with a body 31 that can be seated in the moving groove 11, the fixing pin 41 of the tension means 40 to be described later in the center of the body 31 ) Is provided with a moving hole 311 through which movement is possible. In addition, the end of the body 31 is provided with a terminal member 33, the terminal member 33 is the first terminal portion 331 provided at one end of the body 31, and of the body 31 The second terminal portion 333 is provided at the other end.
  • the first terminal portion 331 and the second terminal portion 333 are formed in the same shape with each other, provided in a symmetrical shape with respect to the body 31, the first terminal portion 331 for convenience of description As a reference, the first terminal portion 331 is provided at the end of the body 31 and is bent to one side of the first bent portion 331A, the first bent portion 331A of the body 31 of the The first inspection unit 331B is bent in the longitudinal direction to inspect the LED in contact with the defect.
  • the second terminal portion 333 provided at the other end of the probe pin 30 may have the same shape as the first terminal portion 331, but the second bent portion 333A provided symmetrically with the first terminal portion 331. ) And a second inspection portion 333B extending from the second bending portion 333A and being bent in the longitudinal direction of the body 31.
  • the electrode is connected to the second terminal portion 333 of the probe pin 30, and as the connected electric flow flows to the LED through the first inspection unit 331B, the LED is monitored for failure, and the probe pin As the 30 is provided in pairs, the current is circulated through the different electrodes so that the LEDs can be inspected for defects.
  • the probe pin 30 when the first terminal part 331 is worn or damaged as the first terminal part 331 and the second terminal part 333 are symmetrically provided in the same shape, the probe pin 30 By inverting the second terminal part 333 to be in contact with the LED, the worn probe pin 30 can be reused once more, thereby extending the life and reducing the maintenance cost.
  • the distance of the movable groove 11 is a distance that can form the spacer 335 between each of the first terminal portion 331 when the pair of probe pins 30 are coupled to each movable groove 11. It is preferable to be provided with, and as the different electrodes are connected by the spacer 335 to solve the problem that the electrical short flows, even if the LED does not pass the electricity flows smoothly to check whether the defect of the LED can not be inspected. do.
  • the probe pin 30 is provided with a plurality of moving aids 312, when the probe pin 30 moves in the moving groove 11, the air smoothly through the moving aid 312 It is more desirable to be able to circulate and to reduce the frictional force so as to smoothly reciprocate.
  • LED probe kit assembly (A) according to the present invention is further provided with a tension means 40 for connecting the body 10 and the probe pin 30.
  • the tension means 40 includes a fixing pin 41 provided on the body 10, a tension pin 43 provided on the probe pin 30, and the fixing pin 41 and a tension pin.
  • the elastic body 45 which connects 43 is comprised. More specifically, the fixing pins 41 are provided at the centers of the moving grooves 11 of the body 10, respectively, when the probe pins 30 are coupled to the moving grooves 11, the probe pins 30 It passes through the moving hole 311 provided in the).
  • the tension pin 43 is provided on the body 31 of the probe pin 30, and the tension pin 43 used when the LED is inspected using the first terminal portion 331 is the second terminal portion.
  • the tension pin 43 used when inspecting the LED using the second terminal portion 333 is provided to protrude on the rear surface of the first terminal portion 331.
  • the front and the rear determine the direction in which the head 20 is provided on the front side and the direction in which the body 10 is provided on the basis of the case of inspecting the first terminal unit 331 by using the first terminal unit 331.
  • the movable groove 11 is further provided with an accommodation groove 114 for accommodating the tension pin 43 so as not to disturb the movement of the probe pin 30.
  • an elastic body 45 is further provided to connect the fixing pin 41 and the tension pin 43. More specifically, one side of the elastic body 45 is coupled to the tension pin 43, and the other side is fixed. As shown in FIG. 3 as it is coupled to the pin 41, a pair of first terminal portions 331 are normally moved forward (in the direction of the first terminal portion 331), and when the test is performed, the probe The pin 30 is moved to the rear by contacting the LED and inspected. After the inspection is completed, the probe pin 30 can be moved to the initial position by the elastic force of the elastic body 45, thereby providing a conventional compression and piston method. It can move more naturally than using the method, and has the effect of improving durability and improving measurement accuracy.
  • the fixing pin 41, the tension pin 43, the seating groove 25, which is mounted on the elastic body 45 is provided in the head 20, the head 20 to the body 10 Even when covering, the fixing pin 41, the tension pin 43, the elastic body 45 is accommodated in the seating groove 25 does not interfere with the movement of the probe pin 30, the head 20 and the body ( 10) to be tightly coupled.
  • Figure 5 again shows another embodiment of the LED probe pin 30 according to the present invention
  • the probe pin 30 is a body 31, the terminal member provided at both ends of the body 31 33, the terminal member 33 includes a first terminal portion 331 provided at one end of the body 31 and a second terminal portion 333 provided at the other end.
  • the first bent portion 331A to be provided in the first terminal portion 331 is formed in a Y-shape provided on both sides at the end of the body 31, each of the first bent portion 331A (
  • Each of the first inspection parts 331B and 331B ' is provided in a symmetrical shape, and the second terminal part 333 also has a Y-shaped pair of second bent parts 333A ( 333A 'and second inspection units 333B and 333B'.
  • the probe pin 30 when the first terminal portion 331 of the probe pin 30 is worn, the probe pin 30 may be turned upside down and replaced, or the second terminal portion 333 may be flipped back and forth as mentioned above.
  • the tension pins 43 provided on the probe pins 30 are provided on both the front and rear surfaces of the body of the probe pins 30.
  • the tension pins 43 and the fixing pins 41 provided in the probe pins 30 and the body 10, respectively, are not shown in the drawings, but the pin grooves or the probe pins 30 and the body 10 are not shown in the drawings. It is more preferable that the pin hole is provided, and the tension pin 43 or the fixing pin 41 is firmly fixed to the pin groove or the pin hole in an interference fit manner.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

La présente invention concerne un kit de sonde permettant de vérifier si une DEL se trouve en bon ou en mauvais état, et concerne plus particulièrement un ensemble kit de sonde à DEL comprenant des première et seconde bornes qui équipent un corps, et une broche de sonde disposée sur le corps, afin de vérifier si une DEL se trouve en bon ou en mauvais état, la première borne venant en contact avec la DEL, et la seconde borne transmettant de l'électricité vers la première borne. Dans des cas d'usure de la première borne, la broche de sonde est retournée afin d'utiliser la seconde borne en tant que première borne et d'utiliser la première borne en tant que seconde borne, ce qui permet de réduire le coût de maintenance et de prolonger le temps d'utilisation. En outre, étant donné que la broche de sonde et le corps sont reliés l'un à l'autre par l'intermédiaire d'un moyen de traction, la durée de vie peut être augmentée, par comparaison avec un procédé de compression existant, et la broche de sonde peut être déplacée facilement, ce qui permet d'améliorer la précision de mesure.
PCT/KR2015/006748 2014-07-04 2015-07-01 Ensemble kit de sonde à del WO2016003184A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2014-0083792 2014-07-04
KR1020140083792A KR101531150B1 (ko) 2014-07-04 2014-07-04 Ｌｅｄ 프로브 킷 어셈블리

Publications (1)

Publication Number Publication Date
WO2016003184A1 true WO2016003184A1 (fr) 2016-01-07

Family

ID=53519696

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2015/006748 WO2016003184A1 (fr) 2014-07-04 2015-07-01 Ensemble kit de sonde à del

Country Status (2)

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KR (1) KR101531150B1 (fr)
WO (1) WO2016003184A1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110319925A (zh) * 2019-08-05 2019-10-11 淮安杰鼎唐科技有限公司 Led检测装置
WO2020035695A1 (fr) 2018-08-15 2020-02-20 The University Of Manchester Guides d'ondes actifs à commande électrique

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003217774A (ja) * 2002-01-28 2003-07-31 Enplas Corp コンタクトピン及びｉｃソケット
JP2004199921A (ja) * 2002-12-17 2004-07-15 Enplas Corp コンタクトピン，コンタクトピン成形方法及び電気部品用ソケット
KR20070017858A (ko) * 2005-08-08 2007-02-13 주식회사 프로텍 액정디스플레이 검사기용 프로브 조립체
JP3143846U (ja) * 2008-05-27 2008-08-07 日本ガーター株式会社 電子部品分類機の検査機構
JP2012112709A (ja) * 2010-11-22 2012-06-14 Unitechno Inc ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003217774A (ja) * 2002-01-28 2003-07-31 Enplas Corp コンタクトピン及びｉｃソケット
JP2004199921A (ja) * 2002-12-17 2004-07-15 Enplas Corp コンタクトピン，コンタクトピン成形方法及び電気部品用ソケット
KR20070017858A (ko) * 2005-08-08 2007-02-13 주식회사 프로텍 액정디스플레이 검사기용 프로브 조립체
JP3143846U (ja) * 2008-05-27 2008-08-07 日本ガーター株式会社 電子部品分類機の検査機構
JP2012112709A (ja) * 2010-11-22 2012-06-14 Unitechno Inc ケルビンコンタクトプローブおよびそれを備えたケルビン検査治具

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020035695A1 (fr) 2018-08-15 2020-02-20 The University Of Manchester Guides d'ondes actifs à commande électrique
CN110319925A (zh) * 2019-08-05 2019-10-11 淮安杰鼎唐科技有限公司 Led检测装置

Also Published As

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