ATE549770T1 - Untersuchungsgeräte für eine schaltungseinrichtung mit anisotropem leitfähigen verbinder - Google Patents
Untersuchungsgeräte für eine schaltungseinrichtung mit anisotropem leitfähigen verbinderInfo
- Publication number
- ATE549770T1 ATE549770T1 AT04747585T AT04747585T ATE549770T1 AT E549770 T1 ATE549770 T1 AT E549770T1 AT 04747585 T AT04747585 T AT 04747585T AT 04747585 T AT04747585 T AT 04747585T AT E549770 T1 ATE549770 T1 AT E549770T1
- Authority
- AT
- Austria
- Prior art keywords
- anisotropically conductive
- conductive connector
- sheet
- forming parts
- circuit device
- Prior art date
Links
- 238000011835 investigation Methods 0.000 title 1
- 238000007689 inspection Methods 0.000 abstract 3
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/007—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for elastomeric connecting elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Measuring Leads Or Probes (AREA)
- Non-Insulated Conductors (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2004/010119 WO2006008784A1 (ja) | 2004-07-15 | 2004-07-15 | 異方導電性コネクター装置および回路装置の検査装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE549770T1 true ATE549770T1 (de) | 2012-03-15 |
Family
ID=35784920
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT04747585T ATE549770T1 (de) | 2004-07-15 | 2004-07-15 | Untersuchungsgeräte für eine schaltungseinrichtung mit anisotropem leitfähigen verbinder |
Country Status (6)
Country | Link |
---|---|
US (1) | US7384280B2 (de) |
EP (1) | EP1768214B1 (de) |
KR (1) | KR101030360B1 (de) |
CN (1) | CN100468868C (de) |
AT (1) | ATE549770T1 (de) |
WO (1) | WO2006008784A1 (de) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8518304B1 (en) | 2003-03-31 | 2013-08-27 | The Research Foundation Of State University Of New York | Nano-structure enhancements for anisotropic conductive material and thermal interposers |
KR100921268B1 (ko) * | 2003-11-17 | 2009-10-09 | 제이에스알 가부시끼가이샤 | 이방 도전성 시트, 그의 제조 방법 및 그의 응용 제품 |
JP2006194620A (ja) * | 2005-01-11 | 2006-07-27 | Tokyo Electron Ltd | プローブカード及び検査用接触構造体 |
TWI403723B (zh) * | 2005-12-21 | 2013-08-01 | Jsr Corp | Manufacturing method of foreign - shaped conductive connector |
WO2007116826A1 (ja) * | 2006-04-11 | 2007-10-18 | Jsr Corporation | 異方導電性コネクターおよび異方導電性コネクター装置 |
JP5008005B2 (ja) | 2006-07-10 | 2012-08-22 | 東京エレクトロン株式会社 | プローブカード |
US7816932B2 (en) * | 2008-02-21 | 2010-10-19 | Teradyne, Inc. | Test system with high frequency interposer |
KR200446269Y1 (ko) * | 2008-02-25 | 2009-10-29 | 주식회사 아이에스시테크놀러지 | 갭부재를 가진 테스트소켓 |
KR101037786B1 (ko) * | 2008-08-21 | 2011-05-27 | 주식회사 아이에스시테크놀러지 | 스프링 내부에 도전성 와이어가 삽입된 테스트 소켓 및 그 테스트 소켓의 제작방법 |
CN101825787B (zh) * | 2009-03-04 | 2013-06-12 | 北京京东方光电科技有限公司 | 触摸显示屏及其制造方法 |
WO2010101125A1 (ja) * | 2009-03-05 | 2010-09-10 | ポリマテック株式会社 | 弾性コネクタ及び弾性コネクタの製造方法並びに導通接続具 |
JP5698080B2 (ja) * | 2011-06-28 | 2015-04-08 | デクセリアルズ株式会社 | 異方性導電フィルム、接続方法、及び接合体 |
CN103094737A (zh) * | 2011-11-05 | 2013-05-08 | 宝宸(厦门)光学科技有限公司 | 引脚结构与引脚连接结构 |
KR101204940B1 (ko) * | 2011-12-26 | 2012-11-27 | 주식회사 아이에스시 | 전기적 콘택터 및 전기적 콘택터의 제조방법 |
JP2013206707A (ja) * | 2012-03-28 | 2013-10-07 | Fujitsu Ltd | 実装用アダプタ、プリント基板及びその製造方法 |
KR101204941B1 (ko) | 2012-04-27 | 2012-11-27 | 주식회사 아이에스시 | 전극지지부를 가지는 테스트용 소켓 및 그 테스트용 소켓의 제조방법 |
KR101468586B1 (ko) * | 2013-07-16 | 2014-12-03 | 주식회사 아이에스시 | 도전성 커넥터 및 그 제조방법 |
KR101532389B1 (ko) * | 2013-12-27 | 2015-06-30 | 주식회사 아이에스시 | 도전성 시트 및 복합 도전성 시트 |
US9742091B2 (en) * | 2014-04-11 | 2017-08-22 | R&D Sockets, Inc. | Method and structure for conductive elastomeric pin arrays using solder interconnects and a non-conductive medium |
KR101614472B1 (ko) * | 2015-01-26 | 2016-04-29 | 주식회사 아이에스시 | 검사용 커넥터 |
KR101959536B1 (ko) * | 2016-04-05 | 2019-03-18 | 주식회사 아이에스시 | 이종의 입자가 혼합된 도전성 입자를 포함하는 이방도전성 시트 |
KR102282081B1 (ko) * | 2016-11-30 | 2021-07-27 | 데쿠세리아루즈 가부시키가이샤 | 도전 입자 배치 필름, 그 제조 방법, 검사 프로브 유닛, 도통 검사 방법 |
JP7061810B2 (ja) * | 2016-12-07 | 2022-05-02 | ウェハー エルエルシー | 低損失電送機構及びそれを使用するアンテナ |
KR102361639B1 (ko) * | 2017-07-10 | 2022-02-10 | 삼성전자주식회사 | 유니버설 테스트 소켓, 반도체 테스트 장비, 및 반도체 장치의 테스트 방법 |
US10886653B2 (en) | 2018-05-08 | 2021-01-05 | R&D Sockets, Inc | Method and structure for conductive elastomeric pin arrays using conductive elastomeric interconnects and/or metal caps through a hole or an opening in a non-conductive medium |
JP7405337B2 (ja) * | 2018-10-11 | 2023-12-26 | 積水ポリマテック株式会社 | 電気接続シート、及び端子付きガラス板構造 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4209481A (en) * | 1976-04-19 | 1980-06-24 | Toray Industries, Inc. | Process for producing an anisotropically electroconductive sheet |
US5502889A (en) * | 1988-06-10 | 1996-04-02 | Sheldahl, Inc. | Method for electrically and mechanically connecting at least two conductive layers |
US5474458A (en) * | 1993-07-13 | 1995-12-12 | Fujitsu Limited | Interconnect carriers having high-density vertical connectors and methods for making the same |
JP3400051B2 (ja) * | 1993-11-10 | 2003-04-28 | ザ ウィタカー コーポレーション | 異方性導電膜、その製造方法及びそれを使用するコネクタ |
US5456004A (en) * | 1994-01-04 | 1995-10-10 | Dell Usa, L.P. | Anisotropic interconnect methodology for cost effective manufacture of high density printed circuit boards |
JP4290236B2 (ja) | 1998-01-12 | 2009-07-01 | Jsr株式会社 | 導電性ゴムシートの製造方法 |
JP3865019B2 (ja) | 1998-03-23 | 2007-01-10 | Jsr株式会社 | 異方導電性シートおよびその製造方法 |
JP4099905B2 (ja) | 1999-06-08 | 2008-06-11 | Jsr株式会社 | 異方導電性シート用支持体および支持体付異方導電性シート |
JP4385498B2 (ja) * | 2000-06-09 | 2009-12-16 | Jsr株式会社 | シート状コネクターおよびその製造方法並びに電気的検査装置 |
US6720787B2 (en) * | 2000-09-25 | 2004-04-13 | Jsr Corporation | Anisotropically conductive sheet, production process thereof and applied product thereof |
JP4734706B2 (ja) * | 2000-11-01 | 2011-07-27 | Jsr株式会社 | 電気抵抗測定用コネクター並びに回路基板の電気抵抗測定装置および測定方法 |
US7059874B2 (en) * | 2002-03-19 | 2006-06-13 | Paricon Technologies, Inc. | Anisotropic conductive elastomer based electrical interconnect with enhanced dynamic range |
-
2004
- 2004-07-15 CN CNB2004800435807A patent/CN100468868C/zh not_active Expired - Fee Related
- 2004-07-15 AT AT04747585T patent/ATE549770T1/de active
- 2004-07-15 WO PCT/JP2004/010119 patent/WO2006008784A1/ja not_active Application Discontinuation
- 2004-07-15 EP EP04747585A patent/EP1768214B1/de not_active Not-in-force
- 2004-07-15 KR KR1020077000634A patent/KR101030360B1/ko active IP Right Grant
- 2004-07-15 US US11/571,935 patent/US7384280B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP1768214B1 (de) | 2012-03-14 |
WO2006008784A1 (ja) | 2006-01-26 |
KR20070027697A (ko) | 2007-03-09 |
CN1989657A (zh) | 2007-06-27 |
US7384280B2 (en) | 2008-06-10 |
CN100468868C (zh) | 2009-03-11 |
US20070281516A1 (en) | 2007-12-06 |
EP1768214A4 (de) | 2008-05-07 |
EP1768214A1 (de) | 2007-03-28 |
KR101030360B1 (ko) | 2011-04-20 |
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