WO2015174132A1 - Procédé d'évaluation de caractéristique optique de substrat transparent, et substrat transparent - Google Patents

Procédé d'évaluation de caractéristique optique de substrat transparent, et substrat transparent Download PDF

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Publication number
WO2015174132A1
WO2015174132A1 PCT/JP2015/057694 JP2015057694W WO2015174132A1 WO 2015174132 A1 WO2015174132 A1 WO 2015174132A1 JP 2015057694 W JP2015057694 W JP 2015057694W WO 2015174132 A1 WO2015174132 A1 WO 2015174132A1
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Prior art keywords
transparent substrate
glare
index value
luminance distribution
antiglare
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PCT/JP2015/057694
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English (en)
Japanese (ja)
Inventor
稔 玉田
裕介 小林
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旭硝子株式会社
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Application filed by 旭硝子株式会社 filed Critical 旭硝子株式会社
Priority to JP2015540938A priority Critical patent/JP6341210B2/ja
Priority to CN201580024709.8A priority patent/CN106461502B/zh
Priority to KR1020167031511A priority patent/KR102321551B1/ko
Publication of WO2015174132A1 publication Critical patent/WO2015174132A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements

Definitions

  • the present invention relates to a method for evaluating the optical characteristics of a transparent substrate.
  • a protective cover made of a transparent substrate is disposed to protect the display device.
  • an antiglare treatment may be applied to the surface of the transparent substrate.
  • Patent Document 1 discloses a method for evaluating the reflection on a display device using a special device.
  • the transparent substrate is often subjected to an antiglare treatment.
  • the glare of the transparent substrate has a problem that it is difficult to say that an evaluation method has been sufficiently established so far, and it is difficult to quantitatively evaluate it.
  • SMS-1000 apparatus manufactured by Display-Messtechnik & System
  • glare of a transparent substrate can be evaluated by analyzing an image (luminance) of a part of the transparent substrate taken through a solid-state imaging device.
  • the present invention has been made in view of such a background, and the present invention provides an evaluation method capable of appropriately evaluating both the antiglare property and the glare of an antiglare-treated transparent substrate. Objective.
  • a method for evaluating the optical characteristics of a transparent substrate Obtaining a quantified anti-glare index value of a transparent substrate having first and second surfaces, the first surface being anti-glare treated; Obtaining a quantified glare index value of the transparent substrate;
  • the transparent substrate has first and second surfaces, and the first surface is antiglare treated.
  • the antiglare index value R is 0.4 or more
  • a transparent substrate is provided in which the glare index value G is 0.6 or less.
  • the surface of the transparent substrate subjected to the anti-glare treatment also has various forms. It is extremely difficult to uniformly evaluate the antiglare property and glare of such a transparent substrate having various surfaces using the same index.
  • an SMS-1000 apparatus has attracted attention as a transparent substrate glare evaluation apparatus.
  • the measurement result with the appropriate glare is often not obtained by the evaluation using the SMS-1000 apparatus. That is, even if the transparent substrate does not show significant glare by visual observation, the evaluation by the SMS-1000 apparatus determines that the transparent substrate shows a large glare and the opposite case. And exist.
  • the present invention is a method for evaluating the optical properties of a transparent substrate, Obtaining a quantified anti-glare index value of a transparent substrate having first and second surfaces, the first surface being anti-glare treated; Obtaining a quantified glare index value of the transparent substrate;
  • both the antiglare property and the glare of the transparent substrate treated with antiglare are properly evaluated regardless of the method of antiglare treatment. Is possible.
  • FIG. 1 schematically shows a flow of a method for evaluating the antiglare property of a transparent substrate according to an embodiment of the present invention.
  • the method for evaluating the antiglare property of the transparent substrate is: (A) The first light is irradiated from the first surface side of the transparent substrate having the first and second surfaces in a direction of 20 ° with respect to the thickness direction of the transparent substrate; Measuring the brightness of light regularly reflected on the surface (hereinafter also referred to as “20 ° specularly reflected light”) (step S110); (B) The light receiving angle of the reflected light reflected by the first surface is changed in a range of ⁇ 20 ° to + 60 °, and the first light reflected by the first surface (hereinafter referred to as “total reflected light”).
  • step S120 of measuring the luminance of (C) Step of calculating an antiglare index value R from the following equation (1) (step S130)
  • Anti-glare index value R (Brightness of total reflected light-brightness of 20 ° regular reflected light) / (Brightness of total reflected light) Equation (1) And having.
  • Step S110 First, a transparent substrate having first and second surfaces facing each other is prepared.
  • the transparent substrate may be made of any material as long as it is transparent.
  • the transparent substrate may be, for example, glass or plastic.
  • the composition of the glass is not particularly limited.
  • the glass may be, for example, soda lime glass or aluminosilicate glass.
  • the first and / or second surfaces may be chemically strengthened.
  • the chemical strengthening treatment means that a glass substrate is immersed in a molten salt containing an alkali metal, and an alkali metal (ion) having a small ionic radius existing on the outermost surface of the glass substrate is converted into an ionic radius existing in the molten salt.
  • This is a generic term for technologies that substitute for large alkali metals (ions).
  • an alkali metal (ion) having an ionic radius larger than that of the original atom is arranged on the surface of the treated glass substrate. For this reason, compressive stress can be given to the surface of a glass substrate, and the intensity
  • the glass substrate contains sodium ions (Na + )
  • the sodium ions are replaced with, for example, potassium ions (K + ) by the chemical strengthening treatment.
  • the lithium ions may be replaced with, for example, sodium ions (Na + ) and / or potassium ions (K + ) by chemical strengthening treatment.
  • the transparent substrate is made of plastic
  • the composition of the plastic is not particularly limited.
  • the transparent substrate may be a polycarbonate substrate, for example.
  • an anti-glare process is performed on the first surface of the transparent substrate.
  • the method of anti-glare processing is not particularly limited.
  • the anti-glare process may be, for example, a frost process, an etching process, a sand blast process, a lapping process, or a silica coat process.
  • anti-glare index value R a quantitative index value indicating the anti-glare property of the transparent substrate. Accordingly, various methods can be employed as the antiglare processing method.
  • the first surface of the transparent substrate after the antiglare treatment may have a surface roughness (arithmetic average roughness Ra) in the range of 0.05 ⁇ m to 1.0 ⁇ m, for example.
  • the first light is irradiated from the first surface side of the prepared transparent substrate toward the direction of 20 ° ⁇ 0.5 ° with respect to the thickness direction of the transparent substrate.
  • the first light is reflected from the first surface of the transparent substrate.
  • 20 ° specularly reflected light is received and the luminance is measured to obtain “the luminance of the 20 ° regular reflected light”.
  • Step S120 the light receiving angle of the reflected light reflected from the first surface is changed in the range of ⁇ 20 ° to + 60 °, and the same operation is performed. At this time, the luminance distribution of the first light reflected from the first surface of the transparent substrate and emitted from the first surface is measured and summed to obtain “the luminance of the total reflected light”.
  • FIG. 2 schematically shows an example of a measuring apparatus used when obtaining the antiglare index value R represented by the above-described formula (1).
  • the measuring apparatus 300 includes a light source 350 and a detector 370, and the transparent substrate 210 is disposed in the measuring apparatus 300.
  • the transparent substrate 210 has a first surface 212 and a second surface 214.
  • the light source 350 emits first light 362 toward the transparent substrate 210.
  • the detector 370 receives the reflected light 364 reflected on the first surface 212 and detects its brightness.
  • the transparent substrate 210 is disposed so that the first surface 212 is on the light source 350 and the detector 370 side. Accordingly, the first light detected by the detector 370 is reflected light 364 reflected by the transparent substrate 210.
  • the surface subjected to the antiglare treatment becomes the first surface 212 of the transparent substrate 210. That is, in this case, the transparent substrate 210 is disposed in the measurement apparatus 300 such that the antiglare-treated surface is on the light source 350 and the detector 370 side.
  • the first light 362 is irradiated at an angle inclined by 20 ° with respect to the thickness direction of the transparent substrate 210.
  • a range of 20 ° ⁇ 0.5 ° is defined as an angle of 20 ° in consideration of an error of the measuring apparatus.
  • the first light 362 is irradiated from the light source 350 toward the transparent substrate 210, and the detector 370 disposed so that the light receiving angle ⁇ is 20 ° is used. Specular light 364 reflected by the first surface 212 is detected. Thereby, “20 ° specularly reflected light” is detected.
  • the light receiving angle ⁇ for measuring the reflected light 364 is changed in the range of ⁇ 20 ° to + 60 °, and the same operation is performed.
  • minus ( ⁇ ) of the light receiving angle ⁇ represents that the light receiving angle is on the incident light side with respect to the normal line of the target surface to be evaluated (first surface in the above example), and plus ( (+) Indicates that the light receiving angle is not on the incident light side compared to the normal of the target surface.
  • the antiglare index value R of the transparent substrate 210 can be obtained from the brightness of the obtained 20 ° specularly reflected light and the brightness of the totally reflected light by the above-described formula (1). Such a measurement can be easily performed by using a commercially available goniometer (variable photometer).
  • the irradiation angle of the first light can be appropriately selected from the range of 60 ° to 5 °. However, in the present application, 20 ° is selected as the irradiation angle of the first light from the viewpoint that the anti-glare evaluation and the quantitative evaluation by visual observation show a good correlation.
  • FIG. 3 schematically shows a flow of a method for evaluating glare of a transparent substrate according to an embodiment of the present invention.
  • a method for evaluating the glare of the transparent substrate (hereinafter, also referred to as “second method”) (A) disposing a transparent substrate having first and second surfaces on the display device such that the second surface is on the display device side (step S210); (B) A step of photographing the transparent substrate using a solid-state imaging device and obtaining a first image with the display device turned on, and a distance between the solid-state imaging device and the transparent substrate.
  • Step S210 First, a transparent substrate having first and second surfaces facing each other is prepared.
  • the transparent substrate is antiglare treated on the first surface.
  • the material, composition, etc. of the transparent substrate are the same as those shown in step S110 described above, and will not be described further here.
  • the glare of a transparent substrate having various surfaces that differ according to a plurality of anti-glare treatment methods as well as between conventional single anti-glare treatment methods, such as a change in conditions in an etching process. It was difficult to uniformly evaluate with the same index.
  • the glare evaluation method according to an embodiment of the present invention as described below, various transparent substrates are uniformly used by using a quantitative index value (glaring index value G) indicating the glare of the transparent substrate. It can be evaluated. Therefore, it should be noted that the glare evaluation method according to an embodiment of the present invention is also useful as a means for selecting a processing method for anti-glare processing.
  • the display device is not particularly limited as long as it has a picture element (pixel).
  • the display device may be, for example, an LCD device, an OLED (Organic Light Emitting Diode) device, a PDP (Plasma Display Panel) device, or a tablet display device.
  • the resolution of the display device is, for example, preferably 132 ppi or more, more preferably 186 ppi or more, and further preferably 264 ppi or more.
  • a transparent substrate is disposed on the display device.
  • the transparent substrate is disposed on the display device such that the second surface is on the display device side.
  • Step S220 Next, in a state where the display device is turned on (that is, a state where an image is displayed), the transparent substrate is photographed from the first surface side using the solid-state imaging device, and the transparent substrate disposed on the display device is An image (first image) is acquired.
  • the distance d between the solid-state imaging device and the transparent substrate is set to a predetermined value.
  • a distance index r is used as an index corresponding to the distance d between the solid-state imaging device and the transparent substrate.
  • the distance index r is expressed by the following formula (4) using the focal length f of the solid-state imaging device and the distance d between the solid-state imaging device and the transparent substrate:
  • Distance index r (distance d between solid-state imaging device and transparent substrate) / (Focal distance f of solid-state image sensor) Formula (4)
  • the distance index r is 8 or more.
  • the distance index r is smaller than 8
  • the distance d between the solid-state imaging device and the transparent substrate becomes small, and is easily affected by the form of the first surface of the transparent substrate subjected to the antiglare treatment. . Therefore, by setting the distance index r to 8 or more, the transparent substrate that has been anti-glare treated by various methods in a state where the influence of the difference in the shape of the first surface due to the difference in the applied anti-glare treatment method is significantly suppressed. It is possible to uniformly evaluate glare.
  • the distance index r is preferably 9 or more, and more preferably 10 or more.
  • the image displayed on the display device is a single color (for example, green) image, and is preferably displayed on the entire display screen of the display device. This is for minimizing the influence of differences in appearance due to differences in display colors.
  • CMOS complementary metal oxide semiconductor
  • a first image 410 as schematically shown in FIG. 4 is obtained.
  • a region corresponding to nine pixels arranged in 3 rows ⁇ 3 columns of a part of the display device hereinafter referred to as corresponding regions 420-1 to 420-9). ) Is brightly visible.
  • the corresponding areas 420-1 to 420-9 are shown in a sufficiently separated state.
  • the distance between the corresponding areas 420-1 to 420-9 is narrower, and the bright portions may partially overlap between the adjacent corresponding areas.
  • Step S230 Next, the first image 410 captured in step S220 is subjected to image analysis, and a first luminance distribution is formed.
  • the first luminance distribution is formed as a three-dimensional map on the XY plane.
  • FIG. 5 schematically shows an example of the first luminance distribution obtained in this step.
  • the first luminance distribution 430 includes luminance distribution components q 1 to q having a substantially normal distribution shape in the areas corresponding to the corresponding areas 420-1 to 420-9 of the first image 410, respectively. with a q 9. More generally, the first luminance distribution 430 is represented by a set of i plural luminance distribution components q i (i is an integer of 2 or more).
  • the luminance distribution components q 1 to q 9 are shown two-dimensionally (that is, non-stereoscopically) in order to avoid complicated description.
  • the number of the first images 410 to be photographed is increased in step S220, and in this step S230, the same image analysis is performed for each first image 410. May be implemented.
  • the first luminance distribution 430 with higher accuracy can be obtained by averaging the image analysis results thereafter.
  • Step S240 Next, the transparent substrate is slid in a direction parallel to the second surface, and the transparent substrate is moved relative to the display device.
  • the moving distance is preferably less than 10 mm, and may be several mm, for example.
  • Step S250 Next, steps S220 to S230 are repeated. That is, while the display device is turned on, the second image is acquired by the solid-state imaging device, and the second luminance distribution is formed from the second image.
  • the number of second images taken by the solid-state imaging device may be increased in order to increase the accuracy of the second luminance distribution. Thereafter, image analysis is performed on each second image, and each image analysis result is averaged to obtain a second luminance distribution with higher accuracy.
  • a second luminance distribution represented by a collection of a plurality of luminance distribution components s i (where i is an integer of 2 or more) is obtained.
  • the luminance distribution components si are configured with the same number as the luminance distribution components qi.
  • the difference luminance distribution ⁇ S is calculated from the difference between the first luminance distribution and the second luminance distribution. Similar to the first luminance distribution and the second luminance distribution, the difference luminance distribution ⁇ S is represented by a collection of luminance distribution components t i (where i is an integer of 2 or more) having a substantially normal distribution shape.
  • Step S270 Next, the average luminance distribution ⁇ S ave and the variance ⁇ are calculated using the difference luminance distribution ⁇ S obtained in step S260.
  • the average luminance distribution ⁇ S ave can be obtained by averaging the absolute values of i luminance distribution components t i included in the difference luminance distribution ⁇ S.
  • the variance ⁇ can be obtained from the following equation (5) using i luminance distribution components t i included in the difference luminance distribution ⁇ S and the average luminance distribution ⁇ S ave .
  • the output value A is calculated by the following equation (2).
  • Output value A dispersion ⁇ / average luminance distribution ⁇ S ave equation (2) (Step S280)
  • the above-described steps S210 to S270 are carried out using a reference (reference) anti-glare-treated transparent substrate.
  • the reference output value Q is obtained instead of the output value A in the equation (2).
  • the reference output value Q is strongly required to be reproducible in measurement and is sufficiently larger than the error for each measurement. Is needed.
  • soda lime glass is a flat glass that has been anti-glare treated by frost etching, and has a gloss value of 60 degrees. Is as large as possible, and the average length RSm of the roughness curve elements is 70 ⁇ m or more and less than 120 ⁇ m, and a commercially available product may be selected.
  • the 60 degree gloss value can be measured as the specular gloss by a method based on JIS-Z8741.
  • the 60 degree gloss value is, for example, 110 or more, and more preferably 120 or more.
  • the average length RSm of the roughness curve element can be measured by a method based on JIS B0601 (2001).
  • the average length RSm of the roughness curve element is, for example, 70 ⁇ m or more, more preferably 80 ⁇ m or more, and less than 120 ⁇ m, preferably less than 110 ⁇ m.
  • the reference antiglare-treated transparent substrate that satisfies the above conditions has a 60-degree gloss value of 140% and an average length RSm of the surface roughness curve element of 85 ⁇ m.
  • VRD140 anti-glare treated glass manufactured by Asahi Glass Co., Ltd. was selected.
  • this step S280 may be performed before performing the above-described steps S210 to S270 using a transparent substrate subjected to an anti-glare process for evaluation.
  • this step S280 may be performed in parallel with the execution of steps S210 to S270 on the anti-glare-treated transparent substrate for evaluation.
  • the glare index value G correlates with the visual judgment result of the glare by the observer and shows a behavior close to human visual perception.
  • a transparent substrate with a large glare index value G has noticeable glare, and conversely, a transparent substrate with a small glare index value G tends to suppress glare. Therefore, the glare index value G can be used as a quantitative index when judging the glare of the transparent substrate.
  • the method for evaluating the glare of the transparent substrate has been described above with reference to FIGS.
  • the method for evaluating the glare of the transparent substrate is not limited to this.
  • a step (step S265) of removing a component derived from the display device from the difference luminance distribution ⁇ S may be performed between step S260 and step S270.
  • a step S265 of removing a component derived from the display device from the difference luminance distribution ⁇ S may be performed between step S260 and step S270.
  • the differential luminance distribution [Delta] S instead of the differential luminance distribution [Delta] S, using the effective difference luminance distribution [Delta] S e obtained by this operation, by performing the step S270, it is possible to further improve the accuracy of the glare index value G obtained.
  • this step S265 may be performed when necessary, and is not necessarily performed.
  • the method for evaluating the glare of the transparent substrate described above can be easily performed by using, for example, an SMS-1000 apparatus (manufactured by Display-Messtechnik & System).
  • FIG. 6 shows an example of a graph plotting the relationship between the antiglare index value R (horizontal axis) and the glare index value G (vertical axis) obtained in a transparent substrate that has been antiglare treated by various methods.
  • the distance index r at the time of shooting in the glare evaluation for acquiring this data is 10.8.
  • an ideal transparent substrate region having both good anti-glare properties and good anti-glare properties is indicated by a symbol “ideal”.
  • the transparent substrate included in the region C indicated by hatching in FIG. Will be selected uniformly. That is, in such a method, a transparent substrate with poor antiglare properties is included in the selection candidate transparent substrate.
  • the transparent substrate included in the region D indicated by hatching in FIG. 6 is uniformly selected, and a transparent substrate with poor glare prevention property is selected. It will be included in the selection candidates.
  • the transparent substrate can be appropriately selected according to the purpose and application, that is, the best characteristics can be exhibited in terms of glare prevention and antiglare properties.
  • a transparent substrate can be selected.
  • two optical characteristics can be considered quantitatively at a time, so that a transparent substrate can be selected more appropriately according to the purpose of use and application. It becomes.
  • FIG. 7 schematically shows a transparent substrate (hereinafter simply referred to as “transparent substrate”) 900 according to an embodiment of the present invention.
  • the transparent substrate 900 is made of glass.
  • the composition of the glass is not particularly limited, and the glass may be, for example, soda lime glass or aluminosilicate glass.
  • the transparent substrate 900 has a first surface 902 and a second surface 904, and the first surface 902 is antiglare-treated.
  • the anti-glare treatment method is not particularly limited.
  • the anti-glare process may be, for example, a frost process, an etching process, a sand blast process, a lapping process, or a silica coat process.
  • the first surface 902 of the transparent substrate may have a surface roughness (arithmetic average roughness Ra) in the range of 0.05 ⁇ m to 1.0 ⁇ m, for example.
  • the first surface 902 and / or the second surface 904 may be chemically strengthened.
  • the dimensions and shape of the transparent substrate 900 are not particularly limited.
  • the transparent substrate 900 may have a square shape, a rectangular shape, a circular shape, an elliptical shape, or the like.
  • the transparent substrate 900 is preferably thin.
  • the thickness of the transparent substrate 900 may be in the range of 0.2 mm to 2.0 mm.
  • the transparent substrate 900 has a feature that the antiglare index value R measured by using the first method (step S110 to step S130) is 0.4 or more.
  • the antiglare index value R is preferably 0.6 or more, and more preferably 0.8 or more.
  • the glare index value G is preferably 0.5 or less, more preferably 0.4 or less, and further preferably 0.3 or less.
  • a frost treatment As the antiglare treatment, a frost treatment, an etching treatment, a sand blast treatment, a lapping treatment, or a silica coating treatment was adopted.
  • aluminosilicate glass was used for the transparent substrate.
  • each transparent substrate was visually observed from the first surface (that is, antiglare-treated surface) side, and antiglare property was evaluated in 12 stages from level 1 to level 12.
  • the observation direction was 20 ° with respect to the thickness direction of the transparent substrate.
  • Steps S110 to S130 described above are performed, and the formula (1) is used to prevent each transparent substrate.
  • the dazzling index value R was calculated.
  • FIG. 8 shows an example of the relationship between the visually evaluated antiglare evaluation level (vertical axis) and the antiglare index value R (horizontal axis) obtained for each transparent substrate.
  • FIG. 8 shows that there is a positive correlation between the two.
  • the anti-glare index value R corresponds to the tendency of the evaluation level of the reflected image diffusivity visually observed by the observer, and therefore the anti-glare index value R can be used to determine the reflected image diffusivity of the transparent substrate.
  • the antiglare index value R it can be said that the reflected image diffusibility of the transparent substrate can be objectively and quantitatively determined.
  • each transparent substrate is directly arranged on a display device (iPad (registered trademark), resolution 264 ppi).
  • the transparent substrate was placed on the display device such that the first surface of each transparent substrate (that is, the antiglare-treated surface) was on the viewer side.
  • the image displayed from the display device was a green monochromatic image, and the size of the image was 19.6 cm ⁇ 14.6 cm.
  • each transparent substrate was visually observed from the first surface side, and glare was evaluated in 11 stages from level 0 to level 10.
  • Level 0 represents little glare
  • level 10 represents very significant glare. Further, the level value during this time tends to increase the glare as the numerical value increases.
  • FIG. 9 shows an example of the relationship between the glare index value G (vertical axis) and the visual glare level (horizontal axis) obtained for each transparent substrate.
  • FIG. 9 shows that there is a positive correlation between the two.
  • the glare index value G corresponds to the tendency of the determination result of the glare visually observed by the observer, and therefore the glare index value G can be used to determine the glare of the transparent substrate.
  • the glare of the transparent substrate can be objectively and quantitatively determined by using the glare index value G.
  • the antiglare index value R and the glare index value G can be used as quantitative indexes for the antiglare property and the glare of the transparent substrate, respectively.
  • the present invention can be used for optical characteristic evaluation of a transparent substrate installed in various display devices such as an LCD device, an OLED device, a PDP device, and a tablet display device.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

　L'invention concerne un procédé d'évaluation d'une caractéristique optique d'un substrat transparent, le procédé comprenant, dans un ordre quelconque, une étape permettant d'établir une valeur d'indice d'antireflet (R) quantifiée pour un substrat transparent soumis à un traitement antireflet, et une étape permettant d'établir une valeur d'indice de reflet (G) quantifiée pour le substrat transparent.
PCT/JP2015/057694 2014-05-14 2015-03-16 Procédé d'évaluation de caractéristique optique de substrat transparent, et substrat transparent WO2015174132A1 (fr)

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JP2015540938A JP6341210B2 (ja) 2014-05-14 2015-03-16 透明基体の光学特性を評価する方法および透明基体
CN201580024709.8A CN106461502B (zh) 2014-05-14 2015-03-16 评价透明基体的光学特性的方法及透明基体
KR1020167031511A KR102321551B1 (ko) 2014-05-14 2015-03-16 투명 기체의 광학 특성을 평가하는 방법 및 투명 기체

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019184320A (ja) * 2018-04-04 2019-10-24 日本電気硝子株式会社 透明物品の評価方法、及び透明物品の製造方法
CN113620612A (zh) * 2016-05-30 2021-11-09 Ａｇｃ株式会社 带有印刷层的车载用显示装置的玻璃盖板

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JP6399237B2 (ja) * 2015-11-20 2018-10-03 Ａｇｃ株式会社 膜付き曲げ基材およびその製造方法、ならびに画像表示装置

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304648A (ja) * 1999-02-19 2000-11-02 Dainippon Printing Co Ltd 面ぎらの定量的評価方法、評価装置、防眩性フィルム及びその製造方法
JP2002082206A (ja) * 2000-09-06 2002-03-22 Toppan Printing Co Ltd 防眩性反射防止フィルム
JP2003279485A (ja) * 2002-03-26 2003-10-02 Fuji Photo Film Co Ltd 防眩フィルムのギラツキ評価装置
JP2004126495A (ja) * 2001-12-17 2004-04-22 Daicel Chem Ind Ltd 防眩性フィルム、それを用いた光学部材及び液晶表示装置
JP2008058081A (ja) * 2006-08-30 2008-03-13 Fujifilm Corp 防眩性評価装置、防眩性評価基準設定方法および防眩性評価方法
JP2008170344A (ja) * 2007-01-12 2008-07-24 Fujifilm Corp 防眩性の評価方法及び測定装置
JP2009086410A (ja) * 2007-10-01 2009-04-23 Konica Minolta Opto Inc 防眩フィルム、その製造装置、防眩性反射防止フィルム、偏光板、及び表示装置
JP2009085665A (ja) * 2007-09-28 2009-04-23 Toyo Ink Mfg Co Ltd 防眩性評価装置及び防眩性評価方法
JP2010060923A (ja) * 2008-09-04 2010-03-18 Dainippon Printing Co Ltd 光学シート

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100949870B1 (ko) * 2001-12-17 2010-03-25 다이셀 가가꾸 고교 가부시끼가이샤 방현성 필름, 및 이를 이용한 광학 부재 및 액정디스플레이 장치
KR100622243B1 (ko) * 2004-02-17 2006-09-14 오므론 가부시키가이샤 광학식 측정 장치 및 광학식 측정 방법
US8999463B2 (en) * 2005-03-30 2015-04-07 Dai Nippon Printing Co., Ltd. Glare-proofing optical laminate
JP2007147343A (ja) 2005-11-25 2007-06-14 Sharp Corp 防眩度の評価方法、及び防眩度評価装置
JP4844254B2 (ja) * 2006-06-20 2011-12-28 住友化学株式会社 防眩フィルム及び画像表示装置
CN102116884B (zh) * 2006-06-30 2012-10-10 日本板硝子株式会社 反射镜和反射镜用玻璃基板
US8372505B2 (en) * 2006-08-09 2013-02-12 Kimoto Co., Ltd. Anti-glare member, display and screen using the same
CN101630118B (zh) * 2008-07-17 2012-05-23 鸿富锦精密工业（深圳）有限公司 镜头模组眩光检测设备及其检测方法
JP4966395B2 (ja) * 2010-04-14 2012-07-04 大日本印刷株式会社 動画像と静止画像との混用に適した液晶表示装置の黒彩感及び画像の切れの改善方法
CN103119478B (zh) * 2010-10-04 2015-10-14 大日本印刷株式会社 防眩性膜、防眩性膜的制造方法、偏振片和图像显示装置
JP5715532B2 (ja) * 2011-08-31 2015-05-07 株式会社東芝 不快グレア評価方法及び不快グレア評価プログラム
TWM471589U (zh) * 2013-08-06 2014-02-01 Kupo Co Ltd 電子裝置之螢幕光學保護貼結構
TWM473299U (zh) * 2013-11-19 2014-03-01 Yao-Chang Wang 螢幕保護貼

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304648A (ja) * 1999-02-19 2000-11-02 Dainippon Printing Co Ltd 面ぎらの定量的評価方法、評価装置、防眩性フィルム及びその製造方法
JP2002082206A (ja) * 2000-09-06 2002-03-22 Toppan Printing Co Ltd 防眩性反射防止フィルム
JP2004126495A (ja) * 2001-12-17 2004-04-22 Daicel Chem Ind Ltd 防眩性フィルム、それを用いた光学部材及び液晶表示装置
JP2003279485A (ja) * 2002-03-26 2003-10-02 Fuji Photo Film Co Ltd 防眩フィルムのギラツキ評価装置
JP2008058081A (ja) * 2006-08-30 2008-03-13 Fujifilm Corp 防眩性評価装置、防眩性評価基準設定方法および防眩性評価方法
JP2008170344A (ja) * 2007-01-12 2008-07-24 Fujifilm Corp 防眩性の評価方法及び測定装置
JP2009085665A (ja) * 2007-09-28 2009-04-23 Toyo Ink Mfg Co Ltd 防眩性評価装置及び防眩性評価方法
JP2009086410A (ja) * 2007-10-01 2009-04-23 Konica Minolta Opto Inc 防眩フィルム、その製造装置、防眩性反射防止フィルム、偏光板、及び表示装置
JP2010060923A (ja) * 2008-09-04 2010-03-18 Dainippon Printing Co Ltd 光学シート

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113620612A (zh) * 2016-05-30 2021-11-09 Ａｇｃ株式会社 带有印刷层的车载用显示装置的玻璃盖板
JP2019184320A (ja) * 2018-04-04 2019-10-24 日本電気硝子株式会社 透明物品の評価方法、及び透明物品の製造方法

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