Classifications

• • C—CHEMISTRY; METALLURGY
  • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
  • C09G—POLISHING COMPOSITIONS; SKI WAXES
  • C09G1/00—Polishing compositions
  • C09G1/02—Polishing compositions containing abrasives or grinding agents
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
  • B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
  • B01J23/70—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of the iron group metals or copper
  • B01J23/74—Iron group metals
  • B01J23/745—Iron
• • C—CHEMISTRY; METALLURGY
  • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
  • C09G—POLISHING COMPOSITIONS; SKI WAXES
  • C09G1/00—Polishing compositions
  • C09G1/04—Aqueous dispersions
• • C—CHEMISTRY; METALLURGY
  • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
  • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
  • C09K3/00—Materials not provided for elsewhere
  • C09K3/14—Anti-slip materials; Abrasives
  • C09K3/1409—Abrasive particles per se
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
  • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
  • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
  • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
  • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
  • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
  • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
  • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
  • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
  • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
  • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
  • H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
  • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
  • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
  • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
  • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
  • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
  • H01L21/321—After treatment
  • H01L21/32115—Planarisation
  • H01L21/3212—Planarisation by chemical mechanical polishing [CMP]

Definitions

• CMP chemical mechanical polishing
• .Polishing compositions also known as polishing slurries, CMP slurries, and CMP compositions
• metal layers such as tungsten
• CMP compositions may include abrasive particles suspended in an aqueous solution and chemical accelerators such as oxidizers, chelating agents, catalysts, and the like.
• the substrate (wafer) to be polished is mounted on a canier (polishing head) which is in turn mounted on a carrier assembly and positioned in contact with a polishing pad in a CMP apparatus (polishing tool).
• the carrier assembly provides a controllable pressure to the substrate, pressing the substrate against the polishing pad.
• the substrate and pad are moved relativ to one another by an. external driving force.
• the relative motion of the substrate and pad abrades and removes a portion of the material from the surface of the substrate, thereby polishing the substrate.
• the polishing of the substrate by the relative movement of the pad and the substrate may be further aided by the chemical activity of the polishing composition (e.g., by an. oxidizing agent and other chemical components present in the CMP composition) and/or the mechanical activity of an abrasive suspended in the polishing composition.
• tungsten is deposited over dielectric and within openings formed therein. The excess tungsten over the dielectric layer is then removed during a CMP operation to form tungsten plugs and interconnects within the dielectric.
• CMP operations e.g., in tungsten. CMP operations.
• Arra erosion also referred to as oxide erosion
• plug and line recessing and tungsten etching defects are known, to compromise planarity and. overall device integrity. For example, excessive array erosion may lead to difficulties in subsequent lithography steps as well as cause electrical contact, problems thai can degrade electrical performance.
• Th semiconductor industry is also subject to continuing downward pricing pressure.
• high throughput is commonly required thereby necessitating a high tungsten removal rate (as well as high removal rates of any harrier hinder layers).
• the downward pricing pressure also extends to the CMP consumables themselves (e.g., the slurries and pads).
• Such pricing pressure poses a challenge to the slurry formulator as the pressure to reduce costs often conflicts with desired slurry performance metrics.
• the polishing composition includes a water based liquid carrier, first and second colloidal silica abrasives dispersed in the liquid carrier, and an iron containing accelerator.
• the first ' colloidal silica abrasive and the second, colloidal silica abrasive each have a permanent positive charge of at least 10 mV, Moreover, an average particle size of die second sii tc abrasive is at least 20 nanometers grea ter than an average particle size of the first silica abrasive.
• a method for chemical mechanical polishing a substrate including a tungsten layer is further disclosed. The method may include contacting the substrate with the abov described polishing composition, moving the polishing
• composition relative io the substrate and abrading the substrate to remove a portion of the tungsten from the substrate and thereby polish the substrate.
• FIG. I depicts particle size distributions in a plot of height (hg/g) versus particle diameter (nm) for polishing compositions 9 A, 9B, C, 9D, and 9E of Example 9.
• a chemical mechanical polishing composition for polishing a substrate having a tungsten layer includes a water based liquid carrier and first and second colloidal silica abrasives dispersed in the liquid carrier, and an iron, containing accelerator.
• Each of the co loidal silica abrasives has a permanent positive charge of at least 10 raV,
• the average particle size of the second colloidal silica is at least 20 nanometers greater than, the average particle size of the first colloidal silica.
• the polishing composition may further optionally include a stabilizer bound to the iron containing accelerator, a hydrogen peroxide oxidizer, and/or a pFf in. a range from 1.5 to 5.0.
• first and second colloidal silica abrasives may also be treated with an amiuosilane compound.
• ⁇ f)008j T3 ⁇ 4e first silica abrasive includes colloidal silica particles.
• colloidal silica particles refers to silica particles that are prepared via a wet. process rather than a pyrogenic or flame hydrolysis process which produces structurally different particles.
• the colloidal silica particles may be aggregated or now-aggregated. Non-aggregated particles are individually discrete particles that may be spherical or nearly spherical in shape, but. can have other shapes as well (such as generally elliptical, square, or rectangular cross-sections).
• Aggregated, particles are particles in which multiple discrete particles are clustered or bonded, together to form aggregates having generally irregular shapes.
• the colloidal silica is precipitated or condensation-polymerized silica, which may be prepared using any method known to those of ordinary skill in the art, such as by the sol gel method or by silicate ion-exchange.
• Condensation-polymerized silica particles are often prepared by condensing Si(GH).-j to form substantially spherical particles.
• the precursor Si(OH) may be obtained, for example, by hydrolysis of high, purity alkoxysilanes, or by acidification of aqueous silicate solutions.
• Such abrasive particles may be prepared, for example, in accordance with U.S. Pat. No.
• the second, silica abrasive may include substantially any suitable silica abrasive particles, for example, including the aforementioned colloidal silica and pyrogenic (fumed) silica.
• Pyrogenic silica is produced via a flame hydrolysis process in which suitable feedstock vapor (such as silicon terra-chloride) is combusted in a flame of hydrogen and oxygen.
• feedstock vapor such as silicon terra-chloride
• Molten particles of roughly spherical shapes are formed in the combustion process, the diameters of which may be varied via process parameters. These molten spheres, commonly referred to as primary particles, fuse with one another by undergoing collisions at their contact points to form branched, three dimensional chain-like aggregates.
• Fumed silica abrasives are commercially available from a number of suppliers including, for example, Cabot Corporation, Evonic, and Wacker Chemie.
• the particle size of a particle suspended in a dispersion may be defined in the industry using various means. In the embodiments disclosed herein, the particle size is defined as measured by the CPS Disc Centrifuge, Model DC24000H (available from CPS Instruments, Prairieville, Louisiana).
• the abrasive particles may have any suitable particle size.
• the abrasive particles may have an average particle size of 10 am or more (e.g., 20 nm or more, 40 nm or more, 50 nni or more, 80 nm or more, or 00 nm or more).
• the abrasive particles may have an average particle size of 200 nm or less (e.g., 180 nm or less, 150 nm or less, 130 run or less, 1 10 nm or less, or 80 nm or less). Accordingly, the abrasive particles may have an average particle size in a range from 1.0 am to 200 nm (e.g., from 20 nm to 180 nm. or from 50 to 1.30).
• the first silica abrasive has an average particle size that differs from as average particle size of the second silica abrasive.
• the average particle size of the first silica abrasive may less than that of the second silica abrasive.
• the average particle size of the first silica abrasive may be greater than that of the second silica abrasive.
• the first silica abrasive may have an average particle size that differs from the average particle size of the second silica abrasive by at least 20 nm (e.g., at least 30 nm).
• the average particle size of the second silica abrasive is preferably at least 20 nm (e.g., at least 30 nm) greater than that of the first silica abrasi ve.
• the average particle size of the first silica abrasive may be 10 run or more (e.g., 30 nm or more, 40 nm or more, or 50 nm or more).
• the average parti cle size of the first silica abrasive may be 130 nm or less (e.g., 1 10 nm or less, 100 ran or less, or 90 nm or less). Accordingly, the average particle size of the first silica abrasive may be in a range from .10 nm to 130 nm (e.g., from 20 nm to 1 1 nm, from 40 to 100 nm, or from 50 to 90 nm).
• the average particle size of the second silica abrasive may be 80 rtm or more (e.g., 90 am or more, 100 nm or more, or 1 .10 nm or more).
• the average particle size of the second silica, abrasive may be 200 nm or less (e.g., 180 nm or less, 170 nm or less, or 160 nm or less). Accordingly, the average particle size of the second silica abrasive may be in a range from 80 nm to 200 nm (e.g., from 90 nra to I SO am, or from 1 0 to 160 nm).
• the first and second silica abrasives may include a partiall aggregated colloidal silica.
• partially aggregated it is meant thai 50 percent, or more of the colloidal silica abrasive particles Include two or more aggregated primary particles (e.g., two, three, four, or more aggregated primary particles).
• aggregated primary particles e.g., two, three, four, or more aggregated primary particles.
• each, of the first and second silica abrasives include partiall aggregated colloidal silica
• 50 percent or more of the colloidal silica abrasive particles in the first silica abrasive include two o more aggregated primary particles
• 50 percent or more of the colloidal silica abrasive particles in the second silica abrasive include two or more aggregated primary particles.
• a polishing composition may include a first silica abrasive in which 50 percent or more of the abrasive particles include two aggregated primary particles and a second silica abrasive in which 50 percent or more of the abrasive particles include two aggregated primary particles.
• a partially aggregated dispersion in which 50 perceni or more of the colloidal silica abrasive particles include two or more aggregated primary particles may be prepared, for example, using a multi-step process in which primary particles are first, grown in solution, for example as described in the '833 patent The pH of the solution may then be adjusted to an acidic value for a predetermined time period to promote aggregation (or partial aggregation). An optional final step may allow for further growth of the aggregates (and any remaining primary particles).
• polishing compositions may include a mixed abrasive or a single abrasive having a bimodai distribution.
• mixed abrasive it is meant that distinct first and second dispersions are mi ed together after the abrasive particles have been fully grown.
• a single abrasive having a bimodai distribution is a dispersion in which the colloidal silica particles have been processed so as to grow abrasive particles having a bimodai distribution.
• the polishing composition may include any suitable amount of silica abrasi ve particles.
• the polishing composition may include 0,01 weight percent or more of each of the first silic abrasive and the second silica abrasive (e.g., 0.02 weight percent or more, about .05 weight percent or more, or 0.1 weight percent or more).
• the polishing composition may include 1 weight perceni or less of each of the first silica abrasive and the second silica abrasive (e.g., 0.8 weight percent or less, 0.6 weight percent or less, or 0.4 weight percent or less).
• the amount of each of the first silica abrasive and the second silica abrasive may be in a range from 0.01 weight, percent to .1 weight percent (e.g., from 0.02 weight percent to 0.8 weight percent, from 0.05 weight percent to 0.6 weight percent, or from 0.1 weight percent to 0.04 weight percent).
• the total amount of silica abrasive (the sum of the amount of the first silica abrasive and the amount of the second silica abrasive) may be less than 2.0 weight percent (e.g., less than 1.5 weight percent, or less than 1.0 weight percent, or even less than 0.5 weight percent).
• the liquid carrier is used to facilitate the application of the abrasive and any optional chemical additives to the surface of a suitable substrate to be polished (e.g., pknarized).
• the liquid carrier may be any suitable carrier (e.g., a solvent) including lower alcohols (e.g., methanol ethanoi, etc.), ethers (e.g., dioxane, teirahydromran, etc.), water, and mixtures thereof.
• the liquid carrier comprises, consists essentially of, or consists of water, more preferably detonized water,
• the first silica abrasive includes colloidal silica particles having a positive charge of at least 10 mV in the polishing composition.
• the charge on dispersed paiticies suc as colloidal silica particles is commonly referred to in the art as Che .eta potential (or the electrokiuetic potential).
• the zeia potential of a particle refers to the electrical potential difference between the electrical charge of the ions surrounding the particle and the electrical charge of the bulk solution of the -polishing composition (e.g., the liquid carrier and any other components dissolved therein).
• the zeia potential is typically dependent on the p.H of the aqueous medium.
• the isoelectric point of the particles is defined as the pH at hich the .eta potential is zero. As the pH is increased or decreased away from the isoelectric point, the surface charge (and hence the /eta potential) is
• the zeta potential of a dispersion such as a polishing composition may be obtained using commercially available instrumentation such as the DT-1202, an electro-acoustic
• the colloidal silica particles of the first silica abrasive in the polishing composition have a permanent positive charge of 10 mV or more (e.g., 1 5 roV or more or 20 mV or more).
• the colloidal silica particles of the first silica abrasive in the polishing composition may have a. permanent positive charge of 50 niV or less (e.g., 45 mV or less, 40 raV or less, or 35 mV or less).
• colloidal silica particles of the first silica abrasive have a permanent positive charge in a range from 10 rnV to 50 mV (e.g., from 15 mV to 40 mV )
• permanent positive charge it is meant that the positive charge on the silica, particles is not readily reversible, for example, via flushing, dilution, filtration, and the like.
• a permanent positive charge may be the result, for example, of covalently bonding a cationic species with the colloidal silica.
• a permanent positive charge is in contrast to a reversible positive charge (a non-permanent positive charge) that may be the result, for example, of an electrostatic interaction between a cationic species and the colloidal silica.
• a permanent positive charge of at least 10 mV means that the zei potential of the silica particles remains above 10 mV a fter the following three step ultrafiltration test.
• a portion of a polishing composition e.g., initially a 200 ml sample
• a iiiipore UUracell regenerated cellulose ultrafiltration disk e.g., having a MW cutoff of 100,000 Dal tons and a pore size of 6.3 mtt.
• the remaining dispersion (the approximately 65 mi of dispersion that is retained by the ultrafiltration disk) is collected and replenished to the original volume with pH adjusted deionixed water.
• the deionized water is pH adjusted to the original pH of the polishing composition using a suitable inorganic acid or base such as nitric acid or potassium hydroxide. This procedure is repeated for a total of three ultrafiltration cycles (each of which includes an ultrafiltration step and a replenishing step).
• the zeta-poteniiai of the triply ultra-filtered and replenished polishing composition is then measured and compared with the zeta potential of the original polishing composition. This three ste ultrafiltration test is further illustrated below by way of example (in Example 8).
• the dispersion retained by the ultrafiltration disk includes the silica particles and any chemical components (e.g., cationic species) that may be associated with, the surface of the particles (e.g., bonded to, attached to, electrostatically interacting with, or in contact with the particle surface). At least a portion of the liquid carrier and the chemical components dissolved therein pass through the ultrafiltration disk. Replenishing the retained dispersion to the original volume is believed to upset the equilibrium in the original polishing composition such that the chemical components associated with the particle surface may tend towards a new equilibrium.
• any chemical components e.g., cationic species
• Components that are strongly associated (e.g., covalentSy bonded) with the particle sur face remain on the surface such that there tends to be little i f any change i n.
• the positive zeta potential of the particle in contrast, a portion, of components that have a weaker association (e.g., an electrostatic interaction) with the particle surface may return to the solution as the system tends towards the new equilibrium thereby resulting in a reduction in the positi ve zeta potential.
• the positive charge (reduction in the positive zeta potential) on the particles resulting from the aforementioned three step ultrafiltration test is less than 10 mV (e.g., less than 7 mV, less than 5 mV, or even less than 2mV).
• Silica abrasive particles containing an aminosilane compound may have a permanent positive charge.
• a permanent positive charge may be achieved, for example, via treating the particles with at least one aminosilane compound.
• Such compounds include primary aminosilanes, secondary aminosilanes, tertiary aminosilanes, quaternary
• the aminosilane compound may include substantially any suitable aminosilane, for example, a propyl group containing aminosilane or an aminosilane compound including a propyl amine.
• suitable aminosilanes may include bis(2-hydroxyemyl)-3-aminopropyi irialkoxysilane,
• diethyiaininomeihyltrialkoxysilane diethyiaininomeihyltrialkoxysilane, (N,N ⁇ diethyl-3-aminopropyl)trialkoxysi.lane), 3-fN- styryl.rae yl-2-aminoetbylaminopropyl irialkoxysilane. aminoprop l irialkoxysilane, (2-N- ben3 ⁇ 4ylaminoethyl)-3-aminopropyl irialkoxysilane)., trialkoxysilyl propy 1 ⁇ N , ⁇ , ⁇ -triraethyl ammonium chloride, N -f trialkoxysilyiethy benzyl-N.
• N-a-imethyl ammonium chloride (bis(memyldialkoxysilylpropyl)-N-methyl amine, bis(triaikoxysilylpropyS)urea, bis(3- (trialkoxysilyl)propyl)-ethylenediamine, bis(trialkoxysilylpropyl)amine,
• any suitable method of treating the silica particles may be used.
• the silica particles may be treated with the aminosilane compound before mixing with the other components of the polishing composition or the aminosilane and the colloidal silica particles may be added simultaneously to the other components of the polishing composition.
• the aminosilane compound may be present in. the polishing composition in any suitable amount.
• the amount of aminosilane utilized may depend on several factors, for example, including the particle size, the surface area of the particle, the particular aminosilane compound used, and the desired charge on the particle. In general the amount of aminosilane used increases with decreasing particle size (and therefore increasing surface area) and increasing charge on the particle.
• the polishing composition may include 5 ppm or more (e.g., 1 ppm or more, 15 ppm or more, or 20 ppm or more) of the aminosilane compound.
• the polishing composition preferably includes n amount of aminosilane sufficient to provide the desired permanent positive charge withou using an excess.
• the polishing composition may include 500 ppm or less (e.g., 300 ppm or Jess, or 200 ppm or less, or 150 ppm or less) of the aminosilane compound.
• the polishing composition includes a range from 5 ppm to 500 ppm (e.g.. from 10 ppm to 300 ppm. from 15 p m to 200 ppm, or from 20 ppm to 150 ppm) of the aminosilane compound.
• Polymer amines may be used to impart a permanent positive charge (or a semipermanent positive charge that requires more than three ultm-filtraiion cycles to reverse) to certain silica abrasive particles. While such polymer amines may provide a permanent (or semi -permanent) positive charge to the silica particles, the presence of certain polymer amines may have a negative effect on tungsten removal rates in some CMP compositions and CMP operations. Therefore, it may be preferable in certain embodiments that the polishing composition be substantially free of polymer amines (and that the permanent positive charge he imparted via other means).
• the second silica abrasive may have a neutral charge or a non-permanent positive charge.
• neutral charge it is meant that the zeta potential of the silica abrasive particles is near zero, for example, in a range from about -5 to 5 V, Silica abrasive particles having a neutral charge are generally untreated.
• a silica abrasive having a non-permanent positive charge is one in which the abrasive particles have a reversible (or partially reversible) positive charge of greater than 5 mV (e.g. via flushing, dilution, filtration, and the like).
• silica abrasive particles having permanent and non-permanent positive charges may be used to discriminate between silica abrasive particles having permanent and non-permanent positive charges.
• silica abrasive particles having a non-permanent positive charge are particles in which the positive charge is reduced below some threshold (e.g. , 10 mV) after ultra-fiftraiion and replenishing.
• silica abrasive particles having a non-permanent positi ve charge are particles in which the positive charge may decrease after correcting for ionic strength differences (e.g., by more than 5 mV, or by more than 0 mV).
• Example S distinction between a permanent and non-permanent positive charge is further illustrated in Example S.
• Silic abrasive particles in contact with a cation containing component may have a non-permanent positive charge.
• a non- permanent positive charge may be achieved, for example, via treating the particles with at least one cation containing component.
• the treatment component may be selected, for example, from ammonium sails (preferably quaternary amine compounds), phosphonium salts, sulfonium salts, imidaxolium. salts, and pyridinium salts.
• the anion X " can be an suitable anion that preferably does not react with other components of the polishing composition.
• Non-limiting examples of suitable anions include hydroxide, chloride, bromide,, fluoride, nitrate, sulfate, hydrogen sulfate, methanesulfonate, raethylsaifate (i.e., t3 ⁇ 4OS(V) > and the like.
• the cationic component in an ammonium salt may include, for example, tetrametbyiammonium, tetraethylammonium, .etrapropylammanium. tettabuty (ammonium, teirapentylammonium,
• the cationic component in a phosphonium salt may include, for example, tetramethylphosphoninm,
• the cationic component in a sulfonium salt may include, for example, trimethylsulfonium and
• the cationic component in an imida/oliurn salt may include, for example, l -ethyl-3-meihylimida2ol m,
• the cationic component in a pyridinium salt may include, for example, 1 -methyipyridinium.
• the polishing composition is generally acidic having a pH of less than 7.
• the polishing composition typically has a pH of I or more (e.g., 1.5 or more, or 2 or more).
• the polishing composition has a pH of 6 or less (e.g., 5 or less, or 4 or less). More preferably, the polishing composition has a H in a range from 1. to (e.g., from 1.5 to 5, or from 2 to 4, or from 2 to 3.5).
• the pH of the polishing composition may be achieved and or maintained by any suitable means.
• the polishing composition may include substantially any- suitable pB adjusting agents or buffering systems.
• suitable pH adjusting agents may include nitric acid, sulfuric acid, phosphoric acid, phthalic acid, citric acid, adipic acid, oxalic acid, malonic acid, roaleic acid, ammonium hydroxide, and the like while suitable buffering agents may include phosphates, sulfates, acetates, maionates, oxalates, borates, ammonium salts, and the like.
• Optional embodiments of the polishing composition may further include an iron containing accelerator.
• An iron containing accelerator as used herein is an iron containing chemical component that increases the removal rate of tungsten during a tungsten CMP operation.
• the iron containing accelerator may include an iron containing catalyst such as is disclosed in U.S. Patents 5,958,288 and 5,980,775.
• an iron containing catalyst may be soluble in the liquid carrier and may include, for example, feme (iron Hi) or ferrous (iron II) compounds such as iron nitrate, iron sulfate, iron haiides, including fluorides, chlorides,, bromides, and iodides, as well as perchlorates, perbromaies and periodates, and organic iron compounds such as iron acetates, acetylacetonates, citrates, gluconates, malonates, oxalates, phthalates, and succinates, and mixtures thereof.
• An iron containing accelerator may also include an iron containing activator (e.g., a free radical producing compound) or an iron containing catalyst associated with (e.g., coated or ' bonded to) the surface of the colloidal silica particle such as is disclosed in U.S. ' Patents 7,029,508 and 7,077,880.
• the iron containing accelerator may be bonded with the si!anol groups on the surface of the colloidal surface particle, in one embodiment the iron containing accelerator may include a boron containing stabilizer and an iron containing catalyst.
• the stabilizer and catalyst may occupy substantially any percentage of the available surface sites on the colloidal silica particles, for example, greater than i%, greater than 50%, or greater than 80% of the available surface sites,
• the amount of .iron containing accelerator in the polishing composition may be varied depending upo the oxidizing agent used and the chemical, form of the accelerator.
• the catalyst may be present in the composition in an amount sufficient to provide a range from 1 to 3000 ppm Fe based on the total weight of the composition.
• the polishing composition preferably includes 1 ppm Fe or more (e.g., 5 ppm or more, 1 ppm or more, or 20 ppm or more).
• the polishing composition preferably mcludes 500 ppm Fe or less (e.g., 200 ppm.
• the polishing composition may thus include a range from 1 to 500 ppm Fe (e.g., from 3 to 200 ppm, from 5 to 100 ppm, or from 1 to 50 ppm).
• Embodiments of the polishing composition including an iron containing accelerator may further include a stabilizer. Without such a stabilizer, the iron containing accelerator and the oxidizing agent may react in a manner that degrades the oxidizing agent rapidiy over time.
• the addition of a stabilizer tends to reduce the effectiveness of the iron containing accelerator such that the choice of the type and amount of stabilizer added to the polishing composition ma have a significant impact on CMP perfoniian.ee.
• the addition of a stabilizer may lead to the formation of a stabilizer/accelerator complex that inhibits the accelerator from reacting with the oxidizing agent while at the same time allowing the accelerator to remain sufficiently active so as to promote rapid tungsten polishing rates.
• 0036 Useful stabilizers include phosphoric acid, organic acids, phosphonale
• the acid stabilizers may be used in their conjugate form, e.g., the earboxylate can be used instead of the carboxylic acid.
• the term "acid” as it is used to describe useful stabilizers aiso means the conjugate base (or bases) of the acid stabilizer.
• adipic acid means adipic acid and its conjugate bases.
• Stabilizers can be used alone or in combination and significantly decrease the rate at which oxidizing agents such as hydrogen peroxide decomposes.
• Preferred stabilizers include acetic acirl, phosphoric acid, phthalie acid, citric acid, adipic acid, oxalic acid, malonic acid, aspartic acid, succinic acid, grataric acid, pimelic acid, suberic acid, azeiaic acid, sebacic acid, roaleic acid, glutaconic acicl, muconic acid, ethylenediaminetetraacetic acid (EDTA), propylenediaminetetraacetic acid (PDTA), and mixtures thereof.
• the preferred stabilizers may be added to the compositions and slurries of this invention in an amount ranging from 1 equivalent per iron containing accelerator to 3.0 weight percent or more.
• the term "equivalent per iron containing accelerator" .means one molecule of stabilizer per iron species in the composition. For example, 2 equivalents per iron containing accelerator means two molecules of stabilizer for each iron species,
• the polishing composition may further include an oxidizing agent.
• the oxidizing agent may be added to the polishing composition during the slurry manufacturing process or just prior to the CMP operation (e.g., in a tank located at the semiconductor fabrication facility).
• Preferable oxidizing agents include inorganic or organic per-compounds.
• a per- compound as defined by Hawley's Condensed Chemical Dictionary is a compound, containing at least one peroxy group ( ⁇ 0 » 0-) or a compound, containing an element in its highest oxidation state.
• Examples of compounds containing at least one perox group include but are not limited to hydrogen peroxide and its adduets such as urea hydrogen peroxide and percarbonates, organic peroxides such as benzoyl peroxide, peracetic acid, and di-t ⁇ huiyJ peroxide, niouopersulfates (SO; ), dipersalfates (S ⁇ Os ' ), and sodium peroxide.
• Examples of compounds containing an. element in its highest oxidation state include but are not limited to periodic acid, periodaie salts, perbrornic acid, perbromate salts, perchloric acid, perchlorate salts, perboric acid, and perborate salts and permanganates.
• the most preferred oxidizing agents is hydrogen peroxide,
• the oxidizing agent may be present in the polishing composition in a ' amount ranging, for example, from 0.1 to 10 weight percent.
• the oxidizer may be present in the polishing composition in an amount ranging from 0.1 to 6 weight percent (e.g., from 0.2 to 5 weight percent, from 0.5 to 4 weight percent, or from 1 to 3 weight percent).
• the polishing composition may optionally further include a compound that inhibits tungsten etching.
• Suitable inhibitor compounds inhibit the conversion of solid tungsten into soluble tungsten compounds while at the same time allowing for effective removal of solid tungsten via the CMP operation.
• Classes of compounds that that are useful inhibitors of tungsten etching include compounds having nitrogen containing functional groups such as nitrogen containing heierocycles, alky I ammonium ions, amino alkyls, and amino acids.
• Useful amino alkyl corrosion inhibitors include, for example, hexylamine, tetraraethyl-p-phenylene diamine, octylam ie, diethylene triamine, dibutyl benzylamine, aminopropylsilanot, am.inopropyisiloxa.ue, dodecylamme, mixtures thereof and synthetic and naturally occurring amino acids including, for example, lysine., tyrosine, glu amme, glutamic acid, cysteine, and glycine (aroinoacetie acid).
• the inhibi tor compound may alternatively and/or additionally include an. amine compound in solution in the liquid carrier.
• the amine compound (or compounds) may include a primary amine, a secondary amine, a tertiary amine, or a quaternary amine.
• the amine compound may further include a monoamine, a diamine, a triarnine, a tetramine, or an amine based polymer having a large number of repeating amine groups (e.g., 4 or more amine groups).
• the amine compound may include a long chain alkyl group.
• long chain alkyl group it is meant that the amine compound includes an alky! group having at least 10 carbon atoms (e.g., at least 12 carbon atoms or at least 1 carbon atoms).
• Such amine compounds may include, for example, dodecyi amine, teiradecyf amine, hexadecylauune, octadeeylamine, oleylami&e, - raeihyidioctylaroine, N-methyloctadeeylanime, cocamidopropyiamme oxide,
• the amine compound may inc ude a polycationic amine.
• a polycationic amine (as the term is used herein) is an amine compound having multiple (two or more) amine groups in which each of the amine groups is calionic (i.e., has a positive charge).
• the polycaiionic amine may include a
• poly juaieiiiary amine By polyquaiernary amine it is meant that the amine compound includes from 2 to 4 quaternary ammonium groups such that the polyquatemary amine is a diquaternary amine, a ttiqua ternary amine, or a tetraquaternary amine compound.
• 'Diquaternary amine compounds may include, for example, ⁇ , ⁇ '- n5emyienebis(dimethyiteiradeclarnmoriium bromide), I , 1 ,4,4-ietrabuty !piperaziriediiam dibromkie, N > N,N ', '-pentamethyI-N-tallow-i -propane-diammonium dichloride, ⁇ , ⁇ '- hexamethyJenebis(tribuiyIammonium hydroxide), decamethomnm bromide, didodeeyl- tetramethyl- 1 ,4-butanediammium diiodide, 1 ,5-dimethyl- 1 ,5-diazoniahicyclo(3.2.2)nonarie dib.ro.mide, and the like.
• Tri uaternary amine compounds may include, for example,
• Tetraquatemary amine compounds may include, for example,
• the poiyquaternary amine compound may further include a long chai alky! group (e.g., h ving 10 or more carbon atoms).
• a polyquatemary amine compound having a long chain alk l group may include ⁇ , ⁇ '-methylenebis (dimethyltetradeclammoniom bromide), . , ⁇ ', ⁇ ', '- pentamet.hy.l ⁇ ⁇ tallow- i ,3 ⁇ pixipaue-diamTEoniiffn. dichloride, didodecyl-tetraraethyM ,4- butanediammium
• a poi ycationic amine may also be polycationic in that each of the amine groups is protonated (and therefore has a positive charge).
• a dicationic amine such as tetramethyl-p-phenylenediamme includes two tertiary amine groups that may be protonated (and therefore positively charged) at polishing composition pH values less than the pKa o the amine compound.
• the amine compound m y include an amine based polymer. Such a polymer includes four or more amine groups.
• the amine based polymer may include, for example, triethylenetetramine,
• tetraethylenepentamine pentaelh lenehexarnine, and polymers including the following amine containing functional groups methacryloyiox-ethyl irimethyl ammonium methyisulfale, cliailyl dimethyl ammonium chloride, and mefhacrylamido-propyl irimethyl ammonium chloride.
• the polishing composition may inelnde substantially any suitable concentration of the inhibitor compound.
• concentration is desirably high enough to provide adequate etch inhibition, but low enough so that the compound is .soluble and so as not to reduce tungsten polishing rates below acceptable levels.
• soluble it is meant that the compound is fully dissolved in the liquid carrier or that it forms micelles in the liquid carrier or Is carried in micelles. It may be necessary to van,' the concentration of the inhibitor compound depending upon numerous various factors, for example, including the solubility thereof; the number of amine groups therein, the length of an alkyl group, the relationship between etch rate inhibition and polishing rate inhibition, the oxidizing agent used, the concentration of the oxidizing agent, and so on.
• the concentration of an amine compound in the polishing composi tion may he in a range from 0.1 ⁇ to 10 uiM (i.e., from .10 "' to 10 " ⁇ molar).
• concentration may be on the Sower end of the range (e.g., from 10 " ' to 10 " * molar).
• concentration may be on the Sower end of the range (e.g., from 10 " ' to 10 " * molar).
• a range from 0.1 ⁇ to 10 uiM (i.e., from .10 "' to 10 " ⁇ molar).
• the concentration may be on the higher end of the range (e.g., from 10 ' * to Y molar).
• the polishing composition may optionally further include a biocide.
• the biocide may include any suitable biocide, for example an isothiazoiinone biocide.
• the amount of biocide in the polishing composition typicall is in a range from I ppm to 50 ppm, and preferabl from i ppm to 20 ppm.
• the polishing composition may be prepared using any suitable techniques, many of which are known to those skilled in the art.
• the polishing composition may be prepared in a hatch or continuous process. Generally, the polishing composition may he prepared by combining the components thereof in any order.
• component as used herein includes the individual ingredients (e.g., the colloidal silica, the iron containing accelerator, the amine compound, etc.).
• a first silica abrasi e may be dispersed in an aqueous liquid carrier to obtain a first dispersion.
• the first dispersion may then be treated, for example, with an aminosilane compound so as to produce a colloidal silica abrasive having a pen.nane.tii positive charge of at least 10 mV.
• a second silica abrasive may be dispersed in an aqueous liquid carrier to obtain a second dispersion.
• the second dispersion may then be treated, for example, with a quaternary amine compound so as to produce a silica abrasive having a non- permanent positive charge.
• the first and second treated dispersions may then be mixed together prior to adding ihe other components (such as an iron containing accelerator and a stabilizer). Alternatively, the other components may be added to one of the treated dispersions prior to mixing the first and second dispersions together.
• the first and second dispersions and the other components may be blended together using my suitable techniques for achieving adequate mixing.
• the oxidizing agent may be added at any time during the preparation of the polishing composition.
• the polishing composition may be prepared prior to use, with one or more components, such as the oxidizing agent, being added just prior to the CMP operation (e.g., within i minute, or within 10 minutes, or within 1 hour, or within 1 day, or within 1 week, of the CMP operation).
• the polishing composition also may also be prepared by mixing the components at the surface of the substrate (e.g., on the polishing pad) during the CMP operation.
• the polishing composition may be supplied as a one-package system comprising a first silica abrasive having a permanent positive charge of at least lOmV, a second silica abrasive having a neutral or non-permanent positive charge, and other optional components such as an iron containing accelerator, a stabilizer, a tungsten etching inhibitor, a biocide, and the like.
• the oxidizing agent desirably is supplied separately from the other components of the polishing composition and is combined, e.g..
• polishing composition by the end-user, with the other components of the polishing composition shortly before use (e.g., 1 week or less prior to use, 1 day or less prior to use, I hour or less prior to use, 10 minutes or less prior to use, or 1 minute or less prior to use).
• Various other two-container, or three- or more-container, combinations of the components of the polishing composition are within the knowledge of one of ordinary skill in the art.
• the polishing composition of the invention may also be provided as a concentrate which is intended to be diluted with an appropriate amoun of water prior to use.
• the polishing composition concentrate may include the first silica abrasive having a permanent positive charge of at least lOmV, the second silica abrasive having a neutral or non-permanent positive charge, water, and other optional components such as an iron containing accelerator, a stabilizer, a tungsten etching inhibitor, and a biockle, with or without the oxidizing agent, in amounts such that, upon dilution of the concentrate with an appropriate amount of water, and the oxidizing agent if not already present in an appropriate amount, each component of the polishing composition will be present in the polishing composition in an amount within the appropriate range recited above for each component.
• the first silica abrasive having a permanent positive charge of at least l OmV, the second silica abrasive having a neutral or non-permanent positive charge, and other optional components such as an iron containing accelerator, a stabilizer, a tungsten etching inhibitor, and a biockle may each be present in the polishing composition in an amount: that is 2 times (e.g., 3 times, 4 times, 5 times, or even 10 times) greater than the concentration recited above for each component so that, when the concentrate is diluted with an equal volume of (e.g., 2 equal volumes of water, 3 equal volumes of water, 4 equal volumes of water, or even 9 equal volumes of water respectively), along with the oxidizing agent in a suitable amount, each component will be present in the polishing composition in an amount within the ranges set forth above for each component.
• the concentrate may contain an appropriate fraction of the water present in. the final polishing composition in order to ensure
• the polishing composition of the invention may be used to polish any substrate, the polishing composition, is particularly useful in the polishing of a substrate comprising at least one metal including tungsten and. at least one dielectric material.
• the tungsten layer may be deposited over one or more barrier layers, for example, including titanium and/or titanium nitride (TIN).
• the dielectric layer may be a metal oxide such as a silicon oxide layer derived from tetraethylorthosiiicate (TEOS), porous metal oxide, porous or non-porous carbon doped silicon oxide, fluorine-doped silicon oxide, glass, organic polymer, fiuorinated organic polymer, or any other suitable high or low-k insulating layer.
• the polishing method of the invention is particularly suited for use in conjunction with a chemical mechanical polishing (CMP) apparatus.
• the apparatus includes platen, which, when in use, is in motion and has a velocity that results from orbital, linear, or circular motion, a polishing pad in contact with the platen and moving with the platen when in motion, and a carrier that holds a substrate to be polished by contacting and moving relative to the surface of the polishing pad.
• the polishing of the substrate takes place by the substrate being placed in contact with the polishing pad and the polishing composition of the invention and then the polishing pad moving relative to the substrate, so as to abrade at least a portion of the substrate (such as tungsten, titanium, titanium, nitride, and/or a dielectric material as described herein) to polish the substrate.
• the substrate such as tungsten, titanium, titanium, nitride, and/or a dielectric material as described herein
• a substrate can be planarized or polished with the chemical mechanical polishing composition with any suitable polishing pad (e.g., polishing surface).
• suitable polishing pads include, for example, woven and non-woven polishing pads.
• suitable polishing pads can comprise any suitable polymer of varying density, hardness, thickness, compressibility, ability to rebound upon compression, and compression modulus.
• Suitable polymers include, for example, polyvinylchloride, tKjlyvinylfluori.de, nylon, f iorocarbon, polycarbonate, polyester, polyacrylate, po ' lyether, polyethylene, polyamide, polyurethane, polystyrene, polypropylene, coforraed products thereof, and mixtures thereof.
• mixed silica abrasive polishing compositions were prepared using first and second silica abrasives selected from nine silica abrasive dispersions.
• Dispersions ⁇ . ⁇ , B I , C.I > and Dl included colloidal silica dispersions treated with an aminosilane (amiaopropyl trialkoxysslatie) such that the colloidal silica panicles had a permanent positi ve charge of greater than 10 mV
• Dispersions A2, B2, C2, and D2 included colloidal silica particles dispersed in an aqueous solution.
• the colloidal silica abrasives in Al , A2, B l , 82, CL C2, Dl , and D2 each contained a partially aggregated silica abrasi ve in which 50 percent or more of the colloidal silica abrasive particles include two aggregated primary particles.
• Dispersion F2 included an untreated fumed silica having a surface area of 150 o Vg which was dispersed in an aqueous solution. Further details regarding these nine silica abrasive dispersions are presented in Table I .
• the primary particle sizes were estimated using co entional spherical extrapolation of BET surface area measurements.
• the aggregate particle sizes were obtained using a CPS Disc Centrifuge, Model DC24000HR. (available from CPS Instruments, ' Pratrieville, Louisiana). TABLE I
• the tungsten. (W) polishing rate was evaluated in this example for various polishing compositions, each of which included first and second silica abrasives selected from dispersions .41 , B i , Cl , and D.1 in Example 1.
• the fust and second silica abrasives in this example each included a colloidal siiica having a permanent positive charge of greater than 10 mV.
• This example demonstrates the effects of the relative amounts of the first and second silica abrasives and the particle sizes of the first and second siiica abrasives on the W polishing rate.
• Each of the polishing compositions had a pH of 2.5 and included 0.031 weight percent ferric nitrate nonahydrate (Fe( Os)s ⁇ 93 ⁇ 40), 0.04 weight percent malonic acid, and 2.4 weight percent hydrogen peroxide.
• the W polishing rates were obtained by polishing eight inch blanke wafers having a W layer using a Mim CMP tool (available from Applied Materials) and an ICS 0.10 polishing pad at down-force of 2.5 psi, a platen speed of 1 3 rpm, a head speed of 9? rpm, and a slurry flow rate of 1.50 ml/rain.
• the polishing time was two minutes.
• the weight percentages of the first and second silica abrasives and the corresponding W removal rates are shown on. Table 2. TABLE
• high W polishing rates may be achieved when there is at least a 20 nm difference in. particle size between the first and second silica abrasives.
• the tungsten (W) polishing rate was evaluated in this example for various polishing compositions, each of which included first and second silica abrasives selected from dispersions At , .81, CI , and Pi i Example 1 .
• the first and. second silica abrasives in this example each included a colloidal silica having a permanent positive charge of greater than 10 mV.
• This example also demonstrates the effects of the relative amounts of the first and second silica abrasives and the particle sizes of the first and second silica abrasives on the W polishing rate.
• Each of the polishing compositions had a pH of 2.5 and included 0.031 weight percent ferric nitrate nonahydrate, 0,04 weight percent ma!onic acid, and 2.4 weight percent hydrogen peroxide.
• the W polishing rates were obtained by polishing eight inch blanket wafers having a W layer using a Mirra ⁇ CMP tool (available from Applied
• 3A and 3B correspond with polishing compositions 2E and 2H in Example 2 with the only difference being in polishing time.
• the tungsten (W) polishing rate was evaluated in this example for various polishing compositions, three of which included first and second silica abrasives selected from dispersions Bl and DI in Example 1. This example demonstrates the effects of the relative amounts of the first and second silica abrasives on the W polishing rate.
• Each of the polishing compositions had a H of 2.5 and included 0,03 i weight percent ferric .nitrate nonahydrate, 0.04 weight percent malonic acid, 2500 pp . glycine, and 2.4 weight percent hydrogen peroxide.
• the W polishing rates were obtained by polishing eight inch blanket wafers having a W layer using a Mirra# CMP tool (available from Applied Materials) and an ICi 0.10 polishing pad at down-force of 2,5 psi, a platen speed of 103 rpm, a head speed of 97 rpm, and a slurry flow rate of 150 ml min.
• the polishing time in this exampl was one minute.
• polishing composition 4C including a mixture of dispersions B l and D i achieved a higher W polishing than polishing compositions 4A and 48 including dispersions Bl and Di alone.
• the tungsten (W) polishing rate was evaluated in this example for various polishing compositions, four of which included first and second silica abrasi ves selec ted from dispersions Bl, B2, and CI in Example 1.
• This example demonstrates the effects of the relative amounts of the first and second silica abrasives on the W polishing rate and the time to clear the wafer (the end point time).
• Each of the polishing compositions had a pH of 2.5 and included 0.03.1 weight percent ferric nitrate nonahydrate, 0.04 weigh! percent .raalonic acid, 2500 ppro glycine, and 2.4 weight percent hydrogen peroxide.
• the W polishing rates were obtained by polishing eight inch blanket wafers having a W layer using a Mirra3i ; CMP tool (available from Applied Materials) and an ICiOiO polishing pad at down-force of 2.5 psi, a platen speed of 103 rpm, a head speed of 97 rpm, and a slurry flow rate of 150 ml min.
• the polishing time in this example was one roinate.
• the weight percentages of the first and second silica abrasives and the corresponding W removal rates arid wafer clear time are shown on Table 5.
• mixed abrasive polishing compositions 5B and 5C achieved higher W polishing rates than the control composition (5 A).
• mixed abrasive polishing compositions 5D and 5E including mixtures of a colloidal silica having a permanent positive charge (B l ) and a colloidal silica having a non-permanent positive charge (C2) ⁇ achieved higher W polishing rates than any of the other compositions.
• Mixed abrasive polishing compositions 5D and 5E were also observed to clear the waver in less time than the other compositions indicating the potential for a higher throughput CMP process.
• the tungsten. ⁇ W polishing rate was evaluated in this example for various polishing compositions, five of which included first and second silica abrasives selected from dispersions Bl , D2, and Pi ia Example I .
• This example demonstrates the effects of the relative amounts of the first and second silica abrasives on the W polishing rate and the time to clear the wafer (the end point time).
• Each of the polishing compositions had a pH of .2.5 and included 0.031 weight percent ferric nitrate nonahydtate, 0.04 weight percent tnalonic acid, and 2,4 weigh percent hydrogen, peroxide.
• the W polishing rates were obtained by polishing eight inch blanket wafers having a W layer using a Mirra® CMP tool (available from Applied Materials) and an ICI OK ) polishing pad at down-force of 2.5 pst, a platen speed of 103 rpm, a head speed of 97 rpm, and a slurry flow rate of .150 ml/min.
• the polishing time in this example was two minutes.
• the weight percentages of the first and second silica abrasives and the corresponding W removal rates are shown on Table 6.
• mixed abrasive polishing compositions 6B, 6C, and 6D achieved higher W polishing rates and a shorter wafer clear time than the control composition 6A.
• Mixed abrasive polishing compositions 6E and 6F also achieved higher W polishing rates and a shorted wafer clear time than the control composition 6A.
• Each of the polishing compositions had a pH of 2,5 (adjusted using nitric acid) and included 0,031 weight percent ferric nitraie nonahydrate, 0.04 weight percent ma.lonic acid, 100 ppm tetrabuiylammoni am hydroxide (TBAH), and 2.4 weight percent hydrogen peroxide.
• the W polishing rates were obtained by polishing eight inch blanket wafers havin a W layer using a Mirra €> CMP too! (available from Applied Materials) and an IC 1010 polishing pad at down-force of 2,5 psi, a platen speed of 103 rpm, a head speed of 97 rpm, and a slurry flow rate of 150 ml/min.
• the polishing time in this example was two minutes.
• the weight percentages of the first and second silica abrasives and the corresponding W removal rates are shown o Table 7.
• polishing compositions ?B and 70 (including mixtures of dispersions Bl and D2 and C i and 02) achieved higher W
• Polishing compositions 7.E, 7F, and 7G (including mixtures of dispersions CI and D2) achieved approximately equal W polishing rates and shorter wafer clear times than the control composition 7A despite having half or less the solids loading.
• Polishing composition 70 (including a mixture of dispersions CI and 02) achieved an approximately equal W polishing rate and wafer clear time as compared to the control composition 7 A despite having one quarter the solids loading (0.2 vs. 0.8 weight percent).
• the zeta- potemials of the polishing compositions were measured before and after the ultrafiltration procedure (i.e.. for the original polishing composition and the triply ultra-filtered and replenished polishing composition) using a Model DT 1202 Acoustic and Electro-acoustic spectrometer (available from Dispersion Technologies).
• the electrical conductivities of the polishing compositions were measured before and after the ultrafiltration procedure usin a standard conductivity meter.
• Table 8 shows the measured zeta potential and conductivity values for polishing compositions 8A, 8B, SC, and 8D made from dispersions CI, C2, and 02 described in Example 1.
• Polishing composition 8A was prepared using dispersion Ci by diluting with 01 water to a final colloidal silica concentration of 2 weight percent and adjusting the pH to 2,6 using nitric acid.
• Polishing composition 8B was prepared using dispersion C2 by diluting with Dl water to a final silica concentration of 2 weight percent and adjusting the pH to 2.6 using nitric acid.
• the colloidal silica was treated using O. i weight percent TBAH to obtain particles having a non-permanent positive charge.
• Polishing composition 8C was prepared using dispersion C2 by diluting with DI water to a final silica concentration of 2 weight percent and adjusting the pH to 2.3 using nitric acid. The colloidal silica particles remained untreated. Polishing composition 8 ' D was prepared by diluting and mixing dispersions Ci and 02 such that the final mixture included 1. weight percent of the colloidal silica particles from fire C 1 dispersion and 0.6 weight percent of the colloidal silica particles from the D2 dispersion. The D2 dispersion was further treated with 0.0.1 weight percent TBAR to obtain particles having a non-permanent positi ve charge. Polishing composition 80 further included 0.031 weight percent ferric nitrate nonahydrate and 0,04 weight percent malonic acid.
• the zeta potential of polishing composition 8A was .not changed by filtration indicating that the colloidal silica had a permanent positive charge of 41 mV
• the zeta potential of polishing composition SB decreased from 10 to 3 mV indicating that the positive charge on the colloidal silica was not permanent.
• the zeta potential of polishing composition 8C (the untreated colloidal silica particles) was essentially neutral (4 mV).
• the zeta potential of polishing composition 8D decreased modestly from 17 to 1 1 mV.
• polishing compositions 9 A, B, and 9C were prepared by diluting dispersions Blroute CI, and D2 respectively with DI water to a final colloidal silica concentration of I weight percent.
• Polishing composition 9D was prepared by diluting and mixin g dispers io ns B i an D2 such that the final mix tare i ncluded 0.2 weight percent of the colloidal silica particles from the B 1 dispersion and 0.3 weight percent of the colloidal silica particles from the D2 dispersion.
• Polishing composition 9E was prepared by diluting and mixing dispersions Ci and D2 such that the final mixture included 0.2 weight percent of the colloidal silica panicles from the C i dispersion and 0.3 weight percent of the colloidal silica particles from the ⁇ 2 dispersion, ln polishing
• compositions 9D and 9E the D2 dispersion was further treated with 1 0 ppm by weight TBAH to obtain particles having a non-permanent positive charge.
• Polishing compositions 9D and 9£ turther included 193 ppm by weight ferric nitrate nonahydtate,. 250 ppm by weight malonic acid, and 7 ppm by weight Kathon biocide.
• the pH of each of the five polishing compositions ( A, 98, 9C, 9D, and 9E) was adjusted to 2.5 using nitric acid.
• Polishing compositio 9A has a particle size distribution with a peak, at 50 nm.
• Polishing composition 9B has a particle size distribution with a peak at 70 nm.
• Polishing composition 9C has a particle size distribution with peak, at 1 15 nm.
• Polishing composition 9D has a bimodal distribution with a first peak at 50 nm and a second peak, at 1 15 nm.
• Polishing composition 9E has a bimodal distribution with a first peak, at 75 nm and a second peak at 1 1 nm.

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