WO2013137212A1 - 研磨用組成物及び半導体基板の製造方法 - Google Patents
研磨用組成物及び半導体基板の製造方法 Download PDFInfo
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- WO2013137212A1 WO2013137212A1 PCT/JP2013/056702 JP2013056702W WO2013137212A1 WO 2013137212 A1 WO2013137212 A1 WO 2013137212A1 JP 2013056702 W JP2013056702 W JP 2013056702W WO 2013137212 A1 WO2013137212 A1 WO 2013137212A1
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- Prior art keywords
- polishing composition
- monomer unit
- polishing
- silicon chip
- polymer
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- DXGKKTKNDBFWLL-UHFFFAOYSA-N azane;2-[bis(carboxymethyl)amino]acetic acid Chemical compound N.N.N.OC(=O)CN(CC(O)=O)CC(O)=O DXGKKTKNDBFWLL-UHFFFAOYSA-N 0.000 description 1
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- WQZGKKKJIJFFOK-VFUOTHLCSA-N beta-D-glucose Chemical compound OC[C@H]1O[C@@H](O)[C@H](O)[C@@H](O)[C@@H]1O WQZGKKKJIJFFOK-VFUOTHLCSA-N 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011246 composite particle Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- SWSQBOPZIKWTGO-UHFFFAOYSA-N dimethylaminoamidine Natural products CN(C)C(N)=N SWSQBOPZIKWTGO-UHFFFAOYSA-N 0.000 description 1
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical class C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 1
- 239000002612 dispersion medium Substances 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- DUYCTCQXNHFCSJ-UHFFFAOYSA-N dtpmp Chemical compound OP(=O)(O)CN(CP(O)(O)=O)CCN(CP(O)(=O)O)CCN(CP(O)(O)=O)CP(O)(O)=O DUYCTCQXNHFCSJ-UHFFFAOYSA-N 0.000 description 1
- 238000002296 dynamic light scattering Methods 0.000 description 1
- NFDRPXJGHKJRLJ-UHFFFAOYSA-N edtmp Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CCN(CP(O)(O)=O)CP(O)(O)=O NFDRPXJGHKJRLJ-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000005187 foaming Methods 0.000 description 1
- 230000000855 fungicidal effect Effects 0.000 description 1
- 239000000417 fungicide Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000008103 glucose Substances 0.000 description 1
- 238000010559 graft polymerization reaction Methods 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- GTTBQSNGUYHPNK-UHFFFAOYSA-N hydroxymethylphosphonic acid Chemical compound OCP(O)(O)=O GTTBQSNGUYHPNK-UHFFFAOYSA-N 0.000 description 1
- QWPPOHNGKGFGJK-UHFFFAOYSA-N hypochlorous acid Chemical compound ClO QWPPOHNGKGFGJK-UHFFFAOYSA-N 0.000 description 1
- 150000002466 imines Chemical class 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 239000003456 ion exchange resin Substances 0.000 description 1
- 229920003303 ion-exchange polymer Polymers 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 229920002114 octoxynol-9 Polymers 0.000 description 1
- FATBGEAMYMYZAF-KTKRTIGZSA-N oleamide Chemical compound CCCCCCCC\C=C/CCCCCCCC(N)=O FATBGEAMYMYZAF-KTKRTIGZSA-N 0.000 description 1
- 229940113162 oleylamide Drugs 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- 238000010979 pH adjustment Methods 0.000 description 1
- LQPLDXQVILYOOL-UHFFFAOYSA-I pentasodium;2-[bis[2-[bis(carboxylatomethyl)amino]ethyl]amino]acetate Chemical compound [Na+].[Na+].[Na+].[Na+].[Na+].[O-]C(=O)CN(CC([O-])=O)CCN(CC(=O)[O-])CCN(CC([O-])=O)CC([O-])=O LQPLDXQVILYOOL-UHFFFAOYSA-I 0.000 description 1
- 229960005323 phenoxyethanol Drugs 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920000259 polyoxyethylene lauryl ether Polymers 0.000 description 1
- 239000000244 polyoxyethylene sorbitan monooleate Substances 0.000 description 1
- 235000010482 polyoxyethylene sorbitan monooleate Nutrition 0.000 description 1
- 239000001818 polyoxyethylene sorbitan monostearate Substances 0.000 description 1
- 235000010989 polyoxyethylene sorbitan monostearate Nutrition 0.000 description 1
- 229920002503 polyoxyethylene-polyoxypropylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920000053 polysorbate 80 Polymers 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 229960003975 potassium Drugs 0.000 description 1
- 235000011056 potassium acetate Nutrition 0.000 description 1
- 239000001103 potassium chloride Substances 0.000 description 1
- 235000011164 potassium chloride Nutrition 0.000 description 1
- 229940086066 potassium hydrogencarbonate Drugs 0.000 description 1
- OTYBMLCTZGSZBG-UHFFFAOYSA-L potassium sulfate Chemical compound [K+].[K+].[O-]S([O-])(=O)=O OTYBMLCTZGSZBG-UHFFFAOYSA-L 0.000 description 1
- 229910052939 potassium sulfate Inorganic materials 0.000 description 1
- 235000011151 potassium sulphates Nutrition 0.000 description 1
- ARIWANIATODDMH-UHFFFAOYSA-N rac-1-monolauroylglycerol Chemical compound CCCCCCCCCCCC(=O)OCC(O)CO ARIWANIATODDMH-UHFFFAOYSA-N 0.000 description 1
- 229920005604 random copolymer Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 235000017550 sodium carbonate Nutrition 0.000 description 1
- DZCAZXAJPZCSCU-UHFFFAOYSA-K sodium nitrilotriacetate Chemical compound [Na+].[Na+].[Na+].[O-]C(=O)CN(CC([O-])=O)CC([O-])=O DZCAZXAJPZCSCU-UHFFFAOYSA-K 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 235000019337 sorbitan trioleate Nutrition 0.000 description 1
- 229960000391 sorbitan trioleate Drugs 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 230000001502 supplementing effect Effects 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- DZLFLBLQUQXARW-UHFFFAOYSA-N tetrabutylammonium Chemical compound CCCC[N+](CCCC)(CCCC)CCCC DZLFLBLQUQXARW-UHFFFAOYSA-N 0.000 description 1
- CBXCPBUEXACCNR-UHFFFAOYSA-N tetraethylammonium Chemical compound CC[N+](CC)(CC)CC CBXCPBUEXACCNR-UHFFFAOYSA-N 0.000 description 1
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 description 1
- 229910001428 transition metal ion Inorganic materials 0.000 description 1
- 229910021642 ultra pure water Inorganic materials 0.000 description 1
- 239000012498 ultrapure water Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/04—Aqueous dispersions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/06—Other polishing compositions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
- H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
Definitions
- the present invention relates to a polishing composition and a method for producing a semiconductor substrate.
- a polishing composition containing a water-soluble polymer is known as a polishing composition used for polishing the surface of a silicon substrate.
- Some water-soluble polymers have a function of reducing the haze level of the polished surface of the silicon substrate by adsorbing to the abrasive grains and stabilizing the dispersed state of the abrasive grains, and adsorbed on the polished surface of the silicon substrate. Some have the function of increasing the wettability of the polished surface.
- Patent Document 1 discloses a polishing composition containing a PVA-polyvinylpyrrolidone (PVP) copolymer obtained by graft polymerization of polyvinyl pyrrolidone (VP) to polyvinyl alcohol (PVA), and a metal film formed on a substrate. It is disclosed that it is used for an application. According to the polishing composition of Patent Document 1, a high polishing rate can be obtained while maintaining a low etching rate during polishing of a metal film. However, Patent Document 1 does not disclose the use of a polishing composition containing a PVA-PVP copolymer for polishing a silicon substrate.
- PVP polyvinylpyrrolidone
- the polishing composition used for polishing a silicon substrate contains various water-soluble polymers for the purpose of reducing the haze level of the polished surface of the silicon substrate and improving the wettability of the polished surface. is doing.
- the water-soluble polymer contained in the conventional polishing composition used for polishing a silicon substrate can simultaneously reduce the haze level of the polished surface of the silicon substrate and improve the wettability of the polished surface. It wasn't.
- the inventors of the present invention are a co-polymer composed of a first monomer unit having excellent wettability imparting characteristics to a silicon substrate and a second monomer unit having excellent adsorption characteristics to abrasive grains. It has been found that by employing a polymer, the wettability of the polished surface can be improved while reducing the haze level of the polished surface of the silicon substrate.
- the present invention has been made on the basis of the above knowledge, and the object thereof is to improve the wettability of the polished surface of the silicon substrate and reduce the haze level of the polished surface and the semiconductor substrate. It is in providing the manufacturing method of.
- a polishing composition having a pH of 7 or more used for polishing a silicon substrate contains abrasive grains and a water-soluble polymer, and the water-soluble polymer has a first monomer unit having a characteristic value P of 50 to 100 and a characteristic value P of ⁇ 100 to 50.
- the characteristic value P is a difference obtained by subtracting the adsorption coefficient S2 for the abrasive grains from the wettability coefficient S1 for the silicon substrate.
- the wettability coefficient S1 and the adsorption coefficient S2 are determined by the following standard tests A and B, respectively.
- a square silicon chip (one side is 32 mm, the conductivity type is P type, the crystal orientation is ⁇ 100>, the resistivity is 0.1 ⁇ ⁇ cm to 100 ⁇ ⁇ cm) is immersed in a hydrofluoric acid solution. Then, the oxide film on the silicon chip surface is removed.
- the silicon chip After pulling up the silicon chip from the aqueous solution of the test polymer, the silicon chip is arranged so that one diagonal of the silicon chip faces the vertical direction. After standing for 5 seconds, the shortest distance X [mm] from the uppermost point (upper vertex) of the silicon chip to the liquid level remaining on the silicon chip surface is measured.
- Wetability coefficient S1 ⁇ (length of diagonal of silicon chip [mm]) ⁇ (shortest distance X [mm]) ⁇ / (length of diagonal of silicon chip [mm]) ⁇ 100 [Standard test B] (B1) A homopolymer having an average degree of polymerization of 800 or more and 1200 or less consisting only of monomer units to be tested is prepared as a test polymer.
- Adsorption coefficient S2 ⁇ 0.02- (concentration Y) ⁇ (dilution ratio) ⁇ / 0.02 ⁇ 100
- the copolymer is preferably a block copolymer or a graft copolymer.
- the one or more monomer units constituting the copolymer are preferably monomer units derived from an ethylenically unsaturated compound.
- the first monomer unit has at least one structure selected from ethylene oxide group, carboxy group, sulfo group, amino group, hydroxyl group, amide group, imide group, nitrile group, ether group, ester group, and salts thereof. It is preferable to have.
- the second monomer unit preferably has a heterocyclic ring, and the heterocyclic ring is preferably a lactam group.
- a method for producing a semiconductor substrate which includes a polishing step of polishing a silicon substrate using the polishing composition.
- the polishing composition of the present invention the wettability of the polished surface of the silicon substrate can be improved and the haze level of the polished surface can be reduced. Moreover, according to the manufacturing method of the semiconductor substrate using the polishing composition of the present invention, a stable quality polishing product can be manufactured.
- the polishing composition contains abrasive grains and a water-soluble polymer, and preferably further contains a basic compound, a chelating agent, and a surfactant.
- the polishing composition is prepared by mixing each component such as abrasive grains and water-soluble polymer with water.
- the polishing composition has a pH of 7 or more and is used for polishing the surface of a silicon substrate.
- a preliminary polishing process primary polishing and secondary polishing
- the polishing composition can be suitably used for both pre-polishing and final polishing of the silicon substrate.
- a silicon substrate whose surface is polished with the polishing composition can be suitably used for the production of a semiconductor substrate.
- the abrasive grains function to physically polish the surface of the silicon substrate.
- abrasive grains include inorganic particles, organic particles, and organic-inorganic composite particles.
- the inorganic particles include particles made of a metal oxide such as silica, alumina, ceria, titania, and silicon nitride particles, silicon carbide particles, and boron nitride particles.
- Specific examples of the organic particles include polymethyl methacrylate (PMMA) particles.
- silica is preferred.
- Specific examples of silica include colloidal silica, fumed silica, and sol-gel silica. From the viewpoint of reducing scratches generated on the polished surface of the silicon substrate, colloidal silica and fumed silica are preferable, and colloidal silica is particularly preferable.
- These silicas may be used individually by 1 type, and may be used in combination of 2 or more types.
- the true specific gravity of silica is preferably 1.5 or more, more preferably 1.6 or more, and still more preferably 1.7 or more. As the true specific gravity of silica increases, a higher polishing rate is obtained when polishing a silicon substrate.
- the true specific gravity of silica is preferably 2.2 or less. As the true specific gravity of silica decreases, scratches generated on the polished surface of the silicon substrate decrease.
- the true specific gravity of silica is calculated from the weight of the dried silica particles and the total weight after the silica particles are immersed in ethanol with a known volume.
- the average primary particle diameter of the abrasive grains is preferably 5 nm or more, more preferably 10 nm or more, and further preferably 20 nm or more. As the average primary particle diameter of the abrasive grains increases, a high polishing rate is obtained when the silicon substrate is polished.
- the average primary particle diameter of the abrasive grains is preferably 100 nm or less, more preferably 50 nm or less, and still more preferably 40 nm or less. As the average primary particle diameter of the abrasive grains decreases, the stability of the polishing composition improves.
- the value of the average primary particle diameter of the abrasive grains is calculated from, for example, the specific surface area measured by the BET method.
- the measurement of the specific surface area of the abrasive grains can be performed using, for example, “Flow SorbII 2300” manufactured by Micromeritex.
- the average secondary particle diameter of the abrasive grains is preferably 10 nm or more, more preferably 20 nm or more. As the average secondary particle diameter of the abrasive grains increases, a high polishing rate is obtained when the silicon substrate is polished.
- the average secondary particle diameter of the abrasive grains is preferably 200 nm or less, more preferably 150 nm or less. As the average secondary particle diameter of the abrasive grains decreases, the stability of the polishing composition improves.
- the average secondary particle diameter of the abrasive grains can be measured, for example, by a dynamic light scattering method using FPAR-1000 manufactured by Otsuka Electronics.
- the average value of the major axis / minor axis ratio of the abrasive grains is preferably 1.0 or more, more preferably 1.05 or more, and still more preferably 1.1 or more. As the average value of the major axis / minor axis ratio increases, a high polishing rate is obtained when the silicon substrate is polished.
- the average value of the major axis / minor axis ratio of the abrasive grains is preferably 3.0 or less, more preferably 2.0 or less, and still more preferably 1.5 or less. As the average value of the major axis / minor axis ratio decreases, scratches generated on the polished surface of the silicon substrate decrease.
- the ratio of the number of particles having a major axis / minor axis ratio of 1.5 or more to the total number of abrasive grains contained in the polishing composition is preferably 10% or more, more preferably 20% or more. is there. As the ratio of particles having a major axis / minor axis ratio of 1.5 or more increases, a high polishing rate is obtained when the silicon substrate is polished.
- the ratio of particles having a major axis / minor axis ratio of 1.5 or more is preferably 90% or less, and more preferably 80% or less. As the ratio of the abrasive grains having the major axis / minor axis ratio of 1.5 or more decreases, the haze level of the polished surface of the silicon substrate decreases.
- the major axis / minor axis ratio is a value related to the shape of the abrasive grains, and can be determined using, for example, an electron microscope image of the abrasive grains. Specifically, in a scanning electron microscope image of a predetermined number (for example, 200) of abrasive grains, a minimum circumscribed rectangle is drawn for each abrasive grain. Next, for each minimum circumscribed rectangle, the major axis / minor axis ratio is calculated by dividing the long side length (major axis value) by the short side length (minor axis value). Moreover, the average value of the major axis / minor axis ratio can be obtained by calculating the average value thereof.
- the content of abrasive grains in the polishing composition is preferably 0.1% by mass or more, more preferably 0.15% by mass or more. As the content of abrasive grains increases, a high polishing rate is obtained when polishing a silicon substrate.
- the content of abrasive grains in the polishing composition is preferably 10% by mass or less, more preferably 8% by mass or less, still more preferably 6% by mass or less, and still more preferably 3% by mass or less. Yes, and most preferably 1% by mass or less. As the abrasive content decreases, the stability of the polishing composition improves.
- the polishing composition contains a specific copolymer as a water-soluble polymer.
- the copolymer increases the wettability of the polished surface and reduces the haze level of the polished surface during surface treatment of the silicon substrate such as during polishing or rinsing.
- the copolymer includes, as monomer units (constituent units), a first monomer unit having excellent wettability imparting properties to a silicon substrate, and a second monomer unit having excellent adsorption properties to abrasive grains.
- the copolymer is composed of a first monomer unit having a characteristic value P of 50 to 100 and a second monomer unit having a characteristic value P of ⁇ 100 to less than 50. It is a copolymer.
- the characteristic value P is a difference obtained by subtracting the adsorption coefficient S2 for the abrasive grains from the wettability coefficient S1 for the silicon substrate.
- the wettability coefficient S1 is an index value indicating the magnitude of the wettability imparting property of the monomer unit to the silicon substrate, and is a value obtained by the following standard test A.
- the adsorption coefficient S2 is an index value indicating the magnitude of the adsorption characteristic with respect to the abrasive grains of monomer units, and is a value obtained by the following standard test B.
- a square silicon chip (one side is 32 mm, the conductivity type is P type, the crystal orientation is ⁇ 100>, the resistivity is 0.1 ⁇ ⁇ cm to 100 ⁇ ⁇ cm) is immersed in a hydrofluoric acid solution. Then, the oxide film on the silicon chip surface is removed.
- the silicon chip After pulling up the silicon chip from the aqueous solution of the test polymer, the silicon chip is arranged so that one diagonal of the silicon chip faces the vertical direction. After standing for 5 seconds, the shortest distance X [mm] from the uppermost point (upper vertex) of the silicon chip to the liquid level remaining on the silicon chip surface is measured.
- Wetability coefficient S1 ⁇ (length of diagonal of silicon chip [mm]) ⁇ (shortest distance X [mm]) ⁇ / (length of diagonal of silicon chip [mm]) ⁇ 100 [Standard test B] (B1) A homopolymer having an average degree of polymerization of 800 or more and 1200 or less consisting only of monomer units to be tested is prepared as a test polymer.
- the concentration Y [mass%] of the test polymer in the supernatant of the aqueous solution after the centrifugation treatment is measured.
- the concentration Y of the test polymer can be determined based on, for example, the total carbon amount (TOC) contained in the supernatant.
- Adsorption coefficient S2 ⁇ 0.02- (concentration Y) ⁇ (dilution ratio) ⁇ / 0.02 ⁇ 100
- the wettability coefficient S1 of the first monomer unit is preferably 50 or more, more preferably 70 or more, still more preferably 80 or more, and most preferably 90 or more.
- the first monomer unit has at least one structure selected from ethylene oxide group, carboxy group, sulfo group, amino group, hydroxyl group, amide group, imide group, nitrile group, ether group, ester group, and salts thereof.
- the monomer unit is preferably a monomer unit derived from an ethylenically unsaturated compound such as vinyl alcohol or acrylic acid. Among these, a monomer unit derived from vinyl alcohol is particularly preferable.
- the first monomer unit may be composed of only one type of monomer unit, or may be composed of two or more types of monomer units.
- the at least one type of monomer unit is preferably a monomer unit derived from an ethylenically unsaturated compound. More preferably, all of the units are monomer units derived from an ethylenically unsaturated compound.
- the adsorption coefficient S2 of the second monomer unit is preferably 50 or more, more preferably 70 or more, still more preferably 80 or more, and most preferably 90 or more.
- the second monomer unit is preferably a monomer unit having a heterocyclic ring such as a lactam group, and particularly derived from an ethylenically unsaturated compound such as N-vinyl-2-pyrrolidone or N-vinyl- ⁇ -caprolactam. It is preferable that it is a monomer unit. Among these, a monomer unit derived from N-vinyl-2-pyrrolidone is particularly preferable.
- the second monomer unit may be composed of only one type of monomer unit, or may be composed of two or more types of monomer units.
- the at least one type of monomer unit is preferably a monomer unit derived from an ethylenically unsaturated compound, and the second monomer More preferably, all of the units are monomer units derived from an ethylenically unsaturated compound.
- copolymer examples include a PVA-PVP copolymer comprising a first monomer unit derived from vinyl alcohol and a second monomer unit derived from N-vinyl-2-pyrrolidone.
- the copolymer may be any of a random copolymer composed of a first monomer unit and a second monomer unit, an alternating copolymer, a block copolymer, and a graft copolymer. .
- the first monomer unit is mainly used.
- a block copolymer or graft copolymer having a first polymer constituted as a component and a second polymer constituted mainly of a second monomer unit is preferred.
- the copolymer is a block copolymer
- a first polymer (first block chain) composed mainly of a first monomer unit
- a second monomer unit A block copolymer composed of a second polymer (second block chain) constituted as a main component is preferable.
- the copolymer is a graft copolymer
- the first polymer (main chain) composed mainly of the first monomer unit is added to the first polymer composed mainly of the second monomer unit.
- a graft copolymer in which the first polymer (side chain) is grafted is preferable.
- the ratio of the first monomer unit in the first polymer is preferably 50% or more, more preferably 70% or more, still more preferably 90% or more, and most preferably 100%.
- the polymer comprised as a main component the 1st monomer unit derived from vinyl alcohol is preferable, and a PVA polymer is more preferable.
- the ratio of the second monomer unit in the second polymer is preferably 50% or more, more preferably 70% or more, still more preferably 90% or more, and most preferably 100%.
- the second polymer a polymer composed mainly of a second monomer unit derived from N-vinyl-2-pyrrolidone is preferable, and a PVP polymer is more preferable.
- a PVA-PVP block copolymer having the PVA polymer as the first block chain and the PVP polymer as the second block chain is particularly preferable.
- a PVA-PVP graft copolymer having a PVA polymer as a main chain and a PVP polymer as a side chain or a PVP polymer as a main chain and a PVA polymer as a side chain.
- a PVP-PVA graft copolymer is particularly preferable, and a PVA-PVP graft copolymer having a PVA polymer as a main chain and a PVP polymer as a side chain is most preferable.
- the weight average molecular weight of the entire copolymer is preferably 2000 or more, more preferably 10,000 or more, and further preferably 15000 or more in terms of polyethylene oxide. As the weight average molecular weight of the entire copolymer increases, the wettability of the polished surface of the silicon substrate increases.
- the weight average molecular weight of the entire copolymer is preferably 2000000 or less, more preferably 1500,000 or less, still more preferably 1000000 or less, and most preferably 500000 or less. As the weight average molecular weight of the entire copolymer decreases, the stability of the polishing composition improves.
- the weight average molecular weight of each block chain composed of the first monomer unit or the second monomer unit is preferably 1000 or more in terms of polyethylene oxide, More preferably, it is 10,000 or more, More preferably, it is 15000 or more, Most preferably, it is 20000 or more. Moreover, it is preferable that the weight average molecular weight of each block chain is 1 million or less, More preferably, it is 500000 or less, Most preferably, it is 300000 or less.
- the weight average molecular weight of the main chain composed of one of the first monomer unit and the second monomer unit is preferably 1000 or more in terms of polyethylene oxide. More preferably, it is 5000 or more, More preferably, it is 10,000 or more, More preferably, it is 15000 or more. Further, the weight average molecular weight of the main chain is preferably 1000000 or less, more preferably 500000 or less, still more preferably 300000 or less, still more preferably 200000 or less, and most preferably 100000 or less.
- the weight average molecular weight of the side chain composed of the other of the first monomer unit and the second monomer unit is preferably 1000 or more, more preferably 10,000 or more, and further preferably 15000 in terms of polyethylene oxide. That's it. Moreover, it is preferable that the weight average molecular weight of a side chain is 1 million or less, More preferably, it is 500000 or less, More preferably, it is 300000 or less, More preferably, it is 200000 or less, Most preferably, it is 100000 or less.
- content of the said copolymer in polishing composition is 0.002 mass% or more, More preferably, it is 0.004 mass% or more.
- the content of the copolymer in the polishing composition is preferably 0.5% by mass or less, more preferably 0.05% by mass or less, and still more preferably 0.03% by mass or less. Most preferably, it is 0.02 mass% or less.
- the stability of the polishing composition improves.
- Water becomes a dispersion medium or solvent for other components. It is preferable that water does not inhibit the function of other components contained in the polishing composition. Examples of such water include water having a total content of transition metal ions of 100 ppb or less.
- the purity of water can be increased, for example, by removing impurity ions using an ion exchange resin, removing foreign matters using a filter, distillation, or the like. Specifically, for example, ion exchange water, pure water, ultrapure water, distilled water or the like is preferably used.
- the pH of the polishing composition is 7.0 or more, preferably 8.0 or more, more preferably 9.0 or more, and most preferably 10.0 or more. As the pH of the polishing composition increases, a higher polishing rate is obtained when polishing the silicon substrate. It is preferable that pH of polishing composition is 12.0 or less, More preferably, it is 11.0 or less, Most preferably, it is 10.5 or less. As the pH of the polishing composition decreases, the shape of the silicon substrate tends to be maintained.
- the polishing composition may contain a basic compound.
- the basic compound functions to chemically polish the polished surface of the silicon substrate (chemical etching). Thereby, it becomes easy to improve the polishing rate at the time of polishing the silicon substrate.
- alkali metal hydroxides or salts examples include alkali metal hydroxides or salts, quaternary ammonium hydroxide or salts thereof, ammonia, amines, and the like.
- alkali metal examples include potassium and sodium.
- the salt examples include carbonate, hydrogen carbonate, sulfate, acetate and the like.
- quaternary ammonium examples include tetramethylammonium, tetraethylammonium, and tetrabutylammonium.
- alkali metal hydroxide or salt include potassium hydroxide, potassium carbonate, potassium hydrogen carbonate, potassium sulfate, potassium acetate, potassium chloride and the like.
- quaternary ammonium hydroxide or a salt thereof include tetramethylammonium hydroxide, tetraethylammonium hydroxide, and tetrabutylammonium hydroxide.
- amines include methylamine, dimethylamine, trimethylamine, ethylamine, diethylamine, triethylamine, ethylenediamine, monoethanolamine, N- ( ⁇ -aminoethyl) ethanolamine, hexamethylenediamine, diethylenetriamine, triethylenetetramine, anhydrous piperazine Piperazine hexahydrate, 1- (2-aminoethyl) piperazine, N-methylpiperazine, guanidine and the like. These basic compounds may be used individually by 1 type, and may be used in combination of 2 or more type.
- the basic compounds at least one selected from ammonia, ammonium salts, alkali metal hydroxides, alkali metal salts, and quaternary ammonium hydroxides is preferable.
- At least one selected from ammonia, potassium hydroxide, sodium hydroxide, tetramethylammonium hydroxide, and tetraethylammonium hydroxide is more preferable, and more preferably at least one of ammonia and tetramethylammonium hydroxide. Yes, most preferably ammonia.
- the content of the basic compound in the polishing composition is preferably 0.001% by mass or more, more preferably 0.002% by mass or more, and further preferably 0.003% by mass or more. As the content of the basic compound increases, a high polishing rate is obtained when the silicon substrate is polished.
- the content of the basic compound in the polishing composition is preferably 1.0% by mass or less, more preferably 0.5% by mass or less, still more preferably 0.2% by mass or less, Most preferably, it is 0.1 mass% or less. As the content of the basic compound decreases, the shape of the silicon substrate is easily maintained.
- the polishing composition may contain a chelating agent.
- the chelating agent functions to suppress metal contamination of the silicon substrate by capturing metal impurity components in the polishing system to form a complex.
- chelating agents include aminocarboxylic acid chelating agents and organic phosphonic acid chelating agents.
- aminocarboxylic acid chelating agent include ethylenediaminetetraacetic acid, sodium ethylenediaminetetraacetate, nitrilotriacetic acid, sodium nitrilotriacetate, ammonium nitrilotriacetate, hydroxyethylethylenediaminetriacetic acid, sodium hydroxyethylethylenediaminetriacetate, diethylenetriamine Examples include acetic acid, sodium diethylenetriaminepentaacetate, triethylenetetraminehexaacetic acid, and sodium triethylenetetraminehexaacetate.
- organic phosphonic acid chelating agents include 2-aminoethylphosphonic acid, 1-hydroxyethylidene-1,1-diphosphonic acid, aminotri (methylenephosphonic acid), ethylenediaminetetrakis (methylenephosphonic acid), diethylenetriaminepenta (methylene Phosphonic acid), ethane-1,1-diphosphonic acid, ethane-1,1,2-triphosphonic acid, ethane-1-hydroxy-1,1-diphosphonic acid, ethane-1-hydroxy-1,1,2-triphosphonic Acid, ethane-1,2-dicarboxy-1,2-diphosphonic acid, methanehydroxyphosphonic acid, 2-phosphonobutane-1,2-dicarboxylic acid, 1-phosphonobutane-2,3,4-tricarboxylic acid, ⁇ -methyl
- Examples include phosphonosuccinic acid.
- the polishing composition may contain a surfactant.
- the surfactant functions to suppress roughening of the polished surface of the silicon substrate. Thereby, it becomes easy to reduce the haze level of the polished surface.
- the polishing composition contains a basic compound, the polishing surface of the silicon substrate is likely to be roughened by chemical etching with the basic compound. For this reason, the combined use of the basic compound and the surfactant is particularly effective.
- the weight average molecular weight of the surfactant is preferably less than 10,000.
- Anionic or nonionic surfactants can be used, and among them, nonionic surfactants are preferably used. Since the nonionic surfactant has low foaming property, it is easy to handle at the time of preparation and use of the polishing composition. Moreover, when a nonionic surfactant is used, pH adjustment of polishing composition becomes easy.
- nonionic surfactant examples include oxyalkylene polymers such as polyethylene glycol and polypropylene glycol, polyoxyethylene alkyl ether, polyoxyethylene alkyl phenyl ether, polyoxyethylene alkylamine, polyoxyethylene fatty acid ester, polyoxyethylene
- examples include polyoxyalkylene adducts such as oxyethylene glyceryl ether fatty acid ester and polyoxyethylene sorbitan fatty acid ester, and copolymers of a plurality of types of oxyalkylene (diblock type, triblock type, random type, alternating type). .
- polyoxyethylene polyoxypropylene copolymer polyoxyethylene glycol, polyoxyethylene propyl ether, polyoxyethylene butyl ether, polyoxyethylene pentyl ether, polyoxyethylene hexyl ether, polyoxyethylene octyl ether, polyoxyethylene Oxyethylene-2-ethylhexyl ether, polyoxyethylene nonyl ether, polyoxyethylene decyl ether, polyoxyethylene isodecyl ether, polyoxyethylene tridecyl ether, polyoxyethylene lauryl ether, polyoxyethylene cetyl ether, polyoxyethylene stearyl Ether, polyoxyethylene isostearyl ether, polyoxyethylene oleyl ether, polyoxyethylene Phenyl ether, polyoxyethylene octyl phenyl ether, polyoxyethylene nonyl phenyl ether, polyoxyethylene dodecyl phenyl ether, polyoxyethylene styrenated phenyl ether, polyoxyethylene
- Surfactant may be used alone or in combination of two or more.
- the polishing composition may further contain a known additive generally contained in the polishing composition, for example, an antiseptic or antifungal agent, if necessary.
- a known additive generally contained in the polishing composition for example, an antiseptic or antifungal agent, if necessary.
- the antiseptic and fungicide include isothiazoline compounds, paraoxybenzoates, phenoxyethanol and the like.
- an oxidizing agent such as hydrogen peroxide, nitric acid, potassium periodate, hypochlorous acid, ozone water
- film forming agents such as alkylamines, amino acids, imines, azoles, mercaptans, glucose and cellulose.
- the polishing pad is pressed against the surface to rotate the silicon substrate and the polishing pad.
- the surface of the silicon substrate is polished by the physical action due to friction between the polishing pad and the silicon substrate surface and the physical action due to friction between the abrasive grains in the polishing composition and the silicon substrate surface.
- the polishing composition contains a basic compound
- the surface of the silicon substrate is polished by a chemical action by the basic compound in addition to the above physical action.
- the polishing composition is composed of the first monomer unit having a characteristic value P of 50 or more and 100 or less and the second monomer unit having a characteristic value P of ⁇ 100 or more and less than 50. Containing a copolymer.
- a monomer unit having a large characteristic value P (first monomer unit) and a monomer unit having a small characteristic value P (second monomer unit) coexist in one molecule of the copolymer.
- wettability imparting characteristics to the polished surface and adsorption characteristics to the abrasive grains can be exhibited at the same time.
- the present inventors have found that the use of a water-soluble polymer having these characteristics is a condition for realizing both reduction of the haze level and improvement of wettability of the polished surface of the silicon substrate.
- the above copolymer favorably adsorbs to the abrasive grains in the portion consisting of the second monomer unit having excellent adsorption characteristics with respect to the abrasive grains, and improves the dispersion stability of the abrasive grains in the polishing composition.
- the haze level of the polished surface of the silicon substrate is reduced.
- the copolymer improves the wettability of the polished surface by suitably adsorbing to the polished surface of the silicon substrate in the portion composed of the first monomer unit having excellent wettability imparting characteristics to the silicon substrate. .
- the copolymer is first adsorbed to the abrasive grains when the polishing composition is prepared. Thereafter, the copolymer adsorbed on the abrasive grains is transferred (adsorbed) to the polishing surface of the silicon substrate through contact between the abrasive grains and the silicon substrate during polishing, thereby imparting wettability to the polishing surface.
- the characteristic value P of the first monomer unit is set to a high range of 50 or more so that the wettability imparting characteristics of the copolymer can be expressed with certainty.
- the action of the copolymer in the polishing composition can increase the wettability of the polished surface of the silicon substrate and reduce the haze level of the polished surface.
- the copolymer in the polishing composition is preferably a first polymer composed mainly of the first monomer unit and a second composition composed mainly of the second monomer unit.
- the wettability imparting property of the first monomer unit to the silicon substrate and the adsorption property of the second monomer unit to the abrasive grains can be more remarkably exhibited.
- a method for manufacturing a semiconductor substrate includes a polishing step of polishing a silicon substrate using the polishing composition. As a result, a silicon substrate having high wettability on the polished surface and a reduced haze level is formed, and a high-quality semiconductor substrate can be manufactured from the silicon substrate.
- the polishing composition may further contain other water-soluble polymers in addition to the above copolymer.
- the polishing composition may be a one-part type or a multi-part type including a two-part type.
- the polishing composition may be in a concentrated state at the time of manufacture and sale. That is, the polishing composition may be manufactured and sold in the form of a stock solution of the polishing composition.
- the polishing composition may be prepared by diluting a stock solution of the polishing composition with water.
- the dilution rate is preferably 2 times or more, more preferably 5 times or more, and further preferably 10 times or more.
- the dilution ratio is preferably 100 times or less, more preferably 50 times or less, and further preferably 40 times or less.
- the stability of the stock solution of the polishing composition improves.
- Each component contained in the polishing composition may be filtered through a filter immediately before production.
- the polishing composition may be used after being filtered by a filter immediately before use. By performing the filtration treatment, coarse foreign matters in the polishing composition are removed, and the quality is improved.
- the material and structure of the filter used for the filtration process are not particularly limited.
- the filter material include cellulose, nylon, polysulfone, polyethersulfone, polypropylene, polytetrafluoroethylene (PTFE), polycarbonate, and glass.
- the filter structure include a depth filter, a pleated filter, and a membrane filter.
- the polishing pad used in the polishing step using the polishing composition is not particularly limited.
- any of non-woven fabric type, suede type, those containing abrasive grains, and those not containing abrasive grains may be used.
- the polishing composition once used for polishing may be collected and used again for polishing the silicon substrate.
- a method of reusing the polishing composition for example, there is a method in which the used polishing composition discharged from the polishing apparatus is once collected in a tank and then recycled from the tank to the polishing apparatus. Can be mentioned.
- the amount of the polishing composition discharged as a waste liquid can be reduced, and the amount of the polishing composition used can be reduced. This is useful in that the environmental load can be reduced and the cost for polishing the silicon substrate can be suppressed.
- the polishing composition When the polishing composition is reused, components such as abrasive grains are consumed and lost by polishing. For this reason, it is preferable to supplement the polishing composition with a reduced amount of each component such as abrasive grains.
- the components to be replenished may be added individually to the polishing composition, or may be added to the polishing composition as a mixture containing two or more components at any concentration, depending on the size of the tank, polishing conditions, etc. May be.
- polishing compositions of Examples 1 to 5 and Comparative Examples 1 to 5 containing colloidal silica having an average primary particle diameter of 35 nm as abrasive grains, water-soluble polymer, ammonia as a basic compound, and ion-exchanged water were prepared.
- water-soluble polymers include PVA-PVP graft copolymers (Examples 1 to 5, Comparative Example 5), PVA homopolymer (Comparative Example 1), PVP homopolymer (Comparative Example 2), and PVA homopolymer. And an equivalent mixture of PVP homopolymer (Comparative Example 3) and partially cationized PVA homopolymer (Comparative Example 4), respectively.
- the pH was adjusted to less than 7 by further adding hydrochloric acid.
- Table 1 shows the common compositions of the polishing compositions of the examples and the comparative examples.
- the PVA-PVP graft copolymer used in each example is a copolymer composed of a monomer unit derived from vinyl alcohol and a monomer unit derived from N-vinyl-2-pyrrolidone shown in Table 3.
- the wettability coefficient S1 was determined by the standard test A
- the adsorption coefficient S2 was determined by the standard test B.
- the characteristic value P was calculated from the obtained wettability coefficient S1 and adsorption coefficient S2. The results are shown in the “first monomer unit” column and the “second monomer unit” column of Table 3.
- a square silicon chip (one side is 32 mm, the conductivity type is P-type, the crystal orientation is ⁇ 100>, the resistivity is 0.1 ⁇ ⁇ cm to 100 ⁇ ⁇ cm) is added to a 3% hydrofluoric acid solution. It was immersed for 2 seconds to remove the oxide film on the silicon chip surface.
- the silicon chip After pulling up the silicon chip from the aqueous solution of the test polymer, the silicon chip was arranged so that one diagonal line of the silicon chip was oriented in the vertical direction. After standing for 5 seconds, the shortest distance X from the uppermost point (upper vertex) of the silicon chip to the liquid level remaining on the silicon chip surface was measured. As a result, the shortest distance X was 10 mm.
- B2 10% by mass of colloidal silica (PL-3 manufactured by Fuso Chemical Industry Co., Ltd.) having an average primary particle size of 35 nm measured by BET method, 0.2% by mass of ammonia, and 0.02% by mass of a test polymer 200 g of an aqueous solution was prepared. The aqueous solution was allowed to stand for 12 hours to adsorb the test polymer onto the colloidal silica.
- colloidal silica PL-3 manufactured by Fuso Chemical Industry Co., Ltd.
- the adsorption coefficient S2 was calculated from the measured concentration Y (0.001% by mass) of the test polymer based on the following formula. As a result, the adsorption coefficient S2 was “0”.
- the silicon substrate used has a diameter of 300 mm, a conductivity type of P type, a crystal orientation of ⁇ 100>, a resistivity of 0.1 ⁇ ⁇ cm to 100 ⁇ ⁇ cm, and a polishing slurry (product of Fujimi Incorporated) No. GLANZOX 1103) is pre-polished.
- the polished silicon substrate was evaluated for wettability and haze level of the polished surface.
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Abstract
Description
(a1)試験対象とする単量体単位のみからなる平均重合度800以上1200以下の単独重合体をテスト重合体として用意する。
[標準試験B]
(b1)試験対象とする単量体単位のみからなる平均重合度800以上1200以下の単独重合体をテスト重合体として用意する。
共重合体は、ブロック共重合体又はグラフト共重合体であることが好ましい。
砥粒は、シリコン基板の表面を物理的に研磨する働きをする。
研磨用組成物は水溶性高分子として特定の共重合体を含有する。上記共重合体は研磨時やリンス処理時等のシリコン基板の表面処理時において、研磨面の濡れ性を高めるとともに研磨面のヘイズレベルを低減する。
(a1)試験対象とする単量体単位のみからなる平均重合度800以上1200以下の単独重合体をテスト重合体として用意する。
[標準試験B]
(b1)試験対象とする単量体単位のみからなる平均重合度800以上1200以下の単独重合体をテスト重合体として用意する。
次に、上記共重合体を構成する第1単量体単位及び第2単量体単位の詳細について記載する。
水は他の成分の分散媒又は溶媒となる。水は、研磨用組成物に含有される他の成分の働きを阻害しないことが好ましい。このような水の例として、例えば遷移金属イオンの合計含有量が100ppb以下の水が挙げられる。水の純度は、例えば、イオン交換樹脂を用いる不純物イオンの除去、フィルターによる異物の除去、蒸留等によって高めることができる。具体的には、例えば、イオン交換水、純水、超純水、蒸留水等を用いることが好ましい。
研磨用組成物のpHは7.0以上であり、好ましくは8.0以上であり、更に好ましくは9.0以上であり、最も好ましくは10.0以上である。研磨用組成物のpHの増大につれて、シリコン基板を研磨する際に高い研磨速度が得られる。研磨用組成物のpHは12.0以下であることが好ましく、より好ましくは11.0以下であり、最も好ましくは10.5以下である。研磨用組成物のpHの減少につれて、シリコン基板の形状が維持され易くなる。
研磨用組成物は塩基性化合物を含有してもよい。塩基性化合物は、シリコン基板の研磨面を化学的に研磨する働きをする(ケミカルエッチング)。これにより、シリコン基板を研磨する際の研磨速度を向上させることが容易となる。
研磨用組成物はキレート剤を含有してもよい。キレート剤は、研磨系中の金属不純物成分を捕捉して錯体を形成することによってシリコン基板の金属汚染を抑制する働きをする。
研磨用組成物は界面活性剤を含有してもよい。界面活性剤は、シリコン基板の研磨面の荒れを抑制する働きをする。これにより、研磨面のヘイズレベルを低減することが容易となる。特に、研磨用組成物が塩基性化合物を含有する場合には、塩基性化合物によるケミカルエッチングによってシリコン基板の研磨面に荒れが生じ易くなる。このため、塩基性化合物と界面活性剤との併用は特に有効である。
研磨用組成物は、必要に応じて研磨用組成物に一般に含有されている公知の添加剤、例えば防腐剤や防カビ剤等を更に含有してもよい。防腐剤及び防カビ剤の具体例としては、イソチアゾリン系化合物、パラオキシ安息香酸エステル類、フェノキシエタノール等が挙げられる。
砥粒としての平均一次粒子径35nmのコロイダルシリカ、水溶性高分子、塩基性化合物としてのアンモニア、並びにイオン交換水を配合して、実施例1~5及び比較例1~5の研磨用組成物を調製した。水溶性高分子としては、PVA-PVPグラフト共重合体(実施例1~5、比較例5)、PVA単独重合体(比較例1)、PVP単独重合体(比較例2)、PVA単独重合体及びPVP単独重合体の等量混合物(比較例3)、部分カチオン化PVA単独重合体(比較例4)をそれぞれ使用した。また、比較例5では更に塩酸を加えることによりpHを7未満に調整した。各実施例及び比較例の研磨用組成物の共通組成を表1に示す。
各実施例で使用したPVA-PVPグラフト共重合体は、表3に示すビニルアルコール由来の単量体単位とN-ビニル-2-ピロリドン由来の単量体単位とからなる共重合体である。これら両単量体単位について、標準試験Aにより濡れ性係数S1を求めるとともに、標準試験Bにより吸着係数S2を求めた。そして、得られた濡れ性係数S1及び吸着係数S2から特性値Pを算出した。その結果を表3の“第1単量体単位”欄及び“第2単量体単位”欄に示す。
(a1)ビニルアルコール由来の単量体単位のみからなる平均重合度1000の単独重合体(PVA単独重合体)をテスト重合体として用意した。
[標準試験B]
(b1)ビニルアルコール由来の単量体単位のみからなる平均重合度1000の単独重合体(PVA単独重合体)をテスト重合体として用意した。
[特性値Pの算出]
標準試験A及びBの結果、ビニルアルコール由来の単量体単位の濡れ性係数S1は“78”であるとともに、吸着係数S2は“0”であった。したがって、濡れ性係数S1から吸着係数S2を引いた差である特性値Pは、“78(=78-0)”となる。すなわち、ビニルアルコール由来の単量体単位は、特性値Pが50以上100以下であることから第1単量体単位となる。
次に、各実施例及び比較例の研磨用組成物を用いて、予備研磨後のシリコン基板の表面を表2に記載の条件で研磨した。使用したシリコン基板は、直径が300mm、伝導型がP型、結晶方位が<100>、抵抗率が0.1Ω・cm以上100Ω・cm以下であり、株式会社フジミインコーポレーテッド製の研磨スラリー(商品名GLANZOX 1103)を用いて予備研磨したものである。研磨後のシリコン基板について研磨面の濡れ性及びヘイズレベルを評価した。
研磨後のシリコン基板の研磨面の濡れ性をA~Eで評価した。その結果を表3及び4の“濡れ性”欄に示す。なお、濡れ性の評価基準は以下のとおりである。
ケーエルエー・テンコール社製のウェーハ検査装置“Surfscan SP2”を用いて、同装置のDWOモードで研磨後のシリコン基板の研磨面を計測したときに得られる測定値に基づき、同研磨面のヘイズレベルをA~Eで評価した。その結果を表3及び4の“ヘイズレベル”欄に示す。ヘイズレベルの評価基準は以下のとおりである。
Claims (7)
- シリコン基板を研磨する用途に用いられるpH7以上の研磨用組成物であって、
前記研磨用組成物は砥粒及び水溶性高分子を含有し、前記水溶性高分子は、特性値Pが50以上100以下である第1単量体単位と、特性値Pが-100以上50未満である第2単量体単位とから構成される共重合体であり、ここで、特性値Pは、下記標準試験Aにより求められるシリコン基板に対する濡れ性係数S1から下記標準試験Bにより求められる砥粒に対する吸着係数S2を引いた差であることを特徴とする研磨用組成物。
[標準試験A]
(a1)試験対象とする単量体単位のみからなる平均重合度800以上1200以下の単独重合体をテスト重合体として用意する。
(a2)正方形のシリコンチップ(1辺が32mm、伝導型がP型、結晶方位が<100>、抵抗率が0.1Ω・cm以上100Ω・cm以下)をフッ化水素酸溶液に浸漬して、シリコンチップ表面の酸化膜を除去する。
(a3)シリコンチップを垂直に立てた状態で、テスト重合体の0.02%水溶液中にシリコンチップを30秒間浸漬する。
(a4)シリコンチップをテスト重合体の水溶液から引き上げた後、シリコンチップの一方の対角線が垂直方向を向くように配置する。5秒間静置した後、シリコンチップの最上点からシリコンチップ表面に残留する液面までの最短距離X[mm]を測定する。
(a5)測定された最短距離Xから、下記式に基づきテスト重合体を構成する単量体単位の濡れ性係数S1を算出する。
濡れ性係数S1={(シリコンチップの対角線の長さ[mm])-(最短距離X[mm])}/(シリコンチップの対角線の長さ[mm])×100
[標準試験B]
(b1)試験対象とする単量体単位のみからなる平均重合度800以上1200以下の単独重合体をテスト重合体として用意する。
(b2)平均一次粒子径が35nmのコロイダルシリカ10質量%、アンモニア0.2質量%、及びテスト重合体0.02質量%を含む水溶液を調製する。その水溶液を12時間静置してコロイダルシリカにテスト重合体を吸着させる。
(b3)上記水溶液に水を加えて体積換算で所定の希釈倍率に希釈する。希釈した水溶液を遠心分離にかけることにより、コロイダルシリカ、及びコロイダルシリカに吸着したテスト重合体を沈降させる。
(b4)遠心分離処理後の水溶液の上澄み液におけるテスト重合体の濃度Y[質量%]を測定する。
(b5)測定されたテスト重合体の濃度Yから、下記式に基づきテスト重合体を構成する単量体単位の吸着係数S2を算出する。
吸着係数S2={0.02-(濃度Y)×(希釈倍率)}/0.02×100 - 前記共重合体は、ブロック共重合体又はグラフト共重合体であることを特徴とする請求項1に記載の研磨用組成物。
- 前記共重合体を構成する1つ以上の単量体単位は、エチレン性不飽和化合物由来の単量体単位であることを特徴とする請求項1又は2に記載の研磨用組成物。
- 前記第1単量体単位は、エチレンオキサイド基、カルボキシ基、スルホ基、アミノ基、水酸基、アミド基、イミド基、ニトリル基、エーテル基、エステル基、及びこれらの塩から選ばれる少なくとも1つの構造を有することを特徴とする請求項1~3のいずれか1項に記載の研磨用組成物。
- 前記第2単量体単位は、複素環を有することを特徴とする請求項1~4のいずれか1項に記載の研磨用組成物。
- 前記複素環はラクタム基であることを特徴とする請求項5に記載の研磨用組成物。
- 請求項1~6のいずれか一項に記載の研磨用組成物を用いてシリコン基板を研磨する研磨工程を含むことを特徴とする半導体基板の製造方法。
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DE112021006638T5 (de) | 2020-12-23 | 2023-10-26 | Nitta Dupont Incorporated | Polierzusammensetzung und verfahren zum polieren von silizium-wafer |
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US9685341B2 (en) | 2017-06-20 |
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KR20140139541A (ko) | 2014-12-05 |
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