WO2011043367A1 - 導電性薄膜構造体、及び導電性薄膜構造体の製造方法 - Google Patents
導電性薄膜構造体、及び導電性薄膜構造体の製造方法 Download PDFInfo
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- WO2011043367A1 WO2011043367A1 PCT/JP2010/067525 JP2010067525W WO2011043367A1 WO 2011043367 A1 WO2011043367 A1 WO 2011043367A1 JP 2010067525 W JP2010067525 W JP 2010067525W WO 2011043367 A1 WO2011043367 A1 WO 2011043367A1
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- Prior art keywords
- thin film
- substrate
- conductive thin
- transparent electrode
- film structure
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- 239000010409 thin film Substances 0.000 title claims abstract description 68
- 238000004519 manufacturing process Methods 0.000 title claims description 33
- 239000000758 substrate Substances 0.000 claims abstract description 68
- 239000000463 material Substances 0.000 claims abstract description 37
- 238000007645 offset printing Methods 0.000 claims abstract description 18
- 238000009751 slip forming Methods 0.000 claims abstract description 7
- 229920001971 elastomer Polymers 0.000 claims description 11
- 239000005060 rubber Substances 0.000 claims description 11
- 239000004973 liquid crystal related substance Substances 0.000 claims description 8
- 230000001747 exhibiting effect Effects 0.000 abstract 1
- 238000004544 sputter deposition Methods 0.000 description 14
- 238000000034 method Methods 0.000 description 11
- 238000007639 printing Methods 0.000 description 11
- 239000007772 electrode material Substances 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 238000002834 transmittance Methods 0.000 description 5
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 229910003437 indium oxide Inorganic materials 0.000 description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 244000043261 Hevea brasiliensis Species 0.000 description 1
- 239000004944 Liquid Silicone Rubber Substances 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229920004482 WACKER® Polymers 0.000 description 1
- 238000007259 addition reaction Methods 0.000 description 1
- -1 argon ions Chemical class 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 229920003052 natural elastomer Polymers 0.000 description 1
- 229920001194 natural rubber Polymers 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 229920003051 synthetic elastomer Polymers 0.000 description 1
- 239000005061 synthetic rubber Substances 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/14—Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/81—Electrodes
- H10K30/82—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes
- H10K30/83—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes comprising arrangements for extracting the current from the cell, e.g. metal finger grid systems to reduce the serial resistance of transparent electrodes
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/13439—Electrodes characterised by their electrical, optical, physical properties; materials therefor; method of making
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/60—Forming conductive regions or layers, e.g. electrodes
- H10K71/611—Forming conductive regions or layers, e.g. electrodes using printing deposition, e.g. ink jet printing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a conductive thin film structure including a substrate, a thin wire structure formed on the substrate, and a transparent electrode formed on the substrate so as to cover the thin wire structure, and the conductive thin film structure
- the present invention relates to a method for manufacturing a body.
- touch panels have been used as input devices for electronic devices such as bank ATMs, portable information terminals, car navigation systems, and multifunction devices.
- the touch panel is a device that performs an operation according to an image displayed on the screen, and is widely used as an input device that can be easily understood by elderly people.
- the demand for touch panels is expected to increase in the future.
- the touch panel is used in combination with a display device such as a liquid crystal panel or an organic EL panel.
- a transparent electrode is used in order to efficiently apply sunlight to a semiconductor substrate that generates electrons.
- the transparent electrode for example, an indium oxide film (ITO) doped with tin is used.
- ITO indium oxide film
- a touch panel a liquid crystal panel, an organic EL panel, and the like (hereinafter sometimes abbreviated as a touch panel)
- a transparent electrode similar to a solar cell is used to show an image on the display to the operator. Therefore, in solar cell panels, touch panels, and the like, it is desired to increase the transparency (light transmittance) of the transparent electrode as much as possible.
- the film thickness of the transparent electrode must be increased. In this case, the light transmittance is reduced and the raw material cost is increased. For this reason, the technique which makes high light transmittance and low resistance value compatible is indispensable for the transparent electrode used for a solar cell panel, a touch panel, etc.
- an auxiliary electrode is formed on the substrate by a sputtering method in order to reduce the resistance value of the entire solar cell electrode.
- the auxiliary electrode is formed in a mesh shape so as not to impair the transparency of the transparent conductive thin film formed in the subsequent step. Note that the same sputtering method as that for the auxiliary electrode is performed on the transparent conductive thin film formed in the subsequent step.
- Patent Document 1 when the mesh auxiliary electrode is formed by using the sputtering method, the substrate is subjected to a mask process according to the mesh shape in advance, or an etching process according to the mesh shape after the sputtering. It is necessary to do. For this reason, it is difficult to manufacture the electrode for solar cells efficiently. Further, as in Patent Document 1, when the auxiliary electrode and the transparent conductive thin film are formed on the substrate by sputtering, in order to obtain alignment accuracy between the substrate and the auxiliary electrode and the transparent conductive thin film, mask processing and The etching process needs to be performed precisely and requires skill.
- sputtering is a method in which argon ions collide with a target electrode material under reduced pressure, and the electrode material blown off by the impact adheres to the substrate to form a film. Then, the types of applicable substrates are limited.
- a large-scale apparatus such as an argon gas supply source, a high-voltage power source, a vacuum chamber, a vacuum pump, or the like is required. Therefore, the burden of equipment cost and maintenance cost is large.
- the present invention has been made in view of the above problems, and an object of the present invention is to provide a conductive thin film structure having better quality than before. Another object of the present invention is to provide a method for producing a conductive thin film structure that can be carried out more efficiently and at a lower cost than in the past.
- the conductive thin film structure according to the present invention is characterized by a substrate, a fine wire structure formed on the substrate, and a thin wire structure formed on the substrate so as to cover the fine wire structure.
- a transparent thin-film structure, wherein the fine wire structure and the transparent electrode are continuously formed by performing gravure offset printing on the substrate using a gravure roll and an offset roll.
- the offset roll has a surface covered with a blanket material.
- the conventional conductive thin film structure is manufactured by sputtering, it is difficult to manufacture efficiently, and the substrate, thin wire structure (auxiliary electrode) and transparent It was difficult to achieve alignment accuracy with the electrode (transparent conductive thin film). Moreover, since the kind of board
- gravure offset printing is performed using an offset roll whose surface is covered with a gravure roll and a blanket material, and the fine line structure and the fine line structure are covered on the substrate. A transparent electrode is continuously formed.
- this gravure offset printing can be performed at high speed by rotation of the gravure roll and the offset roll, it is possible to efficiently form the fine line structure and the transparent electrode on the substrate. Moreover, since the gravure roll and the offset roll are easy to adjust mechanically and can be rotated precisely, the alignment accuracy between the substrate, the fine wire structure, and the transparent electrode can be improved. Furthermore, this configuration does not require expensive and large-scale equipment as in the conventional sputtering method. Therefore, the types of applicable substrates are wide, and the manufacturing cost of the conductive thin film structure can be reduced. Further, as compared with the conventional sputtering method, the amount of energy to be used can be reduced, and there is an advantage that no cleaning water is required.
- the fine wire structure preferably has a line width of 10 ⁇ m or less, and the blanket material is set to have a thickness of 3 mm or more and a rubber shore hardness of 20 or less.
- a fine line structure having a line width of 10 ⁇ m or less is efficiently obtained by setting the blanket material covering the surface of the offset roll to a thickness of 3 mm or more and a rubber shore hardness of 20 or less. It can be formed well and reliably.
- the conductive thin film structure according to the present invention is preferably used as a component of a solar cell panel, a touch panel, a liquid crystal panel, or an organic EL panel.
- a high quality conductive thin film structure that achieves both high light transmittance and low resistance can be provided efficiently and at low cost.
- the characteristic configuration of the method for manufacturing a conductive thin film structure according to the present invention includes a fine line structure forming step for forming a fine line structure on a substrate, and the fine line structure on the substrate on which the fine line structure is formed.
- the manufacturing method of the conductive thin film structure of this configuration has substantially the same effect as the above-described conductive thin film structure. That is, in the method for producing a conductive thin film structure of this configuration, gravure offset printing is performed using a gravure roll and an offset roll whose surface is covered with a blanket material, and the fine line structure and the fine line structure are formed on a substrate. A transparent electrode to be coated is continuously formed. Since this gravure offset printing can be performed at high speed by rotation of the gravure roll and the offset roll, it is possible to efficiently form the fine line structure and the transparent electrode on the substrate. Moreover, since the gravure roll and the offset roll are easy to adjust mechanically and can be rotated precisely, the alignment accuracy between the substrate, the fine wire structure, and the transparent electrode can be improved.
- this configuration does not require expensive and large-scale equipment as in the conventional sputtering method, so that the types of applicable substrates are wide and the manufacturing cost of the conductive thin film structure can be reduced. Further, as compared with the conventional sputtering method, the amount of energy to be used can be reduced, and there is an advantage that no cleaning water is required.
- the fine wire structure has a line width of 10 ⁇ m or less, and the blanket material is set to have a thickness of 3 mm or more and a rubber shore hardness of 20 or less.
- the manufacturing method of the conductive thin film structure of this configuration has substantially the same effect as the above-described conductive thin film structure. That is, the manufacturing method of the conductive thin film structure of this configuration is such that the blanket material that covers the surface of the offset roll is set to a thickness of 3 mm or more and a rubber shore hardness of 20 or less, so that a fine fine wire having a line width of 10 ⁇ m or less. The structure can be formed efficiently and reliably.
- FIG. 1 It is a schematic diagram of the manufacturing apparatus of the electroconductive thin film structure for enforcing the manufacturing method of the electroconductive thin film structure of this invention. It is a perspective view which illustrates the structure of the electroconductive thin film structure of this invention.
- FIG. 1 is a schematic view of a conductive thin film structure manufacturing apparatus 100 for carrying out the method of manufacturing a conductive thin film structure of the present invention.
- the conductive thin film structure manufacturing apparatus 100 includes a belt conveyor unit 10, a thin wire structure forming unit 20, and a transparent electrode forming unit 30.
- the belt conveyor unit 10 includes a driving roller 11 driven by a motor, a driven roller 12 arranged in a set with the driving roller 11, and a belt 13 connecting the driving roller 11 and the driven roller 12.
- the driving roller 11 and the driven roller 12 are rotated in the clockwise direction. Accordingly, the substrate 1 placed on the belt 13 moves from left to right in the drawing.
- the fine line structure forming unit 20 includes a gravure roll 21 and an offset roll 22 as main components.
- the gravure roll 21 is a metal cylinder, and an intaglio 21a serving as a mold of a thin wire structure is formed on the surface of the cylinder.
- the intaglio 21a is filled with a conductive paste that is a material having a thin wire structure supplied from a raw material supply source (not shown). Excess conductive paste protruding from the intaglio 21a is removed by the blade 21b.
- the offset roll 22 is formed of a metal cylinder similar to the gravure roll 21, and the surface thereof is covered with a blanket material 22a.
- the blanket material 22 a of the offset roll 22 is in contact with the gravure roll 21.
- the conductive paste filled in the intaglio 21a of the gravure roll 21 is transferred to the surface of the blanket material 22a of the offset roll 22.
- the transferred conductive paste is printed on the surface of the substrate 1 conveyed by the belt conveyor unit 10.
- the substrate 1 is sandwiched between the offset roll 22 and the pressure roll 23 and is pressure-bonded.
- offset printing can be reliably performed on the surface of the substrate 1 by performing this pressure bonding step.
- the “thin line structure forming step” of the present invention is executed. After the conductive paste is printed on the substrate 1, the offset roll 22 is brought into pressure contact with the metal roller cylinder 24, and the conductive paste remaining on the surface of the blanket material 22a is precisely removed.
- the transparent electrode forming unit 30 has substantially the same structure as the fine line structure forming unit 20. That is, the transparent electrode forming unit 30 includes, as main constituent elements, a gravure roll 31 formed of a metal cylinder having an intaglio 31a on the surface, and a metal cylinder, and the surface thereof is a blanket material 32a.
- the transparent electrode material filled in the intaglio 31a is transferred to the surface of the blanket material 32a of the offset roll 32.
- the transferred transparent electrode material is printed on the surface of the substrate 1 conveyed by the belt conveyor unit 10.
- the fine line structure 2 is already printed on the substrate 1 by the fine line structure forming unit 20. Therefore, the transparent electrode material is printed from above the thin line structure 2.
- the substrate 1 is sandwiched between the offset roll 32 and the pressure roll 33 and is pressure bonded. Thereby, the fine wire structure 2 and the transparent electrode 3 covering the thin wire structure 2 are formed on the substrate 1.
- the “transparent electrode forming step” of the present invention is executed. After the transparent electrode forming step, a drying step or a heating step can be performed as necessary.
- the offset roll 32 is brought into pressure contact with the metal roller cylinder 34, and the transparent electrode material remaining on the surface of the blanket material 32a is precisely removed.
- the gravure rolls 21 and 31 and the offset rolls 22 and 32 are used, and the gravure offset printing is performed on the substrate 1, whereby the fine wire structure 2 and the transparent electrode 3 are formed on the substrate 1. It can be formed continuously.
- the fine line structure 2 and the transparent electrode 3 can be efficiently formed on the substrate 1 by rotating the gravure rolls 21 and 31 and the offset rolls 22 and 32 at high speed.
- the gravure rolls 21 and 31 and the offset rolls 22 and 32 are easy to adjust mechanically and can be rotated precisely, the alignment accuracy between the substrate 1, the thin wire structure 2 and the transparent electrode 3 is improved. It can be good.
- the transparent electrode 3 can be printed at an appropriate position with respect to the fine line.
- the method using gravure offset printing of the present invention does not require expensive and large-scale equipment as in the conventional sputtering method, so the types of applicable substrates are wide-ranging, such as solar cell panels, touch panels, liquid crystal panels, Or the manufacturing cost of the electroconductive thin film structure used suitably as components, such as an organic electroluminescent panel, can be reduced. Further, as compared with the conventional sputtering method, the amount of energy to be used can be reduced, and there is an advantage that no cleaning water is required.
- the blanket material 22a covering the surface of the offset roll 22 in the thin wire structure forming unit 20 it is preferable to set the blanket material 22a covering the surface of the offset roll 22 in the thin wire structure forming unit 20 to a thickness of 3 mm or more and a rubber shore hardness of 20 or less. Thereby, it is possible to continue printing stably while reducing the line width of the thin line structure 2 to 10 ⁇ m or less.
- the thickness of the blanket material 22a is 3 mm or less, the conductive paste soaks into the blanket material 22a and easily reaches the saturation point, the maintenance frequency of the offset roll 22 increases, and the production efficiency of the conductive thin film structure decreases. There is a fear.
- the upper limit of the thickness of the blanket material 22a is preferably 30 mm or less.
- the blanket material may be deformed due to an increase in weight, and the alignment accuracy during printing may be reduced.
- the lower limit of rubber shore hardness is 2. If the rubber shore hardness is less than 2, the blanket material becomes a gel, and as a result, the roll shape of the offset roll 22 may be deformed.
- the high-quality fine wire structure 2 can be formed efficiently and reliably.
- the blanket material 32 a covering the surface of the offset roll 32 is also preferably set to the same conditions as the blanket material 22 a of the thin wire structure forming unit 20.
- the thin wire structure 2 can be reliably covered while making the thickness of the transparent electrode 3 as thin as possible.
- the high-quality transparent electrode 3 can be formed efficiently and reliably.
- Examples of materials that can be used for the blanket materials 22a and 32a include elastic materials such as silicone resins, fluorine resins, urethane resins, synthetic rubbers, and natural rubbers.
- the silicone-based resin has high durability and oil resistance, and has a sufficient stiffness with sufficient elasticity, and is particularly suitable for performing gravure offset printing on a hard substrate.
- the blanket material used in this embodiment is a two-component addition reaction curable liquid silicone rubber “Elastosil (registered trademark)” manufactured by Wacker Chemie.
- FIG. 2 is a perspective view illustrating the structure of the conductive thin film structure 5 of the present invention.
- the conductive thin film structure 5 is manufactured by the manufacturing method of the conductive thin film structure 5 described above.
- the conductive thin film structure 5 includes a substrate 1, a fine wire structure 2 formed on the substrate 1, and a transparent electrode 3 formed on the substrate 1 so as to cover the fine wire structure 2.
- the substrate 1 may be a hard substrate (eg, metal, glass, hard resin, etc.), or may be a soft substrate (eg, rubber, wood, soft resin, etc.).
- the thin wire structure 2 and the transparent electrode 3 are continuously formed by performing gravure offset printing on the substrate 1 using the above-described gravure rolls 21 and 31 and offset rolls 22 and 32.
- the surfaces of the offset rolls 22 and 32 are covered with blanket materials 22a and 32a, respectively.
- the blanket materials 22a and 32a are preferably set to a thickness of 3 mm or more and a rubber shore hardness of 20 or less. Thereby, it becomes easy to reduce the line width of the thin line structure 2 to 10 ⁇ m or less.
- the fine thin wire structure 2 can be efficiently and reliably formed, and the transparent electrode 3 can be efficiently and reliably formed on the thin wire structure 2 with high alignment accuracy. Can do.
- the conductive thin film structure 5 of the present invention is a high quality conductive thin film structure that achieves both high light transmittance and low resistance, and in particular, a solar cell panel, a touch panel, a liquid crystal panel, or an organic EL. It can be suitably used as a panel component.
- the conductive thin film structure 5 having a two-layer structure in which the thin wire structure 2 and the transparent electrode 3 are formed on the substrate 1 has been described.
- a gravure offset printing unit including a gravure roll and an offset roll may be added according to the number of layers in the conductive thin film structure manufacturing apparatus.
- both the fine wire structure 2 and the transparent electrode 3 are formed by gravure offset printing.
- the fine line structure 2 can be formed by gravure offset printing, and the transparent electrode 3 can be formed by other methods.
- the conductive thin film structure 5 and the method of manufacturing the conductive thin film structure 5 according to the present invention have a solar cell panel, a touch panel, a liquid crystal panel, or an organic material whose demand is expected to increase in the future.
- the present invention can be suitably used for EL panel components and methods for manufacturing the components.
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Abstract
Description
この点、本構成の導電性薄膜構造体では、グラビアロール及びブランケット材で表面が被覆されたオフセットロールを使用してグラビアオフセット印刷が行われ、基板の上に細線構造と当該細線構造を被覆する透明電極とが連続的に形成される。このグラビアオフセット印刷は、グラビアロール及びオフセットロールの回転により高速で実施することができるため、効率よく基板上に細線構造と透明電極とを形成することができる。また、グラビアロール及びオフセットロールは、機械的な調整が容易であるとともに精密に回転させることができるので、基板と細線構造及び透明電極との位置合わせ精度を良好なものとすることができる。
さらに、本構成では、従来のスパッタ法のような高価で大掛かりな設備も要らないので、適用可能な基板の種類が広範であり、導電性薄膜構造体の製造コストを低減することができる。また、従来のスパッタ法と比べて、使用するエネルギーの量を低減することができ、洗浄水が要らないという利点も有する。
さらに、本構成では、従来のスパッタ法のような高価で大掛かりな設備も要らないので、適用可能な基板の種類が広範であり、導電性薄膜構造体の製造コストを低減することができる。また、従来のスパッタ法と比べて、使用するエネルギーの量を低減することができ、洗浄水が要らないという利点も有する。
図1は、本発明の導電性薄膜構造体の製造方法を実施するための導電性薄膜構造体の製造装置100の模式図である。導電性薄膜構造体の製造装置100は、ベルトコンベヤユニット10、細線構造形成ユニット20、及び透明電極形成ユニット30を備えている。
図2は、本発明の導電性薄膜構造体5の構造を例示する斜視図である。導電性薄膜構造体5は、上記の導電性薄膜構造体5の製造方法によって製造される。導電性薄膜構造体5は、基板1、当該基板1の上に形成された細線構造2、当該細線構造2を被覆するように基板1の上に形成された透明電極3を備えている。基板1は硬質基板(例えば、金属、ガラス、硬質樹脂等)であってもよいし、軟質基板(例えば、ゴム、木材、軟質樹脂等)であっても構わない。
<1>上記実施形態では、基板1の上に細線構造2及び透明電極3を形成する2層構造の導電性薄膜構造体5について説明した。しかし、本発明の技術思想を用いれば、例えば、細線構造の上に複数の透明電極層を積層するなどの3層構造以上の導電性薄膜構造体を製造することも可能である。この場合、導電性薄膜構造体の製造装置において、グラビアロール及びオフセットロールからなるグラビアオフセット印刷ユニットを積層数に応じて追加すればよい。
2 細線構造
3 透明電極
5 導電性薄膜構造体
21 細線構造印刷用グラビアロール
22 細線構造印刷用オフセットロール
22a 細線構造印刷用ブランケット材
31 透明電極印刷用グラビアロール
32 透明電極印刷用オフセットロール
32a 透明電極印刷用ブランケット材
100 導電性薄膜構造体の製造装置
Claims (5)
- 基板と、
前記基板の上に形成された細線構造と、
前記細線構造を被覆するように前記基板の上に形成された透明電極と、
を備えた導電性薄膜構造体であって、
前記細線構造及び前記透明電極は、グラビアロール及びオフセットロールを使用して前記基板にグラビアオフセット印刷を行うことにより連続的に形成されたものであり、前記オフセットロールはブランケット材で表面が被覆されている導電性薄膜構造体。 - 前記細線構造は10μm以下の線幅を有し、前記ブランケット材は厚み3mm以上、ゴムショア硬度20以下に設定されている請求項1に記載の導電性薄膜構造体。
- 太陽電池パネル、タッチパネル、液晶パネル、又は有機ELパネルの部品として使用される請求項1又は2に記載の導電性薄膜構造体。
- 基板の上に細線構造を形成する細線構造形成工程と、
前記細線構造を形成した基板の上に前記細線構造を覆う透明電極を形成する透明電極形成工程と、
を包含する導電性薄膜構造体の製造方法であって、
前記細線構造及び前記透明電極は、グラビアロール及びオフセットロールを使用して前記基板にグラビアオフセット印刷を行うことにより連続的に形成され、前記オフセットロールはブランケット材で表面が被覆されている導電性薄膜構造体の製造方法。 - 前記細線構造は10μm以下の線幅を有し、前記ブランケット材は厚み3mm以上、ゴムショア硬度20以下に設定されている請求項4に記載の導電性薄膜構造体の製造方法。
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JP2015004997A (ja) * | 2012-06-07 | 2015-01-08 | 日東電工株式会社 | タッチパネル部材及びその製造方法 |
JP2015008181A (ja) * | 2013-06-24 | 2015-01-15 | 株式会社ニケ・ウィング | 太陽電池モジュール及びその製造方法 |
CN104377255A (zh) * | 2014-11-28 | 2015-02-25 | 浙江鸿禧能源股份有限公司 | 一种减少电流损失的栅线设计方法 |
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KR20120080622A (ko) | 2012-07-17 |
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