WO2010007817A1 - 異方性導電接着剤 - Google Patents
異方性導電接着剤 Download PDFInfo
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- WO2010007817A1 WO2010007817A1 PCT/JP2009/056936 JP2009056936W WO2010007817A1 WO 2010007817 A1 WO2010007817 A1 WO 2010007817A1 JP 2009056936 W JP2009056936 W JP 2009056936W WO 2010007817 A1 WO2010007817 A1 WO 2010007817A1
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- Prior art keywords
- anisotropic conductive
- conductive adhesive
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- parts
- epoxy
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J9/00—Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
- C09J9/02—Electrically-conducting adhesives
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/02—Non-macromolecular additives
- C09J11/04—Non-macromolecular additives inorganic
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
- H05K3/323—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives by applying an anisotropic conductive adhesive layer over an array of pads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
- H01L2924/07811—Extrinsic, i.e. with electrical conductive fillers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
Definitions
- the present invention relates to an anisotropic conductive adhesive.
- Patent Document 1 As a technique for mounting chip parts such as driver ICs and LED elements on a circuit board, there is a wide range of flip chip mounting methods using an anisotropic conductive film formed by dispersing conductive particles in an epoxy adhesive and forming a film.
- Patent Document 1 the electrical connection between the chip component and the circuit board is achieved by the conductive particles in the anisotropic conductive film, and at the same time, the fixing of the chip component to the circuit board is achieved by the epoxy adhesive. Therefore, the connection process is short and high production efficiency can be realized.
- chip parts are mounted on a circuit board with an anisotropic conductive film using an epoxy adhesive, and the resulting mounted product is subjected to a lead-free solder compatible reflow test, thermal shock test (TCT), and high temperature and high humidity test.
- TCT thermal shock test
- a reliability test such as a pressure cooker test (PCT) is performed, an internal stress is generated based on a difference in thermal expansion coefficient between the circuit board and the chip, and a conduction resistance value between the chip and the circuit board increases.
- PCT pressure cooker test
- a problem that the chip component is peeled off from the circuit board occurs. This problem is no exception in LED devices that have recently attracted attention as energy-saving lighting materials.
- An object of the present invention is to solve the above-described problems of the prior art, and lead-free solder for a mounted product obtained by mounting a chip component on a circuit board using an anisotropic conductive adhesive. Even when a reliability test involving heating of mounted products such as a compatible reflow test, thermal shock test (TCT), high temperature and high humidity test, pressure cooker test (PCT), etc., is performed between the circuit board and the chip component. It is another object of the present invention to maintain high conduction reliability and to maintain good adhesion between them and a cured anisotropic conductive adhesive.
- the present invention is an anisotropic conductive adhesive in which conductive particles are dispersed in an epoxy adhesive containing an epoxy compound and a curing agent, and the cured product has a temperature of 35 ° C, 55 ° C, 95 ° C and 150 ° C.
- EM 35 , EM 55 , EM 95 and EM 150 are the elastic moduli in each of the above, and the elastic modulus change rate between 55 ° C. and 95 ° C. is ⁇ EM 55-95 , the elastic modulus change between 95 ° C. and 150 ° C.
- An anisotropic conductive adhesive satisfying the following formulas (1) to (5) when the rate is ⁇ EM 95-150 .
- the elastic modulus change rates ⁇ EM 55-95 and ⁇ EM 95-150 are specifically defined by the following equations (6) and (7), respectively.
- the elastic modulus in the present invention is a numerical value measured according to JIS K7244-4. Specifically, it was measured using a dynamic viscoelasticity measuring device (for example, DDV-01FP-W, A & D) under the conditions of a tensile mode, a frequency of 11 Hz, and a heating rate of 5 ° C./min. .
- a dynamic viscoelasticity measuring device for example, DDV-01FP-W, A & D
- the present invention also provides a connection structure in which a chip component is flip-chip mounted on a circuit board using the above-described anisotropic conductive adhesive.
- the elastic modulus of the cured product satisfies the formulas (1) to (5). Therefore, lead-free solder compatible reflow test, thermal shock test (TCT), high temperature and high humidity test, pressure cooker for mounted products obtained by mounting chip parts on circuit board with anisotropic conductive adhesive of the present invention Even when a reliability test involving heating of a mounted product such as a test (PCT) is performed, high conduction reliability is maintained between the circuit board and the chip component, and the anisotropic conductivity cured with them is maintained. Adhesiveness with the adhesive can be maintained in a good state.
- FIG. 1 is a view showing an elastic modulus profile with respect to temperature of a cured product of the anisotropic conductive adhesive of the present invention.
- FIG. 2 is a diagram showing an elastic modulus profile with respect to the temperature of a cured product of a conventional anisotropic conductive adhesive.
- the anisotropic conductive adhesive of the present invention is one in which conductive particles are dispersed in an epoxy adhesive containing an epoxy compound and a curing agent.
- the cured product has a temperature of 35 ° C, 55 ° C, 95 ° C and 150 ° C.
- the elastic modulus in each is EM 35 , EM 55 , EM 95 and EM 150, and the elastic modulus change rate between 55 ° C. and 95 ° C. is ⁇ EM 55-95 , and the elastic modulus change rate between 95 ° C. and 150 ° C.
- ⁇ EM 95-150 satisfies the above formulas (1) to (5).
- FIG. 1 An example of an elastic modulus profile satisfying these equations (1) to (5) is shown in FIG. 1 (the vertical axis is the elastic modulus and the horizontal axis is the temperature).
- FIG. 2 An example of the elastic modulus profile of a conventional anisotropic conductive adhesive is shown in FIG. Since the conventional anisotropic conductive adhesive of FIG. 2 does not contain a predetermined polymer compound, the elastic modulus hardly changes even if the temperature is raised to some extent. However, if the temperature exceeds a certain temperature, the glass transition temperature is increased. In order to exceed, there exists a tendency for an elasticity modulus to fall large sharply.
- Formula (1) indicates that the elastic modulus at 35 ° C. of the cured anisotropic conductive adhesive is in the range of 700 MPa to 3000 MPa.
- the reason why the temperature of “35 ° C.” is adopted is that, generally, when the elastic modulus change of the cured epoxy resin is less than 35 ° C., the change is relatively small and can be ignored. Is meaningful.
- the elastic modulus EM 35 at 35 ° C. is less than 700 MPa, there is a problem in initial conduction reliability, and when it exceeds 3000 MPa, there is an increased tendency to cause a problem in conduction reliability after the moisture absorption reflow test.
- Equation (2) indicates that the elastic modulus of the cured anisotropic conductive adhesive decreases as the temperature increases to 35 ° C., 55 ° C., 95 ° C., and 150 ° C.
- the elastic modulus does not decrease as the temperature increases, the internal stress of the adhesive (cured product) increases due to the increase in temperature, and as a result, the tendency for problems such as a decrease in adhesive strength and a decrease in conduction reliability increases.
- the temperature of 150 ° C. has a meaning of being a temperature at which the anisotropic conductive adhesive is heated at the time of solder reflow, in addition to being equivalent to the temperature at the time of light emission of the LED device. The reason for measuring the elastic modulus between 35 ° C. and 150 ° C.
- Equation (3) shows that a large elastic modulus change rate .DELTA.Em 95-150 between 95 ° C. and 0.99 ° C. than the elastic modulus change rate .DELTA.Em 55-95 between 55 ° C. and 95 ° C.. If the two are equal, the internal stress relaxation becomes insufficient, and if this relationship is reversed, the tendency that the conduction reliability cannot be maintained increases.
- Equation (4) shows that the elastic modulus change rate ⁇ EM 55-95 between 55 ° C. and 95 ° C. is 20% or more. If it is less than 20%, the tendency that conduction reliability cannot be maintained increases.
- Equation (5) indicates that the elastic modulus change rate ⁇ EM 95-150 between 95 ° C. and 150 ° C. is 40% or more. If it is less than 40%, the tendency that the conduction reliability cannot be maintained increases.
- the preferable ranges of ⁇ EM 55-95 and ⁇ EM 95-150 are the following formulas (4 ′) and (5 ′).
- the anisotropic conductive adhesive of the present invention is obtained by dispersing conductive particles in an epoxy adhesive containing an epoxy compound and a curing agent.
- the epoxy compound include compounds or resins having two or more epoxy groups in the molecule. These may be liquid or solid. Specifically, bisphenol A, bisphenol F, bisphenol S, hexahydrobisphenol A, tetramethylbisphenol A, diaryl bisphenol A, hydroquinone, catechol, resorcin, cresol, tetrabromobisphenol A, trihydroxybiphenyl, benzophenone, bisresorcinol, Glycidyl ether obtained by reacting polychlorophenol and epichlorohydrin such as bisphenol hexafluoroacetone, tetramethylbisphenol A, tetramethylbisphenol F, tris (hydroxyphenyl) methane, bixylenol, phenol novolac, cresol novolac, etc .; glycerin, neo Pentyl glycol, ethylene glycol, propylene glycol, butylene glycol Polyglycidyl ether obtained by reacting
- alicyclic epoxy compounds that can ensure light transmission suitable for mounting LED elements on the cured product can be preferably used.
- hydrogenated glycidyl bisphenol A glycidyl hexahydrobisphenol A
- tris (2,3-epoxypropyl) isocyanate Nurate (TEPIC) is mentioned.
- the curing agent a known curing agent for epoxy compounds can be used, and it may be latent.
- an acid anhydride curing agent, an amine curing agent, an imidazole curing agent, and the like can be used.
- curing agent which can ensure the light transmittance suitable for mounting of the LED element of hardened
- the amount of the epoxy compound and curing agent used in the epoxy adhesive increases the amount of uncured epoxy compound if the curing agent is too little, and if it is too much, the excess material will cause corrosion of the adherend material. Since it tends to be accelerated, the curing agent is preferably used in an amount of 80 to 120 parts by mass, more preferably 95 to 105 parts by mass with respect to 100 parts by mass of the epoxy compound.
- the epoxy adhesive preferably contains a polymer compound for the purpose of relaxing internal stress in addition to the epoxy compound and the curing agent.
- a polymer compound since the internal stress relaxation effect is reduced if the weight average molecular weight is too small or too large, a compound having a molecular weight of preferably 5,000 to 200,000, more preferably 10,000 to 100,000 is used.
- the glass transition temperature is too high, the internal stress relaxation effect is reduced, so that the glass transition temperature is preferably 50 ° C. or lower, more preferably ⁇ 30 to 10 ° C.
- Such a polymer compound examples include acrylic resin, rubber (NBR, SBR, NR, SIS or hydrogenated product thereof), olefin resin, and the like. These polymer compounds preferably have a functional group such as a glycidyl group or an amino group.
- Preferable polymer compounds include acrylic resins from the viewpoint of showing good heat resistance characteristics.
- Specific examples of the acrylic resin include those obtained by copolymerizing 10 to 100 parts by mass, preferably 10 to 40 parts by mass of glycidyl methacrylate or diethylaminoethyl acrylate with respect to 100 parts by mass of ethyl acrylate.
- the amount of such a polymer compound used in an epoxy adhesive is too small, the internal stress relaxation effect is small, and if it is too large, there is a tendency that the conduction reliability cannot be maintained.
- the amount is preferably 10 to 50 parts by mass, more preferably 10 to 30 parts by mass with respect to 100 parts by mass in total with the compound.
- an imidazole compound can be further blended as a curing accelerator if necessary.
- Specific examples of the imidazole compound include 2-methyl-4-ethylimidazole. If the amount of the imidazole compound used is too small, the amount of uncured components increases, and if it is too large, the corrosion of the adherend material tends to be accelerated by the influence of the excess curing accelerator. On the other hand, it is preferably 0.01 to 10 parts by mass, more preferably 0.1 to 5 parts by mass.
- conductive particles constituting the epoxy adhesive conductive particles conventionally used in anisotropic conductive adhesives can be used.
- metal particles such as gold, nickel and solder, plated metal-coated particles of resin particles, particles coated with an insulating thin film, and the like can be used as appropriate.
- the particle diameter of the conductive particles is usually 3 to 10 ⁇ m, similar to the conventional conductive particles.
- Such conductive particles are preferably 1 to 100 parts by mass, more preferably 10 to 50 parts by mass with respect to 100 parts by mass of the epoxy-based adhesive in order to ensure good anisotropic conductivity and conduction reliability. Part.
- anisotropic conductive adhesive of the present invention various additives that are also used in conventional anisotropic conductive adhesives can be blended as necessary.
- a silane coupling agent, a filler, an ultraviolet absorber, an antioxidant and the like can be blended.
- the anisotropic conductive adhesive of the present invention can be produced by uniformly dispersing conductive particles in an epoxy adhesive according to a conventional method. In that case, it can process into forms, such as a paste form, a film form, and a highly viscous liquid form, according to a conventional method.
- the anisotropic conductive adhesive is thermosetting and can be cured by heating to 150 to 250 ° C.
- the anisotropic conductive adhesive of the present invention can be preferably used when connecting chip components and various modules to a circuit board.
- a connection structure in which chip parts such as IC chips and LED elements are flip-chip mounted on a circuit board using the anisotropic conductive adhesive of the present invention is a reflow test corresponding to lead-free solder, a thermal shock test (TCT).
- TCT thermal shock test
- Examples 1 to 4 and Comparative Examples 1 to 5 An anisotropic conductive adhesive was prepared by uniformly mixing the components shown in Table 1 with a planetary stirrer.
- a paste-like anisotropic conductive adhesive is applied to a glass epoxy circuit board having a Cu wiring portion subjected to Au flash plating to a thickness of 25 ⁇ m (dry thickness), and a 1.5 mm square IC chip is formed thereon. And a thermocompression bonding by heating to 180 ° C. for 30 seconds with a flip chip bonder to obtain a connection structure.
- the IC chip of the connection structure after being left at 150 ° C. for 100 hours was bonded using a die shear tester (Bond Tester PTR 1100, Resca) with an adhesive strength (N / (Chip) was measured.
- the obtained results are shown in Table 1. When the conditions for this adhesion test are assumed, it is practically desirable that the adhesion is 50 N / chip or more.
- the anisotropic conductive adhesive was applied on the release-treated PET so as to have a dry thickness of 80 ⁇ m, and cured by being put in a furnace at 150 ° C.
- the cured product was peeled off from the peel-treated PET, and was cut into strips having a length of 3.5 cm and a width of 0.4 cm to prepare a sample.
- the elastic modulus (EM 35 , EM 55 , EM 95 , EM 150 ) at 35 ° C., 55 ° C., 95 ° C. and 150 ° C. of the sample was measured using a dynamic viscoelasticity measuring device (DDV-01FP-W, A & D) Mode, frequency 11 Hz, temperature rising rate 5 ° C./min). From the obtained results, the elastic modulus change rates ( ⁇ EM 55-95 , ⁇ EM 95-150 ) were calculated according to the equations (6) and (7). The obtained results are shown in Table 1.
- a paste-like anisotropic conductive adhesive is applied to a glass epoxy circuit board having a Cu wiring portion subjected to Au flash plating so as to have a thickness of 25 ⁇ m (dry thickness), and a 6.3 mm square IC chip is formed thereon. And thermocompression-bonded by heating to 180 ° C. for 30 seconds with a flip chip bonder. The conduction resistance of the connection structure immediately after being obtained was measured by a four-terminal method.
- the anisotropic conductive adhesives of Examples 1 to 5 whose elastic modulus satisfies the following mathematical formulas (1) to (5) have an initial adhesive strength of 150 ° C. for 100 hours after reflow. Good results were shown in each after the course. The conduction reliability also showed good results at the beginning, after level 4 moisture absorption reflow, after level 2 moisture absorption reflow, and after 500 cycles of thermal shock.
- the EM 35 is less than 700 MPa and does not satisfy the formula (1). Therefore, the adhesive strength was not obtained after leaving at 150 ° C. for 100 hours, but the conduction reliability was The expected characteristics were not obtained immediately after the connection structure was created.
- the elastic modulus change rate ⁇ EM 55-95 is less than 20%
- ⁇ EM 95-150 is also less than 40%, and does not satisfy the expressions (4) and (5).
- the desired characteristics were not obtained.
- the conduction reliability the expected conduction reliability could not be achieved after the moisture absorption reflow test under more severe conditions.
- the elastic modulus of the cured product satisfies the formulas (1) to (5). Therefore, lead-free solder compatible reflow test, thermal shock test (TCT), high temperature and high humidity test, pressure cooker for mounted products obtained by mounting chip parts on circuit board with anisotropic conductive adhesive of the present invention Even when a reliability test involving heating of a mounted product such as a test (PCT) is performed, high conduction reliability is maintained between the circuit board and the chip component, and the anisotropic conductivity cured with them is maintained. Adhesiveness with the adhesive can be maintained in a good state. Therefore, the anisotropic conductive adhesive of the present invention is useful for connection between a circuit board and various electronic components such as chip parts, modules, and flexible circuit boards.
Abstract
Description
攪拌機、冷却管を備えた四つ口フラスコに、エチレアクリレート(EA)100g、グリシジルメタクリレート(GMA)10g、アゾビスブチロニトリル0.2g、酢酸エチル300g、及びアセトン5gを仕込み、撹拌しながら70℃で8時間重合反応させた。沈殿した粒子を濾取し、エタノールで洗浄し乾燥することによりアクリル樹脂Aを得た。得られたアクリル樹脂Aの重量平均分子量は80000であり、ガラス転移温度は-40℃であった。
攪拌機、冷却管を備えた四つ口フラスコに、エチレアクリレート(EA)100g、ジメチルアミノエチルアクリレート(DMAEA)10g、アゾビスブチロニトリル0.2g、酢酸エチル300g、及びアセトン5gを仕込み、撹拌しながら70℃で8時間重合反応させた。沈殿した粒子を濾取し、エタノールで洗浄し乾燥することによりアクリル樹脂Bを得た。得られたアクリル樹脂Bの重量平均分子量は80000であり、ガラス転移温度は18℃であった。
表1に示す配合の成分を遊星型撹拌器で均一に混合することにより異方性導電接着剤を調製した。
実施例1~4及び比較例1~5で得られたペースト状の異方性導電接着剤について、以下に説明するように、接着力、弾性率、導通信頼性を測定した。
Cu配線部分にAuフラッシュメッキが施されたガラスエポキシ回路基板に、ペースト状の異方性導電接着剤を25μm厚(乾燥厚)となるように塗布し、その上に1.5mm角のICチップを載置し、フリップチップボンダーで180℃に30秒間加熱することにより熱圧着して接続構造体を得た。得られた直後(初期)、リフロー後(260℃)、150℃で100時間放置後の接続構造体のICチップについて、ダイシェアーテスター(ボンドテスターPTR1100、レスカ社)を用いて接着強度(N/Chip)を測定した。得られた結果を表1に示す。本接着力試験の条件を前提にした場合には、実用上、接着力は50N/chip以上であることが望ましい。
異方性導電接着剤を、剥離処理PET上に乾燥厚が80μmとなるように塗布し、150℃の炉中に投入することで硬化させた。剥離処理PETから硬化物を剥離し、長さ3.5cm、幅0.4cmの短冊状にカットし試料とした。その試料の35℃、55℃、95℃、150℃における弾性率(EM35,EM55、EM95、EM150)を動的粘弾性測定器(DDV-01FP-W、エーアンドデー社:引っ張りモード、周波数11Hz、昇温速度5℃/分)を用いて測定した。また、得られた結果から、式(6)、(7)に従って弾性率変化率(ΔEM55-95、ΔEM95-150)を算出した。得られた結果を表1に示す。
Cu配線部分にAuフラッシュメッキが施されたガラスエポキシ回路基板に、ペースト状の異方性導電接着剤を25μm厚(乾燥厚)となるように塗布し、その上に6.3mm角のICチップを載置し、フリップチップボンダーで180℃に30秒間加熱することにより熱圧着した。得られた直後の接続構造体の導通抵抗を、4端子法により測定した。その後、その接続構造体に対し、レベル4の吸湿リフロー試験(吸湿条件:30℃、60%RHの環境下に96時間放置、リフロー条件 リフローピーク温度260℃)又はレベル2の吸湿リフロー試験(吸湿条件:85℃、60%RHの環境下に168時間放置、リフロー条件:リフローピーク温度260℃)を行い、導通抵抗を測定した。この測定後、接続構造体に対し熱衝撃試験(TCT:-55℃、0.5時間←→125℃、0.5時間、500サイクル)を行い、再び導通抵抗を測定した。導通抵抗値が1Ω未満のときは良好(G)と評価し、1Ω以上の場合を不良(NG)と評価した。得られた結果を表1に示す。
Claims (12)
- エポキシ系接着剤が、エポキシ化合物100質量部に対し、硬化剤80~120質量部を含有する請求項1又は2に記載の異方性導電接着剤。
- エポキシ系接着剤が、エポキシ化合物以外に、重量平均分子量5000~200000且つガラス転移温度50℃以下の高分子化合物を含有する請求項1~3のいずれかに記載の異方性導電接着剤。
- 該高分子化合物が、エチルアクリレート100質量部に対し、グリシジルメタクリレート又はジエチルアミノエチルアクリレート10~100質量部を共重合させたアクリル樹脂である請求項4記載の異方性導電接着剤。
- エポキシ系接着剤における高分子化合物の使用量が、エポキシ化合物と硬化剤と高分子化合物との合計100質量部に対し、10~50質量部である請求項4又は5記載の異方性導電接着剤。
- エポキシ化合物が脂環式エポキシ化合物であり、硬化剤が脂環式酸無水物系硬化剤である請求項1~6のいずれかに記載の異方性導電接着剤。
- 脂環式エポキシ化合物が、グリシジルビスフェノールAの水添化物又は3,4-エポキシシクロヘキセニルメチル-3′,4′-エポキシシクロヘキセンカルボキシレートであり、脂環式酸無水物系硬化剤が、メチルヘキサヒドロフタル酸無水物である請求項7記載の異方性導電接着剤。
- 更に硬化促進剤として2-メチル-4-エチルイミダゾールを、硬化剤100質量部に対し、0.01~10質量部含有する請求項1~8のいずれかに記載の異方性導電接着剤。
- エポキシ系接着剤100質量部に対し、導電粒子1~100質量部含有する請求項1~9のいずれかに記載の異方性導電接着剤。
- 回路基板にチップ部品を請求項1~10のいずれかに記載の異方性導電接着剤を用いてフリップチップ実装された接続構造体。
- チップ部品が、LED素子である請求項11記載の接続構造体。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/000,866 US8636924B2 (en) | 2008-07-16 | 2009-04-03 | Anisotropic conductive adhesive |
EP09797745.8A EP2302013B1 (en) | 2008-07-16 | 2009-04-03 | Anisotropic conductive adhesive |
CN2009801279194A CN102089398B (zh) | 2008-07-16 | 2009-04-03 | 各向异性导电粘合剂 |
KR1020117000877A KR101273863B1 (ko) | 2008-07-16 | 2009-04-03 | 이방성 도전 접착제 |
HK11108958.0A HK1155194A1 (en) | 2008-07-16 | 2011-08-24 | Anisotropic conductive adhesive |
US14/104,320 US9418958B2 (en) | 2008-07-16 | 2013-12-12 | Anisotropic conductive adhesive |
Applications Claiming Priority (2)
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JP2008185322A JP5499448B2 (ja) | 2008-07-16 | 2008-07-16 | 異方性導電接着剤 |
JP2008-185322 | 2008-07-16 |
Related Child Applications (2)
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---|---|---|---|
US13/000,866 A-371-Of-International US8636924B2 (en) | 2008-07-16 | 2009-04-03 | Anisotropic conductive adhesive |
US14/104,320 Continuation US9418958B2 (en) | 2008-07-16 | 2013-12-12 | Anisotropic conductive adhesive |
Publications (1)
Publication Number | Publication Date |
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WO2010007817A1 true WO2010007817A1 (ja) | 2010-01-21 |
Family
ID=41550226
Family Applications (1)
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PCT/JP2009/056936 WO2010007817A1 (ja) | 2008-07-16 | 2009-04-03 | 異方性導電接着剤 |
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US (2) | US8636924B2 (ja) |
EP (1) | EP2302013B1 (ja) |
JP (1) | JP5499448B2 (ja) |
KR (1) | KR101273863B1 (ja) |
CN (2) | CN103468187B (ja) |
HK (1) | HK1155194A1 (ja) |
TW (1) | TWI484016B (ja) |
WO (1) | WO2010007817A1 (ja) |
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WO2011086680A1 (ja) * | 2010-01-15 | 2011-07-21 | ソニーケミカル&インフォメーションデバイス株式会社 | 異方性導電接着剤 |
CN102858836A (zh) * | 2010-04-13 | 2013-01-02 | 索尼化学&信息部件株式会社 | 固化性树脂组合物、粘接性环氧树脂糊料、芯片接合剂、非导电性糊料、粘接性环氧树脂膜、非导电性环氧树脂膜、各向异性导电糊料及各向异性导电膜 |
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JP6292808B2 (ja) | 2013-09-13 | 2018-03-14 | デクセリアルズ株式会社 | 接着剤、及び発光装置 |
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JP6419457B2 (ja) * | 2014-05-23 | 2018-11-07 | デクセリアルズ株式会社 | 接着剤及び接続構造体 |
JP6430148B2 (ja) * | 2014-05-23 | 2018-11-28 | デクセリアルズ株式会社 | 接着剤及び接続構造体 |
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WO2016190424A1 (ja) * | 2015-05-27 | 2016-12-01 | デクセリアルズ株式会社 | 異方導電性フィルム及び接続構造体 |
JP6750197B2 (ja) * | 2015-07-13 | 2020-09-02 | デクセリアルズ株式会社 | 異方性導電フィルム及び接続構造体 |
JP2021103609A (ja) | 2019-12-24 | 2021-07-15 | デクセリアルズ株式会社 | 異方性導電フィルム |
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Also Published As
Publication number | Publication date |
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KR101273863B1 (ko) | 2013-06-11 |
CN102089398B (zh) | 2013-08-21 |
HK1155194A1 (en) | 2012-05-11 |
TW201005069A (en) | 2010-02-01 |
CN103468187B (zh) | 2016-01-20 |
US9418958B2 (en) | 2016-08-16 |
CN102089398A (zh) | 2011-06-08 |
US20110108878A1 (en) | 2011-05-12 |
CN103468187A (zh) | 2013-12-25 |
EP2302013A1 (en) | 2011-03-30 |
JP5499448B2 (ja) | 2014-05-21 |
EP2302013A4 (en) | 2013-07-17 |
EP2302013B1 (en) | 2016-03-30 |
JP2010024301A (ja) | 2010-02-04 |
TWI484016B (zh) | 2015-05-11 |
US20140097463A1 (en) | 2014-04-10 |
KR20110026478A (ko) | 2011-03-15 |
US8636924B2 (en) | 2014-01-28 |
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