WO2009034620A1 - コネクタ、導電部材、その製造方法、パフォーマンスボードおよび試験装置 - Google Patents

コネクタ、導電部材、その製造方法、パフォーマンスボードおよび試験装置 Download PDF

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Publication number
WO2009034620A1
WO2009034620A1 PCT/JP2007/067678 JP2007067678W WO2009034620A1 WO 2009034620 A1 WO2009034620 A1 WO 2009034620A1 JP 2007067678 W JP2007067678 W JP 2007067678W WO 2009034620 A1 WO2009034620 A1 WO 2009034620A1
Authority
WO
WIPO (PCT)
Prior art keywords
connector
manufacturing
conductive member
testing device
coaxial plug
Prior art date
Application number
PCT/JP2007/067678
Other languages
English (en)
French (fr)
Inventor
Hirotaka Wagata
Takayuki Nakamura
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to CN2007801005829A priority Critical patent/CN101803127B/zh
Priority to PCT/JP2007/067678 priority patent/WO2009034620A1/ja
Priority to JP2009532002A priority patent/JP5225997B2/ja
Priority to KR1020107005811A priority patent/KR101193407B1/ko
Priority to TW097134599A priority patent/TWI375376B/zh
Publication of WO2009034620A1 publication Critical patent/WO2009034620A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2464—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
    • H01R13/2492—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point multiple contact points
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/648—Protective earth or shield arrangements on coupling devices, e.g. anti-static shielding  
    • H01R13/658—High frequency shielding arrangements, e.g. against EMI [Electro-Magnetic Interference] or EMP [Electro-Magnetic Pulse]
    • H01R13/6581—Shield structure
    • H01R13/6585—Shielding material individually surrounding or interposed between mutually spaced contacts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/648—Protective earth or shield arrangements on coupling devices, e.g. anti-static shielding  
    • H01R13/658—High frequency shielding arrangements, e.g. against EMI [Electro-Magnetic Interference] or EMP [Electro-Magnetic Pulse]
    • H01R13/6591—Specific features or arrangements of connection of shield to conductive members
    • H01R13/6592—Specific features or arrangements of connection of shield to conductive members the conductive member being a shielded cable
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2103/00—Two poles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency

Abstract

　ボード本体３１０に取り付けられ、同軸プラグ４４０が接続されるレセプタクルコネクタ３２２であって、ハウジング６１０と複数の導電部材５００とを備え、導電部材５００の各々は、同軸プラグ４４０の信号線に接触する内部導体５１０、および、内部導体５１０を囲んだ外部導体５２０を有し、外部導体５２０は、同軸プラグ４４０が接続された場合に内部導体４４４の端面を挿脱方向および周方向の一部について覆う遮蔽部５２１を有し、内部導体５１０は、外部導体５２０の中心よりも遮蔽部５２１側に偏った位置において同軸プラグ４４０の挿脱方向に延伸する。
PCT/JP2007/067678 2007-09-11 2007-09-11 コネクタ、導電部材、その製造方法、パフォーマンスボードおよび試験装置 WO2009034620A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN2007801005829A CN101803127B (zh) 2007-09-11 2007-09-11 连接器、导电部件、其制造方法、功能板,以及测试装置
PCT/JP2007/067678 WO2009034620A1 (ja) 2007-09-11 2007-09-11 コネクタ、導電部材、その製造方法、パフォーマンスボードおよび試験装置
JP2009532002A JP5225997B2 (ja) 2007-09-11 2007-09-11 コネクタ、導電部材、パフォーマンスボードおよび試験装置
KR1020107005811A KR101193407B1 (ko) 2007-09-11 2007-09-11 연결기, 도전 부재, 연결기의 제조 방법, 퍼포먼스 보드 및 시험 장치
TW097134599A TWI375376B (en) 2007-09-11 2008-09-09 Connector,conductive component,manufacturing method of the same,performance board and test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/067678 WO2009034620A1 (ja) 2007-09-11 2007-09-11 コネクタ、導電部材、その製造方法、パフォーマンスボードおよび試験装置

Publications (1)

Publication Number Publication Date
WO2009034620A1 true WO2009034620A1 (ja) 2009-03-19

Family

ID=40451645

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/067678 WO2009034620A1 (ja) 2007-09-11 2007-09-11 コネクタ、導電部材、その製造方法、パフォーマンスボードおよび試験装置

Country Status (5)

Country Link
JP (1) JP5225997B2 (ja)
KR (1) KR101193407B1 (ja)
CN (1) CN101803127B (ja)
TW (1) TWI375376B (ja)
WO (1) WO2009034620A1 (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011014327A (ja) * 2009-06-30 2011-01-20 Advantest Corp コネクタ、及びコネクタを備える半導体試験装置
JP2011014326A (ja) * 2009-06-30 2011-01-20 Advantest Corp コネクタ及びコネクタを備える半導体試験装置
JP2011243414A (ja) * 2010-05-18 2011-12-01 Advantest Corp コネクタ及びそれを有する半導体試験装置
KR101397805B1 (ko) 2011-07-25 2014-05-21 가부시키가이샤 어드밴티스트 커넥터 및 반도체 테스트 디바이스
JP2015210888A (ja) * 2014-04-24 2015-11-24 富士通コンポーネント株式会社 コネクタ、及び、コンタクト
CN113884793A (zh) * 2021-09-27 2022-01-04 中国汽车工程研究院股份有限公司 一种通用电缆屏蔽性能测试系统及其测试方法
JP7453851B2 (ja) 2020-05-26 2024-03-21 株式会社アドバンテスト 同軸端子、同軸コネクタ、配線板、及び、電子部品試験装置
JP7453852B2 (ja) 2020-05-26 2024-03-21 株式会社アドバンテスト 同軸コネクタを備えた配線板及び電子部品試験装置、並びに、同軸コネクタ

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101762836B1 (ko) * 2015-09-10 2017-07-28 리노공업주식회사 프로브 소켓
CN111964610B (zh) * 2020-08-07 2021-12-07 浙江理工大学 电连接器头座五自由度自动对中方法
JP2023124567A (ja) * 2022-02-25 2023-09-06 キオクシア株式会社 テストボード及び半導体デバイスの製造方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11237439A (ja) * 1998-02-20 1999-08-31 Advantest Corp テストフィクスチャ
JP3070437U (ja) * 2000-01-21 2000-08-04 株式会社アドバンテスト 半導体試験装置
JP2003249322A (ja) * 2002-02-22 2003-09-05 Advantest Corp コネクタ及び半導体部品取付装置
JP2004055203A (ja) * 2002-07-17 2004-02-19 Auto Network Gijutsu Kenkyusho:Kk ダイバーシティ受信機用基板コネクタ
JP2004355932A (ja) * 2003-05-28 2004-12-16 Advantest Corp コネクタ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4442162B2 (ja) * 2003-08-27 2010-03-31 Ｔｄｋ株式会社 ホログラフィック記録再生システム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11237439A (ja) * 1998-02-20 1999-08-31 Advantest Corp テストフィクスチャ
JP3070437U (ja) * 2000-01-21 2000-08-04 株式会社アドバンテスト 半導体試験装置
JP2003249322A (ja) * 2002-02-22 2003-09-05 Advantest Corp コネクタ及び半導体部品取付装置
JP2004055203A (ja) * 2002-07-17 2004-02-19 Auto Network Gijutsu Kenkyusho:Kk ダイバーシティ受信機用基板コネクタ
JP2004355932A (ja) * 2003-05-28 2004-12-16 Advantest Corp コネクタ

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011014327A (ja) * 2009-06-30 2011-01-20 Advantest Corp コネクタ、及びコネクタを備える半導体試験装置
JP2011014326A (ja) * 2009-06-30 2011-01-20 Advantest Corp コネクタ及びコネクタを備える半導体試験装置
JP2011243414A (ja) * 2010-05-18 2011-12-01 Advantest Corp コネクタ及びそれを有する半導体試験装置
KR101397805B1 (ko) 2011-07-25 2014-05-21 가부시키가이샤 어드밴티스트 커넥터 및 반도체 테스트 디바이스
JP2015210888A (ja) * 2014-04-24 2015-11-24 富士通コンポーネント株式会社 コネクタ、及び、コンタクト
JP7453851B2 (ja) 2020-05-26 2024-03-21 株式会社アドバンテスト 同軸端子、同軸コネクタ、配線板、及び、電子部品試験装置
JP7453852B2 (ja) 2020-05-26 2024-03-21 株式会社アドバンテスト 同軸コネクタを備えた配線板及び電子部品試験装置、並びに、同軸コネクタ
CN113884793A (zh) * 2021-09-27 2022-01-04 中国汽车工程研究院股份有限公司 一种通用电缆屏蔽性能测试系统及其测试方法

Also Published As

Publication number Publication date
KR20100051860A (ko) 2010-05-18
TWI375376B (en) 2012-10-21
JP5225997B2 (ja) 2013-07-03
JPWO2009034620A1 (ja) 2010-12-16
KR101193407B1 (ko) 2012-10-24
TW200919878A (en) 2009-05-01
CN101803127A (zh) 2010-08-11
CN101803127B (zh) 2012-12-12

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