WO2009031574A1 - フラットパネルディテクタ - Google Patents
フラットパネルディテクタ Download PDFInfo
- Publication number
- WO2009031574A1 WO2009031574A1 PCT/JP2008/065856 JP2008065856W WO2009031574A1 WO 2009031574 A1 WO2009031574 A1 WO 2009031574A1 JP 2008065856 W JP2008065856 W JP 2008065856W WO 2009031574 A1 WO2009031574 A1 WO 2009031574A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- scintillator
- flat panel
- panel detector
- layer
- phosphor
- Prior art date
Links
- 239000010410 layer Substances 0.000 abstract 5
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 abstract 4
- 230000006866 deterioration Effects 0.000 abstract 2
- 239000012790 adhesive layer Substances 0.000 abstract 1
- 230000035939 shock Effects 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
- H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14632—Wafer-level processed structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Toxicology (AREA)
- Measurement Of Radiation (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009531257A JP4819163B2 (ja) | 2007-09-06 | 2008-09-03 | フラットパネルディテクタ |
US12/675,154 US8525132B2 (en) | 2007-09-06 | 2008-09-03 | Flat panel detector |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007231259 | 2007-09-06 | ||
JP2007-231259 | 2007-09-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009031574A1 true WO2009031574A1 (ja) | 2009-03-12 |
Family
ID=40428888
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/065856 WO2009031574A1 (ja) | 2007-09-06 | 2008-09-03 | フラットパネルディテクタ |
Country Status (3)
Country | Link |
---|---|
US (1) | US8525132B2 (ja) |
JP (4) | JP4819163B2 (ja) |
WO (1) | WO2009031574A1 (ja) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011059058A (ja) * | 2009-09-14 | 2011-03-24 | Fujifilm Corp | 放射線画像撮影装置 |
JP2011069992A (ja) * | 2009-09-25 | 2011-04-07 | Fujifilm Corp | 放射線画像撮影装置 |
WO2011136195A1 (ja) * | 2010-04-30 | 2011-11-03 | 富士フイルム株式会社 | 放射線画像撮影装置、放射線画像撮影システム、及び、放射線画像撮影装置における放射線変換パネルの固定方法 |
JP2011232315A (ja) * | 2010-04-30 | 2011-11-17 | Fujifilm Corp | 放射線画像撮影装置及び放射線画像撮影システム |
WO2011161897A1 (en) * | 2010-06-23 | 2011-12-29 | Canon Kabushiki Kaisha | Radiation image pickup apparatus, radiation image pickup system, and method for manufacturing radiation image pickup apparatus |
JP2012108048A (ja) * | 2010-11-18 | 2012-06-07 | Fujifilm Corp | 放射線検出器および放射線画像撮影装置 |
JP2012133315A (ja) * | 2010-11-29 | 2012-07-12 | Fujifilm Corp | 放射線撮影装置 |
JP2012159395A (ja) * | 2011-01-31 | 2012-08-23 | Fujifilm Corp | 放射線画像検出装置 |
JP2012173275A (ja) * | 2011-02-24 | 2012-09-10 | Fujifilm Corp | 放射線画像検出装置及び放射線撮影用カセッテ |
JP2016070890A (ja) * | 2014-10-01 | 2016-05-09 | キヤノン株式会社 | 放射線撮影装置および放射線撮影システム |
WO2021256011A1 (ja) * | 2020-06-16 | 2021-12-23 | 浜松ホトニクス株式会社 | シンチレータパネル及び放射線検出器 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4819163B2 (ja) * | 2007-09-06 | 2011-11-24 | コニカミノルタエムジー株式会社 | フラットパネルディテクタ |
JP5597039B2 (ja) * | 2010-06-23 | 2014-10-01 | キヤノン株式会社 | 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法 |
JP5649872B2 (ja) * | 2010-08-24 | 2015-01-07 | 浜松ホトニクス株式会社 | 放射線検出器の製造方法 |
US9069083B2 (en) * | 2011-05-19 | 2015-06-30 | Danimar Ltd. | Portable radiation detector |
JP2013050364A (ja) * | 2011-08-30 | 2013-03-14 | Fujifilm Corp | 放射線画像検出装置 |
US20130236677A1 (en) * | 2012-03-06 | 2013-09-12 | Ge Medical Systems Global Technology Company, Llc | Detector and method of panel bonding using removable adhesive film |
JP5462305B2 (ja) | 2012-03-12 | 2014-04-02 | 株式会社東芝 | 画像処理装置、画像処理方法およびそのプログラム |
US8784597B2 (en) * | 2012-04-13 | 2014-07-22 | Pal Wonn (Taiwan) Co., Ltd. | Method for reinforcing a glass of touch panel and reinforcement structure thereof |
CN102956661B (zh) * | 2012-11-21 | 2016-01-20 | 烟台睿创微纳技术有限公司 | 一种芯片封装方法及其封装结构 |
US9702986B2 (en) | 2013-05-24 | 2017-07-11 | Teledyne Dalsa B.V. | Moisture protection structure for a device and a fabrication method thereof |
JP6314984B2 (ja) * | 2013-07-04 | 2018-04-25 | コニカミノルタ株式会社 | シンチレータパネル及びその製造方法 |
JP2015057589A (ja) * | 2013-08-16 | 2015-03-26 | 富士フイルム株式会社 | 放射線画像検出装置の製造方法 |
DE102013221883A1 (de) * | 2013-10-28 | 2015-04-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Messvorrichtung und Fluidikvorrichtung zum Messen einer Menge einer zu untersuchenden Substanz |
EP3234646B1 (en) | 2016-01-29 | 2021-04-14 | Shanghai United Imaging Healthcare Ltd. | Heat exchanger for temperature control in a pet detector |
TWI613804B (zh) | 2017-09-04 | 2018-02-01 | 友達光電股份有限公司 | 光感測裝置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005181121A (ja) * | 2003-12-19 | 2005-07-07 | Canon Inc | X線エリアセンサー |
JP2006184187A (ja) * | 2004-12-28 | 2006-07-13 | Canon Inc | 放射線検出装置、シンチレータパネル、および放射線検出システム |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2382736A (en) * | 1944-02-07 | 1945-08-14 | Mason Collins | Label |
JP3334581B2 (ja) | 1997-11-27 | 2002-10-15 | 松下電器産業株式会社 | X線画像検出器 |
JP3649907B2 (ja) * | 1998-01-20 | 2005-05-18 | シャープ株式会社 | 二次元画像検出器およびその製造方法 |
WO1999066345A1 (fr) | 1998-06-18 | 1999-12-23 | Hamamatsu Photonics K.K. | Panneau de scintillateur et capteur d'image de rayonnement |
JP3789646B2 (ja) | 1998-06-19 | 2006-06-28 | 浜松ホトニクス株式会社 | 放射線イメージセンサ |
JP2002006050A (ja) * | 2000-06-26 | 2002-01-09 | Canon Inc | 二次元撮像装置の実装構造 |
JP2002055165A (ja) * | 2000-08-09 | 2002-02-20 | Canon Inc | 放射線検出装置及びそれを備えた放射線撮像システム |
WO2002023220A1 (fr) * | 2000-09-11 | 2002-03-21 | Hamamatsu Photonics K.K. | Panneau de scintillateur, capteur d'images radiographiques et procedes de production |
JP2002341039A (ja) * | 2001-05-15 | 2002-11-27 | Canon Inc | 放射線検出装置、その製造方法及び放射線検出システム |
JP4307127B2 (ja) * | 2003-04-02 | 2009-08-05 | キヤノン株式会社 | 放射線撮影装置 |
US7355184B2 (en) * | 2003-04-07 | 2008-04-08 | Canon Kabushiki Kaisha | Radiation detecting apparatus and method for manufacturing the same |
JP2005062015A (ja) * | 2003-08-13 | 2005-03-10 | Fuji Photo Film Co Ltd | 放射線像変換パネルおよびその製造方法 |
EP1678525A1 (en) * | 2003-10-22 | 2006-07-12 | Canon Kabushiki Kaisha | Radiation detection device, scintillator panel, method of making the same, making apparatus, and radiation image pick-up system |
JP2005172511A (ja) * | 2003-12-09 | 2005-06-30 | Canon Inc | 放射線検出装置、その製造方法、および放射線撮像システム |
JP2006189377A (ja) | 2005-01-07 | 2006-07-20 | Canon Inc | シンチレータパネル、放射線検出装置、及び放射線検出システム |
JP2006220439A (ja) | 2005-02-08 | 2006-08-24 | Canon Inc | シンチレータパネル、放射線検出装置及びその製造方法 |
JP2006337184A (ja) | 2005-06-02 | 2006-12-14 | Canon Inc | 放射線検出装置 |
JP4819163B2 (ja) | 2007-09-06 | 2011-11-24 | コニカミノルタエムジー株式会社 | フラットパネルディテクタ |
JP2011186902A (ja) | 2010-03-10 | 2011-09-22 | Nec Corp | バックアップシステム及びバックアップ方法 |
-
2008
- 2008-09-03 JP JP2009531257A patent/JP4819163B2/ja not_active Expired - Fee Related
- 2008-09-03 WO PCT/JP2008/065856 patent/WO2009031574A1/ja active Application Filing
- 2008-09-03 US US12/675,154 patent/US8525132B2/en active Active
-
2011
- 2011-08-30 JP JP2011186902A patent/JP5035464B2/ja not_active Expired - Fee Related
-
2012
- 2012-04-06 JP JP2012087290A patent/JP2012154940A/ja active Pending
- 2012-10-29 JP JP2012237669A patent/JP5565444B2/ja not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005181121A (ja) * | 2003-12-19 | 2005-07-07 | Canon Inc | X線エリアセンサー |
JP2006184187A (ja) * | 2004-12-28 | 2006-07-13 | Canon Inc | 放射線検出装置、シンチレータパネル、および放射線検出システム |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011059058A (ja) * | 2009-09-14 | 2011-03-24 | Fujifilm Corp | 放射線画像撮影装置 |
JP2011069992A (ja) * | 2009-09-25 | 2011-04-07 | Fujifilm Corp | 放射線画像撮影装置 |
US8796623B2 (en) | 2010-04-30 | 2014-08-05 | Fujifilm Corporation | Radiation imaging device, radiation imaging system, and method for affixing radiation conversion panel in radiation imaging device |
WO2011136195A1 (ja) * | 2010-04-30 | 2011-11-03 | 富士フイルム株式会社 | 放射線画像撮影装置、放射線画像撮影システム、及び、放射線画像撮影装置における放射線変換パネルの固定方法 |
JP2011232315A (ja) * | 2010-04-30 | 2011-11-17 | Fujifilm Corp | 放射線画像撮影装置及び放射線画像撮影システム |
CN102870008A (zh) * | 2010-04-30 | 2013-01-09 | 富士胶片株式会社 | 辐射成像装置、辐射成像系统和用于将辐射转换板固定在辐射成像装置中的方法 |
WO2011161897A1 (en) * | 2010-06-23 | 2011-12-29 | Canon Kabushiki Kaisha | Radiation image pickup apparatus, radiation image pickup system, and method for manufacturing radiation image pickup apparatus |
JP2012007948A (ja) * | 2010-06-23 | 2012-01-12 | Canon Inc | 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法 |
US9059343B2 (en) | 2010-06-23 | 2015-06-16 | Canon Kabushiki Kaisha | Radiation image pickup apparatus, radiation image pickup system, and method for manufacturing radiation image pickup apparatus |
JP2012108048A (ja) * | 2010-11-18 | 2012-06-07 | Fujifilm Corp | 放射線検出器および放射線画像撮影装置 |
JP2012133315A (ja) * | 2010-11-29 | 2012-07-12 | Fujifilm Corp | 放射線撮影装置 |
JP2012159395A (ja) * | 2011-01-31 | 2012-08-23 | Fujifilm Corp | 放射線画像検出装置 |
US8861680B2 (en) | 2011-02-24 | 2014-10-14 | Fujifilm Corporation | Radiological image detection apparatus and radiographic imaging cassette |
JP2012173275A (ja) * | 2011-02-24 | 2012-09-10 | Fujifilm Corp | 放射線画像検出装置及び放射線撮影用カセッテ |
JP2016070890A (ja) * | 2014-10-01 | 2016-05-09 | キヤノン株式会社 | 放射線撮影装置および放射線撮影システム |
WO2021256011A1 (ja) * | 2020-06-16 | 2021-12-23 | 浜松ホトニクス株式会社 | シンチレータパネル及び放射線検出器 |
Also Published As
Publication number | Publication date |
---|---|
US8525132B2 (en) | 2013-09-03 |
JP2012154940A (ja) | 2012-08-16 |
JP5035464B2 (ja) | 2012-09-26 |
JP2012008141A (ja) | 2012-01-12 |
JP4819163B2 (ja) | 2011-11-24 |
JP5565444B2 (ja) | 2014-08-06 |
JP2013019912A (ja) | 2013-01-31 |
JPWO2009031574A1 (ja) | 2010-12-16 |
US20100243908A1 (en) | 2010-09-30 |
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