WO2008146333A1 - 質量分析装置 - Google Patents
質量分析装置 Download PDFInfo
- Publication number
- WO2008146333A1 WO2008146333A1 PCT/JP2007/000582 JP2007000582W WO2008146333A1 WO 2008146333 A1 WO2008146333 A1 WO 2008146333A1 JP 2007000582 W JP2007000582 W JP 2007000582W WO 2008146333 A1 WO2008146333 A1 WO 2008146333A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ionization
- chamber
- ions
- conducted
- laser irradiation
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
- H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
大気圧雰囲気の下でMALDIイオン化を行うイオン化室(1)から次の第1中間真空室(10)にイオンを導入する加熱キャピラリ(7)の出口に、レーザ照射により二次的なイオン化を行う二次イオン化領域(33)を設ける。イオン化室(1)内でイオン化されなかった又は途中で再結合により発生した試料由来の中性分子がイオンとともにガス流に乗って第1中間真空室(10)内に吐き出されるが、レーザ照射により、大気圧よりも低いガス圧の下で中性分子は高い効率でイオン化される。これにより、従来よりも多量のイオンを後段の高真空雰囲気にある分析室へ送り込むことができ、質量分析の感度や精度を向上させることができる。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009516076A JP5024375B2 (ja) | 2007-05-30 | 2007-05-30 | 質量分析装置 |
PCT/JP2007/000582 WO2008146333A1 (ja) | 2007-05-30 | 2007-05-30 | 質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/000582 WO2008146333A1 (ja) | 2007-05-30 | 2007-05-30 | 質量分析装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008146333A1 true WO2008146333A1 (ja) | 2008-12-04 |
Family
ID=40074622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/000582 WO2008146333A1 (ja) | 2007-05-30 | 2007-05-30 | 質量分析装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5024375B2 (ja) |
WO (1) | WO2008146333A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010170987A (ja) * | 2008-12-26 | 2010-08-05 | Canon Anelva Corp | 質量分析方法およびそれに用いる質量分析装置 |
GB2556074A (en) * | 2016-11-17 | 2018-05-23 | Micromass Ltd | Axial atmospheric pressure photo-ionization imaging source and inlet device |
CN114068288A (zh) * | 2020-08-03 | 2022-02-18 | 布鲁克·道尔顿有限及两合公司 | 具有掺杂气辅助的电离的解吸离子源 |
CN114354737A (zh) * | 2022-03-18 | 2022-04-15 | 中国科学技术大学 | 一种具有常压激光解析电离和二次光电离的质谱成像装置 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101508146B1 (ko) * | 2014-02-17 | 2015-04-07 | 광주과학기술원 | 기화-전자 이온화기 및 레이저 이온화기를 포함하는 에어로졸 질량분석기 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61285649A (ja) * | 1985-06-13 | 1986-12-16 | Mitsubishi Electric Corp | レ−ザ−質量分析装置 |
JPH06201567A (ja) * | 1992-09-11 | 1994-07-19 | American Teleph & Telegr Co <Att> | 質量スペクトル測定用手段を含む装置 |
JPH08240566A (ja) * | 1995-01-17 | 1996-09-17 | At & T Corp | レーザ支援による粒子分析 |
JP2005243573A (ja) * | 2004-02-27 | 2005-09-08 | Mitsubishi Heavy Ind Ltd | 試料分析装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6646257B1 (en) * | 2002-09-18 | 2003-11-11 | Agilent Technologies, Inc. | Multimode ionization source |
JP4645197B2 (ja) * | 2005-01-05 | 2011-03-09 | 株式会社島津製作所 | 質量分析方法 |
-
2007
- 2007-05-30 JP JP2009516076A patent/JP5024375B2/ja not_active Expired - Fee Related
- 2007-05-30 WO PCT/JP2007/000582 patent/WO2008146333A1/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61285649A (ja) * | 1985-06-13 | 1986-12-16 | Mitsubishi Electric Corp | レ−ザ−質量分析装置 |
JPH06201567A (ja) * | 1992-09-11 | 1994-07-19 | American Teleph & Telegr Co <Att> | 質量スペクトル測定用手段を含む装置 |
JPH08240566A (ja) * | 1995-01-17 | 1996-09-17 | At & T Corp | レーザ支援による粒子分析 |
JP2005243573A (ja) * | 2004-02-27 | 2005-09-08 | Mitsubishi Heavy Ind Ltd | 試料分析装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010170987A (ja) * | 2008-12-26 | 2010-08-05 | Canon Anelva Corp | 質量分析方法およびそれに用いる質量分析装置 |
GB2556074A (en) * | 2016-11-17 | 2018-05-23 | Micromass Ltd | Axial atmospheric pressure photo-ionization imaging source and inlet device |
US11127576B2 (en) | 2016-11-17 | 2021-09-21 | Micromass Uk Limited | Axial atmospheric pressure photo-ionization imaging source and inlet device |
CN114068288A (zh) * | 2020-08-03 | 2022-02-18 | 布鲁克·道尔顿有限及两合公司 | 具有掺杂气辅助的电离的解吸离子源 |
CN114354737A (zh) * | 2022-03-18 | 2022-04-15 | 中国科学技术大学 | 一种具有常压激光解析电离和二次光电离的质谱成像装置 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2008146333A1 (ja) | 2010-08-12 |
JP5024375B2 (ja) | 2012-09-12 |
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