WO2008114699A1 - 試験装置および測定回路 - Google Patents

試験装置および測定回路 Download PDF

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Publication number
WO2008114699A1
WO2008114699A1 PCT/JP2008/054661 JP2008054661W WO2008114699A1 WO 2008114699 A1 WO2008114699 A1 WO 2008114699A1 JP 2008054661 W JP2008054661 W JP 2008054661W WO 2008114699 A1 WO2008114699 A1 WO 2008114699A1
Authority
WO
WIPO (PCT)
Prior art keywords
section
testing apparatus
sampling
measuring circuit
inclination
Prior art date
Application number
PCT/JP2008/054661
Other languages
English (en)
French (fr)
Inventor
Koichi Tanaka
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009505180A priority Critical patent/JPWO2008114699A1/ja
Priority to KR1020097021298A priority patent/KR101095641B1/ko
Priority to DE112008000741T priority patent/DE112008000741T5/de
Publication of WO2008114699A1 publication Critical patent/WO2008114699A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

　被試験デバイスを試験する試験装置であって、被試験デバイスが出力する被測定信号の立ち上がりエッジの傾きと、立ち下がりエッジの傾きとを、それぞれ独立に調整する傾き調整部と、傾き調整部によりエッジ傾きが調整された被測定信号をサンプリングするサンプリング部と、サンプリング部におけるサンプリング結果に基づいて、被試験デバイスの良否を判定する判定部とを備える試験装置を提供する。
PCT/JP2008/054661 2007-03-21 2008-03-13 試験装置および測定回路 WO2008114699A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009505180A JPWO2008114699A1 (ja) 2007-03-21 2008-03-13 試験装置および測定回路
KR1020097021298A KR101095641B1 (ko) 2007-03-21 2008-03-13 시험 장치 및 측정 회로
DE112008000741T DE112008000741T5 (de) 2007-03-21 2008-03-13 Prüfgerät und Messschaltung

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US89598507P 2007-03-21 2007-03-21
US60/895,985 2007-03-21
US11/855,155 US7756664B2 (en) 2007-03-21 2007-09-14 Test apparatus and measurement circuit
US11/855,155 2007-09-14

Publications (1)

Publication Number Publication Date
WO2008114699A1 true WO2008114699A1 (ja) 2008-09-25

Family

ID=39765808

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054661 WO2008114699A1 (ja) 2007-03-21 2008-03-13 試験装置および測定回路

Country Status (6)

Country Link
US (1) US7756664B2 (ja)
JP (1) JPWO2008114699A1 (ja)
KR (1) KR101095641B1 (ja)
DE (1) DE112008000741T5 (ja)
TW (1) TWI385398B (ja)
WO (1) WO2008114699A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011024394A1 (ja) * 2009-08-26 2011-03-03 株式会社アドバンテスト 変調された被試験信号の試験装置および試験方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010113213A1 (ja) * 2009-03-31 2010-10-07 富士通株式会社 位相調整回路の自己試験装置及び方法
US20130033279A1 (en) * 2011-08-01 2013-02-07 James Sozanski Electromagnetic Test Enclosure
US10276229B2 (en) * 2017-08-23 2019-04-30 Teradyne, Inc. Adjusting signal timing
KR20220170244A (ko) * 2021-06-22 2022-12-29 삼성전자주식회사 클록 변환 장치, 이를 포함하는 테스트 시스템 및 테스트 시스템의 동작방법
CN114782276B (zh) * 2022-04-29 2023-04-11 电子科技大学 一种基于自适应梯度投影的电阻率成像错位校正方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0993116A (ja) * 1995-09-21 1997-04-04 Fujitsu Ltd 半導体集積回路
JP2002156422A (ja) * 2000-11-17 2002-05-31 Advantest Corp 半導体試験装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0622318B2 (ja) * 1985-04-26 1994-03-23 株式会社日立製作所 パルス遅延回路
JP2816705B2 (ja) * 1989-05-25 1998-10-27 日立電子エンジニアリング株式会社 Ｉｃ試験装置
JPH03262318A (ja) * 1990-03-13 1991-11-22 Nec Corp 遅延回路
JPH0755882A (ja) * 1993-08-23 1995-03-03 Yokogawa Electric Corp Ｉｃ試験装置
JP2002118449A (ja) * 1999-07-07 2002-04-19 Advantest Corp 可変遅延回路
JP2001060854A (ja) 1999-08-24 2001-03-06 Advantest Corp 差動伝送回路及びこれを用いるパルス幅可変回路及び可変遅延回路及び半導体試験装置
FR2804761B1 (fr) * 1999-10-01 2003-02-21 Schlumberger Technologies Inc Methode de test et appareil aux signaux synchrones de source
JP2003098222A (ja) * 2001-09-25 2003-04-03 Mitsubishi Electric Corp 検査用基板、検査装置及び半導体装置の検査方法
JP4928097B2 (ja) * 2005-07-29 2012-05-09 株式会社アドバンテスト タイミング発生器及び半導体試験装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0993116A (ja) * 1995-09-21 1997-04-04 Fujitsu Ltd 半導体集積回路
JP2002156422A (ja) * 2000-11-17 2002-05-31 Advantest Corp 半導体試験装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011024394A1 (ja) * 2009-08-26 2011-03-03 株式会社アドバンテスト 変調された被試験信号の試験装置および試験方法
CN102483440A (zh) * 2009-08-26 2012-05-30 株式会社爱德万测试 调制后的被测试信号的测试装置以及测试方法
JPWO2011024394A1 (ja) * 2009-08-26 2013-01-24 株式会社アドバンテスト 変調された被試験信号の試験装置および試験方法

Also Published As

Publication number Publication date
KR20090129470A (ko) 2009-12-16
JPWO2008114699A1 (ja) 2010-07-01
DE112008000741T5 (de) 2010-01-14
TWI385398B (zh) 2013-02-11
US7756664B2 (en) 2010-07-13
TW200844458A (en) 2008-11-16
KR101095641B1 (ko) 2011-12-19
US20080234961A1 (en) 2008-09-25

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