ATE461456T1 - Echtzeit-einrichtungscharakterisierung und - analyse - Google Patents

Echtzeit-einrichtungscharakterisierung und - analyse

Info

Publication number
ATE461456T1
ATE461456T1 AT05753830T AT05753830T ATE461456T1 AT E461456 T1 ATE461456 T1 AT E461456T1 AT 05753830 T AT05753830 T AT 05753830T AT 05753830 T AT05753830 T AT 05753830T AT E461456 T1 ATE461456 T1 AT E461456T1
Authority
AT
Austria
Prior art keywords
frequency
dut
source
real
analysis
Prior art date
Application number
AT05753830T
Other languages
English (en)
Inventor
Bossche Marc Vanden
Original Assignee
Nmdg Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nmdg Nv filed Critical Nmdg Nv
Application granted granted Critical
Publication of ATE461456T1 publication Critical patent/ATE461456T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Thin Film Transistor (AREA)
AT05753830T 2004-06-07 2005-06-07 Echtzeit-einrichtungscharakterisierung und - analyse ATE461456T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US57753404P 2004-06-07 2004-06-07
PCT/BE2005/000093 WO2005121817A1 (en) 2004-06-07 2005-06-07 Real-time device characterisation and analysis

Publications (1)

Publication Number Publication Date
ATE461456T1 true ATE461456T1 (de) 2010-04-15

Family

ID=34981478

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05753830T ATE461456T1 (de) 2004-06-07 2005-06-07 Echtzeit-einrichtungscharakterisierung und - analyse

Country Status (5)

Country Link
US (1) US7486067B2 (de)
EP (1) EP1759218B1 (de)
AT (1) ATE461456T1 (de)
DE (1) DE602005020003D1 (de)
WO (1) WO2005121817A1 (de)

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EP2205987A2 (de) * 2007-09-28 2010-07-14 Oliver Zafiris Verfahren und system zur bestimmung eines reaktionssignals für einen ausgewählten ort in einem informationsverarbeitenden system nach einwirkung von mindestens einem eingangssignal
US20090174415A1 (en) * 2008-01-05 2009-07-09 Jan Verspecht Method for Calibrating a Real-Time Load-Pull System
US7671605B2 (en) * 2008-01-17 2010-03-02 Agilent Technologies, Inc. Large signal scattering functions from orthogonal phase measurements
US8456175B2 (en) * 2008-04-21 2013-06-04 Anteverta-Mw B.V. Open loop load pull arrangement with determination of injections signals
EP2112516A1 (de) 2008-04-21 2009-10-28 TU Delft Schiebeanordnung mit offener Schleife mit Bestimmung von Einspritzsignalen
US8319504B2 (en) * 2009-05-29 2012-11-27 Freescale Semiconductor, Inc. Tuner characterization methods and apparatus
GB2470781A (en) * 2009-06-05 2010-12-08 Mesuro Ltd High frequency measurement with load pull
FR2947119B1 (fr) 2009-06-18 2011-07-01 Amcad Engineering Procede et systeme d'adaptation optimale d'impedance de source en entree de composants electroniques, en particulier de transistors
US8497689B1 (en) * 2010-03-10 2013-07-30 Christos Tsironis Method for reducing power requirements in active load pull system
US10387592B1 (en) 2010-05-26 2019-08-20 Keysight Technologies, Inc. Method and system for characterizing, modeling and simulating non-linear components having long term memory effects
DE112012002969T5 (de) * 2011-08-08 2014-04-30 National Instruments Ireland Resources Ltd. Messsystem zur Charakterisierung einer testenden Vorrichtung
US8914271B2 (en) * 2011-11-30 2014-12-16 Keysight Technologies, Inc. Method for predistorting signals for non-linear components in the presence of long term memory effects
DE112013001232T5 (de) * 2012-03-01 2015-01-29 National Instruments Ireland Resources Ltd. Verfahren und System zum Charakterisieren einer Frequenzübersetzungsvorrichtung
US9214718B2 (en) * 2012-03-08 2015-12-15 Apple Inc. Methods for characterizing tunable radio-frequency elements
DE102014101718A1 (de) * 2013-02-15 2014-08-21 National Instruments Ireland Resources Ltd. Verfahren zum Kalibrieren eines vektoriellen Netzwerk-Analysators
US9213056B1 (en) * 2013-05-29 2015-12-15 Christos Tsironis Multi-source active injection load pull system and method
DE112014002975T5 (de) * 2013-08-05 2016-05-19 National Instruments Ireland Resources Limited Impedanz-Synthesizer
US10809287B2 (en) * 2013-08-16 2020-10-20 Arcteq Relays Oy Method and system and computer program for measuring alternating-current system quantities
JP6611441B2 (ja) * 2014-02-28 2019-11-27 地方独立行政法人東京都立産業技術研究センター 周波数変換ユニット、計測システム及び計測方法
US9632122B2 (en) 2014-06-23 2017-04-25 Keysight Technologies, Inc. Determining operating characteristics of signal generator using measuring device
US9664718B1 (en) 2014-08-27 2017-05-30 Christos Tsironis High speed hybrid active load pull
US11215655B2 (en) * 2014-10-12 2022-01-04 Compass Technology Group, LLC Correction of transmission line induced phase and amplitude errors in reflectivity measurements
US9459336B1 (en) 2014-11-03 2016-10-04 Christos Tsironis Hybrid load pull system and method
US9729255B1 (en) 2016-05-27 2017-08-08 Avago Technologies General Ip (Singapore) Pte. Ltd. Method of calibrating electronic device for optimized overall specification-driven performance using stimuli within normal operation ranges of the electronic device
US10444266B1 (en) 2016-08-22 2019-10-15 Christos Tsironis Hybrid split signal load pull system with wave-probe
EP3293897B8 (de) * 2016-09-12 2020-08-12 Rohde & Schwarz GmbH & Co. KG System und verfahren zur charakterisierung von multi-element-antennen
US10620659B2 (en) 2017-04-05 2020-04-14 International Business Machines Corporation Clock network analysis using harmonic balance
US11156690B2 (en) * 2017-09-15 2021-10-26 Maury Microwave, Inc. Measurement system configured for measurements at non-calibrated frequencies
US11047821B2 (en) 2018-05-31 2021-06-29 Analog Devices International Unlimited Company Bio-impedance and contact impedances measurement
US10884046B1 (en) * 2018-11-13 2021-01-05 Christos Tsironis Calibration and load pull method for RF and baseband frequencies
US11131704B2 (en) * 2019-03-26 2021-09-28 Rohde & Schwarz Gmbh & Co. Kg Method and measuring apparatus for testing a device under test
US10805015B1 (en) 2020-02-21 2020-10-13 Rohde & Schwarz Gmbh & Co. Kg Method as well as test system for testing a device under test
CN111539165B (zh) * 2020-03-24 2023-08-18 电子科技大学 一种基于成品率负载牵引系统的芯片设计方法及系统
US11474137B2 (en) * 2020-09-18 2022-10-18 Rohde & Schwarz Gmbh & Co. Kg Test system
US11644505B2 (en) * 2021-01-21 2023-05-09 National Instruments Ireland Resources Limited Measurement system for characterizing a device under test
US11698405B2 (en) * 2021-07-09 2023-07-11 Rohde & Schwarz Gmbh & Co. Kg Method and system for determining at least one contribution of at least one device under test of a radio frequency device chain

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US5336988A (en) * 1993-02-10 1994-08-09 Picker International, Inc. Scalar S-parameter test set for NMR instrumentation measurements
US6065137A (en) * 1998-04-06 2000-05-16 Hewlett-Packard Company Network analyzer measurement method using adaptive signal processing
DE19926454C2 (de) 1999-06-10 2002-02-28 Rohde & Schwarz Vektorieller Netzwerkanalysator
IT1312404B1 (it) * 1999-06-15 2002-04-17 Andrea Ferrero Dispositivo a sintesi di impedenza di carico o sorgente attiva perbanchi di misura di componenti ed apparati alle microonde
US6636816B1 (en) * 1999-09-21 2003-10-21 Steven L. Dvorak Vector signal analysis method and apparatus therefor
US6297649B1 (en) * 1999-09-30 2001-10-02 Focus Microwaves Inc. Harmonic rejection load tuner
US6943563B2 (en) * 2001-05-02 2005-09-13 Anritsu Company Probe tone S-parameter measurements
DE60124547T2 (de) * 2001-09-24 2007-09-06 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Sammeln von HF-Eingangs- und -Ausgangs- sowie Vorspannungssignaldaten
EP1296148A1 (de) 2001-09-25 2003-03-26 Agilent Technologies, Inc. (a Delaware corporation) Vorrichtung zur Sammlung von Signalmessdaten in einem Signalport eines RF-Mikrowellenprüflings
GB2382662B (en) * 2001-11-29 2003-12-10 Univ Cardiff High frequency circuit analyzer
DE10246700B4 (de) 2002-10-07 2009-10-15 Rohde & Schwarz Gmbh & Co. Kg Meßvorrichtung, insbesondere vektorieller Netzwerkanalysator, mit getrennten Oszillatoren
US7038468B2 (en) * 2003-06-11 2006-05-02 Jan Verspecht Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves
US7248866B1 (en) * 2003-11-14 2007-07-24 Christos Tsironis Frequency selective load pull tuner and method

Also Published As

Publication number Publication date
US20070194776A1 (en) 2007-08-23
WO2005121817A1 (en) 2005-12-22
EP1759218A1 (de) 2007-03-07
DE602005020003D1 (de) 2010-04-29
US7486067B2 (en) 2009-02-03
EP1759218B1 (de) 2010-03-17

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