WO2008108374A1 - 信号測定装置および試験装置 - Google Patents

信号測定装置および試験装置 Download PDF

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Publication number
WO2008108374A1
WO2008108374A1 PCT/JP2008/053876 JP2008053876W WO2008108374A1 WO 2008108374 A1 WO2008108374 A1 WO 2008108374A1 JP 2008053876 W JP2008053876 W JP 2008053876W WO 2008108374 A1 WO2008108374 A1 WO 2008108374A1
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
input signal
section
phase difference
measurement cycle
Prior art date
Application number
PCT/JP2008/053876
Other languages
English (en)
French (fr)
Inventor
Tadahiko Baba
Masatoshi Ohashi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009502591A priority Critical patent/JP5351009B2/ja
Publication of WO2008108374A1 publication Critical patent/WO2008108374A1/ja

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/023—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in clock generator or timing circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Phase Differences (AREA)

Abstract

　第１入力信号および第２入力信号を測定する信号測定装置であって、測定サイクルの各サイクル内に複数配置されたストローブタイミングで第１入力信号を測定する第１測定部と、測定サイクルの各サイクル内に複数配置されたストローブタイミングで第２入力信号を測定する第２測定部と、第１測定部および第２測定部における測定結果に基づいて、各測定サイクルにおける第１入力信号および第２入力信号の位相差を算出する位相差算出部と、位相差算出部が各測定サイクルにおいて算出した位相差の分布情報を生成する分布生成部とを備える信号測定装置を提供する。
PCT/JP2008/053876 2007-03-08 2008-03-04 信号測定装置および試験装置 WO2008108374A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009502591A JP5351009B2 (ja) 2007-03-08 2008-03-04 信号測定装置および試験装置

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US89386607P 2007-03-08 2007-03-08
US60/893,866 2007-03-08
US11/941,087 US7783452B2 (en) 2007-03-08 2007-11-16 Signal measurement apparatus and test apparatus
US11/941,087 2007-11-16

Publications (1)

Publication Number Publication Date
WO2008108374A1 true WO2008108374A1 (ja) 2008-09-12

Family

ID=39738252

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/053876 WO2008108374A1 (ja) 2007-03-08 2008-03-04 信号測定装置および試験装置

Country Status (4)

Country Link
US (1) US7783452B2 (ja)
JP (1) JP5351009B2 (ja)
KR (1) KR101044707B1 (ja)
WO (1) WO2008108374A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010087008A1 (ja) * 2009-01-30 2010-08-05 株式会社アドバンテスト 電子デバイス、試験装置および試験方法
WO2010087009A1 (ja) * 2009-01-30 2010-08-05 株式会社アドバンテスト 電子デバイス、試験装置および試験方法
WO2010098460A1 (ja) * 2009-02-27 2010-09-02 古野電気株式会社 位相測定装置、および周波数測定装置
WO2010150304A1 (ja) * 2009-06-22 2010-12-29 株式会社アドバンテスト 位相検出装置、試験装置および調整方法
JP2011017604A (ja) * 2009-07-08 2011-01-27 Advantest Corp 試験装置および試験方法
JP2011154009A (ja) * 2010-01-28 2011-08-11 Advantest Corp 試験装置、測定装置および電子デバイス

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5274428B2 (ja) * 2009-10-29 2013-08-28 株式会社アドバンテスト 測定装置および試験装置
US8918686B2 (en) * 2010-08-18 2014-12-23 Kingtiger Technology (Canada) Inc. Determining data valid windows in a system and method for testing an integrated circuit device
US20120089371A1 (en) * 2010-10-06 2012-04-12 Advantest Corporation Measurement apparatus, measurement method, test apparatus and recording medium
US9337848B2 (en) 2014-02-27 2016-05-10 Industry-Academic Cooperation Foundation, Yonsei University Clock and data recovery device
JP6337543B2 (ja) * 2014-03-19 2018-06-06 アイシン精機株式会社 形状測定装置及び形状測定方法
KR101565098B1 (ko) * 2014-04-30 2015-11-02 한국항공우주연구원 신호 입력시간 측정 장치

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001356153A (ja) * 2000-06-14 2001-12-26 Advantest Corp 半導体デバイス試験方法・半導体デバイス試験装置
WO2003060533A1 (fr) * 2002-01-10 2003-07-24 Advantest Corporation Dispositif pour tester la lsi a mesurer, analyseur de gigue et detecteur de dephasage
WO2003104826A1 (ja) * 2002-06-10 2003-12-18 株式会社アドバンテスト 半導体試験装置
JP2004125552A (ja) * 2002-10-01 2004-04-22 Advantest Corp ジッタ測定装置、及び試験装置
WO2005012930A1 (ja) * 2003-07-31 2005-02-10 Advantest Corporation 試験装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6789224B2 (en) * 2000-01-18 2004-09-07 Advantest Corporation Method and apparatus for testing semiconductor devices
JP3830020B2 (ja) * 2000-10-30 2006-10-04 株式会社日立製作所 半導体集積回路装置
JP4006260B2 (ja) * 2002-04-26 2007-11-14 株式会社アドバンテスト 半導体試験装置
US7421355B2 (en) * 2006-02-27 2008-09-02 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device
KR100829455B1 (ko) * 2006-11-13 2008-05-15 주식회사 하이닉스반도체 반도체 메모리 장치의 데이터 출력 제어신호 생성회로 및방법

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001356153A (ja) * 2000-06-14 2001-12-26 Advantest Corp 半導体デバイス試験方法・半導体デバイス試験装置
WO2003060533A1 (fr) * 2002-01-10 2003-07-24 Advantest Corporation Dispositif pour tester la lsi a mesurer, analyseur de gigue et detecteur de dephasage
WO2003104826A1 (ja) * 2002-06-10 2003-12-18 株式会社アドバンテスト 半導体試験装置
JP2004125552A (ja) * 2002-10-01 2004-04-22 Advantest Corp ジッタ測定装置、及び試験装置
WO2005012930A1 (ja) * 2003-07-31 2005-02-10 Advantest Corporation 試験装置

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5249357B2 (ja) * 2009-01-30 2013-07-31 株式会社アドバンテスト 電子デバイス、試験装置および試験方法
WO2010087009A1 (ja) * 2009-01-30 2010-08-05 株式会社アドバンテスト 電子デバイス、試験装置および試験方法
WO2010087008A1 (ja) * 2009-01-30 2010-08-05 株式会社アドバンテスト 電子デバイス、試験装置および試験方法
WO2010098460A1 (ja) * 2009-02-27 2010-09-02 古野電気株式会社 位相測定装置、および周波数測定装置
KR101584394B1 (ko) 2009-02-27 2016-01-11 후루노덴끼가부시끼가이샤 위상 측정 장치, 및 주파수 측정 장치
US8738312B2 (en) 2009-02-27 2014-05-27 Furuno Electric Co., Ltd. Phase measuring device and frequency measuring device
CN102334038B (zh) * 2009-02-27 2013-11-06 古野电气株式会社 相位测定装置、以及频率测定装置
KR20110127676A (ko) * 2009-02-27 2011-11-25 후루노덴끼가부시끼가이샤 위상 측정 장치, 및 주파수 측정 장치
CN102334038A (zh) * 2009-02-27 2012-01-25 古野电气株式会社 相位测定装置、以及频率测定装置
WO2010150304A1 (ja) * 2009-06-22 2010-12-29 株式会社アドバンテスト 位相検出装置、試験装置および調整方法
US7999531B2 (en) 2009-06-22 2011-08-16 Advantest Corporation Phase detecting apparatus, test apparatus and adjusting method
JP2011017604A (ja) * 2009-07-08 2011-01-27 Advantest Corp 試験装置および試験方法
JP2011154009A (ja) * 2010-01-28 2011-08-11 Advantest Corp 試験装置、測定装置および電子デバイス

Also Published As

Publication number Publication date
KR20090115864A (ko) 2009-11-09
US7783452B2 (en) 2010-08-24
JP5351009B2 (ja) 2013-11-27
JPWO2008108374A1 (ja) 2010-06-17
KR101044707B1 (ko) 2011-06-28
US20090216488A1 (en) 2009-08-27

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