WO2008025889A1 - Puce microelectronique nue munie d'un evidement formant un logement pour un element filaire constituant un support mecanique souple, procede de fabrication et microstructure - Google Patents
Puce microelectronique nue munie d'un evidement formant un logement pour un element filaire constituant un support mecanique souple, procede de fabrication et microstructure Download PDFInfo
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- WO2008025889A1 WO2008025889A1 PCT/FR2007/001034 FR2007001034W WO2008025889A1 WO 2008025889 A1 WO2008025889 A1 WO 2008025889A1 FR 2007001034 W FR2007001034 W FR 2007001034W WO 2008025889 A1 WO2008025889 A1 WO 2008025889A1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/02—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the selection of materials, e.g. to avoid wear during transport through the machine
- G06K19/027—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the selection of materials, e.g. to avoid wear during transport through the machine the material being suitable for use as a textile, e.g. woven-based RFID-like labels designed for attachment to laundry items
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- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
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Definitions
- the invention relates to a microelectronic chip comprising two parallel main faces and side faces.
- the invention also relates to a method for manufacturing such a microelectronic chip and to a microstructure comprising at least two chips connected by a wire element.
- thermoelectric tissues generate energy from a temperature gradient
- the piezoelectric tissues are capable of supplying electronics with energy recovery. This energy then feeds an electronic circuit integral with the fabric.
- the electronic functions are obtained by adding electronic circuits to the textiles.
- the electronic functions are performed by a microelectronic chip conventionally connected to other chips or to a power supply via pins connected to mechanical elements weldable by means of connecting wires, a housing protecting the circuit and the studs.
- Functions Achievable electronics can be complex, but the mechanical stability of the electronic chip embedded in the textile is very bad. Such integration is long and requires complex special machines.
- the connector has a significant footprint before that of the active part of the chip.
- the object of the invention is to provide a microelectronic chip whose integration into a fabric or knit is improved.
- At least one of the faces of the chip comprises a recess provided with at least one electrical connection element and forming a housing for a wired element, which simultaneously constitutes an electrical connection between the chip and the outside through said connecting element and a flexible mechanical support for said chip.
- the subject of the invention is also a process for manufacturing a microelectronic chip in which the recess consists of a groove located on at least one lateral face.
- a development of the invention is a microstructure comprising a wire element electrically and mechanically connecting at least two chips according to the invention.
- FIG. 1 is a sectional view of FIG. a first exemplary embodiment of a microelectronic chip according to the invention
- FIG. 2 is a sectional view of a second exemplary embodiment of a microelectronic chip according to the invention
- FIGS. 3 to 5 illustrate the different FIG. 6 shows a sectional view of an embodiment variant of a chip according to FIG. 2
- FIGS. 7 and 8 illustrate two other embodiments of a chip manufacturing process according to FIG.
- FIG. 9 and 10 illustrate a method for producing another embodiment of a chip according to the invention
- FIGS. 11 to 13 illustrate another method of producing a chip according to the invention.
- a first example of a microelectronic chip 1 comprises a plane substrate 2 provided, in a conventional manner, with at least one component microelectronics 3.
- the microelectronic chip 1 thus has two main faces 4 and 5 parallel to each other, connected by side faces forming the edge of the chip 1. Only two lateral faces 6, 7 are shown, but their number may vary and depends on the shape of the outline of the main faces 4, 5.
- each side face 6, 7 is gutter-shaped parallel to the main faces 4 and 5 and constitutes a groove, respectively marked 8 and 9 for the side faces 6, 7 and for housing a wire element .
- the housing grooves 8, 9 each have a concave section.
- the width of the grooves 8, 9 is equal to the height of the lateral faces 6, 7 and its section is in an arc of a circle, that is to say in a C-shape
- the C shape can be exact or approximated with line segments.
- the grooves 8 and 9 can be made by any suitable technique, for example by dry or wet etching, laser ablation, laser assisted chemical etching, mechanical machining ...
- the microelectronic chip 1 can thus be easily integrated into a textile fabric because two adjacent threads 10, 11, for example weft, constituting this textile can automatically be inserted into the housing grooves 8, 9, whether with a method weaving or knitting process.
- the housing grooves 8, 9 provide mechanical stability of the microelectronic chip 1 with respect to the textile. It is clear that we will try to adapt the radius of curvature of the housing grooves 8, 9 to the diameter of the son 10, 11. Similar grooves may be envisaged for the warp son. Alternatively, the grooves 8, 9 may be coated by an electrically conductive layer, respectively 12, 13. This arrangement allows to use son 10, 11 of weft or warp that are electrically conductive and to ensure electrical contact with these wires 10, 11.
- the wires can then be used for the power supply of the microelectronic component 3 and, possibly, for the data transfer with power / data multiplexing.
- the wires can also constitute antenna radiating elements (transmission or reception).
- the electrically conductive layers 12, 13 may be electrically connected, in a conventional manner, to the microelectronic component 3 via a via via 14 perpendicular to the main faces 4, 5 or of a conductive track 15 deposited on the face of the substrate. 2 provided with the component 3 for connecting the layer 13 to a contact of the component 3.
- each groove 8, 9 may have a V-shaped or V-truncated section.
- each groove 8, 9 comprises two convergent walls interconnected by a flat bottom.
- the microelectronic chip 1 consists of two elementary chips 16a and 16b of substantially trapezoidal cross-section, each comprising a small base 17a or 17b and a large base 18a or 18b connected to each other. by flat lateral inclined faces 19a or 19b.
- the inclined plane lateral faces, 19a or 19b form an acute angle with the corresponding large base, 18a or 18b and are convergent.
- a microelectronic component 23a, 23b is located at the level of the small base
- the elementary chips 16a, 16b are secured by their small bases
- housing grooves 20 and 21 are shown. Housing grooves 20, 21 therefore have a V-shaped section (more particularly V-shaped truncated in Figure 2) and constitute the side faces 6 and 7 of the microelectronic chip 1.
- the large bases 18a, 18b are parallel and constitute the main faces 5, 6 of the microelectronic chip 1 of Figure 2.
- the housing grooves 20, 21 can receive the son 10 and 11 in a similar manner to the microelectronic chip 1 of Figure 1.
- the elementary chips 16a and 16b are, for example, assembled to one another by gluing, an adhesive layer 22 then being interposed between the small bases 17a, 17b.
- the glue can be a resin, insulating, conductive or electroactive.
- the assembly of the elementary chips 16a, 16b can also be achieved by molecular bonding. In the latter case, the adhesive layer 22 is absent.
- the housing grooves 20, 21 are coated with an electrically conductive layer 24, 25 respectively, deposited on the inclined plane lateral faces 19a, 19b.
- This arrangement makes it possible to use weirs 10, 11 of wefts or warps that are electrically conductive and to provide electrical contact with these wires 10, 11.
- the electrically conductive layers 24, 25 are electrically connected, in a conventional manner, to microelectronic components 23a, 23b, for example, via conductive tracks 26.
- the tracks 26 may be made of the same material as the layers 24, 25, possibly during the deposition of the layers 24, 25.
- the layers 24, 25 can be deleted. Otherwise, the son 10, 11 can be assigned to different electronic functions of the power supply and the layers 24, 25 are assigned to other functions than the power supply.
- the microelectronic components 23a, 23b may be formed at the large bases 18a, 18b. Such a component may then be electrically connected to an electrically conductive layer 24, 25 via a via via (not shown in Figure 2).
- the microelectronic chip 1 of FIG. 2 can be obtained by the manufacturing method illustrated in FIGS. 3 to 5.
- a first step (FIG. 3) a plurality of separate elementary chips 16a are produced simultaneously on the same first plate 27. by V-shaped grooves 28 each comprising two convergent walls 29a, 29b.
- Each groove 28 is formed in the face of the wafer 27 in which are formed the small bases 17.
- the walls 29a, 29b of the grooves 28 are connected by a flat bottom 30, parallel to the face of the wafer 27 in which are formed the small bases 17.
- Two networks of parallel grooves 28 are made. The grooves 28 of the two networks are orthogonal to each other.
- a pair of adjacent grooves 28 of one of the networks delimits, in combination with a pair of adjacent grooves 28 of the other network, a small base 17, of rectangular or square shape.
- the elementary chips 16a are distributed in rows and columns in the plane of the wafer 27.
- a microelectronic component is formed at each of the small bases 17.
- FIG. 3 illustrates, in section, two adjacent elementary chips 16a, separated by a groove 28.
- a second analogous plate 33 (shown in FIG. 5) comprises a plurality of elementary chips 16b.
- an electrically conductive material is deposited on the face of the wafer 27 in which the small bases 17, so as to form, in each elementary chip 16a, a first contact 31 disposed between the microelectronic component 3 and the wall 29a of an adjacent groove 28, and a second contact 32 disposed between the component 3 and the wall 29b of the adjacent groove 28 parallel.
- Such contacts can also be made for the walls of the grooves 28 of the perpendicular network.
- the wafer 27 comprising the elementary chips 16a is glued to the wafer 33 comprising the elementary chips 16b.
- the plates 27 and 33 are bonded by their faces having the grooves 28, so that the grooves 28 are superimposed.
- the assembly thus produced comprises a plurality of microelectronic chips 1 according to FIG. 2. These microelectronic chips 1 are distributed in rows and columns, separated from each other by the flat bottoms 30 of the grooves 28 of the plates 27 and 33.
- the material used for the bonding is, for each microelectronic chip 1, the adhesive layer 22 of Figure 2.
- the assembly of the plates 27 and 33 can also be achieved by molecular bonding. In the latter case, the adhesive layers 22 are absent.
- a planing of the rear faces (opposite the faces where the grooves 28 are formed) of the plates 27, 33 can be made to thin the microelectronic chips 1 thus formed.
- the plates 27, 33, glued to one another are cut at the grooves 28 so as to separate the microelectronic chips 1 from each other.
- This cutting can be performed by any suitable technique, for example, by sawing with a diamond circular saw, by dry or wet etching, by laser ablation, laser assisted chemical etching ...
- FIG. 6 illustrates a variant of the chip 1 according to FIG. 2.
- the microelectronic components 23a, 23b of the chips elementals 16a, 16b are formed at the level of the large bases 18a, 18b.
- the small base 17a, 17b of each of the elementary chips 16a 16b has an additional groove 34a, 34b parallel to the V-shaped housing grooves 20, 21.
- the additional grooves 34a, 34b are superimposed to form an additional housing for a wire element , such as a wire 35 interposed between the son 10 and 11.
- the additional grooves 34a, 34b are coated by an electrically conductive layer, respectively 36a, 36b, connected to the electronic component, 23a or 23b, associated via a via via, 37a or 37b.
- the latter can, as previously, be connected to the electrically conductive layers 24, 25 via a via via 38a, 38b or by a conductive track 39a, 39b.
- the wire 35 may be intended to provide a direct interconnection between two microelectronic chips 1 or may constitute a radiating wire antenna.
- the wire 35 may also be a piezoelectric fiber, so as to constitute the power supply.
- the wire element can be fixed by any other means, for example, by welding by adding material, plasma, electrolysis, ultrasound, etc.
- the microelectronic chip 1 comprises at least one recess 8, 9, that is to say a groove or hole, in one of its main faces 4, 5. This allows its integration, for example in a textile, in a so-called parallel mode, that is to say that the axis of the wire element 10, 11 in the immediate vicinity of its attachment to the chip is substantially parallel to the main faces 4, 5 of the microelectronic chip 1.
- a microelectronic chip 1 comprising a flat substrate 2, for example made of silicon, is provided with at least one microelectronic component 3.
- the chip 1 comprises at least one recess 8, 9 for example a trench or a non-opening hole, made either on a front face 5, that is to say on the face comprising the microelectronic components 3, or on a rear face 4, substantially parallel to the front face.
- These recesses 8, 9 are intended to ensure a mechanical connection between the chip 1 and the wire element 10, 11 to which the chip 1 will be fixed.
- the shape and the dimensions of the recess 8, 9 are a function of the mechanical and dimensional characteristics of the wire element 10,
- a groove having a concave section for example a square or circular section, truncated V or V may be used.
- a compound fixing for example, a glue
- Fixing by embedding at least one wire element 10, 11 in the recesses 8, 9 of the chip 1 ensures a rigid mechanical connection between the chip and the wire element at the chip.
- An element wire then constitutes a flexible mechanical connection between two chips which are attached thereto.
- the chip has, preferably, within 8, 9 a conductive surface constituting an electrical connection element.
- microelectronic components 3 of the chip 1, electrically connected to the wire element 10, 11, are then able to be electrically powered and / or to communicate with other chips 1 also connected mechanically and electrically to the wired element
- the wire element 10, 11 can be used by the chip 1 as a communication antenna (transmission and / or reception).
- a plurality of microelectronic chips 1 are produced simultaneously on a substrate 2.
- the recesses 8, 9, for example in the form of grooves may be made by chemical etching, for example by means of a KOH solution, or by plasma etching or sawing.
- the choice of the dimensions of the groove 8, 9 is chosen according to the characteristics of the wire element 10, 11 to be integrated in the groove 8, 9 to ensure the best possible mechanical strength.
- the depth and the width of the groove can typically vary between 20 ⁇ m and 100 ⁇ m for integration in the groove of a wire element of the order of 20 .mu.m to 100 .mu.m in diameter.
- the flanks of the grooves can be thinned so as to give them flexibility allowing the wire element to fit into force. Thinning is achieved by for example, by means of two notches formed on either side of the recess and illustrated in FIG. 15 in another embodiment.
- the depth of the groove 8, 9 can be - either less than or equal to the diameter of the wire element so as to leave it flush with the surface, is greater than or equal to obtain greater flank flexibility for embedding .
- the grooves 8, 9 are formed on the front face 5, they are formed within the microelectronic components 3 or in the vicinity ( Figure 7). In the latter case, the recesses 8, 9 are electrically connected to the microelectronic component 3 of the chip to ensure the electrical communication of the chip 1 with the outside.
- the electrical connection between the microelectronic component 3 and a recess 8, 9 is carried out in a conventional manner by any appropriate means, for example by producing a metal track by inkjet, screen printing or use of a conductive adhesive.
- the wire element 10, 11 must provide electrical communication with the chip 1 microelectronics, any contact conductive material of the wire element 10, 11 with undesired areas of the microelectronic chip 1 should be avoided.
- the latter may advantageously be coated with an insulating material 40 (FIG. 7).
- the wire element 10, 11 is of conductive material and does not comprise a coating with an insulating material
- electrical insulation of the bottom of the recess 8, 9 can be made in a known manner.
- layer of insulating material 40 encapsulating the wire element 10, 11 is made of thermosetting polymer, a hot insertion is then preferentially chosen to facilitate the embedding and bonding of the wire element 10, 11 inside the groove 8, 9 and therefore its insertion within, for example, a fabric.
- the coating of the wire element 10, 11 is partially eliminated after insertion of the wire element into the corresponding groove, in order to allow an electrical connection between the wire element and the microelectronic component 3 of the chip 1.
- the removal of the layer of insulating material 40 is carried out by any known means, for example, by scraping with a blade or by hot creep during or after embedding.
- the connection with the component 3 is then made by forming a metal track 44 covering the stripped portion of the wire element and connecting it to a connection pad (not shown) of the component 3.
- a track can conventionally be obtained by inkjet, screen printing or depositing a conductive glue.
- the integration of the grooves 8, 9 is carried out in the rear face 4.
- the surface of the front face 5, called the "active" face is preserved and greater integration density can then be obtained by distributing on the main faces 4, 5 the different features of the chip 1.
- the wire element 10, 11 disposed in a recess 8, 9 located on the rear face 4 is advantageously made of conductive material and preferably without encapsulation in insulating material.
- An electrical contact is made within the microelectronic chip 1 to allow the connection of the wire element 10, 11 of conductive material located on the rear face 4 and the microelectronic component 3 located on the front face 5.
- the recess 8, 9 forms a housing for a wire element which simultaneously constitutes an electrical connection between the chip and the outside while providing a flexible mechanical support for the chip 1.
- a layer of an insulating material 41 is first deposited on the substrate, then structured to electrically isolate from the substrate 2 at least the recesses 8, 9 and future conductor connecting tracks to the component 3.
- the insulating material 41 is, for example, silicon nitride or silicon oxide whose thickness is typically of the order of 100 to 500 nm.
- a conductive material 42 is deposited on the layer 41 to provide an electrical connection between the microelectronic component and the inside of the groove.
- the conductive material 42 is, for example, constituted by a stack of 30 nm of titanium coated with 300 nm of copper. Classically, this conductive material is also structured in order to avoid any short circuit.
- the wire elements 10, 11 can then be inserted into the recesses 8, 9 in order to integrate the microelectronic chip 1 for example within a fabric.
- a reinforcing metal 43 may be deposited, for example by electrolysis after insertion of the wire elements 10, 11.
- the reinforcing metal 43 is preferably constituted by a layer of nickel or copper, the thickness of which is typically between 2 and 30 ⁇ m. This step not only improves the connection between components 3 of the front face 5 and the wire elements 10, 11 of the rear face 4 but also to lock or weld the wire element 10, 11 in its housing.
- FIGS. 11 to 13 Another method of producing a chip in which the grooves are formed at the rear face is illustrated in FIGS. 11 to 13.
- a cavity advantageously a hole, is etched in the microelectronic chip 1, starting from the front face 5, and sinks into the substrate.
- the depth of the hole is preferably between 100 and 200 microns.
- the hole has a typical diameter of the order of 100 microns and may advantageously be terminated by a pointed shape.
- the hole thus produced is then coated, by any suitable technique, with an insulating material 41, for example a silicon oxide PECVD, the thickness of which is, for example, between 100 and 300 nm.
- a conductive material 42 preferably hard, for example, nickel or tungsten, fills the cavity thus covered.
- the conductive material 42 thus formed is connected to the microelectronic component 3.
- a recess 8 for example a groove, from the rear face 4 is then etched opposite the hole.
- the groove 8 is advantageously wider than the hole.
- the depth of the groove 8 is advantageously defined so that the conductive material 42 coming from the front face protrudes at the bottom of the groove 8, preferably from a height of the order of 10 to 20 ⁇ m and forms so a tip.
- the groove 8 is made by any suitable technique, for example by selective etching of the dielectric material of the substrate 2 with respect to the insulating material 41.
- the layer of insulating material 41, projecting into the bottom of the groove 8, is then removed by any known method, for example by plasma etching or by wet etching.
- a wire element 10 for example made of conductive material, advantageously coated with a layer of insulating material 40, is then inserted into the groove 8 in order to integrate the microelectronic chip 1 into a structure flexible.
- the insulating film 40 coating the conductive material may be, for example, a varnish or a thermoplastic polymer.
- the protruding portion of the conductive material 42 in the form of a point, coming from the front face 5, perforates the insulating film 40 encapsulating the wire element 10 and thus makes the contact of the latter with the microelectronic component 3.
- the wire is preferably inserted hot to facilitate the indentation of the conductive material tip 42 in the wire element and stick it to the wire element. inside the groove 8.
- the recess is a non-through hole 8 made on one of the main faces 4, 5 so as to embed a wire element 10 therein.
- the axis of the wire element 10 is perpendicular to the main faces 4, 5 of the microelectronic chip 1 when embedding the chip in the flexible structure as a fabric.
- At least one through recess 8, 9 ' is made in a microelectronic chip 1, preferably at the periphery of the chip.
- This hole 8, 9 ' can be obtained by any known means, for example, by plasma etching or by laser.
- the hollow portion of the chip 1 may be example of square shape, V-shaped or C or then present (hole 9 ') a structure to mechanically lock ("grip wire") a wired element 10.
- the inner walls of the hole 9' are not smooth but present sharp tips, for example the lateral faces of the grooves comprise claws, intended to cut the insulating sheath of the wire element during the introduction thereof into the hole 9 'and to maintain the wire element.
- the recess 9 has in proximity two notches located on either side of the recess so as to give it the flexibility necessary to withstand the stresses during the insertion of the recess. wired element 10 and / or variations in thermal expansion between the wire element 10 and the chip 1.
- the electrical insulation of the inside of the holes 8, 9 is made, for example by deposition by PECVD, of an insulating material 41, for example silicon oxide or silicon nitride, with a typical thickness of the order of 1 to 3 ⁇ m.
- the layer of insulating material 41 is then structured, in a manner known to allow access to contact pads connected to the component 3 of the microelectronic chip 1.
- a conductive material 42 is then performed, for example 30 nm of titanium topped with 300 nm of copper or a titanium / nickel bilayer.
- the conductive material 42 is then structured so that the inner surface of the holes is electrically connected to the component 3.
- electrolytic deposition of a reinforcing metal 43 may advantageously be carried out.
- the reinforcing metal will then cover the wire element 10 and the areas of contact with the chip and thus ensure better mechanical strength.
- the thickness of the metal layer 43 is typically in the range 1-30 ⁇ m, for example of the order of 5 ⁇ m. Compared to other techniques, electrolysis has the advantage of being cold-formed and not subsequently constituting a thermal limitation.
- At least two chips 1 may be integrated on at least one wire element 10 so as to form a microstructure or an assembly.
- This assembly comprises chips each fixed to the wire element 10, the chips 1 being connected together by the wire element which constitutes a flexible mechanical support.
- the recesses 8, 9 provide in this assembly, the mechanical maintenance of the microelectronic chip 1, on the wire elements that serve for its electrical communication with the outside and its power supply.
- the assembly may comprise a plurality of chips 1 organized in the form of a matrix, wire elements 10, 11 ensuring, according to the two main directions of the matrix, the flexible mechanical connection of the various chips and, advantageously, the electrical connection lice or fleas.
- the chips 1 within the assembly can be powered and / or communicate with each other or with the outside by means of, for example, at least one wire element made of conductive material or use optical communication or electromagnetic waves.
- the latter can be at least partially encapsulated by any suitable technique, to protect it from attacks of the external environment and / or to ensure superior mechanical strength. It may, for example, be encapsulated, for example, within a sheath that can be wound and / or unrolled.
- microelectronic chips in particular according to FIGS. 1 and 2, can be integrated into a textile by holding between the same two wires adjacent conductors, so as to constitute a train of chips where each one of them is associated with a particular function (source of energy, energy recovery, digital data processing ...) -
- the power supply can be realized by the intermediate of a metallized chip on its large faces connected to an external generator for example by a clamp system and in contact with the textile supply son.
- the chips can also, in this case, provide the same function (for example pressure sensor or temperature).
- a thermoelectric power supply is also possible.
- Microelectronic chips according to Figure 5 can be used for making a scintillating fabric.
- one of the elementary chips is a micro-battery
- the other elementary chip is a charge control device for this battery and a device that lights a diode as soon as an energy threshold is reached.
- piezoelectric fibers provide energy recovery during movements of the fabric so as to recharge the battery.
- the microelectronic chips are inserted during weaving, and the fabric starts to flicker when it has sufficient movements.
- a thermoelectric power supply is also possible.
- the chip may, for example, be a radio frequency identification device (RFID) and the wires then constitute both antennas and the power supply.
- RFID radio frequency identification device
- These chips can, for example, be used for inventory management.
- Microelectronic chips according to the invention can in particular be used to produce a screen fabric.
- one of the chips elementary is composed of a sapphire substrate on which is implanted a small matrix of multicolored diodes (eg 16 by 16).
- the other elementary chip contains storage and multiplexing logic that retrieves the pixels to be displayed through a serial link.
- a holographic film is placed on the fabric so as to diffuse the light produced by the tissue.
- the microelectronic component of the chips according to the invention can also be an actuator (for example an explosive gas generator or not).
- an actuator for example an explosive gas generator or not.
- the addressing of such chips when they are mounted in chains is performed by one of the conductive threads of the textile. It is thus possible, for example, to maintain at constant pressure an inflatable object (tire, balloon, boat).
- the actuation may also consist of micro actuators.
- the invention can be used for this purpose by vertically assembling chips to form compact blocks but where can be arranged inter-chip spaces (thanks to the wire elements that keep the chips spaced) to improve their cooling during operation.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Theoretical Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Textile Engineering (AREA)
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- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Dicing (AREA)
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- Pressure Sensors (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/310,246 US8093617B2 (en) | 2006-08-29 | 2007-06-21 | Bare microelectronic chip provided with a recess forming a housing for a wire element constituting a flexible mechanical support, fabrication process and microstructure |
ES07803768.6T ES2539640T3 (es) | 2006-08-29 | 2007-06-21 | Chip microelectrónico desnudo provisto de una ranura que forma un alojamiento para un elemento filar que constituye un soporte mecánico flexible, procedimiento de fabricación y microestructura |
CN2007800383632A CN101523605B (zh) | 2006-08-29 | 2007-06-21 | 设置有形成构成柔性机械支撑的布线元件的壳体的凹形的裸微电子芯片、制造工艺和微结构 |
JP2009526145A JP5059110B2 (ja) | 2006-08-29 | 2007-06-21 | 柔軟性機械的サポートを構成するワイヤ要素用ハウジングを形成する凹部を具備するベアマイクロエレクトロニクスチップ、製造プロセスおよび微細構造 |
EP07803768.6A EP2057687B1 (fr) | 2006-08-29 | 2007-06-21 | Puce microelectronique nue munie d'une rainure formant un logement pour un element filaire constituant un support mecanique souple, procede de fabrication et microstructure |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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FR0607588 | 2006-08-29 | ||
FR0607588A FR2905518B1 (fr) | 2006-08-29 | 2006-08-29 | Puce microelectronique a faces laterales munies de rainures et procede de fabrication |
Publications (1)
Publication Number | Publication Date |
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WO2008025889A1 true WO2008025889A1 (fr) | 2008-03-06 |
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Application Number | Title | Priority Date | Filing Date |
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PCT/FR2007/001034 WO2008025889A1 (fr) | 2006-08-29 | 2007-06-21 | Puce microelectronique nue munie d'un evidement formant un logement pour un element filaire constituant un support mecanique souple, procede de fabrication et microstructure |
Country Status (7)
Country | Link |
---|---|
US (1) | US8093617B2 (fr) |
EP (1) | EP2057687B1 (fr) |
JP (1) | JP5059110B2 (fr) |
CN (1) | CN101523605B (fr) |
ES (1) | ES2539640T3 (fr) |
FR (1) | FR2905518B1 (fr) |
WO (1) | WO2008025889A1 (fr) |
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FR3065578B1 (fr) | 2017-04-19 | 2019-05-03 | Primo1D | Procede d'assemblage d'une puce microelectronique sur un element filaire |
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CN107148188B (zh) * | 2017-06-16 | 2020-08-07 | Oppo广东移动通信有限公司 | 壳体组件的制备方法、壳体组件和移动终端 |
WO2018228031A1 (fr) * | 2017-06-16 | 2018-12-20 | Guangdong Oppo Mobile Telecommunications Corp., Ltd. | Boîtier, procédé de fabrication associé, et terminal mobile |
FR3076071B1 (fr) | 2017-12-21 | 2019-11-15 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de fabrication d’une puce a circuit integre et puce a circuit integre |
FR3078980B1 (fr) | 2018-03-14 | 2021-06-11 | Primo1D | Fil guipe compose d’une ame principale et d’au moins un fils de couverture et comprenant au moins un element filaire conducteur relie electriquement a au moins une puce electronique |
US11913143B2 (en) * | 2019-03-08 | 2024-02-27 | Apple Inc. | Fabric with electrical components |
FR3103630B1 (fr) | 2019-11-22 | 2022-06-03 | Primo1D | Puce fonctionnelle adaptee pour etre assemblee a des elements filaires, et procede de fabrication d’une telle puce |
US20230008099A1 (en) * | 2021-07-12 | 2023-01-12 | Apple Inc. | Fabric Seam with Electrical Components |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003086762A (ja) * | 2001-07-04 | 2003-03-20 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
US20030082851A1 (en) * | 2001-10-31 | 2003-05-01 | Van Hoff Jay F. | Back-side through-hole interconnection of a die to a substrate |
JP2003163313A (ja) * | 2001-09-13 | 2003-06-06 | Texas Instr Japan Ltd | 半導体装置及びその製造方法 |
US6646336B1 (en) * | 2002-06-28 | 2003-11-11 | Koninkl Philips Electronics Nv | Wearable silicon chip |
US20030211797A1 (en) * | 2002-05-10 | 2003-11-13 | Hill Ian Gregory | Plural layer woven electronic textile, article and method |
US20050277307A1 (en) * | 2004-06-14 | 2005-12-15 | Motorola, Inc. | Method and apparatus for solder-less attachment of an electronic device to a textile circuit |
US20060175697A1 (en) * | 2005-02-02 | 2006-08-10 | Tetsuya Kurosawa | Semiconductor device having semiconductor chips stacked and mounted thereon and manufacturing method thereof |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3211604B2 (ja) * | 1995-02-03 | 2001-09-25 | 株式会社日立製作所 | 半導体装置 |
JPH10214919A (ja) * | 1997-01-29 | 1998-08-11 | New Japan Radio Co Ltd | マルチチップモジュールの製造方法 |
JP2002343933A (ja) * | 2001-05-18 | 2002-11-29 | Mitsubishi Electric Corp | 半導体記憶装置 |
US7485489B2 (en) * | 2002-06-19 | 2009-02-03 | Bjoersell Sten | Electronics circuit manufacture |
JP2004288680A (ja) * | 2003-03-19 | 2004-10-14 | Mitsubishi Electric Corp | 圧接型半導体装置 |
US7716823B2 (en) * | 2004-04-08 | 2010-05-18 | Hewlett-Packard Development Company, L.P. | Bonding an interconnect to a circuit device and related devices |
US20060278997A1 (en) * | 2004-12-01 | 2006-12-14 | Tessera, Inc. | Soldered assemblies and methods of making the same |
US20080029879A1 (en) * | 2006-03-01 | 2008-02-07 | Tessera, Inc. | Structure and method of making lidded chips |
-
2006
- 2006-08-29 FR FR0607588A patent/FR2905518B1/fr not_active Expired - Fee Related
-
2007
- 2007-06-21 JP JP2009526145A patent/JP5059110B2/ja active Active
- 2007-06-21 WO PCT/FR2007/001034 patent/WO2008025889A1/fr active Application Filing
- 2007-06-21 US US12/310,246 patent/US8093617B2/en active Active
- 2007-06-21 ES ES07803768.6T patent/ES2539640T3/es active Active
- 2007-06-21 CN CN2007800383632A patent/CN101523605B/zh active Active
- 2007-06-21 EP EP07803768.6A patent/EP2057687B1/fr active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003086762A (ja) * | 2001-07-04 | 2003-03-20 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
JP2003163313A (ja) * | 2001-09-13 | 2003-06-06 | Texas Instr Japan Ltd | 半導体装置及びその製造方法 |
US20030082851A1 (en) * | 2001-10-31 | 2003-05-01 | Van Hoff Jay F. | Back-side through-hole interconnection of a die to a substrate |
US20030211797A1 (en) * | 2002-05-10 | 2003-11-13 | Hill Ian Gregory | Plural layer woven electronic textile, article and method |
US6646336B1 (en) * | 2002-06-28 | 2003-11-11 | Koninkl Philips Electronics Nv | Wearable silicon chip |
US20050277307A1 (en) * | 2004-06-14 | 2005-12-15 | Motorola, Inc. | Method and apparatus for solder-less attachment of an electronic device to a textile circuit |
US20060175697A1 (en) * | 2005-02-02 | 2006-08-10 | Tetsuya Kurosawa | Semiconductor device having semiconductor chips stacked and mounted thereon and manufacturing method thereof |
Cited By (27)
Publication number | Priority date | Publication date | Assignee | Title |
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US8012795B2 (en) | 2008-03-06 | 2011-09-06 | Commissariat à l'Energie Atomique | Method and device for fabricating an assembly of at least two microelectronic chips |
US8723312B2 (en) | 2008-03-06 | 2014-05-13 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Assembly of a wire element with a microelectronic chip with a groove comprising at least one bump securing the wire element |
WO2009112644A1 (fr) * | 2008-03-06 | 2009-09-17 | Commissariat A L'energie Atomique | Assemblage d'un élément filaire avec une puce microélectronique à rainure comportant au moins un plot de maintien de l'élément filaire |
FR2937464A1 (fr) * | 2008-10-21 | 2010-04-23 | Commissariat Energie Atomique | Assemblage d'une puce microelectronique a rainure avec un element filaire sous forme de toron et procede d'assemblage |
WO2010046563A1 (fr) * | 2008-10-21 | 2010-04-29 | Commissariat à l'Energie Atomique | Assemblage d'une puce microélectronique à rainure avec un élément filaire sous forme de toron et procédé d'assemblage |
US8611101B2 (en) | 2008-10-21 | 2013-12-17 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Assembly of a microelectronic chip having a groove with a wire element in the form of a strand, and method for assembly |
JP2012506631A (ja) * | 2008-10-21 | 2012-03-15 | コミサリア ア レネルジー アトミック エ オ ゼネルジー アルテルナティブ | 溝を有する超小型電子チップとストランドの形をしたワイヤ要素との組立体及び組立方法 |
WO2010125320A1 (fr) | 2009-04-30 | 2010-11-04 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procédé de fixation d'un composant électronique sur un produit |
JP2012525619A (ja) * | 2009-04-30 | 2012-10-22 | コミサリア ア エナジー アトミック エ オックス エナジーズ オルタネティヴ | 電子部品を製品に取り付ける方法 |
JP2011135083A (ja) * | 2009-12-23 | 2011-07-07 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | 少なくとも1つのチップとワイヤ要素をアセンブルする方法、変形する接続要素を有する電子チップ、複数のチップを製造する方法、及び、少なくとも1つのチップとワイヤ要素のアセンブリ |
EP2339618A3 (fr) * | 2009-12-23 | 2012-10-17 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Procédé d'assemblage d'au moins une puce avec un élément filaire, puce électronique à élément de liaison déformable, procédé de fabrication d'une pluralité de puces, et assemblage d'au moins une puce avec un élément filaire |
EP2339618A2 (fr) | 2009-12-23 | 2011-06-29 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Procédé d'assemblage d'au moins une puce avec un élément filaire, puce électronique à élément de liaison déformable, procédé de fabrication d'une pluralité de puces, et assemblage d'au moins une puce avec un élément filaire |
US8654540B2 (en) | 2009-12-23 | 2014-02-18 | Commisariat A L'energie Atomique Et Aux Energies Alternatives | Method for assembling at least one chip with a wire element, electronic chip with a deformable link element, fabrication method of a plurality of chips, and assembly of at least one chip with a wire element |
FR2954588A1 (fr) * | 2009-12-23 | 2011-06-24 | Commissariat Energie Atomique | Procede d'assemblage d'au moins une puce avec un element filaire, puce electronique a element de liaison deformable, procede de fabrication d'une pluralite de puces, et assemblage d'au moins une puce avec un element filaire |
FR2955972A1 (fr) * | 2010-02-03 | 2011-08-05 | Commissariat Energie Atomique | Procede d'assemblage d'au moins une puce avec un tissu incluant un dispositif a puce |
US9093289B2 (en) | 2010-02-03 | 2015-07-28 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Method for assembling at least one chip using a fabric, and fabric including a chip device |
WO2011095708A1 (fr) | 2010-02-03 | 2011-08-11 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede d'assemblage d'au moins une puce avec un tissu et tissu incluant un dispositif a puce |
US10264682B2 (en) | 2011-07-28 | 2019-04-16 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Method for assembling a microelectronic chip device in a fabric, chip device, and fabric incorporating a crimped chip device |
WO2013013843A1 (fr) | 2011-07-28 | 2013-01-31 | Commissariat à l'Energie Atomique et aux Energies Alternatives | Procede d'assemblage d'un dispositif a puce micro - electronique dans un tissu, dispositif a puce, et tissu incorporant un dispositif a puce serti |
WO2018134547A1 (fr) | 2017-01-23 | 2018-07-26 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de fabrication d'un dispositif electronique et dispositif electronique |
WO2020007960A1 (fr) | 2018-07-04 | 2020-01-09 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Dispositif electronique et son procede de realisation |
FR3083643A1 (fr) | 2018-07-04 | 2020-01-10 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de realisation d'un dispositif electronique |
US11861440B2 (en) | 2019-09-18 | 2024-01-02 | Sensormatic Electronics, LLC | Systems and methods for providing tags adapted to be incorporated with or in items |
US11928538B2 (en) | 2019-09-18 | 2024-03-12 | Sensormatic Electronics, LLC | Systems and methods for laser tuning and attaching RFID tags to products |
US11769026B2 (en) | 2019-11-27 | 2023-09-26 | Sensormatic Electronics, LLC | Flexible water-resistant sensor tag |
US11755874B2 (en) | 2021-03-03 | 2023-09-12 | Sensormatic Electronics, LLC | Methods and systems for heat applied sensor tag |
US11869324B2 (en) | 2021-12-23 | 2024-01-09 | Sensormatic Electronics, LLC | Securing a security tag into an article |
Also Published As
Publication number | Publication date |
---|---|
ES2539640T3 (es) | 2015-07-02 |
FR2905518A1 (fr) | 2008-03-07 |
JP5059110B2 (ja) | 2012-10-24 |
CN101523605A (zh) | 2009-09-02 |
US8093617B2 (en) | 2012-01-10 |
US20090200066A1 (en) | 2009-08-13 |
CN101523605B (zh) | 2012-07-11 |
EP2057687A1 (fr) | 2009-05-13 |
EP2057687B1 (fr) | 2015-04-22 |
FR2905518B1 (fr) | 2008-12-26 |
JP2010502030A (ja) | 2010-01-21 |
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