WO2006138441A3 - Dispositifs d'acceleration et procedes d'utilisation correspondants - Google Patents
Dispositifs d'acceleration et procedes d'utilisation correspondants Download PDFInfo
- Publication number
- WO2006138441A3 WO2006138441A3 PCT/US2006/023277 US2006023277W WO2006138441A3 WO 2006138441 A3 WO2006138441 A3 WO 2006138441A3 US 2006023277 W US2006023277 W US 2006023277W WO 2006138441 A3 WO2006138441 A3 WO 2006138441A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- boost device
- methods
- flame
- plasma
- provide additional
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/30—Plasma torches using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
- B23K20/106—Features related to sonotrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/72—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flame burners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7206—Mass spectrometers interfaced to gas chromatograph
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/724—Nebulising, aerosol formation or ionisation
- G01N30/7246—Nebulising, aerosol formation or ionisation by pneumatic means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/7273—Desolvation chambers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Plasma Technology (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200680021600XA CN101198846B (zh) | 2005-06-17 | 2006-06-15 | 原子化装置 |
JP2008517097A JP2008544454A (ja) | 2005-06-17 | 2006-06-15 | 増強装置及びその使用方法 |
AU2006259381A AU2006259381B2 (en) | 2005-06-17 | 2006-06-15 | Boost devices and methods of using them |
CA2608528A CA2608528C (fr) | 2005-06-17 | 2006-06-15 | Dispositifs d'acceleration et procedes d'utilisation correspondants |
EP06784915A EP1891407A4 (fr) | 2005-06-17 | 2006-06-15 | Dispositifs d'acceleration et procedes d'utilisation correspondants |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/156,249 | 2005-06-17 | ||
US11/156,249 US8622735B2 (en) | 2005-06-17 | 2005-06-17 | Boost devices and methods of using them |
US11/156,274 | 2005-06-17 | ||
US11/156,274 US7742167B2 (en) | 2005-06-17 | 2005-06-17 | Optical emission device with boost device |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006138441A2 WO2006138441A2 (fr) | 2006-12-28 |
WO2006138441A3 true WO2006138441A3 (fr) | 2007-11-08 |
Family
ID=37571144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2006/023277 WO2006138441A2 (fr) | 2005-06-17 | 2006-06-15 | Dispositifs d'acceleration et procedes d'utilisation correspondants |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1891407A4 (fr) |
JP (1) | JP2008544454A (fr) |
CN (1) | CN102291921B (fr) |
AU (1) | AU2006259381B2 (fr) |
CA (1) | CA2608528C (fr) |
WO (1) | WO2006138441A2 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7511246B2 (en) | 2002-12-12 | 2009-03-31 | Perkinelmer Las Inc. | Induction device for generating a plasma |
US7742167B2 (en) | 2005-06-17 | 2010-06-22 | Perkinelmer Health Sciences, Inc. | Optical emission device with boost device |
US8622735B2 (en) | 2005-06-17 | 2014-01-07 | Perkinelmer Health Sciences, Inc. | Boost devices and methods of using them |
DE102009004410B4 (de) * | 2009-01-13 | 2011-06-01 | Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. | Vorrichtung und Verfahren von in einer Elektrolytlösung enthaltenen Analytsubstanzen |
CN102843851B (zh) * | 2012-05-04 | 2015-01-28 | 上海华力微电子有限公司 | 一种等离子发生装置及方法 |
US9259798B2 (en) | 2012-07-13 | 2016-02-16 | Perkinelmer Health Sciences, Inc. | Torches and methods of using them |
WO2014184947A1 (fr) * | 2013-05-17 | 2014-11-20 | 株式会社島津製作所 | Détecteur à capture d'électrons |
US10475626B2 (en) | 2015-03-17 | 2019-11-12 | Applied Materials, Inc. | Ion-ion plasma atomic layer etch process and reactor |
WO2018175569A1 (fr) * | 2017-03-21 | 2018-09-27 | Nordson Corporation | Ensemble lumière retrofit et pistolet de pulvérisation de poudre à lumière intégrée ou retrofit |
CN109443406B (zh) * | 2018-10-19 | 2021-04-09 | 中国科学院深圳先进技术研究院 | 声学流体传感器 |
CN112782174A (zh) * | 2020-12-25 | 2021-05-11 | 西南化工研究设计院有限公司 | 一种高频无极氩放电离子化检测器及气体中硫、磷化合物的分析方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4300834A (en) * | 1980-05-22 | 1981-11-17 | Baird Corporation | Inductively coupled plasma atomic fluorescence spectrometer |
US4362936A (en) * | 1979-11-26 | 1982-12-07 | Leybold-Heraeus Gmbh | Apparatus for monitoring and/or controlling plasma processes |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3492074A (en) * | 1967-11-24 | 1970-01-27 | Hewlett Packard Co | Atomic absorption spectroscopy system having sample dissociation energy control |
JPS5532317A (en) * | 1978-08-28 | 1980-03-07 | Asahi Chemical Ind | High frequency magnetic field coupling arc plasma reactor |
JPS61161138A (ja) * | 1985-01-09 | 1986-07-21 | Natl Inst For Res In Inorg Mater | プラズマ利用化学反応装置 |
DE3521529A1 (de) * | 1985-06-15 | 1987-01-02 | Harald Dipl Chem Dr Berndt | Vorrichtung zum zerstaeuben von probenfluessigkeit fuer spektroskopische zwecke |
JPS62213056A (ja) * | 1986-03-14 | 1987-09-18 | Yokogawa Electric Corp | 高周波誘導結合プラズマを用いた分析装置 |
JPH0624112B2 (ja) * | 1986-04-16 | 1994-03-30 | 横河電機株式会社 | 高周波誘導結合プラズマ・質量分析計 |
JPS62273047A (ja) * | 1986-05-22 | 1987-11-27 | Natl Inst For Res In Inorg Mater | 燃焼炎複合高周波熱プラズマ発生装置 |
US4955717A (en) * | 1986-12-02 | 1990-09-11 | Geochemical Services, Inc. | Demand modulated atomization apparatus and method for plasma spectroscopy |
JPS63158799A (ja) * | 1986-12-22 | 1988-07-01 | 日本高周波株式会社 | 多段無電極高周波プラズマ反応装置 |
JPH0781953B2 (ja) * | 1990-02-07 | 1995-09-06 | 川崎製鉄株式会社 | 分析試料の原子化方法 |
GB9226335D0 (en) * | 1992-12-17 | 1993-02-10 | Fisons Plc | Inductively coupled plasma spectrometers and radio-frequency power supply therefor |
DE69118264T2 (de) * | 1990-07-24 | 1996-08-29 | Varian Australia | Spektroskopie mittels induktiv angekoppelten Plasmas |
JPH05119006A (ja) * | 1991-10-30 | 1993-05-14 | Mitsubishi Heavy Ind Ltd | 炭化水素濃度測定装置 |
JPH05142200A (ja) * | 1991-11-20 | 1993-06-08 | Sumitomo Electric Ind Ltd | 元素分析法 |
US5217362A (en) * | 1991-12-30 | 1993-06-08 | Thompson Richard E | Method for enhanced atomization of liquids |
JP3116151B2 (ja) * | 1993-03-05 | 2000-12-11 | セイコーインスツルメンツ株式会社 | 加熱気化誘導結合プラズマ質量分析装置 |
CA2144834C (fr) * | 1994-03-17 | 2000-02-08 | Masahiro Miyamoto | Methode et appareil pour generation de plasma induit |
US6639227B1 (en) * | 2000-10-18 | 2003-10-28 | Applied Materials, Inc. | Apparatus and method for charged particle filtering and ion implantation |
CN2482075Y (zh) * | 2001-04-25 | 2002-03-13 | 王澎蛟 | 原子吸收分光光度计 |
US6693253B2 (en) * | 2001-10-05 | 2004-02-17 | Universite De Sherbrooke | Multi-coil induction plasma torch for solid state power supply |
JP2003168594A (ja) * | 2001-11-29 | 2003-06-13 | High Frequency Heattreat Co Ltd | 高周波熱プラズマ装置 |
JP2003168595A (ja) * | 2001-11-29 | 2003-06-13 | High Frequency Heattreat Co Ltd | 高周波熱プラズマ装置 |
US7119330B2 (en) * | 2002-03-08 | 2006-10-10 | Varian Australia Pty Ltd | Plasma mass spectrometer |
US6870124B2 (en) * | 2002-05-08 | 2005-03-22 | Dana Corporation | Plasma-assisted joining |
-
2006
- 2006-06-15 JP JP2008517097A patent/JP2008544454A/ja active Pending
- 2006-06-15 CN CN201110096122.1A patent/CN102291921B/zh not_active Expired - Fee Related
- 2006-06-15 CA CA2608528A patent/CA2608528C/fr not_active Expired - Fee Related
- 2006-06-15 EP EP06784915A patent/EP1891407A4/fr not_active Ceased
- 2006-06-15 AU AU2006259381A patent/AU2006259381B2/en not_active Ceased
- 2006-06-15 WO PCT/US2006/023277 patent/WO2006138441A2/fr active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4362936A (en) * | 1979-11-26 | 1982-12-07 | Leybold-Heraeus Gmbh | Apparatus for monitoring and/or controlling plasma processes |
US4300834A (en) * | 1980-05-22 | 1981-11-17 | Baird Corporation | Inductively coupled plasma atomic fluorescence spectrometer |
Non-Patent Citations (1)
Title |
---|
See also references of EP1891407A4 * |
Also Published As
Publication number | Publication date |
---|---|
CN102291921B (zh) | 2014-09-17 |
EP1891407A2 (fr) | 2008-02-27 |
CN102291921A (zh) | 2011-12-21 |
AU2006259381B2 (en) | 2012-01-19 |
CA2608528C (fr) | 2014-12-23 |
JP2008544454A (ja) | 2008-12-04 |
EP1891407A4 (fr) | 2009-09-23 |
WO2006138441A2 (fr) | 2006-12-28 |
AU2006259381A1 (en) | 2006-12-28 |
CA2608528A1 (fr) | 2006-12-28 |
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