WO2006073077A1 - 赤外発光ダイオード及びその製造方法 - Google Patents
赤外発光ダイオード及びその製造方法 Download PDFInfo
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- WO2006073077A1 WO2006073077A1 PCT/JP2005/023749 JP2005023749W WO2006073077A1 WO 2006073077 A1 WO2006073077 A1 WO 2006073077A1 JP 2005023749 W JP2005023749 W JP 2005023749W WO 2006073077 A1 WO2006073077 A1 WO 2006073077A1
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- WIPO (PCT)
- Prior art keywords
- infrared light
- emitting diode
- type
- light emitting
- active layer
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of group III and group V of the periodic system
Definitions
- the present invention relates to an infrared light emitting diode that can be used for both infrared communication and remote control operation communication, and a method for manufacturing the same.
- LEDs light emitting diodes
- AlGaAs and GaAs LEDs are widely used in fields such as infrared communication and remote control operations.
- LEDs that are used for infrared communication are required to have higher output and higher speed in order to support large-capacity data communication, so double-hetero (DH) structure LEDs are used.
- DH double-hetero
- Patent Document 1 discloses an LED having the above DH structure, in which germanium (Ge) is used as an effective impurity (dopant) to be added to the active layer, and the thickness of the active layer is 0.5 ⁇ L: 5 Lm. By doing so, it is described that LEDs with high output, high reliability and good response can be obtained.
- germanium (Ge) is used as an effective impurity (dopant) to be added to the active layer, and the thickness of the active layer is 0.5 ⁇ L: 5 Lm.
- a homojunction type LED by liquid phase growth of GaAs is used as an LED used for remote control operation.
- the pn junction of this LED is formed using so-called pn inversion, in which silicon (Si) used as a dopant during liquid phase growth converts the p-type force into n-type depending on the growth temperature. Since Si forms deeper impurity levels in GaAs than other dopants, the emission wavelength of GaAs homojunction LEDs is widely distributed on the longer wavelength side than the GaAs absorption edge (870 nm). However, because of the long carrier diffusion distance, the pulse response was slow. For this reason, Tr (rise time) and Tf (fall time) in the pulse response were limited to several / i sec.
- Patent Document 1 Japanese Patent Application Laid-Open No. 8-293622
- the present invention aims to provide an infrared light emitting diode that can be used for both infrared communication and remote control operation communication, and that is capable of high output and high speed response. It has been the target.
- an emission peak wavelength longer than 870 nm can be obtained by setting the active layer thickness to 2 to 6 ⁇ m in an AlGaAs infrared LED. If the effective impurity of the layer is Ge, an emission peak wavelength in the range of 880 to 890 nm, a higher output than a homojunction LED, and a Tr and Tf are short, making a high-speed response LED.
- the present invention has been achieved by obtaining knowledge such as that it is possible to obtain light emission characteristics that can be used for both infrared communication and remote control operation communication.
- the infrared light-emitting diode of the present invention has a p-type Al Ga As (0 x 1-x
- the active layer has a thickness of 2 to 6 ⁇ , and can be used as an infrared light source for both infrared communication and remote control operation communication.
- the infrared light emission wavelength is controlled to a desired wavelength, and as an infrared light source for both infrared communication and remote control operation communication.
- An infrared light-emitting diode that can be used can be provided.
- the effective impurity of the active layer is formed of Ge. According to this configuration, since the effective impurity of the active layer is Ge, it is possible to realize an infrared light emitting diode with high output and high speed response.
- the emission peak wavelength at room temperature of the infrared light emitting diode is preferably 880 to 890 nm. Therefore, the infrared light-emitting diode of the present invention can be used as an infrared light source for both infrared communication and remote control operation communication.
- the infrared light emitting diode manufacturing method described above is formed by epitaxial growth on a p-type cladding layer, a p-type active layer, an n-type cladding layer, and a force GaAs substrate. After the epitaxial growth, It is manufactured by removing the substrate.
- an infrared light emitting diode having an emission peak wavelength of 880 to 890 nm and capable of high output and high speed response for both infrared communication and remote control operation communication is suitable for mass production. It can be manufactured at low cost.
- an infrared light emitting diode that can be used for both infrared communication and remote control operation communication, and that can provide high output and high speed response.
- devices with infrared communication and remote control operation communication functions required the use of two types of infrared light emitting diodes with different wavelengths, but in the present invention, one infrared light emitting diode is used. It is no longer necessary to use two types of infrared light emitting diodes.
- an infrared light emitting diode that can be used for both infrared communication and remote control operation communication and has a high output and a high speed response is low in mass productivity. Can be manufactured at cost.
- FIG. 1 is a schematic cross-sectional view showing the structure of an infrared light emitting diode of the present invention.
- FIG. 2 is a schematic cross-sectional view of a boat used for the epitaxial growth of the infrared light emitting diode of the present invention.
- FIG. 3 is a graph showing the peak emission wavelength and the emission output at the peak emission wavelength when the active layer thickness d is changed in the infrared light emitting diode of the example.
- FIG. 4 is a graph showing the rise time Tr and fall time Tf of light emission when the active layer thickness d is changed in the infrared light emitting diode of the example.
- FIG. 1 is a schematic cross-sectional view showing the structure of an infrared light emitting diode of the present invention.
- the infrared light emitting diode 1 of the present invention has a DH structure (double heterostructure) consisting of a p-type cladding layer 2, an active layer 3, and an n-type cladding layer 4, and the p-type cladding layer 2 and A p-layer electrode 5 and an n-layer electrode 6 are formed on the n-type cladding layer 4, respectively.
- the shapes of the electrodes 5 and 6 formed on the upper and lower surfaces of the infrared light emitting diode 1 can be arbitrarily selected.
- the infrared light-emitting diode 1 may be reverse to FIG. 1, that is, in order from the top, a p-layer electrode 5, a p-type cladding layer 2, an active layer 3, an n-type cladding layer 4, and an n-layer electrode 6. .
- the p-type cladding layer 2 is p-type Al Ga As (where x is a mixed crystal composition, 0.15 ⁇ x ⁇ 0.
- the p-type cladding layer 2 is the p-type A1 It may have a two-layer structure in which a p-type GaAs layer is further formed on the Ga As layer. For example 1—
- the p-type GaAs layer is a high impurity density layer
- the p-layer electrode 5 can be easily formed, the series resistance can be reduced, and the response performance can be improved.
- the n-type cladding layer 4 is an n-type Al Ga As (where z is a mixed crystal composition, 0.15 ⁇ z ⁇ 0.
- the n-type cladding layer 4 may have a two-layer structure in which an n-type GaAs layer is further formed on the n-type A1 Ga As layer. Illustration
- the n-type GaAs layer is a high impurity density layer
- the n-layer electrode 6 can be easily formed, the series resistance can be reduced, and the response performance can be improved.
- the p-type and n- type cladding layers 2 and 4 are required to have both the confinement effect of electrons and holes as carriers and the confinement effect of light with respect to the active layer 3. , Al Ga above
- x and z which are Al compositions of the As and Al Ga As layers, be 0.15 or more.
- the upper limit of the Al composition X, z may be high in principle for confining carriers and light.
- the A1 composition increases, the problem of corrosion deterioration of the infrared light emitting diode due to energization occurs, and the forward voltage increases due to ohmic cross, which is not preferable. For this reason, it is desirable that the A1 composition is 0.15 ⁇ x, z ⁇ 0.45.
- the active layer 3 is a layer inserted between the p-type and n-type clad layers 2 and 4 and serves as a light emitting layer.
- the active layer 3 is a layer containing p-type Al Ga As (0 ⁇ y ⁇ 0.01), that is, Ga i
- composition y of A1 is 0.01 or more, it is not preferable because long-wavelength infrared light is emitted.
- the conductivity type of the active layer 3 is preferably p-type in terms of light emission efficiency.
- Ge is preferable as an effective impurity of the p-type active layer 3.
- the impurity density of the p-type active layer 3 may be approximately l ⁇ 10 18 cm 3 or more.
- an effective impurity refers to an impurity that effectively dominates. For example, a small amount of Zn (zinc) or Mg (magnesium) lower than the impurity density of Ge in the p-type active layer 3 may be added.
- the infrared light emitting diode at room temperature is formed.
- the emission peak wavelength can be 880 to 890 nm. If the thickness of the active layer 3 is 2 ⁇ m or less, the emission wavelength shifts to a shorter wavelength side than 880 nm, which is not preferable. On the other hand, even if the thickness of the active layer 3 is set to 6 ⁇ ⁇ ⁇ or more, the shift amount of the emission wavelength toward the longer wavelength side is saturated and the emission output is also reduced, which is preferable.
- the emission wavelength of the LED changes depending on the temperature of the light emitting part, that is, the pn junction. That is, the emission peak wavelength moves to the long wavelength side.
- the peak emission wavelength of the infrared light-emitting diode of the present invention is defined by the measured value when the DC forward current force is 3 ⁇ 40 mA at room temperature.
- the emission peak wavelength can be set to 880 to 890 nm, it is used as a high output infrared light source for both infrared communication and remote control operation communication.
- the pulse response at the time of light emission is high-speed, it can cope with not only low-speed remote control operation communication but also high-speed infrared communication.
- the infrared light emitting diode 1 of the present invention can be manufactured as follows. First, on the GaAs substrate, a p-type cladding layer 2, an active layer 3, and an n-type cladding layer 4 are epitaxially grown in this order to obtain a DH structure. The order of growth may be the order of the n-type cladding layer 4, the active layer 3, and the p-type cladding layer 2 in the reverse order. As will be described later, the GaAs substrate to be used may be p-type, n-type, semi-insulating, or undoped when removed after epitaxial growth. If the GaAs substrate is not removed, a P-type or n-type GaAs substrate corresponding to the conductivity type of the cladding layer to be grown first may be used.
- the GaAs substrate is removed from the GaAs substrate on which the DH structure is formed to obtain a DH structure.
- electrodes 5 and 6 are formed on the p-type cladding layer 2 and the n-type cladding layer 4 having a DH structure, respectively, and divided into chips having a predetermined area. Thereafter, the chip surface may be roughened to increase the light extraction efficiency.
- the lower surface electrode of the chip is fixed to one of the lead frames, It is possible to manufacture a bullet-type infrared light-emitting diode by connecting the other electrode to the top electrode by wire bonding using gold wire or Al wire, and epoxy-coating the top of the lead frame on which the chip is mounted. it can.
- a liquid phase growth method for the epitaxial growth, a liquid phase growth method, a MOCVD method, or the like can be used.
- a slow cooling method or a temperature difference method can be used. It is preferable to remove the GaAs substrate to improve the light extraction efficiency.
- the film thickness of the DH structure itself is preferably set to 100 111 to 200 111 so as not to be damaged in a subsequent process such as electrode formation.
- a liquid phase growth method is preferred, in which a thick growth layer and high-quality crystals can be easily obtained, mass production is possible, and the cost is low.
- FIG. 2 is a schematic cross-sectional view of a boat used for the epitaxial growth of the infrared light emitting diode of the present invention.
- the boat 10 used for the epitaxial growth of infrared light-emitting diodes is composed of three parts: a crucible 11, a base 12, and a partition 13. Carbon can be used as a material for these parts.
- the crucible 11 consists of at least three tanks. This is because three solution tanks having different compositions and dopants are required for the epitaxial growth of the p-type cladding layer 2, the active layer 3, and the n-type cladding layer 4.
- Each tank of the crucible 11 is filled with a Ga raw material, an A1 raw material, a GaAs raw material, and a dopant so as to have a predetermined composition of each layer of the DH structure.
- the growth raw material of each layer filled in each tank becomes a raw material solution.
- a GaAs substrate 14 is housed in the base 12.
- the boat 10 filled with the raw material in the crucible 11 is accommodated in a quartz tube in an electric furnace, and after purging with nitrogen gas or evacuating, hydrogen gas is flowed, and the temperature is raised to the growth temperature by the electric furnace. And held for a predetermined time.
- the boat 10 is gradually cooled under the control of the electric furnace, and the crucible 11 is moved to introduce the raw material solution into the base 12 in which the GaAs substrate 14 is accommodated. And given Epitaxial growth is performed according to temperature, time, and slow cooling rate, and the partition 13 is operated to separate the grown raw material solution from the GaAs substrate. By repeating this process, each layer 2, 3, 4 of the DH structure can be grown.
- the segregation coefficient of AlAs is larger than that of GaAs, when thick layers of cladding layers 2 and 4 are grown, the AlAs component in Ga decreases, and the A1 composition in cladding layers 2 and 4 x, z Is tilted.
- the thickness of the active layer 3 is very thin compared to the thickness of the cladding layers 2 and 4, so that the variation of the A1 composition y hardly occurs.
- an infrared light emitting diode of the present invention by setting the emission peak wavelength to 880 to 890 nm, high output and high speed response for both infrared communication and remote control operation communication are possible. Infrared light emitting diodes that can be manufactured can be manufactured at a low cost in accordance with mass productivity.
- a slow cooling method was used as a liquid phase growth method, and a DH structure comprising a p-type cladding layer 2, a p-type active layer 3, and an n-type cladding layer 4 was epitaxially grown on a GaAs substrate.
- the thickness of the p-type cladding layer 2 and the n-type cladding layer 4 is fixed to about 100 ⁇ m and about 60 ⁇ m, respectively, and the thickness of the AlGa As layer that becomes the p-type active layer 3 is fixed.
- the growth temperature was in the range of 600-900 ° C.
- Table 1 is a table showing an example of the Al composition, impurity density, impurities (dopant) used, and thickness of each layer of the DH structure manufactured in the example.
- the composition X of the p-type cladding layer 2 is 0 ⁇ 15 to 0 ⁇ 45
- the impurity density due to ⁇ is 3 X 10 17 cm 3
- the thickness is 10 0 / im .
- the composition y of the p-type active layer 3 is 0, that is, GaAs, and the effective defect due to Ge
- the density of the pure material was 2 ⁇ 10 18 cm 3 , and the thickness was variously changed, so that the thickness expressed as d / im was about 0.5 / ⁇ ⁇ to 8 ⁇ .
- composition ⁇ of the ⁇ -type cladding layer 4 is 0.20 to 0.45, the impurity density due to Te is 6 ⁇ 10 17 cm 3 , and the thickness is 60 / im. Note that the compositions x and z each indicate the fluctuation range within each film thickness as described above.
- the GaAs substrate is removed, electrodes 5 and 6 are formed on the p-type cladding layer 2 and the n-type cladding layer 4, respectively, and divided into chips of a predetermined area to obtain the infrared light emitting diode 1 as described above. It was produced by the method described in 1.
- the chip size of this infrared light emitting diode has an area of 0.32 mm X 0.32 mm, and its thickness is about 160 ⁇ m, which is ignored because the active layer is sufficiently thinner than the cladding layer. m.
- FIG. 3 shows the peak emission wavelength and the emission output at the peak emission wavelength when the thickness d of the active layer is changed in the infrared light emitting diode of the example.
- the horizontal axis represents the active layer thickness d (/ m)
- the left vertical axis represents the peak emission wavelength (nm)
- the right vertical axis represents the light output (mW) at the peak emission wavelength.
- the light-emitting diode 1 passes a current of 2 OmA at room temperature (25 ° C).
- the emission characteristics were measured using a spectroscope (MCPD3000 manufactured by Otsuka Electronics Co., Ltd.).
- the peak emission wavelength changes from about 870 to 890 nm. It can be seen that the peak emission wavelength is about 880 nm to 890 nm when the active layer thickness d is between 2 ⁇ m and 6 ⁇ m. At this time, a high output of about 4 mW was obtained at the peak emission wavelength. As a result, the peak emission wavelength of 880 ⁇ m to 890 nm corresponds to the wavelength corresponding to the boundary of the infrared light region that can be used for both infrared communication and remote control operation communication, and has a high output power.
- FIG. 4 is a diagram showing the rise time Tr and fall time Tf of light emission when the active layer thickness d is changed in the infrared light emitting diode of the example.
- the horizontal axis indicates the active layer thickness d (zm)
- the vertical axis indicates the rise time Tr and the fall time Tf (nsec)
- the rise time Tr is a rhombus ( ⁇ )
- the fall time Tf ( nsec) is represented by a square (country mark).
- the rise time Tr and the fall time Tf are measured with an infrared light emitting diode 1 having a non-less width of 125 nsec, a duty ratio of 25%, and a peak current of 500 mA. Measurement was performed by applying a pulse.
- the rise time Tr and the fall time Tf are almost the same value, about 37 to 55 nsec. It can be seen that the response performance is compatible with the cutoff frequency required for infrared communication.
- the measurement of peak emission wavelength, etc. is the value when 20mA DC forward current is applied at room temperature.
- the peak emission wavelength was 885 nm, and its half-value width (the emission wavelength width at which the emission output was halved) was 51 nm. Its light output was 3.82 mW.
- the rise time Tr and the fall time Tf at the time of driving the pulse current of 500 mA were 30 nsec.
- the peak emission wavelength was 885 nm, and its half-value width was 51 nm. Its luminous output was 3.59 mW.
- the rise time Tr and fall time Tf when driving with a pulse current of 500 mA were 65 nsec, respectively.
- the emission peak wavelength can be set to 880 nm to 890 nm, high output and high speed response to both infrared communication and remote control operation communication are possible. It can be used as an infrared light source. Therefore, it can be used as an infrared light source for high-speed infrared communication. For example, it can be used as an infrared light source for IrDA (abbreviation of Infrared Data Association, which is a standard setting organization for infrared communication).
- IrDA abbreviation of Infrared Data Association
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Abstract
Description
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/813,321 US8017960B2 (en) | 2005-01-05 | 2005-12-26 | Infrared emitting diode and method of its manufacture |
DE112005003346T DE112005003346T5 (de) | 2005-01-05 | 2005-12-26 | Infrarot-Emittierende Diode und Verfahren zu ihrer Herstellung |
Applications Claiming Priority (2)
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JP2005001018A JP4273237B2 (ja) | 2005-01-05 | 2005-01-05 | 赤外発光ダイオード及びその製造方法 |
JP2005-001018 | 2005-01-05 |
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WO2006073077A1 true WO2006073077A1 (ja) | 2006-07-13 |
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PCT/JP2005/023749 WO2006073077A1 (ja) | 2005-01-05 | 2005-12-26 | 赤外発光ダイオード及びその製造方法 |
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US (1) | US8017960B2 (ja) |
JP (1) | JP4273237B2 (ja) |
KR (1) | KR20070104362A (ja) |
DE (1) | DE112005003346T5 (ja) |
WO (1) | WO2006073077A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US20080087906A1 (en) * | 2005-02-25 | 2008-04-17 | Dowa Electronics Materials Co., Ltd. | Algaas-Based Light Emitting Diode Having Double Hetero Junction and Manufacturing Method of the Same |
TWI447954B (zh) | 2009-09-15 | 2014-08-01 | Showa Denko Kk | 發光二極體、發光二極體燈及照明裝置 |
JP5557649B2 (ja) | 2010-01-25 | 2014-07-23 | 昭和電工株式会社 | 発光ダイオード、発光ダイオードランプ及び照明装置 |
JP2012119585A (ja) | 2010-12-02 | 2012-06-21 | Showa Denko Kk | 発光ダイオード、発光ダイオードランプ及び照明装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS61128581A (ja) * | 1984-11-23 | 1986-06-16 | フィリップス エレクトロニクス ネムローゼ フェンノートシャップ | 発光ダイオードのマトリツクスおよびその製造方法 |
JPS63178568A (ja) * | 1987-01-20 | 1988-07-22 | Fuji Xerox Co Ltd | 発光ダイオ−ドアレイ |
JPH04179279A (ja) * | 1990-11-14 | 1992-06-25 | Omron Corp | 微小発光領域面発光素子およびその作製方法 |
JPH0567806A (ja) * | 1991-09-06 | 1993-03-19 | Sanyo Electric Co Ltd | 発光ダイオード |
JPH08293622A (ja) * | 1995-04-24 | 1996-11-05 | Dowa Mining Co Ltd | 赤外発光ダイオードおよびその製造方法 |
JP2000138640A (ja) * | 1998-10-30 | 2000-05-16 | Sanyo Electric Co Ltd | 光半導体装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6149486A (ja) | 1984-08-17 | 1986-03-11 | Mitsubishi Electric Corp | 発光ダイオ−ド |
TW253999B (ja) * | 1993-06-30 | 1995-08-11 | Hitachi Cable | |
TW456058B (en) * | 2000-08-10 | 2001-09-21 | United Epitaxy Co Ltd | Light emitting diode and the manufacturing method thereof |
TW550834B (en) * | 2002-02-15 | 2003-09-01 | United Epitaxy Co Ltd | Light emitting diode and its manufacturing method |
-
2005
- 2005-01-05 JP JP2005001018A patent/JP4273237B2/ja not_active Expired - Fee Related
- 2005-12-26 WO PCT/JP2005/023749 patent/WO2006073077A1/ja active Application Filing
- 2005-12-26 KR KR1020077017159A patent/KR20070104362A/ko not_active Application Discontinuation
- 2005-12-26 DE DE112005003346T patent/DE112005003346T5/de not_active Withdrawn
- 2005-12-26 US US11/813,321 patent/US8017960B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61128581A (ja) * | 1984-11-23 | 1986-06-16 | フィリップス エレクトロニクス ネムローゼ フェンノートシャップ | 発光ダイオードのマトリツクスおよびその製造方法 |
JPS63178568A (ja) * | 1987-01-20 | 1988-07-22 | Fuji Xerox Co Ltd | 発光ダイオ−ドアレイ |
JPH04179279A (ja) * | 1990-11-14 | 1992-06-25 | Omron Corp | 微小発光領域面発光素子およびその作製方法 |
JPH0567806A (ja) * | 1991-09-06 | 1993-03-19 | Sanyo Electric Co Ltd | 発光ダイオード |
JPH08293622A (ja) * | 1995-04-24 | 1996-11-05 | Dowa Mining Co Ltd | 赤外発光ダイオードおよびその製造方法 |
JP2000138640A (ja) * | 1998-10-30 | 2000-05-16 | Sanyo Electric Co Ltd | 光半導体装置 |
Also Published As
Publication number | Publication date |
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KR20070104362A (ko) | 2007-10-25 |
US20090008658A1 (en) | 2009-01-08 |
JP2006190792A (ja) | 2006-07-20 |
US8017960B2 (en) | 2011-09-13 |
JP4273237B2 (ja) | 2009-06-03 |
DE112005003346T5 (de) | 2007-11-22 |
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