WO2005122277A1 - 有機薄膜トランジスタ - Google Patents
有機薄膜トランジスタ Download PDFInfo
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- WO2005122277A1 WO2005122277A1 PCT/JP2005/010323 JP2005010323W WO2005122277A1 WO 2005122277 A1 WO2005122277 A1 WO 2005122277A1 JP 2005010323 W JP2005010323 W JP 2005010323W WO 2005122277 A1 WO2005122277 A1 WO 2005122277A1
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- thiophene
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- film transistor
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/464—Lateral top-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K19/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
- H10K19/10—Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00 comprising field-effect transistors
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S428/00—Stock material or miscellaneous articles
- Y10S428/917—Electroluminescent
Definitions
- the present invention relates to an organic thin film transistor.
- a display medium is formed using elements utilizing liquid crystal, organic EL, electrophoresis, or the like.
- display media in order to ensure the uniformity of screen luminance and the screen rewriting speed, the technology using an active drive element (TFT element) as the image drive element has become mainstream.
- TFT element active drive element
- these TFT elements are formed on a glass substrate, and a liquid crystal, an organic EL element, and the like are sealed.
- TFT element semiconductors such as a-Si (amorphous silicon) and p-Si (polysilicon) can be mainly used for the TFT element, and these S ⁇ conductors (and metal films as necessary) can be used.
- the TFT device is manufactured by multi-layering and sequentially forming source, drain and gate electrodes on the substrate. The manufacture of such TFT devices typically requires sputtering and other vacuum-based manufacturing processes.
- each layer must be formed by repeating the manufacturing process of the vacuum system including the vacuum chamber many times, and the equipment cost and the running cost are extremely enormous. Had become something.
- a TFT device it is usually necessary to repeat processes such as vacuum deposition, doping, photolithography, and development many times to form each layer, and the device is formed on a substrate through dozens of processes. ing.
- the semiconductor part that is the key to switching operation multiple types of semiconductor layers such as P-type and n-type are stacked.
- a large design change of a manufacturing apparatus such as a vacuum chamber is required.
- a TFT element is formed on a transparent resin substrate and a display material can be driven by the TFT element, the display is lighter and more flexible than conventional ones, and does not break when dropped. Very hard to break) and could be a display.
- Low molecular weight compounds such as phthalocyanines including lead phthalocyanine, perylene and its tetracarboxylic acid derivative (for example, see Patent Document 2), and aromatic oligomers represented by ocphenyl or thiophene hexamers called sexithiophene (See, for example, Patent Document 3), a compound in which a 5-membered heteroaromatic ring is symmetrically fused to naphthalene and anthracene (for example, see Patent Document 4), a molyte oligo, and a polydithienopyridine (see, for example, Patent Document 5).
- phthalocyanines including lead phthalocyanine, perylene and its tetracarboxylic acid derivative
- aromatic oligomers represented by ocphenyl or thiophene hexamers called sexithiophene See, for example, Patent Document 3
- Patent Document 4 a compound in which a 5-membered
- Non-Patent Documents 1 to 3 The development of a semiconductive composition using a novel charge transporting material exhibiting mobility has been anticipated!
- Patent Document 1 JP-A-5-55568
- Patent Document 2 JP-A-5-190877
- Patent Document 3 JP-A-8-264805
- Patent Document 4 JP-A-11-195790
- Patent Document 5 JP-A-2003-155289
- Patent Document 6 Japanese Patent Application Laid-Open No. 2003-261655
- Patent Document 7 JP-A-2003-264327
- Patent Document 8 JP-A-2003-268083
- Patent Document 9 Japanese Patent Application Laid-Open No. 2004-186695
- Patent Document 10 JP-A-2003-264327
- Patent Document 11 JP-A-2003-268083
- Non-Patent Document 1 “Science”, Vol. 289, 599 pages (2000)
- Non-patent Document 2 “Naturer” (Nature), vol. 403, p. 521 (2000)
- Non-Patent Document 3 "Advanced Material", 2002, Issue 2, p. 99
- Non-Patent Document 4 J. Am. Chem. Soc., 126, 11, 3378 (2004)
- An object of the present invention is to provide an organic thin-film transistor having both high carrier mobility and high durability.
- An organic thin film transistor comprising: a semiconductor layer.
- the number of thiophene rings contained in the thiophene oligomer is from 10 to 10.
- Item 2 The organic thin film transistor according to item 1, wherein
- an organic thin-film transistor having both high carrier mobility and high durability can be provided.
- FIG. 1 is a diagram showing a configuration example of an organic TFT according to the present invention.
- FIG. 2 is an example of a schematic equivalent circuit diagram of the organic TFT of the present invention.
- organic TFT organic thin film transistor of the present invention
- organic TFT organic thin film transistor
- pentacene which is well known as an organic semiconductor material
- pentacene is insoluble or hardly soluble in organic solvents, it is difficult to form a film by coating, and thus there is a problem.
- thiophene oligomers having no substituent such as unsubstituted sexithiophene, also easily form a ⁇ stack between molecules and form a regularly arranged structure. It is sparingly soluble and difficult to apply.
- thiophene oligomers represented by ⁇ 3 ⁇ are soluble in organic solvents, and can be applied or formed into a film by an inkjet method.
- the formation of the ⁇ stack was insufficient, and there were many parts with disordered molecular arrangements, so that satisfactory carrier mobility and onZoff ratio could not be obtained.
- the compound of the present invention is obtained by providing a thiophene ring having a substituent, which is a soluble site, and a continuous site of an unsubstituted thiophene ring which promotes formation of a ⁇ -stack by having sites having respective functions.
- a thiophene ring having a substituent which is a soluble site
- a continuous site of an unsubstituted thiophene ring which promotes formation of a ⁇ -stack by having sites having respective functions.
- the organic semiconductor material according to the organic thin film transistor of the present invention has sufficient solvent solubility and can be applied.
- the organic TFT of the present invention can be manufactured by a low-temperature process and is not vacuum-based. As a result, a transistor can be easily manufactured at low cost with low running cost.
- the thiophene oligomer according to the present invention will be described.
- the thiophene oligomer according to the present invention has a thiophene ring having a substituent and a partial structure in which at least two or more unsubstituted thiophene rings are continuous, and is included in one molecule.
- the thiophene oligomer represented by the general formula (1) according to the present invention will be described.
- the thiophene oligomer has a partial structure represented by the general formula (1).
- examples of the substituent represented by R include an alkyl group (for example, a methyl group, an ethyl group, a propyl group, an isopropyl group, a tert-butyl group, a pentyl group, a hexyl group Octyl group, dodecyl group, tridecyl group, tetradecyl group, pentadecyl group, etc.), cycloalkyl group (eg, cyclopentyl group, cyclohexyl group, etc.), alkenyl group (eg, bur group, aryl group, etc.), alkyl -Aryl group (for example, ethynyl group, propargyl group, etc.), aromatic hydrocarbon group (for example, phenyl group, p-chlorophenyl group, mesityl group, tolyl group, xylyl group, naphthyl group, anthryl group
- acyl group for example, acetyl group, ethylcarbyl group, propyl group carbonyl group, pentylcarbol group
- acyloxy group for example, Acetyloxy, ethylcarboxy-, butylcarboxy-, octylcarboxy-, dodecylcarboxy-, phenylcarboxy-, etc.
- amide groups eg, methylcarboxy-amin
- Groups e.g., aminocarbonyl group, methylaminocarbon group, dimethylaminocarbon group, propylaminocarbon group, pentylaminocarbon group, cyclohexylaminocarbon group, octylamino Carboxyl group, 2-ethylhexylaminocarbol group, dodecylaminocarbol group, phenylaminocarbyl group, naphthylaminocarbol group, 2-pyridylaminocarbol group, etc.
- Ureido groups eg, methylureido group, ethyl ureide group, pentyl ureide group, cyclohexyl ureide group, octyl ureide group
- dodecylureide group phenylureide group, naphthylureide group, 2-pyridylaminoureide group, etc.
- sulfiel group for example, methyl Rusulfyl group, ethylsulfyl group, butylsulfyl group, cyclohexylsulfyl group, 2-ethylhexylsulfyl group, dodecylsulfuryl group, phenylsulfuryl group, naphthylsulfuryl group Group, 2-pyridylsulfiel group, etc.), alkylsulfol group (eg, methylsulfol group, ethyl ureide
- a preferable substituent is an alkyl group, more preferably an alkyl group having 2 to 20 carbon atoms, and particularly preferably an alkyl group having 6 to 12 carbon atoms.
- the thiophene oligomer according to the present invention has a thiophene ring having a substituent and a partial structure in which at least two or more unsubstituted thiophene rings are continuous. Containing an aromatic hydrocarbon ring or an aromatic heterocyclic ring!
- the aromatic hydrocarbon ring includes a benzene ring, a biphenyl ring, a naphthalene ring, an azulene ring, an anthracene ring, a phenanthrene ring, a pyrene ring, a thalicene ring, a naphthacene ring, a triphenylene ring, o —Tenorefe-nore ring, m-tenorefe-nore ring, p-tenorefe-nore ring, acenaphthene ring, coronene ring, fluorene ring, fluoranthrene ring, naphthacene ring, pentacene ring, perylene ring, pentaphene ring, picene ring, Examples include a pyrene ring, a pyranthrene ring, and an anthranthrene
- Examples of the aromatic heterocycle include a furan ring, a thiophene ring, an oxazole ring, Pyrrole ring, pyridine ring, pyridazine ring, pyrimidine ring, pyrazine ring, triazine ring, benzoimidazole ring, oxadiazole ring, triazole ring, imidazole ring, pyrazole ring, thiazole ring, indole ring, indazole ring, benzimidazole ring, benzothiazole ring Benzoxazole ring, quinoxaline ring, quinazoline ring, cinnoline ring, quinoline ring, isoquinoline ring, phthalazine ring, naphthyridine ring, carbazole ring, carboline ring, diaza carbazole ring (for the hydrocarbon ring constituting the carboline ring) Re
- the terminal group of the thiophene oligomer according to the present invention will be described.
- the terminal group of the thiophene oligomer according to the present invention preferably does not have a chain group, and a preferable group as the terminal group is an aryl group (eg, a phenyl group, a p-chlorophenyl- group).
- a preferable group as the terminal group is an aryl group (eg, a phenyl group, a p-chlorophenyl- group).
- alkyl Groups eg, methyl, ethyl, propyl, isopropyl, tert-butyl, pentyl, hexyl, octyl, dodecyl, tridecyl, tetradecyl, pentadecyl, etc.
- halogen atoms eg, Fluorine atom, chlorine atom, bromine atom, etc.
- the thiophene oligomer according to the present invention preferably has a Head-to-Tail structure or a Head-to-Tail structure in the structure, in addition to the fact that the structure preferably does not have a Head-to-Head structure. , Tail-to- Tail structure.
- head-to-head structure head-to-tail structure, and tail-to-tail structure according to the present invention are described in, for example, “ ⁇ -Electron Organic Solids” (1998, published by Gakkai Shuppan Center, Japan This can be referred to on pages 27-32, Adv. Mater. 1998, 10, No. 2, pages 93-116, etc.
- specific structural features are shown below.
- the present invention is not limited thereto, which shows specific examples of the thiophene oligomer according to the present invention.
- Organic thin film transistor also referred to as organic TFT
- organic thin film transistor organic TFT
- the organic semiconductor material according to the present invention can provide an organic TFT that can be driven well by being used in an organic thin film transistor (organic TFT).
- An organic TFT organic thin film transistor
- An organic TFT has a top electrode having a source electrode and a drain electrode connected by an organic semiconductor channel as a semiconductor layer on a support, and having a gate electrode thereon via a gate insulating layer.
- a bottom-gate type which has a gate electrode on the support, and has a source electrode and a drain electrode connected by an organic semiconductor channel via a gate insulating layer.
- the thiophene oligomer can be installed on the substrate by vacuum evaporation.
- the thiophene oligomer is prepared by dissolving in an appropriate solvent and adding an additive as needed. It is preferable that the solution obtained is set on a substrate by cast coating, spin coating, printing, an inkjet method, an abrasion method, or the like.
- the solvent for dissolving the organic semiconductor compound according to the present invention is not particularly limited as long as it can dissolve the organic semiconductor conjugate to prepare a solution having an appropriate concentration.
- chain ether solvents such as getyl ether and diisopropyl ether; cyclic ether solvents such as tetrahydrofuran and dioxane; ketone solvents such as acetone and methyl ethyl ketone; halogens such as chloroform and 1,2-dichloroethane; Alkylated solvents, aromatic solvents such as toluene, o-dichlorobenzene, nitrobenzene, m-talesol, N-methylpyrrolidone, disulfide carbon and the like.
- the material forming the source electrode, the drain electrode, and the gate electrode is not particularly limited as long as it is a conductive material, and platinum, gold, silver, nickel, chromium, copper, iron, tin, Antimony tin, tantalum, indium, palladium, tellurium, rhenium, iridium, anolemmium, ruthenium, germanium, molybdenum, tungsten, tin oxide 'antimony, indium' tin (ITO), fluorine-doped zinc oxide, zinc , Carbon, graphite, glassy carbon, silver paste and carbon paste, lithium, beryllium, sodium, magnesium, potassium, calcium, scandium, titanium, manganese, zirconium, gallium, niobium, sodium, sodium-potassium alloy, magnesium, Lithium, Anoremi-Pam, Ma Nesium Z-copper mixture, magnesium Z-silver mixture, magnesium Z-aluminum mixture, magnesium
- a known conductive polymer whose conductivity has been improved by doping or the like, for example, a conductive polyaline, a conductive polypyrrole, a conductive polythiophene, a complex of polyethylenedioxythiophene and polystyrene sulfonic acid, etc., is preferably used.
- a conductive polyaline a conductive polypyrrole, a conductive polythiophene, a complex of polyethylenedioxythiophene and polystyrene sulfonic acid, etc.
- a method for forming an electrode a method for forming an electrode using a known photolithographic method or a lift-off method on a conductive thin film formed by a method such as vapor deposition or sputtering using the above materials, aluminum, copper, or the like is used.
- a method of etching using a resist by thermal transfer, ink jet, or the like on the metal foil Alternatively, a conductive polymer solution or dispersion, or a conductive fine particle dispersion may be directly patterned by ink jetting, or may be formed from a coating film by lithography or laser ablation.
- ink, conductive paste, etc., containing conductive polymer or conductive fine particles are intaglio, intaglio, lithographic, screen printing.
- a method of patterning by a printing method such as printing can also be used.
- the ability to use various insulating films as the gate insulating layer is preferably an inorganic oxide film having a high relative dielectric constant.
- Inorganic oxides include silicon oxide, aluminum oxide, tantalum oxide, titanium oxide, tin oxide, vanadium oxide, barium strontium titanate, barium zirconate titanate, lead zirconate titanate, and titanate. Examples include lanthanum lead, strontium titanate, barium titanate, barium magnesium fluoride, bismuth titanate, strontium bismuth titanate, strontium bismuth tantanoleate, bismuth niobate tantalate and yttrium trioxide. Among them, preferred are Sidani silicon, Sidani aluminum, Tidani tantalum and Tidani titanium. Inorganic nitrides such as silicon nitride and aluminum nitride can also be suitably used.
- Examples of the method of forming the film include a vacuum deposition method, a molecular beam epitaxy growth method, an ion cluster beam method, a low energy ion beam method, an ion plating method, a CVD method, a sputtering method, and an atmospheric pressure plasma method. Dry process, application method such as spray coating method, spin coating method, blade coating method, dip coating method, casting method, roll coating method, bar coating method, die coating method, etc. And a wet process according to the material.
- the wet process includes a method of applying and drying a liquid obtained by dispersing fine particles of an inorganic oxide in an optional organic solvent or water using a dispersing aid such as a surfactant as necessary.
- a so-called sol-gel method of applying and drying a solution of a body for example, an alkoxide body, is used.
- the atmospheric pressure plasma method and the sol-gel method are preferred.
- a method for forming an insulating film by plasma film formation under atmospheric pressure is a process of forming a thin film on a substrate by discharging under an atmospheric pressure or a pressure close to the atmospheric pressure, exciting a reactive gas by plasma.
- the method is described in JP-A-11-61406, JP-A-11133205, JP-A-2000-121804, JP-A-2000-147209, JP-A-2000-185362, etc. , Atmospheric pressure plasma method).
- a highly functional thin film can be formed with high productivity.
- the organic compound film may be a polyimide, polyamide, polyester, polyatalylate, photo-radical polymerization type, photo-thion polymerization type photo-curable resin, or acrylonitrile coating.
- a copolymer containing a polybutadiene, polybutylphenol, polybutyl alcohol, novolak resin, cyanoethyl pullulan and the like can also be used.
- the method for forming the organic compound film the above-mentioned wet process is preferable.
- the inorganic oxide film and the organic oxide film can be laminated and used together. The thickness of these insulating films is generally 50 ⁇ ! 33 m, preferably 100 nm to 1 ⁇ m.
- the support is made of glass or a flexible resin sheet.
- a plastic film can be used as the sheet.
- the plastic film include polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polyethersulfone (PES), polyetherimide, polyetheretherketone, polyphenylenesulfide, polyarylate, polyimide, and polycarbonate.
- PC polyethylene terephthalate
- PEN polyethylene naphthalate
- PES polyethersulfone
- PC polyetherimide
- polyetheretherketone polyphenylenesulfide
- polyarylate polyimide
- polycarbonate polycarbonate
- PC cellulose triacetate
- CAP cellulose acetate propionate
- FIG. 1 is a diagram showing a configuration example of an organic TFT according to the present invention.
- FIG. 3A shows that a source electrode 2 and a drain electrode 3 are formed on a support 6 by a metal foil or the like, and an organic semiconductor layer 1 made of an organic thin film transistor material of the present invention is formed between both electrodes.
- An insulating layer 5 is formed thereon, and a gate electrode 4 is further formed thereon to form a field effect transistor.
- FIG. 2B shows the organic semiconductor layer 1 formed between the electrodes in FIG. 2A and formed so as to cover the entire surface of the electrodes and the support using a coating method or the like.
- (C) shows a structure in which the organic semiconductor layer 1 is first formed on the support 6 by a coating method or the like, and then the source electrode 2, the drain electrode 3, the insulating layer 5, and the gate electrode 4 are formed.
- FIG. 4D shows that after forming a gate electrode 4 on a support 6 with a metal foil or the like, an insulating layer 5 is formed thereon, and a source electrode 2 and a drain electrode 3 are formed thereon with a metal foil or the like.
- the organic semiconductor layer 1 formed of the organic thin film transistor material of the present invention is formed between the electrodes.
- FIGS. FIG. 2 is a diagram showing an example of a schematic equivalent circuit diagram of an organic TFT sheet.
- the organic TFT sheet 10 has a large number of organic TFTs 11 arranged in a matrix. 7 is a gate bus line of each TFT11, and 8 is a source bus line of each TFT11.
- An output element 12 is connected to a source electrode of each TFT 11, and the output 12 is, for example, a liquid crystal or an electrophoretic element, and constitutes a pixel in a display device.
- the pixel electrode may be used as an input electrode of an optical sensor.
- the liquid crystal is shown as an output element by an equivalent circuit having resistance and capacitor power.
- 13 is a storage capacitor
- 14 is a vertical drive circuit
- 15 is a horizontal drive circuit.
- a 200-nm-thick thermal oxide film was formed on a Si wafer with a specific resistance of 0.02 ⁇ 'cm as a gate electrode to form a gate insulating layer, and surface treatment with octadecyltrichlorosilane was performed.
- a nitrogen-containing form solution of Comparative Compound 1 was bubbled with nitrogen gas.
- nitrogen gas atmosphere 1.013 ⁇ 10 2 kPa
- it is applied using an applicator to the surface of the thermal oxidation film (oxidation silicon film)
- a cast film film thickness 20 nm
- Organic transistor 1 was prepared in the same manner except that comparative compound (1) was changed to comparative compounds (2) and (3) (pentacene, a commercial reagent manufactured by Aldrich Co., Ltd., which was sublimated and purified). Thin film transistors 2 and 3 were produced, respectively.
- the organic thin film transistor 4 was prepared in the same manner except that the comparative semiconductor conjugate (1) was replaced with the organic semiconductor material according to the present invention shown in Table 1.
- the carrier mobility was also obtained for the saturation region force of the —V characteristic, and the ON / OFF ratio was obtained from the ratio of the drain current value when the drain bias was ⁇ 50 V and the gate bias was 50 V and OV.
- the organic thin-film transistors 4 to 11 of the present invention show excellent transistor characteristics even immediately after fabrication and have little deterioration over time, as compared with the comparative organic thin-film transistors 1 to 3. It can be seen that it has both high and durability.
Abstract
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WO2007034841A1 (ja) * | 2005-09-21 | 2007-03-29 | Mitsubishi Chemical Corporation | 有機半導体材料及び有機電界効果トランジスタ |
JP2007201132A (ja) * | 2006-01-26 | 2007-08-09 | Konica Minolta Holdings Inc | 有機薄膜トランジスタ |
KR20110021275A (ko) * | 2009-08-25 | 2011-03-04 | 삼성전자주식회사 | 유기 반도체 고분자 및 이를 포함하는 트랜지스터 |
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US7714320B2 (en) * | 2005-10-25 | 2010-05-11 | Alcatel-Lucent Usa Inc. | Branched phenylene-terminated thiophene oligomers |
KR100730159B1 (ko) * | 2005-11-10 | 2007-06-19 | 삼성에스디아이 주식회사 | 유기 박막 트랜지스터, 이를 구비한 평판표시장치, 상기유기 박막 트랜지스터의 제조방법 |
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JP5181587B2 (ja) * | 2006-09-29 | 2013-04-10 | 大日本印刷株式会社 | 有機半導体素子およびその製造方法、有機トランジスタアレイ、およびディスプレイ |
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- 2005-06-06 WO PCT/JP2005/010323 patent/WO2005122277A1/ja active Application Filing
- 2005-06-06 US US11/145,667 patent/US8129497B2/en not_active Expired - Fee Related
- 2005-06-06 JP JP2006514488A patent/JPWO2005122277A1/ja active Pending
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WO2007034841A1 (ja) * | 2005-09-21 | 2007-03-29 | Mitsubishi Chemical Corporation | 有機半導体材料及び有機電界効果トランジスタ |
JP2007201132A (ja) * | 2006-01-26 | 2007-08-09 | Konica Minolta Holdings Inc | 有機薄膜トランジスタ |
KR20110021275A (ko) * | 2009-08-25 | 2011-03-04 | 삼성전자주식회사 | 유기 반도체 고분자 및 이를 포함하는 트랜지스터 |
KR101644048B1 (ko) | 2009-08-25 | 2016-07-29 | 삼성전자 주식회사 | 유기 반도체 고분자 및 이를 포함하는 트랜지스터 |
Also Published As
Publication number | Publication date |
---|---|
US8129497B2 (en) | 2012-03-06 |
US20050274954A1 (en) | 2005-12-15 |
JPWO2005122277A1 (ja) | 2008-04-10 |
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