WO2005106964A1 - 受光素子、受光素子の製造方法、光ヘッド装置、及び光情報処理装置 - Google Patents
受光素子、受光素子の製造方法、光ヘッド装置、及び光情報処理装置 Download PDFInfo
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- WO2005106964A1 WO2005106964A1 PCT/JP2005/007621 JP2005007621W WO2005106964A1 WO 2005106964 A1 WO2005106964 A1 WO 2005106964A1 JP 2005007621 W JP2005007621 W JP 2005007621W WO 2005106964 A1 WO2005106964 A1 WO 2005106964A1
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- WIPO (PCT)
- Prior art keywords
- receiving element
- semiconductor chip
- light receiving
- package
- light
- Prior art date
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- 230000003287 optical effect Effects 0.000 title claims description 75
- 238000004519 manufacturing process Methods 0.000 title claims description 15
- 238000000034 method Methods 0.000 title claims description 9
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- 239000000853 adhesive Substances 0.000 claims abstract description 27
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- 229910052751 metal Inorganic materials 0.000 claims description 18
- 239000002184 metal Substances 0.000 claims description 18
- 230000010365 information processing Effects 0.000 claims description 11
- 238000007789 sealing Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 6
- 238000005476 soldering Methods 0.000 abstract description 26
- 239000011521 glass Substances 0.000 abstract description 14
- 239000005394 sealing glass Substances 0.000 abstract 1
- 239000005357 flat glass Substances 0.000 description 18
- 239000000758 substrate Substances 0.000 description 16
- 239000000463 material Substances 0.000 description 14
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- 229920005989 resin Polymers 0.000 description 12
- 238000006243 chemical reaction Methods 0.000 description 9
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- 229910000679 solder Inorganic materials 0.000 description 4
- 239000007789 gas Substances 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
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- 238000005516 engineering process Methods 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 238000012856 packing Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48257—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Definitions
- Light receiving element method of manufacturing light receiving element, optical head device, and optical information processing apparatus
- the present invention is an optical medium or magneto-optical medium that is applicable to an optical information processing apparatus for recording, reproducing or erasing information on an optical medium or magneto-optical medium, such as an optical disc or an optical card, for example.
- the present invention relates to a light receiving element used in, for example, an optical head device that receives reflected light of the light source and converts it into an electric signal, and a method of manufacturing the same.
- Optical memory technology using an optical disk having a pit-like pattern as a high-density, large-capacity storage medium is expanding its applications, such as digital audio disks, video disks, document file disks, and data files.
- information is recorded and reproduced with high accuracy and reliability on an optical disc through a light beam collected by a minute. This recording and reproducing operation depends on the optical system at once.
- optical head which is a main part of the optical system, are convergence to form a diffraction-limited minute spot with light from a light source, focus control and tracking control of the optical system, and pit signal detection. It is divided roughly. These functions are realized by the combination of various optical systems and photoelectric conversion detection methods according to the purpose and application.
- One of the basic elements of an optical system is a light receiving element, which includes a reflected light blue signal and a light component necessary for focus control and tracking control in a recording medium. To receive light, perform photoelectric conversion, and extract signals necessary for recording and reproduction.
- a light receiving element is also used when receiving a part of light emitted from the light source to control the output of the light source.
- a light receiving element for an optical head is photoelectrically converted by a semiconductor, and has a structure in which a light receiving area and an attached circuit as necessary are formed on a semiconductor chip. Furthermore, the semiconductor chip is sealed and shielded from the outside in order to protect it from deterioration by the contact of external force and moisture in the air. Also, for the input and output of electric signals of the semiconductor chip, it is soldered to a flexible printing circuit (hereinafter referred to as FPC) as a substrate like other electric parts on the optical head.
- FPC flexible printing circuit
- FIG. 12 is a cross-sectional view showing a light receiving element according to a conventional embodiment.
- the semiconductor chip 51 is fixed on the lead frame 54.
- the lead frame 54 is made of metal and fixed in position by soldering to an FPC or the like (not shown) as a whole, and serves as terminals for input and output of electric signals and electric power.
- a bonding wire 55 is provided between the electrode on the semiconductor chip 51 and the lead frame 54 to electrically connect the semiconductor chip 51 to the lead frame 54.
- the semiconductor chip 51 may be broken or deteriorated by moisture in the air or contact from the outside at the time of standing a, so it is necessary to seal the semiconductor chip 51 in order to shield it from the outside.
- the semiconductor chip 51, the lead frame 54 and the bonding wire 55 are injected into a mold in which the force is preset, molded and sealed.
- the translucent resin 52 has the required transmittance for the wavelength of light used for the light flux 56, and it is necessary to use a good molded resin.
- the light transmitting resin 52 needs to give priority to light transmitting property and formability, and it is impossible to give priority to selection of a material which is resistant to heat.
- the aluminum film 57 is deposited to reflect the heat rays, thereby reducing the heat absorbed by the light receiving element at the time of the reflow and enabling the reflow soldering (for example, in the case of
- a light beam 56 including a signal component reflected from an optical disk (not shown) passes through the light transmitting resin 52, reaches the photoelectric conversion area on the semiconductor chip 51, is photoelectrically converted, and passes through the bonding wire 55. Frame 54 force is also extracted as the required signal.
- the photoelectric conversion region on the semiconductor chip 51 is configured in various shapes as needed, and is not shown! In combination with the profile of the luminous flux 56 produced by the optical system, the desired signal is produced be able to.
- the area 61 of the translucent resin 52 through which the light flux 56 passes is a flat surface so as not to adversely affect the profile of the light flux 56.
- the light receiving element has a configuration in which the semiconductor chip 51 is disposed so that the light beam 136 to the semiconductor chip 51 is incident on the opening of the package 132 using the package 132 integrated with the lead frame 54. Further, a flat glass plate 133 is disposed so as to seal the opening of the package 132, and the edge of the package 132 and the flat glass plate 138 are fixed by an adhesive 131.
- the semiconductor chip 51 is sealed in an internal space 137 formed by the glass flat plate 133 and the package 132, and air and moisture from the outside are shut off.
- the light path of the light beam 136 is not affected since the glass plate 138 is not altered or deformed by light.
- the light receiving element when mounting the light receiving element on the substrate, in order to suppress the temperature rise of the entire light receiving element, the light receiving is performed after the reflow soldering of components other than the light receiving element to be mounted on the substrate is completed. It is necessary to solder only the element while heating only the lead using a soldering iron. Therefore, in the manufacture of the optical head, the mounting process must be separated between the light receiving element and the other components, and the complexity of such a process hinders the low cost of the optical head.
- the present invention solves the above problems and can be mounted on a substrate only by reflow soldering, and is a low cost, highly reliable mountable light receiving element, and
- An object of the present invention is to provide a cost optical head device and an optical information processing apparatus.
- a semiconductor chip for converting incident light into an electrical signal
- a metal frame serving as a terminal for holding the semiconductor chip and electrically connecting to the semiconductor chip
- a package having an opening provided to receive the semiconductor chip and integrated with the metal frame;
- the space including the semiconductor chip is sealed by fixing the translucent flat plate and the package with an adhesive.
- the pressure in the space is a light receiving element whose pressure is reduced to less than 1 atm at normal temperature.
- the pressure of the space is substantially less than or equal to 0.5 atm at normal temperature. It is a light receiving element according to claim 1.
- a semiconductor chip for converting incident light into an electrical signal
- a metal frame serving as a terminal for holding the semiconductor chip and electrically connecting to the semiconductor chip
- a package having an opening provided to receive the semiconductor chip and integrated with the metal frame;
- the space including the semiconductor chip is sealed by fixing the translucent flat plate and the package with an adhesive.
- a part of the wall of the package is a light receiving element having a flexible structure.
- the flexible structure is formed by replacing the part of the wall of the package with a member having a material different from the material of the package. It is a light receiving element according to item 3.
- the flexible structure is formed by making the portion of the wall of the package thinner than the other portion of the package. It is a light receiving element as described.
- a sixth aspect of the present invention is the light receiving element according to claim 3 or 4, wherein the flexible structure has plasticity.
- a semiconductor chip for converting incident light into an electrical signal
- a metal frame serving as a terminal for holding the semiconductor chip and electrically connecting to the semiconductor chip
- a package having an opening provided to receive the semiconductor chip and integrated with the metal frame;
- a space including the semiconductor chip is formed by fixing the translucent flat plate and the package with an adhesive.
- the package has a valve that opens and closes according to a predetermined temperature, connects the space and the outside in an open state, and isolates the space and the outside in a closed state.
- the valve is a light receiving element which is in the open state at a temperature higher than the predetermined temperature and in the closed state at a temperature lower than the predetermined temperature.
- the eighth invention of the present invention is the light receiving element according to claim 7, wherein the predetermined temperature is substantially 150 to 200 ° C.
- a ninth aspect of the present invention is a semiconductor chip for converting incident light into an electrical signal
- a metal frame serving as a terminal for holding the semiconductor chip and electrically connecting to the semiconductor chip
- a package having a first opening and a second opening which is provided to receive the semiconductor chip and which is integrated with the metal frame;
- a translucent flat plate provided on a side through which light incident on the semiconductor chip passes while sealing the first opening of the package.
- a space including the semiconductor chip is formed to communicate with the outside only through the second opening. is there.
- the second opening is provided at a position sealed by the substrate when the light receiving element is mounted on the substrate.
- a semiconductor chip that converts incident light into an electric signal
- a metal frame that holds the semiconductor chip and serves as a terminal for electrically connecting to the semiconductor chip.
- a package which is provided to house the semiconductor chip and has an opening formed integrally with the metal frame, and the side which seals the opening of the package and through which light incident on the semiconductor chip passes
- a method of manufacturing a light receiving element comprising: a light transmitting flat plate provided in
- the twelfth invention of the present invention is a fixing method of a light receiving element for fixing the light receiving element according to the ninth aspect on a substrate,
- a thirteenth invention of the present invention is an optical head device comprising the light receiving element according to any one of claims 1, 3, 7 or 9.
- a fourteenth aspect of the present invention is an optical information processing apparatus comprising the optical head apparatus according to claim 13.
- a low cost optical head device can be provided.
- optical head device of the present invention a low cost optical information processing apparatus can be provided.
- FIG. 1 is a cross-sectional view of a light receiving element in the first embodiment.
- the basic configuration is the same as that of the conventional example shown in FIG. That is, 1 is a semiconductor chip.
- 2 is a package
- 3 is a flat glass plate
- 4 is a lead frame
- 5 is a bonding wire.
- 6 is a luminous flux.
- Reference numeral 7 is a space surrounded by the package 2 and the flat glass plate 3.
- 8 is an adhesive for bonding the flat glass plate 3 and the package 2 together.
- the semiconductor chip 1 has a photoelectric conversion region for receiving light and generating a current, and a circuit for converting the current into a desired electric signal as necessary.
- the lead frame 4 is a terminal for fixing the light receiving element to a not-shown FPC or the like by soldering and for inputting / outputting an electric signal to / from the semiconductor chip 1.
- the semiconductor chip 1 and the lead frame 4 are electrically connected by the bonding wire 5, and the electric signal obtained by photoelectric conversion in the semiconductor chip 1 and the power supplied to the semiconductor chip 1 are transmitted. Flow.
- the package 2 is integrally formed including the lead frame 4. Since the package 2 does not need to transmit light, the material can be selected and used in preference to formability and heat resistance.
- the semiconductor chip 1 is disposed inside the package 2 so that the photoelectric conversion region faces the opening.
- the opening of the package 2 is sealed with a flat glass plate 3 so as not to block the light incident on the semiconductor chip 1.
- the edge portion of the flat glass plate 3 and the end face of the package 2 are fixed by the adhesive 8 to form an internal space 7 which is shielded from external creases.
- a desired profile is given to the light flux 6 by an optical system (not shown), and a desired electrical signal can be obtained in relation to the shape of the photoelectric conversion region on the semiconductor chip 1.
- the semiconductor chip 1 corresponds to the semiconductor chip of the present invention
- the read frame 4 corresponds to the metal frame of the present invention
- the package 2 corresponds to the package of the present invention
- the flat plate 3 corresponds to the translucent flat plate of the present invention
- the adhesive 8 corresponds to the adhesive of the present invention
- the inner space 7 corresponds to the space including the semiconductor chip of the present invention.
- the light receiving element according to the present embodiment is characterized in that the pressure in the internal space 7 is maintained to be lower than 1 atm at room temperature.
- the pressure in the internal space 7 is maintained to be lower than 1 atm at room temperature.
- the process may basically be carried out by the same process as in the conventional example, but the step of fixing the package 2 and the flat glass plate 3 with the adhesive 8 Use a house or the like under a reduced pressure environment at normal temperature. That is, the light receiving element after completion
- the pressure in the internal space 7 of is substantially the same as the pressure in the reduced pressure environment at the time of production.
- the degree of pressure reduction in the internal space 7 is set as follows. That is, since the temperature at the time of reflow soldering is generally at most 600 K, assuming that the room temperature is approximately 300 K, the volume of the internal space 7 is constant, so the reduced pressure environment at the time of manufacturing is set at 0.5 atmosphere or less. According to Boyle's Charles law, even if the temperature reaches the maximum temperature during reflow, no force is generated to press the glass flat plate 3 inwards even if it reaches the maximum temperature during reflow, and the strength of the adhesive 8 is weak. Even if the glass flat plate 3 does not come off, soldering by reflow becomes possible
- the inner space 7 is affected by the pressure from the outside due to the light receiving element after completion, and the flat glass plate 3 is directed to the inner space 7. It may bend and affect the light path, which may lead to damage.
- the flat glass 3 the package against the pressure
- the flat glass 3 may be used. It is desirable to increase the mechanical strength of 2nd grade.
- the contact portion 103a in contact with the glass flat plate 3 of the package 2 is extended toward the inside of the opening.
- the force 104 which rotates around the action center 103 as a fulcrum, acts to release the fixing by the adhesive 8 but to try to break it.
- the adhesive 8 will not be released by the internal pressure.
- the center of action 103 is the end of the abutment portion 103a which extends inside the opening.
- the application position of the adhesive 8 may be the same as in the case of FIG. 1, and the application area of the force contact portion 103a may be larger.
- the flat glass plate 3 and the package 2 may be fixed from the outside.
- a holding frame 320 is provided, whereby the side wall of the package 2 is provided. And fix the periphery of the flat glass plate 3.
- the holding frame 320 is fixed to the package 2 by an adhesive 310 applied to the side wall of the package 2.
- FIG. 4 is a cross-sectional view showing a light receiving element in the second embodiment. The same symbols are given to components having the same functions as those in FIG. 1 in FIG.
- 9 is a flexible structure, and a part of the bottom wall of the package 2 of the first embodiment is replaced with a resilient plate-like material different from the material of the package 2. It is. The periphery of the flexible structure 9 is fixed to the cage / cage 2.
- the pressure in the internal space 7 is substantially equal to 1 atm, that is, the same as the outside pressure at normal temperature.
- the second embodiment of the present invention having such a configuration, when the completed light receiving element is mounted on the FPC by means of reflow soldering, the temperature of the external atmosphere rises due to the heat of the reflow, and accordingly As the air in the internal space 7 expands and the internal pressure rises, as shown in FIG. 5, the flexible structure 9 deforms outward according to the internal pressure. As a result, the volume of the internal space 7 is increased, and an increase in internal pressure can be suppressed, so that the flat glass plate 3 can be prevented from coming off or being damaged, and reflow can be performed simultaneously with other electrical components. Thus, it becomes possible to solder at low cost.
- the flexible structure 9 needs to use a material that can withstand the temperature at the time of mounting of the light receiving element, and as a material different from the material of the package 2, a perfluoro fluorine rubber can be mentioned as an example. . It has a heat resistance temperature of about 300 ° C. (about 573 K), and can withstand reflow, in which the heat resistance temperature is higher than other general heat-resistant rubbers (fluorine rubber, silicone rubber) and the like. In addition, there is almost no irreversible deformation within a few hours (the time for reflow soldering is The shape of the flexible structure 9 after mounting can be restored to a flat plate shape as shown in FIG.
- FIG. 6 (a) Another example of the flexible structure is shown in FIG. 6 (a).
- the flexible structure 69 is formed by forming a part of the bottom wall of the package 2 thinner than the other walls. With such a configuration, the flexible structure 69 is curved when the light receiving element is reflowed, and the same effect as that of the example of FIG. 5 can be obtained.
- the thickness of the flexible structure 69 depends on the area of the flexible structure 69. When the dimension of the force package 2 is about 10 mm square, the average thickness of the side wall, the bottom wall, etc. is about 1 mm. Because of this, it is desirable that the thickness of the flexible structure 69 be about 5 ⁇ m. When the deformation amount is 5 ⁇ m or more, it is a force that is considered to affect the optical accuracy of the package 2. Therefore, the thickness of the flexible structure 69 is generally preferably about 1 Z400 or less than the thickness of the other part of the package 2.
- the contraction of the flexible structure 69 is equal to the bottom surface of the package 2 as it is substantially circular. It is desirable because it is worthwhile.
- This shape is the same as in the flexible structure 9 shown in FIG. However, it may be elliptical or rectangular depending on the conditions at the time of manufacture.
- the shape of the flexible structure 9 is restored to a flat shape at normal temperature after mounting is completed, but the material of the flexible structure 9 is plasticity. It is also possible to use one which has the above-mentioned structure, that is, when it is expanded outward by the expansion of the internal space 7 at the time of mounting, it retains its expanded shape even at room temperature. The same applies to the material of the package 2 to be the flexible structure 69.
- the flexible structure 9 and the flexible structure 69 correspond to the flexible structure of the present invention. Also, although the flexible structures 9 and 69 have been described as being disposed at the bottom of the package 2 as well, the flexible structure of the present invention is a place where the light flux 6 to the semiconductor chip 1 is not affected. You may provide in arbitrary places, such as a side wall of the package 2.
- FIG. 7 is a cross-sectional view showing a light receiving element in the third embodiment. Components in FIG. 7 having the same functions as those in FIG. 1 are assigned the same reference numerals and descriptions thereof will be omitted.
- 10 is a valve.
- an opening 710 is provided in part of the bottom wall of the package 2 of the first embodiment, and a valve 10 is provided at the bottom of the package 2 so as to seal the opening 710. It is done.
- a packing 201 is provided around the opening 710.
- the valve 10 is made of metal such as bimetal and opens and closes in accordance with the temperature of the atmosphere outside the light receiving element.
- the pressure of the internal space 7 is substantially equal to 1 atm, that is, the same as the external pressure at normal temperature.
- the valve 10 corresponds to the valve of the present invention.
- the valve 10 has a flat plate shape at normal temperature, and the opening 710 is sealed by coming into close contact with the notch 201 to form the internal space. 7 is closed to isolate the outside from the outside, and when reflow is performed on the light receiving element, when the outside ambient temperature rises above the specified temperature, it opens in a curved open state as shown by the dotted line in the figure, and the inside Make space 7 communicate with the outside. Therefore, since the internal space 7 is maintained at the same pressure as the outside during reflow, there is no influence in the internal space 7 even when the external temperature reaches approximately 600 K.
- the valve 10 returns to the flat shape again and seals the opening 710. Furthermore, since the pressure in the internal space 7 is further reduced as the temperature decreases, the pressure presses the valve 10 against the packing 201, and the opening 710 is covered with no gap by the valve 10, and the sealing performance can be maintained. Therefore, when the light receiving element is mounted on the FPC or the like, the internal space 7 is isolated from the outside, and air, moisture, and dust do not enter the semiconductor chip 1.
- the predetermined temperature at which the valve 10 is opened and closed is set to be higher than the upper limit of the temperature at which the light receiving element is used or stored, and lower than the temperature of the reflow soldering.
- the upper limit of the temperature used and stored is about 100 ° C.
- the maximum temperature during reflow soldering is 240 ° C. or higher
- the temperature for opening and closing the valve 10 should be 150 to 200 ° C. .
- the temperature at which switching occurs may be higher, / J, or more.
- valve 10 is described as using a metal that changes with temperature, such as a bimetal, it may be realized using a member such as a resin.
- the present embodiment is not limited by the planar shapes of the opening 710 and the valve 10. As long as a close contact state between the valve 10 and the package 2 in the closed state is ensured, it may be rectangular, circular, or elliptical.
- FIG. 8 (a) is a cross-sectional view showing a light receiving element in the fourth embodiment.
- FIG. 8 differs in that an opening 810 is provided in a part of the bottom wall of the package 2 of the first embodiment.
- the internal air pressure is equal to the outside air pressure. It is the same.
- the internal space 7 is isolated from the outside when the opening 810 is in close contact with the substrate when mounted on a substrate such as an FPC. It has the feature of being
- the completed light receiving element is mounted on the FPC 820 by reflow soldering along with other parts (not shown).
- the bottom surface of the package 2 is fixed by an adhesive 830 and the opening 810 is sealed.
- the sealing operation is performed in a reduced pressure environment at normal temperature using a reduced pressure chamber or the like. That is, the pressure of the internal space 7 of the light receiving element in the state where the light receiving element and the FPC 820 are bonded is substantially the same as the pressure of the reduced pressure environment at the time of manufacture.
- the pressure of the internal space 7 of the light receiving element fixed on the FPC 820 is maintained so as to be lower than 1 atm at room temperature. Even if the internal pressure rises as air in the space 7 expands due to the heat of reflow when soldering to the frame 4, the load on the glass flat plate 3 is small and the glass flat plate 3 may come off or be damaged, or the adhesive 8 Since it is possible to prevent cracks from being generated at the same time, it becomes possible to mount the light receiving element by reflow simultaneously with other electric components to be mounted on the FPC. Component mounting is possible.
- the conditions for depressurization may be the same as the conditions described in Embodiment 1.
- fixing of the light receiving element and the FPC 820 under a reduced pressure environment may be performed simultaneously with the force reflow soldering described as being performed before the reflow soldering.
- mounting of the light receiving element and other components and the FPC 820 is performed under a high temperature and reduced pressure environment.
- the substrate is not limited to FPC, but may be another resin substrate.
- the planar shape of the opening 810 is not limited to the force shown as a circle in FIG. 9 (a). It may be any of an ellipse, a rectangle, and the like.
- the opening 810 corresponds to the second opening of the present invention, and the opening of the package 2 in which the flat glass plate 3 is disposed corresponds to the first opening of the present invention.
- FIG. 10 is a block diagram showing an optical head device according to the fifth embodiment.
- 21 is a semiconductor laser
- 22 is a ray emitted from the semiconductor laser 21. It is the best.
- Reference numeral 23 is a condenser lens
- 24 is a raising mirror
- 25 is an objective lens
- 26 is an optical disk.
- Reference numeral 27 denotes a beam splitter, which has the function of separating return light.
- Reference numeral 28 denotes a light receiving element, and the light receiving element described in any one of the first to fourth embodiments of the present invention is used.
- the laser beam 22 having a wavelength of 405 nm emitted from the semiconductor laser 1 becomes parallel light by the condensing lens 23, and the optical path is bent by the rising mirror 24 and enters the objective lens 25.
- the light is focused on the optical disc 26 by the objective lens 25.
- the light reflected by the optical disk 26 returns back to the objective lens 25, the raising mirror 24, and the condenser lens 23, is reflected by the beam splitter 27, is photoelectrically converted by the light receiving element 28, and is detected as an electric signal.
- the electric signal photoelectrically converted and detected by the light receiving element 28 is used as an RF signal of a pit row on the optical disc or a servo signal for tracing a pit row.
- the operation is basically the same during recording. Recording is performed on the optical disc 26 that emits a large amount of light from the semiconductor laser 21.
- the present optical head device uses the light receiving element of the present invention, it is possible to use reflow when soldering other parts of the light receiving element 28, and it is possible to reduce the steps required for mounting the parts. Can provide an optical head device.
- the light receiving element of the present invention is used for detection of an RF signal or a servo signal in the present embodiment, it may be used for detection of a monitor signal for output control of a light source.
- FIG. 11 is a block diagram of an optical information processing apparatus in a sixth embodiment.
- 31 is the optical head apparatus described in the fifth embodiment of the present invention
- 26 is an optical disc
- 32 is a motor, and supports and rotates the optical disc 26.
- 33 is a circuit board
- 34 is a power supply.
- the optical disc 26 is rotated by the motor 32.
- the optical head device 31 sends a signal corresponding to the positional relationship with the optical disc 26 to the circuit board 33.
- the circuit board 33 calculates this signal, and the signal for moving the objective lens in the optical head device 31 or the optical head device 31 is moved.
- Issue the The objective lens in the optical head unit 31 or the optical head unit 31 performs focus servo and tracking servo on the optical disc 26 by a drive mechanism (not shown), and reproduces information from the optical disc 26 or information on the optical disc 26.
- Record or delete the Reference numeral 34 denotes a connection with a power supply or an external power supply, which supplies electricity to the circuit board 33, the optical head unit 31, the motor 32, and the objective lens drive unit. There is no problem if connection terminals to the power supply or external power supply are provided in each drive circuit.
- the optical information processing apparatus of this embodiment uses the optical head apparatus of the present invention, and in this optical head apparatus, the light receiving element is mounted by soldering by reflow simultaneously with other parts. As a result, the manufacturing process is simplified, and a low cost optical information processing apparatus can be provided.
- the light transmitting flat plate of the present invention is a material which is not deteriorated by the light of the force light beam 6 which is implemented by the glass flat plate 3. You may use.
- the present invention can be applied to a light receiving element that enables soldering by reflow in a hollow package, and further, using this light receiving element, an optical medium or magneto-optical medium such as an optical disk or an optical card.
- the present invention can be applied to an optical information processing apparatus that records, reproduces or erases information on the top.
- FIG. 1 A sectional view showing a light receiving element in accordance with a first exemplary embodiment of the present invention
- FIG. 2 A cross-sectional view showing another configuration example of the light receiving element in Embodiment 1 of the present invention.
- FIG. 3 A sectional view showing another configuration example of the light receiving element in the first embodiment of the present invention.
- FIG. 4 A sectional view showing a light receiving element in Embodiment 2 of the present invention
- FIG. 5 A cross-sectional view for illustrating the function of the light receiving element in Embodiment 2 of the present invention
- FIG. 6 (a) A sectional view showing another configuration example of the light receiving element in the second embodiment of the present invention (b) Bottom surface schematically showing another configuration example of the light receiving element in the second embodiment of the present invention Figure
- FIG. 7 A sectional view showing a light receiving element in Embodiment 3 of the present invention 8) (a) A sectional view showing a light receiving element in the fourth embodiment of the present invention (b) A sectional view for explaining the function of the light receiving element in the fourth embodiment of the present invention
- FIG. 11 A block diagram showing an optical information processing apparatus in a sixth embodiment of the present invention.
- FIG. 12 Cross section of a conventional light receiving element
- FIG. 13 Cross section of a conventional light receiving element
Abstract
Description
Claims
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JP2004130956A JP2007242642A (ja) | 2004-04-27 | 2004-04-27 | 受光素子、光ヘッド装置、及び光情報処理装置 |
JP2004-130956 | 2004-04-27 |
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WO2005106964A1 true WO2005106964A1 (ja) | 2005-11-10 |
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PCT/JP2005/007621 WO2005106964A1 (ja) | 2004-04-27 | 2005-04-21 | 受光素子、受光素子の製造方法、光ヘッド装置、及び光情報処理装置 |
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WO (1) | WO2005106964A1 (ja) |
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CN111973167A (zh) * | 2020-08-19 | 2020-11-24 | 青岛歌尔智能传感器有限公司 | 可穿戴设备、光学装置、光学模组及其封装方法 |
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CN111712912B (zh) | 2018-02-13 | 2023-12-22 | 田中贵金属工业株式会社 | 由透光性材料构成的密封用盖 |
Citations (6)
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JP2001284606A (ja) * | 2000-03-28 | 2001-10-12 | Toshiba Corp | 半導体装置およびその製造方法 |
JP2002289958A (ja) * | 2001-03-26 | 2002-10-04 | Kyocera Corp | 光半導体装置 |
JP2002296108A (ja) * | 2001-03-30 | 2002-10-09 | Ihi Aerospace Co Ltd | 光検出素子および光透過材固定構造 |
JP2003197656A (ja) * | 2001-12-27 | 2003-07-11 | Seiko Epson Corp | 光デバイス及びその製造方法、光モジュール、回路基板並びに電子機器 |
JP2003198897A (ja) * | 2001-12-27 | 2003-07-11 | Seiko Epson Corp | 光モジュール、回路基板及び電子機器 |
JP2004031815A (ja) * | 2002-06-27 | 2004-01-29 | Kyocera Corp | 蓋体およびこれを用いた光デバイス収納用パッケージ |
-
2004
- 2004-04-27 JP JP2004130956A patent/JP2007242642A/ja active Pending
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2005
- 2005-04-21 WO PCT/JP2005/007621 patent/WO2005106964A1/ja active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001284606A (ja) * | 2000-03-28 | 2001-10-12 | Toshiba Corp | 半導体装置およびその製造方法 |
JP2002289958A (ja) * | 2001-03-26 | 2002-10-04 | Kyocera Corp | 光半導体装置 |
JP2002296108A (ja) * | 2001-03-30 | 2002-10-09 | Ihi Aerospace Co Ltd | 光検出素子および光透過材固定構造 |
JP2003197656A (ja) * | 2001-12-27 | 2003-07-11 | Seiko Epson Corp | 光デバイス及びその製造方法、光モジュール、回路基板並びに電子機器 |
JP2003198897A (ja) * | 2001-12-27 | 2003-07-11 | Seiko Epson Corp | 光モジュール、回路基板及び電子機器 |
JP2004031815A (ja) * | 2002-06-27 | 2004-01-29 | Kyocera Corp | 蓋体およびこれを用いた光デバイス収納用パッケージ |
Cited By (1)
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CN111973167A (zh) * | 2020-08-19 | 2020-11-24 | 青岛歌尔智能传感器有限公司 | 可穿戴设备、光学装置、光学模组及其封装方法 |
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