WO2005091006A1 - 複数種のテスタに対応可能なプローブ装置 - Google Patents
複数種のテスタに対応可能なプローブ装置 Download PDFInfo
- Publication number
- WO2005091006A1 WO2005091006A1 PCT/JP2005/004698 JP2005004698W WO2005091006A1 WO 2005091006 A1 WO2005091006 A1 WO 2005091006A1 JP 2005004698 W JP2005004698 W JP 2005004698W WO 2005091006 A1 WO2005091006 A1 WO 2005091006A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ring
- probe
- card holder
- card
- conversion
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
Definitions
- the present invention relates to a probe device that can handle a plurality of types of testers. More specifically, the present invention relates to a probe device in which a dedicated connection ring and a probe card can be attached to each of a plurality of types of testers.
- a probe device is used for inspecting electrical characteristics of a device formed on a wafer.
- the example of the probe device includes a loader chamber 1 for transferring a wafer W, and a prober chamber 2 for inspecting electrical characteristics of the wafer W transferred from the loader chamber 1.
- the prober chamber 2 has a mounting table (main chuck) 3 having a built-in elevating mechanism for mounting the wafer W transferred from the loader chamber 1 and an XY table for moving the main chuck 3 in the X and Y directions.
- a probe card 5 disposed above the main chuck 3, a card holding mechanism for detachably holding the probe card 5 (hereinafter, referred to as a "clamp mechanism") (not shown), and a probe card.
- an alignment mechanism 6 for accurately aligning the plurality of probe pins 5A with the plurality of electrode pads of the wafer W on the main chuck 3.
- the alignment mechanism 6 includes an upper camera 6A for imaging the wafer W, and a lower camera 6B attached to the main chuck 3 and imaging the probe pins 5A.
- a head plate 7 is mounted on the upper surface of the prober chamber 2.
- a clamp mechanism for detachably holding the probe card 5 is attached to the opening of the head plate 7.
- the test plate TH of the tester T is rotatably disposed on the head plate 7, and the test head TH and the probe card 5 are electrically connected via a connection ring (pogo ring) 8.
- the test signal from the tester T is transmitted to the probe pin 5A via the test head TH, the performance board, and the pogo ring 8.
- the inspection signal is applied from the probe pin 5A to the electrode pads of Ueno and W, and is used to inspect the electrical characteristics of a plurality of semiconductor elements (devices) formed on the wafer W.
- the inspection content, the number of electrode pads, and the arrangement pattern differ depending on the type of device. Therefore, a plurality of testers can be used depending on the type of device.
- a dedicated test head TH and performance board are prepared for each of the plurality of testers T.
- a probe card 5 and a pogo ring 8 for a specific tester are mounted on the probe device. The pogo ring 8 electrically connects the probe card 5 to the tester's performance board.
- the probe device has a one-to-one relationship with the tester.
- Conventional probe devices can only be electrically connected to specific testers.
- a pogo ring 8 and a probe card 5 corresponding to the performance board of another tester must be prepared.
- the pogo ring 8 has a different number of pogo pins, pin arrangement, and outer shape for each tester.
- the connection structure must be significantly modified, such as by changing the design of the insert ring and the clamp mechanism in accordance with the pogo ring 8 and the probe card 5.
- semiconductor devices have been diversified, device inspections have been diversified, and many types of testers and probe devices have been required.
- Japanese Patent Application Laid-Open No. 2000-349128 discloses a probe device in which an adapter ring is interposed between a pogo ring and an inner ring.
- the change of the tester is handled by the adapter.
- the probe device can use the same inner ring even if the tester is changed by the adapter.
- Japanese Patent Application Laid-Open No. 2000-349128 discloses a connection structure between the probe device side and the tester side.
- the device disclosed in the publication cannot handle a plurality of types of probe cards having different diameters.
- Current probe equipment can handle probe forces up to 350 mm.
- the connection structure disclosed in Japanese Patent Application Laid-Open No. 2000-349128 is applicable to a plurality of types of testers. There was a problem that could not be dealt with.
- the present invention has been made to solve at least one of the above problems.
- a probe that can cope with a large probe card
- An apparatus is provided.
- a probe device capable of supporting a plurality of types of probe cards.
- a probe device including a tester, a probe card, and a base card holder for holding the probe card.
- the probe device comprises:
- a card holder for mounting the probe card to the base card holder a conversion ring configured to relay a connection between the card holder and the base card holder; and a plurality of types of conversion rings.
- a conversion ring suitable for the probe card is selected from among them;
- a base card holder configured to be able to accept the displacement of the plurality of types of conversion rings.
- the probe device may further include one or more of the following (a)-(!).
- the card holder has a plurality of overhangs around the card holder
- the conversion ring includes a plurality of one-touch fixing mechanisms configured to fix the overhangs of the card holder.
- the one-touch fixing mechanism includes a pressing member that presses the overhang portion, and a shaft member that rotatably supports the pressing member.
- the one-touch fixing mechanism has an elastic member for urging the pressing member downward.
- the one-touch fixing mechanism has positioning means for determining a fixing position of the pressing member.
- connection ring for electrically connecting the tester to the probe card, and an inner ring for attaching the connection ring to the insert ring;
- the inner ring is selected from a plurality of types of inner rings, and a type adapted to the connection ring is selected, and the insert ring is configured to accept any of the plurality of types of inner rings.
- the inner ring has a positioning mechanism for determining the vertical position of the probe card dedicated to each tester.
- FIG. 1 is an exploded sectional view showing a main part of an embodiment of a probe device of the present invention.
- FIG. 2 is a cross-sectional view showing a state where each component shown in FIG. 1 is mounted on a probe device.
- FIG. 3 is an exploded perspective view showing a base card holder, a conversion ring, and a card holder used in the probe device shown in FIG. 1.
- FIG. 4A is a cross-sectional view showing a state where the card holder is fixed by the conversion ring shown in FIG. 3, and is a cross-sectional view just before fixing the card holder. .
- FIG. 4B is a cross-sectional view showing a state where the card holder is fixed by the conversion ring shown in FIG. 3, and is a cross-sectional view showing a state where the card holder is fixed.
- FIG. 5 is a perspective view showing a main part of another embodiment of the probe device of the present invention.
- FIG. 6A is an exploded perspective view showing an inner ring corresponding to the conversion ring shown in FIG.
- FIG. 6B is an exploded perspective view showing a main part of the conversion ring shown in FIG. 5.
- FIG. 7A is a cross-sectional view showing a state where the card holder shown in FIG. 5 is fixed to a base card holder, and is a diagram showing a state immediately before fixing.
- FIG. 7B is a cross-sectional view showing a state where the card holder shown in FIG. 5 is fixed to the base card holder, and is a diagram showing the fixed state.
- FIG. 8 is a cross-sectional view showing a part of a conventional probe device in a cutaway manner.
- a probe device capable of coping with a large probe card.
- a probe device capable of supporting a plurality of types of probe cards.
- FIG. 1 shows an example of a probe device 10 of the present embodiment.
- Probe device head plate 1 1, a clamp mechanism 12 attached to the central opening, a base card holder 13 detachably attached to the clamp mechanism 12, and an insert ring 14 attached to the opening of the head plate 11. it can.
- the clamp mechanism 12 and the base card holder 13 can be formed in a size that can accept a large probe card. These can be configured so that probe cards with different outer diameters can be mounted.
- the insert ring 14 can be configured such that a dedicated connection ring (eg, pogo ring) 15 can be mounted on each of the plurality of types of testers T.
- a dedicated connection ring eg, pogo ring
- the base card holder 13 can be formed as a wide ring plate. Further, the diameter of the lower portion of the inner peripheral surface of the ring plate can be formed so as to decrease.
- the base card holder 13 is gripped by the clamp mechanism 12 via a plurality of overhangs 13C.
- the large probe card is directly mounted on the receiving portion 13A of the base card holder 13, and in the case of the current probe card, the probe card with the card holder is attached to the receiving portion 13A of the base force holder 13. It is attached via a conversion ring 16.
- the conversion ring 16 has a function of changing the outer diameter of the probe card 17, as shown in FIG.
- the probe card 17 can be mounted on the base card holder 13 by the conversion ring 16. Since the probe card 17 and its card holder 20 (see Fig. 3) differ depending on the devices formed on the Ueno and W, it is necessary to prepare a dedicated probe card 17 for multiple testers and / or a conversion ring 16 corresponding to the card holder. is necessary
- the conversion ring 16 can have a structure corresponding to the outer shape of the probe card 17.
- FIG. 1 shows, as an example of the conversion ring 16, a conversion ring 16 employing a ring-shaped plate structure.
- the inner peripheral surface of the ring-shaped plate has a reduced diameter.
- the conversion ring 16 has a receiving portion 16A for supporting the card holder 20 (see FIG. 3), and a flange portion 16B formed on the outer peripheral surface of the ring-shaped plate with an enlarged diameter.
- Flange 16 B engages with the receiving portion 13A of the base card holder 13.
- the probe card 17 with the card holder 20 (see FIG. 3) is mounted on the conversion ring 16 as shown by the arrow in FIG.
- the conversion ring 16 is mounted on the base card holder 13.
- the integrated product obtained by integrating the probe card 17, the conversion ring 16, and the base card holder 13 is transported to a position directly below the clamp mechanism 12 via a transport mechanism (not shown).
- the probe card 17 is fixed to the probe device 10 by the clamp mechanism 12 holding the base card holder 13 in a state in which the integrated object is lifted.
- the insert ring 14 can have a ring-like structure.
- the diameter of the lower part of the inner peripheral surface of the insert ring 14 is reduced, and a receiving portion 14A is formed.
- the diameter of the upper part of the insert ring 14 is enlarged to form a flange portion 14B.
- the flange portion 14B of the insert ring 14 is fixed to the head plate 11 by a fastening member such as a screw.
- An inner ring 18 can be attached to the receiving portion 14A of the insert ring 14 as needed.
- the inner ring 18 may have a structure corresponding to the pogo rings 15 for a plurality of types of testers.
- the inner ring 18 may have a ring-like structure as shown in FIG.
- the diameter of the inner peripheral surface can be reduced to form the receiving portion 18A.
- the diameter of the upper part of the outer peripheral surface of the inner ring 18 is enlarged to form a flange portion 18B.
- the flange portion 18B can be configured to engage with the receiving portion 14A of the insert ring 14. Therefore, when a pogo ring adapted to the tester T among a plurality of types of pogo rings 15 is mounted on the insert ring 14, the inner ring 18 is first mounted on the insert ring 14, as indicated by the arrow in the figure. Thereafter, the pogo ring 15 can be attached to the inner ring 18.
- the base card holder, the conversion ring, and the probe card (see FIG. 1) will be specifically described with reference to FIGS. 3 and 4.
- the base card holder 13 can have the receiving portion 13A, the wall portion 13B, and the plurality of overhang portions 13C as described above.
- the conversion ring 16 can have the receiving portion 16A and the flange portion 16B as described above.
- the receiving portion 13A of the base card holder 13 and the flange portion 16B of the conversion ring 16 are fixed by a plurality of screw members 19.
- the probe card 17 is mounted on the conversion ring 16 via the card holder 20, as shown in FIG. However, in FIG. 3, only the card holder 20 is shown and the probe card 17 is omitted.
- the card holder 20 can have a ring-shaped structure as shown in FIG. The diameter of the lower portion of the inner peripheral surface of the card holder 20 is reduced, and the receiving portion 20A can be formed.
- the plurality of overhangs 20B can also be formed so that the upper force of the outer peripheral surface is substantially radial.
- the conversion ring 16 is fitted with the overhang portion 20B, and the receiving portion 16A of the conversion ring 16 supports the card holder 20.
- the conversion ring 16 can have two one-touch fixing mechanisms 21, for example, as shown in FIG.
- the one-touch fixing mechanism 21 fixes the card holder 20 on the conversion ring 16.
- These one-touch fixing mechanisms 21 are arranged on the flange portion 16B of the conversion ring 16 at a circumferential angle of 180 °.
- the one-touch fixing mechanism 21 penetrates a pressing member 21A for pressing the projecting portion 20B of the card holder 20 and a hole formed at the center of the pressing member 21A. It can have a shaft member 21B erected on the inner peripheral edge of the conversion ring 16 and a coil spring 21C mounted between the flange portion at the upper end of the shaft member 21B and the holding member 21A.
- the cross section of the holding member 21A can be rectangular.
- the coil spring 21C constantly urges the holding member 21A downward.
- the lower end of the coil spring 21C can be fitted into a ring-shaped recess surrounding the hole of the pressing member 21A.
- a pair of positioning projections 21D can be attached to the lower surfaces of both ends of the holding member 21A.
- a pair of first recesses 21E and 2IF, which are positioning means, into which the protrusions 21D are fitted are formed on the upper surfaces of the conversion ring 16 and the overhanging portion 20B of the card holder 20, respectively.
- a pair of second recesses (not shown) into which the projections 21D of the holding member 21A are fitted can be formed on the upper surfaces of the conversion rings 16 along the circumferential direction around the shaft member 21B.
- a line connecting the first concave portions 21E and 21F and a line connecting the second concave portions are orthogonal to each other.
- the protrusion 21D of the pressing member 21A of the one-touch fixing mechanism 21 is fitted in the second recess on the upper surface of the flange 16B.
- the holding member 21A of the one-touch fixing mechanism 21 is lifted along the shaft member 21B against the elasticity of the coil spring 21C and rotated by 90 ° C., as shown in FIG. Then, it is arranged so as to cross the boundary between the conversion ring 16 and the card holder 20.
- the pressing member 21A is released in this state, the pressing member 21A moves downward by the urging force of the coil spring 21C as shown in FIG. 4B.
- the protrusion 21D fits into the first recesses 21E and 21F.
- the card holder 20 is pressed by the conversion ring 16 and is fixed.
- a concave portion 18A into which the upper end portion of the shaft member 21B fits can be formed on the lower surface of the inner ring 18, as shown in FIG. 4B.
- the probe card 17 in the present embodiment When mounting the probe card 17 in the present embodiment on the probe device 10, first, the probe card 17 is mounted on the card holder 20 shown in FIG. 3, and the card holder 20 is mounted on the conversion ring 16. At this time, the projecting portion 20B of the card holder 20 is aligned so as to be opposed to the touch fixing mechanism 21 of the conversion ring 16. Next, the pressing member 21A of the one-touch fixing mechanism 21 is lifted and rotated by 90 °, and the projection 21D is released according to the first concave portions 21E and 21F of the flange portion 16B and the overhang portion 20B. The holding member 20A fixes the probe card 17 on the conversion ring 16.
- the positioning hole 16C of the conversion ring 16 and the positioning protrusion 13D of the base card holder 13 are aligned. Attach the conversion ring 16 to the base card holder 13.
- the probe card is attached to the base holder 13 by fastening the both 13 and 16 with screws.
- a card holder transport mechanism (not shown) transports the probe card to just below the clamp mechanism 12. As shown by the arrow in the figure, the probe card is lifted, and the protrusion 13C of the base card holder 13 is fitted into the clamp mechanism 12.
- the clamp mechanism 12 grips and fixes the overhang 13C while positioning in the vertical direction.
- the mounting of the probe card on the probe device 10 is completed.
- the inner ring 18 is attached to the insert ring 14.
- the base card holder 13 formed on the probe card 17 with a diameter larger than the outer diameter of the card holder 20 dedicated to the probe card 17, and the base card holder 13 Since a conversion ring 16 is provided to relay the connection between the card holder 20 and the base card holder 13 when the probe card 17 is attached to the probe card 13, even if the probe card 17 is of a different type, each card holder 20
- the probe card 17 can be securely mounted on the base card holder 13 via the conversion ring 16 according to the condition, and the dedicated probe card 17 can be mounted on a plurality of types of testers for inspection.
- the base card holder 13 can accommodate various probe cards of an acceptable size. Further, with respect to a large probe card, by using the base card holder 13 itself as a card holder for the probe card, it is possible to support a large probe card.
- the probe card 17 can be attached to and detached from the conversion ring 16 with one touch only by operating the holding member 21 A of the one-touch fixing mechanism 21 provided on the conversion ring 16. By this operation, the probe card 17 can be attached to and detached from the base card holder 13 in a short time.
- FIG. 5 to FIG. 7 are diagrams each showing a main part of a probe device according to another embodiment of the present invention.
- the probe device 10 of the present embodiment includes a card holder, a conversion ring, and an inner ring for mounting a probe card of a type different from that of the above-described embodiment.
- a configuration can be employed. Therefore, a card holder, conversion ring, and inner ring different from those in the above embodiment are used.
- a probe card (not shown) used in the present embodiment is mounted on the probe device 10 by a card holder 120 shown in FIG. 5 and FIGS. 7A and 7B.
- This card holder 120 can have a ring-shaped structure as shown in FIG.
- the force holder 120 includes a receiving portion 120A for receiving the outer peripheral edge of the probe card on the back surface, a wall 120B extending upward from the outer peripheral edge of the receiving portion 120A, and a wall.
- a plurality (three in this embodiment) of overhanging portions 120C radially formed at predetermined intervals in the circumferential direction at the upper portion of the portion 120B and the conversion ring 116 provided on the lower end surface of the wall portion 120B.
- the conversion ring 116 can be formed as a ring-shaped plate as shown in FIG. Its inner diameter is large enough to fit into the wall 120B of the card holder 120 and can be large enough to engage with the overhang 120C.
- the flange portion 116B formed on the upper peripheral surface of the conversion ring 116 engages with the receiving portion 13A of the base card holder 13.
- two positioning recesses 116D corresponding to the projections 120D of the card holder 120 can be formed on the inner peripheral edge of the conversion ring 116.
- the positions of the projections 120D are adjusted by fitting the projections 120D into the recesses 116D.
- three one-touch fixing mechanisms 121 can be arranged corresponding to the positions of the projecting portions 120C of the card holder 120.
- the one-touch fixing mechanism 121 includes a pressing member 121A that presses the projecting portion 120C of the card holder 120, and a shaft member 121B that penetrates a collar formed at one end of the pressing member 121A and is erected on the inner peripheral edge of the conversion ring 116. And can have.
- a protrusion is formed around the entire circumference in the middle of the inner peripheral surface of the collar of the pressing member 121A.
- a coil spring 121C is mounted between the projection and the upper surface of the conversion ring 116. The coil spring always urges the holding member 121A upward.
- the pressing member 121A elastically contacts the flange portion of the shaft member 121B.
- Vertical grooves (not shown) can be formed at two locations on the outer peripheral surface of the collar at 180 ° intervals in the circumferential direction. The direction of the pressing member 121A is determined by these grooves as described later.
- a first positioning mechanism 122 can be provided on the inner peripheral edge of the conversion ring 116 at a position adjacent to each shaft member 121B.
- the first positioning mechanism 122 can include a rectangular block body 122A fixed to the inner peripheral edge of the conversion ring 116, and a ball plunger 122B.
- the ball plunger 122B is buried in a radial direction of the conversion ring 116 in the block body 122A.
- the direction of the holding member 121A is determined by fitting the tip of the ball plunger 122B into the groove on the outer peripheral surface of the collar of the holding member 121A. Accordingly, the pressing member 121A can move up and down slightly along the groove.
- the inner ring 118 has three second positioning mechanisms. 123 can be provided.
- the second positioning mechanism 123 is arranged corresponding to the one-touch fixing mechanism 121 of the conversion ring 116.
- the second positioning mechanism 123 positions the probe card in the vertical direction (Z direction).
- the second positioning mechanism 123 can be formed in an arc shape, for example, as shown in FIG. 6A.
- the second positioning mechanism 123 includes a pair of flat bars 123A and 123B attached to both upper and lower surfaces of the inner ring 118, and a plurality of elastic members (described later) between the upper and lower flat bars 123A and 123B.
- This embodiment has seven (7) coil springs 123C, and a guide pin 123D having a pair of heads for vertically connecting the lower flat bar 123B to the inner ring 118 at both ends.
- the upper flat bar 123A is formed shorter than the lower flat bar 123B, and can be screwed at a plurality of places in the shallow recess 118A of the inner ring 118. Since the probe card is attracted to the pogo ring side, the number of coil springs 123C is appropriately set according to the attraction force of the probe card.
- seven first through holes 118B are formed in the recessed portion 118A of the inner ring 118 at equal intervals in the circumferential direction of the inner ring 118.
- the coil spring 123C penetrates through these through holes 118B, and is elastically mounted between the upper and lower flat bars 123A and 123B.
- a second through-hole 118C can be formed in each of the outer sides in the circumferential direction of the recessed portion 118A of the inner ring 118.
- the guide pin 123D passes through these through holes 118C.
- the upper end of the guide pin 123D is screwed into the second through hole 118C of the inner ring 118 via the washer 123E.
- a gap is formed between the head of each guide pin 123D and the lower surface of the inner ring 118.
- flat bar 123B of the lower can be force s vertically moved against the elastic force of the coil spring 123C.
- Seven recesses can be formed in the lower flat bar 123B to prevent displacement of the coil spring 123C.
- a probe card (not shown) is mounted on the card holder 120 shown in FIG. 5, and the card holder is mounted on the conversion ring 116.
- the card holder 120 is mounted on the conversion ring 116 so that the projection 120D of the card holder 120 is aligned with the recess 116D of the conversion ring 116.
- the projecting portion 120C of the card holder 120 is opposed to the one-touch fixing mechanism 121 of the conversion ring 116.
- the tip of the ball plunger 122B of the first positioning mechanism 122 is released from the groove force of the collar of the holding member 121A.
- the positioning hole 116 C of the conversion ring 116 and the positioning protrusion 13 D of the base card holder 13 are aligned. Attach the conversion ring 116 to the base card holder 13 and fasten the two 13 and 116 with screws.
- a card holder transport mechanism (not shown) transports the probe card to just below the clamp mechanism 12. As shown by the arrow in FIG. 7A, the probe card is lifted, and the protrusion 13C of the base card holder 13 is fitted into the clamp mechanism 12. The clamping mechanism 12 does not position vertically, and holds and fixes the overhang 13C.
- the pressing member 121A of the one-touch fixing mechanism 121 elastically contacts the flat bar 123B below the second positioning mechanism 123.
- the pressing member 121A presses the projecting portion 120C of the card holder 120 to fix the card holder 120 on the conversion ring 116.
- the flat bar 123B is lifted up against the elasticity of the coil spring 123C to position the probe card at a predetermined Z position, and the probe card is mounted on the probe device 10.
- the inner ring 118 is attached to the insert ring 14.
- the probe card can be removed in the reverse process of mounting.
- the present invention is not limited to the above-described embodiment, but may be varied depending on the type of tester. By preparing a number of inner rings and conversion rings, the probe device can be adapted to various testers.
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05726695.9A EP1736787A4 (en) | 2004-03-19 | 2005-03-16 | TEST DEVICE SUITABLE FOR A VARIETY OF DIFFERENT TESTERS |
US11/522,984 US7323893B2 (en) | 2004-03-19 | 2006-09-19 | Probe device capable of being used for plural kinds of testers |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-079510 | 2004-03-19 | ||
JP2004079510A JP2005265658A (ja) | 2004-03-19 | 2004-03-19 | 複数種のテスタに対応可能なプローブ装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/522,984 Continuation US7323893B2 (en) | 2004-03-19 | 2006-09-19 | Probe device capable of being used for plural kinds of testers |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005091006A1 true WO2005091006A1 (ja) | 2005-09-29 |
Family
ID=34993841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/004698 WO2005091006A1 (ja) | 2004-03-19 | 2005-03-16 | 複数種のテスタに対応可能なプローブ装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7323893B2 (ja) |
EP (1) | EP1736787A4 (ja) |
JP (1) | JP2005265658A (ja) |
KR (1) | KR100845349B1 (ja) |
CN (1) | CN100545666C (ja) |
TW (1) | TW200533923A (ja) |
WO (1) | WO2005091006A1 (ja) |
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US6408500B1 (en) * | 2000-09-15 | 2002-06-25 | James Orsillo | Method of retrofitting a probe station |
US7652491B2 (en) * | 2006-11-17 | 2010-01-26 | Suss Microtec Test Systems Gmbh | Probe support with shield for the examination of test substrates under use of probe supports |
US7471078B2 (en) * | 2006-12-29 | 2008-12-30 | Formfactor, Inc. | Stiffener assembly for use with testing devices |
JP4514236B2 (ja) * | 2008-02-25 | 2010-07-28 | 株式会社協同 | プローブカード移載装置 |
KR101101535B1 (ko) * | 2008-03-14 | 2012-01-02 | 송원호 | 프로브블록 |
KR101222504B1 (ko) * | 2008-09-26 | 2013-01-15 | 가부시키가이샤 아드반테스트 | 테스트부유니트 및 테스트헤드 |
CN101738575B (zh) * | 2008-11-11 | 2013-08-21 | 京元电子股份有限公司 | 可换用不同探针卡的ic测试机台 |
JPWO2011013231A1 (ja) * | 2009-07-30 | 2013-01-07 | 株式会社アドバンテスト | プローブカード保持装置及びプローバ |
JP2011064659A (ja) * | 2009-09-21 | 2011-03-31 | Tokyo Electron Ltd | プローブカードのクランプ機構及び検査装置 |
JP2011089891A (ja) * | 2009-10-22 | 2011-05-06 | Micronics Japan Co Ltd | 電気的接続装置及びこれを用いる試験装置 |
TWI415204B (zh) * | 2010-04-28 | 2013-11-11 | Wen Chyimr Chen | 測試板 |
KR101101559B1 (ko) * | 2010-10-06 | 2012-01-02 | 송원호 | 프로브블록의 실리콘전극기판 제조방법 |
JP5788767B2 (ja) * | 2011-11-07 | 2015-10-07 | 株式会社日本マイクロニクス | プローブブロックとそれを備えるプローブカード並びにプローブ装置 |
CN103207290A (zh) * | 2012-01-12 | 2013-07-17 | 瑞统企业股份有限公司 | 改良的电路板的测试治具结构 |
JP2013246153A (ja) * | 2012-05-29 | 2013-12-09 | Micronics Japan Co Ltd | プローブカード |
JP6488281B2 (ja) * | 2013-05-14 | 2019-03-20 | フォームファクター, インコーポレイテッド | 交換可能プローブヘッドの自動取り付け及び取り外し |
KR101754175B1 (ko) * | 2014-12-27 | 2017-07-05 | 싱크-테크 시스템 코포레이션 | 업그레이드 기능을 구비한 테스트 기기 |
TWI583963B (zh) * | 2016-04-18 | 2017-05-21 | 旺矽科技股份有限公司 | 探針卡 |
KR102566685B1 (ko) * | 2016-07-18 | 2023-08-14 | 삼성전자주식회사 | 프로브 카드용 클램핑 장치 및 이를 포함하는 프로브 카드 |
TWI620937B (zh) * | 2017-04-17 | 2018-04-11 | 中華精測科技股份有限公司 | 微米細針吸取裝置及其使用方法 |
US11379004B2 (en) * | 2018-08-08 | 2022-07-05 | Hewlett-Packard Development Company, L.P. | Adjustment control mechanisms of pogo pins |
JP7138004B2 (ja) * | 2018-09-28 | 2022-09-15 | 株式会社日本マイクロニクス | プローブカード保持具 |
TWM580255U (zh) | 2019-01-25 | 2019-07-01 | 和碩聯合科技股份有限公司 | 旋鈕裝置 |
CN116774012B (zh) * | 2023-08-15 | 2023-10-20 | 深圳市微特精密科技股份有限公司 | 一种ict测试夹具及测试装置 |
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JP2000150596A (ja) * | 1998-11-10 | 2000-05-30 | Tokyo Seimitsu Co Ltd | プローバ |
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2004
- 2004-03-19 JP JP2004079510A patent/JP2005265658A/ja active Pending
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2005
- 2005-03-03 TW TW094106464A patent/TW200533923A/zh unknown
- 2005-03-16 EP EP05726695.9A patent/EP1736787A4/en not_active Withdrawn
- 2005-03-16 WO PCT/JP2005/004698 patent/WO2005091006A1/ja not_active Application Discontinuation
- 2005-03-16 CN CNB2005800016070A patent/CN100545666C/zh active Active
- 2005-03-16 KR KR1020067019266A patent/KR100845349B1/ko active IP Right Grant
-
2006
- 2006-09-19 US US11/522,984 patent/US7323893B2/en active Active
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JPS6453428A (en) * | 1987-05-01 | 1989-03-01 | Tokyo Electron Ltd | Automatic exchange of probe card |
JPS63299243A (ja) * | 1987-05-29 | 1988-12-06 | Tokyo Electron Ltd | プロ−ブカ−ドアダプタ |
JP2000349128A (ja) * | 1999-06-04 | 2000-12-15 | Tokyo Seimitsu Co Ltd | プローバ装置のプローバ側とテスタ側との接続方法及びその構造 |
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Also Published As
Publication number | Publication date |
---|---|
EP1736787A4 (en) | 2014-04-02 |
KR100845349B1 (ko) | 2008-07-09 |
CN100545666C (zh) | 2009-09-30 |
US20070007979A1 (en) | 2007-01-11 |
KR20060130660A (ko) | 2006-12-19 |
CN1906496A (zh) | 2007-01-31 |
EP1736787A1 (en) | 2006-12-27 |
US7323893B2 (en) | 2008-01-29 |
TWI354794B (ja) | 2011-12-21 |
TW200533923A (en) | 2005-10-16 |
JP2005265658A (ja) | 2005-09-29 |
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