WO2004095895A1 - Euv光発生装置におけるデブリ回収装置 - Google Patents
Euv光発生装置におけるデブリ回収装置 Download PDFInfo
- Publication number
- WO2004095895A1 WO2004095895A1 PCT/JP2004/005815 JP2004005815W WO2004095895A1 WO 2004095895 A1 WO2004095895 A1 WO 2004095895A1 JP 2004005815 W JP2004005815 W JP 2004005815W WO 2004095895 A1 WO2004095895 A1 WO 2004095895A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- debris
- light
- plasma
- laser
- laser light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/009—Auxiliary arrangements not involved in the plasma generation
- H05G2/0094—Reduction, prevention or protection from contamination; Cleaning
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps
Definitions
- the present invention relates to an EUV light generation apparatus used for a light source such as an exposure apparatus, and more particularly to an apparatus for collecting debris generated when EUV light is generated.
- Photolithography technology for optically transferring circuit patterns onto semiconductor wafers is important for the integration of LSIs.
- An exposure apparatus used for photolithography mainly uses a reduction projection exposure method called stepper. That is, the transmitted light of an original (reticle) pattern illuminated by an illumination light source is projected onto a photosensitive material on a semiconductor substrate by a reduction projection optical system to form circuits and turns. The resolution of this projected image is limited by the wavelength of the light source used. For this reason, the wavelength of the light source has been gradually shortened to the ultraviolet region along with the demand for finer pattern line width.
- KrF excimer laser (wavelength 248 nm) and ArF excimer laser (wavelength 193 nm) that emit light in the deep ultraviolet region (DUV light) are used as light sources, or light in the vacuum ultraviolet region (VUV light) is oscillated.
- An F2 laser (wavelength 157 m m) has been developed as a light source.
- EUV light source wavelength 13.5 nm
- EUV light the Extreme Ultra Violet
- LPP Laser Excited Plasma
- FIG. 11 conceptually shows the structure of an E UV light generator used as a light source of an exposure apparatus.
- a condensing mirror 41 for condensing EUV light is provided in the chamber 4.
- the EUV light collected by the collection mirror 41 is transmitted to an illumination optical system (not shown) outside the chamber 4 and a semiconductor circuit pattern is formed on the semiconductor wafer using the E UV light.
- the inside of the chamber 4 is evacuated by a vacuum pump or the like to be in a vacuum state. This is because EUV light can not propagate efficiently unless its wavelength is as short as 13.5 nm in vacuum.
- a liquid 1 which is an E UV light generating material is dripped.
- liquid xenon (Xe) is used as the evening gate 1.
- the diameter of the evening gate 1 is about 10 m.
- the laser oscillator 10 is, for example, a YAG laser, and near infrared laser light L is pulsed.
- the laser light L is emitted toward the target 1.
- the irradiation direction of the laser light L is perpendicular to the traveling direction of the evening get 1.
- the target 1 When the first get 1 is irradiated with the laser light L, the target 1 is excited to a plasma state to generate E UV light.
- the generated plasma 2 has a diameter of about several 10 / m to 1 mm.
- the generated E UV light diverges in all directions centering on the plasma 2.
- a focusing mirror 41 is disposed so as to surround the plasma 2. EUV light which diverges in all directions is collected by a collection mirror 41, and the collected EUV light is reflected and led to the illumination optical system.
- a part of the evening get 1 is split and scattered by the shock wave at the time of plasma generation, and becomes debris 3.
- Debris 3 contains fast ions and debris that did not become plasma.
- a collection cylinder 130 is provided in the advancing direction of the evening target 1.
- the recovery cylinder 130 is provided to recover the burnt of the evening get 1 and the evening gate 1 not irradiated with the pulse laser light L.
- a recovery mechanism 1 31 is provided in addition to the recovery cylinder 130.
- the recovery mechanism 1 31 is composed of a filter, a vacuum pump, etc., and traps or evacuates the debris 3 recovered in the recovery cylinder 130 and discharges it to the outside.
- the debris 3 floats in the chamber 4 with almost no recovery in the recovery cylinder 130. Leaving the debris 3 in the chamber 4 is undesirable in terms of light output efficiency due to the durability of the E UV light generator.
- debris 3 of high-speed ions collides with an optical device such as the condensing mirror 41 1 to scratch the smooth reflecting surface of the condensing mirror 41 1 or the like, thereby impairing the durability of the optical system o
- gasification of the debris 3 reduces the degree of vacuum in the chamber 4 and reduces the propagation efficiency of the E UV light, thereby reducing the output of the E UV light.
- Patent Document 1 describes a technique in which debris generated from a cryotarget (a substance that is gaseous at normal temperature) is exhausted to the outside of a chamber by a vacuum pump.
- a cryotarget a substance that is gaseous at normal temperature
- Patent Document 2 a transmission film is disposed on the incident surface side of the return mirror of the illumination optical system, and debris contained in the E UV light path reflected by the collection mirror is absorbed or absorbed by the transmission film. The technology to do is described.
- Patent Document 1 Japanese Patent Application Publication No. 2 0 0 0-3 4 9 0 0 9 Disclosure of the Invention
- the above-mentioned prior art 1 is a technology that exhausts and recovers gaseous debris by vacuum pump to the outside of the chamber by vacuum pump, and for debris that collides with the collecting mirror at high speed from plasmaized evening gate, The problem is expected that the effect is low and debris collection efficiency is low.
- the above-mentioned prior art 2 is a technology of recovering debris in the E UV light path reflected by the collecting mirror afterward with a transmission filter, and collects debris which collides with or adheres to the collecting mirror. It is not possible.
- the present invention has been made in view of the above circumstances, and efficiently collects debris that collides with a focusing mirror at high speed from plasmaized sunset and debris that adheres to the focusing mirror.
- the object of the present invention is to improve the durability of the optical device including the condenser mirror in the chamber, maintain the degree of vacuum in the chamber, and suppress the decrease in the output of EUV light.
- the first invention is a first invention.
- Debris collection means for collecting debris is arranged opposite to the irradiation surface to which the laser light is irradiated among the faces of the target.
- the present invention is based on the finding that the debris 3 is most abundantly generated on the irradiation surface side (direction perpendicular to the irradiation surface) to which the laser light L is irradiated among the surfaces of the flat gate 1 (plasma 2). It was done.
- the debris collection means 30 for collecting debris is disposed opposite to the irradiation surface to which the laser light L is irradiated among the surfaces of the target 1. Since the largest number of debris 3 is generated on the irradiation surface side of the laser light L, a large number of debris 3 generated is a collection means disposed facing the laser irradiation surface Collection tube) 30 is efficiently recovered. Debris 3 is efficiently recovered without colliding with or adhering to the optical devices in the light source 4 such as the collector mirror 1 1 1. As a result, the durability of the optical instrument including the condensing mirror 41 in the chamber 4 is improved, the degree of vacuum of the chamber 4 is maintained, and the reduction in the output of the E UV light is suppressed.
- the second invention is a first invention.
- the evening gate is put into a plasma state by emitting laser light from the laser light irradiation means to the advancing target, and is applied to the EUV light generation apparatus to generate EUV light.
- the debris recovery unit in the E UV light generator configured to collect the
- a laser beam irradiation unit is disposed such that the laser irradiation direction and the target traveling direction are opposite to each other;
- Debris collection means for collecting debris should be arranged in the direction of evening get.
- the laser light irradiation means 10 is disposed so that the irradiation direction of the laser light L is opposite to the traveling direction of the target 1. Then, debris collecting means 30 for collecting the debris 3 is disposed in the direction of movement of the train 1.
- the laser beam L is irradiated to face the traveling direction of the evening target 1
- the largest amount of debris is on the traveling direction side of the evening get 1 which is the irradiation surface side of the evening get 1. 3 is generated, and this large amount of generated debris 3 is collected on the side of the direction in which the evening get 1 travels.
- the debris 3 is diffused while progressing toward the debris collection means 30 with the advancing speed of the evening get 1 as the initial speed when irradiated with the laser light L.
- the debris 3 rapidly reaches the debris recovery means 30 at a speed according to the speed of the spring 1 so that the debris 3 can reach the debris recovery means 30 before the debris 3 spreads widely. Can be For this reason, the collection efficiency of debris 3 is further improved as compared with the first invention.
- the time for the debris 3 to reach the debris recovery means 30 can be further shortened, and the recovery efficiency of the debris 3 can be further enhanced.
- Laser light irradiation means for plasma generation for irradiating the evening get with a laser beam for generating plasma with one energy level enough to bring the evening gate into a plasma state, E UV light heating the evening get brought into the plasma state Addition of a plasma heating laser light to the evening gate to generate an energy level enough to generate Laser beam irradiation means for heat and
- Debris recovery means is disposed facing the irradiation surface to which the laser light for plasma generation is applied among the surfaces of the target.
- the generation amount of debris 3 is the largest at the initial stage of laser irradiation, and the smaller the irradiation energy of laser light L, the less the debris 3 is generated. If the irradiation energy at the initial stage of laser irradiation is reduced It was made based on the finding that the amount of generation can be suppressed.
- the laser light L 1 for generating plasma from the laser light irradiation means 11 for plasma generation has an energy level enough to bring the target 1 into a plasma state. It is irradiated to 1.
- a plasma heating laser light L 2 having an energy level enough to generate EUV light from the plasma heating laser light irradiator 12 by heating the evening get 1 in a plasma state is set. It is irradiated to gate 1.
- the debris collection means 30 is disposed to face the irradiation surface to which the laser light L 1 for plasma generation is applied among the surfaces of the target 1.
- the generated debris 3 is efficiently recovered by the debris recovery means 30 disposed on the irradiation surface side of the target 1. Furthermore, EUV light is generated by irradiating the plasma gate 1 with a relatively high energy level of the plasma heating laser light L 2 to the plasma state.
- the fourth invention is the second invention
- the plasma generation laser light irradiation means for irradiating the target with a laser light for plasma generation at an energy level that brings the evening get into a plasma state, and the UV light heated to the plasma state
- the laser light application means for plasma generation is arranged such that the irradiation direction of the laser light for plasma generation and the advancing direction of the evening light face each other
- the laser beam L 1 for generating plasma from the laser beam irradiation means 11 for plasma generation is an energy level enough to turn the target 1 into a plasma state. It is irradiated to 1.
- the plasma heating heater Next is the plasma heating heater.
- the light irradiation means 12 heats the evening gate 1 in the plasma state to generate EUV light, and the plasma heating laser light L 2 of an energy level to an extent that generates EUV light is irradiated to the evening target 1
- the laser light irradiation means 1 1 for plasma generation is disposed such that the irradiation direction of the laser light L 1 for plasma generation and the traveling direction of the target 1 are opposite to each other.
- the debris 3 By irradiating the evening get 1 with plasma light L 1 having a relatively low energy level, it is possible to reduce the initial generation amount of debris 3. Then, as in the second aspect of the invention, the debris 3 rapidly propagates toward the debris recovery means 30 at a speed corresponding to the advancing speed of the target 1 so that the debris 3 can be recovered before the debris 3 diffuses widely. The recovery efficiency of debris 3 is further improved. EUV light is generated by irradiating the evening light 1 with the plasma state with laser light L2 for plasma heating, which has a relatively high energy level.
- the fifth invention relates to the first invention
- the laser beam for plasma generation at an energy level that brings the target into a plasma state First, the target that has been brought into the plasma state is heated to generate an E UV light.
- the laser beam L1 for plasma generation and the laser beam L2 for plasma heating are separated by a time delay. It is irradiated to 1.
- the amount of debris 3 generated at the initial stage can be reduced by irradiating the plasma gate 1 for plasma generation L 1 with a relatively low energy level to the evening gate 1, and then the energy relative to the energy is relatively low.
- EUV light is generated by irradiating the high-level plasma heating laser light L 2 to the plasma gate 1. Then, as in the first aspect of the invention, the generated debris 3 is efficiently recovered by the debris recovery means 30 disposed on the irradiation surface side of the target 1.
- the device configuration is compared with the third invention. Can be simplified.
- the sixth invention relates to the second invention
- the laser beam for generating plasma at an energy level to bring the target into a plasma state is heated first, and then the plasma gate is heated to generate an E UV light.
- the light is it evening Means for irradiating the target
- the laser beam L1 for plasma generation and the laser beam L2 for plasma heating are separated by time intervals. Irradiated.
- the amount of debris 3 generated initially can be reduced by irradiating the evening getter 1 with the laser beam L 1 for plasma generation having a relatively low energy level, and the second higher energy level EUV light is generated by irradiating the plasma gate 1 with the plasma heating laser light L 2. Then, as in the second aspect of the invention, the debris 3 is rapidly collected toward the debris recovery means 30 at a speed corresponding to the advancing speed of the evening get 1 before the debris 3 diffuses widely. It is possible to reach 30 and the efficiency of recovery of debris 3 is further improved.
- the seventh invention relates to the first invention
- the debris recovery means is a cylinder having a space in which debris is accommodated, and a space for allowing laser light to pass is formed in the cylinder.
- the seventh invention technically limits the debris recovery means 30 of the first invention to a recovery cylinder 30, and as shown in FIG. 4, the space formed in the recovery cylinder 30 can be used as a laser.
- the light L passes through and illuminates the sunset 1 and debris 3 is recovered in the space formed in the recovery cylinder 30.
- the eighth invention is the second invention
- the debris recovery means is a cylinder having a space in which debris is accommodated, and a space for allowing laser light to pass is formed in the cylinder.
- the eighth invention technically limits the debris recovery means 30 of the second invention to a recovery cylinder 30.
- the space 33 formed in the recovery cylinder 30 is The light L passes through and illuminates the sunset 1, and debris 3 is recovered in the space 32 formed in the recovery cylinder 30.
- the ninth invention relates to the first invention
- the debris recovery means is a cylinder having a space in which debris is accommodated, and the optical system is disposed such that the laser beam passes through the outside of the cylinder.
- the debris recovery means 30 is a recovery cylinder 30 having a space in which the debris 3 is accommodated,
- the laser light L passes through the outside of the recovery cylinder 30 via the optical systems 2 1 and 2 2 and is applied to the sunset 1.
- the ninth aspect of the present invention there is no need to form a space for the laser light L to pass through the recovery cylinder 30, and since the portion can be used as a recovery space, the debris collection efficiency can be further enhanced. Can.
- the debris recovery means is a cylinder having a space in which debris is accommodated, and the optical system is disposed such that the laser beam passes through the outside of the cylinder.
- the tenth invention is a technical limitation of the second invention, and as shown in FIG. 3, the debris recovery means 30 is a recovery cylinder 30 having a space in which the debris 3 is accommodated.
- the laser light L passes through the outside of the collection cylinder 30 via the systems 2 1 and 2 2 and is irradiated to the evening gate 1.
- the debris 3 recovery efficiency Can be further enhanced.
- the first one invention is a first one invention.
- the debris recovery system in the E UV light generator which collects debris generated in the
- the debris contains charged particles
- Debris recovery means for recovering debris are disposed in the direction of the first get, and magnetic force line generating means for generating magnetic lines of force leading charged particles to the debris recovery means are provided.
- debris 3 spreads at a velocity V as shown in FIG.
- magnetic field lines 51 can be formed by magnetic field line generating means 50.
- the velocity V of the debris 3 is a combination of the velocity v l of the component in the direction perpendicular to the magnetic field line 51 and the velocity v 2 of the component in the direction parallel to the magnetic field line 51.
- Loren repulsive force is applied to the charged particle debris 3 and captured by the magnetic field lines 51. That is, the debris 3 moves at a parallel component velocity v2 in a direction parallel to the magnetic field lines 51 while performing a cycling motion with a radius corresponding to the vertical component velocity vl and is led to the debris recovery means 30.
- debris 3 which would otherwise be diffused and difficult to recover can be reliably captured in the magnetic field lines 51 and can be reliably guided to the debris recovery means 30, so debris 3 Collection efficiency can be increased.
- debris 3 Collection efficiency can be increased.
- the laser beam irradiating means is disposed such that the laser irradiation direction and the target traveling direction are opposite to each other.
- the laser light L is irradiated so as to face the traveling direction of the evening gate 1.
- the largest amount of debris 3 is generated on the side of the direction of movement of one get 1.
- This massively generated debris 3 spreads at speed V, preserving the momentum in the direction of movement of Get1.
- the velocity v2 of the component in the direction parallel to the magnetic field lines 51 of the debris 3 increases in accordance with the traveling speed of the get1.
- the debris 3 travels along the magnetic field line 51 at a velocity v2 according to the advancing speed of the target 1 and advances rapidly to the debris recovery means 30 side.
- the debris 3 is recovered before the debris 3 spreads over a wide area Method 3 Can be reached. For this reason, the collection efficiency of debris 3 is further improved as compared to the first aspect of the invention.
- the time for the debris 3 to reach the debris recovery means 30 can be shortened, and the debris 3 collection efficiency can be further enhanced.
- a plasma generation laser light irradiation means for irradiating the evening light with a laser light for generating a plasma at an energy level enough to bring the eggplant into a plasma state, and heating the electricity state of the plasma state to generate E UV light Laser heating means for heating the plasma that irradiates the evening get with laser light for plasma heating at a level of energy level
- the laser beam irradiation means for plasma generation is disposed such that the irradiation direction of the laser beam for plasma generation and the traveling direction of the gate are opposite to each other.
- the thirteenth invention is a combination of the twelfth invention and the fourth invention, and can reduce the initial generation amount of debris 3.
- Laser light for plasma generation at an energy level that brings the target into a plasma state First, heats the evening gate that is put in a plasma state to generate E UV light.
- the 14th invention is a combination of the 12th invention and the 6th invention. Fat In addition to reducing the initial generation volume of resources, the configuration can be simplified.
- the debris recovery means is a cylinder having a space in which debris is accommodated, and a space for allowing laser light to pass is formed in the cylinder.
- the laser light L passes through the space formed in the collection cylinder 30 and is irradiated to the evening get 1 and formed in the collection cylinder 30. Debris 3 is collected in the space.
- the debris recovery means is a cylinder having a space in which debris is accommodated, and the optical system is disposed such that the laser beam passes through the outside of the cylinder.
- the laser light L passes through the outside of the recovery cylinder 30 via the optical system and is applied to the sunset 1.
- the sixteenth invention it is not necessary to form a space for passing the laser light L in the recovery cylinder 30, and since the portion can be used as a space for recovery, the recovery efficiency of debris 3 is further increased. It can be enhanced.
- FIGS. 1 (a) and 1 (b) are diagrams showing a configuration example of the first embodiment.
- FIG. 2 is a view illustrating a configuration for preventing debris from adhering to the mirror of FIG.
- FIGS. 3 (a) and 3 (b) are diagrams showing a configuration example of the second embodiment.
- FIG. 4 is a view showing a configuration example of the third embodiment.
- FIG. 5 is a view showing a configuration example of the fourth embodiment.
- FIG. 6 is a diagram showing a configuration example of the fifth embodiment.
- FIG. 7 is a view showing a configuration example of the sixth embodiment.
- FIGS. 8 (a) and 8 (b) are diagrams showing a configuration example of the seventh embodiment.
- FIG. 9 is a view illustrating the appearance of the apparatus shown as Example 7.
- FIGS. 10 (a) and 10 (b) are diagrams showing a comparison between the case where acceleration is not performed and the case where acceleration is performed in the seventh embodiment.
- FIG. 11 is a diagram used to explain the configuration of the E UV light generator. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 (a) shows the configuration of the E UV light generator of the first embodiment.
- a condensing mirror 14 1 for condensing the E UV light is provided inside the chamber 4.
- E UV light collected by the light collecting mirror 41 is transmitted to an illumination optical system (not shown) outside the chamber 4 and a semiconductor circuit pattern is formed on the semiconductor wafer using the E UV light. .
- the inside of the chamber 4 is evacuated by a vacuum pump or the like to be in a vacuum state. This is because E UV light has a short wavelength of 135 nm and can not propagate efficiently unless it is in vacuum.
- a liquid 1 which is an UV light generating substance is dripped.
- liquid xenon (Xe) is used as the evening gate 1.
- the diameter of the evening gate 1 is about 1 ⁇ zm.
- a liquid containing tin, a liquid containing indium, or the like can be used as the setting gate 1.
- the evening gate 1 may be ejected from the nozzle 40.
- the laser oscillator 10 is, for example, a YAG laser, and near infrared laser light L is pulsed.
- the laser oscillator 10 and the mirror 1 20 are arranged such that the laser light L is irradiated in the direction opposite to the traveling direction of the target 1.
- a collecting cylinder 30 is provided in the advancing direction of the evening gate 1.
- the mirror 120 is disposed below the collection cylinder 30 in the drawing.
- a laser oscillator 10 is disposed on the right side of the mirror 1 20 in the drawing.
- Laser light L is emitted from the laser oscillator 10 in the left direction in the drawing and is incident on the mirror 20.
- the laser light L is reflected by the mirror 120, is turned 90 °, and travels upward in the figure.
- the laser oscillator 10 can be placed to the side of the recovery cylinder 30 by providing the mirror 20, but the laser oscillator 10 is placed directly below the recovery cylinder 30, and The laser beam L may be emitted upward directly without passing through a line 20.
- the laser oscillator 10 can be disposed to the side of the recovery cylinder 30, so the field volume in the vertical direction of the device can be reduced.
- Figure 1 (b) shows the cross section of the collection cylinder 30.
- a laser beam passage hole 33 which is a space through which the laser beam L passes, is formed in the recovery cylinder 30 so as to penetrate in the vertical direction.
- the laser beam L passes through the laser beam passage hole 33 of the recovery cylinder 30 and is applied to the lower surface of the sunset 1 which is dropped downward in the figure.
- evening gate 1 When evening light 1 is irradiated with laser light L, evening gate 1 is in the plasma state It is excited to generate E UV light.
- the generated plasma 2 is the number 1 O ⁇ ! The diameter is about ⁇ l mm.
- the generated EUV light diverges in all directions around the plasma 2.
- a focusing mirror 41 is disposed so as to surround the plasma 2.
- the E UV light diverging in all directions is collected by the collection mirror 41, and the collected E UV light is reflected and led to the illumination optical system.
- a part of the target 1 is split and shattered due to the shock wave at the time of plasma generation and becomes debris 3.
- Debris 3 contains charged particles, high-speed ions, and debris that has become plasma.
- debris recovery holes 32 which are spaces for recovering debris 3, are formed in the recovery cylinder 30.
- a recovery mechanism 3 1 is provided in addition to the recovery cylinder 30.
- the recovery mechanism 31 is composed of a filter, a vacuum pump, etc., and traps or evacuates the debris 3 recovered in the recovery cylinder 30 and discharges it to the outside.
- the inventors of the present invention found that debris 3 is most abundant on the irradiation surface side (the direction perpendicular to the irradiation surface) to which the laser light L is irradiated among the surfaces of the flat gate 1 (plasma 2). Found that they
- a recovery cylinder 30 is provided to face the laser light irradiation surface (the lower surface of the evening get 1) of the surfaces of the evening get 1.
- the collection cylinder 30 is arranged in the direction of the movement of the first gate 1.
- Debris 3 preserves and diffuses the momentum of evening get 1 when the laser light L is irradiated.
- the debris 3 is diffused while progressing toward the collection cylinder 30 with the advancing speed of the target 1 when the laser light L is irradiated as the initial speed. Since the debris 3 rapidly advances toward the collecting cylinder 30 at a speed corresponding to the advancing speed of the get 1, the debris 3 can reach the collecting cylinder 30 before the debris 3 diffuses widely. . Therefore, the collection efficiency of debris 3 can be enhanced.
- the first embodiment may be implemented in combination with this technique.
- the time until debris 3 reaches recovery cylinder 30 can be further shortened, and debris 3 can be recovered by recovery cylinder 30 before debris 3 diffuses. Furthermore, the collection efficiency of debris 3 can be enhanced. According to the configuration of FIG. 1, it is predicted that a part of the debris 3 will be adhered to the mirror 20 through the laser beam passage hole 33 without being collected in the debris collection hole 32.
- a gas chamber 50 is provided between the recovery cylinder 30 and the mirror 20.
- the gas chamber 50 is connected with a gas introduction pipe 51, a vacuum drawing pipe 52, and a laser light pipe 53.
- the vacuum drawing line 52 communicates with the suction port of the vacuum pump.
- the laser light L is led to the gas chamber 50 through the laser light pipe 53, is incident on the mirror 120, passes through the gas chamber 50, and passes the laser light of the recovery cylinder 30. It is led to the hole 3 3.
- the purge gas is introduced into the gas chamber 50 through the gas introduction line 51.
- the debris 3 that has entered the gas chamber 50 through the laser light passage hole 33 is discharged from the gas chamber 50 via the vacuum drawing pipe 52 together with the purge gas. That is, the debris 3 is purged out of the gas chamber 50 without adhering to the mirror 120.
- the laser beam passage hole 33 is formed in the recovery cylinder 30 so that the laser light L is allowed to pass through the recovery cylinder 30.
- the laser beam L may pass through the outside of the recovery cylinder 30 without passing through L.
- FIG. 3 (a) is a view corresponding to FIG. 1 (a), and shows Example 2 in which the laser beam L passes through the outside of the recovery cylinder 30.
- FIG. Figure 3 (b) shows the A–A cross section of Figure 3 (a). Descriptions of parts in common with Example 1 will be omitted as appropriate.
- debris recovery holes 32 are formed in the recovery cylinder 30 and, unlike FIG. 1, the laser light passage holes 33 are not formed.
- An annular concave mirror 22 is disposed obliquely to the vertical axis on the outer periphery of the collection cylinder 30.
- a laser beam splitting optical system 21 is provided at the subsequent stage of the laser oscillator 10.
- the laser beam splitting optical system 21 splits the laser beam L into a plurality of laser beams L ′ and makes them enter each part of the entire circumference of the concave mirror 12 2.
- the laser beam L ′ is irradiated over the entire circumference of the concave mirror 12 by dividing the laser beam L into a plurality of laser beams L ′.
- the concave mirror 12 By irradiating the concave mirror 12 with a surface so as to be substantially circular, the light may be made incident on each part of the entire circumference of the concave mirror 1.
- the plurality of laser beams L ′ When a plurality of laser beams L ′ are incident on the concave mirror 22, the plurality of laser beams L ′ are reflected upward in the figure, that is, in a direction opposite to the traveling direction of the evening get 1 and converges.
- the laser light L ′ is irradiated to the target 1 at a point where the plurality of laser light L ′ converges.
- the second embodiment it is not necessary to form a space (laser light passage hole 33) for passing the laser light L in the collection cylinder 30, and a space for collection thereof (a debris collection hole 3) Since it can be used as 2), the recovery efficiency of debris 3 can be further enhanced.
- the above-described first embodiment and second embodiment have a configuration (b) in which “the recovery cylinder 30 is disposed in the traveling direction of the first get 1”.
- the laser oscillator 10 is arranged so that the laser light L is irradiated in the direction perpendicular to the traveling direction of the gateway 1. Mira 1 2 0 is arranged.
- the recovery cylinder 30 is provided on the left side of the nozzle 40.
- a mirror 120 is disposed in the left direction of the collection cylinder 30 in the drawing.
- a laser oscillator 10 is disposed below the mirror 1 20 in the figure.
- a laser beam L is emitted from the laser oscillator 10 in the upward direction in the drawing and is incident on the mirror 120.
- the laser light L is reflected by the mirror 20, turned 90 °, and travels to the right in the figure.
- the laser beam L passes through the laser beam passage hole 33 of the recovery cylinder 30 and is applied to the left surface of the evening get 1 dropped downward in the figure.
- the laser oscillator 10 can be arranged below the recovery cylinder 30 by providing the mirror 20, but the left side of the recovery cylinder 30 at the same height position as the recovery cylinder 30.
- the laser oscillator 10 may be disposed in the laser oscillator 10, and the laser light L may be emitted from the laser oscillator 10 directly to the right without passing through the mirror 120.
- a recovery cylinder 30 is provided to face the laser beam irradiation surface (left surface). Therefore, a large amount of debris 3 generated on the laser light irradiated surface side of the first get 1 is efficiently collected in the debris collection hole 32 of the collection cylinder 30. Debris 3 is efficiently collected without colliding with or adhering to the optical devices in the chamber 4 such as the collecting mirror 41 and the like. For this reason, the durability of the optical instrument including the condensing mirror 41 in the chamber 4 is improved, the degree of vacuum of the chamber 4 is maintained, and the decrease in the E UV light output is suppressed.
- the laser beam L may be configured to pass through the outside of the recovery cylinder 30. It is also possible to combine the configuration (c) with the third embodiment to further enhance the debris collection efficiency.
- the inventor of the present invention has the largest amount of debris 3 generated at the initial stage of laser irradiation, and the smaller the irradiation energy of laser light L, the less likely debris 3 is generated. If the irradiation energy at the initial stage of laser irradiation is reduced, debris 3 is generated. We got the idea that the amount could be reduced.
- a fourth embodiment in which the amount of debris 3 generation can be suppressed by reducing the irradiation energy at the initial stage of laser irradiation will be described with reference to FIG.
- the mirror 1 20 is disposed below the recovery cylinder 30 in the same arrangement manner as in FIG. 1 (a), and the laser oscillator 1 of FIG. 1 (a) is disposed to the right of the mirror 1 20.
- a laser oscillator 11 for plasma generation is disposed.
- a plasma generation laser beam L 1 having an energy level enough to turn the end gate 1 into a plasma state is emitted from the plasma generation laser oscillator 11.
- the laser heater for plasma heating 12 is disposed on the right side of the recovery cylinder 30 so that the laser beam L2 for plasma heating is irradiated in the direction perpendicular to the traveling direction of the first get 1.
- the plasma heating laser oscillator 12 emits a plasma heating laser light L2 having an energy level sufficient to heat the evening light 1 in a plasma state to generate E UV light.
- the laser light L 1 for plasma generation is emitted from the laser generator 11 for plasma generation in the left direction in the drawing and is incident on the mirror 120.
- the laser light L 1 for plasma generation is reflected by the mirror 120, is turned 90 °, and travels upward in the figure.
- the laser generator 11 for generating a plasma can be disposed to the side of the recovery cylinder 30 by providing the mirror 20. However, the laser oscillator 11 for generating a plasma can be recovered. The laser generation light L 1 for plasma generation may be emitted upward directly without passing through the mirror 20.
- the plasma generating laser oscillator 11 can be disposed on the side of the recovery cylinder 30, the field volume in the vertical direction of the device can be reduced.
- the laser beam L 1 for plasma generation passes through the laser beam passing hole 33 of the recovery cylinder 30 and is irradiated to the lower surface of the sunset 1 dropped in the lower direction in the figure.
- the target 1 becomes a plasma 2 ′ by irradiating the evening get 1 with a laser beam LI for plasma generation with a relatively low energy level, but this plasma 2 ′ has a temperature high enough to generate E UV light. It has not been done.
- irradiating the target 1 with a laser light L 1 for plasma generation which has a relatively low energy level it is possible to reduce the initial generation amount of debris 3.
- the laser beam L 2 for plasma heating is emitted from the laser heater for plasma heating 12 to the left in the figure, and the right surface of the plasmatized target 1 is emitted.
- Laser light L2 for plasma heating is irradiated.
- the plasmaized evening gate 1 When the plasmaized evening gate 1 is irradiated with plasma heating laser light L2 having a relatively high energy level, it becomes a plasma 2 that can generate E UV light and generates E UV light.
- the generated E UV light diverges in all directions around the plasma 2.
- the E UV light diverging in all directions is collected by the collecting mirror 41, and reflects the collected E UV light to be led to the illumination optical system.
- target 1 is irradiated with laser light L1 for generating plasma at an energy level enough to bring target 1 into a plasma state, and then target 1 in the plasma state is heated to generate E UV light It emits a laser beam L2 for plasma heating with an energy level to an extent that
- the laser light L may pass through the outside of the collection cylinder 30.
- the above-described fourth embodiment has a configuration (b) of “the recovery cylinder 30 is disposed in the traveling direction of the first get 1”, but this configuration (b) is omitted and the configuration (a), (d) Implementation is also possible. That is, the laser generator 11 for plasma generation is disposed in the same arrangement mode as the laser oscillator 10 in FIG. 4 and the laser light L 1 for plasma generation is irradiated in the direction perpendicular to the traveling direction of the target 1. Implementation is also possible o
- FIG. 6 shows the configuration of the fifth embodiment.
- a laser heater 12 for plasma heating is disposed at the same position as the laser generator 11 for plasma generation shown in FIG. Of both laser beams L2 for the evening get 1 It is irradiated in the opposite direction.
- the laser light L may pass through the outside of the recovery cylinder 30.
- FIG. 7 shows the configuration of the sixth embodiment.
- a laser oscillator 10 is disposed at the same position as the laser generator 11 of FIG. 5 for plasma generation, and from the laser oscillator 10 to the laser for laser generation. Both the light L 1 and the laser light L 2 for heating the plasma are emitted and emitted in the direction opposite to the traveling direction of the sunset light 1.
- the laser light L 1 for generating a relatively low energy level laser beam is emitted to the target 1. This can reduce the amount of initial debris 3 generated.
- the laser oscillator L 10 emits a plasma heating laser light L 2 having a relatively high energy level from the laser oscillator 10, and is put into the plasma state. It is irradiated. This generates E UV light.
- the generated debris 3 is efficiently collected by the collection cylinder 30 disposed on the irradiation surface side of the target 1.
- the laser light L 1 for generating a plasma and the laser light L 2 for plasma heating are emitted from the same laser oscillator 10 and irradiated to the evening get 1, the laser oscillators are separated.
- the apparatus configuration can be simplified as compared with the fourth and fifth embodiments provided in the above.
- the laser light L may pass through the outside of the collection cylinder 30.
- the sixth embodiment has a configuration (b) of "the recovery cylinder 30 is disposed in the traveling direction of the first get 1", but this configuration (b) is omitted and the configuration (a), It is also possible to implement (d) alone. That is, it is also possible to irradiate both of the laser light L1 for plasma generation and the laser light L2 for plasma heating in the direction perpendicular to the traveling direction of the sunset 1 in the same arrangement mode as in FIG.
- Example 7 capable of efficiently collecting the debris 3 containing charged particles will be described.
- Fig. 8 (a) shows the configuration of the seventh embodiment, and in the same arrangement as in Fig. 1 (a), a recovery cylinder 30, a mirror 20 and a laser oscillator 10 are arranged.
- the annular coil 50 is disposed such that the recovery cylinder 30 is positioned on the annular central axis of the coil 50.
- the annular coil 50 functions as a superconducting magnet when current is applied, and magnetic lines of force 51 are formed around the conduction direction of the annular coil 50.
- the magnetic lines of force 51 are formed to converge on the debris recovery holes 32 of the recovery cylinder 30.
- the upper end surface of the recovery cylinder 30 is offset slightly toward the nozzle 40 side than the horizontal plane at the center of the annular coil 50. It is desirable to arrange.
- the velocity V of the debris 3 is a combination of the velocity vl of the component in the direction perpendicular to the magnetic field line 51 and the velocity v2 of the component in the direction parallel to the magnetic field line 51.
- Loren repulsive force determined by the charge, the velocity vl and the magnetic flux density is applied to the charged particle debris 3 and is captured by the magnetic field lines 51. That is, the debris 3 is guided to the collection cylinder 30 while moving at a parallel component velocity v2 in a direction parallel to the magnetic field lines 51 while performing a cycling motion with a radius corresponding to the vertical component velocity vl.
- the recovery cylinder 30 is disposed in the traveling direction of the target 1, and the laser irradiation direction and the traveling direction of the target 1 are opposed to each other. a) and (b) are provided.
- the seventh embodiment since the laser light L is irradiated so as to face the traveling direction of the evening gate 1, the sunset 1 on the irradiation surface side of the target 1 is obtained. The largest amount of debris 3 occurs on the side of the direction of travel.
- This massively generated debris 3 preserves the momentum of the traveling direction of the evening target 1 and spreads at a velocity V.
- the velocity v2 of the component in the direction parallel to the magnetic field lines 51 of the debris 3 increases in accordance with the traveling speed of the evening gate 1. Since debris 3 travels along magnetic field line 51 at speed v2 according to the advancing speed of evening gate 1 and advances toward recovery cylinder 30 quickly, debris 3 can be recovered before it spreads widely. 30 can be reached. Therefore, the collection efficiency of debris 3 is further improved.
- the configuration (c) with the seventh embodiment, it is possible to further enhance the debris collection efficiency.
- Figures 10 (a) and (b) do not accelerate target 1 ( Figure 10 (a)), and cases where accelerator 1 is used to accelerate evening 1 ( Figure 10 (b) Comparison with) is shown.
- the traveling speed of the target 1 increases from the speed V to V 'otherwise, and depending on the speed change, the debris 3 in the direction component parallel to the magnetic field lines 5 1
- the speed increases from v2 to v'2.
- the time until debris 3 reaches recovery cylinder 30 can be shortened, debris 3 can be recovered by recovery cylinder 30 before debris 3 diffuses, and debris 3 is recovered. Efficiency can be further enhanced.
- the laser light L may pass through the outside of the recovery cylinder 30.
- debris collection efficiency can be further enhanced.
- the laser irradiation direction and the traveling direction of the target 1 are made to face each other in the seventh embodiment, the laser irradiation direction is arbitrary and does not necessarily have to be opposed to the traveling direction of the first get 1. If there is a collection cylinder 30 in the For example, the laser light L may be irradiated in the direction perpendicular to the traveling direction of the evening get 1. Also, a combination of the seventh embodiment and the fourth embodiment described in FIG. 5 is possible. By irradiating the plasma light L 1 with a relatively low energy level to the evening gate 1, the initial generation amount of debris 3 can be reduced, and the recovery efficiency of the debris 3 can be further enhanced. Can.
- the seventh embodiment and the fifth embodiment described with reference to FIG. 6 may be implemented in combination, and the sixth embodiment described with reference to FIG. 7 may be implemented in combination.
- the combination with Example 6 can reduce the initial generation amount of debris 3 and can improve the collection efficiency of layer debris 3 and, at the same time, the same laser oscillator 1 0 Thus, both laser beams L 1 and L 2 can be emitted, and the device configuration can be simplified.
- FIG. 9 illustrates the appearance of the device.
- FIG. 9 shows a configuration example in which an annular coil 50 is provided outside the chamber 4. However, it is also possible to provide an annular coil 50 inside the chamber 4.
Landscapes
- Epidemiology (AREA)
- Engineering & Computer Science (AREA)
- Public Health (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Health & Medical Sciences (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Environmental & Geological Engineering (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Plasma Technology (AREA)
- X-Ray Techniques (AREA)
Abstract
Description
Claims
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/554,430 US7297968B2 (en) | 2003-04-24 | 2004-04-22 | Debris collector for EUV light generator |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003-119756 | 2003-04-24 | ||
| JP2003119756A JP2004327213A (ja) | 2003-04-24 | 2003-04-24 | Euv光発生装置におけるデブリ回収装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2004095895A1 true WO2004095895A1 (ja) | 2004-11-04 |
Family
ID=33308107
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2004/005815 Ceased WO2004095895A1 (ja) | 2003-04-24 | 2004-04-22 | Euv光発生装置におけるデブリ回収装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7297968B2 (ja) |
| JP (1) | JP2004327213A (ja) |
| WO (1) | WO2004095895A1 (ja) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7217941B2 (en) * | 2003-04-08 | 2007-05-15 | Cymer, Inc. | Systems and methods for deflecting plasma-generated ions to prevent the ions from reaching an internal component of an EUV light source |
| EP1743221B1 (en) * | 2004-03-31 | 2016-01-06 | Philips Intellectual Property & Standards GmbH | Removal of particles generated by a radiation source |
| DE102005015274B4 (de) * | 2005-03-31 | 2012-02-23 | Xtreme Technologies Gmbh | Strahlungsquelle zur Erzeugung kurzwelliger Strahlung |
| DE102005044141B4 (de) * | 2005-09-15 | 2008-08-14 | Qimonda Ag | Belichtungsgerät und Verfahren zum Betrieb eines Belichtungsgeräts |
| JP5156193B2 (ja) * | 2006-02-01 | 2013-03-06 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP4954584B2 (ja) * | 2006-03-31 | 2012-06-20 | 株式会社小松製作所 | 極端紫外光源装置 |
| JP5162113B2 (ja) * | 2006-08-07 | 2013-03-13 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP4884152B2 (ja) * | 2006-09-27 | 2012-02-29 | 株式会社小松製作所 | 極端紫外光源装置 |
| JP5358060B2 (ja) * | 2007-02-20 | 2013-12-04 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5108367B2 (ja) * | 2007-04-27 | 2012-12-26 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5246916B2 (ja) | 2008-04-16 | 2013-07-24 | ギガフォトン株式会社 | Euv光発生装置におけるイオン回収装置および方法 |
| NL1036768A1 (nl) * | 2008-04-29 | 2009-10-30 | Asml Netherlands Bv | Radiation source. |
| EP2157481A3 (en) * | 2008-08-14 | 2012-06-13 | ASML Netherlands B.V. | Radiation source, lithographic apparatus, and device manufacturing method |
| US9052615B2 (en) | 2008-08-29 | 2015-06-09 | Gigaphoton Inc. | Extreme ultraviolet light source apparatus |
| JP2010103499A (ja) | 2008-09-29 | 2010-05-06 | Komatsu Ltd | 極端紫外光源装置および極端紫外光生成方法 |
| JP5142217B2 (ja) * | 2008-12-27 | 2013-02-13 | ウシオ電機株式会社 | 露光装置 |
| JP5474522B2 (ja) * | 2009-01-14 | 2014-04-16 | ギガフォトン株式会社 | 極端紫外光源システム |
| JP5559562B2 (ja) | 2009-02-12 | 2014-07-23 | ギガフォトン株式会社 | 極端紫外光光源装置 |
| US8138487B2 (en) * | 2009-04-09 | 2012-03-20 | Cymer, Inc. | System, method and apparatus for droplet catcher for prevention of backsplash in a EUV generation chamber |
| WO2011013779A1 (ja) * | 2009-07-29 | 2011-02-03 | 株式会社小松製作所 | 極端紫外光源装置、極端紫外光源装置の制御方法、およびそのプログラムを記録した記録媒体 |
| US9265136B2 (en) | 2010-02-19 | 2016-02-16 | Gigaphoton Inc. | System and method for generating extreme ultraviolet light |
| US9113540B2 (en) | 2010-02-19 | 2015-08-18 | Gigaphoton Inc. | System and method for generating extreme ultraviolet light |
| JP2011192965A (ja) * | 2010-02-22 | 2011-09-29 | Komatsu Ltd | チャンバ装置、および極端紫外光生成装置 |
| JP5687488B2 (ja) * | 2010-02-22 | 2015-03-18 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| JP2011222958A (ja) * | 2010-03-25 | 2011-11-04 | Komatsu Ltd | ミラーおよび極端紫外光生成装置 |
| CN103080840B (zh) | 2010-06-25 | 2016-01-27 | Asml荷兰有限公司 | 光刻设备和方法 |
| TWI596384B (zh) * | 2012-01-18 | 2017-08-21 | Asml荷蘭公司 | 光源收集器元件、微影裝置及元件製造方法 |
| US9268031B2 (en) * | 2012-04-09 | 2016-02-23 | Kla-Tencor Corporation | Advanced debris mitigation of EUV light source |
| WO2015086232A1 (en) * | 2013-12-09 | 2015-06-18 | Asml Netherlands B.V. | Radiation source device, lithographic apparatus and device manufacturing method |
| US10880981B2 (en) * | 2017-09-29 | 2020-12-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Collector pellicle |
| US10779387B2 (en) * | 2018-11-26 | 2020-09-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Extreme ultraviolet photolithography system and method |
| NL2025013A (en) * | 2019-03-07 | 2020-09-11 | Asml Netherlands Bv | Laser system for source material conditioning in an euv light source |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0837096A (ja) * | 1994-07-26 | 1996-02-06 | Nikon Corp | X線発生装置 |
| JPH08162287A (ja) * | 1994-12-08 | 1996-06-21 | Nikon Corp | X線発生装置 |
| JP2002214400A (ja) * | 2001-01-12 | 2002-07-31 | Toyota Macs Inc | レーザープラズマeuv光源装置及びそれに用いられるターゲット |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000349009A (ja) | 1999-06-04 | 2000-12-15 | Nikon Corp | 露光方法及び装置 |
| JP2002289397A (ja) | 2001-03-23 | 2002-10-04 | Takayasu Mochizuki | レーザプラズマ発生方法およびそのシステム |
| JP4111487B2 (ja) * | 2002-04-05 | 2008-07-02 | ギガフォトン株式会社 | 極端紫外光源装置 |
| US6973164B2 (en) * | 2003-06-26 | 2005-12-06 | University Of Central Florida Research Foundation, Inc. | Laser-produced plasma EUV light source with pre-pulse enhancement |
| JP4535732B2 (ja) * | 2004-01-07 | 2010-09-01 | 株式会社小松製作所 | 光源装置及びそれを用いた露光装置 |
-
2003
- 2003-04-24 JP JP2003119756A patent/JP2004327213A/ja active Pending
-
2004
- 2004-04-22 US US10/554,430 patent/US7297968B2/en not_active Expired - Fee Related
- 2004-04-22 WO PCT/JP2004/005815 patent/WO2004095895A1/ja not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0837096A (ja) * | 1994-07-26 | 1996-02-06 | Nikon Corp | X線発生装置 |
| JPH08162287A (ja) * | 1994-12-08 | 1996-06-21 | Nikon Corp | X線発生装置 |
| JP2002214400A (ja) * | 2001-01-12 | 2002-07-31 | Toyota Macs Inc | レーザープラズマeuv光源装置及びそれに用いられるターゲット |
Also Published As
| Publication number | Publication date |
|---|---|
| US7297968B2 (en) | 2007-11-20 |
| US20060249698A1 (en) | 2006-11-09 |
| JP2004327213A (ja) | 2004-11-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2004095895A1 (ja) | Euv光発生装置におけるデブリ回収装置 | |
| JP5669736B2 (ja) | 放射システムおよびリソグラフィ装置 | |
| KR101357231B1 (ko) | Lpp 방식의 euv 광원과 그 발생 방법 | |
| WO2003085707A1 (en) | Extreme ultraviolet light source | |
| JP2009260019A (ja) | Euv光発生装置におけるイオン回収装置および方法 | |
| KR20010012473A (ko) | 플라즈마 초점 고에너지 광자소스 | |
| JP2005032972A (ja) | 集光光学系、光源ユニット、照明光学装置および露光装置 | |
| US20130015373A1 (en) | EUV Radiation Source and EUV Radiation Generation Method | |
| TW201925923A (zh) | 極紫外線輻射源模組 | |
| US20110013166A1 (en) | Radiation system and lithographic apparatus | |
| US11269257B2 (en) | Apparatus and method for generating extreme ultraviolet radiation | |
| TW202009608A (zh) | 微影系統及其操作方法 | |
| US20250331092A1 (en) | Extreme ultraviolet radiation source, method of generating extreme ultraviolet radiation, and method of manufacturing integrated circuit | |
| JP4335869B2 (ja) | リソグラフィ装置、照明システム、およびデブリ粒子を抑制するための方法 | |
| TWI745439B (zh) | 高亮度光源和高亮度光線的產生方法 | |
| JP4937616B2 (ja) | 極端紫外光源装置 | |
| JP2011054403A (ja) | Lpp方式のeuv光源とその発生方法 | |
| JP2012018820A (ja) | Lpp方式のeuv光源とその発生方法 | |
| NL2016538A (en) | Radiation Source, Lithographic Apparatus and Device Manufacturing Method. | |
| JP5578482B2 (ja) | Lpp方式のeuv光源とその発生方法 | |
| CN104638503B (zh) | 多脉冲组合泵浦的lpp‑euv光源系统 | |
| CN110858058B (zh) | 光刻设备以及光刻方法 | |
| JP2014207246A (ja) | Lpp方式のeuv光源とその発生方法 | |
| CN111736433A (zh) | 基于椭球面镜-球面镜组合光收集的lpp-euv光源系统 | |
| NL2011306A (en) | Method and apparatus for generating radiation. |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
| AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): BW GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| WWE | Wipo information: entry into national phase |
Ref document number: 2006249698 Country of ref document: US Ref document number: 10554430 Country of ref document: US |
|
| 32PN | Ep: public notification in the ep bulletin as address of the adressee cannot be established |
Free format text: COMMUNICATION PURSUANT TO RULE 69(1) EPC (FORM 1205A, SENT ON 26.01.06 |
|
| WWP | Wipo information: published in national office |
Ref document number: 10554430 Country of ref document: US |