WO2004077465A1 - 固体電解コンデンサ - Google Patents
固体電解コンデンサ Download PDFInfo
- Publication number
- WO2004077465A1 WO2004077465A1 PCT/JP2004/001656 JP2004001656W WO2004077465A1 WO 2004077465 A1 WO2004077465 A1 WO 2004077465A1 JP 2004001656 W JP2004001656 W JP 2004001656W WO 2004077465 A1 WO2004077465 A1 WO 2004077465A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- nitride
- foil
- solid electrolytic
- electrolytic capacitor
- titanium
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 60
- 239000007787 solid Substances 0.000 title claims abstract description 30
- 239000011888 foil Substances 0.000 claims abstract description 74
- 150000004767 nitrides Chemical class 0.000 claims abstract description 27
- 229910052751 metal Inorganic materials 0.000 claims abstract description 24
- 239000002184 metal Substances 0.000 claims abstract description 24
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims abstract description 18
- 239000002131 composite material Substances 0.000 claims abstract description 16
- 150000002736 metal compounds Chemical class 0.000 claims abstract description 16
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000010936 titanium Substances 0.000 claims abstract description 12
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 12
- 229920001940 conductive polymer Polymers 0.000 claims abstract description 10
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000007784 solid electrolyte Substances 0.000 claims abstract description 6
- CFJRGWXELQQLSA-UHFFFAOYSA-N azanylidyneniobium Chemical compound [Nb]#N CFJRGWXELQQLSA-UHFFFAOYSA-N 0.000 claims abstract description 4
- UMUXBDSQTCDPJZ-UHFFFAOYSA-N chromium titanium Chemical compound [Ti].[Cr] UMUXBDSQTCDPJZ-UHFFFAOYSA-N 0.000 claims abstract description 4
- ZVWKZXLXHLZXLS-UHFFFAOYSA-N zirconium nitride Chemical compound [Zr]#N ZVWKZXLXHLZXLS-UHFFFAOYSA-N 0.000 claims abstract description 4
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 claims abstract description 3
- PMTRSEDNJGMXLN-UHFFFAOYSA-N titanium zirconium Chemical compound [Ti].[Zr] PMTRSEDNJGMXLN-UHFFFAOYSA-N 0.000 claims abstract description 3
- 239000003792 electrolyte Substances 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 abstract description 7
- 238000000576 coating method Methods 0.000 abstract description 7
- 229910052782 aluminium Inorganic materials 0.000 description 18
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 18
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 10
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 10
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- 230000001590 oxidative effect Effects 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 150000003839 salts Chemical class 0.000 description 4
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 description 3
- 235000019441 ethanol Nutrition 0.000 description 3
- 238000012856 packing Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- GKWLILHTTGWKLQ-UHFFFAOYSA-N 2,3-dihydrothieno[3,4-b][1,4]dioxine Chemical compound O1CCOC2=CSC=C21 GKWLILHTTGWKLQ-UHFFFAOYSA-N 0.000 description 2
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000003085 diluting agent Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- BTBUEUYNUDRHOZ-UHFFFAOYSA-N Borate Chemical compound [O-]B([O-])[O-] BTBUEUYNUDRHOZ-UHFFFAOYSA-N 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 235000011037 adipic acid Nutrition 0.000 description 1
- 239000001361 adipic acid Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000007739 conversion coating Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229920001002 functional polymer Polymers 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- WHRAZOIDGKIQEA-UHFFFAOYSA-L iron(2+);4-methylbenzenesulfonate Chemical compound [Fe+2].CC1=CC=C(S([O-])(=O)=O)C=C1.CC1=CC=C(S([O-])(=O)=O)C=C1 WHRAZOIDGKIQEA-UHFFFAOYSA-L 0.000 description 1
- 238000001182 laser chemical vapour deposition Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000123 polythiophene Polymers 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/0029—Processes of manufacture
- H01G9/0032—Processes of manufacture formation of the dielectric layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/022—Electrolytes; Absorbents
- H01G9/025—Solid electrolytes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/022—Electrolytes; Absorbents
- H01G9/025—Solid electrolytes
- H01G9/028—Organic semiconducting electrolytes, e.g. TCNQ
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/042—Electrodes or formation of dielectric layers thereon characterised by the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/048—Electrodes or formation of dielectric layers thereon characterised by their structure
- H01G9/055—Etched foil electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/15—Solid electrolytic capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/15—Solid electrolytic capacitors
- H01G9/151—Solid electrolytic capacitors with wound foil electrodes
Definitions
- the present invention relates to a solid electrolytic capacitor in which an anode foil and a cathode foil are wound.
- FIG. 2 is a cross-sectional front view of a conventional solid electrolytic capacitor (1)
- FIG. 4 is a perspective view of a conventional capacitor element (2) (for example, see Japanese Patent Publication No. 4-196595). According to the children, this is because the capacitor element (2) is housed in an aluminum case (3) with an open top, and the case (3) opening is sealed with a rubber packing (30). I have. The upper end of the case (3) is curled to fix the packing (30), and a plastic seat plate (31) is attached to the upper surface of the case (3). The lead wires (21, 21) extending from the capacitor element (2) penetrate the packing (30) and the seat plate (31) and are bent sideways.
- the capacitor element (2) is composed of an anode foil (4), which is an aluminum foil having a dielectric oxide film formed thereon, and a cathode foil (5), which is an aluminum foil. It is wound into a roll via a separator (6), which is an insulator, etc., and stopped with tape (26), and has TCNQ (7, 7, 8, 8—tetrasianoquinodimethane) inside Either impregnated with a solid electrolyte such as a complex salt, or a conductive polymer layer is formed. A pair of lead tabs (25) and (25) are drawn out of the anode foil (4) and the cathode foil (5), and the lead wires (21) and (21) are drawn from the lead tabs (25) and (25). Is extending.
- anode foil (4) which is an aluminum foil having a dielectric oxide film formed thereon
- a cathode foil (5) which is an aluminum foil. It is wound into a roll via a separator (6), which is an
- Such a solid electrolytic capacitor (1) is widely used, but a large-capacity and small-sized capacitor is desired from the market.
- a cathode foil (5) in which a coating made of a metal nitride is formed (see, for example, Japanese Patent Publication No. 2000-1114).
- the capacitance C of the capacitor is a capacitance in which the capacitance C a on the anode foil (4) side and the capacitance C c on the cathode foil (5) side are connected in series. It is.
- the cathode foil (5) has the capacitance Cc, the capacitance C of the capacitor is smaller than the capacitance C a on the anode foil (4) side. Therefore, a metal nitride film such as TiN is formed on the cathode foil (5) by a sputtering method or vapor deposition, and the aluminum base of the cathode foil (5) is electrically connected to the metal nitride. As a result, since the cathode foil (5) has no capacitance, the capacitance can be increased without increasing the external shape of the capacitor. However, the applicant has found that even if such a cathode foil (5) is formed, the effect of increasing the capacitance of the solid electrolytic capacitor (1) is small.
- An object of the present invention is to provide a solid electrolytic capacitor having a large anode-side capacitance, and in particular, to provide a solid electrolytic capacitor having a low rated voltage.
- the solid electrolytic capacitor (1) is formed by winding an anode foil (4) and a cathode foil (5) through a separator (6), and has a solid electrolyte layer or a conductive polymer layer formed inside.
- Capacitor element (2), and a dielectric oxide film is formed on the anode foil (4).
- a film made of a nitride of a single metal or a composite metal compound is formed, and the dielectric oxide film is formed of an oxide of a nitride of the single metal or a composite metal compound.
- the single metal nitride is any of titanium nitride, zirconium nitride, tantalum nitride, and niobium nitride, and is a valve metal nitride.
- the nitride of the composite metal compound is any of aluminum titanium nitride, chromium titanium nitride, zirconia titanium nitride, and titanium carbonitride.
- Figure 1 is a perspective view of a conventional capacitor element
- FIG. 2 is a cross-sectional front view of a conventional solid electrolytic capacitor.
- the capacitor element (2) consists of an anode foil (4), which is an aluminum foil with a chemical conversion coating, and a cathode foil (5), which is an aluminum foil. It is wound up in a roll through the evening (6) and stopped with tape (26).
- the inside of the capacitor element (2) is impregnated with a solid electrolyte such as a TCNQ complex salt or a conductive polymer layer is formed.
- a pair of lead wires (21, 21) extends from the capacitor element (2).
- the capacitor element (2) is formed by the following procedure. First, a strip-shaped aluminum foil to be an anode foil (4) cut out of an aluminum sheet is etched. The etching is performed to roughen the surface of the aluminum foil, increase the surface area, and increase the capacitance. Next, a film of titanium nitride (TiN) is formed on the aluminum foil by vapor deposition. Instead of vapor deposition, the coating may be formed by an ion plating method, a sputtering method, a thermal CVD method, a plasma CVD method, a photo CVD method, or a laser-CVD method.
- TiN titanium nitride
- the aluminum foil on which the titanium nitride film is formed is immersed in a chemical conversion solution, and a voltage of about 5 V is applied.
- the film of titanium nitride is oxidized to form a dielectric oxide film, and this aluminum foil is used as the anode foil (4).
- This dielectric oxide film is composed of titanium oxide.
- solutions of phosphate, borate and adipic acid are known, but solutions of other acid salts may be used.
- TiN titanium nitride
- the anode foil (4) and the cathode foil (5) are wound in a roll via an insulating insulator (6) and fixed with a tape (26) to form a capacitor element (2).
- the positive electrode foil (4) is formed by cutting out from an aluminum sheet, so that the dielectric oxide film is not formed on the end face of the positive electrode foil (4). Therefore, the capacitor element (2) is cut to form a dielectric oxide film on the end face of the anode foil (4). Thereafter, the capacitor element (2) is heat-treated at 280 ° C. to stabilize the characteristics of the dielectric oxide film.
- the capacitor element (2) is immersed in a mixed solution of 3,4-ethylenedioxythiophene containing ethyl alcohol as a diluent and iron (II) p-toluenesulfonate, and then thermally polymerized to form the foil (4).
- a conductive polymer layer is formed between (5) and the capacitor element (2) is completed.
- p—Toluene iron sulfonate ( ⁇ ) is contained in ethyl alcohol at 40-60 weight percent, which is a practical viscosity in the capacitor manufacturing process.
- the capacitor element (2) is sealed in the case (3) to complete the solid electrolytic capacitor (1).
- the conductive polymer layer is formed of a polythiophene-based conductive polymer, but a polypyrrol-based or polyaniline-based functional polymer may be used. Further, instead of the conductive polymer layer, a solid electrolyte layer such as a TCNQ complex salt may be formed.
- the relative dielectric constant of titanium oxide is about 100, which is higher than that of aluminum oxide. Therefore, the capacitance of the anode foil (4) and, consequently, the solid electrolytic capacitor (1) can be increased.
- a dielectric oxide film made of titanium oxide obtained by oxidizing a nitride of a single metal or a composite metal compound has more stable characteristics than a film formed by directly oxidizing titanium.
- an applied voltage of about 5 V is sufficient to form an oxide film on the nitride of the composite metal compound. Since the applied voltage needs to be about three times the rated voltage of the target solid electrolytic capacitor (1), the voltage applied to the anode foil (4) of the solid electrolytic capacitor (1) with a lower rated voltage can be reduced. Also, a film made of titanium oxide can be formed.
- the applicant made a solid electrolytic capacitor (1) using an anode foil (4) on which an oxide film of titanium nitride (TiN), which is a single metal nitride, was formed.
- a solid electrolytic capacitor (1) using an anode foil (4) formed with an oxide film of aluminum titanium nitride (TiA1N), which is a nitride of a composite metal compound, instead of titanium nitride was used in Example 2.
- a conventional method namely, an anode foil (5) is formed by forming an oxide film on an aluminum foil, and a cathode foil (5) is formed by forming a titanium nitride (TiN) film on another aluminum foil.
- TiN titanium nitride
- Each of the solid electrolytic capacitors (1) is a capacitor with a rated voltage of 2.5 V, a capacitance of 390 zF, and a case (3) with a diameter of 6.3 mm and a height of 6.0 mm. .
- the capacitance (C a, unit: ii F) was measured at the frequency of 120 Hz for the capacitors of the embodiment and the conventional example, and the equivalent series resistance (ESR) was measured at the frequency of 100 k ⁇ ⁇ . , Unit: ⁇ ) was measured.
- ESR equivalent series resistance
- the leakage current (LC, unit: / XA) was measured. Table 1 shows the measurement results.
- the electrical characteristic value is an average value of 20 pieces. (table 1 )
- TiN titanium nitride
- Ti A 1 N aluminum titanium nitride
- valve metals are examples of single metals.
- the valve metal is one whose surface is uniformly covered with the metal oxide.
- the composite metal compound mainly includes a compound of titanium and a valve metal.
- the aluminum foil serving as the anode foil (4) may not be subjected to the etching treatment.
- the anode foil (4) and the cathode foil (5) are formed from aluminum foil, they may be formed from valve metal foil.
- the upper opening of the case (3) may be closed with epoxy resin.
- the shape of the capacitor may be a radial lead type.
- the dielectric oxide film on the anode foil (4) is composed of an oxide of a nitride of a single metal or a composite metal compound, specifically, titanium oxide. Since the dielectric constant of the dielectric oxide film is high, the capacitance of the anode foil (4) and, consequently, the solid electrolytic capacitor (1) can be increased. In addition, a dielectric oxide film made of titanium oxide obtained by oxidizing a nitride of a single metal or a composite metal compound has more stable characteristics than a film formed by directly oxidizing titanium.
- an applied voltage of about 5 V is sufficient to form an oxide film on the nitride of the composite metal compound.
- a coating made of titanium oxide can be formed on the anode foil (4) of the solid electrolytic capacitor (1) whose rated voltage is as low as about 2-3 V.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112004000343T DE112004000343T5 (de) | 2003-02-25 | 2004-02-16 | Festelektrolytkondensator |
US10/546,209 US7391604B2 (en) | 2003-02-25 | 2004-02-16 | Solid electrolytic capacitor |
CN2004800050876A CN1754235B (zh) | 2003-02-25 | 2004-02-16 | 固体电解电容器 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003046958A JP2004265951A (ja) | 2003-02-25 | 2003-02-25 | 固体電解コンデンサ |
JP2003-046958 | 2003-02-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004077465A1 true WO2004077465A1 (ja) | 2004-09-10 |
Family
ID=32923250
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2004/001656 WO2004077465A1 (ja) | 2003-02-25 | 2004-02-16 | 固体電解コンデンサ |
Country Status (7)
Country | Link |
---|---|
US (1) | US7391604B2 (ja) |
JP (1) | JP2004265951A (ja) |
KR (1) | KR101018581B1 (ja) |
CN (1) | CN1754235B (ja) |
DE (1) | DE112004000343T5 (ja) |
TW (1) | TWI245300B (ja) |
WO (1) | WO2004077465A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20230029692A1 (en) * | 2019-12-17 | 2023-02-02 | Nippon Chemi-Con Corporation | Solid electrolytic capacitor and method for manufacturing same |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006108170A (ja) * | 2004-09-30 | 2006-04-20 | Sanyo Electric Co Ltd | 固体電解コンデンサ |
JP4716862B2 (ja) * | 2005-12-09 | 2011-07-06 | 佐賀三洋工業株式会社 | 固体電解コンデンサ |
CN101641754A (zh) * | 2007-03-30 | 2010-02-03 | 日本贵弥功株式会社 | 电解电容器 |
JP2009049373A (ja) * | 2007-07-25 | 2009-03-05 | Panasonic Corp | 固体電解コンデンサ |
JP5261199B2 (ja) * | 2009-01-07 | 2013-08-14 | 三洋電機株式会社 | 電解コンデンサの製造方法 |
US8971022B2 (en) | 2011-05-16 | 2015-03-03 | Panasonic Corporation | Electrode foil and method for manufacturing same, and capacitor |
CN106486287A (zh) * | 2015-09-02 | 2017-03-08 | 北京纳米能源与系统研究所 | 可降解电容器及其制造方法 |
JP6735510B2 (ja) * | 2016-03-25 | 2020-08-05 | パナソニックIpマネジメント株式会社 | 電解コンデンサ |
CN106683881B (zh) * | 2016-08-05 | 2018-06-12 | 南京理工大学 | 一种纳米结构电介质电容器及其制备方法 |
CN114496575A (zh) * | 2022-02-25 | 2022-05-13 | 广东省华钏电子有限公司 | 复合介质铝电解电容器 |
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JP2000182899A (ja) * | 1998-12-15 | 2000-06-30 | Showa Denko Kk | コンデンサの製造方法 |
JP2002299181A (ja) * | 2001-03-29 | 2002-10-11 | Nippon Chemicon Corp | 固体電解コンデンサ |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3106559B2 (ja) * | 1991-07-05 | 2000-11-06 | 日本ケミコン株式会社 | 表面に金属酸化物を有する基材の製造方法 |
JP2770746B2 (ja) * | 1994-09-02 | 1998-07-02 | 日本電気株式会社 | 固体電解コンデンサ及びその製造方法 |
JP3741539B2 (ja) * | 1997-06-03 | 2006-02-01 | 松下電器産業株式会社 | 電解コンデンサおよびその製造方法 |
JP2000012402A (ja) * | 1998-06-19 | 2000-01-14 | Nichicon Corp | アルミニウム電解コンデンサ用電極箔 |
US6529367B1 (en) * | 1998-12-15 | 2003-03-04 | Showa Denko Kabushiki Kaisha | Niobium capacitor and method of manufacture thereof |
WO2001020625A1 (fr) * | 1999-09-10 | 2001-03-22 | Matsushita Electric Industrial Co., Ltd. | Condensateur electrolytique solide, procede de production de celui-ci et solution d'agent oxydant de polymerisation de polymere conducteur |
US6602741B1 (en) * | 1999-09-14 | 2003-08-05 | Matsushita Electric Industrial Co., Ltd. | Conductive composition precursor, conductive composition, solid electrolytic capacitor, and their manufacturing method |
JP2003022934A (ja) * | 2001-07-05 | 2003-01-24 | Nippon Chemicon Corp | 電解コンデンサ |
JP2004265924A (ja) * | 2003-02-12 | 2004-09-24 | Sanyo Electric Co Ltd | 固体電解コンデンサ |
-
2003
- 2003-02-25 JP JP2003046958A patent/JP2004265951A/ja active Pending
-
2004
- 2004-02-16 KR KR1020057015488A patent/KR101018581B1/ko active IP Right Grant
- 2004-02-16 WO PCT/JP2004/001656 patent/WO2004077465A1/ja active Application Filing
- 2004-02-16 DE DE112004000343T patent/DE112004000343T5/de not_active Ceased
- 2004-02-16 US US10/546,209 patent/US7391604B2/en active Active
- 2004-02-16 CN CN2004800050876A patent/CN1754235B/zh not_active Expired - Lifetime
- 2004-08-17 TW TW093124625A patent/TWI245300B/zh active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000182899A (ja) * | 1998-12-15 | 2000-06-30 | Showa Denko Kk | コンデンサの製造方法 |
JP2002299181A (ja) * | 2001-03-29 | 2002-10-11 | Nippon Chemicon Corp | 固体電解コンデンサ |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20230029692A1 (en) * | 2019-12-17 | 2023-02-02 | Nippon Chemi-Con Corporation | Solid electrolytic capacitor and method for manufacturing same |
Also Published As
Publication number | Publication date |
---|---|
KR101018581B1 (ko) | 2011-03-03 |
DE112004000343T5 (de) | 2008-03-06 |
TWI245300B (en) | 2005-12-11 |
CN1754235B (zh) | 2010-05-05 |
JP2004265951A (ja) | 2004-09-24 |
KR20050104384A (ko) | 2005-11-02 |
CN1754235A (zh) | 2006-03-29 |
US20060146474A1 (en) | 2006-07-06 |
US7391604B2 (en) | 2008-06-24 |
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