KR20050104384A - 고체 전해 컨덴서 - Google Patents
고체 전해 컨덴서 Download PDFInfo
- Publication number
- KR20050104384A KR20050104384A KR1020057015488A KR20057015488A KR20050104384A KR 20050104384 A KR20050104384 A KR 20050104384A KR 1020057015488 A KR1020057015488 A KR 1020057015488A KR 20057015488 A KR20057015488 A KR 20057015488A KR 20050104384 A KR20050104384 A KR 20050104384A
- Authority
- KR
- South Korea
- Prior art keywords
- nitride
- foil
- titanium
- solid electrolytic
- electrolytic capacitor
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 56
- 239000007787 solid Substances 0.000 title claims abstract description 27
- 239000011888 foil Substances 0.000 claims abstract description 72
- 229910052751 metal Inorganic materials 0.000 claims abstract description 24
- 239000002184 metal Substances 0.000 claims abstract description 24
- 150000004767 nitrides Chemical class 0.000 claims abstract description 24
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000010936 titanium Substances 0.000 claims abstract description 14
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 14
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000002131 composite material Substances 0.000 claims abstract description 13
- 150000002736 metal compounds Chemical class 0.000 claims abstract description 13
- 229920001940 conductive polymer Polymers 0.000 claims abstract description 11
- 239000007784 solid electrolyte Substances 0.000 claims abstract description 6
- CFJRGWXELQQLSA-UHFFFAOYSA-N azanylidyneniobium Chemical compound [Nb]#N CFJRGWXELQQLSA-UHFFFAOYSA-N 0.000 claims abstract description 4
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 claims abstract description 4
- PMTRSEDNJGMXLN-UHFFFAOYSA-N titanium zirconium Chemical compound [Ti].[Zr] PMTRSEDNJGMXLN-UHFFFAOYSA-N 0.000 claims abstract description 4
- ZVWKZXLXHLZXLS-UHFFFAOYSA-N zirconium nitride Chemical compound [Zr]#N ZVWKZXLXHLZXLS-UHFFFAOYSA-N 0.000 claims abstract description 4
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 claims abstract description 3
- UMUXBDSQTCDPJZ-UHFFFAOYSA-N chromium titanium Chemical compound [Ti].[Cr] UMUXBDSQTCDPJZ-UHFFFAOYSA-N 0.000 claims abstract description 3
- 238000004804 winding Methods 0.000 claims description 4
- 239000003792 electrolyte Substances 0.000 claims description 2
- 229920000123 polythiophene Polymers 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 abstract description 7
- 238000000576 coating method Methods 0.000 abstract description 7
- 229910052782 aluminium Inorganic materials 0.000 description 17
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 17
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 9
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- 230000001590 oxidative effect Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 3
- 235000019441 ethanol Nutrition 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 238000012856 packing Methods 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- GKWLILHTTGWKLQ-UHFFFAOYSA-N 2,3-dihydrothieno[3,4-b][1,4]dioxine Chemical compound O1CCOC2=CSC=C21 GKWLILHTTGWKLQ-UHFFFAOYSA-N 0.000 description 2
- -1 26) Substances 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 239000003085 diluting agent Substances 0.000 description 2
- VRZVPALEJCLXPR-UHFFFAOYSA-N ethyl 4-methylbenzenesulfonate Chemical compound CCOS(=O)(=O)C1=CC=C(C)C=C1 VRZVPALEJCLXPR-UHFFFAOYSA-N 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- WHRAZOIDGKIQEA-UHFFFAOYSA-L iron(2+);4-methylbenzenesulfonate Chemical compound [Fe+2].CC1=CC=C(S([O-])(=O)=O)C=C1.CC1=CC=C(S([O-])(=O)=O)C=C1 WHRAZOIDGKIQEA-UHFFFAOYSA-L 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical class OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 1
- CXOWYMLTGOFURZ-UHFFFAOYSA-N azanylidynechromium Chemical compound [Cr]#N CXOWYMLTGOFURZ-UHFFFAOYSA-N 0.000 description 1
- 150000001642 boronic acid derivatives Chemical class 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229920001002 functional polymer Polymers 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 238000001182 laser chemical vapour deposition Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 235000021317 phosphate Nutrition 0.000 description 1
- 150000003013 phosphoric acid derivatives Chemical class 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 229920000128 polypyrrole Polymers 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- PCCVSPMFGIFTHU-UHFFFAOYSA-N tetracyanoquinodimethane Chemical compound N#CC(C#N)=C1C=CC(=C(C#N)C#N)C=C1 PCCVSPMFGIFTHU-UHFFFAOYSA-N 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/022—Electrolytes; Absorbents
- H01G9/025—Solid electrolytes
- H01G9/028—Organic semiconducting electrolytes, e.g. TCNQ
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/0029—Processes of manufacture
- H01G9/0032—Processes of manufacture formation of the dielectric layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/022—Electrolytes; Absorbents
- H01G9/025—Solid electrolytes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/042—Electrodes or formation of dielectric layers thereon characterised by the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/048—Electrodes or formation of dielectric layers thereon characterised by their structure
- H01G9/055—Etched foil electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/15—Solid electrolytic capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/15—Solid electrolytic capacitors
- H01G9/151—Solid electrolytic capacitors with wound foil electrodes
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
Claims (5)
- 양극박 (4)와 음극박 (5)를 격리막 (6)을 통해 권취하여 구성되고, 내부에 고체 전해질층 또는 도전성 고분자층이 형성된 컨덴서 소자 (2)를 포함하며,상기 양극박 (4) 상에는 유전체 산화 피막이 형성되어 있고, 상기 유전체 산화 피막은 단일 금속 또는 복합 금속 화합물의 질화물의 산화물로부터 형성되는 것을 특징으로 하는 고체 전해 컨덴서.
- 제1항에 있어서, 상기 단일 금속의 질화물이 질화티탄, 질화지르코늄, 질화탄탈, 질화니오븀 중 어느 하나인 밸브(valve) 금속의 질화물인 고체 전해 컨덴서.
- 제1항에 있어서, 상기 복합 금속 화합물의 질화물이 질화알루미늄티탄, 질화크롬티탄, 질화지르코늄티탄, 탄질화티탄 중 어느 하나인 고체 전해 컨덴서.
- 제1항에 있어서, 상기 컨덴서 소자 (2) 내의 전해질이 폴리티오펜계 도전성 고분자를 이용하는 고체 전해 컨덴서.
- 제1항에 있어서, 상기 양극박 (4) 및 음극박 (5)가 밸브 금속박으로부터 형성되는 고체 전해 컨덴서.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003046958A JP2004265951A (ja) | 2003-02-25 | 2003-02-25 | 固体電解コンデンサ |
JPJP-P-2003-00046958 | 2003-02-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050104384A true KR20050104384A (ko) | 2005-11-02 |
KR101018581B1 KR101018581B1 (ko) | 2011-03-03 |
Family
ID=32923250
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020057015488A KR101018581B1 (ko) | 2003-02-25 | 2004-02-16 | 고체 전해 컨덴서 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7391604B2 (ko) |
JP (1) | JP2004265951A (ko) |
KR (1) | KR101018581B1 (ko) |
CN (1) | CN1754235B (ko) |
DE (1) | DE112004000343T5 (ko) |
TW (1) | TWI245300B (ko) |
WO (1) | WO2004077465A1 (ko) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006108170A (ja) * | 2004-09-30 | 2006-04-20 | Sanyo Electric Co Ltd | 固体電解コンデンサ |
JP4716862B2 (ja) * | 2005-12-09 | 2011-07-06 | 佐賀三洋工業株式会社 | 固体電解コンデンサ |
CN101641754A (zh) * | 2007-03-30 | 2010-02-03 | 日本贵弥功株式会社 | 电解电容器 |
JP2009049373A (ja) * | 2007-07-25 | 2009-03-05 | Panasonic Corp | 固体電解コンデンサ |
JP5261199B2 (ja) * | 2009-01-07 | 2013-08-14 | 三洋電機株式会社 | 電解コンデンサの製造方法 |
CN103534774B (zh) | 2011-05-16 | 2015-05-27 | 松下电器产业株式会社 | 电极箔、其制造方法以及电容器 |
CN106486287A (zh) * | 2015-09-02 | 2017-03-08 | 北京纳米能源与系统研究所 | 可降解电容器及其制造方法 |
JP6735510B2 (ja) * | 2016-03-25 | 2020-08-05 | パナソニックIpマネジメント株式会社 | 電解コンデンサ |
CN106683881B (zh) * | 2016-08-05 | 2018-06-12 | 南京理工大学 | 一种纳米结构电介质电容器及其制备方法 |
CN114830276A (zh) * | 2019-12-17 | 2022-07-29 | 日本贵弥功株式会社 | 固体电解电容器及其制造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3106559B2 (ja) | 1991-07-05 | 2000-11-06 | 日本ケミコン株式会社 | 表面に金属酸化物を有する基材の製造方法 |
JP2770746B2 (ja) * | 1994-09-02 | 1998-07-02 | 日本電気株式会社 | 固体電解コンデンサ及びその製造方法 |
US6134099A (en) * | 1997-06-03 | 2000-10-17 | Matsushita Electric Industrial | Electrolytic capacitor having a conducting polymer layer without containing an organic acid-type dopant |
JP2000012402A (ja) | 1998-06-19 | 2000-01-14 | Nichicon Corp | アルミニウム電解コンデンサ用電極箔 |
JP2000182899A (ja) * | 1998-12-15 | 2000-06-30 | Showa Denko Kk | コンデンサの製造方法 |
EP1158552B2 (en) * | 1998-12-15 | 2011-05-18 | Showa Denko K.K. | Niobium capacitor and method of manufacture thereof |
US6519137B1 (en) * | 1999-09-10 | 2003-02-11 | Matsushita Electric Industrial Co., Ltd. | Solid electrolytic capacitor and production method thereof, and conductive polymer polymerizing oxidizing agent solution |
US6602741B1 (en) * | 1999-09-14 | 2003-08-05 | Matsushita Electric Industrial Co., Ltd. | Conductive composition precursor, conductive composition, solid electrolytic capacitor, and their manufacturing method |
JP2002299181A (ja) | 2001-03-29 | 2002-10-11 | Nippon Chemicon Corp | 固体電解コンデンサ |
JP2003022934A (ja) | 2001-07-05 | 2003-01-24 | Nippon Chemicon Corp | 電解コンデンサ |
JP2004265924A (ja) * | 2003-02-12 | 2004-09-24 | Sanyo Electric Co Ltd | 固体電解コンデンサ |
-
2003
- 2003-02-25 JP JP2003046958A patent/JP2004265951A/ja active Pending
-
2004
- 2004-02-16 CN CN2004800050876A patent/CN1754235B/zh not_active Expired - Lifetime
- 2004-02-16 US US10/546,209 patent/US7391604B2/en not_active Expired - Lifetime
- 2004-02-16 KR KR1020057015488A patent/KR101018581B1/ko active IP Right Grant
- 2004-02-16 DE DE112004000343T patent/DE112004000343T5/de not_active Ceased
- 2004-02-16 WO PCT/JP2004/001656 patent/WO2004077465A1/ja active Application Filing
- 2004-08-17 TW TW093124625A patent/TWI245300B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2004077465A1 (ja) | 2004-09-10 |
TWI245300B (en) | 2005-12-11 |
CN1754235A (zh) | 2006-03-29 |
DE112004000343T5 (de) | 2008-03-06 |
JP2004265951A (ja) | 2004-09-24 |
US7391604B2 (en) | 2008-06-24 |
CN1754235B (zh) | 2010-05-05 |
US20060146474A1 (en) | 2006-07-06 |
KR101018581B1 (ko) | 2011-03-03 |
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