WO2003083032A1 - Composition de diluant pour elimination de resine photosensible - Google Patents

Composition de diluant pour elimination de resine photosensible Download PDF

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Publication number
WO2003083032A1
WO2003083032A1 PCT/KR2003/000632 KR0300632W WO03083032A1 WO 2003083032 A1 WO2003083032 A1 WO 2003083032A1 KR 0300632 W KR0300632 W KR 0300632W WO 03083032 A1 WO03083032 A1 WO 03083032A1
Authority
WO
WIPO (PCT)
Prior art keywords
propyleneglycol
thinner composition
ether acetate
thinner
weight part
Prior art date
Application number
PCT/KR2003/000632
Other languages
English (en)
Inventor
Soon-Hee Park
Sang-Dai Lee
Woo-Sik Jun
Original Assignee
Dongjin Semichem Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongjin Semichem Co., Ltd. filed Critical Dongjin Semichem Co., Ltd.
Priority to AU2003214682A priority Critical patent/AU2003214682A1/en
Publication of WO2003083032A1 publication Critical patent/WO2003083032A1/fr

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/168Finishing the coated layer, e.g. drying, baking, soaking
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D9/00Chemical paint or ink removers
    • C09D9/005Chemical paint or ink removers containing organic solvents
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/37Polymers
    • C11D3/3746Macromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds
    • C11D3/3757(Co)polymerised carboxylic acids, -anhydrides, -esters in solid and liquid compositions
    • C11D3/3765(Co)polymerised carboxylic acids, -anhydrides, -esters in solid and liquid compositions in liquid compositions
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/43Solvents
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/0226Quinonediazides characterised by the non-macromolecular additives
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • G03F7/0233Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/42Stripping or agents therefor
    • G03F7/422Stripping or agents therefor using liquids only
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/42Stripping or agents therefor
    • G03F7/422Stripping or agents therefor using liquids only
    • G03F7/423Stripping or agents therefor using liquids only containing mineral acids or salts thereof, containing mineral oxidizing substances, e.g. peroxy compounds
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

Definitions

  • the present invention relates to a thinner composition for removing
  • crystal display devices particularly to a thinner composition for removing
  • Photolithography is a process of coating a photosensitive film on a
  • This photolithography process comprises:
  • composition on a substrate
  • a light source such as UV
  • substrate may cause many problems in the following processes, such as
  • substances may be peeled during transferring of the substrate to cause
  • Efficiency of a thinner composition is determined by dissolution rate
  • the dissolution rate of a thinner composition means
  • dissolution rate is appropriate. If the dissolution rate is too high, there may be
  • the thinner solution may bound
  • the thinner composition should readily evaporate and should not
  • volatility of the is so low that the thinner remains on the substrate, it may be a
  • the conventional thinner compositions are as follows.
  • Japan Patent Publication No. Sho 63-69563 discloses a method for
  • Japan Patent Publication No. Hei 4-49938 E. uses
  • Japan Patent Publication No. Hei 4-42523 discloses a method of using alkyl alkoxy propionate as a thinner.
  • ethyl lactate has high viscosity and low dissolution rate, so
  • Hei 4-130715 uses a mixture solvent comprising alkyl pyruvate and methyl
  • Japan Patent Publication No. Hei 7-146562 discloses
  • a thinner composition comprising a mixture of propyleneglycol alkyl ether and
  • Japan Patent Publication No. Hei 7-128867 uses a
  • thinner composition comprising a mixture of propyleneglycol alkyl ether, butyl
  • solvent mixture comprising propyleneglycol alkyl ether acetate
  • 4,886,728 uses a mixture comprising ethyl lactate and methyl ethyl ketone as a
  • lactate and methyl ethyl ketone is used rinsing ability on the edge side of the
  • An object of the present invention is to provide a thinner composition
  • Another object of the present invention is to provide a thinner
  • composition for removing photosensitive resin capable of preventing
  • Still another object of the present invention is to provide a thinner
  • composition for removing photosensitive resin capable of completely removing
  • Still another object of the present invention is to provide a thinner
  • composition for removing photosensitive resin having superior dissolution rate
  • Still another object of the present invention is to provide a thinner
  • composition for removing photosensitive resin having good pigment
  • Still another object of the present invention is to provide a thinner
  • composition for removing photosensitive resin having superior spreadability when contacting with interface of photosensitive solution, and thereby capable
  • Still another object of the present invention is to provide a thinner
  • the present invention provides a thinner
  • composition for rinsing used in manufacture of semiconductor devices
  • liquid crystal display devices which comprises:
  • the thinner composition comprises:
  • the present invention is based on the finding that a thinner composition for removing photosensitive solution has superior ability when the
  • the alkyl group may
  • cycloketone cyclopentanone, cyclohexanone, cycloheptanone
  • the polyethylene based condensate functions as nonionic surfactant.
  • polyethylene condensate of alkyl phenol can be used.
  • the alkyl phenol may be derived from polymerized propylene,
  • diisobutylene, octene or nonene examples of such compounds are
  • nonylphenol obtained by condensing 1 mol of phenol with about 9.5 mol of
  • the fluorinated acrylic copolymer is highly soluble in water and other.
  • this copolymer is below 0.001 weight part, dissolution ability to the
  • Propyleneglycol monomethyl ether acetate is known to be safe to
  • Hexanone is a cycloketone that dissolves a variety of resins well.
  • Butyl acetate is an alkyl acetate that has low surface tension, is highly
  • the present invention combines above four components and coats the
  • photosensitive substances formed on the edge and side of the substrate are
  • thinner composition can be controlled depending on the kind of photosensitive resin
  • a minute circuit pattern can be formed by a
  • Substrate sample to be used in Examples was prepared as follows.
  • PGMEA stands for propyleneglycol monomethyl ether acetate
  • NP-1019 is Dongnam Chemical Industries' Monopol NP-1019, which is
  • OP-1015 is Dongnam Chemical Industries' Monopol OP-1015, which is
  • R-08 is Dainippon Inc And Chemicals' R-08, which is a fluorinated
  • Photosensitive film composition was coated on each 8-inch silicon
  • the thinner composition shown in Table 1 was injected through an
  • compositions are more stable in change of process conditions than the
  • Thinner compositions according to the present invention can remove a

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Wood Science & Technology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Organic Chemistry (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Detergent Compositions (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Materials For Photolithography (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

L'invention concerne une composition de diluant, destinée à l'élimination de résine photosensible utilisée dans les procédés de fabrication de dispositifs semi-conducteurs et de dispositifs d'affichage à cristaux liquides. Cette composition comprend un monoalkylétheracétate de propylèneglycol, une cyclocétone, un condensat à base de polyéthylène et un copolymère acrylique fluoré.
PCT/KR2003/000632 2002-03-29 2003-03-28 Composition de diluant pour elimination de resine photosensible WO2003083032A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003214682A AU2003214682A1 (en) 2002-03-29 2003-03-28 Thinner composition for removing photosensitive resin

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2002-0017385A KR100503967B1 (ko) 2002-03-29 2002-03-29 감광성 수지 제거용 씬너 조성물
KR10-2002-0017385 2002-03-29

Publications (1)

Publication Number Publication Date
WO2003083032A1 true WO2003083032A1 (fr) 2003-10-09

Family

ID=28673037

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2003/000632 WO2003083032A1 (fr) 2002-03-29 2003-03-28 Composition de diluant pour elimination de resine photosensible

Country Status (4)

Country Link
KR (1) KR100503967B1 (fr)
AU (1) AU2003214682A1 (fr)
TW (1) TWI226978B (fr)
WO (1) WO2003083032A1 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006104340A1 (fr) * 2005-03-31 2006-10-05 Dongjin Semichem Co., Ltd. Composition de diluant pour retirer du photoresist
JP2007531898A (ja) * 2003-06-03 2007-11-08 ドウジン セミケム カンパニー リミテッド 感光性樹脂除去用シンナー組成物
CN1987663B (zh) * 2005-12-23 2010-12-01 新应材股份有限公司 光阻清洗剂
WO2012056311A2 (fr) * 2010-10-29 2012-05-03 Az Electronic Materials Usa Corp. Décapant pour élimination de surépaisseurs périphériques de revêtements

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100718639B1 (ko) * 2004-10-27 2007-05-16 주식회사 이엔에프테크놀로지 안료 분산형 감광제 제거용 세정제 조성물
JP2007163983A (ja) * 2005-12-15 2007-06-28 Tokyo Ohka Kogyo Co Ltd 洗浄剤
KR100812085B1 (ko) * 2006-12-22 2008-03-07 동부일렉트로닉스 주식회사 반도체 소자의 개별화 방법
KR102347910B1 (ko) 2016-11-07 2022-01-06 동우 화인켐 주식회사 감광성 수지 및 반사방지막의 도포성 향상 및 제거용 신너 조성물
KR102652985B1 (ko) 2016-11-07 2024-03-29 동우 화인켐 주식회사 감광성 수지 및 반사방지막의 도포성 향상 및 제거용 신너 조성물

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58105182A (ja) * 1981-12-18 1983-06-22 Olympus Optical Co Ltd 感光体再生方法
US4948697A (en) * 1985-10-28 1990-08-14 Hoechst Celanese Corporation Positive photoresist with a solvent mixture of propylene glycol alkyl ether and propylene glycol alkyl ether acetate
US4983490A (en) * 1985-10-28 1991-01-08 Hoechst Celanese Corporation Photoresist treating composition consisting of a mixture of propylene glycol alkyl ether and propylene glycol alkyl ether acetate
WO2001048555A1 (fr) * 1999-12-24 2001-07-05 Samsung Electronics Co., Ltd. Diluant pour le rinçage de la photoresine et procede de traitement d'une couche de photoresine

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58105182A (ja) * 1981-12-18 1983-06-22 Olympus Optical Co Ltd 感光体再生方法
US4948697A (en) * 1985-10-28 1990-08-14 Hoechst Celanese Corporation Positive photoresist with a solvent mixture of propylene glycol alkyl ether and propylene glycol alkyl ether acetate
US4983490A (en) * 1985-10-28 1991-01-08 Hoechst Celanese Corporation Photoresist treating composition consisting of a mixture of propylene glycol alkyl ether and propylene glycol alkyl ether acetate
WO2001048555A1 (fr) * 1999-12-24 2001-07-05 Samsung Electronics Co., Ltd. Diluant pour le rinçage de la photoresine et procede de traitement d'une couche de photoresine

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007531898A (ja) * 2003-06-03 2007-11-08 ドウジン セミケム カンパニー リミテッド 感光性樹脂除去用シンナー組成物
WO2006104340A1 (fr) * 2005-03-31 2006-10-05 Dongjin Semichem Co., Ltd. Composition de diluant pour retirer du photoresist
CN1987663B (zh) * 2005-12-23 2010-12-01 新应材股份有限公司 光阻清洗剂
WO2012056311A2 (fr) * 2010-10-29 2012-05-03 Az Electronic Materials Usa Corp. Décapant pour élimination de surépaisseurs périphériques de revêtements
WO2012056311A3 (fr) * 2010-10-29 2012-08-02 Az Electronic Materials Usa Corp. Décapant pour élimination de surépaisseurs périphériques de revêtements

Also Published As

Publication number Publication date
TWI226978B (en) 2005-01-21
KR100503967B1 (ko) 2005-07-26
KR20030078374A (ko) 2003-10-08
AU2003214682A1 (en) 2003-10-13
TW200304585A (en) 2003-10-01

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