WO2003056377A1 - Telescope a large bande - Google Patents
Telescope a large bande Download PDFInfo
- Publication number
- WO2003056377A1 WO2003056377A1 PCT/JP2002/013484 JP0213484W WO03056377A1 WO 2003056377 A1 WO2003056377 A1 WO 2003056377A1 JP 0213484 W JP0213484 W JP 0213484W WO 03056377 A1 WO03056377 A1 WO 03056377A1
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- WIPO (PCT)
- Prior art keywords
- light
- optical system
- incidence optical
- reflecting mirror
- reflected
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
- G02B23/02—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices involving prisms or mirrors
- G02B23/06—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices involving prisms or mirrors having a focussing action, e.g. parabolic mirror
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
- G02B23/02—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices involving prisms or mirrors
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure
Definitions
- the present invention relates to a broadband telescope, and more particularly, to a light source having a wide energy band.
- a broadband telescope suitable for observation of incident astronomical objects.
- a multilayer mirror is formed on a surface and reflects only light having a predetermined energy corresponding to the multilayer with a high reflectance, and a reflected light reflected by the mirror is collected.
- a normal incidence telescope having a detector such as a semiconductor detector for detecting light having a predetermined energy and observing light having a predetermined energy is known.
- the apparent energy level fluctuates considerably due to collective motion and red shift, so that it is not observed in the energy band expected for stationary systems.
- the multilayer film formed on the surface of the reflecting mirror has a high reflectance only for light of a predetermined energy, the reflection
- the problem is that only light of a certain energy reflected by the mirror with high reflectance can be observed, and light in a wide energy band, for example, light in the visible to X-ray region cannot be observed. There was.
- a single telescope can observe only light having a predetermined energy corresponding to the multilayer film of the reflector.
- new problems will arise, such as increased costs and more room for placing multiple direct-incidence telescopes.
- grazing incidence optical systems are known to provide high reflectivity in the region from visible light to X-rays.However, such grazing incidence optical systems have various problems such as a narrow field of view and a small effective area. There was.
- the present invention has been made in view of the above-mentioned problems of the conventional technology. The purpose is to provide a broadband telescope that can observe light in a wide energy band by making good use of the advantages of each of the normal incidence optical system and the oblique incidence optical system. It is.
- an object of the present invention is to provide a composite telescope comprising a direct-incidence optical system and an oblique-incidence optical system, for example, to reflect light in a wide energy band from visible light to X-rays with high reflectance.
- the purpose of the present invention is to provide a broadband telescope that can reduce costs and save space by reflecting light at the same time, and can efficiently observe light in a wide energy band. Disclosure of the invention
- the present invention provides a grazing incidence optical system in which light is obliquely incident on a surface that reflects incident light, and a light that is substantially perpendicular to a surface that reflects incident light.
- a direct-incidence optical system to be incident, reflected light reflected on the surface of the oblique-incidence optical system and reflected light reflected on the surface of the direct-incidence optical system, and the incident light And a detector for spectrally detecting the light.
- the light in the wide energy band for example, the region from visible light to X-rays is obtained.
- the light reflected on the surface of the optical system is spectrally detected by the emitter, the advantages of the normal incidence optical system and the oblique incidence optical system Is used well, and it is possible to observe light in a wide energy band.
- the confocal compound telescope of the direct-incidence optical system and the oblique-incidence optical system reflects light in a wide energy band with a high reflectance, cost can be reduced and space can be saved and efficiency can be improved. It is possible to simultaneously observe light in a wide energy band.
- the direct-incidence optical system may be located on the inner side and the detector may be located on the optical axis as compared with the oblique-incidence optical system. In this way, further space saving can be realized, and the entire telescope can be reduced in size.
- the present invention provides a first reflecting mirror which reflects light incident on a first surface portion formed of a paraboloid of revolution, and a first reflecting mirror formed on a second surface portion formed of a hyperboloid of revolution.
- An oblique incidence optical system section having a second reflecting mirror for reflecting light reflected on the surface section; and a predetermined length in a range from vacuum ultraviolet rays to extreme ultraviolet rays, wherein a period length is continuously changed in a depth direction.
- a third surface portion on which a multilayer film having a high reflectivity due to total reflection is formed over a visible light region, and the light incident on the third surface portion is reflected by the third surface portion.
- the periodic length is changed in the depth direction in correspondence with the third reflecting mirror that reflects and the third surface portion of the third reflecting mirror, and in the region from vacuum ultraviolet light to extreme ultraviolet light.
- the light of the given energy A fourth surface portion on which a multilayer film having high reflectivity due to total reflection over the visible light region is formed, while reflecting the light, respectively;
- a direct-incidence optical system section having a fourth reflecting mirror for reflecting light reflected on the third surface section of the third reflecting mirror; and the second surface of the second reflecting mirror
- the light reflected by the section and the light reflected by the fourth reflecting mirror are made incident, and a detector for spectrally detecting the incident light is provided.
- light in a wide energy band is transmitted to the first surface of the first reflector of the oblique incidence optical system and the third surface of the third reflector of the direct incidence optical system.
- the incident light enters the oblique incidence optical system
- the light in the range from visible light to extreme ultraviolet light is reflected with high reflectance
- the light reflected on the surface of the oblique incidence optical system and the surface of the direct incidence optical system is a detector. Since it is spectrally detected by, it is possible to observe light in a wide energy band, especially light in the visible to X-ray region.
- the confocal compound telescope of the direct-incidence optical system and the oblique-incidence optical system reflects light in a wide energy band with high reflectivity, thereby reducing costs and saving space. Light in a wide energy band can be efficiently observed simultaneously.
- the first reflecting mirror and the second reflecting mirror of the oblique incidence optical system unit constitute a substantially cylindrical aspherical reflecting mirror, and are provided on the inner diameter side of the aspherical reflecting mirror.
- the direct incidence optical system is located, and the detector is located on the optical axis. In this way, further space saving can be realized, and the entire telescope can be downsized.
- the detector may be a superconducting tunnel junction element.
- the superconducting tunnel junction element which functions as a detector having high sensitivity and spectral capability in a wide band from infrared rays to X-rays, allows light in a wide energy band to be reflected by one or more reflecting mirrors. Can be spectrally detected with a single detector.
- the reflected light reflected on the surface portion of the oblique incidence optical system portion only light having a higher energy than the reflected light reflected on the surface portion of the direct incidence optical system portion is selectively used. It is also possible to have a filter for making the light incident on the detector.
- FIG. 1 is a conceptual configuration explanatory view showing an example of an embodiment of a broadband telescope according to the present invention.
- FIG. 2 is a schematic structural explanatory view showing an example of an embodiment of the broadband telescope according to the present invention.
- FIG. 3 is an explanatory perspective view mainly showing the oblique incidence optical system of the broadband telescope according to the present invention.
- FIG. 4 is an explanatory perspective view mainly showing the direct incidence optical system of the broadband telescope according to the present invention.
- FIG. 5 (a) is an explanatory diagram mainly showing a surface of a reflecting mirror which is a primary mirror of a direct incidence optical system of a broadband telescope according to the present invention
- FIG. FIG. 2 is a partially enlarged explanatory view of a cross-sectional view taken along line A-A.
- FIG. 6 (a) is a graph showing the reflectivity of the surface of the superconducting tunnel junction device
- FIG. 6 (b) is a graph showing the transmittance of the superconducting tunnel junction device.
- FIG. 7 is a graph showing an example of energy resolution of a superconducting tunnel junction device in the region from ultraviolet rays to X-rays.
- FIG. 8 is a graph showing an example of the energy resolution of the superconducting tunnel junction device in the X-ray region.
- Figures 9 (a), (b), (c), and (d) are graphs showing examples of the energy resolution of the superconducting tunnel junction device in the soft X-ray region.
- Figures 9 (e), (f), and (g) (h) is a graph showing an example of the energy resolution of the superconducting tunnel junction device in the extreme ultraviolet region.
- FIG. 10 is a graph showing the combined reflectance characteristics of the oblique incidence optical system and the direct incidence optical system in an example of the embodiment of the broadband telescope according to the present invention.
- FIG. 11 is a graph showing the combined reflectance characteristics of the oblique incidence optical system and the direct incidence optical system in another example of the embodiment of the broadband telescope according to the present invention.
- FIG. 12 is an explanatory diagram showing a first Lagrangian point (L 1) as one example of locating the broadband telescope according to the present invention.
- FIG. 13 is an explanatory diagram showing an example of specific dimension setting and the like of the broadband telescope according to the present invention.
- Figures 14 (a) and 14 (b) are graphs showing the transmittance of the A1ZC (aluminum / carbon) metal thin film filter.
- FIG. 1 is a conceptual diagram illustrating an example of an embodiment of a broadband telescope according to the present invention
- FIG. 2 is a schematic explanatory diagram illustrating an example of an embodiment of a broadband telescope according to the present invention. It is shown.
- the broadband telescope 10 includes an oblique incidence optical system unit 12 in which light is obliquely incident on the reflecting mirror 30, a normal incidence optical system unit 14 in which light is incident on the reflecting mirror 40 almost perpendicularly, and oblique incident optical system.
- the reflected light from the system unit 12 and the reflected light from the direct-incidence optical system unit 14 are condensed.
- a superconducting tunnel junction element (Superjunction Tunnel Junion: ST J) 16 as a detector is provided. It is configured.
- the broadband telescope 10 includes a cylindrical main body 20 having a hollow interior 20a.
- One end of the main body 20 is closed by a substantially circular bottom 20b, and the other end is opened by a substantially circular opening 20c. Further, it has a wall portion 20f that divides the main body portion 20 into a front side 20d and a rear side 20e, and a support portion 20g extending from the wall portion 20f.
- the central axis of the main body 20 is an axis passing through the center of the optical system of the oblique incidence optical system section 12 and an axis passing through the center of the optical system of the direct incidence optical system section 14, that is, a broadband telescope 10 This corresponds to the optical axis ⁇ 1 ⁇ (see the dashed line in FIG. 2).
- the oblique incidence optical system section 12 includes a so-called IIu-type (Wo 1 ter) I-type substantially cylindrical aspherical reflecting mirror 12 c used in an oblique incidence telescope, and a wall of the main body section 20. It is composed of a part 20f and a philharmonic philosophy 34 set up by a rooster (see Fig. 3).
- the aspherical reflecting mirror 12c is located near the opening 20c on the front side 20d of the main body 20.
- a paraboloid 1 2a composed of a plurality of reflectors 30 disposed therein; and a hyperboloid 1 2b composed of a plurality of reflectors 32 disposed near a wall 20 f of the main body 20. It consists of.
- Each of the plurality of reflecting mirrors 30 constituting the paraboloid 12a is substantially a cylindrical body as a whole, and has a surface portion 30a formed as a rotating paraboloid.
- each of the plurality of reflecting mirrors 32 constituting the hyperboloid 12b is substantially a cylindrical body as a whole, and has a surface portion 32a formed as a rotating hyperboloid.
- the surface portion 30a of the reflecting mirror 30 and the surface portion 32a of the reflecting mirror 32 are coated with Au (gold) or Pt (platinum).
- the plurality of reflecting mirrors 30 and the plurality of reflecting mirrors 32 respectively correspond to each other in a one-to-one correspondence, and are multiplexed and arranged concentrically around the optical axis 0- ⁇ .
- the parabolic surface 12a and the hyperboloid 12b are located in this order from the opening 20c side of the part 20. That is, one end 3 Ob of the reflecting mirror 30 of the parabolic surface 12 a is located near the opening 20 c of the main body 20, and the other end 30 c of the reflecting mirror 30. And one end 32 b of the reflector 32 are close to each other, and the other end 32 c of the reflector 32 is located on the wall 20 f side of the main body 20.
- the fill filter 34 is a substantially ring-shaped body having a substantially circular hole 34a drilled in the center, and is disposed on the wall 20f of the main body 20 and has a reflector 3 It is located near the end 3 2c of 2. This filter cuts off light below the energy of extreme ultraviolet rays.
- the normal incidence optical system section 14 is located on the inner diameter side of the substantially cylindrical aspherical reflecting mirror 1 2c composed of the parabolic surface 12a and the hyperboloid surface 12b of the oblique incidence optical system section 12.
- Is located in the body A reflecting mirror 40 supported by the supporting portion 20 g on the front side 20 d of 20; a reflecting mirror 42 supported by the front arm portion 20 h extending from the supporting portion 20 g; It has a filter 44 supported by a rear arm portion 20 i extending from the support portion 20 g (see FIG. 4).
- the direct-incidence optical system section 14 including the reflecting mirror 40, the reflecting mirror 42, and the filter 44 is provided with a so-called Cassegrain on the inner diameter side of the aspherical reflecting mirror 12c of the oblique incidence optical system section 12. It constitutes a type of telescope.
- the surface portion 4 Ob of the primary reflecting mirror 40 and the surface portion 42 a of the secondary reflecting mirror 42 oppose each other, and the optical path is turned back by the secondary reflecting mirror 42, and the primary mirror
- the focal point is focused on the rear surface 40c side of the barrel reflecting mirror 40.
- a superconducting tunnel junction device 16 is arranged at the position where the above-mentioned focal point is formed.
- the reflector 40, the reflector 42, and the filter 44 are respectively located at the center of the reflector 40, the center of the reflector 42, and the center of the filter 44, respectively. It is arranged so as to coincide with axis 0-0.
- the reflecting mirror 40 is a circular dish-shaped body 40a as a whole, and a hole 40d that is open at the surface portion 40b and the back surface portion 40c is formed at the center. Also, the surface portion 40b of the dish 40a is formed as a paraboloid of revolution formed concavely around the hole 40d (FIGS. 4 and 5 (a) ( b)).
- a first layer 40 e-l having a predetermined refractive index is formed in the entire region of the surface portion 4 Ob of the substantially ring-shaped I dog, and the first layer 40 e-1 is formed on the first layer 40 e-1.
- the second layer 40e-2 having a refractive index different from the refractive index of the first layer 40-1 is laminated.
- a predetermined number n of layers is defined as a set of two layers of the first layer 40 e-1 and the second layer 40 e-2 laminated on the first layer 40 e-1. (However, “n” is a positive integer.)
- a multilayer film 40 e is formed on the surface portion 4 Ob by laminating the layers.
- the first layer 40 e— 1 is formed of, for example, heavy elements such as Ni (nickel) and Mo (molybdenum), and the second layer 40 e— 1 2 is formed by light elements such as C (carbon) and Si (silicon).
- thin films having different refractive indices are stacked in a multilayer shape, and the period length d of J3U of a pair of the first layer 40e-1 and the second layer 40e-2 uses the Bragg reflection.
- the light incident on the multilayer film is reflected at the boundary between the first layer 40e-1 and the second layer 40e-2, and the first layer 4e is formed.
- the interference of the reflected light reflected at the boundary between 0 e-1 and the second layer 40 e-2 causes light of a predetermined energy to be reflected at a high level of reflectance. .
- the multilayer film 40 e formed on the surface portion 4 Ob of the reflecting mirror 40 is a multilayer film having a different cycle length d.
- the period length d of the multilayer film 40e changes continuously in the depth direction of the multilayer film 40e (see FIG. 5B). More specifically, in the multilayer film 40 e of the surface portion 4 Ob of the reflecting mirror 40, the periodic length d decreases as the distance from the surface 40 ee increases along the depth direction of the multilayer film 40 e, The period length d is made longer as it approaches the surface 40 ee.
- the period length far from the surface 40 ee and the depth The middle period length d 2 in the direction and the period length d 3 in the vicinity of the surface 40 ee of the multilayer film 40 e have a relationship of period length d 2 ⁇ period length d 3 .
- the period length d of the multilayer film 40 e of the surface portion 40 b of the reflecting mirror 40 is set to correspond to each of light having a predetermined energy in the region from vacuum ultraviolet light to extreme ultraviolet light, so that the multilayer film 40 e It changes continuously in the depth direction. Accordingly, the first layer 40 e ⁇ 1 and the second layer 40 e of the different period length d (for example, the period length (1 ⁇ d 2 , d 3 )) of the multilayer film 40 e of the reflecting mirror 40 are different. — The energy of the light reflected at the interface with 2 using Bragg reflection will be different.
- the “multilayer film in which the period length d is continuously changed in the depth direction” is appropriately referred to as “super mirror”.
- the surface portion 42a of the reflecting mirror 42 is convex and formed of a super mirror.
- the super mirror of the reflecting mirror 42 is designed in accordance with various conditions such as the type of the super mirror constituting the concave surface portion 4 Ob of the reflecting mirror 40 and the focal length. .
- the surface portion 42a of the reflecting mirror 42 reflects the light reflected on the surface portion 40b of the reflecting mirror 40 with a high reflectance.
- a known technique can be used. Detailed description of the method will be omitted.
- the fill filter 44 is a substantially disc-shaped body, is supported by the rear support portion 20 i of the main body 20, and is located on the rear surface 40 c side of the reflecting mirror 40 and has a hole portion 4. It is located near 0 d. This filter is used to adjust the amount of light.
- the superconducting tunnel junction device 16 is a type of Josephson device and has a structure in which a thin insulating film (for example, aluminum oxide) is sandwiched between superconducting metal thin films (for example, niobium, aluminum, titanium, etc.). Have.
- the superconducting tunnel junction element 16 is a detector that condenses the reflected light from the oblique incidence optical system unit 12 and the reflected light from the direct incidence optical system unit 14 as described above. More specifically, when operating at a cryogenic temperature of about 0.3 K and light enters the superconducting tunnel junction element 16, the energy of the incident light is absorbed by the superconducting metal thin film. When the energy of the light incident on the superconducting metal thin film of the superconducting tunnel junction element 16 is absorbed, dissociation of the Cooper pair in the superconducting metal thin film and generation of phonons are caused. Furthermore, the process in which the generated phonons dissociate the Cooper pair occurs within a time of about 10 to 12 seconds.
- the superconducting tunnel junction element 16 functions as a detector having high sensitivity and spectral capability in a wide band from infrared rays to X-rays.
- Fig. 6 (a) shows the reflectivity of the surface of the superconducting tunnel junction device 16
- Fig. 6 (b) shows the transmissivity of the superconducting tunnel junction device 16. It has been. As is evident from the reflectivity and transmittance of the superconducting tunnel junction device 16, the photon absorption of the superconducting tunnel junction device 16 is 95% or more. In addition, the superconducting tunnel junction device 16 emits light in the region from extreme ultraviolet to soft X-rays.
- the spectral detection of light in the region from visible light to hard X-rays can be achieved. It is realized.
- FIG. 7 is a graph showing an example of the energy resolution of the superconducting tunnel junction device 16 in the region from the extreme ultraviolet to the X-ray
- FIG. 8 shows the superconducting tunnel junction device 16.
- Graphs showing an example of the energy resolution in the X-ray region are shown.
- Figures 9 (a), (b), (c), and (d) show the soft X-ray region of the superconducting tunnel junction device 16.
- Fig. 9 (e), (f), (g), and (h) show an example of the energy resolution of the superconducting tunnel junction device 16 in the extreme ultraviolet region.
- a graph is shown.
- a filter 50 is disposed in front of the superconducting tunnel junction element 16.
- Phil Yuichi 50 is a substantially disc-shaped body that blocks infrared rays.
- the infrared rays are cut off by the filter 50 and the infrared rays do not enter the superconducting tunnel junction element 16. Therefore, a temperature rise of the superconducting tunnel junction element 16 is prevented, a favorable operating environment is maintained, and a more accurate detection result can be obtained.
- the oblique incidence optical system 12 of the wide energy band light obliquely incident on the surface 30 a of the reflecting mirror 30, the light having the energy equal to or less than the hard X-ray energy is obliquely incident on the oblique incidence optical system.
- the light is reflected twice by the aspherical reflecting mirror 1 2c of the section 12.
- the reflecting mirror 30 Of the light in the wide energy band obliquely incident on the surface portion 30a, light having energy equal to or less than the hard X-ray energy is reflected on the surface portion 30a of the reflecting mirror 30.
- the light reflected on the surface portion 30a of the reflecting mirror 30 is obliquely incident on the surface portion 32a of each of the plurality of reflecting mirrors 32 constituting the hyperboloid 12b of the oblique incidence optical system portion 12. And is reflected on the surface 32 a of the reflecting mirror 32.
- the light reflected on the surface portion 32a of the reflecting mirror 32 that is, the light in the range from visible light to hard X-rays in the light of a wide energy band incident on the surface portion 30a of the reflecting mirror 30 Is incident on Phil Yuichi 34.
- the light below the energy of the polar ⁇ ⁇ ultraviolet ray is cut off by the filter 34, and the light in the soft X-ray to hard X-ray region is transmitted through the filter 34 to the superconducting tunnel junction device 16.
- the reflectivity of the surface portion 40 b of the reflecting mirror 40 is equal to that of the first layer 40 e-1 and the second layer 40 e-2 of the multilayer film 40 e having a predetermined period length d.
- the reflectivity of each of the boundary surfaces and the anti-oblique ratio of the surface 40 ee of the multilayer film 40 e are superimposed (see FIG. 10). As a result, the light in the range from visible light to extreme ultraviolet light of the incident light in one band of wide energy is reflected with high reflectance.
- the light reflected by the supermirror constituting the surface portion 40b of the reflecting mirror 40 in this way is transmitted by the supermirror constituting the surface portion 42a of the reflecting mirror 42 as a sub mirror. Is reflected.
- the super mirror constituting the surface portion 42 a of the reflecting mirror 42 reflects the light reflected at the surface portion 40 b of the reflecting mirror 40 with a high reflectance. It is designed according to the super mirror constituting the surface portion 4 Ob of the mirror 40. For this reason, Of the light of a wide band of energy incident on the surface portion 40 b of the reflector 40, of the region from the visible light to the extreme ultraviolet region reflected by the surface portion 40 b of the reflector 40 with a high reflectance, Each light is reflected ⁇ with a high reflectance at the surface portion 42 a of the reflecting mirror 42.
- the light reflected by the surface portion 42a of the reflecting mirror 42 that is, the light in the wide energy band range from the visible light to the extreme ultraviolet region in the light of the wide energy band incident on the surface portion 40b of the reflecting mirror 40.
- Each light passes through the hole 40 d of the reflecting mirror 40, passes through the filter 44, and is focused on the superconducting tunnel junction device 16.
- the light in the wide energy band incident on the broadband telescope 10 the light in the soft X-ray to hard X-ray region, which is the reflected light from the oblique incidence optical system 12, and the direct incidence optical system 1
- the light in the range from visible light to extreme ultraviolet light, which is reflected light from 4 is condensed and incident on the superconducting tunnel junction element 16, it is proportional to the energy of the incident light as described above.
- the generated current is generated.
- a current is generated based on light from the soft X-rays to the hard X-rays, which is the reflected light from the grazing incidence optical system section 12
- a signal is extracted by a circuit for high energy and the direct incidence optical system
- a current is generated based on the light in the region from visible light to extreme ultraviolet, which is the reflected light from section 14
- a signal is extracted by a circuit for low energy, and the light is separated from the visible light to the hard X-ray region. Detection is performed.
- the oblique incidence optical system unit 12 having the aspherical reflecting mirror 12 c and the super mirror corresponding to light in the visible to ultraviolet region are formed.
- a single telescope, a confocal compound telescope with normal incidence and oblique incidence optics reflects light in a wide energy band from visible light to hard X-ray with high reflectance. Then, the light is spectrally detected by the superconducting tunnel junction element 16.
- the broadband telescope 10 in the present invention, light in a wide energy band, in particular, light in the range from visible light to X-rays can be observed.
- a single telescope that is, a confocal composite telescope of a direct-incidence optical system and an oblique incidence optical system, provides a wide energy band from visible light to hard X-rays. Since this light is reflected at a high reflectance, there is no need to use multiple telescopes, which enables cost reduction and space saving, and enables efficient simultaneous observation of light in a wide energy band.
- the broadband telescope 10 since a single telescope reflects light in a wide energy band from visible light to hard X-rays with a high reflectance, the oblique incidence optical system
- the superconducting tunnel junction element 16 that collects the reflected light from the section 12 and the reflected light from the direct-incidence optical system section 14 may be provided alone, which can reduce the cost and increase the cost. Since only one cooling device for cooling the superconducting tunnel junction element 16 is required, further space saving can be realized in an astronomical satellite equipped with the broadband telescope 10 for astronomical observation.
- the opening of the aspherical reflecting mirror 12c of the oblique incidence optical system 12 ie, the reflecting mirror 30
- the superconducting tunnel junction element 16 is disposed on the back side of the end 3 O b side) and on the back side of the reflecting mirror 40 as the primary mirror of the normal incidence optical system section 14, the superconducting tunnel is provided. It becomes easy to incorporate a cooling system such as a cooling device for cooling the junction element 16.
- the broadband telescope 10 is a so-called Oryu I-type oblique-incidence telescope, in which a direct-incidence optical system is disposed in a substantially cylindrical dead space formed on the inner diameter side of the aspherical reflector. It can be configured to be installed. For this reason, it is easy to reduce the size of the entire wide-band telescope, and in that case, the design know-how of the oblique incidence telescope can be used.
- the aberration can be corrected by the two mirror surfaces of the reflecting mirror 40 as the primary mirror and the reflecting mirror 42 as the secondary mirror.
- the superconducting tunnel junction element 16 is a detector capable of one-photon spectral detection from infrared rays to X-rays, the observation field of the oblique incidence optical system section 12 and the direct incidence optical system section 14 is limited. Even if they are different, they can be identified separately.
- the filter 34 of the oblique incidence optical system section 12 blocks light below the energy of extreme ultraviolet rays, and the multilayer of the surface section 40 b of the reflecting mirror 40 is provided.
- the cycle length d of the film 40e is set to correspond to each light having a predetermined energy in a region from vacuum ultraviolet light to extreme ultraviolet light, but it is a matter of course that the present invention is not limited to this.
- the period length of the multilayer film 40e of the surface portion 4Ob of the reflecting mirror 40 may be changed so as to correspond to light having predetermined energy in the region of soft X-rays from vacuum ultraviolet rays.
- the combined reflectance of the oblique incidence optical system 12 and the normal incidence optical system 14 is shown in FIG. Unlike 10, it is as shown in Figure 11.
- the fill filter 34 when the fill filter 34 is changed so that only light having higher energy than the reflected light from the normal incidence optical system section 14 is selectively transmitted, the fill fill optical system section is directly connected to the oblique incidence optical system section. It is possible to change the range of the energy allocated to each of the incident optical systems (see FIGS. 10 and 11).
- the fill light 44 adjusts the light amount.
- the light amount is not limited to this. It may be used to adjust the amount of reflected light from 14 and to select a band. Alternatively, the configuration of the normal incidence optical system 14 may be simplified by not disposing the filter 44.
- the super-mirror The uppermost layer of the reflecting mirror 40 and the reflecting mirror 42, for example, in the case of the reflecting mirror 40, the uppermost layer of the multilayer film 40e of the surface portion 4Ob shown in FIG. 5 (b).
- a certain surface 40 ee may be provided with a top coating such as Pt. In this way, the reflectance of light in the visible light region having lower energy than the region from vacuum ultraviolet light to extreme ultraviolet light can be further improved.
- the period length d of the super mirror is not limited to the above-described embodiment, and when a specific wavelength does not make sense in observation, such a specific wavelength is excluded. In this way, the period length d may be changed so as to correspond to only a necessary wavelength.
- the same supermirror is formed in the entire area of the surface portion 4Ob of the reflecting mirror 40 of the direct-incidence optical system 12; Although one kind of super-mirror is formed, it is needless to say that the present invention is not limited to this, and the surface portion 4 Ob of the reflecting mirror 40 is divided into a plurality of regions, and Different types of super mirrors may be formed for each section. At this time, it is preferable to change the super mirror of the reflecting mirror 42 according to the type of the super mirror of the reflecting mirror 40.
- the size and configuration of the main body 20 may be set according to the observation target of the reflecting mirrors 30, 32, 40, and 42 and the space of the mounted observation satellite.
- the broadband telescope according to the present invention is mounted on an observation satellite, and the broadband telescope according to the present invention is positioned at the first Lagrangian point (see L1 shown in FIG. 12).
- the number of each of the reflecting mirrors 30 and 32 constituting the aspherical reflecting mirror 12c of the oblique incidence optical system unit 12 is the parabolic surface of the aspherical reflecting mirror of the so-called Alternator I type oblique incidence telescope.
- the number may be smaller than the total number of the reflecting mirrors and the reflecting mirrors forming the hyperboloid.
- the number of the reflecting mirrors 30 and 32 is adjusted according to the size and position of the direct incidence optical system 14 located on the inner diameter side of the aspherical reflecting mirror 12c of the oblique incidence optical system 12, and oblique incidence is performed. It is preferable to change the space on the inner diameter side of the optical system section 12.
- the so-called ⁇ uoryu I-type substantially cylindrical aspherical reflecting mirror used in the grazing incidence telescope is arranged in the grazing incidence optical system unit 12.
- the present invention is not limited to this. Obviously, this is not the case, and a different type of reflector than the Ayuru I-type aspherical reflector may be provided.
- a thin film filter using a material absorption structure for example, an A1 / C (aluminum / iron-bon) metal thin film filter can be used (Fig. 14).
- a filter that uses the absorption structure of a substance or a bandpass filter that uses interference for vacuum ultraviolet light to visible light, it is possible to use a filter that uses the absorption structure of a substance or a bandpass filter that uses interference.
- each event of visible light may be separated from the phonon pen.
- a filter disposed before the superconducting tunnel junction element 16 a filter for adjusting the amount of light incident on the superconducting tunnel junction element 16 may be used.
- spectral imaging may be performed by using a plurality of superconducting tunnel junction devices 16 .In this case, various circuit systems may be changed. Good.
- the present invention can make good use of the advantages of each of the normal incidence optical system and the oblique incidence optical system to provide a wide energy band, for example, a range from visible light to X-rays. It has an excellent effect of observing light.
- a complex telescope of a normal incidence optical system and an oblique incidence optical system can be used, for example, for each light in a wide energy band from visible light to X-ray. Is reflected at a high reflectance, which is advantageous in that it can reduce costs and save space, and can efficiently observe light in a wide energy band.
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Astronomy & Astrophysics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Telescopes (AREA)
- Optical Elements Other Than Lenses (AREA)
- Lenses (AREA)
- Optical Filters (AREA)
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02790859A EP1469334B1 (en) | 2001-12-27 | 2002-12-25 | Broadband telescope |
US10/499,968 US7450299B2 (en) | 2001-12-27 | 2002-12-25 | Broadband telescope |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001-397998 | 2001-12-27 | ||
JP2001397998A JP4142289B2 (ja) | 2001-12-27 | 2001-12-27 | 広帯域望遠鏡 |
Publications (1)
Publication Number | Publication Date |
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WO2003056377A1 true WO2003056377A1 (fr) | 2003-07-10 |
Family
ID=19189269
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2002/013484 WO2003056377A1 (fr) | 2001-12-27 | 2002-12-25 | Telescope a large bande |
Country Status (4)
Country | Link |
---|---|
US (1) | US7450299B2 (ja) |
EP (1) | EP1469334B1 (ja) |
JP (1) | JP4142289B2 (ja) |
WO (1) | WO2003056377A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7253939B2 (en) * | 2005-09-30 | 2007-08-07 | Intel Corporation | Superconductor-based modulator for extreme ultraviolet (EUV) |
US7615385B2 (en) | 2006-09-20 | 2009-11-10 | Hypres, Inc | Double-masking technique for increasing fabrication yield in superconducting electronics |
US20100328762A1 (en) * | 2009-04-27 | 2010-12-30 | Trex Enterprises Corp. | Radiation coating for silicon carbide components |
FR2984584A1 (fr) * | 2011-12-20 | 2013-06-21 | Commissariat Energie Atomique | Dispositif de filtrage des rayons x |
CN105093484B (zh) * | 2015-08-27 | 2017-12-22 | 北京控制工程研究所 | 一种多层嵌套圆锥面型x射线掠入射光学镜头 |
JP6889897B2 (ja) * | 2016-06-10 | 2021-06-18 | 国立大学法人東海国立大学機構 | Frp製ミラー構造体の製造方法 |
CN106569521B (zh) * | 2016-11-04 | 2018-12-21 | 北京控制工程研究所 | 一种用于x射线脉冲星导航敏感器的精密控温装置 |
JP6921391B2 (ja) * | 2017-01-24 | 2021-08-18 | 国立研究開発法人宇宙航空研究開発機構 | 望遠鏡システム |
CN108572442B (zh) * | 2018-03-23 | 2020-11-27 | 同济大学 | 一种嵌套式分段型类Wolter-I型结构的设计方法 |
WO2021162669A1 (en) * | 2020-08-03 | 2021-08-19 | Roman Duplov | Device for reduction of off-axis aberrations of optical systems |
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JPH08136821A (ja) * | 1994-11-09 | 1996-05-31 | Mitsubishi Electric Corp | 光学望遠鏡装置 |
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US5753935A (en) * | 1990-03-26 | 1998-05-19 | Nippon Steel Corporation | Superconductive tunnel junction array radiation detector |
JPH11211895A (ja) * | 1998-01-28 | 1999-08-06 | Shimadzu Corp | X線光学装置 |
JP2002350730A (ja) * | 2001-03-19 | 2002-12-04 | Mitsubishi Electric Corp | 結像光学系 |
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NL7017658A (ja) * | 1970-12-03 | 1972-06-06 | ||
JPS59222932A (ja) | 1983-06-02 | 1984-12-14 | Sharp Corp | 半導体装置 |
US4562583A (en) * | 1984-01-17 | 1985-12-31 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Spectral slicing X-ray telescope with variable magnification |
US4941163A (en) * | 1985-08-15 | 1990-07-10 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Multispectral glancing incidence X-ray telescope |
JPH0575169A (ja) | 1991-09-11 | 1993-03-26 | Hitachi Ltd | 光超伝導素子 |
FR2711251B1 (fr) | 1993-10-15 | 1996-01-26 | Matra Marconi Space France | Télescope pour imagerie infrarouge ou visible. |
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GB9506010D0 (en) * | 1995-03-23 | 1995-08-23 | Anderson John E | Electromagnetic energy directing method and apparatus |
JPH09113697A (ja) | 1995-10-20 | 1997-05-02 | Nikon Corp | 多層膜反射鏡 |
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JPH1114913A (ja) | 1997-06-23 | 1999-01-22 | Kazuo Kosho | 第1面に凹球面反射鏡を使用した望遠鏡。 |
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JP3857058B2 (ja) | 2001-02-06 | 2006-12-13 | 三菱電機株式会社 | 反射型望遠鏡による天体観測用多周波共用望遠鏡装置 |
JP2002318157A (ja) | 2001-04-24 | 2002-10-31 | Nec Corp | 電磁波検出装置 |
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2001
- 2001-12-27 JP JP2001397998A patent/JP4142289B2/ja not_active Expired - Fee Related
-
2002
- 2002-12-25 WO PCT/JP2002/013484 patent/WO2003056377A1/ja active Application Filing
- 2002-12-25 EP EP02790859A patent/EP1469334B1/en not_active Expired - Lifetime
- 2002-12-25 US US10/499,968 patent/US7450299B2/en not_active Expired - Fee Related
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US5753935A (en) * | 1990-03-26 | 1998-05-19 | Nippon Steel Corporation | Superconductive tunnel junction array radiation detector |
JPH08136821A (ja) * | 1994-11-09 | 1996-05-31 | Mitsubishi Electric Corp | 光学望遠鏡装置 |
US5565983A (en) * | 1995-05-26 | 1996-10-15 | The Perkin-Elmer Corporation | Optical spectrometer for detecting spectra in separate ranges |
JPH11211895A (ja) * | 1998-01-28 | 1999-08-06 | Shimadzu Corp | X線光学装置 |
JP2002350730A (ja) * | 2001-03-19 | 2002-12-04 | Mitsubishi Electric Corp | 結像光学系 |
Non-Patent Citations (1)
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See also references of EP1469334A4 * |
Also Published As
Publication number | Publication date |
---|---|
EP1469334A4 (en) | 2007-06-13 |
US7450299B2 (en) | 2008-11-11 |
EP1469334B1 (en) | 2011-06-15 |
US20050122603A1 (en) | 2005-06-09 |
JP2003195184A (ja) | 2003-07-09 |
JP4142289B2 (ja) | 2008-09-03 |
EP1469334A1 (en) | 2004-10-20 |
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