WO2003036313A1 - Appareil et procede de mesure de deplacement lateral d'horloge - Google Patents

Appareil et procede de mesure de deplacement lateral d'horloge Download PDF

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Publication number
WO2003036313A1
WO2003036313A1 PCT/JP2002/010867 JP0210867W WO03036313A1 WO 2003036313 A1 WO2003036313 A1 WO 2003036313A1 JP 0210867 W JP0210867 W JP 0210867W WO 03036313 A1 WO03036313 A1 WO 03036313A1
Authority
WO
WIPO (PCT)
Prior art keywords
clock
signal
measured
skew
skew measurement
Prior art date
Application number
PCT/JP2002/010867
Other languages
English (en)
French (fr)
Inventor
Mani Soma
Masahiro Ishida
Takahiro Yamaguchi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2003538758A priority Critical patent/JP4171699B2/ja
Priority to DE10297381T priority patent/DE10297381T5/de
Publication of WO2003036313A1 publication Critical patent/WO2003036313A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
PCT/JP2002/010867 2001-10-25 2002-10-21 Appareil et procede de mesure de deplacement lateral d'horloge WO2003036313A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2003538758A JP4171699B2 (ja) 2001-10-25 2002-10-21 クロック・スキュー測定装置、クロック・スキュー測定方法
DE10297381T DE10297381T5 (de) 2001-10-25 2002-10-21 Vorrichtung und Verfahren zur Taktschrägemessung

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/033,188 US6737852B2 (en) 2001-10-25 2001-10-25 Clock skew measuring apparatus and method
US10/033,188 2001-10-25

Publications (1)

Publication Number Publication Date
WO2003036313A1 true WO2003036313A1 (fr) 2003-05-01

Family

ID=21868996

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/010867 WO2003036313A1 (fr) 2001-10-25 2002-10-21 Appareil et procede de mesure de deplacement lateral d'horloge

Country Status (4)

Country Link
US (1) US6737852B2 (ja)
JP (1) JP4171699B2 (ja)
DE (1) DE10297381T5 (ja)
WO (1) WO2003036313A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008501933A (ja) * 2004-06-07 2008-01-24 株式会社アドバンテスト 広帯域信号解析装置、広帯域周期ジッタ解析装置、広帯域スキュー解析装置、広帯域信号解析方法、及び試験装置システム
WO2008149990A1 (ja) * 2007-06-06 2008-12-11 Advantest Corporation 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法
WO2008149973A1 (ja) * 2007-06-07 2008-12-11 Advantest Corporation 試験装置およびキャリブレーション用デバイス
US8138799B2 (en) 2009-12-28 2012-03-20 Nec Corporation Inter-phase skew detection circuit for multi-phase clock, inter-phase skew adjustment circuit, and semiconductor integrated circuit

Families Citing this family (10)

* Cited by examiner, † Cited by third party
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TW555979B (en) * 2002-07-25 2003-10-01 Via Tech Inc Device and method for verifying clock signal frequency
US7219270B1 (en) * 2003-11-21 2007-05-15 Lsi Logic Corporation Device and method for using a lessened load to measure signal skew at the output of an integrated circuit
US7454647B1 (en) * 2005-07-28 2008-11-18 National Semiconductor Corporation Apparatus and method for skew measurement
US7620861B2 (en) * 2007-05-31 2009-11-17 Kingtiger Technology (Canada) Inc. Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
US9632136B2 (en) * 2013-04-04 2017-04-25 International Business Machines Corporation Precise estimation of arrival time of switching events close in time and space
TWI528724B (zh) * 2014-01-08 2016-04-01 晨星半導體股份有限公司 信號發送方法與相關之信號發送器
US9797938B2 (en) * 2014-03-28 2017-10-24 International Business Machines Corporation Noise modulation for on-chip noise measurement
US9933477B2 (en) * 2014-03-28 2018-04-03 Intel Corporation Semiconductor chip having transistor degradation reversal mechanism
US11047898B2 (en) * 2019-02-12 2021-06-29 Bae Systems Information And Electronic Systems Integration Inc. Vector processing using amplitude or power detectors
CN111913038B (zh) * 2020-06-03 2023-12-19 大唐微电子技术有限公司 一种多路时钟信号频率检测装置和方法

Citations (12)

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JPH0367850U (ja) * 1989-10-25 1991-07-03
JPH04340485A (ja) * 1991-05-16 1992-11-26 Nec Corp クロック観測回路
JPH05158575A (ja) * 1991-12-05 1993-06-25 Nec Corp クロックスキュー観測システム
JPH06149408A (ja) * 1992-11-12 1994-05-27 Nec Corp 集積回路装置
JPH0738590A (ja) * 1993-06-01 1995-02-07 Internatl Business Mach Corp <Ibm> 並列／直列バスにおけるエラー検出および回復システム
JPH0815380A (ja) * 1994-06-27 1996-01-19 Nec Corp 半導体集積回路装置
JPH11135920A (ja) * 1997-10-28 1999-05-21 Nec Corp プリント配線板およびクロックスキュー調整方法
JP2000035831A (ja) * 1998-07-21 2000-02-02 Nec Corp 可変閾値電圧トランジスタを用いた低スキュークロックツリー回路
JP2000091506A (ja) * 1998-09-16 2000-03-31 Matsushita Electric Ind Co Ltd 半導体集積回路
JP2000089849A (ja) * 1998-09-09 2000-03-31 Nec Corp クロックスキュー調整回路および該調整回路を備えた大規模集積回路
JP2000235063A (ja) * 1999-02-16 2000-08-29 Advantest Corp フェーズロックループ回路の遅延故障検出装置及び方法
JP2001228213A (ja) * 2000-02-18 2001-08-24 Nec Corp 半導体集積回路装置及びクロックスキューの検証方法

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US4412299A (en) * 1981-02-02 1983-10-25 Teltone Corporation Phase jitter detector
US4805195A (en) * 1984-06-08 1989-02-14 Amdahl Corporation Selectable timing delay circuit
US4833397A (en) * 1987-04-06 1989-05-23 Unisys Corporation Tester for verification of pulse widths in a digital system
US4896271A (en) * 1987-08-05 1990-01-23 Tektronix, Inc. Method and apparatus for measuring jitter in a periodic signal
US6150872A (en) 1998-08-28 2000-11-21 Lucent Technologies Inc. CMOS bandgap voltage reference
JP2001127623A (ja) * 1999-10-27 2001-05-11 Matsushita Electric Ind Co Ltd ジッタ検出回路
JP4445114B2 (ja) * 2000-01-31 2010-04-07 株式会社アドバンテスト ジッタ測定装置及びその方法
US6594595B2 (en) * 2001-04-03 2003-07-15 Advantest Corporation Apparatus for and method of measuring cross-correlation coefficient between signals

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367850U (ja) * 1989-10-25 1991-07-03
JPH04340485A (ja) * 1991-05-16 1992-11-26 Nec Corp クロック観測回路
JPH05158575A (ja) * 1991-12-05 1993-06-25 Nec Corp クロックスキュー観測システム
JPH06149408A (ja) * 1992-11-12 1994-05-27 Nec Corp 集積回路装置
JPH0738590A (ja) * 1993-06-01 1995-02-07 Internatl Business Mach Corp <Ibm> 並列／直列バスにおけるエラー検出および回復システム
JPH0815380A (ja) * 1994-06-27 1996-01-19 Nec Corp 半導体集積回路装置
JPH11135920A (ja) * 1997-10-28 1999-05-21 Nec Corp プリント配線板およびクロックスキュー調整方法
JP2000035831A (ja) * 1998-07-21 2000-02-02 Nec Corp 可変閾値電圧トランジスタを用いた低スキュークロックツリー回路
JP2000089849A (ja) * 1998-09-09 2000-03-31 Nec Corp クロックスキュー調整回路および該調整回路を備えた大規模集積回路
JP2000091506A (ja) * 1998-09-16 2000-03-31 Matsushita Electric Ind Co Ltd 半導体集積回路
JP2000235063A (ja) * 1999-02-16 2000-08-29 Advantest Corp フェーズロックループ回路の遅延故障検出装置及び方法
JP2001228213A (ja) * 2000-02-18 2001-08-24 Nec Corp 半導体集積回路装置及びクロックスキューの検証方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008501933A (ja) * 2004-06-07 2008-01-24 株式会社アドバンテスト 広帯域信号解析装置、広帯域周期ジッタ解析装置、広帯域スキュー解析装置、広帯域信号解析方法、及び試験装置システム
WO2008149990A1 (ja) * 2007-06-06 2008-12-11 Advantest Corporation 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法
JPWO2008149990A1 (ja) * 2007-06-06 2010-08-26 株式会社アドバンテスト 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法
WO2008149973A1 (ja) * 2007-06-07 2008-12-11 Advantest Corporation 試験装置およびキャリブレーション用デバイス
JPWO2008149973A1 (ja) * 2007-06-07 2010-08-26 株式会社アドバンテスト 試験装置およびキャリブレーション用デバイス
US8138799B2 (en) 2009-12-28 2012-03-20 Nec Corporation Inter-phase skew detection circuit for multi-phase clock, inter-phase skew adjustment circuit, and semiconductor integrated circuit

Also Published As

Publication number Publication date
JPWO2003036313A1 (ja) 2005-02-17
US6737852B2 (en) 2004-05-18
US20030094937A1 (en) 2003-05-22
DE10297381T5 (de) 2004-11-04
JP4171699B2 (ja) 2008-10-22

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