WO2002032589A2 - Poröse schichten und ein verfahren zu deren herstellung mittels spin-coating - Google Patents
Poröse schichten und ein verfahren zu deren herstellung mittels spin-coating Download PDFInfo
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- WO2002032589A2 WO2002032589A2 PCT/EP2001/012153 EP0112153W WO0232589A2 WO 2002032589 A2 WO2002032589 A2 WO 2002032589A2 EP 0112153 W EP0112153 W EP 0112153W WO 0232589 A2 WO0232589 A2 WO 0232589A2
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- porous
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J29/00—Catalysts comprising molecular sieves
- B01J29/03—Catalysts comprising molecular sieves not having base-exchange properties
- B01J29/035—Microporous crystalline materials not having base exchange properties, such as silica polymorphs, e.g. silicalites
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J37/00—Processes, in general, for preparing catalysts; Processes, in general, for activation of catalysts
- B01J37/02—Impregnation, coating or precipitation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/002—Processes for applying liquids or other fluent materials the substrate being rotated
- B05D1/005—Spin coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/022—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being a laminate, i.e. composed of sublayers, e.g. stacks of alternating high-k metal oxides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02203—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being porous
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02214—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H01L21/02216—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
- H01L21/31695—Deposition of porous oxides or porous glassy oxides or oxide based porous glass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D5/00—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
- B05D5/02—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures to obtain a matt or rough surface
Definitions
- the present invention relates to porous layers, a process for their production by means of spin coating and the use of these layers in microelectronics, in sensors, in catalytic reactions, in separation processes and in optical layers.
- zeolitic layers can be grown directly from hydrothermal synthesis gels or solutions on porous and non-porous substrates such as silicon, ceramics and metals (T. Bein, Chemistry of Materials, 1996, 8, 1636). When these layers are grown on porous substrates, membranes for separation processes are obtained.
- WO 97/33684 describes the deposition of nanoscale zeolite layers which are intended to serve as a seed layer. Subsequently a second zeolite layer is applied by hydrothermal synthesis.
- the processes described above are used essentially to produce error-free membranes for separation processes.
- these methods have the disadvantage that the substrates have to be immersed in the hydrothermal synthesis solution in order to allow the layer to grow.
- the growth conditions are typically characterized by a high pH (e.g. 11-14) and an elevated temperature (e.g. 90 - 200 ° C). Therefore, only a small number of substrates can be used which are not decomposed or attacked under the growing conditions.
- the number of suitable combinations of zeolite layer / substrate is therefore very limited.
- the growth reaction usually takes several hours to a few days. Such a period is incompatible with production lines operating today.
- Coatings made of mesoporous substances e.g. with structure-directing surfactants have so far been produced either by direct synthesis from precursor solutions on the substrate or by dip coating with suitable reactive precursor solutions (Huo et al., Chem. Mater., 1994, 6, 1176; Sellinger et al. Nature, 1998 , V. 394, 256). These methods also have the disadvantages described above.
- the porous layers can be seen as dielectric layers with low dielectric constants ("low- k "dielectrics).
- the dielectric constants of these layers are, for example, around 2.8.
- the development is moving towards smaller and smaller design dimensions. With the introduction of the 0.18 ⁇ m dimension, the delays of the entire circuits become sensitive Delays in the connecting line are influenced, so that copper conductors and "low-k" dielectric interlayers become more important.
- low-k dielectrics not only reduces the conductor-to-conductor capacitance, but also the crosstalk between neighboring connections
- HSQ hydrogen f-silsesquioxane
- CVD chemical vapor deposition
- Organic-inorganic polymer composites such as HSOP (hybrid-siloxane-organic polymer) and nanoporous amorphous silica films (Nanoglass) were developed with the aim of lowering the dielectric constant even further (D. Toma, S. Kaushal, D. Fatke, Proc. Electrochem. Soc, 2000, 5, 99-7).
- HSOP hybrid-siloxane-organic polymer
- Nanoporous amorphous silica films nanoporous silica films
- Mesoporous films for "low-k” applications were made by spin-coating a reactive precursor solution with organic templates on a silicon wafer, followed by prolonged heating, calcining and removal of the surface hydroxyl groups by treatment with hexamethyldisilazane (HMDS) (S Baskaran, J. Liu, K. Domansky, N. Kohler, X. Li, Ch. Coyle, G. Fryxell, S. Thevuthasan, RE Williford, Advanced Materials, 2000, 12, 291).
- HMDS hexamethyldisilazane
- reactive precursor solutions are applied to the substrates, so that subsequent synthesis steps are necessary in order to obtain porous materials.
- these layers have low k values, it is difficult to use them in chip manufacturing because they have poor mechanical stability and the manufacturing process is lengthy.
- Porous layers are also used in sensor technology.
- Typical components of sensors are transducers such as a quartz 'microbalance (QCM), which is combined with a selective layer.
- QCM quartz 'microbalance
- Sensors based on zeolite layers on piezoelectric QCM or surface wave transducers are described in US-A-5,151,110 and in S. Mintova, B.J. Schoeman, V. Valtchev, J. Sterte, S. Mo and T. Bein, Advanced Materials, 1997, 7, 585.
- the invention further relates to coated substrates produced using this method.
- the homogeneous coated substrates obtained can be used in catalysis or in separation processes or as dielectric layers in microelectronics or as selective layers in sensors or as optical layers. Coated substrates of this type could not be produced by previous processes and are therefore hitherto unknown.
- Fig. 2 scanning electron micrograph of a silicalite-1 layer applied to a silicon wafer by means of spin coating.
- the substrates are exposed to very little chemical and thermal stress.
- all substrates that can be introduced in a spin coating device can be coated.
- the substrates are planar and can be either porous or non-porous.
- the selection of the substrate depends on the intended use of the coated substrate.
- non-porous substrates are preferred in microelectronic applications, sensor applications and for optical coatings, while the substrate is typically porous in separation processes and catalytic applications.
- non-porous substrates are metals, semi-metals such as silicon; inorganic oxides such as silica or quartz; Glasses and ceramics.
- porous substrates are porous inorganic oxide ceramics, such as aluminum oxide, silicon oxide, zirconium oxide, titanium oxide and mixtures thereof; porous glasses and porous metals such as sintered porous metals.
- porous inorganic oxide ceramics such as aluminum oxide, silicon oxide, zirconium oxide, titanium oxide and mixtures thereof
- porous glasses and porous metals such as sintered porous metals.
- red and non-porous polymer substrates and wood can be used.
- Preferred substrates are silicon wafers, aluminum oxide, steel and gold.
- suitable cleaning steps such as rinsing with solvents, acidic or basic solutions, oxidizing treatments at high temperature, oxidizing treatments in the plasma or combinations of these and other treatments.
- the surface of the substrate in order to increase the adhesion between the substrate and the porous layer. Both physical and chemical methods for modifying the surface can be considered.
- the substrate can thus be provided with a layer which strengthens the adhesion between the substrate and the porous particles.
- the person skilled in the art can select a suitable surface modification from the known possibilities (Whitesides et al., Crit.. Rev. Surf. Chem., 1993, 3, 49; AR Bishop and RG Nuzzo, Curr. Opin. Colloidal Interface Sei., 1996, 1, 127).
- the adhesion between gold, which is used as the electrode material, and a zeolite layer can be improved by adsorbing a monolayer of mercapto propyltrimethoxysilane and then hydrolyzing the silane before the zeolite layer is applied.
- the porous layer is produced by applying a suspension of periodic porous particles to the substrate.
- microporous are preferred (average pore size between 0.2 and 2 nm) and mesoporous (average pore size between 2 and 50 nm) periodic materials are used, although materials with other pore diameters may also be suitable.
- the pore diameter can be determined by gas adsorption and electron microscopy.
- the porous particles should have an average particle diameter of at least 1 nm and less than 1 ⁇ m, preferably at most 200 nm. The size of the particles affects the quality of the coating. Particularly smooth, homogeneous coatings are achieved with small i ⁇
- Particles achieved for example, have an average particle diameter of at most 100 nm or at most 50 nm.
- Microporous particles which are preferably used are zeolites and materials of related crystalline lattice structures, supported layered minerals, such as montmorillonite, microporous particles produced by the sol-gel process and microporous carbon. Further preferred microporous particles are aluminum phosphates, silicon aluminum phosphates, metal aluminum
- zeolites are preferred as microporous materials and periodic mesostructures such as MCM-41, since their properties such as pore size, ion exchange capacity and acid functionality can be regulated well. This makes them as materials for the
- the zeolites can have hydrophobic or hydrophilic properties. Suitable structure types in the context of the present invention are AFI, AEL, BEA, CHA, FAU, FER, KFI, LTA, LTL, MAZ, MOR, MEL, MFI, MTN, MTT, MTW, OFF and TON.
- MFI or BEA zeolites with an aluminum content of 0 or at most 0.1 or 1% by weight and especially MFI zeolites (silicalite-1) are preferred for applications in microelectronics. According to the invention, it is also possible to use zeolites with a content of metals other than Si, in particular Al. In these applications in particular, the average particle diameter should be at most 100 nm, preferably at most 50 nm.
- Silicates, aluminum silicates, metal phosphates and other materials with a regular mesostructure can be used as periodic mesoporous particles.
- Suitable periodic mesoporous materials are e.g. in "Mesoporous Molecular Sieves 1998, Studies in Surface Science and Catalysis", Vol. 117, Elsevier, Amsterdam, 1998, pages 1-598.
- the periodic mesoporous particles can be obtained from metal oxide precursors or other related framework precursors and by ionic or non-ionic surfactants.
- the mesoporous structure can be generated by lyotropic, liquid-crystalline structure directors (e.g. alkylammonium surfactants, neutral amphiphiles or block copolymers).
- Preferred mesoporous materials in the context of this invention are MCM-41, MCM-48, SBA-15 and similar compounds with average particle diameters in the range from 50 to 500 nm.
- Zeolites are crystalline porous solids that are characterized by very sharply defined pore openings and channel dimensions in the range between 0.2 and about 2 nm distinguished. They also have high thermal and chemical stability and a large pore volume. This results in a variety of advantageous properties, such as the selective adsorption of gases and liquids, which allows certain substances to be adsorbed while others are excluded from the inside of the crystals (molecular sieve behavior). This allows fabrics to be separated according to their shape and size.
- zeolites By incorporating various elements into the zeolite lattice, their affinity for molecules to be adsorbed can be controlled over a wide range; This means that zeolites can behave both hydrophilically and hydrophobically - this also allows the adsorption properties to be controlled. These properties result in possible applications in membranes for separation processes as well as selective adsorption layers for sensors. Because of their possible high hydrophilicity, zeolites can be useful in dehumidifying films in optical windows.
- Zeolites have enormous mechanical and thermal stability compared to amorphous silicon dioxide; Some zeolites such as silicalite can be heated to over 1100 degrees Celsius, while the amorphous oxide begins to lose its porosity through softening over about 500 degrees. The chemical stability of silicon-rich zeolites is often much higher than that of amorphous oxides - the latter are ultimately used as starting materials for zeolite synthesis.
- lattice modules example aluminum in silicate
- charge can be introduced into the lattice; this then enables the easy exchange of ions from liquids.
- the ion exchange behavior of the zeolites is due to very high exchange capacity and Selectivity marked.
- acid groups of very strong acidity can also be introduced, resulting in high catalytic activity. Such high acid strengths are very difficult or impossible to achieve with amorphous materials.
- the ion exchange can e.g. for the introduction of metal ions such as Pt are used, which then sit on defined extra grid spaces and e.g. can be reduced in a controlled manner so that very fine metal clusters in the nanometer range are created. These are stabilized by the zeolite lattice and can serve as highly active catalysts. Further synthesis steps, e.g. Oxidation before or after film formation can follow in order to stabilize highly dispersed metal oxide clusters in the zeolite.
- Amorphous silicon dioxide has neither ion exchange capacity nor well-defined cages with coordination positions, so that when metal clusters are introduced (by impregnation) only broad particle size distributions with a smaller surface area are obtained.
- I plexes or receptors that can serve as selective catalysts or as sensor molecules.
- amorphous porous materials such as silicon dioxide, there are no well-defined cages available to selectively enclose these guests, and also no molecular sieve properties.
- the periodic mesoporous materials are characterized by extremely high pore volumes and surfaces (up to over 1000 m 2 / g). Due to the geometrically regular - periodic - arrangement of the pores (eg in parallel hexagonal packed bundles) extremely rapid diffusion of guests and thereby Transport of reactants in catalytic reactions, equilibrium during adsorption processes, or fast response behavior of sensor layers achieved. In comparison, amorphous porous materials such as silicon dioxide usually have very convoluted or even closed pores, making transportation difficult.
- the well-defined pore structure of the periodic mesoporous materials with pore diameters between about 1.5 and 30 nm also enables the use of molecular sieve behavior for larger molecules such as Enzymes.
- the inner surface of the mesoporous materials can be specifically functionalized by cocondensation of reactive groups with the aid of suitable silane coupling reagents; the synthesis mechanism with surfactant molecules enables advantageous control of the arrangement and orientation of the reactive groups in the open pore volume.
- Such functional groups can e.g. be used in catalysis or selective sensor technology; in the latter case e.g. Receptor molecules built in, which enable a selective interaction with and detection of analytes.
- Readout mechanisms can e.g. piezoelectric (mass), optical (solvatochromism or specific spectral changes), or calorimetric (heat development with selective catalysts); this also applies to zeolites.
- the spin coating process offers the possibility of layering completely different (or identical) films on top of each other in independent steps in order to obtain the desired properties such as thickness or functionality. This is impossible with direct synthesis, since the subsequent synthesis attacks, dissolves, or at least changes, the previously deposited films. Also are the films obtained in spin coating are distinguished by very high uniformity of thickness and morphology across the dimensions of the substrate. This cannot be achieved with direct synthesis, since even minimal convection in the solution, temperature differences, or sedimentation of precursor species in the solution leads to large differences in the morphology and thickness of the films.
- the porous particles can be pretreated by known methods to achieve certain properties. Examples of this are the ion exchange with other metal ions, the reduction at elevated temperature, the intraporous synthesis of guest species, such as catalytically active metal complexes or the modifications of the lattice by treatment with volatile metal precursors such as silicon tetrachloride (T. Bein, Solid-State Supermolecular Chemistry : Two- and Three-dimensional Inorganic Networks, Comprehensive Supermolecular Chemistry, Vol. 7, (ed .: G. Alberti, T. Bein), Elsevier, Tarrytown, NY, 1996, 465).
- T. Bein Solid-State Supermolecular Chemistry : Two- and Three-dimensional Inorganic Networks, Comprehensive Supermolecular Chemistry, Vol. 7, (ed .: G. Alberti, T. Bein), Elsevier, Tarrytown, NY, 1996, 465).
- mixtures of porous particles with different particle sizes, different pore sizes, different crystal shapes and / or chemical compositions can be used.
- the porous particles are suspended in a suitable solvent. Both organic and inorganic solvents are suitable as solvents.
- the solvent should not attack the substrate and should not interfere with the spin coating process. Furthermore, after the spin coating step, it should be easy, e.g. B. can be separated by evaporation.
- the suspension of the porous particles should be stable, ie. the particles should not settle before the suspension is applied. This can be ensured by choosing a suitable solvent and / or dispersion aid.
- suitable solvents are acetone, C 4 alkanols and water. Ethanol or acetone are preferably used.
- the suspension can be prepared by simply dispersing the particles in the solvent. However, it is also possible to prepare the suspension by treatment in an ultrasonic bath and / or the addition of surfactants or other dispersants.
- the porous particles should have a regular or irregular approximately spherical shape. However, in some cases it may be desirable to use acicular or disc-shaped porous particles. These needles or disks are aligned parallel to the substrate during spin coating and can be additionally aligned, for example in the case of magnetic particles, by applying a magnetic field.
- additional particulate materials can be introduced in the porous layer in addition to the porous particles.
- These additional particulate materials can regulate the catalytic activity, the redox properties, the magnetic properties or the optical properties of the porous layer.
- these additional particulate materials can regulate the catalytic activity, the redox properties, the magnetic properties or the optical properties of the porous layer.
- these additional particulate materials can regulate the catalytic activity, the redox properties, the magnetic properties or the optical properties of the porous layer.
- suitable metal oxides are colloidal silicon dioxide, colloidal aluminum oxide, colloidal titanium oxide and other particulate metal oxides.
- the metal oxides can be obtained by precipitation methods or the sol-gel method.
- the porous particles can be mixed in any ratio with the additional particulate materials. The weight ratio of the porous particles to the additional particulate materials strongly depends on the desired system.
- the weight ratio of the porous particles to the additional particulate materials is preferably 0.01: 0.99 to 0.99: 0.01, particularly preferably 0.50: 0.50 to 0.99: 0.01.
- the size of the additional particulate materials should be in the range specified for the porous particles.
- the suspension of periodic porous particles is applied to the substrate by spin coating.
- a small amount of the suspension is applied in the center of the substrate to be coated. Then the substrate is rotated rapidly, whereby a thin film of the suspension spreads on the substrate and the solvent evaporates.
- the substrate is in a spin coating apparatus at a speed of rotation of 100 rpm to 10,000 rpm, preferably 1000 rpm to 3500 rpm and an acceleration speed of 100 rpm to 5000 rpm / s, preferably 1000 rpm to 3000 rpm / s rotated.
- 0.2 ml to 10 ml, preferably 0.5 ml to 2 ml, of the suspension of porous particles is applied to the center of the substrate. The amount depends on the substrate size and the desired layer thickness.
- the suspension should have a solids content of 0.5% by weight to 30% by weight, preferably 2% by weight to 10% by weight.
- This process usually takes between 5 and 120 seconds, preferably between 10 and 60 seconds.
- the thickness of the layer can be influenced both by the solids concentration of the suspension and by the speed of rotation and / or the amount applied.
- layer thicknesses between 30 nm and 1000 nm are typically achieved in a spin coating step. By repeating the spin coating several times, thicker layers can be achieved. It is also possible to apply different suspensions one after the other by spin coating and thus produce multilayer layers.
- the porous layers can also be applied to the substrate in the form of patterns by known methods (Fan et al., Nature, 2000, V. 405, 56; Kind et al., Adv. Mater, 1999, 11, 15 ). Areas that are not to be coated can be masked with wax or, as with photoresist films. After the porous layer has been applied and, if necessary, stabilized, the masking is removed again.
- the substrate can be pretreated so that it adsorbs the porous particles.
- This pretreatment can include rinsing with suitable solvents, acidic or basic rinses, oxidizing treatments at high temperatures or in plasma or suitable combinations.
- a binder can be added to the suspension of porous particles. It is also possible to add an additional layer of binder to the already applied porous layer, for example by spin-coa- ting to muster.
- the binder can also be used in the form of a precursor thereof. According to the invention, it is preferred to use a binder, it being particularly preferred to add the binder to the suspension before it is applied to the substrate.
- binder depends on the system of porous particles and substrate. It can be any desired substance that increases the mechanical stability of the layers compared to identical layers without a binder.
- suitable binders or binder precursors are / metal oxide precursors, polymers and polymerizable compounds.
- the choice of binder is preferably made in close coordination with the desired end use of the coated substrate.
- Suitable polymers are, for example, silicones.
- a suitable polymerizable compound is, for example, hydrogen silsesquioxane. If the polymerizable compounds are liquids, it is possible to suspend the porous particles directly therein and to dispense with another solvent.
- the binder can be selected, for example, from metal oxide precursors that are obtained in the course of the sol-gel process.
- TEOS tetraethyl orthosilicate
- porous particles or the particulate materials or substrate may be present. This can be done by the reaction of functional groups on the surfaces of the respective particles or the surface of the substrate and in which binders are present can be achieved.
- Suitable reactive binder systems are known to the person skilled in the art. For example, silane coupling reagents such as 3-amino (propyltri ethoxysilane) can be used for porous particles containing metal oxide.
- silane coupling reagents such as 3-amino (propyltri ethoxysilane) can be used for porous particles containing metal oxide.
- the binder chosen should not adversely affect the other properties that are important for the desired end use, such as the catalytic activity in catalytic applications or the refractive index in optical applications.
- the binder: particle weight ratio should preferably be at most 1: 1, more preferably at most 1: 5, even more preferably at most 1:10, and most preferably about 1:20.
- This aftertreatment can be a simple baking process in which not only the solvent is volatilized, but also the binder is stabilized, or the aftertreatment can include a polymerization reaction.
- the temperature depends on the binder system chosen, the porous particles and the substrate. The temperatures can be between 40 and 1200 ° C, preferably between 100 and 800 ° C and more preferably between 250 and 800 ° C for inorganic systems or for systems in which the binder is to decompose.
- Organic binders typically require lower temperatures.
- the polymerization can be photochemical, thermal or chemical (e.g. by treatment with water-containing, acidic or basic vapors).
- the present invention provides a fast, efficient method to make porous layers from periodic materials.
- the spin coating method according to the invention avoids thermal and chemical stress on the substrate.
- a large number of substrates which could not be used in the processes known hitherto can thus be coated with thin porous layers.
- the porous layers obtained have a high quality (uniform coating) and in particular mechanical stability such. B. against ultrasound and solvents.
- the substrates according to the invention with porous layers can be used as dielectric layers in microelectronics, as selective layers in sensors or in catalysts. They are also used in separation processes and as> local layers.
- the substrates according to the invention with a porous layer of periodic materials are suitable, for example as an antireflection layer, as chemically reactive layers on optical surfaces or as dehumidification layers in optical windows.
- the sensitive nature of the optical surfaces to be coated prevented the direct growth of zeolite layers on the optical material.
- the large crystallite dimensions obtained by the known method led to the scattering of the light. They were therefore not suitable for the production of crystalline, porous, optical layers.
- the spin coating method according to the invention avoids the hydrothermal load on the substrates and can reduce the scatter in the layers, since the crystallite sizes can be freely selected in a wide range during spin coating.
- an optional multiple coating makes it possible to produce relatively thick films that consist of very small crystals.
- the method according to the invention is also particularly suitable for producing "low-k" dielectric layers.
- the coated substrates obtained have improved chemical and mechanical stability and can also be produced easily and quickly.
- the porous layers can be used in a variety of sensors, particularly in the selective layer. Possible areas of application include piezoelectric mass detection, calorimetric detection and optical detection.
- silicon wafers are particularly preferably provided which have at least one layer of at least one periodic porous, in particular one crystalline porous (such as zeolites) or periodic mesoporous material.
- the periodic porous materials preferably have an average particle diameter of at most 200 nm and can also be applied in several identical or different layers;
- the number of layers can be 1, 2, 3 or 4.
- the porous layers have k values of preferably less than 3, preferably less than 2.5 and particularly preferably of less than 2. Minimum k values of 1.5 can be achieved.
- the porous layer can be produced by applying a plurality of substrates according to the invention, preferably in the form of a ring and particularly preferably lengthwise in the direction of the center line of the carrier, to a suspension according to the invention and to the carrier in the region of the point of passage of the axis of rotation is rotated to such an extent that the suspension applied is distributed over the individual substrates as a result of centrifugal force.
- a device which has a rotatable carrier which is suitable for receiving a plurality of substrates in a preferably ring-shaped arrangement around the axis of rotation, a feeding device for feeding a suspension according to the invention in the region of the point of passage of the axis of rotation through the carrier and a drive which is suitable to set the carrier in rotation at a speed such that the suspension is distributed over the preferably ring-shaped substrates.
- coated substrates produced were characterized by X-ray diffraction and scanning electron microscopy.
- X-ray diffraction XDS 2000, from Scintag, in ⁇ - ⁇ mode, 5 - 50 degrees 2 ⁇ , column 0.1; 0.2; 0.3; 0.5 mm; 30 min. Measuring time.
- This example shows the production of 250 nm thick siliconite-1 layers on silicon wafers by direct coating by means of spin coating.
- Tetraethylorthosilicate (TEOS) 98%, tetrapropylammonium hydroxide and double distilled water were in a molar ratio . 25, 0: 9.0: 408 mixed.
- This suspension was prehydrolyzed in an automatic shaker for 24 hours. This was followed by a hydrothermal treatment at 90 ° C for 48 h.
- the crystals were separated from the mother solution by centrifugation three times (20,000 rpm; 30 minutes).
- the crystal cake was redispersed each time in .2 ml of double-distilled water in an ultrasonic bath (Branson 5200, room temperature, one hour).
- the pH of the suspension after cleaning was 9.8.
- An electron micrograph of these nanocrystals is shown in Fig. 1. The average particle diameter is about 50 nm.
- the porous coatings were applied in a coating step by means of spin coating to a silicon wafer (RC8 Gyrset, Spin-Coater, Karl Süss).
- the silicon wafers to be coated were vacuum-coated on the during the spin-coating step Carrier held.
- the silicon wafers were cleaned for 10 seconds each with about 20 ml of ethanol and acetone. Before and after the cleaning step, the wafers were blown with nitrogen to remove dust and dry the wafers. 0.1, 0.2 and 0.4 ml of the silicalite-1 suspension were applied to the center of the 3, 4 and 8 inch silicon wafers, respectively. At an acceleration speed of 1000 rpm and a rotation speed of 3000 rpm, coatings with a layer thickness of about 250 nm (after drying) were obtained within 35 seconds. The substrates were exposed to air at 420 ° C heated for one hour to remove the tetrapropylammonium hydroxide from the zeolite cavities and to stabilize the layer.
- silicalite-1 coatings with a thickness of 200 or 400 nm on silicon wafers by means of spin coating is described.
- a suspension of discrete silicalite-1 crystals was obtained by the method described in Example 1.
- a reaction mixture with the following molar composition was initially used: 9 tetrapropylammonium hydroxide: 25 silicon dioxide: 1450 double-distilled water: 100 ethanol (from TEOS).
- 9 tetrapropylammonium hydroxide 25 silicon dioxide: 1450 double-distilled water: 100 ethanol (from TEOS).
- the crystal cake obtained was separated from the mother liquor by centrifugation, the particles being taken up in ethanol.
- the resulting suspension contained 6.5% by weight of silicalite-1.
- the crystal size was determined by means of dynamic light scattering and high-resolution electron microscopy and was approximately 90 nm.
- This example describes the production of strongly adhering sialicalite-1 layers by the separate application of a zeolite-ethanol suspension and a pre-hydrolyzed tetraethyl orthosilicate solution.
- Example 1 a reaction mixture with the molar composition: 3 tetrapropylammonium hydroxide: 25 silicon dioxide: 1500 bidistilled water: 100 ethanol (from TEOS) was prepared. After a 24-hour pre-hydrolysis at 100 ° C. for 48 h, this composition was treated hydrothermally in polyethylene bottles. The particles were cleaned by centrifuging twice (20,000 rpm, 20 minutes) and redispersing in 25 ml of distilled water to remove unreacted organic material. After the last centrifugation, the particles were taken up in 98% ethanol in order to obtain a 5.5% by weight solution. It was shown by means of X-ray diffraction that a pure silicalite-1 phase is present without amorphous contamination (FIG. 3).
- a binder composition of 30 ml ethanol, 30 ml 98% tetraethyl orthosilicate and 0.4 ml water with 0.1 ml 37% hydrochloric acid was prepared and treated in an orbital shaker for 24 hours before use.
- 3 Inch silicon wafer first cleaned and then coated with 2 ml of the ethanol-zeolite solution. The acceleration was 1500 rpm and the rotational speed was 3500 rpm. The coating took 40 seconds. Uniformly coated wafers with high reproducibility were obtained.
- 1 ml of the binder composition was applied at an acceleration of 1000 rpm / s and a rotation speed of 1000 rpm within 40 seconds. This resulted in the zeolite layer being completely covered with prehydrolyzed
- This example describes the production of a two-layer silicalite-1 layer with a total layer thickness of 400 nm by successive application of zeolite suspensions. .
- Example 2 With the silicalite-1 suspension obtained in Example 1, a first siliconite-1 layer was first applied to a cleaned silicon wafer. For this purpose, 2 ml of the suspension were applied at an acceleration of 1500 rpm / s and a rotational speed of 3000 rpm for 30 seconds. A second coating was applied under the same conditions introduced. This was followed by calcination at 420 ° C in air for one hour.
- the porous layer obtained was examined with the electron microscope. Two distinguishable layers can be recognized on these recordings.
- the total layer thickness is approximately 400 nm (Fig. 4).
- a polymer layer is produced on a silicon wafer by immersing it in an aqueous solution containing 0.5% by weight of cationic polymer (Berocell 6100, molecular weight about 50,000, Akzo Nobel) at room temperature for 20 minutes. Colloidal silicalite-1 crystals are then adsorbed on the modified slicium wafer by immersing the substrate in a cleaned colloidal solution containing 3% by weight of silicalite-1 in water for one hour.
- cationic polymer Boeocell 6100, molecular weight about 50,000, Akzo Nobel
- a thicker, mechanically stable silicalite-1 layer is then produced on the modified substrate by being in a hydrothermal synthesis solution of the composition 3 TPAOH: 25 SiO 2 : 1500 H 2 0: 100 EtOH for (a) six hours and for (b) held at 100 ° C for 30 hours. (See Figures 5 (a) and (b).
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WO2003039791A1 (en) * | 2001-11-02 | 2003-05-15 | The Trustees Of Princeton University | Methods for the preparation of metallic alloy nanoparticles and compositions thereof |
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---|---|---|---|---|
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US8491962B2 (en) * | 2010-04-02 | 2013-07-23 | National Taiwan University | Method for manufacturing a low-k layer |
EP2424270B1 (de) * | 2010-08-23 | 2014-05-21 | Knowles Electronics Asia PTE. Ltd. | Lautsprechersystem mit verbessertem Ton |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4795543A (en) * | 1987-05-26 | 1989-01-03 | Transducer Research, Inc. | Spin coating of electrolytes |
US5151110A (en) * | 1990-09-11 | 1992-09-29 | University Of New Mexico | Molecular sieve sensors for selective detection at the nanogram level |
WO1997033684A1 (en) * | 1996-03-14 | 1997-09-18 | Exxon Chemical Patents Inc. | Procedure for preparing molecular sieve films |
US6066401A (en) * | 1998-02-25 | 2000-05-23 | National Research Council Of Canada | Wide-band two-layer antireflection coating for optical surfaces |
WO2002007191A2 (en) * | 2000-07-13 | 2002-01-24 | The Regents Of The Universty Of California | Silica zeolite low-k dielectric thin films |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05115828A (ja) * | 1991-10-30 | 1993-05-14 | Canon Inc | 塗布装置 |
FR2708482B1 (fr) * | 1993-07-29 | 1995-09-29 | Inst Francais Du Petrole | Procéédé de fabrication de catalyseurs sur supports incluant une étape de centrifugation du support après enduction. |
CN1057611C (zh) * | 1993-08-31 | 2000-10-18 | 住友水泥株式会社 | 抗反射膜 |
US5591517A (en) * | 1993-08-31 | 1997-01-07 | Sumitomo Osaka Cement Co., Ltd. | Antireflection film |
GB9413863D0 (en) * | 1994-07-08 | 1994-08-24 | Exxon Chemical Patents Inc | Molecular sieves and processes for their manufacture |
US6528034B1 (en) * | 1999-11-09 | 2003-03-04 | Board Of Trustees Of Michigan State University | Ultra-stable lamellar mesoporous silica compositions and process for the prepration thereof |
-
2000
- 2000-10-19 DE DE10052075A patent/DE10052075A1/de not_active Withdrawn
-
2001
- 2001-10-19 US US10/399,100 patent/US20040028809A1/en not_active Abandoned
- 2001-10-19 AU AU2002221711A patent/AU2002221711A1/en not_active Abandoned
- 2001-10-19 WO PCT/EP2001/012153 patent/WO2002032589A2/de not_active Application Discontinuation
- 2001-10-19 EP EP01987698A patent/EP1333936A2/de not_active Withdrawn
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4795543A (en) * | 1987-05-26 | 1989-01-03 | Transducer Research, Inc. | Spin coating of electrolytes |
US5151110A (en) * | 1990-09-11 | 1992-09-29 | University Of New Mexico | Molecular sieve sensors for selective detection at the nanogram level |
WO1997033684A1 (en) * | 1996-03-14 | 1997-09-18 | Exxon Chemical Patents Inc. | Procedure for preparing molecular sieve films |
US6066401A (en) * | 1998-02-25 | 2000-05-23 | National Research Council Of Canada | Wide-band two-layer antireflection coating for optical surfaces |
WO2002007191A2 (en) * | 2000-07-13 | 2002-01-24 | The Regents Of The Universty Of California | Silica zeolite low-k dielectric thin films |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003039791A1 (en) * | 2001-11-02 | 2003-05-15 | The Trustees Of Princeton University | Methods for the preparation of metallic alloy nanoparticles and compositions thereof |
US6932851B2 (en) | 2001-11-02 | 2005-08-23 | The Trustees Of Princeton University | Methods for the preparation of metallic alloy nanoparticles and compositions thereof |
DE102004032962A1 (de) * | 2004-07-07 | 2006-02-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung mit einer auf einen Träger aufgebrachten Zeolithbeschichtung sowie Verfahren zum Herstellen dieser Zeolithbeschichtung |
DE102004032962B4 (de) * | 2004-07-07 | 2007-11-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung mit einer auf einen Träger aufgebrachten Zeolithbeschichtung sowie Verfahren zum Herstellen dieser Zeolithbeschichtung |
DE102005038044A1 (de) * | 2005-08-10 | 2007-02-15 | Sortech Ag | Schichtverbund und seine Herstellung |
Also Published As
Publication number | Publication date |
---|---|
DE10052075A1 (de) | 2002-05-02 |
AU2002221711A1 (en) | 2002-04-29 |
WO2002032589A3 (de) | 2003-06-05 |
US20040028809A1 (en) | 2004-02-12 |
EP1333936A2 (de) | 2003-08-13 |
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