WO1999011583A1 - Produit de frittage en nitrure de silicium a conductibilite thermique elevee et son procede de preparation - Google Patents
Produit de frittage en nitrure de silicium a conductibilite thermique elevee et son procede de preparation Download PDFInfo
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- WO1999011583A1 WO1999011583A1 PCT/JP1998/003878 JP9803878W WO9911583A1 WO 1999011583 A1 WO1999011583 A1 WO 1999011583A1 JP 9803878 W JP9803878 W JP 9803878W WO 9911583 A1 WO9911583 A1 WO 9911583A1
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Definitions
- the present invention is useful not only for various components used in semiconductor devices such as insulating substrates and various heat sinks, but also for various structural components such as automobiles, machinery and OA equipment, and is excellent in productivity.
- TECHNICAL FIELD The present invention relates to a Si 3 N 4 sintered body having excellent heat dissipation characteristics as well as mechanical strength and a method for producing the same.
- Ceramics mainly composed of silicon nitride are superior in heat resistance, mechanical strength, and toughness compared to other ceramic materials, and are suitable for various structural parts such as automotive parts and OA equipment parts. Material. Attempts have also been made to use semiconductor insulating devices as insulating heat-radiating substrates, etc., by utilizing high insulation properties. Conventionally, alumina and the like have been widely used as ceramic substrates for semiconductors. However, as semiconductor devices have become faster, more integrated, and more powerful, the use of materials that have high thermal conductivity and high heat dissipation, such as A1N and SiC, have been required. Has been advanced.
- the current high heat conductive substrates such as AIN are not sufficient in strength and toughness, and there are difficulties in handling and shape of products such as breakage due to external force. It is desired to develop a ceramic material that has both high strength characteristics and excellent heat dissipation characteristics.
- Silicon nitride (Si 3 N 4) has inherently high strength, and if its thermal conductivity can be improved, it can be expected to be applied to an insulation substrate.
- the thermal conductivity of the silicon nitride sintered body known from the future is A 1 N or Because of its low value compared to SiC, its practical use as an insulating heat dissipation board has not been advanced.
- Thermal conduction of insulating ceramic mix such as silicon nitride is mainly due to phonon propagation. Since phonon is scattered by phases having different impedances such as lattice defects and impurities present in the sintered body, the thermal conductivity / c is represented by the following equation 1;
- S i 3 New 4 promotes types of crystal grains, a rare earth Upsilon 2 0 3 or the like that will be a hard solid solution in the crystal grains It is important to use elemental compounds as sintering aids and to reduce the amount of A1 compounds containing A1 ions that are easily dissolved in the crystal grains.
- type 3 Si 3 N 4 powder having a low oxygen content and a small amount of cationic impurities is used.
- a dense silicon nitride sintered body composed of / 3 type Si 3 N 4 crystal grains having a thermal conductivity of 40 W / m * k or more is introduced.
- a compound of an alkaline earth element and a rare earth element is added, and sintering is performed at a relatively high temperature of about 2000 ° C. in a high-pressure nitrogen gas.
- a dense silicon nitride sintered body with a thermal conductivity of 80 W / m ⁇ k or more and a bending strength of 60 OMP a. Or more can be obtained. It is described.
- JP-A-6-135771 and JP-A-7-48174 disclose rare-earth element compounds and 4A without limiting the amount of AI ions to a small amount as described above. Add an appropriate amount together with the group III element compound, and after sintering There is disclosed a method of obtaining a dense silicon nitride sintered body composed of type crystal grains by promoting crystallization of a grain boundary phase by slow cooling. According to the same publication, it is stated that a Si 3 N 4 sintered body having a bending strength of 800 MPa or more and a thermal conductivity of 60 W / m ⁇ k or more can be obtained.
- a metallized substrate on which a refractory metal metallized layer of W or Mo force is formed and a semiconductor module in which a conductive circuit is bonded to the metallized substrate are disclosed.
- Japanese Patent Application Laid-Open No. 7-187793 discloses various semiconductor devices using the same metallized substrate and various structural members using the same ceramic sintered body. I have.
- the high-melting metallized layer was formed on the substrate by interposing an SiO 2 oxide film, a Group 4A metal, a brazing material layer containing them, or a Cu—Cu 2 ⁇ eutectic layer. It has a peel strength of 3 kgf Zmm 2 or more.
- high-purity Si 3 N 4 powder containing few impurities is used, and sintering is performed. It is important to optimize the type and amount of auxiliaries.
- high-purity raw material powder is used for both the main component and the auxiliary component, and grain growth is caused under high temperature and pressure to remove impurities or defects. It is necessary to purify the inside of the grains to be purified.
- a high-purity / 3-type room-temperature silicon is used as a raw material powder under high temperature and high pressure (200 ° C., 300 ° C.). 0 atm) There is.
- An object of the present invention is to provide a silicon nitride sintered body having excellent productivity, high strength, and unprecedented high thermal conductivity in view of the conventional circumstances, and a method of manufacturing the same.
- the silicon nitride sintered body provided by the present invention is selected from a crystal grain phase composed of a / 3 type silicon nitride and a Y and lanthanide series.
- a grain boundary phase containing 1 to 20% by weight of a compound of at least one element in terms of oxide, which is contained in the silicon nitride crystal grains in an amount of 0.01 to 1%. It is characterized in that 0% by weight of free 3i is dispersed, and has high strength and high thermal conductivity.
- the high thermal conductivity chambered clayey sintered body of the present invention contains at least one element compound selected from the group 4A elements in an amount of 0.01 to 3% by weight in terms of element, and / or It can contain 0.1 to 5% by weight of a compound of at least one of C a and i in terms of oxide. Further, in this high thermal conductive silicon nitride sintered body, the amount of oxygen contained in the crystal particles of silicon nitride is preferably 0.6% by weight or less.
- the method for producing a high thermal conductive silicon nitride sintered body according to the present invention described above comprises the steps of: 99 to 80% by weight of Si powder in terms of Si 3 N 4 , and 1 to 20% by weight of Y and lanthanide.
- the rate of temperature rise in the temperature range of 120.0 to 130 ° C. is set to 0.3 to 0.5 ° C./min, and thereafter, 130 to 140 ° C.
- the heat treatment is preferably performed within a temperature range of 00 ° C.
- a compound powder of a Group 4A element is added so that at least one element selected from Group 4A elements accounts for 0.01 to 3% by weight of the whole. It is preferable to use a raw material powder containing a Group 4A element. Further, a compound powder of at least one element of Li and Ca can be added so as to account for 1 to 5% by weight of the total as oxides.
- defects are eliminated by using a new method of using Si powder, which is easy to obtain a high-purity product, as the main raw material powder and nitriding it into Si 3 N 4 while leaving moderate free Si. It is possible to obtain high-purity Si 3 N 4 crystal particles, and it is possible to obtain an inexpensive silicon nitride sintered body having both high thermal conductivity and mechanical strength.
- a Si raw material powder is used, and after adding and mixing 1 to 20% by weight of a rare earth element compound selected from the series of Y and lanthanide, the compact is formed into a powder of 1200 to 100%.
- a nitride comprising high-purity Si 3 N 4 crystal particles containing 0.05 to 10% by weight of free Si is obtained.
- a high-strength and high-thermal-conductivity silicon nitride sintered body can be obtained.
- the method of the present invention reduces Si 3 with less defects such as dislocations.
- a nitride composed of 3 N 4 crystal grains can be obtained.
- the nitridation method of leaving free Si in the nitride it is possible to easily achieve high purity (reduction of oxygen and defects) of Si 3 N 4 crystal particles in the subsequent sintering process.
- a silicon nitride sintered body having significantly improved thermal conductivity and high strength can be obtained.
- the high thermal conductive silicon nitride sintered body of the present invention is substantially composed of i8 type silicon nitride and 0.01 to 10% by weight of fine free Si dispersed in crystal grains thereof. It contains 1 to 20% by weight of a rare earth element as an oxide as a grain boundary phase.
- the amount of free Si dispersed in the silicon nitride crystal grains is 0.01 to 10% by weight, preferably 0.01 to 5% by weight based on the whole sintered body. / 0 . It is desirable that the dispersed Si particles are fine, specifically, the maximum diameter is 3 ⁇ m or less. If the amount of the Si particles dispersed is less than 0.01% by weight, the thermal conductivity of the sintered body decreases, and if it exceeds 10% by weight, the bending strength and heat resistance decrease. The reason why the silicon nitride particles are of the i3 type is that they have excellent thermal conductivity because the crystal strain is small and phonon scattering is small as compared with the ⁇ type.
- the grain boundary phase contains one or more rare earth element compounds selected from the series of Y and lanthanide, and the content thereof is 1 to 20% by weight based on the whole sintered body in terms of oxide. is there. If this content is less than 1% by weight, the nitridation reaction will not proceed sufficiently and it will be difficult to control the amount of free Si on a daily basis. On the other hand, if the content exceeds 20% by weight, the liquid phase becomes excessive during sintering, and both the thermal conductivity and the bending strength of the sintered body decrease.
- the rare earth element particularly, an element having an ionic electric field strength [valence / (ionic radius) 2 ] of 0.54 or more, for example, Sm, Y, Yb, Gd, Dy, Er, etc. preferable.
- the grain boundary phase may contain a compound of one or more elements selected from the group 4A in addition to the rare earth element compound. Addition of this Group 4A element compound Thus, the thermal conductivity of the sintered body can be further improved. That is, it is considered that the above-mentioned group 4A compound plays a role in suppressing the amount of impurities in the generated Si 3 N 4 crystal grains and the crystal strain caused by the impurities to an extremely low level.
- the content of these Group 4A element compounds is 0.01 to 3 weights in total in terms of elements. / 0 is preferred, and if it is less than 0.01% by weight, a further effect of improving thermal conductivity cannot be obtained. If it exceeds 3% by weight, practically sufficient mechanical strength may not be obtained.
- the grain boundary phase may contain either element of Ca or Li in the range of 0.1 to 5% by weight in terms of its oxide. These elements improve sinterability and contribute to high density by sintering at low temperatures. If the content of Ca or Li is less than 0.1% by weight, no improvement in sinterability is observed, and if it exceeds 5% by weight, the mechanical strength of the sintered body decreases. You.
- the amount of oxygen contained in the Si 3 N 4 crystal grains of the silicon nitride sintered body is preferably 0.6% by weight or less, more preferably 0.3% by weight or less. By keeping the amount of oxygen low in this way, even higher thermal conductivity can be stably obtained.
- Si powder as a main component and Y and a powder of a compound of at least one rare earth element selected from a lanthanide series as a subcomponent are weighed, respectively. And mix.
- the Si powder is in the range of 99 to 80% by weight in terms of Si 3 N 4
- the powder of the auxiliary component is in the range of 1 to 20% by weight in terms of oxide.
- the mixing method is a known method. May be.
- the Si powder used as a main component preferably has an oxygen content of 0.6% by weight or less, more preferably 0.3% by weight or less.
- the average particle size of the Si powder is preferably 20 m or less, more preferably 5 ⁇ m or less. If the average particle size exceeds 20 ⁇ m, nitriding may not proceed sufficiently in the nitriding step.
- the kind and composition of the auxiliary component are set in the above-mentioned ranges, because the intended Si 3 N 4 sintered body has a weight of 0.01 to 10 wt. /. This is to form a structure in which free Si is finely dispersed to improve strength and thermal conductivity.
- ionic strong electric field intensity Y of (0.5 4 above), S m When you add a compound such as Y b, combines with free oxygen ions in the S i 0 2 film S i powder surface, S It is more preferable for high thermal conductivity because it suppresses oxygen solid solution in i 3 N 4 crystal particles.
- the nitriding reaction does not proceed sufficiently, and the amount of unnitrided Si becomes excessive, and the bulk Si becomes a fracture starting point, so that the strength characteristics are remarkably deteriorated.
- the content exceeds 10% by weight, the amount of the grain boundary phase becomes excessive, so that the thermal conductivity is lowered along with the strength.
- compounds of Group 4A elements such as T i, Z r, and H f may be added in the range of 0.01 to 3% by weight in terms of elements. May be added as a compound powder or as a raw material impurity. If the amount of these group 4A elements is within the above range, it is effective for improving the thermal conductivity.
- a compound powder of Li and / or Ca, especially an oxide powder may be added in an amount of 0.1 to 5% by weight based on the whole. This has the effect of improving the sinterability without affecting the thermal conductivity, and is particularly effective in increasing the strength during low-temperature sintering. Li does not form a solid solution in the Si 3 N 4 crystal particles because it volatilizes during sintering, and Ca does not form a solid solution in the crystal particles because of its large ionic radius. Excellent thermal conductivity can be maintained.
- the obtained mixed powder of the raw materials is molded to obtain a molded body having a predetermined shape.
- a commonly used method such as a die pressing method and a sheet molding method can be applied.
- the nitriding step which is the third step of the present invention, is performed in a nitrogen atmosphere in a temperature range of 1200 to 140 ° C.
- the reaction rate drops sharply.On the contrary, when it exceeds 140 ° C, the temperature rises partially above the melting point of Si, causing the melting of Si. Is generated and remains as a coarse unnitrided molten mass, and the mechanical properties of the sintered body are undesirably reduced.
- the temperature is raised in the temperature range of 1200 to 130 ° C. at a rate of 0.3 to 0.5 ° C./min.
- the heat treatment is preferably performed in a temperature range of 140 ° C. This control of the heating rate is because it is suitable for controlling the free Si remaining without nitriding to a desired dispersion state and amount. Since the released Si becomes a coarse lump, it is difficult to obtain a desired uniform and finely dispersed state. At a slower rate of temperature rise, the solid solution of impurities into the generated Si 3 N 4 crystal particles tends to proceed.
- the nitride after the nitriding step is placed in a nitrogen atmosphere. And sintering at a temperature of 160-200 ° C. If the sintering temperature is lower than 160 ° C., the porosity of the sintered body increases, resulting in a decrease in thermal conductivity. Conversely, if the sintering temperature exceeds 2000 ° C., decomposition of Si 3 N 4 tends to occur, which is not preferable. In particular, when sintering at normal pressure, it is desirable to keep the temperature at 180 ° C. or less.
- the nitrogen atmosphere used in the nitriding step and the sintering step may contain ammonia gas or other inert gas in addition to nitrogen.
- a dense high thermal conductive silicon nitride sintered body can be obtained at a temperature of 170 to 190 ° C. in a nitrogen atmosphere of about 1 to 5 atm.
- sintering at a high temperature of about 200 ° C. and a high pressure of 100 atm or more is not required.
- the silicon nitride sintered body obtained by the above-described method of the present invention has high thermal conductivity and also excellent mechanical strength. Specifically, a silicon nitride sintered body having a relative density of at least 95%, a thermal conductivity of at least 50 WZm ⁇ k, and a bending strength of at least 600 MPa should be provided by an inexpensive manufacturing method. Can be.
- Samples marked with * in the table are comparative examples.
- Each mixed granulated powder is available in two types: length 45 mm, width 8 mm, thickness 5 mm (for bending strength measurement) and diameter 12.5 mm, thickness 5 mm (for thermal conductivity measurement) Specimens of similar shapes were dry pressed. Then, these compacts were placed in a carbon refractory case whose inner wall was covered with BN, and all were nitrided at 1300 ° C under 1 atmosphere of nitrogen gas for 3 hours, and then 1850 ° C. The temperature was raised to C and sintering was performed for 3 hours under a nitrogen gas pressure of 4 atm.
- the amount of oxygen used as a 1 wt% as S i powder raw material, rare earth oxide is a minor component (S m 2 0 3) the amount of powder 1-2 0 by weight. / 0 range and nitriding in a temperature range of 1200 to 140 ° C in a nitrogen atmosphere. After sintering, ⁇ -type Si 3 N 4 crystal Can be controlled within the range of 0.01 to 10% by weight, and the three-point bending strength is not less than 600 MPa and the thermal conductivity is not less than 50 W / m ⁇ k. High thermal conductivity S It can be seen that an i 3 N 4 sintered body is obtained.
- Example 2 The same raw material powder as in Sample 3 of Example 1 was used in the same composition, and similarly, molded bodies of each shape were prepared. Each of the compacts was nitrided at a nitrogen gas pressure of 1 atm at each nitriding temperature shown in Table 3 below for 3 hours. At this time, for some samples, the heating rate in the temperature range of 1200 to 130 ° C. was controlled as shown in Table 3. Thereafter, each nitride was sintered for 3 hours at each sintering temperature shown in Table 3 under a nitrogen gas pressure of 4 atm. The same evaluation as in Example 1 was performed for the obtained Si 3 N 4 sintered body of each sample, and the results are shown in Table 4 below.
- the amount of Si in the Si 3 N 4 crystal grains in the nitride after nitriding is set to 0.0. It turns out that it is in the range of 1 to 10% by weight.
- nitride By concentrating at 00 ° C, the Si content in the Si 3 N 4 crystal particles is 0.01 to 10% by weight, the three-point bending strength is 600 MPa or more, and the thermal conductivity
- a high thermal conductivity Si 3 N 4 sintered body having a WC of 5 OWZmk or more can be obtained.
- the thermal conductivity can be further improved while maintaining the high bending strength of the obtained sintered body. It can be seen that it can be achieved.
- the combination of C a and L i It can be seen that by adding 0.1 to 5% by weight of the material in terms of oxygen, the sinterability is improved and the material can be densified at a low temperature.
- the Group 4A element exceeds 3% by weight or the compound of Ca or Li is 5% by weight. It can be seen that if the ratio exceeds / 0 , the strength of the sintered body is reduced.
- Si powder having an average particle diameter of 1 m and an oxygen content of 0.5% by weight in the particles and each of the rare earth element compound powders shown in Table 7 below having an average particle diameter of 0.5 ⁇ m were prepared.
- the Si powder was weighed so as to be 90% by weight in terms of Si 3 N 4 and the rare earth element compound powder was weighed so as to be 10% by weight, and the same as in Example 1 described above.
- a mixed granulated powder was produced.
- the molded body was formed into two types of shapes, and the molded body was placed in a carbon fireproof case whose inner wall was covered with Si 3 N 4 , and the same conditions as in Example 1 were applied. And nitriding and sintering were performed.
- each Si powder having an oxygen content in the particles as shown in Table 8 below and each of the rare earth compound powders shown in Table 8 having an average particle size of 0.5 ⁇ m were prepared. Each of these Si powders is 90 weight in terms of Si 3 N 4 . /. , And each of the rare earth compound powders was collected so as to be the remaining 10% by weight, and a mixed granulated powder was produced in the same manner as in Example 1. Thereafter, each mixed granulated powder was nitrided and sintered under the same conditions as in Sample 18 of Example 2. Each of the obtained sintered bodies was evaluated in the same manner as in Example 1, and the results are shown in Table 8. From this result, it can be seen that the smaller the particle-oxygen content of the initial raw material Si powder, the more the Si 3 N 4 sintered body having a higher thermal conductivity of the lead layer can be obtained. Table 8
- a novel method having excellent productivity, by removing or reducing impurities dissolved in silicon nitride crystal grains, has a high strength and at the same time, a nitride having a high thermal conductivity which has not existed in the past. It is possible to provide a C-based sintered body.
- the high thermal conductive silicon nitride sintered body is extremely useful as various components for semiconductor devices such as heat dissipation insulating substrates, and various structural components such as mechanical devices and office automation equipment.
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EP98940636A EP0963965A4 (en) | 1997-09-03 | 1998-08-31 | SILICON NITRIDE SINTER WITH HIGH THERMAL CONDUCTIVITY AND PROCESS FOR PREPARING THE SAME |
US09/254,960 US6143677A (en) | 1997-09-03 | 1998-08-31 | Silicon nitride sinter having high thermal conductivity and process for preparing the same |
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JP23816897 | 1997-09-03 | ||
JP9/238168 | 1997-09-03 |
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PCT/JP1998/003878 WO1999011583A1 (fr) | 1997-09-03 | 1998-08-31 | Produit de frittage en nitrure de silicium a conductibilite thermique elevee et son procede de preparation |
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EP (1) | EP0963965A4 (ja) |
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JP2001181051A (ja) * | 1999-12-28 | 2001-07-03 | Ngk Spark Plug Co Ltd | 窒化珪素質焼結体、それを用いた工具ならびに摺動部材、及び窒化珪素質焼結体の製造方法 |
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JPH11314969A (ja) * | 1998-03-05 | 1999-11-16 | Sumitomo Electric Ind Ltd | 高熱伝導性Si3N4焼結体及びその製造方法 |
JP2000128654A (ja) | 1998-10-28 | 2000-05-09 | Sumitomo Electric Ind Ltd | 窒化ケイ素複合基板 |
JP2001080967A (ja) * | 1999-09-06 | 2001-03-27 | Sumitomo Electric Ind Ltd | Si3N4セラミックスとその製造用Si基組成物及びこれらの製造方法 |
JP4473463B2 (ja) * | 2001-03-26 | 2010-06-02 | 日本碍子株式会社 | 窒化珪素多孔体及びその製造方法 |
JP4574044B2 (ja) * | 2001-03-26 | 2010-11-04 | 日本碍子株式会社 | 窒化珪素多孔体及びその製造方法 |
US20040009866A1 (en) * | 2002-06-13 | 2004-01-15 | Ngk Spark Plug Co. Ltd. | Sintered silicon nitride, cutting tip, wear-resistant member, cutting tool, and method for producing sintered silicon nitride |
CN102714191B (zh) * | 2010-01-13 | 2015-08-05 | 京瓷株式会社 | 氮化硅质基板、及使用其的电路基板以及电子装置 |
WO2015060274A1 (ja) * | 2013-10-23 | 2015-04-30 | 株式会社東芝 | 窒化珪素基板およびそれを用いた窒化珪素回路基板 |
JP2023123942A (ja) * | 2022-02-25 | 2023-09-06 | 株式会社プロテリアル | 窒化珪素基板およびその製造方法 |
CN115557792B (zh) * | 2022-10-17 | 2023-11-03 | 天津大学 | 具有优异力学性能的高导热氮化硅陶瓷材料及制备方法 |
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