WO1995029039A1 - Plaque support de surface de meulage separable et appareil associe - Google Patents
Plaque support de surface de meulage separable et appareil associe Download PDFInfo
- Publication number
- WO1995029039A1 WO1995029039A1 PCT/JP1995/000793 JP9500793W WO9529039A1 WO 1995029039 A1 WO1995029039 A1 WO 1995029039A1 JP 9500793 W JP9500793 W JP 9500793W WO 9529039 A1 WO9529039 A1 WO 9529039A1
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- WO
- WIPO (PCT)
- Prior art keywords
- polishing
- disk
- surface plate
- platen
- separation type
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
- B24B37/16—Lapping plates for working plane surfaces characterised by the shape of the lapping plate surface, e.g. grooved
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D9/00—Wheels or drums supporting in exchangeable arrangement a layer of flexible abrasive material, e.g. sandpaper
- B24D9/08—Circular back-plates for carrying flexible material
- B24D9/10—Circular back-plates for carrying flexible material with suction means for securing the material
Definitions
- the present invention relates to a separation type polishing platen used for precision polishing such as a semiconductor wafer, a laser or an optical prism, and a polishing apparatus using the same.
- polishing using free abrasive grains has been applied as a method for precisely polishing semiconductors, lasers, optical prisms, various glass plates, metal plates, and the like.
- polishing is performed by supplying a polishing liquid (a slurry of polishing particles and a polishing solution) between the polishing cloth and the object to be polished.
- a polishing liquid a slurry of polishing particles and a polishing solution
- the conventional polishing platen 1 is placed on a water-cooled jacket 4 fixed by bolts 3 to a drive shaft 2 connected to a drive unit (not shown) for about 7 years. It is fixed with more than 50 bolts 5 as it does not disassemble. After this, the polishing platen 1 is finished to the required dimensional accuracy. The polishing cloth is attached to the surface of the polishing platen 1 as described above.
- a precise polishing surface force is formed by at least one of a mechanism of forming a soft chemical product on the surface of the semiconductor wafer and a mechanical polishing using abrasive grains.
- the surface of the polishing platen raises the temperature by about 25 to 50K '.
- the conventional polishing platen as described above cannot be easily removed from the polishing device.
- the dimensional accuracy must be adjusted later. Therefore, the work of replacing the polishing cloth as described above necessarily involves the polishing machine installed in a clean room. Has been done on For this reason, it was difficult to ensure the accuracy of attaching the polishing cloth, and much labor and time were required. Further, if such work is performed in a clean room, there has been a problem that the cleanness of the clean room is reduced.
- the size of semiconductor wafers is increasing year by year, and it is said that the age of 4 to 5 inch to 8 inch wafers will be entered. Therefore, the polishing table also tends to be inevitably formed, and it becomes more difficult to replace the polishing cloth.
- a polishing plate on which a polishing cloth is adhered and a platen body connected to the drive unit can be separated.
- the polishing platen inserts a pin fixed to the platen body side into a hole provided on the outer peripheral side of the polishing platen. By mechanically fixing the outer periphery of the polishing machine, the polishing machine is attached to the main body of the surface plate.
- the conventional separation type polishing table can facilitate cleaning and re-polishing of the polishing pad, but the polishing accuracy is reduced due to deformation of the polishing table due to heat during polishing. It had a problem of shaking.
- An object of the present invention is to achieve separation type polishing in which the precision of platen cleaning work and polishing cloth replacement work has been ensured and the labor has been reduced, and the polishing precision has been prevented from lowering due to thermal deformation and the like.
- An object of the present invention is to provide a polishing apparatus. Disclosure of the invention
- the separation type polishing platen of the present invention comprises: a platen body connected to a driving unit of a polishing apparatus;
- the platen body is provided with a polishing part disk which is rotatable integrally with the platen body, is detachably held by vacuum suction or magnetic force, and comes into contact with the object to be polished directly or through a polishing cloth.
- the platen main body is provided with a suction hole for vacuum suction of the polishing section disk, or the polishing section disk is attached to the platen main body. It is characterized by having a magnet system such as electromagnets and permanent magnets that are held by magnetic force.
- a first polishing apparatus includes a surface plate main body having a suction hole, and a polishing unit disk that is rotatable integrally with the surface plate main body and that is detachably held on the surface plate main body by vacuum suction.
- a driving system for rotationally driving the separation type polishing platen through the polishing table, and a polishing liquid supply means for supplying a polishing liquid onto the polishing unit disk.
- a second polishing apparatus includes: a platen main body; a polishing unit disk that is rotatable integrally with the platen main body and that is detachably held by the platen main body; Separation type polishing platen having a magnet system that is held by magnetic force, a drive system that rotates the ⁇ polishing platen via a drive shaft connected to the platen body, and a polishing liquid on the polishing unit disk And a polishing liquid supply means for supplying the polishing liquid.
- the first or second polishing apparatus further includes a gas supply system for supplying gas between the main body of the polishing table and the disk for the polishing section when the polishing section disk is detached from the main body of the polishing table. It is characterized by:
- the polishing table disk is detachably attached to the table plate main body by vacuum suction or magnetic force, thereby realizing the division of the polishing table disk from the polishing table disk. .
- the polishing table disk is detachably attached to the table plate main body by vacuum suction or magnetic force, thereby realizing the division of the polishing table disk from the polishing table disk. .
- daily management work such as cleaning the surface plate of the polishing section and replacing the polishing cloth with the polishing work to be controlled. This can be performed after the polishing section disk constituting the surface is removed from the platen body. Also, by reducing the weight of the polishing section disk, transportation and the like can be easily performed.
- the daily management work as described above can be set up outside, and, for example, the work of replacing the polishing cloth can be made less. This leads to ensuring the accuracy of the work of changing the polishing cloth and reducing labor, and It is necessary to improve the polishing accuracy and the operation rate of the polishing equipment.
- both the vacuum suction and the magnetic force applied as a method of attaching the polishing section disk to the table main body have a small fixing force in the lateral direction. Even if there is a difference in the amount of thermal expansion between the polishing section disk and the polishing section disk, for example, the polishing section disk can relatively freely extend in the expansion direction.
- the polishing part disk can be held on the platen body with a vacuum attraction force or a magnetic force that is smaller than a stress in which the deformation in the thickness direction exceeds an allowable range.
- the polishing plate can be held on the platen body by a vacuum attraction force or a magnetic force that can shift in the surface direction of the polishing portion disk so that the deformation in the direction maintains an allowable range.
- the polishing unit disk can be easily removed from the surface plate main body.
- FIG. 1 is a diagram schematically showing a configuration of a polishing apparatus according to an embodiment of the present invention
- FIG. 2 is an enlarged cross-sectional view showing a separation type polishing table of the polishing apparatus shown in FIG. 1
- FIG. 4 is a plan view showing a modification of the method of mounting the separation type polishing table in the polishing apparatus shown in FIG. 4
- FIG. 4 is a cross-sectional view of the separation type polishing table shown in FIG. 3
- FIG. FIG. 6 is a diagram schematically showing a main part configuration of FIG. 6,
- FIG. 6 is a diagram showing a modification of the polishing apparatus shown in FIG. 5
- FIG. 7 is a plan view showing a main part of a conventional polishing platen and an accompanying polishing apparatus
- 8 is a cross-sectional view of the conventional polishing table and polishing apparatus shown in FIG. DETAILED DESCRIPTION OF THE INVENTION
- FIG. 1 is a diagram showing a configuration of a polishing apparatus according to one embodiment of the present invention.
- reference numeral 11 denotes a separation-type polishing surface plate, and this separation-type polishing surface plate 11 is composed of a surface plate main body 12 and a disk 13 for a polishing section.
- the platen body 12 has a hole 12a therein, and a number of suction holes 1 2 are provided so as to reach the upper surface from the vacuum chamber 12a.
- b is formed.
- the polishing disc 13 with the polishing cloth 14 attached to the surface is placed on the surface of the platen body 12 where the suction holes 12a are formed, and the vacuum chamber 12a and suction Vacuum suction is performed through the holes 12 b, and the platen body 12 is made. That is, the polishing section disk 13 is held on the platen body 12 by vacuum suction.
- vacuum suction I as used herein means a suction suction I at a pressure lower than the atmospheric pressure.
- a drive shaft 15 is fixed to the lower surface of the platen body 12.
- This drive shaft 15 can also be connected to the platen body 12 via a water-cooled jacket, similarly to the conventional ⁇ -polishing platen shown in FIGS. 7 and 8.
- the drive shaft 15 is connected to a motor 16 as a drive system via a drive belt 17, and the separation type polishing platen 11 is rotationally driven at a predetermined rotation speed by these drive systems.
- the vacuum suction force that holds the polishing unit disk 13 to the platen body 1 2 is such that the platen body 1 2 and the polishing unit disk 13 rotate integrally when the separate polishing platen 11 is driven to rotate. It is set as possible. Then, while maintaining the rotation of the platen body 12 and the polishing unit disk 13 together, the polishing unit disk 13 has a vacuum suction force that is smaller than the stress in which the amount of deformation in the thickness direction exceeds an allowable range. And is held by the platen body 12. In other words, the polishing disc 13 has a vacuum suction force that can shift in the plane direction of the polishing disc 13 so that its deformation in the thickness direction maintains an allowable range. Is held.
- the allowable deformation amount in the thickness direction of the polishing part disk 13 varies depending on the required accuracy depending on the object to be polished, for example, about 800 ⁇ for a silicon wafer, and about 500 // in for a patterned wafer. It is. Also, as shown in FIGS. 3 and 4, for example, Notch 13a is formed, and a convex portion 12c for preventing free rotation is provided on the upper surface of the platen body 12 in correspondence with the notch 13a. It is also possible to assist in holding the disc 13.
- the platen body 12 and the polishing unit disk 13 can be integrally rotated with a small vacuum suction force.
- the notch 13a and the free rotation preventing protrusion 12c are effective by forming at least one notch. Also, a hole is provided at the center of the polishing unit disk 13 and a fixing pin provided at the center of the platen body 12 is inserted into this hole to prevent deviation from the center of rotation. It helps to hold the working disk 13.
- a vacuum pipe 18 is passed through the above-mentioned drive shaft 15, and this vacuum pipe 18 is connected to a vacuum suction device 20, for example, a vacuum pump via a polishing unit disk detachment control system 19.
- the polishing unit disk detachment control system 19 includes, together with the vacuum suction device 20, when the polishing unit disk 13 is removed from the main unit 12, the platen body 12 and the polishing unit disk 13 are removed.
- An air pump 21 is connected as a pressurized gas supply system for supplying a pressurized gas therebetween.
- the polishing unit disk detachment control system 19 is connected to the vacuum suction device 20 and the vacuum suction device 20 is operated.
- the polishing unit disk 13 is sucked in vacuum through the vacuum pipe 18, the vacuum chamber 12 a and the suction hole 12 b, and is held by the platen body 12.
- the polishing unit disk detachment control system 19 is switched to the air pump 21 side and the air pump 21 is operated.
- the pressurized gas supplied from the air pump 21 is blown onto the T® of the polishing unit disk 13 via the vacuum pipe 18, the vacuum chamber 12 a and the suction hole 12 b, and the polishing unit disk is 13 is blown up and can be easily removed.
- the vacuum suction of the polishing unit disk 13 by appropriately setting the number and diameter of the suction holes 12 b on the platen body 12, a uniform force can be applied to the entire polishing unit disk 13. And the holding force itself can be controlled. By these means, it is possible to realize the integral rotation of the polishing unit disk 13 with the platen body 12 and to reduce the holding force in the lateral direction.
- the specific holding force is as described above. Therefore, due to the temperature gradient and the difference in the coefficient of thermal expansion between the platen body 12 and the polishing part disk 13, etc., Even if there is a difference in the amount of thermal expansion between the platen body 12 and the polishing part disk 13, the polishing part disk 13 can extend relatively freely in the expansion direction.
- the separate type polishing platen 11 as described above is particularly effective for a platen having a diameter of more than 300 thighs;
- the polishing liquid supply device 24 has, for example, a polishing liquid tank whose temperature can be controlled. While supplying the above-mentioned polishing liquid, the polishing platen 11 in which the polishing portion disk 13 is fixed to the platen body 12 by vacuum suction is rotated, and the object 23 is polished with a polishing cloth 14 at a predetermined pressure. While being pressed, the polishing plate 11 is rotated on the polishing plate 11 while rotating in the opposite direction to the polishing plate 11. In this manner, the work of polishing the object 23 is performed with high power.
- the polishing unit disk detachment control system 19 is operated by the air pump 21 as described above. Side, and operate the air pump 21 to blow up the polishing section disk 13 and remove it. Next, another polishing disk 13 to which the polishing cloth 14 has been attached in advance is set on the platen body 12 to continue the polishing operation. As described above, in the polishing apparatus of this embodiment, since the replacement operation of the polishing cloth 14 can be performed in a short time, the operation rate of the polishing apparatus can be reduced with the replacement operation of the polishing cloth 14. Absent.
- the polishing cloth 14 is replaced, and then the polishing work is performed by, for example, a polishing cloth 14 mounting apparatus that is separately installed.
- a polishing cloth 14 mounting apparatus that is separately installed.
- FIG. 5 is a diagram showing a main configuration of a polishing apparatus in which a polishing unit disk 13 is held on a platen body 12 using electromagnetic force.
- the drive system, the polishing liquid supply device, and the like are not shown, but have the same configuration as the polishing device shown in FIG. 1 except for the holding mechanism of the polishing unit disk 13. .
- a plurality of electromagnets 25 are embedded as a magnet system in the platen body 12. These electromagnets 25 serve to attract the polishing unit disk 13 to the platen body 12 by electromagnetic force. That is, the polishing section disk 13 is held on the surface plate main body 12 by the electromagnetic attraction force of the electromagnet 25, and these constitute a surface polishing surface plate 26. However, when such a; ⁇ is applied, the polishing portion disk 13 should be formed of a ferromagnetic material. Further, instead of the electromagnet 25, a permanent magnet can be used as a magnet system.
- a polishing section disk 13 made of a non-magnetic material is used, as shown in FIG. 6, for example, an outer peripheral fixing jig 29 having a permanent magnet 28 fixed to a support ring 27 is used.
- the outer peripheral fixing jig 29 and the central fixing jig 31 may be used in combination.
- the polishing section disk 13 is held on the platen body 12 by the magnetic force of the fixing jigs 29 and 31 arranged on the upper part thereof.
- polishing section disk 13 when removing the polishing section disk 13, it is possible to easily remove the polishing section disk 13 by blowing up using the air pump 21, as in the first embodiment. Can be. Note that the holding mechanism of the polishing unit disk 13 shown in FIGS. 5 and 6 can be used in combination with the free rotation preventing means of the polishing unit disk 13 shown in FIGS. 3 and 4.
- the attraction force (magnetic force) of the electromagnet 25 and the permanent magnet 28 shown in FIGS. 5 and 6 is similar to the vacuum attraction force in the first embodiment, and the platen body 12 and the polishing disc 13
- the amount of deformation in the thickness direction of the polishing portion disk 13 is set to be smaller than a stress exceeding an allowable range within a range where the integral rotation of and can be maintained.
- the polishing part disk 13 is held by the platen body 12 with a magnetic force capable of shifting in the plane direction of the polishing part disk 13 so that the deformation in the thickness direction maintains an allowable range.
- Thickness of polishing disc 1 3 The allowable deformation amount in the direction is as described above.
- the magnetic force used to hold the polishing unit disk 13 as described above realizes the unitary rotation of the polishing unit disk 13 and the platen body 12, and adjusts the strength so that it can be used in the horizontal direction.
- the holding force can be reduced. Therefore, due to the temperature gradient and the difference in the coefficient of thermal expansion between the platen body 12 and the polishing part disk 13, the distance between the platen body 12 and the polishing part disk 13 becomes large. Even if there is a difference in the amount of thermal expansion, the polishing portion disk 13 can extend relatively freely in the expansion direction. As described above, by increasing the degree of freedom of expansion of the polishing section disk 13 in the expansion direction, thermal deformation of the polishing section disk 13 can be prevented. Therefore, it is possible to maintain the polishing accuracy.
- the polishing section disk 13 in the first and second embodiments provides a polishing surface, and such a polishing section disk 13 is stretched flat without wrinkles on the polishing cloth. Needs to be strong enough to maintain In addition, it is necessary to have a strength that does not cause plastic deformation during the work of attaching and detaching to and from the polishing apparatus, the work of changing the polishing cloth 14, and the work of transporting. On the other hand, it is necessary for the worker to be light enough to lift the arm with the arm extended horizontally. In order to satisfy such lightness and strength, the constituent material of the polishing portion disk 13 preferably has a specific yield strength of 10 Nm / g or more. When the specific yield strength is less than 10 Nm / g, for example, wrinkling or deformation is likely to occur during the work of changing the polishing pad 14.
- the accuracy of the polished surface by the polishing unit disk 13 is determined by the surface accuracy (plate thickness accuracy) and the surface accuracy of the upper surface of the platen body 12.
- the polishing unit disk 13 When the polishing unit disk 13 is held on the platen body 12 by the above-mentioned vacuum suction or magnetic force, the polished surface accuracy can be obtained in a form following the surface accuracy of the upper surface of the platen body 12.
- the polishing section disk 13 may be deformed as long as it is within elastic deformation. Therefore, depending on the constituent material of the polishing portion disk 13, the weight can be reduced by reducing the plate thickness.
- the thickness accuracy of the polishing part disk 13 is 500 / m or less, and the surface roughness is R m .
- the thickness accuracy of the polishing section disk 13 is a value measured using, for example, an ultrasonic pulse reflection method (JIS Z 2355).
- the ultrasonic pulse reflection method is a method in which the sound velocity of a material is set in advance, and the pulse propagation time in the material is converted into a thickness.
- a frequency of 10 to 40 MHz is used.
- the temperature of the polished surface rises by about 298 to 323 K, so that a temperature gradient occurs between the vicinity of the polished surface and the lower part of the platen.
- the constituent material of the polishing part disk 13 has a low coefficient of thermal expansion.
- the constituent material of the polishing portion disk 13 has corrosion resistance to acids and alkalis. This is because, when the polishing section disk 13 is corroded, the corrosion product causes contamination of the object to be polished.
- the temperature of the polished surface may be controlled by forcibly cooling the polished platen 11. In such a case, it is preferable that the constituent material of the polished disc 13 has excellent thermal conductivity.
- the constituent material of the polishing portion disk 13 in consideration of the basic required characteristics as described above, the required characteristics according to the intended use, and the polishing conditions such as the polishing liquid and the temperature. It is possible to apply various materials. For example, in order to further suppress thermal deformation due to a temperature gradient or the like, a low-thermal-expansion iron-based material or a fiber-reinforced composite material containing at least one selected from Ni and Co is used for the polishing part disc 13. It is suitable as a constituent material.
- low thermal expansion iron-based material examples include Invar mono alloy (Fe-36wt% Ni), super Invar alloy (Fe-31wt% Ni-5wt3 ⁇ 4iCo), Kovar alloy (Fe-29wt% Ni-17wt3 ⁇ 4Co), etc. Is exemplified.
- the fiber reinforced composite material will be described later in detail.
- a corrosion-resistant iron-based material containing at least one selected from Ni and Cr is preferable, and specifically, Examples include stainless steel, Ni steel, and Cr steel.
- lightweight non-ferrous metals such as Al, Mg, and Ti and alloys thereof are preferable.
- a copper-based or aluminum-based high heat conductive metal or alloy thereof is preferred.
- the surface of the polishing part disk 13 made of various metal materials as described above is It is also effective to perform some kind of surface treatment.
- Specific examples of the surface treatment include film formation such as ceramics coating and fluororesin coating, and surface modification by diffusion treatment such as carburizing, nitriding, and thermal diffusion.
- the above-mentioned coating is used, for example, as a corrosion-resistant coating.
- the method of forming the film is not particularly limited, and various film forming methods such as, for example, a plating method, an ion plating method, a CVD method, and a coating method can be used.
- the metal material of the base has characteristics such as low thermal expansion, high toughness, and light weight in addition to corrosion resistance. Thus, it is possible to meet a wider range of use conditions.
- the fiber-reinforced composite material which is a kind of constituent material of the polishing part disk 13, will be described in detail.
- Various properties can be imparted to the fiber-reinforced composite material by appropriately selecting a matrix material, and a lightweight, high-strength * high-rigidity material can be obtained depending on the type and amount of the reinforcing fiber.
- a material that can achieve weight reduction while satisfying high rigidity and high heat resistance that can maintain dimensional accuracy and shape accuracy specifically, a specific yield strength of 150 Nm / g or more and a specific young It is also possible to use a material with a rate of 20 ⁇ ⁇ ⁇ Nm / g or more.
- Examples of the reinforcing fibers in the above fiber-reinforced composite material include carbon fibers, glass fibers, alumina fibers, SiC fibers, SiC whiskers, potassium titanate whiskers, and aluminum boa whiskers.
- Table 1 shows the characteristics of typical reinforcing fibers. In the present invention, various fibers as shown in Table 1 can be used, but it is particularly preferable to use carbon fibers having a low coefficient of thermal expansion and a low density.
- the shape of the reinforcing fiber is not particularly limited, but long fibers and short fibers have an average diameter of about 3 to 6 / in, and whiskers have an average diameter of 0.5 to About 2 is preferred. Further, the amount of the composite of the reinforcing fiber is set so as to obtain necessary characteristics according to the type of the reinforcing fiber to be used, the material of the matrix material, and the like.
- the matrix material of the fiber reinforced composite material examples include plastics, ceramics containing carbon, and light alloys such as aluminum alloys.
- plastic / ceramics capable of reducing the thermal expansion as the matrix material.
- aluminum alloy or the like having excellent thermal conductivity as the matrix material.
- Aluminum alloy has high thermal conductivity, so temperature control is easy.
- fiber-reinforced composite material using the reinforcing fiber and the matrix material as described above include fiber-reinforced plastic (in particular, carbon fiber-reinforced plastic is effective), Fiber reinforced ceramics (especially carbon fiber reinforced ceramics are effective), fiber reinforced aluminum alloys, and the like.
- carbon fiber reinforced plastics are obtained by mounting a pre-predeer made by impregnating a thermosetting resin into a woven fabric of carbon long fibers into a mold, and heat-molding it with an autoclave-hot press.
- thermal stress in the radial direction is omnidirectional by, for example, radially stacking several vertically and horizontally woven fiber sheets on a horizontal plane. It is preferable that they are substantially the same.
- the fiber-reinforced ceramics include those using carbon, gay nitride, gay carbide, alumina, stabilized zirconium, or the like as a matrix material.
- a fiber-reinforced ceramic is obtained by molding and firing a mixture of ceramic powder and reinforcing fibers according to a usual production method.
- it can also be obtained by preparing a pre-formed body in advance using a reinforcing fiber, impregnating the pre-formed body with a ceramic slurry, and then firing.
- carbon fiber reinforced carbon is particularly effective.
- the polishing portion disk 13 is made of such fiber reinforced ceramics, it is preferable to apply a Ni plating or a fluororesin coating on the surface thereof, whereby the corrosion resistance can be improved.
- a method for producing fiber-reinforced light alloys molten metal impregnation, powder metallurgy, hot pressing, etc. are applicable.
- the polishing section disk 13 and the platen body 12 are configured to have the same thermal expansion during polishing.
- the difference in the amount of tension be within the range of 1 to 5 / m when the platen is 600 band in diameter. This is to further effectively prevent thermal deformation and the like due to a difference in thermal expansion between the polishing section disk 13 and the platen body 12.
- the constituent materials are selected so that the thermal expansion coefficient (with respect to the temperature at the time of polishing) of the polishing section disk 13 and the platen body 12 becomes a force tunnel, or the like.
- it can be realized by controlling the temperature of the platen body 12.
- a specific constituent material of the platen body 12 a low-expansion iron or the like similar to a normal polishing platen may be used, or a material similar to the polishing portion disk 13 may be used. is there.
- PAN polyacrylonitrile
- the density was 1.6 ⁇ 10 3 kg / i 3
- the yield strength was 1.4 GN / m 2
- the Young's modulus was 220 GN / m 2
- the specific yield strength was 875 Nm / g
- the specific Young's modulus was 137.5 ⁇ 10 3.
- a polishing cloth 14 was attached to the CFRP polishing section disk 13.
- the polishing plate 12 having a diameter ⁇ 600 discussions, produced in low-expansion ⁇ thermal expansion coefficient of the 288 ⁇ 323K about 8.5x10 _6 / ⁇ (FCDLE4 material equivalent of JIS G5511), the upper surface 2 Paiiota less Finished with flatness. Further, on this upper surface, a total of 50 vacuum suction holes 12b having a diameter of 2 nm were uniformly formed by drilling.
- the CFRP polishing unit disk 13 and the low-expansion iron platen body 12 thus obtained are used to construct the separation-type polishing table 11 shown in FIG. 2 and the polishing apparatus shown in FIG. Mounted on.
- the polishing disk 13 made of CFRP is fixed to the low expansion steel platen body 12 by vacuum suction.
- the vacuum suction force at this time is as described above, but specifically, vacuum suction was performed at 0.9 atm.
- the CFRP polishing unit disk 13 can be easily attached to and detached from the platen body 12, and the polishing unit disk 13 can be easily transported due to its light weight. Can be. Therefore, the work of replacing the polishing cloth 14 and the like can be performed with the polishing unit disk 13 removed from the polishing apparatus. Furthermore, the work of replacing the polishing cloth 14 and the like can be compared to the outside of the polishing work environment as an external setup. This can be done outside the clean room. As a result, the accuracy of attaching the polishing pad 14 can be easily ensured, the number of steps for replacing the polishing pad can be reduced, and the contamination of the polishing work environment such as a clean room can be prevented. In addition, the operation rate of the polishing apparatus can be improved by external setup such as the work of replacing the polishing cloth 14.
- the CFRP polishing unit disk 13 When a 6 inch diameter semiconductor wafer was actually polished using a polishing machine equipped with the above-mentioned ⁇ -polishing surface plate 11, the CFRP polishing unit disk 13 was highly rigid. However, the shape accuracy did not decrease. Furthermore, since the CFRP polishing unit disk 13 is brought into close contact with the platen body 12 by an appropriate vacuum suction force, the flatness of the polishing unit disk 13 follows the platen body 12, Good flatness was obtained. In addition, since the amount of thermal expansion of the polishing part disk 13 made of CFR II and that of the platen body 12 are almost the same, there was no occurrence of thermal deformation due to polishing heat. As a result, good polishing was realized.
- a woven fabric (shape: 100 ⁇ 100 ⁇ 0.2 mm thick) woven with PAN-based short carbon fiber 1000 filaments was laminated in the same manner as in Example 1 using colloidal silica as a binder, and the volume fraction of short carbon fibers was obtained.
- a 30% preform with a diameter of ⁇ 600mm and a height of 8nim was prepared. The preform was mounted in a mold using a molten metal casting machine, and impregnated with an ADC12 aluminum alloy under the conditions of a molten metal temperature of 1073K and a pressure of 80MPa, thereby obtaining a carbon fiber reinforced aluminum alloy having the same shape as in Example 1.
- a disc 13 for a polishing section was produced.
- the carbon fiber-reinforced aluminum alloy polishing unit for the disc 1 3, thermal expansion coefficient (room temperature ⁇ 373K) 18x lO _6 / K , a density 2. 2 X 10 3 kg / m °, yield strength 1. 0GN / n ⁇ , Young's modulus 160GN / m 2, the ratio yield strength 454. 5 Nm / g, a specific Young's modulus 72. 7 xl0 3 Nm / g, a weight of the polishing section for the disc 1 3 was about 5 kg.
- a platen body 12 having the same dimensions as in Example 1 was produced using SUS316 stainless steel.
- the coefficient of thermal expansion of the SUS316 platen body 12 near room temperature is 16xl (T D / K.
- the carbon fiber reinforced aluminum alloy polishing disk 13 described above and the SUS316 platen body 1 2 Using this, a separation-type polishing platen 11 was constructed in the same manner as in Example 1. Also with this separation type polishing table 11, as in the case of Example 1, a favorable polishing operation in which thermal deformation was prevented was realized. In addition, the removal and transportation of the polishing unit disk 13 and the replacement of the polishing cloth 14 were easily performed, and contamination of the polishing environment such as a clean room was prevented.
- a polishing portion disk 13 of the same dimensions as in Example 1 was prepared, and the surface thereof was coated with a Ni coating having a thickness of about 30 ium by vacuum evaporation.
- a Ni coating having a thickness of about 30 ium by vacuum evaporation.
- the carbon fiber reinforced carbon disc 13 for polishing part has a tension coefficient (room temperature to 373K) of 0.5 X 10_ 6 / K, a density of 1.76 X 10 3 kg / m 3 , a yield strength of 2. OGN / m 2 , Young's modulus 150 GN / m 2 , specific yield strength 1.1 X 10 3 Nm / g, specific Young's modulus 85 X 10 3 Nm / g, and the weight of the polishing part disk was about 5 kg .
- a tension coefficient room temperature to 373K
- a platen body 12 having the same dimensions as in Example 1 was produced using a low expansion steel having a thermal expansion coefficient of about 0.5xl (T 6 / K) near room temperature.
- a semi-polished surface plate 11 was constructed in the same manner as in Example 1. Like the first embodiment, a good polishing operation in which thermal deformation was prevented was realized by the separate polishing platen 11 as well. In addition, the removal and transport of the polishing unit disk 13 and the replacement of the polishing cloth 14 were easily performed, and contamination of the polishing work environment such as a clean room was effectively prevented.
- a PAN-based carbon fiber (diameter of about 7 / m, length of about 50-100 // m) and Si 3 N 4 powder (average particle size of about 8 / m) in a volume ratio of 1: 2 And mixed.
- a slurry obtained by adding a sintering aid and water thereto was mixed by an alumina ball mill for 48 hours. This slurry was poured into a plaster mold to produce a green compact. Thereafter, the Darline compact was fired in a nitrogen gas of 1923K, and the diameter was ⁇ 600, and the height was 8 mm.
- a disc 13 for a polishing section was prepared.
- Said carbon fiber reinforced ceramic polishing unit for disk 13 has a thermal expansion coefficient (room temperature ⁇ 373 K) 3.0x10 one 6 / K, a density 2.2X10 3 kg / m 3, flexural yield strength 5GN / i 2, Young's modulus 200GN / E 2 , the specific yield strength was 2.3 ⁇ 10 3 Nm / g, the specific Young's modulus was 91 ⁇ 10 Nm / g, and the weight of the polishing part disk was 5.2 kg.
- a platen body 12 having the same dimensions as in Example 1 was produced using low-expansion iron having a thermal expansion coefficient of about 2.0 to 2.5 ⁇ 10 6 / K near room temperature.
- Example 1 Using the above-mentioned polishing disk 13 made of carbon fiber reinforced ceramics and the platen body 12 made of low expansion steel, a separate polishing 11 was formed in the same manner as in Example 1. As in the case of Example 1, a good polishing work in which thermal deformation was prevented was realized by the separation type polishing table 11 as well. In addition, the work for removing and transporting the polishing unit disk 13 and the work for replacing the polishing cloth 14 can be easily performed, thereby preventing contamination of the polishing work environment such as a clean room.
- Stainless steel * SUS 316L ( ⁇ Example 5), invar alloyFe-36wt3 ⁇ 4Ni (Example 6), titanium alloyTi-6wt3 ⁇ 4Al-4wt3 ⁇ 4V (Example 7), aluminum alloy 2014 ⁇ 1 (Example 8), alumina (Example 9), and copper (Example 10) were prepared, respectively, and polishing section disks 13 having the same shape as that of Example 1 were produced.
- the polishing unit for disc 13 are both plate thickness accuracy 500 / zm or less, surface roughness (R m. V) was 50 / m or less.
- the fifth embodiment is effective when a strongly acidic polishing liquid (for example, a nitric acid polishing liquid) having ⁇ 2 of about 2 to 3 is used.
- a strongly acidic polishing liquid for example, a nitric acid polishing liquid
- an aluminum-based material or the like has insufficient corrosion resistance.
- stainless steel * SUS 316L was used for the material of the platen body 12. Even when the polishing heat is as high as 303 to 353K, a passivation film is formed on the surface of the polishing part disk 13 so that corrosion does not proceed.
- a polishing platen 11 was constructed in the same manner as in Example 1 using such a stainless steel polishing unit disk 13 and a stainless steel platen body 12.
- the sixth embodiment is effective when it is required to further reduce the thermal deformation as in the first embodiment.
- the constituent materials of the platen body 12 are from room temperature to 373 ⁇ . There are adopted the low expansion ⁇ having substantially the same iota. Thermal expansion coefficients of ⁇ _6 / ⁇ and Invar alloy.
- the main component of this low expansion iron is CI. 13 ⁇ 4-Si0.23 ⁇ 4-MnO. 23 ⁇ 4-Ni303 ⁇ 4-Co53 ⁇ 4-Mg0.0.33 ⁇ 4 (weight3 ⁇ 4;). Since these materials are iron alloys containing 25% by weight or more of Ni, they exhibit sufficient corrosion resistance even when the polishing liquid is alkaline or acidic such as hydrochloric acid or nitric acid.
- a polishing 11 was constructed in the same manner as in Example 1.
- Example 7 is effective for corrosion resistance and weight reduction.
- Example 8 is effective for light weight and high strength.
- Example 9 is effective for corrosion resistance, weight reduction, and a certain degree of low thermal expansion. Further, the tenth embodiment is effective for achieving good heat conduction.
- a polishing and polishing table 11 was constructed in the same manner as in Example 1 using the polishing section disk 13 and each of the main bodies 12 whose materials are shown in Table 2.
- Each of the above-mentioned separate-type polishing plates 11 was mounted on the polishing apparatus shown in FIG. 1 in the same manner as in Example 1, and the semiconductor wafer was polished. Was able to be prevented, and good polishing work could be realized.
- the surface of the polishing part disk 13 formed of an Invar alloy and the surface plate body 12 formed of low expansion iron were coated with a chromium oxide having a thickness of about 1 to 2 / m.
- a dense film was formed.
- a disk 13 for a polishing part for electromagnetic adsorption and a platen body 12 with an electromagnet 25 embedded as shown in FIG. 5 were produced.
- the circular plate 1 3 polishing section, accuracy of plate thickness 500 // .pi.1 less, surface roughness (R m. V) was 50 ⁇ m or less.
- a separation-type polishing surface plate 26 using electromagnetic force shown in FIG. 5 was configured.
- the polishing platen 26 was mounted on the polishing machine shown in Fig. 5 and the semiconductor wafer was polished in the same manner as in Example 1.
- the polishing disk 13 made of Invar was thermally deformed. Polishing work could be carried out without any trouble.
- a polishing disc 13 shown in Fig. 6 was fabricated, and the platen body 12 was made of ferromagnetic iron. Further, an SmCo-based magnet 28 was attached to the support ring 27 to produce an outer peripheral fixing jig 29.
- a separation type polishing table 26 using electromagnetic force shown in FIG. 6 was constructed. That is, the stainless steel polishing disc 13 is placed on the iron platen body 12 and the outer peripheral fixing jig 29 is placed on it, and the outer peripheral fixing jig 2 9 The stainless steel polishing section disk 13 was fixed by the magnetic force of.
- a polishing section disk and a platen main body having the same dimensions as in Example 1 were made of stainless steel * SUS316L.
- the polishing section disk was fixed to the surface plate body by bolting eight places on the outer periphery of the polishing section disk.
- This polishing platen was polished in the same manner as in Example 1.
- the polishing temperature rose to 313K.
- the surface temperature of the polishing section disk was 313K, but the temperature of the platen body was 303K, and a temperature gradient was generated between the polishing section disk and the platen body.
- the amount of thermal expansion of the polishing portion disk was larger than that of the platen body, and it was observed that the vicinity of the center of the polishing portion disk was deformed in a convex shape. As a result, the flatness of the semiconductor wafer was greatly reduced.
- the separation type polishing table of the present invention has a configuration in which the polishing section disk constituting the polishing surface to be managed can be easily attached and detached and transported, and also prevents thermal deformation. It is held on the platen body by vacuum suction or magnetic force which can be performed. For this reason, while maintaining good polishing accuracy, it is possible to secure accuracy and reduce labor for cleaning the surface plate and replacing the polishing cloth. And the polishing apparatus of the present invention using such a separation type polishing can improve both the polishing accuracy and the operation rate of the apparatus. Therefore, the polishing apparatus of the present invention is useful for precision polishing of semiconductor wafer prisms and the like.
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/732,250 US6083083A (en) | 1994-04-22 | 1995-04-21 | Separation type grinding surface plate and grinding apparatus using same |
EP95916033A EP0756917A4 (en) | 1994-04-22 | 1995-04-21 | SEPARATE GRINDING SURFACE SUPPORT PLATE AND ASSOCIATED APPARATUS |
KR1019960705910A KR100213855B1 (ko) | 1994-04-22 | 1995-04-21 | 분리형 연마정반 및 그를 이용한 연마장치 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8449094 | 1994-04-22 | ||
JP6/84490 | 1994-04-22 | ||
JP32308094 | 1994-12-26 | ||
JP6/323080 | 1994-12-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1995029039A1 true WO1995029039A1 (fr) | 1995-11-02 |
Family
ID=26425523
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1995/000793 WO1995029039A1 (fr) | 1994-04-22 | 1995-04-21 | Plaque support de surface de meulage separable et appareil associe |
Country Status (4)
Country | Link |
---|---|
US (1) | US6083083A (ja) |
EP (1) | EP0756917A4 (ja) |
KR (1) | KR100213855B1 (ja) |
WO (1) | WO1995029039A1 (ja) |
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS591158A (ja) * | 1982-06-01 | 1984-01-06 | ゼネラル・シグナル・コ−ポレ−シヨン | 磨きパツド組立体 |
JPS60228070A (ja) * | 1985-03-25 | 1985-11-13 | Hitachi Ltd | 両面研摩装置 |
JPS61241059A (ja) * | 1985-04-16 | 1986-10-27 | Toshiba Corp | 研磨装置 |
JPS63134166A (ja) * | 1986-11-21 | 1988-06-06 | Hitachi Ltd | ウエハ保持機構 |
JPH0283171A (ja) * | 1988-09-19 | 1990-03-23 | Nippon Steel Corp | 溝付きラッピング材 |
JPH02116468A (ja) * | 1988-10-21 | 1990-05-01 | Sumitomo Special Metals Co Ltd | ラッピング方法 |
JPH035413Y2 (ja) * | 1983-05-24 | 1991-02-12 | ||
JPH0373425B2 (ja) * | 1985-02-28 | 1991-11-21 | Kanebo Ltd | |
JPH0413093B2 (ja) * | 1987-12-15 | 1992-03-06 | Toshiba Kk |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4141180A (en) * | 1977-09-21 | 1979-02-27 | Kayex Corporation | Polishing apparatus |
JPS5935413A (ja) * | 1982-08-24 | 1984-02-27 | 株式会社フジクラ | メツセンジヤワイヤの延線方法 |
JPS5941185A (ja) * | 1982-08-30 | 1984-03-07 | Toshiba Corp | デイジタル式電動機制御装置 |
JP2690118B2 (ja) * | 1988-04-12 | 1997-12-10 | 正己 入来院 | 土砂流出防止用排水フィルター |
JPH0453682A (ja) * | 1990-06-19 | 1992-02-21 | Mitsubishi Electric Corp | 研磨工具 |
JP2999547B2 (ja) * | 1990-11-30 | 2000-01-17 | 東芝セラミックス株式会社 | ウェーハ・ポリシング用セパレート定盤 |
-
1995
- 1995-04-21 WO PCT/JP1995/000793 patent/WO1995029039A1/ja not_active Application Discontinuation
- 1995-04-21 KR KR1019960705910A patent/KR100213855B1/ko not_active IP Right Cessation
- 1995-04-21 US US08/732,250 patent/US6083083A/en not_active Expired - Lifetime
- 1995-04-21 EP EP95916033A patent/EP0756917A4/en not_active Ceased
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS591158A (ja) * | 1982-06-01 | 1984-01-06 | ゼネラル・シグナル・コ−ポレ−シヨン | 磨きパツド組立体 |
JPH035413Y2 (ja) * | 1983-05-24 | 1991-02-12 | ||
JPH0373425B2 (ja) * | 1985-02-28 | 1991-11-21 | Kanebo Ltd | |
JPS60228070A (ja) * | 1985-03-25 | 1985-11-13 | Hitachi Ltd | 両面研摩装置 |
JPS61241059A (ja) * | 1985-04-16 | 1986-10-27 | Toshiba Corp | 研磨装置 |
JPS63134166A (ja) * | 1986-11-21 | 1988-06-06 | Hitachi Ltd | ウエハ保持機構 |
JPH0413093B2 (ja) * | 1987-12-15 | 1992-03-06 | Toshiba Kk | |
JPH0283171A (ja) * | 1988-09-19 | 1990-03-23 | Nippon Steel Corp | 溝付きラッピング材 |
JPH02116468A (ja) * | 1988-10-21 | 1990-05-01 | Sumitomo Special Metals Co Ltd | ラッピング方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP0756917A4 * |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0818272A1 (en) * | 1996-07-12 | 1998-01-14 | Applied Materials, Inc. | Holding a polishing pad on a platen in a chemical mechanical polishing system |
EP0850725A2 (en) * | 1996-12-02 | 1998-07-01 | Motorola, Inc. | Platen coating structure for chemical mechanical polishing and method |
EP0850725A3 (en) * | 1996-12-02 | 1999-01-13 | Motorola, Inc. | Platen coating structure for chemical mechanical polishing and method |
KR100501961B1 (ko) * | 1996-12-02 | 2005-10-06 | 프리스케일 세미컨덕터, 인크. | 화학기계연마용플래튼코팅구조및방법 |
KR101409947B1 (ko) * | 2009-10-08 | 2014-06-19 | 주식회사 엘지화학 | 유리판 연마 시스템용 하정반 |
US8758096B2 (en) | 2009-10-08 | 2014-06-24 | Lg Chem, Ltd. | Glass setting plate for glass polishing system |
JP2011255461A (ja) * | 2010-06-09 | 2011-12-22 | Mitsubishi Plastics Inc | ワイヤーソー及びそのメインローラー |
JP2017144495A (ja) * | 2016-02-15 | 2017-08-24 | 国立研究開発法人海洋研究開発機構 | 仕上研磨用定盤、仕上研磨装置 |
WO2017141812A1 (ja) * | 2016-02-15 | 2017-08-24 | 国立研究開発法人海洋研究開発機構 | 仕上研磨用定盤、仕上研磨装置、及び研磨方法 |
JP2020128008A (ja) * | 2020-05-26 | 2020-08-27 | 国立研究開発法人海洋研究開発機構 | 仕上研磨用定盤、仕上研磨装置及び研磨方法 |
JP2022090594A (ja) * | 2020-12-07 | 2022-06-17 | 上銀科技股▲分▼有限公司 | 回転台 |
JP7140875B2 (ja) | 2020-12-07 | 2022-09-21 | 上銀科技股▲分▼有限公司 | 回転台 |
Also Published As
Publication number | Publication date |
---|---|
KR970702124A (ko) | 1997-05-13 |
EP0756917A1 (en) | 1997-02-05 |
US6083083A (en) | 2000-07-04 |
KR100213855B1 (ko) | 1999-08-02 |
EP0756917A4 (en) | 1997-12-17 |
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