US9420210B2 - Solid-state image sensor for capturing high-speed phenomena and drive method for the same - Google Patents

Solid-state image sensor for capturing high-speed phenomena and drive method for the same Download PDF

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Publication number
US9420210B2
US9420210B2 US12/996,969 US99696909A US9420210B2 US 9420210 B2 US9420210 B2 US 9420210B2 US 99696909 A US99696909 A US 99696909A US 9420210 B2 US9420210 B2 US 9420210B2
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pixel
memory section
reading memory
signals
burst
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US20110085066A1 (en
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Shigetoshi Sugawa
Yasushi Kondo
Hideki Tominaga
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Tohoku University NUC
Shimadzu Corp
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Tohoku University NUC
Shimadzu Corp
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Assigned to TOHOKU UNIVERSITY, SHIMADZU CORPORATION reassignment TOHOKU UNIVERSITY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SUGAWA, SHIGETOSHI, TOMINAGA, HIDEKI, KONDO, YASUSHI
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    • H04N5/378
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75Circuitry for providing, modifying or processing image signals from the pixel array
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
    • H04N5/37452
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/148Charge coupled imagers
    • H01L27/14831Area CCD imagers
    • H01L27/14843Interline transfer
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H04N5/3575
US12/996,969 2008-06-10 2009-06-10 Solid-state image sensor for capturing high-speed phenomena and drive method for the same Active 2030-05-22 US9420210B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008151162 2008-06-10
JP2008-151162 2008-06-10
PCT/JP2009/002605 WO2009150829A1 (ja) 2008-06-10 2009-06-10 固体撮像素子及びその駆動方法

Publications (2)

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US20110085066A1 US20110085066A1 (en) 2011-04-14
US9420210B2 true US9420210B2 (en) 2016-08-16

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US12/996,969 Active 2030-05-22 US9420210B2 (en) 2008-06-10 2009-06-10 Solid-state image sensor for capturing high-speed phenomena and drive method for the same

Country Status (7)

Country Link
US (1) US9420210B2 (ja)
EP (1) EP2299696B1 (ja)
JP (1) JP4978818B2 (ja)
KR (1) KR101152145B1 (ja)
CN (1) CN102057671B (ja)
TW (1) TWI458346B (ja)
WO (1) WO2009150829A1 (ja)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI444040B (zh) * 2008-06-10 2014-07-01 Univ Tohoku Solid-state imaging element
JP2011204878A (ja) 2010-03-25 2011-10-13 Sony Corp 固体撮像デバイスおよび電子機器
KR101251744B1 (ko) 2011-04-13 2013-04-05 엘지이노텍 주식회사 Wdr 픽셀 어레이, 이를 포함하는 wdr 이미징 장치 및 그 구동방법
FR2976121A1 (fr) * 2011-05-31 2012-12-07 St Microelectronics Sa Dispositif d'imagerie matriciel comprenant au moins un ensemble de photosites a multiples temps d'integration.
WO2013005389A1 (ja) * 2011-07-01 2013-01-10 パナソニック株式会社 固体撮像装置、固体撮像装置の駆動方法および撮像装置
US9001107B2 (en) * 2011-07-14 2015-04-07 SK Hynix Inc. Image pixel and image pixel control method
JP5959187B2 (ja) * 2011-12-02 2016-08-02 オリンパス株式会社 固体撮像装置、撮像装置、および信号読み出し方法
JP5448208B2 (ja) * 2011-12-13 2014-03-19 国立大学法人東北大学 固体撮像装置
JP5796509B2 (ja) * 2012-02-16 2015-10-21 株式会社島津製作所 フローサイトメータ
JP6218434B2 (ja) * 2013-05-24 2017-10-25 キヤノン株式会社 焦点検出センサ
GB2520722A (en) * 2013-11-29 2015-06-03 Stfc Science & Technology Hybrid pixel sensor array
US9386220B2 (en) 2013-12-06 2016-07-05 Raytheon Company Electro-optical (EO)/infrared (IR) staring focal planes with high rate region of interest processing and event driven forensic look-back capability
EP2890117B1 (en) * 2013-12-26 2020-11-18 IMEC vzw Improvements in or relating to imaging sensors
FR3027479B1 (fr) * 2014-10-21 2017-12-29 Commissariat Energie Atomique Pixel de capteur d'image ayant de multiples gains de noeud de detection
JP5897752B1 (ja) * 2015-05-14 2016-03-30 ブリルニクスジャパン株式会社 固体撮像装置およびその駆動方法、電子機器
US9762812B2 (en) * 2015-10-30 2017-09-12 Raytheon Company Dual-field-of-view optical system
WO2017101864A1 (zh) * 2015-12-18 2017-06-22 广东欧珀移动通信有限公司 图像传感器、控制方法和电子装置
CN114339036A (zh) * 2017-03-30 2022-04-12 株式会社尼康 摄像元件及摄像装置
WO2019065866A1 (ja) * 2017-09-29 2019-04-04 株式会社ニコン 撮像素子
JP6398021B1 (ja) * 2018-01-09 2018-09-26 株式会社フローディア 固体撮像装置及びカメラシステム
CN113614565B (zh) * 2019-03-29 2024-03-08 凸版印刷株式会社 固体摄像装置、摄像系统及摄像方法
JP7120180B2 (ja) * 2019-08-07 2022-08-17 トヨタ自動車株式会社 イメージセンサ

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05336420A (ja) 1992-06-04 1993-12-17 Kinki Univ 撮影装置
JP2000165750A (ja) 1998-09-22 2000-06-16 Koji Eto 高速撮像素子
US20010009440A1 (en) * 1999-07-30 2001-07-26 Yang David Xiao Dong Memory updating for digital pixel sensors
JP2001345441A (ja) 2000-03-28 2001-12-14 Hideki Muto 高速撮像素子及び高速撮影装置
US20030038888A1 (en) * 2001-08-23 2003-02-27 Flynn David J. CCD image detector and method of operating the same
JP2004336108A (ja) 2003-04-30 2004-11-25 Shimadzu Corp 撮像装置
US20050206757A1 (en) * 2004-03-19 2005-09-22 Olympus Optical Company, Ltd. Image pickup device and image pickup apparatus
US20060103748A1 (en) * 2002-11-13 2006-05-18 Keiji Mabuchi Solid state imaging apparatus
JP2006245522A (ja) 2005-02-04 2006-09-14 Tohoku Univ 光センサ、固体撮像装置、および固体撮像装置の動作方法
US20070222877A1 (en) * 2006-03-27 2007-09-27 Seiko Epson Corporation Image sensing apparatus, image sensing system, and image sensing method
US20070291149A1 (en) * 2004-10-07 2007-12-20 Yasushi Kondo Image Sensor, and Image Pickup Apparatus Using Same, and Manufacturing Method for Manufacturing Image Sensor
US20090021630A1 (en) * 2007-07-20 2009-01-22 Fujifilm Corporation Solid state imaging element and driving method thereof
US20100013973A1 (en) * 2008-07-16 2010-01-21 International Business Machines Corporation Pixel sensor cell with frame storage capability
US20100188538A1 (en) * 2007-09-05 2010-07-29 Tohoku University Solid-state image sensor and drive method for the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5557734A (en) * 1994-06-17 1996-09-17 Applied Intelligent Systems, Inc. Cache burst architecture for parallel processing, such as for image processing
JP2000316121A (ja) * 1999-03-26 2000-11-14 Texas Instr Inc <Ti> 多重アクセスモード画像バッファ
GB0027931D0 (en) * 2000-11-16 2001-01-03 Sgs Thomson Microelectronics Solid state imaging device
KR100374647B1 (ko) * 2001-03-26 2003-03-03 삼성전자주식회사 촬상 소자의 고속 촬상 방법 및 고속 촬상 제어 장치
KR100437467B1 (ko) * 2002-07-03 2004-06-23 삼성전자주식회사 연속 버스트 읽기 동작 모드를 갖는 멀티 칩 시스템
CN100431341C (zh) * 2003-01-29 2008-11-05 奥林巴斯株式会社 图像感测装置
JP2008042828A (ja) * 2006-08-10 2008-02-21 Matsushita Electric Ind Co Ltd 固体撮像素子及びその駆動方法。

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05336420A (ja) 1992-06-04 1993-12-17 Kinki Univ 撮影装置
JP2000165750A (ja) 1998-09-22 2000-06-16 Koji Eto 高速撮像素子
US6972795B1 (en) 1998-09-22 2005-12-06 Hispec Goushi Kaisha High-speed imaging device
US20010009440A1 (en) * 1999-07-30 2001-07-26 Yang David Xiao Dong Memory updating for digital pixel sensors
JP2001345441A (ja) 2000-03-28 2001-12-14 Hideki Muto 高速撮像素子及び高速撮影装置
US20030038888A1 (en) * 2001-08-23 2003-02-27 Flynn David J. CCD image detector and method of operating the same
US20060103748A1 (en) * 2002-11-13 2006-05-18 Keiji Mabuchi Solid state imaging apparatus
JP2004336108A (ja) 2003-04-30 2004-11-25 Shimadzu Corp 撮像装置
US20050206757A1 (en) * 2004-03-19 2005-09-22 Olympus Optical Company, Ltd. Image pickup device and image pickup apparatus
US20070291149A1 (en) * 2004-10-07 2007-12-20 Yasushi Kondo Image Sensor, and Image Pickup Apparatus Using Same, and Manufacturing Method for Manufacturing Image Sensor
JP2006245522A (ja) 2005-02-04 2006-09-14 Tohoku Univ 光センサ、固体撮像装置、および固体撮像装置の動作方法
US20070222877A1 (en) * 2006-03-27 2007-09-27 Seiko Epson Corporation Image sensing apparatus, image sensing system, and image sensing method
US20090021630A1 (en) * 2007-07-20 2009-01-22 Fujifilm Corporation Solid state imaging element and driving method thereof
US20100188538A1 (en) * 2007-09-05 2010-07-29 Tohoku University Solid-state image sensor and drive method for the same
US20100013973A1 (en) * 2008-07-16 2010-01-21 International Business Machines Corporation Pixel sensor cell with frame storage capability

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Extended European search report dated Nov. 16, 2012 issued in corresponding European application 09762260.9.
Japanese language international preliminary report on patentability dated Jan. 11, 2011 and its English language translation for corresponding PCT application PCT/JP2009/002605.
Taiwan Office Action dated Jan. 23, 2014 for corresponding Taiwan Patent Application No. 98119310, and the English translation of "Reason for Rejection".
Yasushi Kondo et al., "Development of "Hyper-Vision HPV-1" High Speed Video Camera", Shimadzu Review, Sep. 30, 2005, vol. 62, No. 1-2, pp. 79-86.

Also Published As

Publication number Publication date
US20110085066A1 (en) 2011-04-14
TWI458346B (zh) 2014-10-21
KR20110014689A (ko) 2011-02-11
EP2299696A4 (en) 2012-12-19
WO2009150829A1 (ja) 2009-12-17
JPWO2009150829A1 (ja) 2011-11-10
EP2299696A1 (en) 2011-03-23
KR101152145B1 (ko) 2012-06-15
CN102057671A (zh) 2011-05-11
EP2299696B1 (en) 2013-11-27
TW201004334A (en) 2010-01-16
CN102057671B (zh) 2013-03-13
JP4978818B2 (ja) 2012-07-18

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