US7304882B2 - Circuits for driving FRAM - Google Patents
Circuits for driving FRAM Download PDFInfo
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- US7304882B2 US7304882B2 US11/301,920 US30192005A US7304882B2 US 7304882 B2 US7304882 B2 US 7304882B2 US 30192005 A US30192005 A US 30192005A US 7304882 B2 US7304882 B2 US 7304882B2
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/225—Auxiliary circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/02—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding parasitic signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/06—Address interface arrangements, e.g. address buffers
Definitions
- the present invention relates to a semiconductor memory device, and more particularly, to a drive circuit of an FRAM for generating a drive signal for performing an operation despite address noise.
- Ferroelectric thin films have been developed for as a dielectric film of a capacitor.
- the ferroelectric thin films improve a refresh operation of DRAM (Dynamic Random Access Memory) devices with large capacities.
- a ferroelectric random access memory (FRAM, FeRAM) using such a ferroelectric thin film is a nonvolatile memory device having high-speed access, low power consumption and durable construction.
- FRAM may be implemented in various kinds of electronic equipment having file storage and search functions, such as portable computers, cellular phones, game machines, etc.
- FRAM may be implemented in other applications, including for example, as a record medium for recording sounds or images.
- a memory cell comprises a ferroelectric capacitor and an access transistor.
- the memory cell stores a logic data state, e.g., ‘1’ or ‘0’, through an electric polarization state of the ferroelectric capacitor.
- a ferroelectric material of the ferroelectric capacitor is polarized.
- a polarization state of the ferroelectric material corresponds to a direction of an electric field produced by the voltage.
- a switching threshold voltage for controlling the polarization state of the ferroelectric material is a coercive voltage.
- a voltage is applied to generate a potential difference between both electrodes of the ferroelectric capacitor, and the logic data state stored in the memory cell is sensed by a change of charge in a coupled a bit line.
- FIG. 1 illustrates a hysteresis curve of the ferroelectric material of the ferroelectric capacitor.
- the charge amount that ferroelectric material retains is a residual polarization level represented as +Qr.
- the polarization level is changed to a state point C of a negative charge polarization region from the state point B.
- the ferroelectric material is polarized in a direction opposite to the polarization direction of the state point A.
- the polarization level at state point C is represented as ⁇ Qs.
- the voltage of both ends of the capacitor falls to a ground voltage Vss, the polarization level does not fall to zero but remains at a state point D.
- the residual polarization level at the state point D is represented as ⁇ Qr.
- FIG. 2 illustrates a memory cell of a memory cell array in an FRAM.
- a memory cell is constructed of one access transistor M 1 and one ferroelectric capacitor C FE .
- the access transistor M 1 has two terminals, a source terminal and a drain terminal, which are respectively connected between one terminal of the ferroelectric capacitor C FE and a bit line B/L.
- a gate of the access transistor M 1 is connected to a word line W/L.
- a first terminal of the ferroelectric capacitor C FE is coupled to the access transistor M 1 , and a second terminal thereof is coupled to a plate line P/L.
- the non-switching capacitance Qnsw is distinguished from a charge difference in changing from the state point D to the state point A, namely, a voltage corresponding to a switching capacitance Qsw.
- the switching capacitance Qsw corresponds to a read operation on data stored in memory cell.
- An asynchronous FRAM operates according to an external chip control signal, e.g., an external enable signal or external chip selector signal.
- an external chip control signal When the external chip control signal is enabled, an applied external address transition is detected to control a cycle operation by using a composite pulse signal obtained by totaling respective address transition detection signals.
- An internal clock is generated by the composite pulse signal, and through the composite pulse signal, read and write operations for a corresponding address of memory can be performed.
- an external address is changed, a composite pulse signal is generated, and a precedent cycle operation is completed by this signal and a next cycle preparation operation proceeds.
- an internal chip enable signal ICE
- ICE internal chip enable signal
- FIG. 3 illustrates timings for a read operation in an FRAM.
- a read operation in an FRAM starts by a transition and enabling of an external chip control signal XCEB from a logic ‘high’ level to a logic ‘low’ level.
- An external address signal XA is applied by the enabling of the external chip control signal XCEB.
- the external address XA is applied to an address buffer circuit (not shown).
- the address buffer circuit buffers the applied external address signal XA and generates an internal address signal. Further, the address buffer circuit detects a transition of the internal address signal and generates address transition detection signals for respective address signals.
- the address transition detection signals are totaled in a composite pulse signal generating circuit, and become a composite pulse signal ATD_SUM as an address transition detection signal.
- the composite pulse signal ATD_SUM is a short pulse signal that is enabled for a given time and then disabled.
- An internal chip enable signal ICE is generated by the composite pulse signal ATD_SUM, and the internal control signals needed for operation of a memory device are generated by the internal chip enable signal ICE.
- the internal chip enable signal is not generated in a transition for enabling the composite pulse signal ATD_SUM, but is generated in a transition for disabling the composite pulse signal ATD_SUM after the address transition detection signals are applied.
- a word line W/L is enabled by a word line decoder and driver circuit (not shown).
- a plate line P/L is enabled by a plate control signal generated in response to the internal chip enable signal ICE.
- a sense amplifier enable signal SAEN responding to an enabling of the plate control signal, is generated, enabling a sense amplifier.
- SAEN responding to an enabling of the plate control signal.
- the operation at the sensing interval t 2 is finished by a disabling of the plate line P/L through the plate control signal, and operation of a write-back interval t 3 starts.
- the write-back interval t 3 At the write-back interval t 3 , previous data is restored; data stored in a memory cell is reversed when a plate line is enabled for a general read operation and needs to be restored.
- the write-back interval t 3 needs to be sufficient to prevent a breakage of data stored in a memory cell.
- the operation of the write-back interval t 3 continues until the sense amplifier is disabled by a subsequently generated composite pulse signal ATD_SUM after disabling the plate line P/L.
- FIG. 4 illustrates timings for an abnormal operation, e.g., a read operation including address noise, in an FRAM.
- an abnormal operation e.g., a read operation including address noise
- a drive circuit of an FRAM comprises an address buffer circuit for buffering an applied external address signal and generating an internal address signal, and detecting a transition of the internal address signal and generating a plurality of address transition detection signals for respective internal address signals.
- the FRAM comprises a composite pulse signal generating circuit for limiting a subsequent generation of a second composite pulse signal to a delay interval provided after a generation of a first composite pulse signal, in generating the second composite pulse signal obtained by totaling the plurality of address transition detection signals.
- the FRAM comprises an internal chip enable buffer circuit for generating an internal chip enable signal to generate an internal control signal, in response to the composite pulse signal.
- the internal chip enable signal may be generated in response to a transition for disabling the composite pulse signal.
- the drive circuit of the FRAM may further comprise a plate control signal generating circuit for generating a plate control signal for an enabling and disabling of plate line in response to the internal chip enable signal.
- the delay interval may be a time interval obtained by totaling a first delay interval as an enable section of the plate control signal and a second delay interval having determine time after a disabling of the plate control signal.
- the first delay interval may be a time interval enough to sense data of a memory cell in a read operation of the FRAM, and the second delay interval may be a time interval enough to perform a restoring of previous data.
- the composite pulse signal generating circuit may include a composite pulse signal generating part for totaling and outputting a sum of the plurality of respectively inputted address transition detection signals, and a delay part for outputting an output signal of the composite pulse signal generating part as the second composite pulse signal, before the plate control signal is enabled when the internal chip enable signal is not applied, and for outputting an output signal to restrict an effect of the output signal of the composite pulse signal generating part outputted as the second composite pulse signal, at a time interval obtained by totaling the first and second delay intervals, after an enabling of the plate control signal.
- the composite pulse signal generating circuit may include an output part for generating the composite pulse signals in response to an output signal of the composite pulse signal generating part and an output signal of the delay part.
- the composite pulse signal generating part may include a first NAND circuit for performing an NAND operation on respectively inputted address transition detection signals.
- the delay part may include a first inverter for inverting the plate control signal, a second inverter for inverting an output signal of the first inverter, and a delay unit for delaying for a time an output of the second inverter.
- the delay part may further include a third inverter for inverting an output signal of the delay unit, a second NAND circuit for performing a NAND operation on an output signal of the first inverter and an output signal of the third inverter, and a fourth inverter for inverting an output of the second NAND circuit and applying it as an input signal of the output part.
- the delay part may further include a PMOS transistor that is driven by the output signal of the first inverter and that controls an input signal level of the third inverter as a power source voltage level.
- the output part may include a third NAND circuit for performing a NAND operation on an output signal of the composite pulse signal generating part and an output signal of the delay part; and a fifth inverter for inverting and outputting an output signal of the third NAND circuit, and generating the second composite pulse signal.
- a stabilized read operation can be provided and a breakage of data stored in memory cells can be prevented or substantially reduced.
- a composite pulse signal generating circuit of a drive circuit of a FRAM limits a subsequent generation of a second composite pulse signal for a delay interval provided after a generation of a first composite pulse signal.
- the composite pulse signal generating circuit includes a composite pulse signal generating part for totaling and outputting a sum of a plurality of address transition detection signals.
- the composite pulse signal generating circuit includes a delay part for outputting an output signal of the composite pulse signal generating part as the second composite pulse signal, before a plate control signal is enabled when an internal chip enable signal is not applied, and for outputting an output signal to restrict an effect of the second composite pulse signal in a time interval, after an enabling of the plate control signal.
- the composite pulse signal generating circuit further includes an output part for generating the composite pulse signals in response to an output signal of the composite pulse signal generating part and an output signal of a delay part, wherein the output signal is the time interval.
- FIG. 1 illustrates a hysteresis curve for ferroelectric material according to a prior art
- FIG. 2 is a circuit diagram illustrating a memory cell of a ferroelectric memory cell array according to a prior art
- FIG. 3 illustrates timings for read operation in an FRAM according to a prior art
- FIG. 4 illustrates timings for an address noise occurrence in an FRAM according to a prior art
- FIG. 5 is a block diagram for a drive circuit of an FRAM according to an exemplary embodiment of the present invention.
- FIG. 6 depicts a block diagram and circuit diagram of a composite pulse signal generating circuit shown in FIG. 5 ;
- FIG. 7 illustrates timings for read operation of an FRAM shown in FIG. 5 .
- FIG. 5 is a block diagram for a drive circuit of an FRAM according to an exemplary embodiment of the present invention.
- a drive circuit of the FRAM includes a composite pulse signal generating circuit 110 , an internal chip enable (ICE) buffer circuit 120 , an address buffer circuit 130 and a plate control signal generating circuit 140 .
- ICE internal chip enable
- the composite pulse signal generating circuit 110 adds up respective address transition detection signals ATDi applied from the address buffer circuit 130 , and generates a composite pulse signal ATD_SUM.
- the composite pulse signal generating circuit 110 is configured to limit a generation of a next composite pulse signal to a given delay interval after the generation of a prior composite pulse signal ATD_SUM.
- the given delay interval is a time interval sufficient to sense data of a memory cell and restore previous data by the first composite pulse signal ATD_SUM, in read operation of a semiconductor memory device.
- the composite pulse signal generating circuit 110 determines the delay interval by using a plate control signal inputted from the plate control signal generating circuit 140 .
- the delay interval is a time interval obtained by totaling a first delay interval as an enable section of the plate control signal and a second delay interval having a time after a disabling of the plate control signal.
- FIG. 6 An exemplary embodiment of the composite pulse signal generating circuit 110 is shown in FIG. 6 .
- the address buffer circuit 130 buffers an applied external address signal and generates an internal address signal.
- the address buffer circuit 130 detects a transition of the internal address signal and generates address transition detection signals ATDi for respective address signals.
- the internal chip enable buffer circuit 120 generates an internal chip enable signal ICE to generate an internal control signal needed for operation of the memory device in response to the composite pulse signal ATD_SUM.
- Internal control signals needed for operation of the memory device are generated by the internal chip enable signal ICE.
- the internal control signals include, for example, a word line control signal for enabling and disabling of word line, a plate line control signal for enabling and disabling the plate line, etc.
- the plate control signal generating circuit 140 generates a plate control signal PPLS for enabling and disabling the plate line in response to the internal chip enable signal ICE.
- FIG. 6 depicts a block diagram and circuit diagram of the composite pulse signal generating circuit 110 shown in FIG. 5 .
- the composite pulse signal generating circuit 110 includes a composite pulse signal generating part 112 , a delay part 114 and an output part 116 .
- the composite pulse signal generating part 112 adds up and outputs a sum of respectively inputted address transition detection signals ATD 1 , ATD 2 and ATDi.
- the composite pulse signal generating part 112 may include a first NAND circuit NA 112 for performing a NAND operation on respectively inputted address transition detection signals ATD 1 , ATD 2 and ATDi.
- the first NAND circuit NA 112 maintains a logic ‘high’ level in a stand-by state of the respective address transition detection signals ATD 1 , ATD 2 and ATDi.
- the first NAND circuit NA 112 adopts a short pulse of a logic ‘low’ level in an address transition.
- the composite pulse signal generating part 112 may be re-configured with a NOR circuit or other circuits.
- the delay part 114 does not prevent the output part 116 from outputting the composite pulse signal ATD_SUM before the plate control signal PPLS is enabled. So, the output part 116 receives an output signal of the composite pulse signal generating part 112 and outputs the composite pulse signal ATD_SUM.
- the delay part 114 After the plate control signal PPLS is enabled when the internal chip enable signal ICE is applied, the delay part 114 outputs an output signal to the output part 116 to prevent the output part 116 from outputting the output signal of the composite pulse signal generating part 112 as the composite pulse signal ATD_SUM, at a time interval obtained by totaling the first and second delay intervals.
- the delay part 114 may include a first inverter I 6 for inverting the applied plate control signal PPLS; a second inverter I 8 for inverting an output signal of the first inverter I 6 ; a delay unit D 2 for delaying for determine time an output of the second inverter I 8 ; a third inverter I 10 for inverting an output signal of the delay unit D 2 ; a second NAND circuit NA 114 performing a NAND operation on the output signal of the first inverter I 6 and an output signal of the third inverter I 10 ; and a fourth inverter I 12 for inverting an output of the second NAND circuit NA 114 and applying it as an input signal of the output part 116 .
- the delay unit D 2 is designed to have a delay to achieve a time interval obtained by totaling the first and second delay intervals. For example, the delay time interval of the delay unit D 2 may be substantially equal to the second delay interval.
- the delay part 114 may further include a PMOS transistor P 12 that is driven by the output signal of the first inverter I 6 and that controls an input signal level of the third inverter I 10 as a level of power source voltage VDD.
- the PMOS transistor P 12 limits an output change of the delay part 114 based on an output of the delay unit D 2 when the plate control signal PPLS is applied.
- the output part 116 generates the composite pulse signal ATD_SUM in response to an output signal of the composite pulse signal generating part 112 and an output signal of the delay part 114 .
- the output part 116 may include a third NAND circuit NA 116 performing a NAND operation on the output signal of the composite pulse signal generating part 112 and the output signal of the delay part 114 ; and a fifth inverter I 4 for inverting an output signal of the third NAND circuit NA 116 , and generating the composite pulse signal ATM_SUM.
- the composite pulse signal generating circuit 110 may be realized by those skilled in the art of the invention through various methods other than exemplary embodiments described with reference to FIG. 6 .
- the address transition does not occur.
- the address transition detection signals ATD 1 , ATD 2 and ATDi maintain a logic ‘high’ level
- the plate control signal PPLS maintains a logic ‘low’ level as a disabling state.
- An output of the composite pulse signal generating part 112 is maintained as a logic ‘low’ level
- an output signal of the delay part 114 is maintained as a logic ‘high’ level
- a logic ‘low’ level is maintained.
- the address transition detection signals ATD 1 , ATD 2 and ATDi are transited from a logic ‘high’ level to a logic ‘low’ level.
- the composite pulse signal generating part 112 outputs a pulse signal of a logic ‘high’ level.
- an output signal of the delay part 114 maintains a logic ‘high’ level and the output part 116 generates and outputs a composite pulse signal ATD_SUM enabled to a logic ‘high’ level.
- the plate control signal PPLS is enabled to a logic ‘high’ level by the generation of the composite pulse signal ATD_SUM.
- the output signal of the delay part 114 is transited from a logic ‘high’ level to a logic ‘low’ level by the enabling of the plate control signal PPLS. This logic ‘low’ state continues until the plate control signal PPLS is disabled and a determined time elapses.
- the determined time is a time interval obtained by totaling the first delay interval and the second delay interval. During the time interval, if an address transition occurs due to noise, etc., such that the composite pulse signal generating part 112 outputs a pulse signal of logic ‘high’ level, the composite pulse signal ATD_SUM is not generated from the output part 116 .
- an output signal of the delay part 114 is determined as a logic ‘high’ level, and a pulse signal of logic ‘high’ level is outputted from the composite pulse signal generating part 112 .
- the pulse signal is outputted by the output part 116 and a next composite pulse signal ATD_SUM is outputted.
- FIG. 7 illustrates timings for a read operation in a semiconductor memory device to which a drive circuit of FIG. 5 is applied.
- a read operation in an FRAM starts by a transition from a logic ‘high’ level of an external chip control signal XCEB to a logic ‘low’ level, namely, by an enabling the read operation.
- An external address signal XA is applied by the enabling of the external chip control signal XCEB.
- the external address XA is applied to the address buffer circuit 130 .
- the address buffer circuit 130 buffers the applied external address signal XA and generates an internal address signal.
- the address buffer circuit 130 detects a transition of the internal address signal and generates address transition detection signals ATDi for respective address signals.
- the address transition detection signals ATDi are added up by the composite pulse signal generating circuit 110 , and become a composite pulse signal ATD_SUM as a first address transition detection signal.
- the composite pulse signal ATD_SUM is a short pulse signal that is enabled for a determined time and then disabled.
- An internal chip enable signal ICE is generated by the composite pulse signal ATD_SUM, and the internal control signals needed for operation of the memory device are generated by the internal chip enable signal ICE.
- the internal chip enable signal is not generated at a transition for enabling the composite pulse signal ATD_SUM, but is generated at a transition for disabling the composite pulse signal ATD_SUM after applying the address transition detection signals ATDi.
- a word line W/L is enabled by a word line decode and driver circuit (not shown).
- a plate line P/L is enabled by enabling a plate control signal PPLS generated in response to the internal chip enable signal ICE.
- a sense amplifier enable signal SAEN responding to an enabling of line of the plate control signal, is generated to enable a sense amplifier.
- SAEN responding to an enabling of line of the plate control signal.
- the sensing interval t 2 is finished by a disabling of the plate line P/L through the plate control signal, and a write-back interval t 3 starts.
- the write-back interval t 3 is to restore previous data, the data stored at a memory cell being reversed when the plate line is enabled to perform the read operation. At the write-back interval t 3 , sufficient time to prevent a breakage of data stored at the write-back interval t 3 is provided.
- the write-back interval t 3 is extended until a point of time when the sense amplifier is disabled by a composite pulse signal ATD_SUM generated subsequently after the plate line P/L is disabled.
- a composite pulse signal ATD_SUM is not generated even if an address transition 10 is generated by address noise, etc.
- a stabilized read operation can be performed, and a sufficient write-back interval t 3 can be provided, thereby preventing or substantially reducing a breakage of data at a memory cell.
- the internal chip enable signal is disabled and the word line W/L is disabled, and read operation is completed.
- An internal chip enable signal is again generated at a transition for a disabling a next generated composite pulse signal ATD_SUM and its subsequent operation is performed.
- a drive circuit of an FRAM stabilizes a read operation and prevents or substantially reduces a breakage of data of memory cells.
- Exemplary embodiments of the invention were described above under the assumption of a read operation in the FRAM, but a write operation can be also applied thereto to ensure a write section.
- data ‘0’ corresponded to a state point B of hysteresis loop shown in FIG. 1 and data ‘1’ corresponded to a state point D
- data of a memory cell was read when a level of bit line had a grounded state and a plate line had a level state of power source voltage.
- the invention can be applied by those skilled in the art, so that data ‘1’ corresponds to a state point B and data ‘0’ corresponds to a state point D, and read operation can be performed by changing a level state of plate line and bit line through various methods.
- stabilized operations can be executed by limiting a generation of composite pulse signal generable by address noise, etc. in operating an FRAM, and a breakage of data stored at memory cells can be prevented or substantially reduced.
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KR1020040105343A KR100665841B1 (ko) | 2004-12-14 | 2004-12-14 | 강유전체 메모리장치의 구동회로 |
KR2004-105343 | 2004-12-14 |
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US20060126372A1 US20060126372A1 (en) | 2006-06-15 |
US7304882B2 true US7304882B2 (en) | 2007-12-04 |
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US11/301,920 Expired - Fee Related US7304882B2 (en) | 2004-12-14 | 2005-12-13 | Circuits for driving FRAM |
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US (1) | US7304882B2 (ko) |
JP (1) | JP4974521B2 (ko) |
KR (1) | KR100665841B1 (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070035983A1 (en) * | 2005-07-13 | 2007-02-15 | Samsung Electronics Co., Ltd. | Ferroelectric random access memory device and method for controlling writing sections therefor |
US20090052224A1 (en) * | 2007-08-23 | 2009-02-26 | Samsung Electronics Co., Ltd. | Ferroelectric random access memory apparatus and method of driving the same |
TWI632548B (zh) * | 2016-06-21 | 2018-08-11 | 美光科技公司 | 記憶體單元之印痕避免 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5953803B2 (ja) * | 2012-02-21 | 2016-07-20 | 富士通セミコンダクター株式会社 | アクティブ信号生成回路及び半導体記憶装置 |
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US6590829B2 (en) | 2001-03-06 | 2003-07-08 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit |
US6889268B2 (en) * | 2002-07-03 | 2005-05-03 | Samsung Electronics Co., Ltd. | Multi-chip system having a continuous burst read mode of operation |
US6967890B2 (en) * | 2003-12-19 | 2005-11-22 | Hon Hai Precision Ind. Co., Ltd. | Battery power measuring system and method for a battery-backed SRAM |
Family Cites Families (4)
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US4636991A (en) | 1985-08-16 | 1987-01-13 | Motorola, Inc. | Summation of address transition signals |
KR960004566B1 (ko) * | 1994-01-28 | 1996-04-09 | 금성일렉트론주식회사 | 스태틱 램(sram)의 어드레스 입력회로 |
KR100351935B1 (ko) * | 2000-05-10 | 2002-09-12 | 삼성전자 주식회사 | 강유전체 랜덤 액세스 메모리 장치 및 그것의 읽기/쓰기동작을 제어하는 방법 |
KR100463606B1 (ko) * | 2002-01-29 | 2004-12-29 | 주식회사 하이닉스반도체 | 강유전체 메모리의 구동 장치 및 방법 |
-
2004
- 2004-12-14 KR KR1020040105343A patent/KR100665841B1/ko not_active IP Right Cessation
-
2005
- 2005-12-13 US US11/301,920 patent/US7304882B2/en not_active Expired - Fee Related
- 2005-12-14 JP JP2005360732A patent/JP4974521B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6590829B2 (en) | 2001-03-06 | 2003-07-08 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit |
US6889268B2 (en) * | 2002-07-03 | 2005-05-03 | Samsung Electronics Co., Ltd. | Multi-chip system having a continuous burst read mode of operation |
US6967890B2 (en) * | 2003-12-19 | 2005-11-22 | Hon Hai Precision Ind. Co., Ltd. | Battery power measuring system and method for a battery-backed SRAM |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070035983A1 (en) * | 2005-07-13 | 2007-02-15 | Samsung Electronics Co., Ltd. | Ferroelectric random access memory device and method for controlling writing sections therefor |
US20090052224A1 (en) * | 2007-08-23 | 2009-02-26 | Samsung Electronics Co., Ltd. | Ferroelectric random access memory apparatus and method of driving the same |
US7800931B2 (en) | 2007-08-23 | 2010-09-21 | Samsung Electronics Co., Ltd. | Ferroelectric random access memory apparatus and method of driving the same |
TWI632548B (zh) * | 2016-06-21 | 2018-08-11 | 美光科技公司 | 記憶體單元之印痕避免 |
Also Published As
Publication number | Publication date |
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KR100665841B1 (ko) | 2007-01-09 |
JP2006172706A (ja) | 2006-06-29 |
JP4974521B2 (ja) | 2012-07-11 |
US20060126372A1 (en) | 2006-06-15 |
KR20060066849A (ko) | 2006-06-19 |
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