US5745467A - Optical information recording method and apparatus - Google Patents

Optical information recording method and apparatus Download PDF

Info

Publication number
US5745467A
US5745467A US08/725,944 US72594496A US5745467A US 5745467 A US5745467 A US 5745467A US 72594496 A US72594496 A US 72594496A US 5745467 A US5745467 A US 5745467A
Authority
US
United States
Prior art keywords
power
recording
pulse
cooling
mark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US08/725,944
Other languages
English (en)
Inventor
Yoshitaka Sakaue
Kenichi Nishiuchi
Eiji Ohno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. reassignment MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NISHIUCHI, KENICHI, OHNO, EIJI, SAKAUE, YOSHITAKA
Application granted granted Critical
Publication of US5745467A publication Critical patent/US5745467A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/125—Optical beam sources therefor, e.g. laser control circuitry specially adapted for optical storage devices; Modulators, e.g. means for controlling the size or intensity of optical spots or optical traces
    • G11B7/126—Circuits, methods or arrangements for laser control or stabilisation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/125—Optical beam sources therefor, e.g. laser control circuitry specially adapted for optical storage devices; Modulators, e.g. means for controlling the size or intensity of optical spots or optical traces
    • G11B7/126—Circuits, methods or arrangements for laser control or stabilisation
    • G11B7/1263—Power control during transducing, e.g. by monitoring
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004—Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/0045—Recording
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004—Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/0045—Recording
    • G11B7/00454—Recording involving phase-change effects
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004—Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/006—Overwriting
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004—Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/0055—Erasing
    • G11B7/00557—Erasing involving phase-change media

Definitions

  • the present invention relates to an optical disk recording method and apparatus for recording and playing back information at high speed and high density using optical means such as laser light or the like.
  • Optical disks can be classified into three main types: read-only type, write-once type, and rewritable type.
  • the read-only type has found practical application, for example, as compact discs and laser discs, and the write-once type and the rewritable type as disks for storing document files, data files, etc.
  • Rewritable optical disks are mainly implemented by magneto-optical recording and phase-change optical recording.
  • Phase-change optical disks use a recording layer which, when illuminated with laser light, exhibits a reversible state change between amorphous and crystalline or between one crystalline structure and another crystalline structure. More specifically, when illuminated with laser light, either the refractive index or extinction coefficient of the thin film or both vary, thus accomplishing recording. Since the amplitude of transmitted light or reflected light changes at this recorded portion, the recorded signal is read by detecting the change in the amount of the transmitted light or reflected light reaching the detection system.
  • Representative examples of materials used that exhibit a state change between amorphous and crystalline include alloys of tellurium, selenium, indium, antimony, etc.
  • phase-change optical disks can use a one-beam overwrite method to rewrite recorded marks.
  • the one-beam overwrite method is a method that records a new signal while erasing the already recorded old signal, by modulating laser power with a recording signal between a recording power and a bias power (also called an erasing power) lower than the recording power and by shining the thus modulated laser onto the signal track.
  • Overwrite itself requires two power levels, the recording power level and the bias power level, but when recording, erasure, and reading are considered, three power levels are required, that is, the recording power level, the bias power level, and the read power level.
  • an area illuminated with the recording power level when its original state was amorphous or crystalline, becomes amorphous since it is rapidly cooled after melting, and an area illuminated with the erasing power level is crystallized regardless of its original state, since it is heated above its crystallizing temperature. A new signal is thus written over the old signal.
  • CLV constant linear velocity
  • CAV constant angular velocity
  • CAV CAV is used since varying the disk's rotational speed takes time.
  • the linear velocity along the circumference of the disk increases toward the outer circumference and decreases toward the inner circumference.
  • mark spacing also called mark position
  • mark length also called mark edge
  • mark spacing modulation recording a signal is recorded by varying mark spacing, and when playing back, the signal is read by detecting mark positions.
  • mark length modulation recording marks of various lengths are recorded with various mark spacings, and when playing back, the recorded signal is read by detecting both edges of each mark.
  • the mark length modulation method can achieve recording at a density twice what is possible with the mark spacing modulation method.
  • laser recording on a phase-change optical disk is achieved by a heat mode; therefore, when a long mark is recorded, the end portion of the mark becomes wider than the start portion of the mark because of heat accumulation, distorting the mark in a teardrop shape and resulting in a distorted read waveform with both ends of the mark displaced in position.
  • a recording method for example, in Japanese Patent Laid Open Publication No. 3-185628, in which a recording waveform for forming a recorded mark is constructed with a recording pulse train consisting of a plurality of pulses (this recording method is also called multipulse recording).
  • This method compared with a single pulse recording method, can control the heat applied to the recording film and can produce a mark with a good shape without the mark shape becoming asymmetrical between its start and end portions as has been the case with the single pulse method.
  • a method aimed at solving this problem is proposed, for example, in Japanese Patent Laid Open Publication No. 7-129959.
  • the amount of heat interference is predicted, and when performing multipulse recording, the start and end positions of a recording pulse train are changed according to recorded mark length and mark spacing, to suppress heat interference between marks and thereby improve signal characteristics.
  • a recording method for example, in Japanese Patent Laid Open Publication No. 6-295440 that performs laser radiation with a power lower than the bias power when recording by the multipulse recording method.
  • Signal degradation is caused by destruction of the dielectric layer and recording layer and also by a phenomenon called material flow in the recording layer.
  • Material flow is a phenomenon in which the recording layer material moves in the track direction as the overwrite cycle is repeated since the recording layer and its adjacent areas are heated to high temperatures during recording, resulting in the formation of portions where the recording film is thin and portions where the recording film is thick on the same track.
  • the recorded signal is played back, the read waveform is corrupted and the signal cannot be played back from the affected portion.
  • signal degradation due to repeated overwrite cycles is large, the potential application of the optical disk is limited.
  • the recorded mark shape varies depending on the way that the recording layer heated by the laser light cools.
  • the recording layer once melted becomes crystallized instead of becoming amorphous. As a result, the recorded mark is reduced in size or distorted in shape, causing degradation in read signal quality.
  • the degree of heat trapping at the end portion of the mark is reduced, facilitating the amorphizing thereof, but in some cases, the amorphized area may become larger at the end portion than at the start portion because of an excessive cooling rate at the end portion.
  • C/N refers to the ratio of the carrier level to the noise level.
  • the present invention provides a recording method in which, in both mark length and mark spacing modulation recording, after laser radiation with recording power the laser power is reduced to a cooling power lower than a bias power, and after being maintained at the cooling power for a prescribed period of time, the laser power is raised back to the bias power, wherein laser radiation with the bias power is applied between the laser radiation with the recording power and the laser radiation with the cooling power that follows the recording power.
  • the recording method reduces the laser power, after laser radiation with multiple pulses, to the cooling power lower than the bias power, and after maintaining the cooling power for a prescribed period of time, raises the laser power back to the bias power, wherein at least either the duration of cooling power radiation or the start time of the cooling power is varied in accordance with the mark length to be recorded.
  • the start time of the cooling power is varied in accordance with disk radius in CAV mode.
  • mark length modulation recording at least either the duration of cooling power radiation or the start time of the cooling power is varied in accordance with disk radius in CAV mode.
  • a recording pulse train consists of a start pulse, an end pulse, and intermediate pulses therebetween alternating at intervals of time equal to or shorter than one data clock period
  • laser radiation with the cooling power is applied following the end pulse in the recording pulse train
  • laser radiation with the bias power is applied between the end pulse in the recording pulse train and laser radiation with the cooling power
  • the recording pulse train consists of a start pulse, an end pulse, and intermediate pulses therebetween alternating at intervals of time equal to or shorter than one data clock period, and the positions of the start pulse and end pulse of the recording pulse train change in accordance with mark length and mark spacing
  • the duration of the laser radiation with the cooling power is fixed and, regardless of the positions of the start pulse and end pulse of the recording pulse train, the time at which to start the laser radiation with the cooling power is fixed relative to the start of the laser radiation of the end pulse in the recording pulse train, or the timing to start the laser radiation with the cooling power is determined based on the clock.
  • a recording apparatus for implementing the above recording method comprises: a start pulse generating circuit for generating a start pulse of prescribed duration at a start position of a Hi period of data; a burst gate generating circuit for generating a burst gate signal at a middle position of a mark when the Hi period of data is long, and for not generating a burst gate signal when the Hi period of data is short; an end pulse generating circuit for generating an end pulse of prescribed duration at an end position of the Hi period of data; a mark/space length detection circuit for generating an nT mark signal in such a manner as to contain the start pulse and end pulse when the Hi period of data is n clocks long, and for generating an mT space signal in such a manner as to contain the end pulse and start pulse at both ends of a space when a Lo period of data is m clocks long (where n and m are natural numbers existing in data train); an encoder for generating a select signal for controlling a start value selector and an end value selector (
  • Another recording apparatus for implementing the above recording method comprises: a start pulse generating circuit for generating a start pulse of prescribed duration at a start position of a Hi period of data; a burst gate generating circuit for generating a burst gate signal at a middle position of a mark when the Hi period of data is long, and for not generating a burst gate signal when the Hi period of data is short; an end pulse generating circuit for generating an end pulse of prescribed duration at an end position of the Hi period of data; a mark/space length detection circuit for generating an nT mark signal in such a manner as to contain the start pulse and end pulse when the Hi period of data is n clocks long, and for generating an mT space signal in such a manner as to contain the end pulse and start pulse at both ends of a space when a Lo period of data is m clocks long (where n and m are natural numbers existing in data train); an encoder for generating a select signal for controlling a start value selector and an end value selector (
  • a recording pulse train for forming a recorded mark is followed by a cooling pulse train (hereinafter called the mark end portion correction pulse train), different from the recording pulse train, for correctly shaping the end portion of the recorded mark.
  • the mark end portion correction pulse train a cooling pulse train
  • the mark end portion correction pulse train is formed by radiating laser light with at least two different powers including a power lower than the bias power.
  • laser radiation with the recording pulse train is followed by a period during which the laser power is reduced in continuous manner to a power lower than either the lower power or bias power in the recording pulse train.
  • the recording pulse train is followed by laser radiation with the bias power preceding the formation of the mark end portion correction pulse train.
  • the start time of the mark end portion correction pulse train or the pulse shape of the mark end portion correction pulse train is varied for each recorded mark length.
  • the start time of the mark end portion correction pulse train or the pulse shape of the mark end portion correction pulse train is varied in accordance with radius.
  • the end portion of a recorded mark can be formed in a desired shape, achieving good read signal characteristics, and according to the optical information recording method and apparatus of the invention, thermal damage can be greatly alleviated and good cycle characteristics can be obtained.
  • FIG. 1 is a diagram showing recording waveforms used in the embodiments of the present invention:
  • FIG. 2 is a structural diagram of an optical disk used in the embodiments of the present invention.
  • FIG. 3 is a diagram of an optical disk apparatus used in the embodiments of the present invention.
  • FIG. 4 is a diagram showing recording pulse trains used in the embodiments of the present invention.
  • FIG. 5 is a diagram showing recording waveforms used in the embodiments of the present invention.
  • FIG. 6 is a diagram showing recording waveforms used in one embodiment of the present invention.
  • FIG. 7 is a diagram showing recording waveforms used in one embodiment of the present invention.
  • FIG. 8 is a diagram showing recording waveforms used in one embodiment of the present invention.
  • FIG. 9 is a diagram showing recording waveforms used in one embodiment of the present invention.
  • FIG. 10 is a diagram showing recording waveforms used in one embodiment of the present invention.
  • FIG. 11 is a block diagram of a disk recording apparatus used in one embodiment of the present invention.
  • FIG. 12 is a diagram showing signal waveforms at various parts of the disk recording apparatus used in the same embodiment of the present invention.
  • FIG. 13 is a block diagram of a disk recording apparatus used in one embodiment of the present invention.
  • FIG. 14 is a diagram showing signal waveforms at various parts of the disk recording apparatus used in the same embodiment of the present invention.
  • FIG. 15 is a diagram showing recording waveforms used in the same embodiment of the present invention.
  • BIAS CURRENT SOURCE 32. PLAYBACK BEAM CURRENT SOURCE, 33. SWITCH, 34. SWITCH, 35. LASER DIODE, 38. INVERTER, 39. HELD START SET VALUE, 41. COOLING PULSE, 42. DELAYED COOLING PULSE, 43. DELAYED COOLING PULSE (INVERTED), 45. HELD END SET VALUE, 36. COOLING PULSE GENERATING CIRCUIT, 37. COOLING PULSE DELAY LINE, 51. SUBSTRATE, 52, FIRST DIELECTRIC LAYER, 53. RECORDING LAYER, 54. SECOND DIELECTRIC LAYER, 55.
  • REFLECTIVE LAYER 56. PROTECTIVE LAYER, 61. OPTICAL DISK, 62. SPINDLE MOTOR, 63. OPTICAL HEAD, 64. LASER DRIVING CIRCUIT, 65. WAVEFORM CORRECTION CIRCUIT
  • the recording method of the present invention provides the following features in mark length modulation recording.
  • Cooling power radiation for cooling pulse application is started at a predetermined time and performed for a predetermined length of time only when recorded mark length is shorter than a predetermined length.
  • the recording method of the present invention provides the following features in mark spacing modulation recording.
  • the recorded mark can be formed in a desired shape by preventing the shape from becoming substantially asymmetric between the start and end portions of the mark, and good read signal quality can be achieved.
  • the recording method of the present invention also provides the following features in mark length modulation recording.
  • the recording pulse train consists of a start pulse, an end pulse, andintermediate pulses therebetween alternating at intervals of time equal to or shorter than one data clock period
  • the recording pulse train consists of a start pulse, an end pulse, and intermediate pulses therebetween alternating at intervals of time equal to or shorter than one data clock period, and the positions of the start pulse and end pulse change in accordance with mark length and mark spacing
  • K the duration of laser radiation with cooling power is fixed and, regardless of the positions of the start pulse and end pulse of the recording pulse train, the time at which to start the laser radiation withthe cooling power is fixed relative to the end pulse in the recording pulsetrain, or the timing to start the laser radiation with the cooling power isdetermined based on the clock.
  • the recording apparatus of the present invention comprises: a start pulse generating circuit for generating a start pulse of prescribed duration at a start position of a Hi period of data; a burst gate generating circuit for generating a burst gate signal at a middle position of a mark when theHi period of data is long, and for not generating a burst gate signal when the Hi period of data is short; an end pulse generating circuit for generating an end pulse of prescribed duration at an end position of the Hi period of data; a mark/space length detection circuit for generating annT mark signal in such a manner as to contain the start pulse and end pulsewhen the Hi period of data is n clocks long, and for generating an mT spacesignal in such a manner as to contain the end pulse and start pulse at bothends of a space when a Lo period of data is m clocks long (where n and m are natural numbers existing in data train); an encoder for generating a select signal for controlling a start value selector and an end value selector (described
  • a cooling pulse is generated by supplying the delayed end pulse from the end value programmable delay line to the cooling pulse generating circuit
  • a cooling pulse is generated by supplying the end pulse from the end pulse generating circuit to the cooling pulse generating circuit.
  • the recording apparatus offers the same effects asachieved with the recording method described above, and thus provides good cycle characteristics by reducing the total energy required when recordingon the thin recording film and thereby alleviating the problem of signal degradation due to thermal damage caused by repeating the overwrite cycle many times.
  • the recording method of the present invention provides the following features in mark length modulation recording.
  • a recording pulse train for forming a recorded mark is followed by a mark end portion correction pulse train as a cooling pulse which is formedby radiating laser light with at least two different powers including a power lower than the bias power.
  • (O) Laser radiation with the recording pulse train is followed by a mark end portion correction pulse train as a cooling pulse having a period during which the laser power is reduced in continuous manner to a power lower than the bias power.
  • the recorded mark can be formed in a desired shape by preventing the shape from becoming substantially asymmetric between the start and end portions of the mark, and good read signal quality can be achieved.
  • Dielectric layers, a recording layer, and a reflective layer are formed on a transparent substrate 51 by using aconventional thin-film deposition method such as vacuum evaporation or sputtering. That is, the first dielectric layer 52, recording layer 53, second dielectric layer 54, and reflective layer 55 are sequentially formed on the substrate 51. On top of that, a protective layer 56 is formed in intimate contact with the thus layered structure. An optical disk that does not have a reflective layer 55 or a protective layer 56 canalso be used as an optical disk. Laser light for recording and reading is applied from underneath the substrate 51.
  • aconventional thin-film deposition method such as vacuum evaporation or sputtering. That is, the first dielectric layer 52, recording layer 53, second dielectric layer 54, and reflective layer 55 are sequentially formed on the substrate 51.
  • a protective layer 56 is formed in intimate contact with the thus layered structure.
  • An optical disk that does not have a reflective layer 55 or a protective layer 56 canalso be used as an optical disk. Laser
  • the substrate 51 Glass, quartz, polycarbonate, or polymethyl methacrylate can be used as thematerial for the substrate 51. Further, the substrate may be constructed from a flat smooth plate or a plate with a pregrooved surface for trackingguide.
  • a resin dissolved in a solvent is applied and dried on the top surface, or a resin sheet is bonded with an adhesive.
  • chalcogen alloys that exhibit an amorphous/crystalline phase change are well known, for example, alloys based on SbTe, GeSbTe, GeSbTeSe, GeSbTePd, TeGeSnAu, AgSbTe, GeTe, GaSb, InSe, InSb, InSbTe, InSbSe, InSbTeAg, etc. Alloys containing other elements can also be used as long as they do not affect the phase change characteristics or optical characteristics of the above-listed alloys.
  • SiO 2 , SiO, TiO 2 , MgO, Ta 2 O 5 , Al 2 O 3 , GeO 2 , Si 3 N 4 , BN, AlN, SiC, ZnS, ZnSe, ZnTe, PbS, etc. or a mixture of these can be used.
  • a material composed principally of Au, Al, Cu,Cr, Ni, Ti, or other metal element, or a mixture of these elements, or even a dielectric multilayer film having a large reflectivity at a designated wavelength can be used.
  • the disks used in the embodiments hereinafter described were each fabricated using a 130-mm diameter polycarbonate substrate having a signalrecording track, with a ZnS-SiO 2 composite film as the first dielectric layer formed by sputtering on the substrate to a thickness of 1300A.
  • the recording layer composition of the disks used in the first and second embodiments hereinafter described was Ge 22 Sb 24 Te 54
  • the recording layer composition of the disks used in the third to 18th embodiments hereinafter described was Ge 21 Sb 26 Te 53 .
  • the recording layer was formed to a thickness of 250A
  • a ZnS-SiO 2 composite film as the second dielectric layer was formed to a thickness of200A.
  • the reflective layer was formed by sputtering an Al film to a thickness of 1500A.
  • a protective layer of polycarbonate was formed on top of the reflective layer.
  • An optical disk 61 is mounted to a spindle motor 62 for rotation.
  • An optical head 63 uses a semiconductor laser as a light source, and focuses a laser spot on the optical disk through a collimator lens, objective lens, etc.
  • the semiconductor laser is driven by a laser driving circuit 64.
  • the input signal is first waveform-corrected by a waveform correction circuit 65, and then input to the laser driving circuit 64.
  • waveform correction be made as simple as possible, for example, by correcting recording waveforms only for predesignated mark lengths, rather than correcting recording waveforms for all mark lengths.
  • FIG. 4 Specific examples of recording pulse train patterns used in the embodimentsof the invention are shown in FIG. 4.
  • the recording pulse trainsA to D show typical recording pulse train patterns when recording a 6T markby mark length modulation recording.
  • Each of the embodiments hereinafter described shows the results of mark length modulation recording performed by setting the first laser power equal to the recording power, the second power equal to the bias power, and the cooling power or the lowest power in the mark end portion correction pulse train as a cooling pulse equal to the read power.
  • Settingthe first power equal to the recording power, the second power equal to thebias power, and the lowest power equal to the read power in this way is desirable particularly because the waveform correction circuit can be simplified in construction, but the laser powers applicable to the presentinvention are not limited to the above setting.
  • the laser powers can be set in any desired way, provided that the first power is set equal to or larger than the recording power, the second power is set at least lower than the first power, and the lowest power is set lower than either the second power or the bias power.
  • the recording pulse train A consists of a start pulse with the first laser power of 1.5T duration and pulses with the laser power switched alternately between the first power and the second power at intervals of 0.5T, for the formation of a recorded mark.
  • T is one clock period.
  • the recording pulse train B consists of a start pulse with the first laser power of 1.0T duration, pulses with the laser power switched alternately between the first power and the second power at intervals of 0.5T, and an end pulse with the first power of 1.0T duration, for the formation of a recorded mark.
  • the recording pulse train C has the same pulse pattern as the recording pulse train B, except that the positions of the start and end pulses in the recording pulse train vary depending on the mark length to be recordedand the mark spacing before and after the mark.
  • the recording pulse train D consists of pulses with the laser light power switched alternately between the first power and the second power at intervals of 0.5T, for the formation of a recorded mark.
  • the pulse widths in the recording pulse trains (including the start pulse width, the end pulse width, the intermediate pulse width, and in the case of the recording pulse train D, the recording pulse width) applicable to the present invention are not limited to those shown in FIG. 4, but it will be appreciated that the pulse widths can be set in any desired way.
  • FIG. 5 shows specific examples of recording waveform patterns with a cooling pulse added in mark spacing modulation recording in the embodiments of the invention.
  • Input waveform A shows an example of (2, 7) modulation method.
  • the mark duration is 0.5T.
  • the mark spacings are set to 2.0T, 3.5T, and 1.5T.
  • the recording waveform E is for recording the input waveform A.
  • the recording pulse width is 0.25T.
  • the recording waveform F is for recording the input waveform A, with laser radiation at the cooling power level applied immediately after each application of the recording power.
  • the recording pulse width is 0.25T
  • the cooling power radiation time is 0.25T.
  • the recording waveform G is for recording the input waveform A, with laser radiation at the bias power level applied after each application of the recording power, followed by radiation at the cooling power level.
  • the recording pulse width is 0.25T
  • the cooling power radiation time is 0.25T
  • the cooling power start time is 0.25T.
  • FIG. 1 shows specific examples of recording waveform patterns with a cooling pulse added in mark length modulation recording in the embodimentsof the invention.
  • the recording pulse train A of FIG. 4 is used.
  • Input waveform B shows an example of an input waveform of an eight-to-fourteen modulation (EFM) signal.
  • EFM eight-to-fourteen modulation
  • data is modulated by a combination of signals of nine different lengths from 3T to 11T, where T is one clock period.
  • the recording waveform H is for recording the input waveform B, with no cooling pulses added.
  • the recording waveform I is a waveform with cooling pulses added when recording the input waveform B.
  • the cooling pulses are added with the cooling power radiation time fixed to 0.5T and the cooling power start time fixed to 0 regardless of the immediately preceding recorded mark length.
  • the recording waveform J is a waveform with cooling pulses added when recording the input waveform B.
  • the cooling pulses are added with the cooling power radiation time fixed to 0.5T and the cooling power start time fixed to 0.25T regardless of the immediately preceding recorded mark length.
  • This embodiment deals with an example in which laser radiation with bias power was applied between laser radiation with recording power and laser radiation with cooling power when recording by mark spacing modulation.
  • An optical disk was evaluated using the following conditions. Laser light with a 680-nm wavelength was used, and the objective lens of the optical head used for recording and reading in the recording apparatus was chosen to have an NA of 0.55; with these conditions, a (2,7) modulated signal wasrecorded 100 times by one-beam overwrite with clock T so set as to provide the shortest mark pitch of 2.1 ⁇ m, the read signal was differentiated to detect a peak, and the jitter value, sum/Tw (%), of the detected signalwas measured, where ⁇ is the standard deviation of the jitter and Tw is the window width of the detection system. A linear velocity of 6.0 m/s was used.
  • the power where C/N saturates when a single frequency with a mark pitch of 2.1 ⁇ m was recorded was set as the recording power, and power of a center value of the power margin whereerasure ratio exceeds -20 dB when the signal was overwritten with a signal with a mark pitch of 5.6 ⁇ m was set as the bias power.
  • the recording waveforms used in the present embodiment and the jitter values are shown in Table 1 and Table 2, respectively.
  • the recording waveform 1-1 in Table 1 is a waveform when no cooling pulses were added, like the recording waveform E in FIG. 5.
  • the recording waveform 1-2 is a waveform when a cooling pulse was added immediately after each application of laser light at the recording power, like the waveform F in FIG. 5.
  • the cooling power radiation time was 0.25T.
  • the recording waveform 1-3 is a waveform when laser radiation with the bias power was applied after each application of the recording power, followed by radiation with the cooling power, like the waveform G in FIG. 5.
  • the cooling power radiation time was 0.25T, and the cooling power start time was delayed by 0.20T from the end of the recording power radiation.
  • the recording waveform 1-1 has larger jitter than the other recording waveforms.
  • the recording waveform 1-2 shows an improvement in jitter when compared with the recording waveform 1-1, but the improvement is not so good as that achieved with the recording waveform 1-3. That is, the recording waveform 1-3 with the cooling power start time delayed in accordance with the invention achievesa greater improvement in jitter than the other recording waveforms.
  • read power was taken as an example of the cooling power, but it should be noted that similar results were also obtained when the cooling power was set at a level between the bias power and laser off level.
  • This embodiment deals with an example in which the cooling power start timewas varied in accordance with disk radius when recording was made by mark spacing modulation with the optical disk being rotated at a constant angular velocity.
  • the recording waveforms used in the present embodiment and the jitter values are shown in Table 3 and Table 4, respectively.
  • the recording waveform 2-1 in Table 3 is a waveform when no cooling pulses were added, like the recording waveform E in FIG. 5.
  • the recording waveform 2-2 is a waveform when laser radiation with the cooling power wasapplied after laser radiation with the recording power, like the waveform Fin FIG. 5.
  • the cooling power radiation time was 0.30T.
  • the recording waveform 2-3 is a waveform when laser radiation with the bias power was applied after radiation with the recording power, followed by radiation with the cooling power, like the waveform G in FIG. 5.
  • the cooling power radiation time was 0.30T, and the cooling power start time was 0.10T from the end of radiation with the recording power.
  • the recording waveform 2-1 has larger jitter at both the inner and outer radius portions of the disk when compared with the other waveforms.
  • jitter is reduced at the inner radius portion of the disk when compared with the other recording waveforms.
  • the recording waveform 2-3 while jitter is larger at the inner radius portion of the disk when compared with the recording waveform 2-2, jitter is smaller at the outer radius portion of the disk than the jitter in the other waveforms.
  • This embodiment deals with an example in which laser radiation with the bias power was applied between laser radiation with the recording power and laser radiation with the cooling power when recording by mark length modulation.
  • An optical disk was evaluated using the following conditions. Laser light with a 680-nm wavelength was used, and the objective lens of the optical head used for recording and reading in the recording apparatus was chosen to have an NA of 0.55; with these conditions, an 8-14 modulated (EFM) input signal was recorded 100 times by one-beam overwrite with clock T so set as to provide the shortest mark length of 0.90 ⁇ m, and the jitter values, ⁇ sum/Tw (%), at the zero cross points of the read signals of 3T to 11T were measured.
  • ⁇ sum is the standard deviation ofthe sum of the jitters from 3T to 11T
  • Tw is the window width of the detection system.
  • a linear velocity of 4.0 m/s was used.
  • the power where C/N saturates when a single frequency forming a recorded mark length of 0.9 ⁇ m was recorded was set as the recording power, and power of a center value of the power margin where erasure ratio exceeds -20 dB when the signal of the 3T mark was overwritten with a single frequency equivalent to 11T was set as the bias power.
  • the recording waveforms used in the present embodiment and the jitter values are shown in Table 5 and Table 6, respectively.
  • Table 5 shows the cooling power radiation time and cooling power start timefor each of the three recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 3-1 in Table 5 is a waveform when no cooling pulses were added, like the recording waveform H in FIG. 1.
  • the recording waveform 3-2 is a waveform when laser radiation with the cooling power wasapplied immediately following the end of the recording pulse train, like the recording waveform I in FIG. 1.
  • the cooling power radiation time was fixed to 0.5T
  • the cooling power start time was fixed to 0, regardlessof the mark length 3T to 11T.
  • the recording waveform 3-3 is a waveform whenbias power radiation was applied immediately following the end of the recording pulse train, and followed by radiation with the cooling power, like the recording waveform J in FIG. 1.
  • the cooling power radiation time and the cooling power start time were 0.5T and 0.2T, respectively, regardless of the mark length.
  • the recording waveform 3-1 has larger jitter than the other recording waveforms.
  • the recording waveform 3-2 shows an improvement in jitter when compared with the recording waveform 3-1.
  • jitter is reduced as compared to the other waveforms, since thesymmetry at the start and end portions of the mark is better controlled.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which only the cooling power radiation time was varied in accordance with recorded mark length.
  • the respective recording waveforms and jitter values are shown in Table 7 and Table 8, respectively.
  • the measuring conditions were the same as thoseused in the third embodiment.
  • Table 7 shows the cooling power radiation time and cooling power start timefor each of the four recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 4-1 in Table 7 is a waveform when no cooling pulses were added, like the recording waveform H in FIG. 1.
  • the recording waveform 4-2 is a waveform when the cooling power radiation time was fixedto 0.10T regardless of the mark length and the cooling power radiation was started immediately following the end of the recording pulse train, like the waveform I in FIG. 1.
  • the recording waveform 4-3 is a waveform when radiation with the cooling power was applied immediately following the endof the recording pulse train, like the recording waveform I in FIG. 1. However, the cooling power radiation time was set longer than that in the recording waveform 4-2, that is, to 0.50T.
  • the recording waveform4-4 is a waveform when radiation with the cooling power was applied immediately following the end of the recording pulse train, like the recording waveform I in FIG. 1, and when the cooling power radiation time was increased with decreasing mark length.
  • the recording waveform 4-1 has larger jitter than the other recording waveforms.
  • the recording waveforms 4-2 and 4-3 both show an improvement in jitter when compared with the recording waveform 4-1, but the improvement is not so good as that achieved with the recording waveform 4-4.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which the cooling power radiation time was varied in accordance with mark length only when the mark length was shorter than a predetermined length.
  • the respective recording waveforms and jitter values are shown in Table 9 and Table 10, respectively.
  • the measuring conditions were the same as those used in the third embodiment.
  • Table 9 shows the cooling power radiation time and cooling power start timefor each of the three recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 5-1 in Table 9 is a waveform when no cooling pulses were added, like the recording waveform H in FIG. 1.
  • the recording waveform 5-2 is a waveform when radiation with the cooling power was applied immediately following the end of the recording pulse train, like the recording waveform I in FIG. 1, but the cooling power radiation time was varied only when recording short mark lengths of 3T to 6T, the radiation time increasing with decreasing recorded mark length.
  • the recording waveform 5-3 is a waveform when the cooling power radiation time was increased only for the mark length of 3T, and when a cooling pulse was added immediately following the end of the recording pulse train.
  • the recording waveform 5-1 has larger jitter than theother recording waveforms.
  • the recording waveform 5-2 where the cooling power radiation time was increased with decreasing mark length when recording marks of lengths 3T to 6T in accordance with the present invention, an improvement in jitter is apparent when compared with the recording waveform 5-1.
  • jitter is larger than that in the recording waveform 5-2, but an improvement is achieved as compared with the recording waveform 5-1.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which the cooling power radiation time was fixed regardless of mark length and only the cooling power start time was varied in accordance with the mark length to be recorded.
  • the respective recording waveforms and jitter values are shown in Table 11 and Table 12, respectively.
  • the measuring conditions were the same as those used in the third embodiment.
  • Table 11 shows the cooling power radiation time and cooling power start time for each of the four recording waveforms when recording marks of marklengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 6-1 in Table 11 is a waveform when no cooling pulseswere added after the end of the recording pulse train, like the recording waveform H in FIG. 1.
  • the recording waveform 6-2 is a waveform when radiation with the cooling power was applied immediately following the endof the recording pulse train, as in the recording waveform I in FIG. 1.
  • the cooling power radiation time was fixed to 0.50T regardless of the mark length to be recorded.
  • the recording waveform 6-3 is a waveform when radiation with the bias power was applied following the end of the recording pulse train, and followed by radiation with the cooling power, like the recording waveform J in FIG. 1.
  • the cooling power radiationtime was fixed to 0.50T, and the cooling power start time to 0.4T, regardless of the mark length to be recorded.
  • the recording waveform 6-4 is a waveform when the cooling power radiation time was fixedto 0.5T regardless of the mark length, as in the recording waveform 6-3, but when the cooling power start time was advanced with decreasing recorded mark length.
  • the recording waveform 6-1 has larger jitter than theother recording waveforms.
  • the recording waveforms 6-2 and 6-3 both show animprovement in jitter when compared with the recording waveform 6-1.
  • the jitter is further reduced as compared with the other recording waveforms.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which the cooling power radiation time was fixed, but the cooling power start time was varied in accordance with the mark length to be recorded, only when the mark length was shorterthan a predetermined length.
  • the respective recording waveforms and jitter values are shown in Table 13 and Table 14, respectively.
  • the measuring conditions were the same as those used in the third embodiment.
  • Table 13 shows the cooling power radiation time and cooling power start time for each of the three recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 7-1 in Table 13 is a waveform when no cooling pulseswere added, like the recording waveform H in FIG. 1.
  • the recording waveform7-2 is a waveform when radiation with the bias power was applied following the end of the recording pulse train, and followed by radiation with the cooling power, like the recording waveform J in FIG. 1, and when the cooling pulse start time was advanced with decreasing mark length when recording marks of lengths 3T to 6T.
  • the cooling power radiation time was fixed to 0.50T regardless of the mark length.
  • the recording waveform 7-3 is a waveform when a cooling pulse was added immediately following the end of the recording pulse train only when recording a 3T mark, and when the cooling power start time was delayed by a fixed length of time, that is, 0.20T when recording marks of 4T to 11T.
  • the recording waveform 7-1 has larger jitter than theother recording waveforms.
  • the recording waveform 7-2 where the cooling power start time was advanced with decreasing mark length for the recorded mark lengths of 3T to 6T in accordance with the present invention, an improvement in jitter is apparent when compared with the recording waveform 7-1.
  • the recording waveform 7-3 where the cooling pulse start time was advanced only for the recorded mark length of 3T in accordance with the present invention, jitter is larger than that in the recording waveform 7-2, but an improvement is achieved as compared with the recording waveform 7-1.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which a cooling pulse with a fixedcooling power radiation time and a fixed cooling power start time was addedonly when recording a mark not longer than a predetermined length.
  • the respective recording waveforms and jitter values are shown in Table 15 and Table 16, respectively.
  • the measuring conditions were the same as those used in the third embodiment.
  • Table 15 shows the cooling power radiation time and cooling power start time for each of the three recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 8-1 in Table 15 is a waveform when no cooling pulseswere added, like the recording waveform H in FIG. 1.
  • the recording waveform8-2 is a waveform when radiation with the bias power was applied following the end of the recording pulse train, and followed by radiation with the cooling power, like the recording waveform J in FIG. 1, only when the marklength to be recorded was one of 3T to 6T.
  • the cooling power radiation time was set to 0.43T and the cooling power start time to 0.08T to add a cooling pulse.
  • the recording waveform 8-3 is a waveform when a cooling pulse, with the cooling power radiation time fixed to 0.43T and the cooling power start time fixed to 0.08T, was added only when the mark length to be recorded was 3T.
  • the recording waveform 8-1 has larger jitter than theother recording waveforms.
  • the recording waveform 8-2 where a cooling pulse with a fixed pulse duration and fixed pulse start time was added only when recording a mark not longer than a predetermined mark length in accordance with the present invention, an improvement in jitter is apparent when compared with the recording waveform 8-1.
  • the recording waveform 8-3 where a cooling pulse was added only when recording a mark of the shortest mark length in accordance with the present invention, an improvement in jitter is achieved as compared with the recording waveform 8-1, though the improvement is no so good as that achieved with the recording waveform 8-2.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which, when an optical disk was rotated at a constant angular velocity, a cooling pulse was added only when recording a mark not longer than a predetermined mark length at the inner radius portion of the disk.
  • Table 17 shows the cooling power radiation time and cooling power start time for each of the three recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 9-1 in Table 17 is a waveform when no cooling pulseswere added, like the recording waveform H in FIG. 1.
  • the recording waveform9-2 is a waveform when radiation with the bias power was applied following the end of the recording pulse train, and followed by radiation with the cooling power, like the recording waveform J in FIG. 1, only when the marklength to be recorded was one of 3T to 6T.
  • the cooling power radiation time was fixed to 0.43T and the cooling power start time to 0.08T. No cooling pulses were added when recording marks of 7T to 11T.
  • the recording waveform 9-3 is a waveform when no cooling pulses were added except when recording a 3T mark, like the recording waveform H in FIG. 1; the cooling radiation time was set to 0.43T and the cooling power start time to 0.08T only when recording a 3T mark.
  • the recording waveform 9-1 has larger jitter than theother recording waveforms, especially at the inner radius portion of the disk.
  • the recording waveform 9-2 where acooling pulse was added only when recording a short mark
  • an improvement injitter was observed at the inner radius portion of the disk when compared with the recording waveform 9-1.
  • the recording waveform 9-3 also where a cooling pulse was added only when recording a 3T mark
  • an improvement in jitter was observed at the inner radius portion of the diskwhen compared with the recording waveform 9-1.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • This embodiment deals with an example in which, when an optical disk was rotated at a constant angular velocity, the cooling power radiation time and the cooling power start time were varied in accordance with the radiusof the disk.
  • the respective recording waveforms and jitter values are shown in Table 19 and Table 20, respectively.
  • the measuring conditions were the same as those used in the ninth embodiment.
  • Table 19 shows the cooling power radiation time and cooling power start time for each of the three recording waveforms when recording marks of mark lengths 3T to 11T.
  • the recording pulse train A shown in FIG. 4 was used.
  • the recording waveform 10-1 in Table 19 is a waveform when no cooling pulses were added, like the recording waveform H in FIG. 1.
  • the recording waveform 10-2 is a waveform when radiation with the cooling power was applied immediately following the end of the recording pulse train, like the recording waveform I in FIG. 1.
  • the cooling power radiation time was varied in accordance with the mark length to be recorded, the cooling power radiation time being increased with decreasing mark length.
  • the recording waveform 10-3 is a waveform when radiation with bias power was applied following the end of the recording pulse train, and followed by radiation with the cooling power, like the recording waveform J in FIG.1.
  • the cooling power radiation time was set to 0.50T
  • the coolingpower start time was varied in accordance with the mark length to be recorded, the start time being advanced with decreasing mark length.
  • the recordingwaveform 10-1 has larger jitter than the other recording waveforms.
  • the recording waveform 10-2 though an improvement in jitter is achieved at the inner radius portion of the disk when compared with the recording waveform 10-1, the jitter characteristic tends to deteriorate at the outer radius portion.
  • the recording waveform 10-3 also, an improvement in jitter is achieved at the inner radius portion of the disk when compared with the recording waveform10-1, but the jitter characteristic tends to deteriorate at the outer radius portion.
  • recording with small jitter can be achieved at any radius portion of the disk by increasing the cooling power radiation time or advancing the cooling powerstart time with decreasing mark length.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • the recording pulse train A shown in FIG. 4 was used, and various mark end portion correction pulse trains were used, each addedimmediately following the end of the recording pulse train.
  • the measuring conditions were the same as those used in the third embodiment.
  • the various recording waveforms used in the present embodiment will be described with reference to FIG. 6.
  • the waveforms shown in FIG. 6 show typical recording waveform patterns when recording a 6T mark.
  • the recording waveform 11-1 is a waveform when a mark end portion correction pulse train was not added.
  • the recording waveform 11-2 is a waveform when laser light with the read optical power was radiated for a period of 0.5T immediately following the end of the recording pulse train, after which laser radiation with the bias power was applied.
  • the recording waveform 11-3 is a waveform when laser light, with its power reduced to an intermediate level between the bias power and read optical power, was radiated for a period of 0.25T immediately following the end ofthe recording pulse train, the 0.25T period being immediately followed by a0.25T period of laser radiation with the laser power reduced to the read optical power, thus adding a mark end portion correction pulse train, which was then followed by laser radiation with the bias power.
  • the recording waveform 11-4 is a waveform when laser light was radiated with a power 2 mW higher than the bias power for a period of 0.15T immediately following the end of the recording pulse train, the 0.15T period being immediately followed by a 0.35T period of laser radiation with the read optical power, thus adding a mark end portion correction pulse train, which was then followed by laser radiation with the bias power.
  • the recording waveform 11-5 is a waveform when laser light with the read optical power was radiated for a period of 0.2T immediately following the end of the recording pulse train, the 0.2T period being immediately followed by a 0.1T period of bias power radiation and then by a 0.2T period of laser radiation with the read optical power, thus adding a mark end portion correction pulse train, which was then followed by laser radiation with the bias power.
  • the recording waveform 11-6 is a waveform when laser power was reduced continuously from the bias power to the read optical power over a period of 0.2T immediately following the end of the recording pulse train, and then the laser light was retained at the read optical power for a period of 0.3T, thus adding a mark end portion correction pulse train, which was then followed by laser radiation with the bias power.
  • the recording waveform 11-7 is a waveform when laser power was reduced continuously from the bias power to the read optical power over a period of 0.25T immediately following the end of the recording pulse train, and then the laser light was continuously raised from the read optical power to the bias power, thus adding a mark end portion correction pulse train, which was then followed by laser radiation with the bias power.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps.
  • the present embodiment has shown an example where the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the second power in the recording pulse train was set equal to the bias power, but it should be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A shown in FIG. 4 was used.
  • the measuring conditions were the same as those used in the 11th embodiment.
  • the recording waveforms used in this embodiment will be described with reference to FIG. 7.
  • the waveforms in FIG. 7 show typical recording waveform patterns when recording a 6T mark.
  • the recording waveform 12-1 is the same as the recording waveform 11-3 in the 11th embodiment.
  • the recording waveform 12-2 is a waveform when laser radiation with the bias power was applied between the recording pulse train and mark end portion correction pulse train in accordance with the present invention; that is, laser light with the bias power was radiated for a period of 0.2T following the end of the recording pulse train, then the power was reduced to an intermediate level between the bias power and read power, at which level the laser light was radiated for a period of 0.25T, immediately followed by a 0.25T period of laser radiation with the laser power reduced to the read power, after which laser light with the bias power was radiated.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps, or if the laser power is continuously reduced below the bias power immediately following the end of the recording pulse train, during the application of the mark end portion correction pulse train.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of the recordingpulse trains B, C, and D shown in FIG. 4.
  • the present embodiment has shown an example where the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the second power in the recording pulse train was set equal to the bias power, but it should be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording waveforms used in this embodiment will be described with reference to FIG. 8.
  • the waveforms in FIG. 8 show typical recording waveform patterns when recording a 6T mark.
  • the measuring conditions were the same as those used in the 11th embodiment.
  • the recording pulse train in the recording waveforms 13-1, 13-2, and 13-3 is the recording pulse train B shown in FIG. 4.
  • the recording waveform 13-1 is a waveform when a mark end portion correction pulse train was not added.
  • the recording waveform 13-2 is a waveform when laser light with the read optical power was radiated for a period of 0.5T immediately following the end of the recording pulse train, after which laser light with the bias power was radiated.
  • the recording waveform 13-3 is a waveform when laser light, with its power reduced to an intermediate level between the bias level and read optical power, was radiated for a period of 0.25T immediately following the end ofthe recording pulse train, the 0.25T period being immediately followed by a0.25T period of laser radiation with the laser power reduced to the read optical power, thus adding a mark end portion correction pulse train, after which after which laser light with the bias power was radiated.
  • the recording pulse train in the recording waveforms 13-4, 13-5, and 13-6 is the recording pulse train C shown in FIG. 4.
  • the recording waveform 13-4 is a waveform when a mark end portion correction pulse train was not added.
  • the recording waveform 13-5 is a waveform when laser light with the read optical power was radiated for a period of 0.5T immediately following the end of the recording pulse train, after which laser light with the bias power was radiated.
  • the recording waveform 13-6 is a waveform when the same mark end portion correction pulse train as in the recording waveform 13-3 was added immediately following the end of the recording pulse train, after which laser light with the bias power was radiated.
  • the recording pulse train in the recording waveforms 13-7, 13-8, and 13-9 is the recording pulse train D shown in FIG. 4.
  • the recording waveform 13-7 is a waveform when a mark end portion correction pulse train was not added.
  • the recording waveform 13-8 is a waveform when laser light with the read optical power was radiated for a period of 0.5T immediately following the end of the recording pulse train, after which laser light with the bias power was radiated.
  • the recording waveform 13-9 is a waveform when the same mark end portion correction pulse train as in the recording waveform 13-3 was added immediately following the end of the recording pulse train, after which laser light with the bias power was radiated.
  • the jitter is reduced compared with the recording waveform 13-2.
  • the recording pulse train B of FIG. 4 by adding the mark end portion correction pulse train an improvementin jitter can be achieved because of improved symmetry between the start and end portions of the recorded mark.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps, or if the laser power is continuously reduced below the bias power immediately following the end of the recording pulse train, during the application of the mark end portion correction pulse train.
  • the present embodiment has shown an example where the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the second power in the recording pulse train was set equal to the bias power, but it should be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording waveform 14-1 is a waveform when laser light with its power reduced to an intermediate level between the bias level and read optical power was radiated for a period of 0.25T, regardless of recorded mark length, immediately following the end of the recording pulse train, the 0.25T period being immediately followed by a 0.25T period of laser radiation with the power reduced to the read optical power, after which laser light with the bias power was radiated.
  • the recording waveform 14-2 is a waveform when the same mark end portion correction pulse train as in the recording waveform 14-1 was added, exceptthat the time at which to start the application of the mark end portion correction pulse train was set to 0.8T when recording an 11T mark, the start time being advanced in increments of 0.1T as the mark length decreased, the mark end portion correction pulse train being added immediately following the end of the recording pulse train when recording a 3T mark, after which laser light with the bias power was radiated.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps, or if the laser power is continuously reduced below the bias power immediately following the end of the recording pulse train, during the application of the mark end portion correction pulse train.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • the recording pulse train (the recording pulse train A shown in FIG. 4) was used. Also, the same measuring conditions were the same as those used in the 11th embodiment.
  • the various recording waveforms used in the present embodiment will be described with reference to FIG. 9.
  • the recording waveform 15-1 in FIG. 9 shows a typical recording waveform pattern when recording a 6T mark.
  • the recording waveform 15-2 are shown recording waveform patterns only for3T, 4T, 5T, 10T, and 11T out of the mark lengths 3T to 11T.
  • the recording waveform 15-1 is the same as the recording waveform 11-3 in the 11th embodiments.
  • the recording waveform 15-2 is a waveform when the power to be applied immediately after the end of the recording pulse train was varied in such a manner as to decrease with decreasing recorded mark length. More specifically, the power was set equal to the read optical power when recording a 3T mark, and then set higher than the read optical power by one-eighth of the difference between the bias power and the read optical power when recording a 4T mark, the power thus being increased incrementally with increasing mark length, and the power thus set was applied for a period of 0.25T, followed immediately by a 0.25T period of laser radiation with the power reduced to the read optical power, thus adding a mark end portion correction pulse train, after which laser light with the bias power was radiated.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps, or if the laser power is continuously reduced below the bias power immediately following the end of the recording pulse train, during the application of the mark end portion correction pulse train.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • the rotational speed of the disk was set to 1000 rpm, and an EFM signal wasrecorded while varying clock T in accordance with disk radius in such a manner as to maintain the shortest mark length constantly at 0.90 ⁇ m.
  • the same recording pulse train as used in the 11th embodiment (the recording pulse train A in FIG. 4) was used.
  • the recording waveform 16-1 is a waveform when a mark end portion correction pulse train was not added.
  • the recording waveform 16-2 is the same as the recording waveform 11-3 in the 11th embodiment.
  • the recording waveform 16-3 is a waveform when the same mark end portion correction pulse train as in the recording waveform 11-3 was added, but the time at which to start the application of the mark end portion correction pulse train was advanced as the disk radius portion moved inwards in accordance with the present invention. More specifically, for 23 to 34 mm radius, the mark end portion correction pulse train was added immediately following the end of the recording pulse train; for 35 to 46 mm radius, the start time of the mark end portion correction pulse train was delayed by 0.2T; and for 47 to 57 mm radius, the start time of the mark end portion correction pulse train was delayed by 0.5T.
  • the respective recording waveforms and the jitter values after 100 overwrites are shown in Table 28.
  • the measurements were made at radius 26 mm for the inner radius portion, 38 mm for the intermediate radius portion, and 50 mm for the outer radius portion.
  • the linear velocities at the respective radius positions were approximately 2.7, 4.0, and 5.2 m/s.
  • the other measuring conditions were the same as those used in the 11th embodiment.
  • the recording waveform 16-1 has large jitter because of heat accumulation, but when the mark end portion correction pulse trainwas added, as in the recording waveform 16-2, the jitter value after 100 overwrites improves across the radius of the disk because of the elimination of heat accumulation.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps, or if the laser power is continuously reduced below the bias power immediately following the end of the recording pulse train, during the application of the mark end portion correction pulse train.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B. C, and D shown in FIG. 4.
  • the same recording pulse train as used in the 11th embodiment (the recording pulse train A in FIG. 4) was used.
  • the measuring conditions were the same as those used in the 16th embodiment.
  • the recording waveforms used in the present embodiment will be described with reference to FIG. 10. Shown in FIG. 10 are typical recording pulse train patterns when recording a 6T mark.
  • the recording waveform 17-2 showsrecording waveform patterns for the inner, intermediate, and outer radius portions of the disk.
  • the shape of the mark end portion correction pulse train remains the same regardless of the radius position on the disk, and the recording waveform itself is the same as therecording waveform 11-3 in the 11th embodiment.
  • the recording waveform 17-2 is a waveform when the power for adding the mark end portion correction pulse train immediately following the end of the recording pulse train was reduced as the disk radius portion moved inwards. More specifically, the power to be applied immediately following the end of the recording pulse train was set 1 mW higher than the read optical power for 23 to 24 mm radius, was set to an intermediate level between the bias power and the read optical power for 35 to 46 mm radius, and was set 1 mW lower than the bias power for 47 to 57 mm radius; the power thus set was applied for a period of 0.25T, followed immediately by a 0.25T period of laser radiation with the power reduced to the read optical power, thus adding a mark end portion correction pulse train, after which laser light with the bias power was radiated.
  • laser power was varied in two steps to add the mark end portion correction pulse train, but it will be appreciated that similar results can also be obtained if the power is varied in three or more steps, or if the laser power is continuously reduced below the bias power immediately following the end of the recording pulse train, during the application of the mark end portion correction pulse train.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recording pulse train A in FIG. 4 was used as the recording pulse train, but it should be noted that similar results were also obtained in the case of therecording pulse trains B, C, and D shown in FIG. 4.
  • data 1 is PWM data (FIG. 12a) having a Hi period and Loperiod, each having a length equal to integral multiples of clock period and not smaller than two clock periods.
  • the Hi period of the data corresponds to a mark and the Lo period corresponds to a space when recorded on the disk.
  • the duration of the start pulse 3 and end pulse 7 is set equal to one clockperiod, and the duration of one burst pulse 27 is set equal to one-half of the clock period.
  • the cooling pulse duration is set equal to one-half of the clock period, and the time from the end pulse in the recording pulse train to the start of the laser radiation with the cooling power is also set equal to one-half of the clock period.
  • a mark/space length detection circuit 8 detects a space length that causes heat interference between marks in high-density recording and a mark/spacelength that causes a peak shift due to the frequency characteristics of theread system.
  • the shortest mark length 2T and shortest space length 2T contained in a data train to be recorded will be detected.
  • a start pulse generating circuit 2 generates a start pulse 3 of duration of one clock period at the start of the Hi period of data 1 (FIG.12b).
  • a burst gate generating circuit 4 generates a burst gate signal 5, at the center of the mark, with a duration equal to the mark length minus three clock periods. When the mark length is equal to or shorter than three clock periods, the burst gate signal will not be generated (FIG. 12c).
  • An end pulse generating circuit 6 generates an end pulse 7 of duration of one clock period at the end of the Hi period of data 1 (FIG. 12e).
  • the mark/space length detection circuit 8 detects data of two-clock width, that is, a 2T mark and a 2T space, and when a 2T mark arrives, generates a2T mark signal 9 of two-clock width in such a manner as to contain the start pulse and end pulse of the 2T mark (FIG. 12f), and when a 2T space arrives, generates a 2T space signal 10 of four-clock width in such a manner as to contain the end pulse and start pulse at both ends of the 2T space (FIG. 12g).
  • An encoder 11 determines the attribute of the start pulse 3 and end pulse 7from the 2T mark signal 9 and 2T space signal 10, and outputs it as a select signal 12. More specifically, the select signal 12 classifies the mark/space into four attributes, that is, a mark of 3T or longer with a space of 3T or longer as normal, a mark of 3T or longer with a space of 2Tas 2Ts, a mark of 2T with a space of 3T or longer as 2Tm, and a mark of 2T with a space of 2T as 2Ts-2Tm (FIG. 12h).
  • a start value selector 14 selects one value from among a plurality of start set values 13, that is, a start set value for normal, a start set value for 2Ts, a start set value for 2Tm, and a start set value for 2Ts-2Tm, and outputs the selected value as a selected start set value 15.
  • a start value sample-and-hold circuit 16 updates the value only when the start pulse 3 arrives, and holds the value until the next start pulse 3 arrives. The value thus held is output as a held start set value 39 (FIG. 12i).
  • the start pulse 3 is then delayed through a start value programmable delay line 17 by an amount of time based on the held start set value 39, and is output as a delayed start pulse 18 (FIG. 12j).
  • an end value selector 20 selects one value from among a plurality of end set values 19 on the basis of the select signal 12, and outputs the selected value as a selected end set value 21.
  • An end value sample-and-hold circuit 22 updates the value only when the end pulse 7 arrives, and holds the value until the next end pulse 7 arrives. The valuethus held is output as a held end set value 45 (FIG. 12k).
  • the end pulse 7 is then delayed through an end value programmable delay line 23 by an amount of time based on the held end set value 45, and is output as a delayed end pulse 24 (FIG. 12l).
  • a cooling pulse generating circuit 36 generates a cooling pulse with a duration of one-half of the clock period at the rising edge of the delayedend pulse (FIG. 12n).
  • the cooling pulse 41 output from the cooling pulse generating circuit36 is delayed through a cooling pulse delay line 37 by a predetermined amount, and a cooling pulse signal 42 is output (FIG. 12o).
  • This signal is passed through an inverter 38, and output as a delayed cooling pulse signal 43 with Hi and Lo inverted (FIG. 12p).
  • burst gate signal 5 and clock 25 are ANDed by an AND gate 26, to generate a burst pulse 27 (FIG. 12m).
  • the delayed start pulse 18, the burst pulse 27, and the delayed end pulse 24 are ORed by an OR gate 28, to generate a recording signal 29.
  • a laser diode 35 is supplied with a bias from a read beam current source 32and thus emits light of read optical power for a phase-change optical disk.
  • a bias level current source 31 and a recording level current source 30 are provided in parallel with the read beam current source 32.
  • the drive current to the laser diode 35 can be switched between the three levels, i.e., the recording level current, bias level current, and read optical level current.
  • the laser diode 35 can be driven to emit light with its power switched between the recording power, bias power, and cooling power.
  • an optical head containing the laser diode 35 a mark and space with a cooling pulse addedthereto is recorded on the phase-change optical disk (FIG. 12q).
  • the cooling pulse 41 is output from the cooling pulse generating circuit 36 in synchronism with the rising of the end pulse output from the end pulse generating circuit 6 (FIG. 14f).
  • the cooling pulse delay line 37 outputs a cooling pulse delayed by a predetermined amount (FIG. 14o).
  • the disk recording apparatus of the present embodiment can record marks and spaces corresponding to the data by adding laser radiation with the cooling power and by changing the startand end positions of the mark in accordance with the mark length to be recorded and with the space lengths before and after that mark length.
  • the present embodiment has assumed the use of a (1-7) RLL code recording signal, and the mark/space length detection circuit has been described as detecting the minimum transition spacing, 2T mark and 2T space, based on which the mark/space has been classified into four patterns using combinations of marks and spaces of 2T and longer.
  • the edge position accuracy of each mark can be enhanced.
  • start and end pulses have each been specified as 1T duration, and the burst pulse as 0.5T duration.
  • the cooling pulse duration has been fixed to a predetermined value of0.5T, but total energy can be further reduced by varying the duration in accordance with mark length or mark spacing.
  • An optical disk was evaluated using the following conditions. Laser light with a 680-nm wavelength was used, and the objective lens of the optical head used for recording and read in the recording apparatus was chosen to have an NA of 0.55; with these conditions, a (1-7) RLL signal was recordedwith clock T so set as to provide the shortest mark length of 0.60 ⁇ m, and the jitter values, ⁇ sum/Tw (%), at the zero cross points of theread signals of 2T to 8T were measured.
  • ⁇ sum is the standard deviation of the sum of the jitters from 2T to 8T
  • Tw is the window width of the detection system.
  • a linear velocity of 4.0 m/s was used.
  • the power where C/N saturates when a single frequency forming a recorded mark length of 0.6 ⁇ m was recorded was set as the recording power, and power of a center value of the power margin where erasure ratio exceeds -20 dB when the signal of the 2T mark was overwritten with a single frequency equivalent to 7T was set as the bias power.
  • the cycle characteristic of the disk was evaluated based on the number of cycles that satisfied the condition dictating that the jitter values, ⁇ sum/Tw (%), at the zero cross points of the read signals from 2T to 8T be less than 13%.
  • the recording waveforms used in the present embodiment will be described with reference to FIG. 15.
  • the waveforms in FIG. 15 show typical recordingwaveform patterns when recording a 7T mark.
  • the recording pulse train B shown in FIG. 4 was used in the recording waveforms 18-1 to 18-3, and the recording pulse train C shown in FIG. 4 was used in the recording waveforms 18-4 to 18-7.
  • the recording waveform 18-1 is a recording pulse train which consists of a start pulse of 1.0T duration, an end pulse of 1.0T duration, and intermediate pulses formed by alternating the laser power between the second power and the first power at intervals of 0.5T, and which does not accompany a cooling pulse.
  • the recording waveform 18-2 is fundamentally the same as the recording waveform 18-1, except that a cooling pulse was applied with a cooling power of 0.5T duration immediately following the end pulse in the recording pulse train, regardless of the mark length to be recorded.
  • the recording waveform 18-3 is fundamentally the same as the recording waveform 18-1, except that a cooling pulse was applied with a cooling power of 0.5T duration, the time from the falling of the end pulse in the recording pulse train to the start of the laser radiation of the cooling power being fixed to 0.5T, regardless of the mark length to be recorded.
  • the recording waveform 18-4 is fundamentally the same as the recording waveform 18-1, except that the start and end pulse positions of the recording pulse train were changed in accordance with the mark length to be recorded and with the mark spacings before and after the mark. No cooling pulses were added.
  • the recording waveform 18-5 is fundamentally the same as the recording waveform 18-4, except that a cooling pulse was applied with a cooling power of 0.5T duration immediately following the end pulse of the recording pulse train, regardless of the mark length to be recorded.
  • the recording waveform 18-6 is fundamentally the same as the recording waveform 18-4, except that a cooling pulse was applied with a cooling power of 0.5T duration, the time from the rising of the end pulse in the recording pulse train to the start of the laser radiation with the coolingpower being fixed to 1.5T, regardless of the mark length to be recorded.
  • the recording waveform 18-7 is fundamentally the same as the recording waveform 18-4, except that a cooling pulse was applied with a cooling power of 0.5T duration, the application of the cooling power being delayedby a fixed period of 2.5T from the rising of the end pulse in a sub pulse train (consisting of pulses between the start and end pulses), regardless of the mark length to be recorded. That is, the cooling pulse radiation start time was determined based on the clock.
  • the number of cycles that satisfies the jitter ⁇ 13% is improved because of reduced thermal damage when compared with the recording waveform 18-1 where no cooling pulses were added.
  • the number of cycles that satisfies the jitter ⁇ 13% is improved because of reduced thermal damage when compared with the recording waveform 18-4 where no cooling pulses were added.
  • the read optical power was used as the cooling power, but it should be noted that similar results were also obtained when the cooling power was set larger than 0 but smaller than the bias power.
  • the present embodiment has shown an example where the second power in the recording pulse train was set equal to the bias power, but itshould be noted that similar results were also obtained when the second power was set equal to or larger than 0 but smaller than the recording power.
  • the recorded mark can be formed in the desired shape, and an improvement in read signal quality can be achieved not only in the case of an increased density optical disk but also when the disk rotation method is constant angular velocity. Furthermore, good cycle characteristics can be achieved by reducing signal degradation due to thermal damage when overwrite cycles are repeated many times.

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Optical Head (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Manufacturing Optical Record Carriers (AREA)
US08/725,944 1995-10-09 1996-10-08 Optical information recording method and apparatus Expired - Lifetime US5745467A (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP26124695 1995-10-09
JP26126295 1995-10-09
JP19588096 1996-07-25
JP7-261246 1996-07-25
JP8-195880 1996-07-25
JP7-261262 1996-07-25

Publications (1)

Publication Number Publication Date
US5745467A true US5745467A (en) 1998-04-28

Family

ID=27327159

Family Applications (1)

Application Number Title Priority Date Filing Date
US08/725,944 Expired - Lifetime US5745467A (en) 1995-10-09 1996-10-08 Optical information recording method and apparatus

Country Status (11)

Country Link
US (1) US5745467A (fr)
EP (5) EP1020850B1 (fr)
JP (2) JP4145958B2 (fr)
KR (1) KR100456957B1 (fr)
CN (3) CN1146869C (fr)
DE (5) DE69612833T2 (fr)
HK (1) HK1005275A1 (fr)
MX (1) MX9704098A (fr)
MY (1) MY113691A (fr)
TW (1) TW359812B (fr)
WO (1) WO1997014143A1 (fr)

Cited By (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6018508A (en) * 1996-09-27 2000-01-25 Kabushiki Kaisha Toshiba Intensity of a light beam changed according to the length of a mark
US6205102B1 (en) * 1996-02-16 2001-03-20 U.S. Philips Corporation Method and device for recording an optical information carrier
US20020051415A1 (en) * 2000-10-26 2002-05-02 Matsushita Electric Industrial Co., Ltd. Recording waveform generator and disk recording device
SG93212A1 (en) * 1998-07-23 2002-12-17 Samsung Electronics Co Ltd Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20030058771A1 (en) * 2000-10-05 2003-03-27 Shigeaki Furukawa Optical recording medium, method for recording on optical record medium, and apparatus for recording on optical record medium
US20030081523A1 (en) * 2001-10-02 2003-05-01 Matsushita Electric Industrial Co., Ltd. Optical information recording method, optical information recording and reproducing device, and optical information recording medium
US6574178B2 (en) * 2000-05-11 2003-06-03 Koninklijke Electronics N.V. Methods and devices for recording marks on a recording surface of an optical record carrier
SG97882A1 (en) * 1999-04-13 2003-08-20 Hitachi Ltd Method of and apparatus for recording information
US6614739B1 (en) * 1999-08-31 2003-09-02 Sony Corporation Recording apparatus and recording method
US20030193867A1 (en) * 1996-12-20 2003-10-16 Matsushita Electric Industrial Co., Ltd. Optical recording method and optical recording device
US20030202452A1 (en) * 2002-04-26 2003-10-30 Tdk Corporation Optical recording medium and method for optically recording data in the same
US20030214892A1 (en) * 2002-05-20 2003-11-20 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US20040027973A1 (en) * 2002-08-12 2004-02-12 Tdk Corporation Optical recording medium and method for optically recording data in the same
US20040052177A1 (en) * 2002-09-04 2004-03-18 Hiroshi Maegawa Optical information recording method, apparatus, and medium, laser control circuit, wobble signal detection method, and servo signal detection method
US6714230B2 (en) * 2001-02-14 2004-03-30 Ricoh Company, Ltd. Method for optically recording information on an optically re-writable information medium
US6714503B1 (en) * 1998-04-03 2004-03-30 Samsung Electronics Co., Ltd. Adaptive recording method and apparatus for high-density optical recording apparatus
US20040156292A1 (en) * 1997-12-30 2004-08-12 Samsung Electronics Co., Ltd Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20040190431A1 (en) * 2003-01-23 2004-09-30 Samsung Electronics Co., Ltd. Optical recording medium, method and apparatus for recording data thereon
US20040251945A1 (en) * 2003-06-16 2004-12-16 Kang Sang Hee Shared delay circuit of a semiconductor device
US20050036423A1 (en) * 2003-07-18 2005-02-17 Sony Corporation Information recording device and information recording method
US20050074701A1 (en) * 2002-04-09 2005-04-07 Matsushita Electric Industrial Co., Ltd. Method for manufacturing optical disk master and method for manufacturing optical disk
US20050105437A1 (en) * 2002-03-15 2005-05-19 Akira Shimofuku Recording apparatus and recording method
US20050213467A1 (en) * 2002-12-17 2005-09-29 Yoshihiro Noda Optical recording medium, and recording/reading method and recording/reading apparatus for optical recording medium
US20050243680A1 (en) * 1998-08-04 2005-11-03 Takeshi Maeda Information recording method, information recording medium and information recording apparatus
US20060013111A1 (en) * 2002-11-19 2006-01-19 Tdk Corporation Method for recording data onto optical recording medium, data recording device, and optical recording medium
US20060039261A1 (en) * 2002-09-09 2006-02-23 Tdk Corporation Method for recording data on optical recording medium, device for recording data on optical recording medium, and optical recording medium
SG119163A1 (en) * 2002-05-20 2006-02-28 Samsung Electronics Co Ltd Optical recording medium on which power information of erase pattern is recorded
US20060126467A1 (en) * 1999-09-18 2006-06-15 Jin-Tae Roh Optimal recording apparatus and method for determining an optical recording condition
US20060140094A1 (en) * 2003-02-19 2006-06-29 Hiroshi Tabata Optical recording method, optical recording medium, optical recording medium recording device, optical recording device, optical disk, optica disk recording/reproducing device
US7079466B1 (en) 1999-03-30 2006-07-18 Koninklijke Philips Electronics N.V. Method and device for recording marks in an information layer of an optical record carrier
US20060203677A1 (en) * 1997-12-30 2006-09-14 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20070133369A1 (en) * 2003-10-27 2007-06-14 Kunihiko Horikawa Information recording device and information recording method
US20070286047A1 (en) * 2006-06-12 2007-12-13 Hiroyuki Minemura Information Recording Method of Optical Disc, Laser Driving Apparatus and Optical Disc Apparatus
US20080137504A1 (en) * 2004-10-19 2008-06-12 Koninklijke Philips Electronics, N.V. Method Of Writing Data On A Master Substrate For Optical Recording
US20080212453A1 (en) * 2006-12-15 2008-09-04 Taiyo Yuden Co., Ltd. Optical information recording device, optical information recording method, and optical information recording medium
US20080316885A1 (en) * 2002-05-20 2008-12-25 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording meidum based on the erase pattern information, and optical recording medium therefor
US20090073835A1 (en) * 2006-04-28 2009-03-19 Sharp Kabushiki Kaisha Recording Parameter Setting Device, Program Thereof, Computer-Readable Recording Medium Containing the Program, Information Recording Medium, Recording/Reproducing Device, and Recording Parameter Setting Method
US20090097368A1 (en) * 2006-03-13 2009-04-16 Koninklijke Philips Electronics N. V. Real time power control for optical recording drives
US20090251524A1 (en) * 2004-12-22 2009-10-08 Koninklijke Philips Electronics, N.V. Pulsed laser mode for writing labels
US20110128837A1 (en) * 1999-07-15 2011-06-02 Koninklijke Philips Electronics N.V. Methods and devices for recording marks in an information layer of an optical record carrier, and record carriers for use therein
US20170244583A1 (en) * 2007-03-01 2017-08-24 Lightfleet Corporation Time domain symbol transmitter

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6243339B1 (en) * 1997-08-12 2001-06-05 U.S. Philips Corporation Method and device for writing optical record carriers
TW468177B (en) * 1998-08-04 2001-12-11 Hitachi Ltd Data storage method, data storage medium and data storage recording device
JP3076033B1 (ja) 1998-09-14 2000-08-14 松下電器産業株式会社 光学情報の記録再生装置および情報記録媒体
WO2000057408A1 (fr) 1999-03-19 2000-09-28 Matsushita Electric Industrial Co., Ltd. Procede d'enregistrement optique d'informations et dispositif a cet effet
EP1662493B1 (fr) 1999-05-19 2010-07-14 Mitsubishi Kagaku Media Co., Ltd. Enregistrement à vitesse angulaire constante
AU4783500A (en) * 1999-05-31 2000-12-18 Matsushita Electric Industrial Co., Ltd. Optical information recording method, optical information recording device and optical information recording medium
JP4267852B2 (ja) * 1999-07-15 2009-05-27 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 光学的記録担体の情報層にマークを記録するための方法及び装置、並びにそこでの使用に対する記録担体
US6654325B1 (en) 1999-08-09 2003-11-25 Hitachi, Ltd. Trial writing method and optical disk system using the same
WO2002011132A1 (fr) * 2000-07-28 2002-02-07 Matsushita Electric Industrial Co., Ltd. Dispositif a disque optique et procede de determination de puissance d'enregistrement
JP3793437B2 (ja) * 2000-10-10 2006-07-05 Ｔｄｋ株式会社 光記録方法および光記録媒体
JP4405115B2 (ja) * 2001-09-03 2010-01-27 パイオニア株式会社 情報記録装置および情報記録方法
TWI261236B (en) * 2001-09-29 2006-09-01 Samsung Electronics Co Ltd Method for forming first state and second state on optical recording medium
JP2003208713A (ja) * 2002-01-16 2003-07-25 Tdk Corp 光記録媒体への情報記録方法、光記録媒体及び情報記録／再生装置
EP2278349A3 (fr) * 2002-04-03 2011-10-12 Panasonic Corporation Dispositif d'information optique, support de stockage optique, dispositif d'inspection de support de stockage optique, et procédé d'inspection de stockage optique
WO2004013846A1 (fr) * 2002-07-26 2004-02-12 Koninklijke Philips Electronics N.V. Procede et dispositif d'enregistrement optique et support d'enregistrement optique
US7529168B2 (en) 2002-11-21 2009-05-05 Panasonic Corporation Recording/reproduction method and recording/reproduction apparatus
KR20040067778A (ko) * 2003-01-23 2004-07-30 삼성전자주식회사 광 기록 매체, 이에 데이터를 기록하는 방법 및 그 장치
CN101599277B (zh) * 2004-01-09 2011-05-04 松下电器产业株式会社 光记录方法、光盘介质及再现方法
CN100356455C (zh) * 2004-09-08 2007-12-19 上海乐金广电电子有限公司 相变型光盘信息记录的方法
CN101427308B (zh) * 2006-04-28 2011-02-16 夏普株式会社 记录参数设定装置、记录参数设定程序、记录有该程序的计算机可读取的记录介质、信息记录介质、记录重放装置和记录参数设定方法
KR102544036B1 (ko) 2021-09-01 2023-06-21 대한전열공업(주) 브레이징 접합을 통한 중계기용 냉각장치의 제조방법
KR102448582B1 (ko) 2021-10-14 2022-09-29 대한전열공업(주) 중계기용 유로형성 링의 조립장치

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63113938A (ja) * 1986-10-31 1988-05-18 Matsushita Electric Ind Co Ltd 情報の光学的記録方法
JPH03185628A (ja) * 1989-12-13 1991-08-13 Matsushita Electric Ind Co Ltd 光学情報の記録方法および記録装置
US5257256A (en) * 1987-04-24 1993-10-26 Hitachi, Ltd. Recording waveform for mark-length modulation optical recording
JPH06295440A (ja) * 1993-04-07 1994-10-21 Matsushita Electric Ind Co Ltd ディスク記録方法およびディスク記録装置
US5396480A (en) * 1992-11-24 1995-03-07 Kabushiki Kaisha Toshiba Method and apparatus for recording information using an energy beam of power levels changed stepwise
JPH07129959A (ja) * 1993-11-09 1995-05-19 Matsushita Electric Ind Co Ltd ディスク記録方法およびディスク記録装置
US5430696A (en) * 1991-01-24 1995-07-04 Ricoh Company, Ltd. Magneto-optical recording medium
US5490126A (en) * 1993-04-07 1996-02-06 Matsushita Electric Industrial Co., Ltd. Apparatus for recording and reproducing data on a disk
US5581535A (en) * 1992-10-28 1996-12-03 Nikon Corporation Prepulse conditon/heat shut off condition determination method and apparatus for optical recording, and optical recording method and apparatus
US5608710A (en) * 1994-01-31 1997-03-04 Hitachi, Ltd. Phase changing recording medium with amorphous points each formed by a pair of high power and low recording pulses

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2574379B2 (ja) * 1988-03-31 1997-01-22 松下電器産業株式会社 光学的情報記録消去方法
JPH05120685A (ja) * 1991-10-25 1993-05-18 Olympus Optical Co Ltd 光学式情報記録方法及びその装置
EP0594425A3 (en) * 1992-10-21 1996-10-09 Nippon Kogaku Kk Pulse train condition/heat shut off condition determination method and apparatus for optical recording, and optical recording method and apparatus
JPH0969246A (ja) * 1995-08-30 1997-03-11 Canon Inc 光学的情報記録再生装置

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63113938A (ja) * 1986-10-31 1988-05-18 Matsushita Electric Ind Co Ltd 情報の光学的記録方法
US5257256A (en) * 1987-04-24 1993-10-26 Hitachi, Ltd. Recording waveform for mark-length modulation optical recording
JPH03185628A (ja) * 1989-12-13 1991-08-13 Matsushita Electric Ind Co Ltd 光学情報の記録方法および記録装置
US5430696A (en) * 1991-01-24 1995-07-04 Ricoh Company, Ltd. Magneto-optical recording medium
US5581535A (en) * 1992-10-28 1996-12-03 Nikon Corporation Prepulse conditon/heat shut off condition determination method and apparatus for optical recording, and optical recording method and apparatus
US5396480A (en) * 1992-11-24 1995-03-07 Kabushiki Kaisha Toshiba Method and apparatus for recording information using an energy beam of power levels changed stepwise
JPH06295440A (ja) * 1993-04-07 1994-10-21 Matsushita Electric Ind Co Ltd ディスク記録方法およびディスク記録装置
US5490126A (en) * 1993-04-07 1996-02-06 Matsushita Electric Industrial Co., Ltd. Apparatus for recording and reproducing data on a disk
JPH07129959A (ja) * 1993-11-09 1995-05-19 Matsushita Electric Ind Co Ltd ディスク記録方法およびディスク記録装置
US5608710A (en) * 1994-01-31 1997-03-04 Hitachi, Ltd. Phase changing recording medium with amorphous points each formed by a pair of high power and low recording pulses

Cited By (134)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6205102B1 (en) * 1996-02-16 2001-03-20 U.S. Philips Corporation Method and device for recording an optical information carrier
US6018508A (en) * 1996-09-27 2000-01-25 Kabushiki Kaisha Toshiba Intensity of a light beam changed according to the length of a mark
US20030193867A1 (en) * 1996-12-20 2003-10-16 Matsushita Electric Industrial Co., Ltd. Optical recording method and optical recording device
US6762985B2 (en) * 1996-12-20 2004-07-13 Matsushita Electric Industrial Co., Ltd. Optical recording method and optical recording device
US20040156292A1 (en) * 1997-12-30 2004-08-12 Samsung Electronics Co., Ltd Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20060203677A1 (en) * 1997-12-30 2006-09-14 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US7158461B1 (en) * 1997-12-30 2007-01-02 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US8305857B2 (en) 1997-12-30 2012-11-06 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US7209423B2 (en) 1997-12-30 2007-04-24 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US7391697B2 (en) 1997-12-30 2008-06-24 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20060203697A1 (en) * 1997-12-30 2006-09-14 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20040125729A1 (en) * 1998-04-03 2004-07-01 Samsung Electronics Co., Ltd. Adaptive recording method and apparatus for high-density optical recording apparatus
US7212310B2 (en) 1998-04-03 2007-05-01 Samsung Electronics Co., Ltd. Adaptive recording method and apparatus for high-density optical recording apparatus
US6714503B1 (en) * 1998-04-03 2004-03-30 Samsung Electronics Co., Ltd. Adaptive recording method and apparatus for high-density optical recording apparatus
US7916604B2 (en) 1998-07-23 2011-03-29 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US7391696B2 (en) 1998-07-23 2008-06-24 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
EP1282117A2 (fr) 1998-07-23 2003-02-05 Samsung Electronics Co., Ltd. Procédé et circuit d'écriture adaptive pour un appareil d'enregistrement optique à haute densité
US20080239913A1 (en) * 1998-07-23 2008-10-02 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US8315146B2 (en) 1998-07-23 2012-11-20 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
EP1288922A3 (fr) * 1998-07-23 2008-12-10 Samsung Electronics Co., Ltd. Procédé et circuit d'écriture adaptive pour un appareil d'enregistrement optique à haute densité
EP1282117A3 (fr) * 1998-07-23 2008-12-17 Samsung Electronics Co., Ltd. Procédé et circuit d'écriture adaptive pour un appareil d'enregistrement optique à haute densité
US20080239915A1 (en) * 1998-07-23 2008-10-02 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20070153659A1 (en) * 1998-07-23 2007-07-05 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
SG93212A1 (en) * 1998-07-23 2002-12-17 Samsung Electronics Co Ltd Adaptive writing method for high-density optical recording apparatus and circuit thereof
US8315138B2 (en) 1998-07-23 2012-11-20 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
EP1282122A3 (fr) * 1998-07-23 2008-12-10 Samsung Electronics Co., Ltd. Procédé et circuit d'écriture adaptive pour un appareil d'enregistrement optique à haute densité
US8315145B2 (en) 1998-07-23 2012-11-20 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US7986610B2 (en) 1998-07-23 2011-07-26 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
EP1282122A2 (fr) * 1998-07-23 2003-02-05 Samsung Electronics Co., Ltd. Procédé et circuit d'écriture adaptive pour un appareil d'enregistrement optique à haute densité
US7391698B2 (en) 1998-07-23 2008-06-24 Samsung Electronics Co., Ltd. Adaptive writing method for high-density optical recording apparatus and circuit thereof
US6631110B1 (en) * 1998-07-23 2003-10-07 Samsung Electronics Co., Ltd Adaptive writing method for high-density optical recording apparatus and circuit thereof
US20050243679A1 (en) * 1998-08-04 2005-11-03 Takeshi Maeda Information recording method, information recording medium and information recording apparatus
US7349318B2 (en) 1998-08-04 2008-03-25 Hitachi, Ltd. Information recording method, information recording medium and information recording apparatus
US20050254388A1 (en) * 1998-08-04 2005-11-17 Takeshi Maeda Information recording method, information recording medium and information recording apparatus
US20100027399A1 (en) * 1998-08-04 2010-02-04 Takeshi Maeda Information Recording Method, Information Recording Medium and Information Recording Apparatus
US7349317B2 (en) 1998-08-04 2008-03-25 Hitachi, Ltd. Information recording method, information recording medium and information recording apparatus
US20070237049A1 (en) * 1998-08-04 2007-10-11 Takeshi Maeda Information Recording Method, Information Recording Medium And Information Recording Apparatus
US8040777B2 (en) 1998-08-04 2011-10-18 Hitachi, Ltd. Information recording method, information recording medium and information recording apparatus
US20050243680A1 (en) * 1998-08-04 2005-11-03 Takeshi Maeda Information recording method, information recording medium and information recording apparatus
US7352675B2 (en) 1998-08-04 2008-04-01 Hitachi, Ltd. Information recording method, information recording medium and information recording apparatus
US7079466B1 (en) 1999-03-30 2006-07-18 Koninklijke Philips Electronics N.V. Method and device for recording marks in an information layer of an optical record carrier
US7009923B2 (en) 1999-04-13 2006-03-07 Hitachi, Ltd. Method of and apparatus for recording information
KR100533557B1 (ko) * 1999-04-13 2005-12-06 가부시키가이샤 히타치세이사쿠쇼 정보 기록 방법 및 기록 장치
SG97882A1 (en) * 1999-04-13 2003-08-20 Hitachi Ltd Method of and apparatus for recording information
US20040052188A1 (en) * 1999-04-13 2004-03-18 Hidehiko Kando Method of and apparatus for recording information
US7609602B2 (en) 1999-04-13 2009-10-27 Hitachi, Ltd. Method of generating a recording pulse train in accordance with a NRZI signal for recording information to a recording medium
US20050265197A1 (en) * 1999-04-13 2005-12-01 Hidehiko Kando Method of and apparatus for recording information
US6678228B1 (en) 1999-04-13 2004-01-13 Hitachi, Ltd. Method and apparatus for recording information in which the average power of a pulse is adjusted according to control data
US20110128837A1 (en) * 1999-07-15 2011-06-02 Koninklijke Philips Electronics N.V. Methods and devices for recording marks in an information layer of an optical record carrier, and record carriers for use therein
US20050128932A1 (en) * 1999-08-31 2005-06-16 Sony Corporation Recording apparatus and recording method
US7123566B2 (en) 1999-08-31 2006-10-17 Sony Corporation Recording apparatus and recording method
US20050122873A1 (en) * 1999-08-31 2005-06-09 Sony Corporation Recording apparatus and recording method
US6856588B2 (en) 1999-08-31 2005-02-15 Sony Corporation Recording apparatus and recording method
US7633847B2 (en) 1999-08-31 2009-12-15 Sony Corporation Recording apparatus and recording method
US20040008601A1 (en) * 1999-08-31 2004-01-15 Sony Corporation Recording apparatus and recording method
US6614739B1 (en) * 1999-08-31 2003-09-02 Sony Corporation Recording apparatus and recording method
US20060126467A1 (en) * 1999-09-18 2006-06-15 Jin-Tae Roh Optimal recording apparatus and method for determining an optical recording condition
US7170835B1 (en) * 1999-09-18 2007-01-30 Lg Electronics Inc. Optical recording apparatus and method for determining an optimal recording condition
US7760597B2 (en) 1999-09-18 2010-07-20 Lg Electronics Inc. Optimal recording apparatus and method for determining an optical recording condition
US6574178B2 (en) * 2000-05-11 2003-06-03 Koninklijke Electronics N.V. Methods and devices for recording marks on a recording surface of an optical record carrier
AU782210B2 (en) * 2000-05-11 2005-07-14 Koninklijke Philips Electronics N.V. Methods and devices for recording marks on a recording surface of an optical record carrier
US7193948B2 (en) * 2000-10-05 2007-03-20 Matsushita Electric Industrial Co., Ltd. Optical recording medium, method for recording on optical record medium, and apparatus for recording on optical record medium
US20030058771A1 (en) * 2000-10-05 2003-03-27 Shigeaki Furukawa Optical recording medium, method for recording on optical record medium, and apparatus for recording on optical record medium
US20020051415A1 (en) * 2000-10-26 2002-05-02 Matsushita Electric Industrial Co., Ltd. Recording waveform generator and disk recording device
US6714230B2 (en) * 2001-02-14 2004-03-30 Ricoh Company, Ltd. Method for optically recording information on an optically re-writable information medium
US7038990B2 (en) 2001-02-14 2006-05-02 Ricoh Company, Ltd. Method for optically recording information
US20040190385A1 (en) * 2001-02-14 2004-09-30 Akihiko Shimizu Method for optically recording information
US20080019241A1 (en) * 2001-10-02 2008-01-24 Matsushita Electric Industrial Co., Ltd. Optical information recording method, optical information recording and reproducing device, and optical information recording medium
US7292525B2 (en) 2001-10-02 2007-11-06 Matsushita Electric Industrial Co., Ltd. Optical information recording method and apparatus for multiple recording layer medium
US7492687B2 (en) 2001-10-02 2009-02-17 Panasonic Corporation Optical information recording method, optical information recording and reproducing device, and optical information recording medium
US20030081523A1 (en) * 2001-10-02 2003-05-01 Matsushita Electric Industrial Co., Ltd. Optical information recording method, optical information recording and reproducing device, and optical information recording medium
US7142496B2 (en) * 2001-10-02 2006-11-28 Matsushita Electric Industrial Co., Ltd. Optical information recording method, device, and recording medium with plural recording layers
US20060023588A1 (en) * 2001-10-02 2006-02-02 Matsushita Electric Industrial Co., Ltd. Optical information recording method, optical information recording and reproducing device, and optical information recording medium
US20050105437A1 (en) * 2002-03-15 2005-05-19 Akira Shimofuku Recording apparatus and recording method
US20050074701A1 (en) * 2002-04-09 2005-04-07 Matsushita Electric Industrial Co., Ltd. Method for manufacturing optical disk master and method for manufacturing optical disk
US7479363B2 (en) 2002-04-26 2009-01-20 Tdk Corporation Optical recording medium and method for optically recording data in the same
US20030202452A1 (en) * 2002-04-26 2003-10-30 Tdk Corporation Optical recording medium and method for optically recording data in the same
US8018817B2 (en) 2002-05-20 2011-09-13 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
SG119163A1 (en) * 2002-05-20 2006-02-28 Samsung Electronics Co Ltd Optical recording medium on which power information of erase pattern is recorded
US20080316885A1 (en) * 2002-05-20 2008-12-25 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording meidum based on the erase pattern information, and optical recording medium therefor
US20050073930A1 (en) * 2002-05-20 2005-04-07 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US7349306B2 (en) 2002-05-20 2008-03-25 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US20030214892A1 (en) * 2002-05-20 2003-11-20 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US7411880B2 (en) 2002-05-20 2008-08-12 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US20070064567A1 (en) * 2002-05-20 2007-03-22 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US20060193227A1 (en) * 2002-05-20 2006-08-31 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US7369470B2 (en) 2002-05-20 2008-05-06 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor
US7447129B2 (en) 2002-05-20 2008-11-04 Samsung Electronics Co., Ltd. Method of recording erase pattern information on an optical recording medium, erasing information on the optical recording medium based on the erase pattern information, and optical recording medium therefor.
US20040027973A1 (en) * 2002-08-12 2004-02-12 Tdk Corporation Optical recording medium and method for optically recording data in the same
US20040052177A1 (en) * 2002-09-04 2004-03-18 Hiroshi Maegawa Optical information recording method, apparatus, and medium, laser control circuit, wobble signal detection method, and servo signal detection method
US7474603B2 (en) * 2002-09-04 2009-01-06 Ricoh Company, Ltd. Optical information recording method, apparatus, and medium, laser control circuit, wobble signal detection method, and servo signal detection method
US7193949B2 (en) * 2002-09-09 2007-03-20 Tdk Corporation Method for recording data on optical recording medium, device for recording data on optical recording medium, and optical recording medium
US20060039261A1 (en) * 2002-09-09 2006-02-23 Tdk Corporation Method for recording data on optical recording medium, device for recording data on optical recording medium, and optical recording medium
US20060013111A1 (en) * 2002-11-19 2006-01-19 Tdk Corporation Method for recording data onto optical recording medium, data recording device, and optical recording medium
US7345976B2 (en) 2002-11-19 2008-03-18 Tdk Corporation Method for recording data in optical recording medium, apparatus for recording data in optical recording medium and optical recording medium
US7801000B2 (en) 2002-12-17 2010-09-21 Mitsubishi Kagaku Media Co., Ltd. Recording/reading method for an optical recording medium using an irradiating a laser beam
US20050213467A1 (en) * 2002-12-17 2005-09-29 Yoshihiro Noda Optical recording medium, and recording/reading method and recording/reading apparatus for optical recording medium
US20080002550A1 (en) * 2002-12-17 2008-01-03 Mitsubishi Chemical Corporation Recording/reading method for an optical recording medium using an irradiating a laser beam
US20040190431A1 (en) * 2003-01-23 2004-09-30 Samsung Electronics Co., Ltd. Optical recording medium, method and apparatus for recording data thereon
US9418694B2 (en) 2003-02-19 2016-08-16 JVC Kenwood Corporation Optical recording method, optical recording medium, optical recording medium recording apparatus, optical recording apparatus, optical disk, and optical disk recording/reproducing apparatus
US20060140094A1 (en) * 2003-02-19 2006-06-29 Hiroshi Tabata Optical recording method, optical recording medium, optical recording medium recording device, optical recording device, optical disk, optica disk recording/reproducing device
US9025424B2 (en) * 2003-02-19 2015-05-05 JVC Kenwood Corporation Optical recording method, optical recording medium, optical recording medium recording apparatus, optical recording apparatus, optical disk, and optical disk recording/reproducing apparatus
US20040251945A1 (en) * 2003-06-16 2004-12-16 Kang Sang Hee Shared delay circuit of a semiconductor device
US6989703B2 (en) * 2003-06-16 2006-01-24 Hynix Semiconductor Inc. Shared delay circuit of a semiconductor device
SG113512A1 (en) * 2003-07-18 2005-08-29 Sony Corp Information recording device and information recording method
US7301875B2 (en) 2003-07-18 2007-11-27 Sony Corporation Information recording device and information recording method
US20050036423A1 (en) * 2003-07-18 2005-02-17 Sony Corporation Information recording device and information recording method
US20070133369A1 (en) * 2003-10-27 2007-06-14 Kunihiko Horikawa Information recording device and information recording method
US7719943B2 (en) * 2003-10-27 2010-05-18 Pioneer Corporation Information recording device and information recording method
US20080137504A1 (en) * 2004-10-19 2008-06-12 Koninklijke Philips Electronics, N.V. Method Of Writing Data On A Master Substrate For Optical Recording
US20090251524A1 (en) * 2004-12-22 2009-10-08 Koninklijke Philips Electronics, N.V. Pulsed laser mode for writing labels
US20090097368A1 (en) * 2006-03-13 2009-04-16 Koninklijke Philips Electronics N. V. Real time power control for optical recording drives
US7995441B2 (en) * 2006-03-13 2011-08-09 Koninklijke Philips Electronics N.V. Real time power control for optical recording drives
US20100188958A1 (en) * 2006-04-28 2010-07-29 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US8503278B2 (en) 2006-04-28 2013-08-06 Sharp Kabushiki Kaisha Information reproducing device
US20100188949A1 (en) * 2006-04-28 2010-07-29 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US8072856B2 (en) 2006-04-28 2011-12-06 Sharp Kabushiki Kaisha Recording/reproducing device and method using pulse sequences, and information recording medium
US8072864B2 (en) 2006-04-28 2011-12-06 Sharp Kabushiki Kaisha Recording/reproducing device and method using pulse sequences and information recording medium
US8116184B2 (en) 2006-04-28 2012-02-14 Sharp Kabushiki Kaisha Recording/reproducing device and method using pulse sequences, and information recording medium
US8599669B2 (en) 2006-04-28 2013-12-03 Sharp Kabushiki Kaisha Reproduced signal quality judging method
US8154969B2 (en) 2006-04-28 2012-04-10 Sharp Kabushiki Kaisha Recording parameter setting device and method using pulse sequences
US8159912B2 (en) 2006-04-28 2012-04-17 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US8169869B2 (en) 2006-04-28 2012-05-01 Sharp Kabushiki Kaisha Recording parameter setting device and method using pulse sequences
US8169870B2 (en) 2006-04-28 2012-05-01 Sharp Kabushiki Kaisha Recording/reproducing device and method using pulse sequences, and information recording medium
US8189442B2 (en) 2006-04-28 2012-05-29 Sharp Kabushiki Kaisha Recording/reproducing device including recording parameter setting device, and nontransitory computer-readable medium storing program for causing computer to operate as the same
US20100188954A1 (en) * 2006-04-28 2010-07-29 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US20100188956A1 (en) * 2006-04-28 2010-07-29 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US20090116354A1 (en) * 2006-04-28 2009-05-07 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US20090073835A1 (en) * 2006-04-28 2009-03-19 Sharp Kabushiki Kaisha Recording Parameter Setting Device, Program Thereof, Computer-Readable Recording Medium Containing the Program, Information Recording Medium, Recording/Reproducing Device, and Recording Parameter Setting Method
US20100188948A1 (en) * 2006-04-28 2010-07-29 Sharp Kabushiki Kaisha Recording parameter setting device, program thereof, computer-readable recording medium containing the program, information recording medium, recording/reproducing device, and recording parameter setting method
US8144559B2 (en) 2006-06-12 2012-03-27 Hitachi, Ltd. Multiple pulse recording method with 3-valued power levels
US20070286047A1 (en) * 2006-06-12 2007-12-13 Hiroyuki Minemura Information Recording Method of Optical Disc, Laser Driving Apparatus and Optical Disc Apparatus
US20080212453A1 (en) * 2006-12-15 2008-09-04 Taiyo Yuden Co., Ltd. Optical information recording device, optical information recording method, and optical information recording medium
US20170244583A1 (en) * 2007-03-01 2017-08-24 Lightfleet Corporation Time domain symbol transmitter

Also Published As

Publication number Publication date
DE69612833D1 (de) 2001-06-21
CN1250210A (zh) 2000-04-12
DE69618681D1 (de) 2002-02-28
DE69612833T2 (de) 2001-08-30
MX9704098A (es) 1997-09-30
DE69618681T2 (de) 2002-08-14
EP1018727B1 (fr) 2002-01-09
TW359812B (en) 1999-06-01
DE69618680T2 (de) 2002-08-14
MY113691A (en) 2002-04-30
JP2000155946A (ja) 2000-06-06
EP0991058A1 (fr) 2000-04-05
DE69614005T2 (de) 2001-10-31
DE69614005D1 (de) 2001-08-23
EP1020850A2 (fr) 2000-07-19
EP0991058B1 (fr) 2001-07-18
CN1250211A (zh) 2000-04-12
CN1146869C (zh) 2004-04-21
DE69618680D1 (de) 2002-02-28
EP0797193A4 (fr) 1999-06-23
WO1997014143A1 (fr) 1997-04-17
CN1137473C (zh) 2004-02-04
CN1128442C (zh) 2003-11-19
DE69618034T2 (de) 2002-05-16
EP0991059B1 (fr) 2001-12-12
EP0797193A1 (fr) 1997-09-24
KR980700643A (ko) 1998-03-30
HK1005275A1 (en) 1998-12-31
EP1020850A3 (fr) 2000-08-16
CN1173941A (zh) 1998-02-18
EP0991059A1 (fr) 2000-04-05
EP1018727A2 (fr) 2000-07-12
KR100456957B1 (ko) 2005-01-17
EP1020850B1 (fr) 2002-01-09
EP0797193B1 (fr) 2001-05-16
EP1018727A3 (fr) 2000-08-16
DE69618034D1 (de) 2002-01-24
JP4145958B2 (ja) 2008-09-03

Similar Documents

Publication Publication Date Title
US5745467A (en) Optical information recording method and apparatus
JP3323782B2 (ja) 情報の記録方法
US5412626A (en) Method of recording optical information with selective correction in pulse waveform and a recording system therefor
US7417930B2 (en) Optical recording method
KR20010099753A (ko) 다가 기록재생 방법 및 위상 변화 다가 기록 매체
JPH097176A (ja) 光記録方法および光記録媒体
JP3022770B2 (ja) 光記録方法、装置及び光記録媒体
KR950003182B1 (ko) 광디스크 및 광학정보의 기록방법
JP4063978B2 (ja) 情報記録方法
JP2003228834A (ja) 情報記録方式及び光記録媒体
US7260044B2 (en) Recording method for a phase-change optical recording medium
JP3277733B2 (ja) 光ディスクへの光学的情報の記録方法および記録装置
JP3740151B2 (ja) 光記録方法及び光記録装置
JP2000132836A (ja) 光記録方法
JP3218235B2 (ja) 記録装置
US7362682B2 (en) Method for recording data in an optical recording disc and an apparatus for recording data in an optical recording disc
JP2000137916A (ja) 光記録方法及び相変化型記録媒体
JP2000190637A (ja) 光学的情報記録媒体
JP3455521B2 (ja) 光記録方法
JPH0971049A (ja) 光学的情報記録用媒体および記録方法
US20050063272A1 (en) Method for recording data in an optical recording disc and an apparatus for recording data in an optical recording disc
US7680010B2 (en) Method for recording information on optical recording medium
JPH0877600A (ja) 光学的情報記録部材
JP2004227743A5 (fr)
JP2005122881A (ja) 光記録方法

Legal Events

Date Code Title Description
AS Assignment

Owner name: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SAKAUE, YOSHITAKA;NISHIUCHI, KENICHI;OHNO, EIJI;REEL/FRAME:008265/0321

Effective date: 19961001

STCF Information on status: patent grant

Free format text: PATENTED CASE

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

FPAY Fee payment

Year of fee payment: 12