US4996106A - Pellicle - Google Patents
Pellicle Download PDFInfo
- Publication number
- US4996106A US4996106A US07/267,380 US26738088A US4996106A US 4996106 A US4996106 A US 4996106A US 26738088 A US26738088 A US 26738088A US 4996106 A US4996106 A US 4996106A
- Authority
- US
- United States
- Prior art keywords
- pellicle
- film
- side face
- tacky
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0002—Apparatus or processes for manufacturing printed circuits for manufacturing artworks for printed circuits
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/28—Web or sheet containing structurally defined element or component and having an adhesive outermost layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/3154—Of fluorinated addition polymer from unsaturated monomers
- Y10T428/31544—Addition polymer is perhalogenated
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31855—Of addition polymer from unsaturated monomers
- Y10T428/3188—Next to cellulosic
- Y10T428/31884—Regenerated or modified cellulose
- Y10T428/31888—Addition polymer of hydrocarbon[s] only
Definitions
- the present invention relates to a pellicle used as the dust-proof cover during exposure of a photomask or a reticle.
- a mask comprising a glass sheet and a circuit pattern of a vacuum deposition film of chromium or the like (hereinafter called mask) formed on the surface of the glass sheet is used, and the circuit pattern is transferred to a resist-coated silicon wafer.
- the circuit pattern is transferred to the wafer and a defective product is formed.
- a stepper when light exposure is carried out by using a stepper, the risk that all of the chips formed on a wafer will be defective is increased, and an adhesion of foreign matter to a circuit pattern of a mask or the like becomes a serious problem. Therefore, a pellicle has recently been developed and used by which this problem is eliminated.
- the pellicle comprises a transparent film of nitrocellulose or the like spread on one side face of a pellicle frame made of aluminum, a double-adhesive tape is applied to the other side face of the pellicle, and the pellicle is attached to a mask.
- this pellicle is used, the intrusion of a foreign substance from the outside can be prevented, and even if a foreign substance adheres to the film, the foreign substance is transferred in the fuzzy state during light exposure and no particular problem arises.
- a single layer thin film of nitrocellulose has been primarily utilized as the pellicle film, and to improve the stability of the light transmittance and the like during the exposure step, a pellicle film having a reflection preventive layer comprising a fluorine type polymer or a silicon type polymer and the like on a transparent film of nitrocellulose has been proposed (see: Japanese Unexamined Pat. Publication (Kokai) No. 60-237450).
- Japanese Pat. application No. 62-205533 proposed a pellicle which does not use a double-adhesive tape at the adhered surface. But, even in this method, the foreign matter attached on the inner face of the pellicle film may be sometimes caused to fall onto the mask due to shock during usage, to thereby cause the production of defective LSI's.
- the pellicle film used as a dust-proof film must have a high light ray transmittance, and accordingly, the presence of a foreign substance is extremely disadvantageous, and thus a material to which the attachment of a foreign substance is difficult has been used.
- a reflection preventive film as disclosed in the above-mentioned Japanese Unexamined Pat. Publication (Kokai) No. 60-237450, however, a material without tackiness on the surface must be used to prevent the attachment of a foreign substance.
- the objects of the present invention are to eliminate the above-mentioned disadvantages of the prior art and to provide a pellicle which prevents the dropping of a foreign substance onto a photomask or a reticle by attaching the foreign substance to a tacky substance layer having a high light transmittance and formed on the inner face of the pellicle film.
- a pellicle comprising a pellicle frame, a pellicle film spread on one side face of the pellicle frame, and a tacky substance layer having a high light transmittance formed on the inner side face of the pellicle film.
- FIG. 1 is a sectional view of a part showing the pellicle of the Example, in which 1 is a pellicle, 2 a pellicle frame, 3 a pellicle film, 4, 6, and 7 are tacky substance layers, 5 a non-tacky layer, and 8 a material to be adhered.
- the pellicle frame usable in the present invention is not particularly limited, but an almite-treated aluminum frame used in the prior art may be utilized, and other materials can be used.
- the shape of the pellicle frame may be as desired, for example, cylindrical, square. Also, preferably a tacky substance layer is formed on the inner side face of the pellicle frame.
- the transparent thin film which becomes the main body of the pellicle film, may be a film having a large average light transmittance at the wavelengths of 350 to 450 nm used for exposure, but preferably is a cellulose derivative thin film such as nitrocellulose, ethylcellulose, propionic acid cellulose, and the like.
- nitrocellulose is preferred from the aspects of an average light transmittance at 350 to 450 nm and the film strength.
- nitrocelluloses those having a nitration degree (N%) of 11 to 12.5%, particularly 11.5 to 12.2%, and an average molecular weight (weight average Mw) of 50,000 to 350,000, particularly, 70,000 to 320,000 are preferred.
- the term, average light transmittance refers to an average value of the transmittance at the same number of peak portions and valley portions of interference waves occurring between 350 and 450 nm.
- the thickness of the transparent thin film is selected so that transmittance to the desired wavelength between 350 and 450 nm may be higher, but a thickness of 2.85 ⁇ m is generally selected to raise the transmittance to around 436 nm +405 nm +365 nm of the exposed wavelength currently in use, and a thickness of 0.865 ⁇ m is used for raising the transmittance at 436 nm.
- the tacky substance for forming the tacky substance layer on the inner side face of the transparent thin film which becomes the main body of the pellicle film there may be employed a substance having a high light transmittance and a tackiness, but preferably the substance used can firmly hold a tacky foreign substance attached thereto.
- the tacky substance preferably has a refractive index not higher than that of the transparent thin film, without decomposition by the light rays at 350 to 450 nm. Also, the tacky substance may have a reflection preventive effect.
- fluorine type polymers for example, there may be included fluorine type polymers and silicone type polymers.
- fluorine type polymer acrylic fluorine polymers are preferred, for example, polyfluoro(meth) acrylates comprising at least one monomer selected from CH 2 ⁇ CHCOOR 1 or CH 2 ⁇ C(CH 3 )COOR 2 wherein R 1 , R 2 are each a fluoroalkyl group which may also contain an ethereal oxygen atom interposed, namely, homopolymers or copolymers of fluorine containing acrylates, homopolymers, copolymers of fluorine containing methacrylates, copolymers of fluorine containing acrylates, and fluorine containing methacrylates, and by suitably varying the kind of the fluoroalkyl group of R 1 and R 2 and the copolymer composition, a polymer with a desired fluorine content can be used.
- a polyfluoro(meth)acrylate having a fluorine content of 50% by weight or more is used.
- a preferable tacky substance is a polyfluoroacrylate which is a copolymer of trifluoroethyl acrylate and perfluorooctylethyl acrylate.
- the monomer (A) of this copolymer, trifluoroethyl acrylate is represented by CH 2 CHCOOCH 2 CF 3
- the monomer (B), perfluorooctylethyl acrylate by CH 2 ⁇ CHCOOC 2 H 4 C 8 F 17 .
- the above polyfluoro(meth)acrylate also has a reflection preventive property.
- the tacky substance layer is formed on the inner side face of the transparent thin film of the cellulose derivative, with the above tacky substance, and the film thickness at that time is preferably 1/4 n (n is the refractive index) of the wavelength of the target light.
- a layer such as a reflection preventive layer or the like can be formed on the outer side face of the transparent thin film which becomes the main body of the pellicle film, as in the prior art.
- the layer such as reflection preventive layer or the like to be formed on the outer side face is preferably a non-tacky substance layer.
- a non-tacky fluorine type polymer or silicone type polymer used in the prior art as a reflection preventive layer may be utilized.
- fluorine type polymer there may be included copolymers of tetrafluoroethylene and vinylidene chloride, or vinylidene fluoride, ternary copolymers of tetrafluoroethylene, vinylidene chloride, or vinylidene fluoride, and hexafluoropropylene and the like.
- the layers formed on the inner side face and the outer side face of the transparent thin film may be either a single layer or multiple layers.
- a tacky substance layer can be used for the innermost layer and a non-tacky substance layer for the outermost layer.
- the method for preparing the pellicle film having a tacky substance layer may be practiced as follows, in the case of forming a tacky substance layer comprising a polyfluoroacrylate on a cellulose derivative transparent thin film.
- a cellulose derivative solution is fed onto a smooth substrate such as glass, and a transparent film of the cellulose derivative is formed by the rotatory film fabrication method.
- the cellulose derivative is dissolved in a good solvent and the solution is purified by, for example, filtration, before use if necessary.
- the solvent there may be employed ketones such as methyl ethyl ketone, methyl isobutyl ketone, acetone and the like; lower fatty acid esters such as butyl acetate, isobutyl acetate and the like; and mixtures of these solvents with alcohols such as isopropyl alcohol and the like.
- the thickness of the transparent thin film formed can be suitably varied by changing the solution viscosity or the rotational speed of the substrate.
- the cellulose derivative transparent thin film formed on the substrate is dried by, for example, hot air or IR-ray lamp irradiation, to remove the residual solvent.
- a solution of a tacky substance such as the above polyfluoroacrylate is applied over the dried cellulose derivative thin film, and a tacky substance layer comprising a fluorine polymer is formed by the rotatory film fabrication method, as for the cellulose derivative thin film.
- the solvent for dissolving polyfluoroacrylate is selected from among m-xylenehexafluoride ##STR1## and among these, m-xylenehexafluoride is particularly preferred.
- the thickness of the tacky substance layer can be controlled by suitably varying the solution viscosity and the rotational speed of the substrate, etc., as in the case of the cellulose derivative thin film.
- a pellicle film has a tacky substance layer on one face and a non-tacky substance layer on the other face
- the transparent thin film having the tacky substance layer on one face is peeled from the substrate, plastered on a tentative frame, and on the other face not having the tacky substance layer, is formed a solution of, for example, a tetrafluoroethylene/vinylidene chloride or vinylidene fluoride/hexafluoropropylene ternary copolymer (50/29/21 weight ratio) dissolved in a solvent such as perfluoro-2-methyl-1-oxy-3-thiacyclohexane-3, 3-dioxide whereby a reflection preventive layer comprising a non-tacky substance layer can be formed.
- a polyfluoroacrylate solution (note, the solvent is not limited to the solvents mentioned above and any solvent which will dissolve the same polymer can be used) is fed onto a smooth substrate such as glass, etc., a polyfluoroacrylate thin film is formed by the rotatory film fabrication method, and the film is dried by, for example, hot air or IR-ray lamp irradiation, to remove the residual solvent.
- a solution of tetrafluoroethylene/vinylidene chloride or vinylidene fluoride/hexafluoropropylene ternary copolymer is applied to form a non-tacky substance layer, whereby a three-layer structure pellicle film can be formed.
- the pellicle film having the tacky substance layer thus formed on the substrate is peeled from the substrate and used as the pellicle.
- a cellophane tape or a frame-shaped implement having an adhesive coated thereon is pushed against the outermost layer of the laminated film formed on the substrate.
- the polyfluoroacrylate film is in contact with the outer atmosphere to be adhered thereon, and the film can be directly peeled from the substrate by lifting the cellophane tape or the frame-shaped implement, from one end, by hand or by a mechanical means.
- the film can be peeled without separation and the pellicle film thus obtained plastered onto a pellicle frame to form a pellicle.
- the pellicle thus prepared is used as dust-proof cover during exposure, by being superposed on a photomask or a reticle as in the prior art.
- care is taken that no foreign substance such as dust, etc., is adhered thereto, but any foreign substance accidentally brought in is adhered to the tacky substance layer and will not fall onto the photomask.
- the foreign substance attached on the outer side face of the pellicle can be removed by air blowing, but the foreign substance attached on the inner side face will not fall onto a photomask or reticle, and thus will not cause defective LSI's, because substances having a size of about 50 ⁇ m or less will not form images on the transfer face.
- FIG. 1 is a sectional view of a part showing the pellicle of the Example.
- 1 is a pellicle having a pellicle film 3 spread on one side face of a pellicle frame 2.
- a tacky substance layer 4 On the inner side face of the pellicle film 3 is formed a tacky substance layer 4, and a non-tacky substance layer 5 is formed on the outer side face. This layer 5 is also utilized as the reflection preventive layer.
- tacky substance layers 6 and 7 are formed on the inner side face and the lower side face of a pellicle frame 2 .
- the tacky substance layer 7 is used for adhesion with the material 8 to be adhered, such as a photomask or reticle.
- the pellicle 1 having the above constitution is used as the dust-proof cover during exposure, while adhered to the material 8 to be adhered by utilizing the tacky substance layer 7. At this time, the foreign substance attached to the non-tacky substance layer 5 is removed by air blowing, but the foreign substances attached to the tacky substance layers 6 and 7, will not fall and will not interfere with the exposure.
- Nitrocellulose was dissolved in methyl isobutyl ketone to form a 6% by weight solution. Also, a copolymer of trifluoroethyl acrylate and perfluorooctylethyl acrylate (trifluoroethyl acrylate 67 mol%, perfluorooctylethyl acrylate 33 mol%, fluorine content 52.8% by weight) was dissolved in m-xylenehexafluoride to form a 1.0% by weight solution.
- the above fluorine polymer solution was added dropwise by the rotatory coating method and filmed or sheeted by rotation at 500 rpm for 60 seconds to form a tacky substance layer, and then a transparent thin film of nitrocellulose was formed, followed by drying. Further, a solution of a tetrafluoroethylene/vinylidene chloride or vinylidene fluoride/hexafluoropropylene terpolymer (50/29/21 weight ratio) dissolved in perfluoro-2-methyl-1-oxy-3-thiacyclohexane-3, 3-dioxide at a concentration of 0.6% by weight was added dropwise to form a non-tacky substance layer. The pellicle film was peeled from the substrate and spread on a pellicle frame so that the tacky substance was at the inner side face.
- a plasterable substance layer is formed on the inner side face of the pellicle film, and therefore, it is possible to prevent interference with the exposure by foreign substances attached on the innerside of the pellicle which have fallen onto the material to be adhered, such as a photomask.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62-279627 | 1987-11-05 | ||
JP27962787A JP2535971B2 (ja) | 1987-11-05 | 1987-11-05 | ペリクル |
SG48394A SG48394G (en) | 1987-11-05 | 1994-04-09 | Pellicle |
Publications (1)
Publication Number | Publication Date |
---|---|
US4996106A true US4996106A (en) | 1991-02-26 |
Family
ID=26553411
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US07/267,380 Expired - Fee Related US4996106A (en) | 1987-11-05 | 1988-11-04 | Pellicle |
Country Status (6)
Country | Link |
---|---|
US (1) | US4996106A (ja) |
EP (1) | EP0315450B1 (ja) |
JP (1) | JP2535971B2 (ja) |
DE (1) | DE3883707T2 (ja) |
HK (1) | HK84494A (ja) |
SG (1) | SG48394G (ja) |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5339197A (en) * | 1989-03-31 | 1994-08-16 | Yen Yung Tsai | Optical pellicle with controlled transmission peaking |
US5422704A (en) * | 1992-07-13 | 1995-06-06 | Intel Corporation | Pellicle frame |
US5608576A (en) * | 1992-09-03 | 1997-03-04 | Samsung Electronics Co., Ltd. | Projection method and projection system and mask therefor |
US5643654A (en) * | 1990-11-29 | 1997-07-01 | Mitsui Petrochemical Industries, Ltd. | Pellicle structure and process for preparation thereof with dissolution of coating layer |
US5674624A (en) * | 1990-10-16 | 1997-10-07 | Mitsui Petrochemical Industries, Ltd. | Highly light-transmitting dust protective film, and dust protective member |
US5691088A (en) * | 1991-09-26 | 1997-11-25 | Shin-Etsu Chemical Co., Ltd. | Pellicle for protection of photolithographic mask |
US5741576A (en) * | 1995-09-06 | 1998-04-21 | Inko Industrial Corporation | Optical pellicle with controlled transmission peaks and anti-reflective coatings |
US6103427A (en) * | 1991-05-17 | 2000-08-15 | Dupont Photomasks, Inc. | Pressure relieving pellicle |
US6149992A (en) * | 1996-11-19 | 2000-11-21 | Mitsui Chemicals, Inc. | Pellicle |
US6254942B1 (en) * | 1999-06-09 | 2001-07-03 | Nec Corporation | Pellicle case having chemical traps |
US6337161B2 (en) * | 1997-10-01 | 2002-01-08 | Canon Kabushiki Kaisha | Mask structure exposure method |
US6524754B2 (en) | 2001-01-22 | 2003-02-25 | Photronics, Inc. | Fused silica pellicle |
US20040121248A1 (en) * | 2001-01-22 | 2004-06-24 | Ben Eynon | Fused silica pellicle in intimate contact with the surface of a photomask |
CN104471479A (zh) * | 2012-08-02 | 2015-03-25 | 三井化学株式会社 | 防护膜组件 |
CN109314276A (zh) * | 2016-06-20 | 2019-02-05 | 索尔维公司 | 氟聚合物薄膜 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6156300A (en) * | 1985-02-05 | 2000-12-05 | Chiron Corporation | Point mutants of N∇2 CSF-1 and carboxy truncated fragments thereof |
US6146851A (en) * | 1985-02-05 | 2000-11-14 | Chiron Corporation | DNA encoding NV2 (long form) and carboxy truncated fragments thereof |
US5573930A (en) * | 1985-02-05 | 1996-11-12 | Cetus Oncology Corporation | DNA encoding various forms of colony stimulating factor-1 |
US4970099A (en) * | 1989-05-19 | 1990-11-13 | E. I. Du Pont De Nemours And Company | Perfluoropolymer coated pellicles |
JP2714450B2 (ja) * | 1989-08-10 | 1998-02-16 | ダイセル化学工業株式会社 | 防塵膜 |
JP2945201B2 (ja) * | 1992-01-31 | 1999-09-06 | 信越化学工業株式会社 | ペリクル |
JP3027073B2 (ja) * | 1993-07-28 | 2000-03-27 | 信越化学工業株式会社 | ペリクル |
KR20100049445A (ko) * | 2008-11-03 | 2010-05-12 | (주)엠에스티테크놀로지 | 리소그래피용 펠리클 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4470508A (en) * | 1983-08-19 | 1984-09-11 | Micro Lithography, Inc. | Dustfree packaging container and method |
JPS6057841A (ja) * | 1983-09-09 | 1985-04-03 | Hitachi Ltd | 異物固定方法及び装置 |
JPS60237450A (ja) * | 1984-05-11 | 1985-11-26 | Asahi Chem Ind Co Ltd | 非反射性フオトマスク・レチクル用防塵カバ−体及びその製造方法 |
EP0252574A2 (en) * | 1986-07-07 | 1988-01-13 | YEN, Yung-Tsai | Method and apparatus for reducing particulates on photomasks |
EP0304211A2 (en) * | 1987-08-18 | 1989-02-22 | Mitsui Petrochemical Industries, Ltd. | Dust-proof film |
US4833051A (en) * | 1984-08-20 | 1989-05-23 | Nippon Kogaku K.K. | Protective device for photographic masks |
-
1987
- 1987-11-05 JP JP27962787A patent/JP2535971B2/ja not_active Expired - Lifetime
-
1988
- 1988-11-03 DE DE88310357T patent/DE3883707T2/de not_active Expired - Fee Related
- 1988-11-03 EP EP88310357A patent/EP0315450B1/en not_active Expired - Lifetime
- 1988-11-04 US US07/267,380 patent/US4996106A/en not_active Expired - Fee Related
-
1994
- 1994-04-09 SG SG48394A patent/SG48394G/en unknown
- 1994-08-18 HK HK84494A patent/HK84494A/xx not_active IP Right Cessation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4470508A (en) * | 1983-08-19 | 1984-09-11 | Micro Lithography, Inc. | Dustfree packaging container and method |
JPS6057841A (ja) * | 1983-09-09 | 1985-04-03 | Hitachi Ltd | 異物固定方法及び装置 |
JPS60237450A (ja) * | 1984-05-11 | 1985-11-26 | Asahi Chem Ind Co Ltd | 非反射性フオトマスク・レチクル用防塵カバ−体及びその製造方法 |
US4833051A (en) * | 1984-08-20 | 1989-05-23 | Nippon Kogaku K.K. | Protective device for photographic masks |
EP0252574A2 (en) * | 1986-07-07 | 1988-01-13 | YEN, Yung-Tsai | Method and apparatus for reducing particulates on photomasks |
EP0304211A2 (en) * | 1987-08-18 | 1989-02-22 | Mitsui Petrochemical Industries, Ltd. | Dust-proof film |
Non-Patent Citations (3)
Title |
---|
D. W. Fisher et al., IBM Technical Disclosure Bulletin, vol. 20, No. 8, pp. 3000, Jan. 1978. * |
Patent Abstracts of Japan, (Japanese Published Patent Appln. No. 61 241756) vol. 11, No. 91 (P 558) 2538 Mar. 23, 1987. * |
Patent Abstracts of Japan, (Japanese Published Patent Appln. No. 61-241756) vol. 11, No. 91 (P-558) [2538] Mar. 23, 1987. |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5339197A (en) * | 1989-03-31 | 1994-08-16 | Yen Yung Tsai | Optical pellicle with controlled transmission peaking |
US5674624A (en) * | 1990-10-16 | 1997-10-07 | Mitsui Petrochemical Industries, Ltd. | Highly light-transmitting dust protective film, and dust protective member |
US5643654A (en) * | 1990-11-29 | 1997-07-01 | Mitsui Petrochemical Industries, Ltd. | Pellicle structure and process for preparation thereof with dissolution of coating layer |
US6103427A (en) * | 1991-05-17 | 2000-08-15 | Dupont Photomasks, Inc. | Pressure relieving pellicle |
US5691088A (en) * | 1991-09-26 | 1997-11-25 | Shin-Etsu Chemical Co., Ltd. | Pellicle for protection of photolithographic mask |
US5422704A (en) * | 1992-07-13 | 1995-06-06 | Intel Corporation | Pellicle frame |
US6055040A (en) * | 1992-07-13 | 2000-04-25 | Intel Corporation | Pellicle frame |
US5608576A (en) * | 1992-09-03 | 1997-03-04 | Samsung Electronics Co., Ltd. | Projection method and projection system and mask therefor |
US5741576A (en) * | 1995-09-06 | 1998-04-21 | Inko Industrial Corporation | Optical pellicle with controlled transmission peaks and anti-reflective coatings |
US6149992A (en) * | 1996-11-19 | 2000-11-21 | Mitsui Chemicals, Inc. | Pellicle |
US6337161B2 (en) * | 1997-10-01 | 2002-01-08 | Canon Kabushiki Kaisha | Mask structure exposure method |
US20010014375A1 (en) * | 1999-06-09 | 2001-08-16 | Yoshiyuki Tanaka | Pellicle case having chemical traps |
US6254942B1 (en) * | 1999-06-09 | 2001-07-03 | Nec Corporation | Pellicle case having chemical traps |
US6443302B2 (en) * | 1999-06-09 | 2002-09-03 | Nec Corporation | Pellicle and storage case therefor having chemical traps |
US7351503B2 (en) | 2001-01-22 | 2008-04-01 | Photronics, Inc. | Fused silica pellicle in intimate contact with the surface of a photomask |
US6686103B2 (en) | 2001-01-22 | 2004-02-03 | Photronics, Inc. | Fused silica pellicle |
US20040121248A1 (en) * | 2001-01-22 | 2004-06-24 | Ben Eynon | Fused silica pellicle in intimate contact with the surface of a photomask |
US6524754B2 (en) | 2001-01-22 | 2003-02-25 | Photronics, Inc. | Fused silica pellicle |
CN104471479A (zh) * | 2012-08-02 | 2015-03-25 | 三井化学株式会社 | 防护膜组件 |
US20150212404A1 (en) * | 2012-08-02 | 2015-07-30 | Mitsui Chemicals, Inc. | Pellicle |
US9658525B2 (en) * | 2012-08-02 | 2017-05-23 | Mitsui Chemicals Inc. | Pellicle |
CN104471479B (zh) * | 2012-08-02 | 2019-01-18 | 三井化学株式会社 | 防护膜组件 |
CN109314276A (zh) * | 2016-06-20 | 2019-02-05 | 索尔维公司 | 氟聚合物薄膜 |
CN109314276B (zh) * | 2016-06-20 | 2022-10-04 | 索尔维公司 | 氟聚合物薄膜 |
Also Published As
Publication number | Publication date |
---|---|
JPH01120555A (ja) | 1989-05-12 |
DE3883707D1 (de) | 1993-10-07 |
DE3883707T2 (de) | 1993-12-16 |
EP0315450B1 (en) | 1993-09-01 |
HK84494A (en) | 1994-08-26 |
EP0315450A3 (en) | 1989-11-15 |
JP2535971B2 (ja) | 1996-09-18 |
SG48394G (en) | 1995-03-17 |
EP0315450A2 (en) | 1989-05-10 |
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