US20150212213A1 - Radiation detector, and x-ray analysis apparatus and radiation detection method using the same - Google Patents

Radiation detector, and x-ray analysis apparatus and radiation detection method using the same Download PDF

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Publication number
US20150212213A1
US20150212213A1 US14/522,717 US201414522717A US2015212213A1 US 20150212213 A1 US20150212213 A1 US 20150212213A1 US 201414522717 A US201414522717 A US 201414522717A US 2015212213 A1 US2015212213 A1 US 2015212213A1
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US
United States
Prior art keywords
radiation
counters
counter
count
radiation detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US14/522,717
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English (en)
Inventor
Takuto Sakumura
Yasukazu NAKAYE
Masataka Maeyama
Kazuyuki Matsushita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Corp filed Critical Rigaku Corp
Assigned to RIGAKU CORPORATION reassignment RIGAKU CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NAKAYE, YASUKAZU, MAEYAMA, MASATAKA, MATSUSHITA, KAZUYUKI, SAKUMURA, TAKUTO
Publication of US20150212213A1 publication Critical patent/US20150212213A1/en
Priority to US15/680,833 priority Critical patent/US9945961B2/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/18—Measuring radiation intensity with counting-tube arrangements, e.g. with Geiger counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/026—Semiconductor dose-rate meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G01T1/171—Compensation of dead-time counting losses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/246—Measuring radiation intensity with semiconductor detectors utilizing latent read-out, e.g. charge stored and read-out later
    • G01V5/22—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
US14/522,717 2013-11-15 2014-10-24 Radiation detector, and x-ray analysis apparatus and radiation detection method using the same Abandoned US20150212213A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/680,833 US9945961B2 (en) 2013-11-15 2017-08-18 Radiation detector, and X-ray analysis apparatus and radiation detection method using the same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013237225A JP6182758B2 (ja) 2013-11-15 2013-11-15 放射線検出器、これを用いたｘ線分析装置および放射線検出方法
JP2013-237225 2013-11-15

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US15/680,833 Continuation US9945961B2 (en) 2013-11-15 2017-08-18 Radiation detector, and X-ray analysis apparatus and radiation detection method using the same

Publications (1)

Publication Number Publication Date
US20150212213A1 true US20150212213A1 (en) 2015-07-30

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
US14/522,717 Abandoned US20150212213A1 (en) 2013-11-15 2014-10-24 Radiation detector, and x-ray analysis apparatus and radiation detection method using the same
US15/680,833 Active US9945961B2 (en) 2013-11-15 2017-08-18 Radiation detector, and X-ray analysis apparatus and radiation detection method using the same

Family Applications After (1)

Application Number Title Priority Date Filing Date
US15/680,833 Active US9945961B2 (en) 2013-11-15 2017-08-18 Radiation detector, and X-ray analysis apparatus and radiation detection method using the same

Country Status (5)

Country Link
US (2) US20150212213A1 (ja)
JP (1) JP6182758B2 (ja)
CN (1) CN104656114B (ja)
DE (1) DE102014223175A1 (ja)
GB (1) GB2521519B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150277894A1 (en) * 2014-03-31 2015-10-01 Qualcomm Incorporated System and Method for Modifying Firmware Used to Initialize a Computing Device

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2911717T3 (es) * 2015-12-28 2022-05-20 Univ Washington Métodos para alinear un espectrómetro
CN106019355B (zh) * 2016-07-07 2018-08-28 清华大学 辐射粒子探测器读出电路及辐射粒子信号计数的方法
JP7088555B2 (ja) * 2019-03-04 2022-06-21 株式会社リガク 放射線検出器および放射線検出方法
CN113219520B (zh) * 2021-05-10 2023-05-16 中国辐射防护研究院 一种可产生单脉冲x射线的辐射装置和方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5617431A (en) * 1979-07-20 1981-02-19 Toshiba Corp Data processor
JPS63127180A (ja) * 1986-11-17 1988-05-31 Nippon X-Ray Kk Ｘ線分析装置
JPS6457189A (en) * 1987-08-28 1989-03-03 Sumitomo Heavy Industries Method for counting discrete pulse
GB8914910D0 (en) * 1989-06-29 1989-08-23 Vg Instr Group Charge transducer
JP2830482B2 (ja) 1991-01-11 1998-12-02 株式会社ニコン 高ダイナミックレンジ撮像装置
JPH06300851A (ja) * 1993-04-15 1994-10-28 Toshiba Corp シンチレーション検出器
JPH10126692A (ja) 1996-10-16 1998-05-15 Sony Corp ビデオカメラとその映像読み出し方法
DE10012337A1 (de) * 2000-03-14 2001-10-11 Peter Fischer Schaltungsanordnung zum kontinuierlichen Zählen von Impulsen ohne Totzeit
JP2003075373A (ja) 2001-08-31 2003-03-12 Rigaku Corp Ｘ線露光装置及びｘ線測定装置
FI119173B (fi) * 2001-11-23 2008-08-29 Planmed Oy Anturijärjestely ja menetelmä digitaalisessa pyyhkäisykuvantamisessa
JP3731207B2 (ja) * 2003-09-17 2006-01-05 株式会社リガク Ｘ線分析装置
EP2076791B1 (en) * 2006-10-25 2015-04-22 Koninklijke Philips N.V. Apparatus, imaging device and method for detecting x-ray radiation
FI122647B (fi) * 2009-06-09 2012-05-15 Planmeca Oy Digitaaliröntgenanturijärjestely ja digitaalinen röntgenkuvantamismenetelmä

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150277894A1 (en) * 2014-03-31 2015-10-01 Qualcomm Incorporated System and Method for Modifying Firmware Used to Initialize a Computing Device
US9547489B2 (en) * 2014-03-31 2017-01-17 Qualcomm Incorporated System and method for modifying a sequence of instructions in a read-only memory of a computing device

Also Published As

Publication number Publication date
GB2521519A (en) 2015-06-24
JP6182758B2 (ja) 2017-08-23
CN104656114B (zh) 2018-08-10
JP2015096841A (ja) 2015-05-21
GB2521519B (en) 2021-01-20
US9945961B2 (en) 2018-04-17
DE102014223175A1 (de) 2015-05-21
CN104656114A (zh) 2015-05-27
US20170371044A1 (en) 2017-12-28
GB201419199D0 (en) 2014-12-10

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Legal Events

Date Code Title Description
AS Assignment

Owner name: RIGAKU CORPORATION, JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SAKUMURA, TAKUTO;NAKAYE, YASUKAZU;MAEYAMA, MASATAKA;AND OTHERS;SIGNING DATES FROM 20140729 TO 20140804;REEL/FRAME:034030/0391

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION