US20060238759A1 - Spectroscopic polarimetry - Google Patents

Spectroscopic polarimetry Download PDF

Info

Publication number
US20060238759A1
US20060238759A1 US11/388,205 US38820506A US2006238759A1 US 20060238759 A1 US20060238759 A1 US 20060238759A1 US 38820506 A US38820506 A US 38820506A US 2006238759 A1 US2006238759 A1 US 2006238759A1
Authority
US
United States
Prior art keywords
retarder
retardation
spectral intensity
light
obtaining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/388,205
Other languages
English (en)
Inventor
Hiroshi Okabe
Kenichi Matoba
Kazuhiko Oka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hokkaido University NUC
Omron Corp
Original Assignee
Hokkaido University NUC
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hokkaido University NUC, Omron Corp filed Critical Hokkaido University NUC
Assigned to NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY, OMRON CORPORATION reassignment NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MATOBA, KENICHI, OKABE, HIROSHI, OKA, KAZUHIKO
Publication of US20060238759A1 publication Critical patent/US20060238759A1/en
Priority to US12/965,165 priority Critical patent/US9645011B2/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
    • E04G21/00—Preparing, conveying, or working-up building materials or building elements in situ; Other devices or measures for constructional work
    • E04G21/14—Conveying or assembling building elements
    • E04G21/16—Tools or apparatus
    • E04G21/20—Tools or apparatus for applying mortar
    • E04G21/201—Trowels
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
    • E04G21/00—Preparing, conveying, or working-up building materials or building elements in situ; Other devices or measures for constructional work
    • E04G21/14—Conveying or assembling building elements
    • E04G21/16—Tools or apparatus
    • E04G21/18—Adjusting tools; Templates
    • E04G21/1808—Holders for bricklayers' lines, bricklayers' bars; Sloping braces
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
    • E04G21/00—Preparing, conveying, or working-up building materials or building elements in situ; Other devices or measures for constructional work
    • E04G21/14—Conveying or assembling building elements
    • E04G21/16—Tools or apparatus
    • E04G21/22—Tools or apparatus for setting building elements with mortar, e.g. bricklaying machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry

Definitions

  • the present invention relates to a technique for stabilizing measurement of spectropolarization characteristics of an object to be measured by use of a channeled spectrum.
  • Light has properties of a “transverse wave”. Based upon the premise of three mutually orthogonal axes (x, y, z), when a propagation direction of light is assumed to be the z-axis direction, a vibration direction of the light is a direction along the x-y plane. The vibration direction of the light within the x-y plane has a bias. This bias of light is referred to as “polarization”. A biased state of light is referred to as a “state of polarization (SOP)” in this specification. Typically, the SOP varies depending upon wavelengths (colors) of light.
  • SOP state of polarization
  • anisotropy of the object to be measured When light in some state of polarization is incident on an object to be measured to acquire outgoing light such as transparent light or reflected light and the object to be measured has optical anisotropy, a change in SOP is observed between the incident light and the outgoing light. Acquiring information on anisotropy of the object to be measured from the change in SOP is referred to as “polarimetry”. It is to be noted that causes of such anisotropy may include anisotropy of a molecular structure, presence of stress (pressure), and presence of a local field and a magnetic field.
  • a measurement in which a change in SOP between the incident light and the outgoing light is obtained with respect to each wavelength and information on anisotropy of an object to be measured is then acquired is especially referred to as “spectroscopic polarimetry”.
  • This spectroscopic polarimetry has an advantage of acquiring a great amount of information as compared to the case of measurement by use of a single wavelength (single color).
  • a device for measuring the change in SOP between the incident light and the outgoing light namely a spectroscopic polarimeter, serves as a key device.
  • spectroscopic polarimetry As fields of application of the spectroscopic polarimetry, there are known the field of spectroscopic ellipsometry, the medical field, and the like.
  • spectroscopic ellipsometry for example, since thickness as well as a complex refractive index of a thin film can be measured in a nondestructive and non-contact manner, spectroscopic polarimetry has been applied to optical electronic devices, examination/study of semiconductors, and the like.
  • attempts have been made for early detection of glaucoma and a cancer cell since several kinds of cells have polarization characteristics.
  • a mechanical or electric polarization control element is used to modulate light to be measured, and from a change in spectral with the modulation, a Stokes parameter or the like is obtained.
  • spectroscopic ellipsometry utilizing the channeled spectropolarimetry has also been reported (cf. “Spectroscopic ellipsometry using channeled spectrum”, written by Kazuhiko Oka and Takayuki Katoh, collected papers of lectures in 26th Study Session on Light Wave Sensing Technology (Light wave Sensing Technology Study Session held by Japan Society of Applied Physics, Dec. 19-20, 2000) pp. 107-114).
  • FIG. 26 A configuration view of an experiment system for explaining the channeled spectroscopic polarimetry is shown in FIG. 26 .
  • white light emitted from a xenon lamp 1 is transmitted through a polarizer 2 and a Babinet-Soleil compensator 3 , to obtain a light wave having an SOP depending upon a frequency ⁇ .
  • Spectral distributions S 0 ( ⁇ ), S 1 ( ⁇ ), S 2 ( ⁇ ) and S 3 ( ⁇ ) of the Stokes parameters of the light wave are obtained by a measurement system 4 surrounded by a dashed line in the figure.
  • a slow axis of the retarder R 2 is inclined at an angle of 45° with respect to a slow axis of the retarder R 1
  • a transmission axis of the analyzer A is arranged in parallel to the slow axis of the retarder R 1 .
  • a phase difference created between the orthogonal polarization components depends upon a frequency.
  • a channeled spectrum including three carrier components is obtained from the spectrometer 5 which functions as an optical spectrum analyzer.
  • An amplitude and a phase of each of the carrier components are modulated by the spectrum distribution of the Stokes Parameters of the light under measurement. It is therefore possible to obtain each of the Stokes Parameters by execution of a signal processing with a computer 6 by use of Fourier transformation.
  • FIG. 28 One example of results of an experiment is shown in FIG. 28 . This is a result obtained in the case of inclining the Babinet-Soleil compensator 3 at an angle of 30° with respect to the slow axis of the retarder R 1 .
  • Three solid lines respectively show spectral distributions S 1 ( ⁇ )/S 0 ( ⁇ ), S 2 ( ⁇ )/S 0 ( ⁇ ), S 3 ( ⁇ )/S 0 ( ⁇ ) of the standardized Stokes parameters. It is thereby understood that the SOP depends upon the frequency.
  • the retardation means a phase difference created between a fast axis component and a slow axis component.
  • advantages can be obtained including that: [1] a mechanically movable element such as a rotating retarder is unnecessary; [2] an active element such as an electro-optic modulator is unnecessary; [3] four Stokes Parameters are obtained at once with one spectrum so that a so-called snap shot measurement can be performed; and [4] the configuration is simple, and thus suitable for size reduction.
  • reference symbol C denotes a birefringent medium as the sample
  • reference symbols R 1 and R 2 respectively denote the first retarder and the second retarder
  • reference symbol A denotes the analyzer
  • an indicator indicates the traveling direction of the light.
  • the present invention was made by noting the problems as described above, and has an object to solve the problem of variations in incident angle of a retarder seen in the conventional channeled spectroscopic polarimetry, to provide a channeled spectroscopic polarimetry and spectroscopic polarimeter which are capable of measurement with even higher accuracy.
  • a spectroscopic polarimetry of the present invention includes the steps of: preparing an object to be measured; preparing a polarimetric spectroscope; and obtaining the spectral intensity of the object to be measured by use of the polarimetric spectroscope.
  • the polarimetric spectroscope includes: a projection optical system; an analyzer for allowing light to transmit therethrough, the light having been emitted from the projection optical system and reflected on or transmitted through the object to be measured; and a means of obtaining the spectral intensity of the light having transmitted through the analyzer.
  • the projection optical system comprises a light source, a polarizer and a plurality of retarders, where the light source, the polarizer and the plurality of retarders are arranged such that light emitted from the light source is irradiated on the object to be measured after passing through the polarizer and the plurality of retarders in this order.
  • the “object to be measured” is a generic term of an object placed in a light path between the projection optical system and the analyzer. Namely, other than a sample having an unknown spectropolarization characteristic that is intended to be an object of the spectroscopic polarimetry, a polarization element having a known spectropolarization characteristic such as a phase compensator is also included in the “object to be measured” when placed in the light path between the projection optical system and the analyzer.
  • a plurality of retarders include: a retarder which is arranged behind the polarizer with respect to the traveling direction of light and whose principal axis is oriented differently from the transmission axis of the polarizer; and another retarder whose principal axis is oriented differently from the principal axis of the above-mentioned retarder.
  • the “analyzer is an optical element showing a different transmittance from that of the polarization component located in an orthogonal direction to the optical element.
  • the “analyzer” is not restricted to have a plate shape or a film shape. For example, a polarization beam splitter is usable as the “analyzer”.
  • the “means of obtaining the spectral intensity” may be using a spectrometer or using the light source where a wavelength is scanned.
  • the spectrometer in the case of using the light source where the wavelength is scanned may be one capable of detecting an amount of light received, and a timing for detecting the amount of light received is corresponded to the wavelength of light.
  • the spectroscopic polarimetry of the present invention since the object to be measured has no influence on the orientation of light to transmit through the retarder, it is possible to perform the spectroscopic polarimetry with high stability.
  • the spectroscopic polarimetry of the present invention may include a step of obtaining at least one of spectropolarization parameters of the object to be measured by use of the obtained spectral intensity.
  • spectropolarization parameter is used in the meaning of a parameter that expresses the spectropolarization characteristic of the object to be measured.
  • the plurality of retarders that the projection optical system comprises may be a first retarder and a second retarder.
  • each of the elements of the projection optical system is arranged such that light emitted from the light source transmits through the polarizer, the second retarder and the first retarder in this order, the orientation of a transmission axis of the polarizer disagrees with the orientation of a principal axis of the second retarder, and the orientation of the principal axis of the second retarder disagrees with the orientation of a principal axis of the first retarder.
  • a first technique is one comprising: obtaining, from the obtained spectral intensity, a spectral intensity component (first spectral intensity component) which nonperiodically vibrates with wavenumber and a spectral intensity component (third spectral intensity component) which vibrates at a frequency depending upon the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and not depending upon the retardation ( ⁇ 1 ( ⁇ )) of the first retarder, with wavenumber; and obtaining at least one of spectropolarization parameters by use of each of the spectral intensity components.
  • first spectral intensity component which nonperiodically vibrates with wavenumber
  • a spectral intensity component third spectral intensity component
  • the optical disposition in this case may be in either a reflection mode or a transmission mode.
  • light allowed to transmit through the analyzer may be light emitted from the projection optical system and reflected on the object to be measured, light that transmitted through the object to be measured, or light scattered by the object to be measured.
  • Examples of the rate of change in amplitude rate which can be obtained by this method include an arctangent ⁇ ( ⁇ ) of a rate of change in amplitude rate which is one of the ellipsometric parameters, and a rate of change in amplitude rate caused by scattering of light due to particles.
  • a second technique is one comprising: obtaining, from the obtained spectral intensity, at least one of a spectral intensity component (second spectral intensity component) which vibrates at a frequency depending upon a difference between a retardation ( ⁇ 1 ( ⁇ )) of the first retarder and a retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber, a spectral intensity component (fourth spectral intensity component) which vibrates at a frequency depending upon the sum of the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber, and a spectral intensity component (fifth spectral intensity component) which vibrates at a frequency depending upon the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and not depending upon the retardation ( ⁇ 2 ( ⁇ )) of the second retarder, with wavenumber; and obtaining at least one of the spectropolarization parameters of the object to be measured by use of the obtained spectral intensity component.
  • the optical disposition in this case may be in either a reflection mode or a transmission mode.
  • light allowed to transmit through the analyzer may be light emitted from the projection optical system and reflected on the object to be measured, light that transmitted through the object to be measured, or light scattered by the object to be measured.
  • the rate of change in phase difference which can be obtained by this method include a phase difference variation ⁇ ( ⁇ ) which is one of the ellipsometric parameters, and a variation in phase difference caused by scattering of light due to particles.
  • a third technique is one comprising: obtaining, from the obtained spectral intensity, at least one of the spectral intensity component (first spectral intensity component) which nonperiodically vibrates with wavenumber and the spectral intensity component (third spectral intensity component) which vibrates at a frequency depending upon the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and not depending upon the retardation ( ⁇ 1 ( ⁇ )) of the first retarder, with wavenumber, and at least one of the spectral intensity component (second spectral intensity component) which vibrates at a frequency depending upon the difference between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber, the spectral intensity component (fourth spectral intensity component) which vibrates at a frequency depending upon the sum of the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber, and the spectral intensity component (fif
  • Examples of the spectropolarization parameter that can be obtained by this method include the rate of change in amplitude rate between linearly polarized light components which are orthogonal to each other along the orientation of the principal axis of the first retarder, such as an arctangent ⁇ ( ⁇ ) of the rate of change in amplitude rate which is one of the ellipsometric parameters and a rate of change in amplitude rate caused by scattering of light due to particles.
  • the optical disposition in this case can be in either a reflection mode or a transmission mode. Namely, light allowed to transmit through the analyzer may be light emitted from the projection optical system and reflected on the object to be measured, light that transmitted through the object to be measured, or light scattered by the object to be measured. scattering of light due to particles.
  • Other examples of the spectropolarization parameter that can be obtained by this method include an azimuth R of a birefringent medium and a retardation ⁇ ( ⁇ ).
  • the foregoing measurement method using the two retarders comprises: obtaining the retardation ( ⁇ 2 ( ⁇ )) of the second retarder from the spectral intensity; and obtaining at least one of the spectropolarization parameters of the object to be measured by use of the obtained spectral intensity and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • Examples of the spectropolarization parameter that can be obtained by this method include the rate of change in amplitude rate between linearly polarized light components which are orthogonal to each other along the orientation of the principal axis of the first retarder, such as an arctangent ⁇ ( ⁇ ) of a rate of a change in amplitude rate as one of the ellipsometric parameters, and a rate of change in amplitude rate caused by scattering of light due to particles.
  • the foregoing measurement method using the two retarders includes a step of acquiring data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder, wherein the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder are obtained from the spectral intensity and the data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder, and at least one of the spectropolarization parameters of the object to be measured is then obtained by use of the obtained spectral intensity, the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • the “data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder” is for example a rate between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder for each wavelength.
  • Obtaining the retardation includes the case of obtaining a parameter equivalent to the retardation.
  • obtaining a complex function including information as to the retardation corresponds to obtaining a parameter equivalent to the retardation.
  • the retardation of the retarder may be calibrated by use of a reference value for calibration of the retardation as well as light for use in measurement.
  • the measurement method using the two retarders includes the steps of: acquiring data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder; and acquiring a reference value ( ⁇ 1 (i) ( ⁇ )) for calibration of retardation of the first retarder and a reference value ( ⁇ 2 (i) ( ⁇ )) for calibration of retardation of the second retarder, wherein the retardation ( ⁇ 2 (i) ( ⁇ )) of the second retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder from the reference value ( ⁇ 2 (i) ( ⁇ )) for calibration of the retardation are obtained from the obtained spectral intensity; the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder is obtained by use of the obtained retardation variation ( ⁇ 2 ( ⁇
  • the “data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder” is for example a rate between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder for each wavelength. To this rate for each wavelength, it is possible to apply the rate between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder for each wavelength so long as a medium of the first retarder is the same as that of the second retarder.
  • phase unwrapping which is performed in obtaining the retardation of the first retarder from the retardation of the second retarder, may cause a calculation error of retardation of the first retarder, thereby leading to generation of the calculation error of the spectropolarization parameter.
  • Phase unwrapping is a process of determining a value of retardation of the second retarder such that the value of retardation of the second retarder continuously changes over the range of 2 ⁇ with respect to a wavelength change.
  • the retardation of the first retarder is obtained by applying the “data showing the relation between the retardation of the first retarder and the retardation of the second retarder” to the retardation of the second retarder after phase unwrapping.
  • the retardation of the second retarder after phase unwrapping could be calculated by a wrong unit, 2 ⁇ .
  • the retardation of the first retarder is obtained from the retardation of the second retarder including the error by the unit of 2 ⁇ as thus described, the retardation of the first retarder typically includes an error not by the unit of 2 ⁇ , and the included error becomes a large error when the spectropolarization parameter is calculated.
  • the retardation variation of the second retarder changes modestly with wavenumber, performing phase unwrapping on the retardation variation of the second retarder is unnecessary, or necessary only in a small frequency, which enables elimination of, or extreme reduction in, the possibility for generation of an error in the retardation variation of the first retarder due to phase unwrapping.
  • the polarizer and the second retarder may be arranged such that an angle between the orientation of the transmission axis of the polarizer and the orientation of a fast axis of the second retarder is 45°.
  • the spectroscopic polarimetry for obtaining at least one of the spectropolarization parameters further includes a step of obtaining a spectral intensity for calibration by use of the polarimetric spectroscope in a state where an object to be measured having an unknown spectropolarization characteristic does not exist in a light path between the projection optical system and the analyzer, wherein at least one of the spectropolarization parameters of the object to be measured is obtained by use of the obtained spectral intensity regarding the object to be measured and the spectral intensity for calibration or data based upon the spectral intensity for calibration.
  • an object to change the spectropolarization state of light may be prevented from existing in the light path between the projection optical system and the analyzer, or an object having a known spectropolarization characteristic may exist in the light path.
  • an analyzer for calibration may be prepared in a position in which light emitted from the projection optical system is received in a state where the object to be measured having an unknown spectropolarization characteristic does not exist in the light path between the projection optical system and the analyzer, and a spectral intensity of light having passed through the analyzer for calibration may be obtained.
  • the analyzer for calibration may be prepared separately from the analyzer for measurement, or the position of the analyzer for measurement may be temporarily changed so that the analyzer for measurement may be used as the analyzer for calibration.
  • the spectroscopic polarimetry using the spectral intensity for calibration may include a step of obtaining the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder by use of the spectral intensity for calibration, wherein at least one of the spectropolarization parameters of the object to be measured may be obtained by use of the obtained spectral intensity regarding the object to be measured, the retardation ( ⁇ 1 ( ⁇ )) of the first retarder, and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder, which are obtained by means of the spectral intensity for calibration.
  • the spectral intensity for calibration may be obtained by use of the polarimetric spectroscope in a state where the object to be measured having an unknown spectropolarization characteristic does not exist in the light path between the projection optical system and the analyzer, and the data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder may be obtained by use of the obtained spectral intensity for calibration.
  • the spectral intensity for calibration may be obtained by use of the polarimetric spectroscope in a state where the object to be measured having an unknown spectropolarization characteristic does not exist in the light path between the projection optical system and the analyzer, and the data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder may be obtained by use of the obtained spectral intensity for calibration.
  • a spectroscopic quasi-Stokes parameter of the object to be measured may be obtained by use of the obtained spectral intensity.
  • the plurality of retarders that the projection optical system comprises may be a first retarder and a second retarder.
  • each of the elements of the projection optical system is arranged such that light emitted from the light source transmits through the polarizer, the second retarder and the first retarder in this order, the orientation of the transmission axis of the polarizer disagrees with the orientation of the principal axis of the second retarder, and the orientation of the principal axis of the second retarder disagrees with the orientation of the principal axis of the first retarder.
  • the spectroscopic polarimetry may include a step of acquiring data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder. From the obtained spectral intensity, at least one of the spectral intensity component (first spectral intensity component) which nonperiodically vibrates with wavenumber and the spectral intensity component (third spectral intensity component) which vibrates at a frequency depending upon the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and not depending upon the retardation ( ⁇ 1 ( ⁇ )) of the first retarder, with wavenumber, and at least one of the spectral intensity component (second spectral intensity component) which vibrates at a frequency depending upon the difference between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber, the spectral intensity component (fourth spectral intensity component) which vibrates at a frequency depending upon the sum of the retardation
  • the retardation ( ⁇ 1 ( ⁇ )) of the first retarder, the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and the spectroscopic quasi-Stokes parameter may then be obtained by use of the data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder, and each of the obtained spectral intensity components.
  • the meaning of “obtaining the spectroscopic quasi-Stokes parameter” includes obtaining all or part of four spectroscopic quasi-Stokes parameters M 0 , M 1 , M 2 , M 3 (respective definitonal equations for these parameters are provided in DETAILED DESCRIPTION OF THE INVENTION). Whether or not all the spectroscopic quasi-Stokes parameters are practically obtained is referred to a choice of a person implementing the spectroscopic polarimetry. However, according to the spectroscopic polarimetry of the present invention, it is possible in theory to obtain all the spectroscopic quasi-Stokes parameters.
  • the first spectral intensity component and a reference amplitude function m 0 ( ⁇ ) are needed.
  • the third spectral intensity component, the retardation of the second retarder and a reference amplitude function m 2 ( ⁇ ) are needed.
  • the retardation of the first retarder and a reference amplitude function m 1 ( ⁇ ) is needed.
  • the reference amplitude functions needed for obtaining the spectroscopic quasi-Stokes parameter need to be made usable when the spectroscopic quasi-Stokes parameter is obtained.
  • spectroscopic polarimetry for obtaining the spectroscopic quasi-Stokes parameter, an active element such as a mechanically moving part or an electric optical modulator for polarization control is not necessary.
  • the spectroscopic polarimetry by acquiring a one-time spectral, it is possible in theory to obtain all spectroscopic quasi-Stokes parameter of the object to be measured, and further possible to effectively reduce a measurement error of the spectroscopic quasi-Stokes parameter generated caused by variations in retardation of the retarder due to a temperature change or other factors.
  • By performing further calculation by use of the spectroscopic quasi-Stokes parameters it is possible to obtain a variety of spectropolarization parameters regarding the object to be measured. Especially in a case where a Mueller matrix of the object to be measured is determined from only two to three parameters at most, an arbitrary spectropolarization parameter can be obtained from the spectroscopic quasi-Stokes parameters.
  • the spectroscopic polarimetry for obtaining the spectroscopic quasi-Stokes parameter includes the steps of acquiring data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder by use of the two retarders; and acquiring a reference value ( ⁇ 1 (i) ( ⁇ )) for calibration of retardation of the first retarder and a reference value ( ⁇ 2 (i) ( ⁇ )) for calibration of retardation of the second retarder.
  • the spectral intensity component which nonperiodically vibrates with wavenumber and the spectral intensity component (third spectral intensity component) which vibrates at a frequency depending upon the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and not depending upon the retardation ( ⁇ 1 ( ⁇ )) of the first retarder, with wavenumber
  • the spectral intensity component which vibrates at a frequency depending upon the difference between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber
  • the spectral intensity component fourth spectral intensity component which vibrates at a frequency depending upon the sum of the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder with wavenumber
  • the spectral intensity component fifth
  • the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder from the reference value ( ⁇ 2 (i) ( ⁇ ) for calibration may be obtained by use of the obtained spectral intensity.
  • the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder may be obtained by use of the obtained retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder and data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • the retardation ( ⁇ 1 ( ⁇ )) of the first retarder may be obtained from the reference value ( ⁇ 1 (i) ( ⁇ )) for calibration of retardation of the first retarder and the obtained retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder.
  • the spectroscopic quasi-Stokes parameter may be obtained by use of each of the obtained spectral intensity components, the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • a polarimetric spectroscope of the present invention comprises: a projection optical system, comprising a light source, a polarizer and a plurality of retarders, where the light source, the polarizer and the plurality of retarders are arranged such that light emitted from the light source is irradiated on the object to be measured after passing through the polarizer and the plurality of retarders in this order; an analyzer for allowing light to transmit therethrough, the light having been emitted from the projection optical system and reflected on or transmitted through the object to be measured; and a means of obtaining the spectral intensity of the light having transmitted through the analyzer.
  • the direction of light that transmits through the retarder is unsusceptible to the object to be measured, enabling spectroscopic polarimetry with high stability.
  • the plurality of retarders that the projection optical system comprises may be a first retarder and a second retarder.
  • each of the elements of the projection optical system is arranged such that light emitted from the light source transmits through the polarizer, the second retarder and the first retarder in this order, the orientation of a transmission axis of the polarizer disagrees with the orientation of a principal axis of the second retarder, and the orientation of the principal axis of the second retarder disagrees with the orientation of a principal axis of the first retarder.
  • the polarizer and the second retarder may be arranged such that an angle between the orientation of the transmission axis of the polarizer and the orientation of a fast axis of the second retarder is 45°.
  • the spectroscopic polarimetry of the present invention may comprise: an analyzer for calibration, detachably provided in a position in which light emitted from the projection optical system is received in a state where an object to be measured having an unknown spectropolarization characteristic does not exist in the light path between the projection optical system and the analyzer; and a means of obtaining the spectral intensity of the light having transmitted through the analyzer for calibration.
  • the whole or part of the “means of obtaining the spectral intensity of the light having transmitted through the analyzer” may double as the “means of obtaining the spectral intensity of the light having transmitted through the analyzer for calibration”.
  • the use of this polarimetric spectroscope enables calibration even in a state where an object to bend the light path, in the same manner as in the case of existence of the object to be measured, does not exist in the light path.
  • an object having a known spectropolarization characteristic may exist in the light path. It is therefore possible to perform calibration by singly using the device, prior to installation of the object to be measured in the device, or installation of the device on the object to be measured.
  • the polarimetric spectroscope of the present invention may further comprise an optical fiber for projecting light which guides the light emitted from the light source to the polarizer.
  • the light source can be installed in a position apart from the measurement place, thereby facilitating size reduction in a portion of the polarimetric spectroscope, the portion being used in the vicinity of the measurement place.
  • the means of obtaining a spectral intensity may comprise a light-reception element or a spectrometer, and may further comprise an optical fiber for receiving light which guides the light having transmitted through the analyzer to the light-reception element or the spectrometer.
  • the light source can be installed in a position apart from the measurement place, thereby facilitating size reduction in a portion of the polarimetric spectroscope, the portion being used in the vicinity of the measurement place.
  • a spectroscopic polarimeter of the present invention comprises the foregoing polarimetric spectroscope of the present invention and an arithmetic unit for obtaining at least one of spectropolarization parameters of an object to be measured, by use of a spectral intensity of light having transmitted through an analyzer.
  • the plurality of retarders that the projection optical system comprises may be a first retarder and a second retarder.
  • each of the elements of the projection optical system is arranged such that light emitted from the light source transmits through the polarizer, the second retarder and the first retarder in this order, the orientation of a transmission axis of the polarizer disagrees with the orientation of a principal axis of the second retarder, and the orientation of the principal axis of the second retarder disagrees with the orientation of a principal axis of the first retarder.
  • the arithmetic unit of this spectroscopic polarimeter is made capable of using data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder may be obtained from the spectral intensity of the light having transmitted through the analyzer and the data showing the relation between the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • At least one of the spectropolarization parameters of the object to be measured may then be obtained by use of the spectral intensity of the light having transmitted through the analyzer, the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • the plurality of retarders that the projection optical system comprises may be a first retarder and a second retarder.
  • the arithmetic unit is made capable of using data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder, a reference value ( ⁇ 1 (i) ( ⁇ )) for calibration of retardation of the first retarder and a reference value ( ⁇ 2 (i) ( ⁇ )) for calibration of retardation of the second retarder.
  • the retardation ( ⁇ 2 ( ⁇ )) of the second retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder from the reference value ( ⁇ 2 (i) ( ⁇ )) for calibration may be obtained from the spectral intensity of the light having transmitted through the analyzer
  • the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder may be obtained by use of the obtained retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder and data showing the relation between the retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation variation ( ⁇ 2 ( ⁇ )) of the second retarder
  • the retardation ( ⁇ 1 ( ⁇ )) of the first retarder may be obtained from the reference value ( ⁇ 1 (i) ( ⁇ )) for calibration of retardation of the first retarder and the obtained retardation variation ( ⁇ 1 ( ⁇ )) of the first retarder.
  • At least one of the spectropolarization parameters of the object to be measured may then be obtained by use of the obtained spectral intensity, the retardation ( ⁇ 1 ( ⁇ )) of the first retarder and the retardation ( ⁇ 2 ( ⁇ )) of the second retarder.
  • An optical device of the present invention comprises: a projection optical system, comprising a polarizer and a plurality of retarders, where the polarizer and the plurality of retarders are arranged such that light incident on the polarizer is irradiated on the object to be measured after passing through the polarizer and the plurality of retarders in this order; and an analyzer for allowing light to transmit therethrough, the light having been emitted from the projection optical system and reflected on or transmitted through the object to be measured.
  • Such an optical device can be used for the foregoing polarimetric spectroscope.
  • a light-projection device of the present invention comprises a polarizer and a plurality of retarders, wherein the polarizer and the plurality of retarders are arranged such that light incident on the polarizer is irradiated on the object to be measured after passing through the polarizer and the plurality of retarders in this order.
  • Such a light-projection device can be used for the foregoing polarimetric spectroscope.
  • the plurality of retarders may be a first retarder and a second retarder.
  • Each of the elements of the light-projection device may be arranged such that light incident on the polarizer transmits through the polarizer, the second retarder and the first retarder in this order, the orientation of a transmission axis of the polarizer disagrees with the orientation of a principal axis of the second retarder, and the orientation of the principal axis of the second retarder disagrees with the orientation of a principal axis of the first retarder.
  • the polarization element here refers to a polarization element in a case where the object to be measured is composed of a sample and a polarization element on which light, having transmitted through or been reflected on the sample, is incident.
  • the polarization element is an optical element where incident light and outgoing light have a relation depending upon polarization.
  • a means of changing the azimuth angle of the polarization element it is possible to use, for example, a means of changing the azimuth angle of the polarization element, a means of changing the retardation of the polarization element, and some other means.
  • a polarimetric spectroscope further comprising a means of changing the azimuth angle of the analyzer may be used.
  • a spectral intensity regarding the object to be measured may be obtained in a plurality of states where azimuth angles of the analyzer are made different from one another, and at least one of the spectropolarization parameters of the object to be measured may be obtained by use of the obtained spectral intensity.
  • an object to be measured including a sample and a polarization element is prepared.
  • the polarimetric spectroscope further comprising a means of changing the characteristic of the polarization element, is used.
  • a spectral intensity regarding the object to be measured may be obtained in a plurality of states where characteristics of the polarization element are made different from one another. At least one of spectropolarization parameters of the sample may then be obtained by use of the obtained spectral intensity.
  • the spectroscopic polarimetry may be used which further comprises a means of changing the azimuth angle of the analyzer in addition to the means of changing the characteristic of the polarization element.
  • a spectral intensity regarding the object to be measured may be obtained in a plurality of states where characteristics of the polarization element or azimuth angles of the analyzer are made different from one another. At least one of spectropolarization parameters of the sample may then be obtained by use of the obtained spectral intensity.
  • the polarimetric spectroscope of the present invention may further comprise a means of changing the azimuth angle of the analyzer.
  • This polarimetric spectroscope may be combined with an arithmetic unit for obtaining at least one of spectropolarization parameters of the object to be measured by use of this spectroscopic polarimetry a spectral intensity regarding the object to be measured obtained in a plurality of states where azimuth angles of the analyzer are made different from one another, to give a spectroscopic polarimeter.
  • the polarimetric spectroscope of the present invention may further comprise a means of changing the characteristic of the polarization element.
  • This polarimetric spectroscope may be combined with an arithmetic unit for obtaining at least one of spectropolarization parameters of the sample by use of a spectral intensity regarding the object to be measured obtained in a plurality of states where characteristics of the polarization element are made different from one another, to give a spectroscopic polarimeter.
  • the spectroscopic polarimetry may further comprise a means of changing the azimuth angle of the analyzer in addition to the means of changing the characteristic of the polarization element.
  • This polarimetric spectroscope may be combined with an arithmetic unit for obtaining at least one of spectropolarization parameters of the sample by use of a spectral intensity regarding the object to be measured obtained in a plurality of states where characteristics of the polarization element or azimuth angles of the analyzers are made different from one another, to give a spectroscopic polarimeter.
  • the optical device of the present invention may further comprise a means of changing the azimuth angle of the analyzer.
  • the optical device of the present invention may further comprise a means of changing the characteristic of the polarization element.
  • the optical device may further comprise a means of changing the azimuth angle of the analyzer in addition to the means of changing the characteristic of the polarization element.
  • the characteristic of the polarization element or the azimuth angle of the analyzer changeable, it is possible to obtain a spectral intensity in a plurality of states where characteristics of the polarization element or azimuth angles of the analyzers are made different from one another.
  • a relatively many kinds of spectropolarization parameters can be obtained, and an error due to an influence such as noise included in the obtained value of the spectropolarization parameter can be reduced.
  • the characteristic of the polarizer or the azimuth angle of the analyzer can be selected such that a specific one or more than one kinds of spectropolarization parameters of the object to be measured or the sample can be obtained with high sensitivity.
  • the present invention it is possible to perform the spectroscopic polarimetry with high stability since the direction of light that transmits through the retarder is not susceptible to the object to be measured.
  • FIG. 1 shows a view for explaining a principle of solving a problem.
  • FIG. 2 shows a view for explaining a configuration of an optical system device and an azimuth angle of each optical element.
  • FIG. 3 shows a view for explaining spectroscopic polarimetry.
  • FIG. 4 shows a view for explaining a relation between a channeled spectrum obtained from a spectrometer and its four components.
  • FIG. 5 shows a view for explaining a procedure (flows of signal processing) for demodulating a spectrometric quasi-Stokes parameter.
  • FIG. 6 shows a view for explaining one example of Step 2.
  • FIG. 7 shows a view for explaining Fourier transformation.
  • FIG. 8 shows a view for explaining flows of signals for calibration during measurement.
  • FIG. 9 shows a view for explaining flows of signals in combination of “calibration during measurement” and “measurement of a spectrometric quasi-Stokes parameter”.
  • FIG. 10 shows a comparative view for explaining methods (No. 1, 2) for calibrating a reference phase function during measurement.
  • FIG. 11 shows a device configuration view (No. 1) in ellipsometry.
  • FIG. 12 shows a device configuration view (No. 2) in ellipsometry.
  • FIG. 13 shows a view for explaining a principle of solving a problem in the case of reflecting light on a sample.
  • FIG. 14 shows a view for explaining a device configuration in the case of separately installing an optical system for calibration.
  • FIG. 15 shows a view for explaining a polarization state of light reflected on the sample.
  • FIG. 16 shows a view for explaining a device configuration (No. 1) in a double refraction measurement.
  • FIG. 17 shows a view for explaining a device configuration (No. 2) in the double refraction measurement.
  • FIG. 18 shows a view for explaining a principle of solving the problem in the case of allowing light to transmit through the sample.
  • FIG. 19 shows a view for explaining a device configuration in the case of arranging a polarization element having a known spectropolarization characteristic in front of or behind the sample.
  • FIG. 20 shows a configuration view (No. 1) of one example of a spectroscopic polarimeter.
  • FIG. 21 shows a configuration view (No. 2) of one example of the spectroscopic polarimeter.
  • FIG. 22 shows a flowchart of a pre-calibration procedure.
  • FIG. 23 shows a flowchart of a measurement procedure.
  • FIG. 24 shows a view (No. 1) for explaining variations in wave surface of light that passes through a retarder in the incident direction.
  • FIG. 25 shows a view (No. 2) for explaining variations in wave surface of the light that passes through the retarder in the incident direction.
  • FIG. 26 shows a configuration view of an experimental system of channeled spectroscopic polarimetry.
  • FIG. 27 shows a graph of a Stokes parameter in the experimental system.
  • FIG. 28 shows a graph of a standardized Stokes parameter in the experimental system.
  • FIG. 29 shows a device configuration view in the case of measuring a spectropolarization parameter of the sample.
  • FIG. 30 shows a view of a configuration of a channeled spectroscopic polarization state generator (CSPSG).
  • CSPSG channeled spectroscopic polarization state generator
  • FIG. 1 shows a view for explanation comparing a configuration of an optical system in a conventional channeled spectroscopic polarimetry and a configuration of an optical system in a channeled spectroscopic polarimetry of the embodiment of the present invention.
  • the optical system (cf. FIG. 1B ) in the conventional channeled spectroscopic polarimetry is comprised of a light source 7 , a polarizer P, and a polarimeter.
  • the polarimeter is comprised of two thick retarders R 1 and R 2 , an analyzer A and a spectrometer 8 .
  • reference symbol D denotes a sample through which light is transmitted or on which light is reflected.
  • fast axes of the retarder R 1 and the retarder R 2 are inclined at an angle of 45° from each other.
  • a transmission axis of the analyzer A agrees with the fast axis of the retarder R 1 .
  • crossing angles among these three elements may not necessarily be 45°. Measurement is possible even with a different crossing angle, although less efficient to some extent. In short, any crossing angle can be applied so long as principal axes of the adjacent elements are not superposed on each other. A description in this respect is given later. What is important is that each element is fixed and thus not required to be rotated or modulated as in the conventional method.
  • SOP state of polarization
  • ⁇ is a “wavenumber” defined by an inverse number of a wavelength ⁇ .
  • coordinate axes x and y for determining the spectrometric Stokes parameters is taken so as to agree with the fast and late axes of the retarder R 1 .
  • the light incident on the spectrometer passes in this order through the retarders R 1 and R 2 and the analyzer A, and is incident on the polarimeter 8 .
  • the Stokes parameters depending upon the wavenumber a are obtained from a spectrum acquired from the polarimeter 8 .
  • the optical system shown in FIG. 1B has caused a problem of a variety of changes in incident direction of the wave surface of the light that transmits through the retarder under the influence of the sample to result in generation of an error in spectroscopic polarimetry.
  • the present invention is provided to solve such a problem.
  • the optical system of the embodiment of the present invention shown in FIG. 1A is comprised of the light source 7 , the polarizer P, the retarders R 2 and R 1 , the analyzer A and the spectroscope 8 .
  • the light emitted from the light source 7 transmits through the polarizer P, the retarder R 2 and the retarder R 1 in this order, and is reflected on or transmits through the sample D.
  • the light then transmits through the analyzer A, and is incident on the spectroscope 8 . Thereafter, a spectrum of the incident light is acquired in the spectroscope 8 , and spectropolarization parameters of the sample and the like are calculated according to a later-described procedure.
  • the “spectropolarization parameter” is used in the meaning of a parameter for expressing the spectropolarization characteristic of the object to be measured.
  • This is a generic name of parameters for use in quantitatively expressing a polarization change caused by reflection or transmission of light on or through the object to be measured.
  • the spectropolarization parameter include ellipsometric parameters ⁇ ( ⁇ ), ⁇ ( ⁇ ), and a retardation ⁇ ( ⁇ ) of a double refraction medium. It should be noted that, although the spectropolarization characteristic of the object to be measured is typically expressed completely by 16 elements of a 4 ⁇ 4 Mueller matrix, there are few cases where all of those 16 elements are independent variables.
  • the retarders R 2 and R 1 have been arranged on the light-source side with respect to the sample D. This makes it possible to keep the incident direction of the wave surface of light to be incident on the retarder constant so as to realize highly-accurate, stable spectroscopic polarimetry. It should be noted that variations in incident direction of the wave surface of light to be incident on the analyzer A has almost no influence on the measurement result. This leads to solving the foregoing problem of the retardation change due to changes in distance and direction of a light ray that passes through the retarder during calibration of the retardation and during sample measurement.
  • This optical system is comprised of the light source 7 , the polarizer P, the retarders R 2 and R 1 , the analyzer A and the spectroscope 8 .
  • reference symbol D denotes a sample.
  • the orientations of the fast axes of the retarders R 1 and R 2 are inclined at an angle of 45° from each other.
  • the orientation of a transmission axis of the polarizer P agrees with the orientation of the fast axis of the retarder R 1 .
  • the fast axes of the retarders are denoted by “fast” and the slow axes thereof are denoted by “slow”.
  • ⁇ is the azimuth angle of the transmission axis of the analyzer with respect to the fast axis of the retarder R 1 .
  • M ⁇ ( ⁇ ) [ m ⁇ 00 ⁇ ( ⁇ ) m ⁇ 01 ⁇ ( ⁇ ) m ⁇ 02 ⁇ ( ⁇ ) m ⁇ 03 ⁇ ( ⁇ ) m ⁇ 10 ⁇ ( ⁇ ) m ⁇ 11 ⁇ ( ⁇ ) m ⁇ 12 ⁇ ( ⁇ ) m ⁇ 13 ⁇ ( ⁇ ) m ⁇ 20 ⁇ ( ⁇ ) m ⁇ 21 ⁇ ( ⁇ ) m ⁇ 22 ⁇ ( ⁇ ) m ⁇ 23 ⁇ ( ⁇ ) m ⁇ 30 ⁇ ( ⁇ ) m ⁇ 31 ⁇ ( ⁇ ) m ⁇ 32 ⁇ ( ⁇ ) m ⁇ 33 ⁇ ( ⁇ ) ] ( 1.1 )
  • Stokes Parameters are composed of four parameters having definitions as follows:
  • S 1 difference between intensities of linearly polarized light components with angles of 0° and 90°.
  • the Mueller matrix is described with reference to FIG. 3 .
  • the Mueller matrix is a matrix for expressing an interaction of light of reflection, transmission, etc. on or through a sample as an object to be measured.
  • the following case is considered.
  • Light whose SOP is expressed by S( ⁇ ) as a state of polarization 1 is incident on the sample, and comes under the influence of a polarization element and an object to be measured such as the sample.
  • Light is then emitted whose SOP is expressed by S′( ⁇ ) as a state of polarization 2 (cf. FIG. 3A ).
  • the Mueller matrix of the object to be measured is expressed by a relational expression as a 4 ⁇ 4 matrix shown in FIG. 3B (cf. FIG. 3B ).
  • a retarder is an element having the property of changing a phase difference between mutually orthogonal linearly polarized light components before and after transmission of light through the element. An amount of such a change in phase difference is referred to as retardation.
  • coordinate axes taken along the two linearly polarized light directions are referred to as principal axes. Among them, the axis along the linearly polarized light whose phase relatively moves fast is referred to as a fast axis, and the other axis is referred to as a slow axis.
  • a spectrum (spectral intensity) acquired in the spectrometer 8 is expressed by the following expression.
  • P ⁇ ( ⁇ ) ⁇ 1 2 ⁇ m 0 ⁇ ( ⁇ ) ⁇ M 0 ⁇ ( ⁇ ) + 1 4 ⁇ m_ ⁇ ( ⁇ ) ⁇ ⁇ M 23 ⁇ ( ⁇ ) ⁇ ⁇ cos ⁇ ⁇ ⁇ 2 ⁇ ( ⁇ ) - ⁇ 1 ⁇ ( ⁇ ) + arg ⁇ ( M 23 ⁇ ( ⁇ ) ) ⁇ + ⁇ 1 2 ⁇ m 2 ⁇ ( ⁇ ) ⁇ M 1 ⁇ ( ⁇ ) ⁇ cos ⁇ ⁇ ⁇ 2 ⁇ ( ⁇ ) - ⁇ 1 4 ⁇ m + ⁇ ( ⁇ ) ⁇ ⁇ M 23 ⁇ (
  • the spectroscopic quasi-Stokes parameter is expressed by the sum of values each obtained by multiplying each element of each column of the Mueller matrix of the sample by a coefficient determined by an azimuth of the analyzer.
  • the spectropolarization parameter of the sample can be obtained by simultaneously solving the equations of 1.6a to 1.6d.
  • m 0 ( ⁇ ), m ⁇ ( ⁇ ), m 2 ( ⁇ ), and m + ( ⁇ ) each shows a ratio of amplitude attenuation due to failure of the spectrometer to follow a fine vibration component.
  • P 0 ( ⁇ ) shows a “spectrum of the light source”.
  • the “spectrum of the light source” P 0 ( ⁇ ) includes the attenuated portion.
  • ⁇ 1 and ⁇ 2 are retardations of the retarder R 1 and R 2 .
  • M ⁇ ( ⁇ ) [ m ⁇ 00 ⁇ ( ⁇ ) m ⁇ 10 ⁇ ( ⁇ ) m ⁇ 20 ⁇ ( ⁇ ) m ⁇ 01 ⁇ ( ⁇ ) m ⁇ 11 ⁇ ( ⁇ ) m ⁇ 21 ⁇ ( ⁇ ) m ⁇ 02 ⁇ ( ⁇ ) m ⁇ 12 ⁇ ( ⁇ ) m ⁇ 22 ⁇ ( ⁇ ) m ⁇ 03 ⁇ ( ⁇ ) m ⁇ 13 ⁇ ( ⁇ ) m ⁇ 23 ⁇ ( ⁇ ) m ⁇ 30 ⁇ ( ⁇ ) m ⁇ 31 ⁇ ( ⁇ ) m ⁇ 32 ⁇ ( ⁇ ) m ⁇ 33 ⁇ ( ⁇ ) ] (
  • the spectrum P( ⁇ ) obtained from the spectrometer contains four components. One of them is a component gently varies with wavenumber ⁇ , and the other three components are quasi-sinusoidal components that vibrate with wavenumber ⁇ . These are schematically shown in FIG. 4 .
  • each of the three vibration components are respectively 1/L, 1/L 2 and 1/L + .
  • the spectrum containing components that periodically finely vibrate with wavenumber (wavelength) as in the figure is referred to as a channeled spectrum.
  • the component that gently varies with wavenumber a depends not only upon M 0 ( ⁇ ) but additionally upon M 1 ( ⁇ ).
  • this component has information of M 23 ( ⁇ ), as in the cases of the two respective components that vibrate according to ( ⁇ 2 ( ⁇ ) ⁇ 1 ( ⁇ )) and ( ⁇ 2 ( ⁇ )+ ⁇ 1 ( ⁇ )). It means that this term can be treated in the same manner as the other two terms including M 23 ( ⁇ ).
  • the channeled spectrum can take the form of Expression (1.4) under a condition that the fast axis of the retarder R 2 and the transmission axis of the polarizer P cross each other at an angle of ⁇ 45°. Meanwhile, whether the angle formed between the fast axes of the retarders R 1 and R 2 agrees with ⁇ 45° or not is irrelevant.
  • Step 1 Each term is separated from Spectrum P(ca).
  • Step 2 An amplitude and a phase of each component are obtained. (Or equivalent quantities, e.g. a real part and an imaginary part in complex representation are obtained).
  • Step 3 Reference functions (below) included in the amplitude and phase of each vibration component are removed.
  • Spectrometric Stokes parameters M 0 ( ⁇ ), M 1 ( ⁇ ), M 2 ( ⁇ ), and M 3 ( ⁇ ) are then obtained (These reference functions are peculiar to the polarimeter, depending not upon the sample but only upon parameters of the polarimeter.
  • the spectrum P( ⁇ ) contains four components.
  • An operation for taking out each component by a signal processing is performed. What is applied to this operation is that each component vibrates at a different period (frequency).
  • frequency filtering techniques being broadly used in fields of communication engineering, signal analysis and the like, it is possible to separate each component.
  • Component [1] above is a first spectral intensity component which nonperiodically vibrates with wavenumber.
  • Component [2] is a second spectral intensity component which vibrates at a frequency depending upon a difference between a reference phase function (retardation) ⁇ 1 ( ⁇ ) of the first retarder R 1 and a reference phase function (retardation) ⁇ 2 ( ⁇ ) of the second retarder R 2 with wavenumber.
  • Component [3] is a third spectral intensity component which vibrates at a frequency depending upon the reference phase function ⁇ 2 ( ⁇ ) of the second retarder and not depending upon the reference phase function ⁇ 1 ( ⁇ ) of the first retarder, with wavenumber.
  • Component [4] is a fourth spectral intensity component which vibrates at a frequency depending upon the sum of the reference phase function ⁇ 1 ( ⁇ ) of the first retarder and the reference phase function ⁇ 2 ( ⁇ ) of the second retarder with wavenumber. It is to be noted that, when the crossing angle between the elements is not 45°, Component [5] is generated. Component [5] vibrates at a frequency depending upon the reference phase function ⁇ 1 ( ⁇ ) of the first retarder and not depending upon the reference phase function ⁇ 2 ( ⁇ ) of the second retarder, with wavenumber.
  • M 0 is obtained from Component [1]
  • M 1 is from Component [3]
  • M 2 and M 3 are from Component [2] or Component [4]. It should be noted that, when the crossing angle between the elements is not 45°, M 2 and M 3 are obtained at least one of Component [2], Component [4] and Component [5].
  • Step 1 As for each component separated in Step 1, a “paired amplitude and phase” and a “complex representation” are obtained, as shown in FIG. 6 .
  • This can be readily realized by using a variety of demodulation methods in an operation which are common in fields of communication engineering, signal analysis and the like, as in
  • Step 1 Examples of those methods include:
  • Amplitude demodulation rectifying demodulation, envelope demodulation, etc.
  • Phase demodulation frequency discrimination, zero-crossing method, etc.
  • each of the separated components except for Component [1] takes the form of: a( ⁇ )cos ⁇ ( ⁇ ).
  • a( ⁇ ) and ⁇ ( ⁇ ) here are respectively referred to as the “amplitude” and “phase” of the vibration component.
  • the amplitude of Component [1] can also be defined.
  • F( ⁇ ) having the following relation with the amplitude and the phase is called a complex representation.
  • demodulation of one of the paired amplitude and phase and the complex representation enables immediate calculation of the other according to need.
  • the spectrometer parameters M 0 ( ⁇ ), M 1 ( ⁇ ), M 2 ( ⁇ ), and M 3 ( ⁇ ) are determined as functions of the wavenumber ⁇ .
  • the “amplitude” and the “phase” obtained in Step 2 above include, other than the spectrometric Stokes parameters to be obtained, parameters shown below.
  • each of these parameters is hereinafter referred to as a “reference amplitude function” or a “reference phase function”. Since these parameters do not depend upon the sample, each of the parameters is subjected to division or subtraction, to be determined as follows.
  • Steps 1 and 2 are concurrently realized.
  • Step 3 is performed using the results of Steps 1 and 2
  • spectrometric quasi-Stokes parameters are obtained all at once.
  • Step 3 when a spectrometric quasi-Stokes parameter is determined from a channeled spectrum, it is necessary in Step 3 to in advance determine parameters to be obtained based only upon a characteristic of a polarimeter itself parameters, namely:
  • the former (“reference amplitude function” and “reference phase function”) and the latter (“reference complex function”) are required in the respective cases of obtaining spectrometric quasi-Stokes parameters from the “amplifier and phase” and the “complex representation” of each vibration component. Since these are functions not depending upon the sample, it is desirable to calibrate the functions at least prior to measurement.
  • Characteristics of a reference phase function and a reference amplitude function are essentially determined based upon elements for use in a channeled spectroscopic polarimeter. Therefore, optical characteristics of individual elements are repeatedly examined by experiment or calculation to perform calibration of parameters.
  • the reference phase function and the reference amplitude function are in amount determined based not upon the “polarization characteristic of the object to be measured (sample)”, but only upon the characteristic of the “channeled spectroscopic polarimeter”. Accordingly, a “sample having a known polarization characteristic” (light whose measurement result is known)” is inputted into the polarimeter, and using the result of the input, it is possible to calculate backward the reference phase function and the reference amplitude function.
  • a “sample having a known polarization characteristic” is prepared, and then inputted into a channeled spectroscopic polarimeter.
  • spectrometric quasi-Stokes parameters of light are referred to as M 0 (0) ( ⁇ ) M 1 (0) ( ⁇ ), M 2 (0) ( ⁇ ), and M 3 (0) ( ⁇ ).
  • the amplitude and the phase obtained in Step 2 are expressed as follows according to Expressions (1.15a) to (1.15d).
  • the amplitude and the phase of each vibration component are determined only by the spectrometric quasi-Stokes parameters, the reference phase functions and the reference amplitude functions.
  • the spectrometric quasi-Stokes parameters are known in a “case where the sample having a known polarization characteristic”
  • the remaining reference phase functions ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) are determined from the demodulated amplitude and phase.
  • the reference amplitude function and the reference phase function can be obtained so long as the direction ⁇ and the spectrum P 0 (0) ( ⁇ ) of the light source are known in advance. Further, even with P 0 (0) ( ⁇ ) unknown, if only the direction ⁇ is known, it serves sufficiently for obtaining part of (essential) polarization parameters.
  • the above-mentioned method was a method for calculating the “amplitude” and the “phase” of each vibration component separately. However, it may be more convenient (efficient) in some cases to calculate them as the “complex representation” of each vibration component.
  • One example of such calculation may be the case of directly obtaining the “complex representation” (Expressions (1.17a) to (1.17d)), as in the Fourier transform method shown in FIG. 7 above. In such a case, calibration is efficiently performed by calibration of the “complex representation” as it is without separation into the “amplitude” and “phase”.
  • the complex functions K 0 ( ⁇ ), K ⁇ ( ⁇ ), K 2 ( ⁇ ), and K + ( ⁇ ) are in amount (reference complex function) determined based not upon the sample, but only upon the reference amplitude function and the reference phase function, as seen from Expressions (1.18a) to (1.18d). Accordingly, these can be calculated backward as follows.
  • K 0 ⁇ ( ⁇ ) F 0 ( 0 ) ⁇ ( ⁇ ) M 0 ( 0 ) ⁇ ( ⁇ ) ( 1.28 ⁇ a )
  • K - ⁇ ( ⁇ ) F - ( 0 ) ⁇ ( ⁇ ) M 23 ( 0 ) ⁇ ( ⁇ ) ( 1.28 ⁇ b )
  • K 2 ⁇ ( ⁇ ) F 2 ( 0 ) ⁇ ( ⁇ ) M 1 ( 0 ) ⁇ ( ⁇ ) ( 1.28 ⁇ c )
  • K + ⁇ ( ⁇ ) F + ( 0 ) ⁇ ( ⁇ ) M 23 ( 0 ) * ( ⁇ ) ( 1.28 ⁇ d )
  • K 0 ⁇ ( ⁇ ) F 0 ( 0 ) ⁇ ( ⁇ ) 1 2 ⁇ P 0 ( 0 ) ⁇ ( ⁇ ) ( 1.29 ⁇ a )
  • K - ⁇ ( ⁇ ) F - ( 0 ) ⁇ ( ⁇ ) 1 2 ⁇ P 0 ( 0 ) ⁇ ( ⁇ ) ⁇ sin ⁇ ⁇ 2 ⁇ ⁇ ( 1.29 ⁇ b )
  • K 2 ⁇ ( ⁇ ) F 2 ( 0 ) ⁇ ( ⁇ ) 1 2 ⁇ P 0 ( 0 ) ⁇ ( ⁇ ) ⁇ cos ⁇ ⁇ 2 ⁇ ⁇ ( 1.29 ⁇ c )
  • K + ⁇ ( ⁇ ) F + ( 0 ) ⁇ ( ⁇ ) 1 2 ⁇ P 0
  • Step 3 in Section 1.5 for demodulation of spectrometric quasi-Stokes parameters M 0 ( ⁇ ), M 1 ( ⁇ ), M 2 ( ⁇ ), and M 3 ( ⁇ ) from a measured channeled spectrum P( ⁇ ), it is necessary to obtain (calibrate) the following functions in advance.
  • the reference phase functions ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) are amounts (retardation) determined by the retarders R 1 and R 2 in the spectroscopic polarimeter.
  • This retardation has the property of changing sensitively with respect to a temperature.
  • the phase of the channeled spectrum is displaced due to the temperature change.
  • a measured value is displaced to cause occurrence of an error therein.
  • a similar change occurs with pressure change.
  • the channeled spectroscopic polarimeter is provided with a function capable of calibrating the reference phase functions ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) of each vibration component during measurement (concurrently with measurement) (cf. FIGS. 8 to 10 ).
  • the calibration method described in Section 1.6 was a method for calibration “prior to measurement”. As opposed to this, in the following section, a method for calibration “during measurement” is shown.
  • the present inventors and the like found it possible to obtain not only the four spectrometric quasi-Stokes parameters but also the “reference phase functions ( ⁇ 1 ( ⁇ ), ⁇ 2 ( ⁇ ), etc.)” all at once through use of the remaining component.
  • this method it is meant that calibration can be concurrently performed in the midst of measurement without particular input of light in a known SOP.
  • any one of the methods descried in Section 1.6 is to be performed as for the reference amplitude function. It is to be noted that the fluctuations in the reference amplitude function during measurement typically have considerably small magnitude, and are ignorable in many cases. Namely, in contrast to the reference phase function, there is generally almost no need for recalibration of the reference amplitude function during measurement.
  • the ratio between ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) is determined from a ratio between thicknesses of the two retarders.
  • the ratio between ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) is determined (this ratio may be considered not to change during measurement).
  • This relational expression is constantly satisfied regardless of a polarization characteristic of a measurement sample, meaning that one of the reference phase functions can be immediately obtained from a measured value, even from a channeled spectrum by any kind of sample.
  • This is a calibration method that can be performed utterly concurrently during measurement, and in the case of “using a sample having a known polarization characteristic”, there is no need for performing calibration “prior to measurement or after discontinuation of measurement” as in (Section 1.6).
  • the condition of observing Component [3] at a sufficient SN ratio needs to be satisfied (cf. later-described C).
  • ⁇ 2 ( ⁇ ) has the following relation with the complex representation F 2 ( ⁇ ) of Component [3].
  • ⁇ 2 ( ⁇ ) arg [ F 2 ( ⁇ (] (3.4) Therefore, the reference phase function ⁇ 2 ( ⁇ ) can be obtained from the complex representation of Component [3] according to the following expression.
  • ⁇ 2 ( ⁇ ) arg [ F 2 ( ⁇ )] (3.5)
  • Vibration Components [2] and [4] are again shown as follows.
  • Phase of Component [4]: ⁇ + ( ⁇ ) ⁇ 2 ( ⁇ )+ ⁇ 1 ( ⁇ ) ⁇ arg ⁇ M 23 ( ⁇ ) ⁇ + ⁇ (3.6b)
  • ⁇ 1 ( ⁇ ) and arg ⁇ M 23 ( ⁇ ) ⁇ are canceled out, whereby it is found that the following expression is satisfied.
  • [Mathematical Expression 26] ⁇ 2 ⁇ ( ⁇ ) 1 2 ⁇ ⁇ ⁇ - ⁇ ( ⁇ ) + ⁇ + ⁇ ( ⁇ ) ⁇ - ⁇ 2 ( 3.7 )
  • the right side of the above expression means that one ( ⁇ 2 ( ⁇ )) of the reference phase functions can be obtained by taking an average of the phases of Vibration components [2] and [4].
  • this relational expression can also be constantly satisfied regardless of the SOP of the sample, meaning that one of the reference phase functions can be immediately obtained from a measured value, even from a channeled spectrum by any kind of sample.
  • ⁇ ⁇ ( ⁇ ) and ⁇ + ( ⁇ ) have the following relations with the complex representations F ⁇ ( ⁇ ) and F + ( ⁇ ) of Components [2] and [4].
  • ⁇ ⁇ ( ⁇ ) arg [ F ⁇ ( ⁇ )] (3.8a)
  • ⁇ + ( ⁇ ) arg [ F + ( ⁇ )] (3.8b)
  • the reference phase function ⁇ 2 ( ⁇ ) can be obtained from the complex representations of the two components as follows.
  • [Mathematical Expression 27] ⁇ 2 ⁇ ( ⁇ ) 1 2 ⁇ ⁇ arg ⁇ [ F - ⁇ ( ⁇ ) ] + arg ⁇ [ F + ⁇ ( ⁇ ) ] ⁇ - ⁇ 2 ( 3.9 )
  • the following expression obtained by rewriting the above expression to a simple formula of the complex function may be applied.
  • [Mathematical Expression 28] ⁇ 2 ⁇ ( ⁇ ) 1 2 ⁇ arg ⁇ [ - F - ⁇ ( ⁇ ) ⁇ F + ⁇ ( ⁇ ) ] ( 3.10 )
  • an obtained spectrum includes another component having a different period as described above except for the case where the angle formed between the retarder R 2 and the polarizer P is not 45°.
  • Method A and Method B are methods in which one ( ⁇ 2 ( ⁇ )) of the reference phase functions can be calibrated utterly concurrently during measurement.
  • the vibration components used are different between the two methods.
  • the amplitude of Vibration component [3] used in Method A is proportional to M 1 ( ⁇ )
  • the amplitudes of Vibration Components [2] and [4] used in Method B are proportional to the following.
  • ⁇ square root over ( M 2 2 ( ⁇ )+ M 3 2 ( ⁇ )) ⁇ [Mathematical Expression 29]
  • Step 3 In the demodulation in Step 2 of the “procedure for demodulating spectrometric quasi-Stokes parameters” in Section 1.5, when (not the “paired amplitude and phase” but) the “complex representation” is obtained, what are needed ultimately in the operation of Step 3 for obtaining the spectrometric quasi-Stokes parameters are not the reference phase functions ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) but the reference complex functions K 0 ( ⁇ ), K ⁇ ( ⁇ ), K 2 ( ⁇ ), and K + (u). However, these can also be immediately obtained through use of the relations of Expressions (1.18a) to (1.18d) if the reference phase functions ⁇ 1 ( ⁇ ) and ⁇ 2 ( ⁇ ) have been obtained by the procedures up to E above.
  • the two methods have different factors of an error in the case of obtaining ⁇ 1 (c from ⁇ 2 ( ⁇ ). Namely, as shown in FIG. 10A , it is necessary to perform phase unwrapping in the case of obtaining ⁇ 1 ( ⁇ ) from ⁇ 2 ( ⁇ ). This phase unwrapping is a major factor of the error. Especially when a period is at high frequency as compared with sampling, noise is included in the period, or the like, wrong phase unwrapping might be performed. With wrong phase wrapping performed, an error becomes an integer multiple of 2 ⁇ , leading to calculation of a wrong phase. Further, this error affects a broad wavenumber region.
  • the use of the “calibration method during measurement” is based upon the premise of pre-calibration of both the “reference amplitude function” and the “reference phase function” prior to measurement. It is to be noted that, as for the phase, highly accurately obtaining the reference phase function is not necessary since a phase value can be corrected later by the variance and the measurement error.
  • Reference phase functions obtained by the pre-calibration are defined as ⁇ 1 (i) ( ⁇ ) and ⁇ 2 (i) ( ⁇ ).
  • Reference complex functions corresponding to these reference phase functions are expressed as follows according to Expressions (1.18a) to (1.18d).
  • K 0 ( i ) ⁇ ( ⁇ ) 1 2 ⁇ m 0 ⁇ ( ⁇ ) ( 3.16 ⁇ a )
  • K - ( i ) ⁇ ( ⁇ ) 1 8 ⁇ m - ⁇ ( ⁇ ) ⁇ exp ⁇ ⁇ i ⁇ [ ⁇ 2 ( i ) ⁇ ( ⁇ ) - ⁇ 1 ( i ) ⁇ ( ⁇ ) ] ( 3.16 ⁇ b )
  • K 2 ( i ) ⁇ ( ⁇ ) 1 4 ⁇ m 2 ⁇ ( ⁇ ) ⁇ exp ⁇ ⁇ i ⁇ ⁇ ⁇ 2 ( i ) ⁇ ( ⁇ ) ( 3.16 ⁇ c )
  • K + ( i ) ⁇ ( ⁇ ) - 1 8 ⁇ m + ⁇ ( ⁇ ) ⁇ exp ⁇ ⁇ i ⁇ [ ⁇ 2 ( i ) ⁇ ( ) ⁇ (
  • ⁇ 1 ( ⁇ ) ⁇ 1 (i) ( ⁇ )+ ⁇ 1 ( ⁇ ) (3.17a)
  • ⁇ 2 ( ⁇ ) ⁇ 2 (i) ( ⁇ )+ ⁇ 2 ( ⁇ ) (3.17b)
  • phase of Component [3] is expressed as follows.
  • ⁇ 2 ( ⁇ ) ⁇ 2 ( ⁇ ) ⁇ 2 (i) ( ⁇ ) (3.19)
  • Step 2 when not the “paired amplitude and phase” but the “complex representation” is to be obtained, the variation is obtained according to the following expressions.
  • Fluctuations in ⁇ 1 (a are considered similar to those in ⁇ 2 ( ⁇ ). It is thus possible to obtain ⁇ 1 ( ⁇ ) from a measured value of ⁇ 2 ( ⁇ ) by a comparative calculation using, for example, a thickness ratio.
  • K 0 ( ⁇ ) K 0 (i) ( ⁇ ) (3.29a)
  • K ⁇ ( ⁇ ) K ⁇ (i) ( ⁇ ) e i[ ⁇ 2 ( ⁇ ) ⁇ 1 ( ⁇ )]
  • K 2 ( ⁇ ) K 2 (i) ( ⁇ ) e i ⁇ 2 ( ⁇ ) (3.29c)
  • K + ( ⁇ ) K + (i) ( ⁇ ) e i[ ⁇ 2 ( ⁇ )+ ⁇ 1 ( ⁇ )] (3.29d)
  • the optical system in the case of measuring a spectropolarization characteristic of a sample by reflecting light on the sample is described in detail with reference to FIGS. 11 to 13 .
  • the optical system includes the light source 7 , the polarizer P, the retarder R 2 , the retarder R 1 , the analyzer A, and the spectroscope 8 .
  • reference symbol B denotes a sample on which light is reflected.
  • light emitted from the light source 7 is transmitted through the polarizer P, the retarder R 2 and the retarder R 1 in this order. The light is then incident on the sample B in a slanting direction, to be reflected thereon.
  • this device is configured by arranging an optical element on the light source side with respect to the sample in the configuration of the conventional optical system as shown in FIG. 1B . Further, the orientation of the transmission axis of the polarizer P agrees with the orientation of the principal axis of the retarder R 1 , and the orientations of the fast axes of the retarder R 1 and the retarder R 2 are inclined at an angle of ⁇ 45° from each other. ⁇ shows the azimuth angle of the transmission axis of the analyzer with respect to the fast axis of the retarder R 1 .
  • the incident plane of the light agrees with the orientation of the fast axis of the retarder R 1 .
  • the device including the polarizer P, the retarder R 2 , the retarder R 1 and the analyzer A is referred to as a channeled spectrometer unit.
  • an ellipsometric parameter and the like are determined from the light incident on the spectroscope 8 . A procedure for such determination is described below.
  • an arctangent of a rate of change in amplitude rate of a p-polarized light (light having an SOP where the polarizing direction runs parallel with the incident plane) and an s-polarized light (light having an SOP where the polarizing direction runs vertical to the incident plane) is expressed as ⁇ ( ⁇ ), and a phase difference is expressed as ⁇ ( ⁇ ).
  • a Mueller matrix of an isotropic medium can be described as follows.
  • M ⁇ ( ⁇ ) ⁇ [ 1 - cos ⁇ ⁇ 2 ⁇ ⁇ ⁇ ( ⁇ ) 0 0 - cos ⁇ ⁇ 2 ⁇ ⁇ ⁇ ( ⁇ ) 1 0 0 0 0 sin ⁇ ⁇ 2 ⁇ ⁇ ⁇ ( ⁇ ) ⁇ cos ⁇ ⁇ ⁇ ⁇ ( ⁇ ) sin ⁇ ⁇ 2 ⁇ ⁇ ⁇ ( ⁇ ) ⁇ sin ⁇ ⁇ ⁇ ⁇ ( ⁇ ) 0 0 - sin ⁇ ⁇ 2 ⁇ ⁇ ⁇ ( ) ⁇ sin ⁇ ⁇ ⁇ ⁇ ( ) sin ⁇ ⁇ 2 ⁇ ⁇ ⁇ ( ) ⁇ cos ⁇ ⁇ ⁇ ⁇ ( ) ] ( 4.1 ) It is thereby considered that ⁇ ( ⁇ ) and ⁇ ( ⁇ ) are obtained as ellipsometric parameters.
  • M 0 ( ⁇ ) to M 3 ( ⁇ ) which are obtained by demodulation processing include three unknowns; the spectrum P 0 ( ⁇ ) and the ellipsometric parameters ⁇ ( ⁇ ) and ⁇ ( ⁇ ), as expressed in the above expressions, it is possible to determine the ellipsometric parameters ⁇ ( ⁇ ) and ⁇ ( ⁇ ).
  • M 0 ( ⁇ ) is obtained from the first spectral intensity
  • M 1 ( ⁇ ) is from the third spectral intensity
  • M 2 ( ⁇ ) and M 3 ( ⁇ ) are from at least one of the second spectral intensity, the fourth spectral intensity, and the fifth spectral intensity. Therefore, with reference to Expression (4.3), ⁇ ( ⁇ ) which is obtained from the expressions of M 0 ( ⁇ ) and M 1 ( ⁇ ) can be obtained from the first spectral intensity and the third spectral intensity. In this case, even if the reference phase function is to be calibrated during measurement, calibration of only ⁇ 2 ( ⁇ ) sufficiently meets the need.
  • ⁇ ( ⁇ ) can also be obtained from at least one of the first spectral intensity and the third spectral intensity and at least one of the second spectral intensity, the fourth spectral intensity and the fifth spectral intensity. Since ⁇ ( ⁇ ) can be obtained from M 2 ( ⁇ ) and M 3 ( ⁇ ), at least one of the second spectral intensity, the fourth spectral intensity and the fifth spectral intensity can be obtained.
  • the optical system in the case of measuring a spectropolarization characteristic of a sample by transmitting light through the sample is described in detail with reference to FIGS. 16 to 18 .
  • the optical system includes the light source 7 , the polarizer P, the retarder R 2 , the retarder R 1 , the analyzer A, and the spectroscope 8 .
  • reference symbol C denotes a sample through which light is transmitted.
  • light emitted from the light source 7 is transmitted through the polarizer P, the retarder R 2 and the retarder R 1 in this order. The light is then incident on the sample C in a vertical direction, to be transmitted therethrough.
  • this device is configured by arranging an optical element on the light source side with respect to the sample in the configuration of the conventional optical system as shown in FIG. 1B .
  • the orientation of the transmission axis of the polarizer P agrees with the orientation of the fast axis of the retarder R 1
  • the orientations of the fast axes of the retarder R 1 and the retarder R 2 are inclined at an angle of 45° from each other.
  • ⁇ shows the azimuth angle of the transmission axis of the analyzer A with respect to the fast axis of the retarder R 1 .
  • the incident direction of the wave surface of light that transmits through the retarders R 1 and R 2 is not susceptible to the inclination characteristic (cf. FIG. 18A ) and the surface state (cf. FIG. 18B ) of the sample, a stable measurement can be realized without restrictions of being unable to measure the surface shape of the sample and a disturbing substance (living body, etc.). Namely, it is possible to solve the problem of the retardation change between the time of calibrating the retardation of the retarder and the time of measuring the sample due to changes in distance and direction of a light ray that passes through the retarder.
  • M ⁇ ( ⁇ ) [ 1 0 0 0 0 cos 2 ⁇ 2 ⁇ R + ⁇ cos ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ⁇ sin 2 ⁇ 2 ⁇ R cos ⁇ ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ⁇ 2 ⁇ R ⁇ ( 1 - cos ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ) - sin ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ⁇ sin ⁇ ⁇ 2 ⁇ R 0 cos ⁇ ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ⁇ 2 ⁇ R ⁇ ( 1 - cos ⁇ ⁇ ⁇ ⁇ ( ) ) sin ⁇ 2 ⁇ 2 ⁇ R + cos ⁇ ⁇ ⁇ ⁇ ( ) ⁇ cos ⁇ 2 ⁇ 2 ⁇ R cos ⁇ ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ⁇ 2 ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ⁇ 2 ⁇ R ⁇ ⁇
  • M 0 ⁇ ( ⁇ ) 1 2 ⁇ P 0 ⁇ ( ⁇ ) ( 5.2 ⁇ a )
  • M 1 ⁇ ( ⁇ ) ⁇ 1 2 ⁇ P 0 ⁇ ( ⁇ ) ⁇ ⁇ cos ⁇ ⁇ 2 ⁇ R ⁇ ⁇ cos ⁇ ( 2 ⁇ R - 2 ⁇ ⁇ ⁇ ) + ⁇ cos ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ⁇ sin ⁇ ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ( 2 ⁇ R - 2 ⁇ ⁇ ⁇ ) ⁇ ( 5.2 ⁇ b )
  • M 2 ⁇ ( ⁇ ) ⁇ 1 2 ⁇ P 0 ⁇ ( ⁇ ) ⁇ ⁇ sin ⁇ ⁇ 2 ⁇ R ⁇ ⁇ cos ⁇ ( 2 ⁇ R - 2 ⁇ ⁇ ⁇ ) - ⁇ cos ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ⁇ co
  • M 0 ⁇ ( ⁇ ) 1 2 ⁇ P 0 ⁇ ( ⁇ ) ( 5.3 ⁇ a )
  • M 1 ⁇ ( ⁇ ) 1 2 ⁇ P 0 ⁇ ( ⁇ ) ⁇ cos ⁇ ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ⁇ 2 ⁇ R ⁇ ( 1 - cos ⁇ ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ) ( 5.3 ⁇ b )
  • M 2 ⁇ ( ⁇ ) 1 2 ⁇ P 0 ⁇ ( ⁇ ) ⁇ ( sin 2 ⁇ 2 ⁇ R + cos ⁇ ⁇ ⁇ ⁇ ( ⁇ ) ⁇ cos 2 ⁇ 2 ⁇ R ) ( 5.3 ⁇ c )
  • M 3 ⁇ ( ⁇ ) 1 2 ⁇ P 0 ⁇ ( ⁇ ) ⁇ cos ⁇ ⁇ 2 ⁇ R ⁇ ⁇ sin ⁇ ⁇ ⁇ ⁇ ( ⁇ ) (
  • M 0 ( ⁇ ) to M 3 ( ⁇ ) which are obtained by demodulation processing include three unknowns: the spectrum P 0 ( ⁇ ) of the light ray, the azimuth angle R of the birefringent axis, and the retardation ⁇ ( ⁇ ) of the sample (birefringent medium), it is possible to determine the azimuth angle R of the birefringent axis and the retardation ⁇ ( ⁇ ) of the sample (birefringent medium).
  • the azimuth angle R of the birefringent axis may be either the azimuth angle R of the birefringent axis or the retardation ⁇ ( ⁇ ) of the sample (birefringent medium).
  • the orientation of the birefringent axis can be determined when the azimuth angle thereof is obtained.
  • M 3 ( ⁇ ) can be obtained concurrently with M 2 ( ⁇ ).
  • M 0 ( ⁇ ) obtained from the first spectral intensity
  • M 1 ( ⁇ ) obtained from the third spectral intensity
  • the necessary spectral intensities are either the first or third spectral intensity and any one of the second, fourth and fifth spectral intensities. This also applies to necessary spectral intensities for obtaining ⁇ ( ⁇ ).
  • FIG. 14 shows a device configuration necessary for pre-calibration.
  • This device is comprised of the light source 7 , the spectroscope 8 , a unit 9 for pre-calibration, a unit 12 for measurement, an optical fiber 10 for use in pre-calibration, and an optical fiber 11 for use in measurement.
  • the unit 12 for measurement includes the polarizer P, the retarder R 2 , the retarder R 1 , and an analyzer A 2 for measurement.
  • the unit 9 for pre-calibration includes an analyzer A 1 for pre-calibration. It is to be noted that the analyzer A 1 for pre-calibration is set to have a known polarization angle.
  • the polarizer P the retarder R 2 and the retarder R 1 in this order.
  • the light is then transmitted through the analyzer A 1 for pre-calibration included in the unit 9 for pre-calibration, to be incident on the spectroscope 8 through the optical fiber 10 .
  • a measurement is performed by the methods described in Sections 4.1 and 4.2, using the unit 12 for measurement.
  • the unit 9 for pre-calibration (light-reception part) including the analyzer A 1 for pre-calibration set to have a known polarization angle becomes movable to place where calibration is readily performed.
  • the advantage of being able to perform precalibration in a place which is not a measurement place is obtained. Further, the advantages of time reduction and the like are also obtained simultaneously.
  • FIG. 15 a problem with the channeled spectroscopic polarimetry described in “Spectroscopic ellipsometry using channeled spectrum”, written by Kazuhiko Oka and Takayuki Katoh, collected papers of lectures in 26th Study Session on Light Wave Sensing Technology (Light wave Sensing Technology Study Session held by Japan Society of Applied Physics, Dec. 19-20, 2000) pp. 107-114 is shown in FIG. 15 .
  • light is incident from the lower left of the figure. The light is transmitted through the polarizer P, reflected on the sample B, and then transmitted through the retarder R.
  • pre-calibration is not accompanied by reflection on the sample as apparent from FIG. 14 , thereby giving the advantage of eliminating the need for arranging a polarization angle adjustment system on the light-projection side (retarder side), to permit size reduction in light-projection side unit.
  • FIG. 19 shows a device configuration of an optical system in such cases.
  • the optical system includes the light source 7 , the polarizer P, the retarder R 2 , the retarder R 1 , the analyzer A and the spectroscope 8 .
  • the object to be measured includes the sample D and a known polarization element E.
  • Light emitted from the light source 7 is transmitted through the polarizer P, the retarder R 2 and the retarder R 1 in this order. The light is then reflected on or transmitted through the object to be measured, and transmitted through the analyzer, to be incident on the spectroscope 8 .
  • the sample and the known sample are regarded and measured as one object to be measured, and the effect of the known polarization element may be eliminated from the obtained equation (spectroscopic quasi-Stokes parameter).
  • a case is considered where a quarter wave plate is arranged in a position after the sample such that the slow axis thereof runs parallel with the fast axis of the first retarder.
  • the known polarization element E is regarded as the quarter wave plate.
  • M ′ ⁇ ( ⁇ ) ( m ⁇ 00 ′ ⁇ ( ⁇ ) m ⁇ 10 ′ ⁇ ( ⁇ ) m ⁇ 20 ′ ⁇ ( ⁇ ) ⁇ m ⁇ 01 ′ ⁇ ( ⁇ ) m ⁇ 11 ′ ⁇ ( ⁇ ) m ⁇ 21 ′ ⁇ ( ⁇ ) ⁇ m ⁇ 02 ′ ⁇ ( ⁇ ) m ⁇ 12 ′ ⁇ ( ⁇ ) m ⁇ 22 ′ ⁇ ( ⁇ ) ⁇ m ⁇ 03 ′ ⁇ ( ⁇ ) m ⁇ 13 ′ ⁇ ( ⁇ ) m ⁇ 23 ′ ⁇ ( ⁇ ) m ⁇ 30 ′ ⁇ ( ⁇ ) m ⁇ 31 ′ ⁇ ( ⁇ ) m ⁇ 32
  • M ⁇ ( ⁇ ) ( m ⁇ 00 ⁇ ( ⁇ ) m ⁇ 01 ⁇ ( ⁇ ) m ⁇ 02 ⁇ ( ⁇ ) m ⁇ 03 ⁇ ( ⁇ ) m ⁇ 10 ⁇ ( ⁇ ) m ⁇ 11 ⁇ ( ⁇ ) m ⁇ 12 ⁇ ( ⁇ ) m ⁇ 13 ⁇ ( ⁇ ) m ⁇ 20 ⁇ ( ⁇ ) m ⁇ 21 ⁇ ( ⁇ ) m ⁇ 22 ⁇ ( ⁇ ) m ⁇ 23 ⁇ ( ⁇ ) m ⁇ 30 ⁇ ( ⁇ ) m ⁇ 31 ⁇ ( ⁇ ) m ⁇ 32 ⁇ ( ⁇ ) m ⁇
  • the elements associated with the spectroscopic quasi-Stokes parameters are different from those in the case without the quarter wave plate.
  • the number of parameters obtained is four, which is the same as in the case without the quarter wave plate.
  • some of the spectropolarization parameters of the sample can be calculated also in the case with the quarter wave plate.
  • the use of the quarter wave plate or the like permits for changing the relational expression of the Mueller matrix of the sample and the spectroscopic quasi-Stokes parameters to be measured. Actively using this fact can for example lead to enhancement of measurement sensitivity with respect to the specific spectropolarization parameter.
  • the case of calculating the retardation of the sample shown in Section 4.2 is considered.
  • M 0 ⁇ ( ⁇ ) 1 2 ⁇ P 0 ⁇ ( ⁇ )
  • the use of measurement principle of the present invention allows concurrent and independent measurement of four spectroscopic quasi-tokes parameters in one spectrum measurement. This links to the characteristic of being capable of concurrently determining a plurality of spectropolarization parameters regarding an object to be measured (i.e. sample included therein).
  • the Mueller matrix for expressing the SOP of the sample has sixteen elements, and depending upon the sample, each of those sixteen element may be a different value.
  • the condition of the sample was being an isotropic medium in Expression (4.1), but when the sample is an anisotropic medium, the sixteen elements are expressed by up to seven independent parameter equations. This was demonstrated by G. E. Jellison, Jr, (“Handbook of ellipsometry”, edited by H. G Thompkins and E. A. Irene, William Andrew Publishing, P. 244). Further, there is even a case where, when the sample is a heterogeneous medium, the sixteen elements are all independent parameters in measurement of transmitted light or reflected light on or through the sample.
  • M sample ⁇ ( ⁇ ) [ m ⁇ s ⁇ ⁇ 00 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 01 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 02 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 03 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 10 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 11 ⁇ ( ⁇ ) m ⁇ s ⁇ 12 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 13 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 20 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 21 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 22 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 23 ⁇ ( ⁇ ) m ⁇ s ⁇ ⁇ 30 ⁇ ( ⁇ )
  • the number of equations can be increased by changing a vector for giving a coefficient in several times and repeating measurement at each of the changes. Since this coefficient vector depends only upon the characteristic of the known polarization element E and the azimuth angle ⁇ of the analyzer A, controlling either one of them allows changing of the vector. With the number of equations increased, it is possible to increase the number of independent spectropolarization parameters which are concurrently obtained.
  • N ⁇ ( ⁇ ) [ a ⁇ 0 ( 0 ) ⁇ ( ⁇ ) a ⁇ 1 ( 0 ) ⁇ ( ⁇ ) a ⁇ 2 ( 0 ) ⁇ ( ⁇ ) a ⁇ 3 ( 0 ) ⁇ ( ⁇ ) a ⁇ 0 ( 1 ) ⁇ ( ⁇ ) a ⁇ 1 ( 1 ) ⁇ ( ⁇ ) a ⁇ 2 ( 1 ) ⁇ ( ⁇ ) a ⁇ 3 ( 1 ) ⁇ ( ⁇ ) a ⁇ 0 ( 2 ) ⁇ ( ⁇ ) a ⁇ 1 ( 2 ) ⁇ ( ⁇ ) a ⁇ 2 ( 2 ) ⁇ ( ⁇ ) a ⁇ 3 ( 2 ) ⁇ ( ⁇ ) a ⁇ 1 ( 3 ) ⁇ ( ⁇ ) a ⁇ 0 ( 3 ) ⁇ ( ⁇ ) a ⁇ 1 ( 3 ) ⁇ (
  • the present measurement method has a large advantage as compared with the conventional method even in the case of moving the known polarization element E and the analyzer A.
  • mechanical or active polarization control is necessary for certain, the number of necessary measurement steps is significantly different from that of the conventional method.
  • four spectroscopic quasi-Stokes parameters are obtained in one measurement, meaning that in terms of the number of parameters to be obtained, the number of measurements can be reduced to the order of a quarter of the number of measurements in the conventional method.
  • the present method has large advantages in terms of reduction in measurement time or simplification of the measurement system.
  • the characteristic of the known polarization element E and the azimuth angle ⁇ of the analyzer A can be changed by a variety of methods.
  • a first method is changing either or both of azimuth angles ⁇ of the two elements. Such a change may be made by actually rotating the element, or replacing the element by an element having a different azimuth angle ⁇ , or inserting a Faraday cell or the like in a position before the element so as to magneto-optically rotate the azimuth angle ⁇ of the element from the installation orientation.
  • a second method is introducing a compensator capable of moduclation such as an electro-optic modulator, a photoelastic modulator, or a liquid-crystal optical modulator, to change a retardation of one of parameters for determining a Mueller matrix of this element.
  • a third method is combining the above-mentioned methods. (It is to be noted that the above-mentioned methods do not limit the method to be performed.)
  • the known polarization element E is not necessarily composed of a single element.
  • the known polarization element E may be constituted by combination of a plurality of compensators capable of modulation.
  • a ⁇ 0 ⁇ ( ⁇ ) 1 2 ( 7.10 ⁇ a )
  • a ⁇ 1 ⁇ ( ⁇ ) ⁇ 1 2 ⁇ cos ⁇ ⁇ 2 ⁇ ⁇ C ⁇ cos ⁇ ⁇ 2 ⁇ ( ⁇ - ⁇ C ) + ⁇ 1 2 ⁇ cos ⁇ ⁇ ⁇ C ⁇ ( ⁇ ) ⁇ sin ⁇ ⁇ 2 ⁇ ⁇ ⁇ C ⁇ sin ⁇ ⁇ 2 ⁇ ( ⁇ - ⁇ C ) ( 7.10 ⁇ b )
  • a ⁇ 2 ⁇ ( ⁇ ) ⁇ 1 2 ⁇ sin ⁇ ⁇ 2 ⁇ ⁇ C ⁇ cos ⁇ ⁇ 2 ⁇ ( ⁇ - ⁇ C ) + ⁇ - 1 2 ⁇ cos ⁇ ⁇ ⁇ C ⁇ ( ⁇ ) ⁇ cos ⁇
  • channeled spectrums may be repeatedly measured while either one of the azimuth angles of the two elements is changed.
  • N 1 2 ⁇ [ 1 0 1 0 1 0 0 1 1 3 4 3 4 1 2 1 - 3 4 3 4 - 1 2 ] ( 7.11 )
  • the inverse matrix of this matrix is given as follows.
  • N - 1 2 ⁇ [ - 1 0 1 1 - 4 3 - 2 3 5 3 1 3 2 0 - 1 - 1 1 1 - 1 - 1 ] ( 7.12 )
  • spectroscopic quasi-tokes parameters obtained by four times of measurements and N ⁇ 1 mentioned above into Expression (7.9), it is possible to determine all the sixteen elements of the Mueller matrix of the sample for each wavenumber.
  • a retardation ⁇ c ( ⁇ ) of a compensation is a function of a wavenumber a and is not constant. However, even in such a case, the measurement remains unsusceptible since Expression (7.9) is calculated for each wavenumber. Further, according to demonstration similar to that in the case of “spectroscopic polarization state measurement by retarder rotating method” shown in a reference document (“Polarized light” written by D. Goldstein, Mercel Dekker Inc., p. 555), it is possible to demonstrate that 132° is the optimum value as the retardation ⁇ c ( ⁇ ). The closer to this value the retardation is, the less susceptible to measurement noise the measurement can be.
  • the number of equations can be increased also by rotating the azimuth angle ⁇ of the analyzer.
  • rotating only the analyzer prevents the matrix N( ⁇ ) from having an inverse matrix due to the property of the analyzer. If all the sixteen Mueller matrix elements are to be obtained, it is at least necessary to rotate the compensator.
  • the optical system is comprised of the light source 7 , the polarizer P, the retarders R 2 and R 1 , the analyzer A and the spectroscope 8 , and spectropolarization parameters of the sample and the like are calculated by analysis of a spectrum of incident light acquired in the spectroscope 8 in the foregoing procedure.
  • this part can be defined as a “spectroscopic polarization state generator” for emitting light having a modulated SOP. This is especially named a “channeled spectroscopic polarization state generator (hereinafter referred to as CSPSG)”.
  • CSPSG channeled spectroscopic polarization state generator
  • FIG. 30 shows the configuration of the channeled spectroscopic polarization state generator (CSPSG).
  • This optical system is configured to allow light emitted from the light source 7 to transit through the polarizer P and the retarders R 1 and R 2 .
  • the constituent elements in this configuration are the same as those starting with the light source and ending with the component before the sample in FIG. 2 . Further, the azimuth angle of the element is the same as in FIG. 2 .
  • light emitted from the CSPSG is light having an SOP modulated along the wavenumber axis.
  • a stokes spectrum S PSG ( ⁇ ) emitted from the CSPSG is expressed below by calculation using the Mueller matrix.
  • S 1 ( ⁇ ) is modulated in a quasi-sinusoidal manner at a period 1/L 1 .
  • S 2 ( ⁇ ) and S 3 ( ⁇ ) are both composed of two components modulated in a quasi-sinusoidal manner at a period 1/L and a period 1/L.
  • the quasi-sinusoidal components at the same period has initial phases 90° different from each other. Therefore, the light emitted from the CSPSG can be considered as light having four spectroscopic Stokes parameters modulated at a period or phase independently different from one another. It can thereby be said that this CSPSG is a complete spectroscopic polarization state generator.
  • the present invention can be defined as having a configuration for obtaining a spectropolarization parameter of an object to be measured, formed by combination, of the light source of the above-mentioned CSPSG as a complete spectroscopic polarization state generator with the light source, the analyzer and the spectrometer.
  • FIG. 20 shows a configuration view of one example of a spectroscopic polarimeter. As shown in this figure, this device comprises a light-projection side unit 200 and a light-reception side unit 300 . It is to be noted that reference numeral 400 denotes a sample.
  • the light-projection side unit 200 comprises: a power source 201 ; a light source 202 that is turned on by power feeding from the power source 201 ; a pinhole plate 203 arranged on the front face side of the light source 202 in the light emitting direction; a collimator lens 204 for collimating light transmitting through the pinhole of the 203 ; a shutter 205 which is arranged on the front face side of the collimator lens 204 and opens and closes to transmit or block the transmitted light; a polarizer 206 on which the light having transmitted through the shutter is incident; and a second retarder 207 and a first retarder 208 , through which the light having transmitted through the polarizer transmits in this order.
  • the light after passage of the first retarder 208 is emitted from the light-projection side unit 200 and applied to the sample 400 .
  • the light transmitted through or reflected on the sample 400 is incident on the light-reception side unit 300 .
  • a respective angle between the first retarder 208 and the analyzer 301 is set to be a known angle.
  • the spectrometer 302 comprises: a diffraction grating 302 a for spatially dispersing the incident light; a CCD 302 b with the light-reception face on which light spatially dispersed by the diffraction grating 302 a is incident; and an A/D converter 302 c for converting light-reception output from the CCD 302 b into a digital signal.
  • the digital light-reception output signal obtained from the A/D converter 302 c is taken out from the spectrometer 302 , and then processed in a computer 303 such as a personal computer (PC).
  • PC personal computer
  • the computer 303 comprises: an arithmetic processing part 303 a comprised of a microprocessor and the like; a memory part 303 b comprised of an ROM, an RAM, an HDD and the like; and a measurement result output part 303 c comprised of a display, a printer, a variety of data output devices, a communication device, and the like.
  • FIG. 21 shows a more specific configuration view regarding a sensor head part of the spectroscopic polarimeter.
  • a sensor head part 100 comprises: a light-projection part 110 for emitting light; a light-reception part 120 for receiving light having been reflected on or transmitted through a sample; and a housing 130 for protecting the light-projection part 110 and the light-reception part 120 .
  • reference numeral 50 denotes a sample.
  • the light-projection part 110 includes: a fiber-optic cable 111 for allowing light emitted from a light source (not shown) to transmit therethrough; a cable head 112 for allowing transmitted light from the fiber-optic cable 111 to transmit therethrough; a collimator lens (light-projection lens) 115 for collimating transmitted light from the cable head 112 ; a polarizer 116 which is arranged on the front face side of the collimator lens 115 and allows incident light to transmit therethrough; a second retarder 117 and a first retarder 118 , through which light emitted from the polarizer transmits in this order; and an optical system holding member 113 and a fixing member 114 which are used to install the optical system in the housing 130 .
  • a solid line 119 is a light-projection axis of the light that transmits through the light-projection part 110 .
  • the light-reception part 120 includes: an analyzer 122 for allowing light reflected on or transmitted through the sample 50 to transmit therethrough; a light-reception lens 123 for condensing transmitted light from the analyzer 122 ; a cable head 126 for allowing light having transmitted through the light-reception lens 123 to transmit therethrough; a fiber-optic cable 127 connected to a spectrometer (not shown); and a fixing member 124 and an optical system holding member 125 which are used to install the optical system in the housing 130 .
  • a solid line 121 is a light-reception axis of the light that is reflected on or transmits through the sample 50 .
  • FIG. 29 shows a device configuration view in the case of installing a polarization element having a known polarization parameter in a position after the sample and measuring the polarization parameter of the sample.
  • FIG. 29 is configured to install a compensator (known polarization element) 140 held in a hollow motor 141 between the sample 50 and the analyzer 122 .
  • reference numeral 142 denotes electrical wiring for motor drive.
  • a spectroscopic quasi-Stokes parameter can be measured under a plurality of conditions by rotating the hollow motor 141 to control the azimuth angle of the compensator 140 .
  • the hollow motor 141 is fixed to the housing 130 to form an integral configuration as an element of the light-reception part 120 .
  • the hollow motor 141 is controlled by the arithmetic processing part 303 a in FIG. 20 . It is to be noted that in the case of not rotating the compensator 140 but rotating the analyzer 122 , the hollow motor 141 may be replaced by a fixing hardware of the compensator 140 , to provide a hollow motor for rotating the analyzer 122 . Further, both the compensator 140 and the analyzer 122 may be made individually rotatable.
  • FIG. 22 shows a flowchart of a pre-calibration procedure.
  • the precalibration procedure is started with application of light to the device in Step 2201 .
  • the relative angle between the first retarder 208 and the analyzer 301 is a known angle, and an element for changing an SOP of light is not arranged between the first retarder 208 and the analyzer 301 .
  • Step 2202 a spectral intensity of transmitted light from the analyzer 301 is measured using the spectrometer.
  • the shutter 205 may be utilized for reduction in influence of unnecessary light, such as lost light.
  • a spectrum of the unnecessary light can be canceled out by taking a difference in spectrum between when measured with the shutter open and when measured with the shutter closed.
  • Step 2203 the spectral intensity of the transmitted light received is forwarded from the spectrometer to the computer 303 , to be provided to calculation in the arithmetic processing part 303 a.
  • Step 2204 reference phase functions and reference amplitude functions are calculated by the action of the arithmetic processing part 303 a.
  • Step 2205 the calculated reference phase functions and reference amplitude functions are stored in the memory part 303 b , whereby the pre-calibration procedure is completed.
  • FIG. 23 shows a flowchart of a measurement procedure. As shown in the figure, the measurement procedure is started with application of light to the device in Step 2301 .
  • Step 2302 light is reflected on or transmitted through the sample 400 using the spectrometer 302 , and thereafter, a spectral intensity of transmitted light having transmitted through the analyzer 301 is measured.
  • the shutter 205 can be utilized for reduction in influence of unnecessary light, such as lost light.
  • the spectrum of the unnecessary light can be canceled out by taking a difference in spectrum between when measured with the shutter open and when measured with the shutter closed.
  • Step 2303 the spectral intensity of the transmitted light is forwarded from the spectrometer 302 to the computer 303 , to be provided to processing in the arithmetic processing part 303 a .
  • the optical system described by use of FIG. 29 is used and the azimuth angle of the compensator 140 or the analyzer 122 is changed to acquire a spectral intensity more than once.
  • Step 2304 in the computer 303 , the arithmetic processing part 303 a acquires reference phase functions and reference amplitude functions from the memory part 303 b.
  • Step 2305 in the computer 303 , the arithmetic processing part 303 a calculates reference phase function variations ( ⁇ 1 and ⁇ 2 ) by use of the measured spectral intensity, the reference phase functions and the reference amplitude functions.
  • Step 2306 in the computer 303 , the arithmetic processing part 303 a calculates spectrometric Stokes parameters by use of the measured spectral intensity, the reference phase functions, the reference amplitude functions and the reference phase function variations.
  • the arithmetic processing part 303 a outputs the spectrometric Stokes parameters of the sample 400 .
  • the measurement result output part 303 c may include a memory, a hard disc, and other processing parts (calculating part for film thickness, complex refractive index, etc.).
  • spectrometric Stokes parameters of the sample are calculated through the pre-calibration procedure shown in FIG. 22 and the measurement procedure shown in FIG. 23 in the system constitution shown in FIGS. 20, 21 and 29 .

Landscapes

  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
US11/388,205 2005-03-28 2006-03-24 Spectroscopic polarimetry Abandoned US20060238759A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/965,165 US9645011B2 (en) 2005-03-28 2010-12-10 Optical device having polarizer and non-active retarders for spectroscopic polarimetry

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPP2005-091763 2005-03-28
JP2005091763 2005-03-28
JPP2005-362047 2005-12-15
JP2005362047A JP3909363B2 (ja) 2005-03-28 2005-12-15 分光偏光計測方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/965,165 Division US9645011B2 (en) 2005-03-28 2010-12-10 Optical device having polarizer and non-active retarders for spectroscopic polarimetry

Publications (1)

Publication Number Publication Date
US20060238759A1 true US20060238759A1 (en) 2006-10-26

Family

ID=36617143

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/388,205 Abandoned US20060238759A1 (en) 2005-03-28 2006-03-24 Spectroscopic polarimetry
US12/965,165 Active US9645011B2 (en) 2005-03-28 2010-12-10 Optical device having polarizer and non-active retarders for spectroscopic polarimetry

Family Applications After (1)

Application Number Title Priority Date Filing Date
US12/965,165 Active US9645011B2 (en) 2005-03-28 2010-12-10 Optical device having polarizer and non-active retarders for spectroscopic polarimetry

Country Status (8)

Country Link
US (2) US20060238759A1 (zh)
EP (1) EP1707929B1 (zh)
JP (1) JP3909363B2 (zh)
KR (1) KR100765709B1 (zh)
CN (1) CN1841030B (zh)
AT (1) ATE449318T1 (zh)
DE (1) DE602006010465D1 (zh)
TW (1) TWI279529B (zh)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090051916A1 (en) * 2006-01-13 2009-02-26 National University Corporation Tokyo University Of Agriculture And Technology Measuring Apparatus, Measuring Method, and Characteristic Measurement Unit
US20100271475A1 (en) * 2007-04-12 2010-10-28 Schwiegerling James T Compact snapshot polarimetry camera
US20110122409A1 (en) * 2009-11-20 2011-05-26 Industrial Technology Research Institute Object characteristic measurement method and system
US20130250277A1 (en) * 2012-03-16 2013-09-26 National Tsing Hua University Apparatus for quantifying unknown stress and residual stress of a material and method thereof
US9097585B2 (en) 2011-09-08 2015-08-04 William B. Sparks Spectrographic polarimeter and method of recording state of polarity
US9188543B2 (en) 2011-04-18 2015-11-17 General Electric Company Inspection device and method thereof
US9897486B2 (en) 2016-05-16 2018-02-20 Samsung Electronics Co., Ltd. Method of calibrating and using a measuring apparatus that performs measurements using a spectrum of light
CN111209661A (zh) * 2019-12-31 2020-05-29 武汉颐光科技有限公司 一种光谱椭偏测量带宽和数值孔径退偏效应修正建模方法及装置
CN111965114A (zh) * 2020-08-15 2020-11-20 天津大学 一种导管偏振敏感光学相干层析成像本地双折射解调方法
CN113218877A (zh) * 2021-05-20 2021-08-06 华南师范大学 一种穆勒矩阵检测装置的校准方法
US11736199B1 (en) * 2020-01-29 2023-08-22 Cable Television Laboratories, Inc. Systems and methods for phase compensation

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5140789B2 (ja) * 2007-06-26 2013-02-13 オムロン株式会社 分光偏光計測装置
JP5048795B2 (ja) * 2010-01-21 2012-10-17 浜松ホトニクス株式会社 分光装置
CN102435418B (zh) * 2011-09-15 2013-08-21 中国科学院长春光学精密机械与物理研究所 ArF激光光学薄膜元件综合偏振测量装置及测量方法
JP6180311B2 (ja) * 2013-12-13 2017-08-16 大塚電子株式会社 偏光解析装置
CN107505063B (zh) * 2017-07-13 2019-07-12 北京航空航天大学 一种基于高频正弦校准光的激光光线偏折校正装置及方法
WO2020097485A2 (en) * 2018-11-08 2020-05-14 Seti Institute Method and system for polarimetry using static geometric polarization manipulation
GB201820796D0 (en) 2018-12-20 2019-02-06 Dublin Institute Of Tech Imaging of biological tissue
JP7296239B2 (ja) * 2019-04-10 2023-06-22 オムロン株式会社 光学計測装置、光学計測方法、及び光学計測プログラム
CN110261317B (zh) * 2019-06-17 2021-11-16 西安理工大学 一种Mueller矩阵光谱的测量系统及方法
CN110907403B (zh) * 2019-11-18 2021-07-09 中国科学技术大学 单次直接定量相位成像的实现装置
CN114812821B (zh) * 2022-04-26 2024-08-23 北京环境特性研究所 可见近红外偏振光谱仪偏振辐射定标方法和装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020057433A1 (en) * 2000-09-20 2002-05-16 Menguc M. Pinar Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
US20030086033A1 (en) * 2001-10-10 2003-05-08 Nitto Denko Corporation Laminated phase retarder, polarizing member and liquid-crystal display device
US20040004688A1 (en) * 2002-03-11 2004-01-08 Fuji Photo Film Co., Ltd. Retarders and circular polarizers
US20040130717A1 (en) * 2002-10-15 2004-07-08 Bernard Drevillon Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process
US7202950B2 (en) * 2003-07-08 2007-04-10 Marine Biological Laboratory Retardance measurement system and method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288835A (ja) 1993-03-30 1994-10-18 Shimadzu Corp エリプソメータ
JP3329898B2 (ja) * 1993-07-15 2002-09-30 株式会社日清製粉グループ本社 マルチチャンネル型フーリエ変換分光装置
JPH10143060A (ja) 1996-11-11 1998-05-29 Gakken Co Ltd コンピュータを用いたブラインドタッチ練習システム
EP1213578A1 (en) 2000-12-07 2002-06-12 Semiconductor300 GmbH & Co KG Apparatus and method for detecting an amount of depolarization of a linearly polarized beam
JP4045140B2 (ja) 2002-06-21 2008-02-13 国立大学法人 筑波大学 偏光感受型光スペクトル干渉コヒーレンストモグラフィー装置及び該装置による試料内部の偏光情報の測定方法
JP4224644B2 (ja) * 2005-01-21 2009-02-18 北海道ティー・エル・オー株式会社 分光偏光計測方法
JP4205704B2 (ja) * 2005-08-02 2009-01-07 国立大学法人 北海道大学 撮像偏光計測方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020057433A1 (en) * 2000-09-20 2002-05-16 Menguc M. Pinar Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
US20030086033A1 (en) * 2001-10-10 2003-05-08 Nitto Denko Corporation Laminated phase retarder, polarizing member and liquid-crystal display device
US20040004688A1 (en) * 2002-03-11 2004-01-08 Fuji Photo Film Co., Ltd. Retarders and circular polarizers
US20040130717A1 (en) * 2002-10-15 2004-07-08 Bernard Drevillon Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process
US7202950B2 (en) * 2003-07-08 2007-04-10 Marine Biological Laboratory Retardance measurement system and method

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7796257B2 (en) * 2006-01-13 2010-09-14 National University Corporation Tokyo University Of Agriculture And Technology Measuring apparatus, measuring method, and characteristic measurement unit
US20090051916A1 (en) * 2006-01-13 2009-02-26 National University Corporation Tokyo University Of Agriculture And Technology Measuring Apparatus, Measuring Method, and Characteristic Measurement Unit
US20100271475A1 (en) * 2007-04-12 2010-10-28 Schwiegerling James T Compact snapshot polarimetry camera
US8368889B2 (en) 2007-04-12 2013-02-05 The Arizona Board Of Regents On Behalf Of The University Of Arizona Compact snapshot polarimetry camera
US20110122409A1 (en) * 2009-11-20 2011-05-26 Industrial Technology Research Institute Object characteristic measurement method and system
US9188543B2 (en) 2011-04-18 2015-11-17 General Electric Company Inspection device and method thereof
US9097585B2 (en) 2011-09-08 2015-08-04 William B. Sparks Spectrographic polarimeter and method of recording state of polarity
US8780348B2 (en) * 2012-03-16 2014-07-15 National Tsing Hua University Apparatus for quantifying unknown stress and residual stress of a material and method thereof
US20130250277A1 (en) * 2012-03-16 2013-09-26 National Tsing Hua University Apparatus for quantifying unknown stress and residual stress of a material and method thereof
US9897486B2 (en) 2016-05-16 2018-02-20 Samsung Electronics Co., Ltd. Method of calibrating and using a measuring apparatus that performs measurements using a spectrum of light
CN111209661A (zh) * 2019-12-31 2020-05-29 武汉颐光科技有限公司 一种光谱椭偏测量带宽和数值孔径退偏效应修正建模方法及装置
US11736199B1 (en) * 2020-01-29 2023-08-22 Cable Television Laboratories, Inc. Systems and methods for phase compensation
CN111965114A (zh) * 2020-08-15 2020-11-20 天津大学 一种导管偏振敏感光学相干层析成像本地双折射解调方法
CN113218877A (zh) * 2021-05-20 2021-08-06 华南师范大学 一种穆勒矩阵检测装置的校准方法

Also Published As

Publication number Publication date
CN1841030A (zh) 2006-10-04
EP1707929A1 (en) 2006-10-04
KR20060103848A (ko) 2006-10-04
TWI279529B (en) 2007-04-21
JP2006308550A (ja) 2006-11-09
CN1841030B (zh) 2011-01-12
DE602006010465D1 (de) 2009-12-31
US20110080586A1 (en) 2011-04-07
TW200643388A (en) 2006-12-16
US9645011B2 (en) 2017-05-09
KR100765709B1 (ko) 2007-10-11
ATE449318T1 (de) 2009-12-15
JP3909363B2 (ja) 2007-04-25
EP1707929B1 (en) 2009-11-18

Similar Documents

Publication Publication Date Title
US9645011B2 (en) Optical device having polarizer and non-active retarders for spectroscopic polarimetry
US7623236B2 (en) Spectroscopic polarimetry
US7336360B2 (en) Imaging polarimetry
Arteaga Useful Mueller matrix symmetries for ellipsometry
WO2006134840A1 (ja) 光学特性計測装置及び光学特性計測方法
US20200116626A1 (en) Snapshot Ellipsometer
CN101281091A (zh) 使用了分光器的相位差测量装置
JP2009210457A (ja) 分光偏光計測装置
EP0737856B1 (en) A method of investigating samples by changing polarisation
JP3311497B2 (ja) フーリエ変換分光位相変調偏光解析法
JP5041508B2 (ja) 光学特性計測装置および方法
JP5140789B2 (ja) 分光偏光計測装置
Otani et al. Spectroscopic Mueller matrix polarimeter using four-channeled spectra
US7233395B2 (en) Performing retardation measurements
US7075648B2 (en) Performing retardation measurements
Sanaâ et al. Linear retardance and diattenuation dispersion measurements of anisotropic medium with Jones calculus based spectrometric technique
KR20030074779A (ko) 액정 셀의 갭 측정 방법
US20040207843A1 (en) Method and apparatus for measuring polarization
Arteaga et al. Measurement of the optical activity of anisotropic samples by transmission Mueller matrix ellipsometry
US7224457B2 (en) Performing retardation measurements
US20230273116A1 (en) Device for polarimetrically characterising the anisotropy of a medium, and corresponding imaging system
RU2310162C1 (ru) Поляризационный способ определения взаимной пространственной ориентации объектов и устройство для его реализации
RU2682605C1 (ru) Устройство для калибровки дихрографов кругового дихроизма
Nagib et al. Spectrophotometric calibration of a quarterwave plate
Harrison The Development of Reflection Anisotropy Spectroscopy Instrumentation for the study of dynamic surface properties

Legal Events

Date Code Title Description
AS Assignment

Owner name: NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSIT

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:OKABE, HIROSHI;MATOBA, KENICHI;OKA, KAZUHIKO;REEL/FRAME:017993/0121;SIGNING DATES FROM 20060501 TO 20060511

Owner name: OMRON CORPORATION, JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:OKABE, HIROSHI;MATOBA, KENICHI;OKA, KAZUHIKO;REEL/FRAME:017993/0121;SIGNING DATES FROM 20060501 TO 20060511

STCB Information on status: application discontinuation

Free format text: ABANDONED -- AFTER EXAMINER'S ANSWER OR BOARD OF APPEALS DECISION