TWI833166B - 濺鍍裝置 - Google Patents

濺鍍裝置 Download PDF

Info

Publication number
TWI833166B
TWI833166B TW111106280A TW111106280A TWI833166B TW I833166 B TWI833166 B TW I833166B TW 111106280 A TW111106280 A TW 111106280A TW 111106280 A TW111106280 A TW 111106280A TW I833166 B TWI833166 B TW I833166B
Authority
TW
Taiwan
Prior art keywords
target
sputtering
dummy electrode
gap
electrode
Prior art date
Application number
TW111106280A
Other languages
English (en)
Chinese (zh)
Other versions
TW202330969A (zh
Inventor
安東靖典
Original Assignee
日商日新電機股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日新電機股份有限公司 filed Critical 日商日新電機股份有限公司
Publication of TW202330969A publication Critical patent/TW202330969A/zh
Application granted granted Critical
Publication of TWI833166B publication Critical patent/TWI833166B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/3211Antennas, e.g. particular shapes of coils
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • H01J37/32183Matching circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/01Manufacture or treatment
    • H10D64/013Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator
    • H10D64/01302Manufacture or treatment of electrodes having a conductor capacitively coupled to a semiconductor by an insulator the insulator being formed after the semiconductor body, the semiconductor being silicon
    • H10D64/01332Making the insulator
    • H10D64/01336Making the insulator on single crystalline silicon, e.g. chemical oxidation using a liquid
    • H10D64/01342Making the insulator on single crystalline silicon, e.g. chemical oxidation using a liquid by deposition, e.g. evaporation, ALD or laser deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
TW111106280A 2021-12-14 2022-02-22 濺鍍裝置 TWI833166B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP2021/046079 WO2023112155A1 (ja) 2021-12-14 2021-12-14 スパッタリング装置
WOPCT/JP2021/046079 2021-12-14

Publications (2)

Publication Number Publication Date
TW202330969A TW202330969A (zh) 2023-08-01
TWI833166B true TWI833166B (zh) 2024-02-21

Family

ID=86773738

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111106280A TWI833166B (zh) 2021-12-14 2022-02-22 濺鍍裝置

Country Status (5)

Country Link
JP (1) JP7653594B2 (https=)
KR (1) KR20240101688A (https=)
CN (1) CN118251754A (https=)
TW (1) TWI833166B (https=)
WO (1) WO2023112155A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537868U (https=) * 1978-09-05 1980-03-11
TW201612341A (en) * 2014-07-09 2016-04-01 Ulvac Inc Insulating material target
JP2019052345A (ja) * 2017-09-14 2019-04-04 株式会社Screenホールディングス 成膜方法および成膜装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63243269A (ja) * 1987-03-30 1988-10-11 Toshiba Corp スパツタリング・タ−ゲツトの固定装置
JPH0748666Y2 (ja) * 1990-03-05 1995-11-08 日電アネルバ株式会社 スパッタリング装置
JP2021080533A (ja) 2019-11-21 2021-05-27 日新電機株式会社 スパッタリング装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537868U (https=) * 1978-09-05 1980-03-11
TW201612341A (en) * 2014-07-09 2016-04-01 Ulvac Inc Insulating material target
JP2019052345A (ja) * 2017-09-14 2019-04-04 株式会社Screenホールディングス 成膜方法および成膜装置

Also Published As

Publication number Publication date
CN118251754A (zh) 2024-06-25
JPWO2023112155A1 (https=) 2023-06-22
JP7653594B2 (ja) 2025-03-31
TW202330969A (zh) 2023-08-01
KR20240101688A (ko) 2024-07-02
WO2023112155A1 (ja) 2023-06-22

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