TWI712100B - Electronic parts packaging device - Google Patents

Electronic parts packaging device Download PDF

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Publication number
TWI712100B
TWI712100B TW108126041A TW108126041A TWI712100B TW I712100 B TWI712100 B TW I712100B TW 108126041 A TW108126041 A TW 108126041A TW 108126041 A TW108126041 A TW 108126041A TW I712100 B TWI712100 B TW I712100B
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packaging
head
heads
positions
pickup
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TW108126041A
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Chinese (zh)
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TW202008495A (en
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田澤秀博
久保晶義
辻正人
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日商新川股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/52Mounting semiconductor bodies in containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0404Pick-and-place heads or apparatus, e.g. with jaws
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/75Apparatus for connecting with bump connectors or layer connectors

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Die Bonding (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Wire Bonding (AREA)

Abstract

本發明於包括多個封裝頭的電子零件封裝裝置中,實現設置空間的減少及封裝精度的提高。將半導體晶片16封裝於基板15的接合裝置100包括:共通的線性引導件20,於Y方向延伸;多個封裝頭21a、封裝頭21b,於Y方向排列配置,且被線性引導件20引導而於Y方向移動;以及控制部50,調整封裝頭21a、封裝頭21b的Y方向的位置;並且控制部50使封裝頭21a、封裝頭21b朝向同一方向而同時起動,且使封裝頭21a、封裝頭21b同時停止。The invention realizes the reduction of the installation space and the improvement of the packaging accuracy in an electronic part packaging device including a plurality of packaging heads. The bonding device 100 for packaging the semiconductor chip 16 on the substrate 15 includes a common linear guide 20 extending in the Y direction; a plurality of packaging heads 21a and 21b are arranged in the Y direction and are guided by the linear guide 20 Move in the Y direction; and the control unit 50 adjusts the positions of the packaging head 21a and the packaging head 21b in the Y direction; and the control unit 50 causes the packaging head 21a and the packaging head 21b to face in the same direction while starting, and causes the packaging head 21a and the packaging The head 21b stops at the same time.

Description

電子零件封裝裝置Electronic parts packaging device

本發明是有關於一種電子零件封裝裝置的結構。The invention relates to a structure of an electronic component packaging device.

作為將電子零件封裝於基板的封裝裝置,使用如下封裝裝置,其包括:拾取部,從晶圓拾取(pick up)半導體晶片(semiconductor die)而載置於中間平台;以及接合(bonding)部,從中間平台上拾取半導體晶片而移送至基板上,且接合於基板上。As a packaging device for packaging electronic parts on a substrate, the following packaging device is used, which includes: a pick-up part, which picks up a semiconductor die from a wafer and places it on an intermediate platform; and a bonding part, The semiconductor wafer is picked up from the intermediate platform, transferred to the substrate, and bonded to the substrate.

另外,封裝裝置中,亦提出有包括兩個拾取部、接合部,交替進行拾取及接合而縮短接合時間的裝置(例如參照專利文獻1)。 [現有技術文獻] [專利文獻]In addition, in the packaging device, there has also been proposed a device that includes two pick-up parts and a bonding part, and alternately performs pick-up and bonding to shorten bonding time (for example, refer to Patent Document 1). [Prior Art Literature] [Patent Literature]

[專利文獻1]日本專利特開2009-130583號公報[Patent Document 1] Japanese Patent Laid-Open No. 2009-130583

[發明所欲解決之課題][The problem to be solved by the invention]

但是,專利文獻1所記載的封裝裝置中,由於將兩個封裝頭排列配置在與支持臂正交的方向,故而需要大的設置空間。另外,由於交替進行拾取及接合,故而存在如下情況:於其中一個封裝頭的接合中,由其他封裝頭的動作所引起的振動產生干擾而對封裝精度造成影響。該影響於為了縮短封裝時間而使封裝頭高速移動的情況下,變得更顯著。However, in the packaging device described in Patent Document 1, since the two packaging heads are arranged in a direction orthogonal to the support arm, a large installation space is required. In addition, since picking and bonding are performed alternately, there is a situation in which, during bonding of one of the packaging heads, vibration caused by the actions of the other packaging heads interferes and affects the packaging accuracy. This effect becomes more pronounced when the packaging head is moved at a high speed in order to shorten the packaging time.

因此,本發明的目的為於包括多個封裝頭的電子零件封裝裝置中,實現設置空間的減少及封裝精度的提高。 [解決課題之手段]Therefore, the object of the present invention is to reduce the installation space and improve the packaging accuracy in an electronic component packaging device including a plurality of packaging heads. [Means to solve the problem]

本發明的電子零件封裝裝置是將電子零件封裝於基板或者其他電子零件的電子零件封裝裝置,包括:線性引導件(linear guide),於規定方向延伸;多個封裝頭,於規定方向排列配置,且被線性引導件引導而於規定方向移動;以及控制部,調整封裝頭的規定方向的位置;並且控制部使各個封裝頭朝向同一方向而同時起動,且使各個封裝頭同時停止。The electronic component packaging device of the present invention is an electronic component packaging device that encapsulates electronic components on a substrate or other electronic components, and includes: a linear guide extending in a predetermined direction; a plurality of packaging heads arranged in a predetermined direction, It is guided by the linear guide to move in a predetermined direction; and the control unit adjusts the position of the packaging head in the predetermined direction; and the control unit makes the packaging heads start in the same direction and simultaneously starts, and stops the packaging heads at the same time.

如上所述,藉由將封裝頭於規定方向排列配置,可實現設置空間的減少。另外,藉由使多個封裝頭同時起動、停止,可抑制由各封裝頭的動作所引起的振動的干擾,可提高封裝品質。As described above, by arranging the packaging heads in a predetermined direction, the installation space can be reduced. In addition, by starting and stopping a plurality of packaging heads at the same time, the interference of vibration caused by the operation of each packaging head can be suppressed, and the packaging quality can be improved.

本發明的電子零件封裝裝置中亦可設為:各個封裝頭安裝有將電子零件拾取及封裝的封裝噴嘴,且於封裝噴嘴拾取電子零件的拾取位置、與封裝頭的封裝噴嘴將電子零件進行封裝的封裝位置之間,於規定方向移動,並且控制部使各個封裝頭從各個拾取位置或者各個封裝位置,朝向同一方向而同時起動,且使各個封裝頭同時到達各個封裝位置或者各個拾取位置而同時停止。The electronic component packaging device of the present invention can also be configured as: each packaging head is equipped with a packaging nozzle for picking up and packaging electronic parts, and the picking position of the packaging nozzle picks up the electronic parts, and the packaging nozzle of the packaging head encapsulates the electronic parts Between the packaging positions, move in a predetermined direction, and the control unit makes each packaging head from each pickup position or each packaging position, facing the same direction and start at the same time, and makes each packaging head reach each packaging position or each pickup position at the same time stop.

由於控制部使各封裝頭從拾取位置或者封裝位置,朝向同一方向而同時起動,同時到達封裝位置或者拾取位置而同時停止,故而可於其中一個封裝頭的拾取動作或者封裝動作中,抑制由其他封裝頭的移動所造成的振動產生干擾而對封裝精度造成影響。Since the control unit causes the packaging heads to start in the same direction from the pickup position or the packaging position at the same time, reach the packaging position or the pickup position at the same time and stop at the same time, it is possible to suppress the pick-up or packaging operation of one of the packaging heads. The vibration caused by the movement of the packaging head interferes and affects the packaging accuracy.

本發明的電子零件封裝裝置中亦可設為:包括多個封裝平台,於上表面保持封裝電子零件的基板或者封裝有其他電子零件的基板,並且各個拾取位置與各個封裝平台之間的規定方向的距離相等。The electronic component packaging device of the present invention can also be configured to include a plurality of packaging platforms, holding a substrate for packaging electronic parts or a substrate for packaging other electronic parts on the upper surface, and a predetermined direction between each pickup position and each packaging platform The distances are equal.

藉由該構成,可使拾取位置與封裝位置之間的距離相同,可使多個封裝頭同時起動、停止而提高封裝品質。With this configuration, the distance between the pick-up position and the packaging position can be made the same, and multiple packaging heads can be started and stopped at the same time to improve packaging quality.

本發明的電子零件封裝裝置中亦可設為:基板於規定方向封裝有多個電子零件,並且控制部是以各個拾取位置與各個封裝位置之間的各個距離成為相等的方式,使各個封裝頭移動而將多個電子零件進行封裝。The electronic component packaging device of the present invention may also be configured such that the substrate is packaged with a plurality of electronic components in a predetermined direction, and the control unit makes each packaging head equal to each distance between each pickup position and each packaging position. Move and encapsulate multiple electronic parts.

藉此,於在基板的規定方向封裝多個電子零件的情況下,亦可使拾取位置與封裝位置之間的距離相同,因此可使多個封裝頭同時起動、停止而提高封裝品質。With this, when multiple electronic components are packaged in a predetermined direction of the substrate, the distance between the pick-up position and the packaging position can be made the same. Therefore, multiple packaging heads can be started and stopped at the same time to improve the packaging quality.

本發明的電子零件封裝裝置中,於各個拾取位置與各個封裝位置之間的各個距離不同的情況下,亦可使距離短的一方的封裝頭的移動速度較距離長的一方的封裝頭的移動速度更緩慢。In the electronic component packaging device of the present invention, when the respective distances between the pick-up positions and the respective packaging positions are different, the movement speed of the packaging head of the shorter distance may be made to move the packaging head of the longer distance The speed is slower.

藉此,即便於拾取位置與封裝位置之間的各個距離不同的情況下,亦可使多個封裝頭同時起動、停止,可提高封裝品質。 [發明的效果]Thereby, even when the respective distances between the pickup position and the packaging position are different, multiple packaging heads can be started and stopped at the same time, which can improve packaging quality. [Effects of the invention]

本發明於包括多個封裝頭的電子零件封裝裝置中,可實現設置空間的減少及封裝精度的提高。In an electronic component packaging device including a plurality of packaging heads, the present invention can reduce the installation space and improve the packaging accuracy.

以下,一面參照圖式,一面對實施方式的電子零件封裝裝置即接合裝置100進行說明。接合裝置100將作為電子零件的半導體晶片16封裝於基板15或者其他半導體晶片16。Hereinafter, while referring to the drawings, the bonding device 100 which is the electronic component packaging device of the embodiment will be described. The bonding apparatus 100 encapsulates a semiconductor wafer 16 as an electronic component on a substrate 15 or another semiconductor wafer 16.

如圖1所示,接合裝置100包括:基座10;共通的線性引導件20,安裝於基座10,且於作為規定方向的Y方向延伸;多個封裝頭21a、封裝頭21b,被線性引導件20引導而於Y方向移動;以及控制部50,調整兩個封裝頭21a、封裝頭21b的Y方向的位置。As shown in FIG. 1, the bonding device 100 includes: a base 10; a common linear guide 20 installed on the base 10 and extending in the Y direction as a predetermined direction; a plurality of package heads 21a and 21b are linearly The guide 20 is guided to move in the Y direction; and the control unit 50 adjusts the positions of the two packaging heads 21a and 21b in the Y direction.

另外,如圖1所示,於接合裝置100的基座10,安裝有將基板15於X方向搬送的兩組搬送軌道11a、搬送軌道11b以及兩個封裝平台12a、封裝平台12b。進而,於接合裝置100包括:導架(guide frame)32,安裝於基座10且於X方向延伸;拾取頭33,被導架32引導而於X方向移動;導軌(guide rail)30,安裝於基座10且於Y方向延伸;中間平台31,被導軌30引導而於Y方向移動;以及晶圓保持器(未圖示),保持晶圓35。In addition, as shown in FIG. 1, on the base 10 of the bonding device 100, two sets of transfer rails 11 a and 11 b for transferring the substrate 15 in the X direction, and two packaging platforms 12 a and 12 b are mounted. Furthermore, the joining device 100 includes: a guide frame 32 installed on the base 10 and extending in the X direction; a pickup head 33 guided by the guide frame 32 to move in the X direction; and a guide rail 30 installed It extends in the Y direction on the base 10; the intermediate platform 31 is guided by the guide rail 30 to move in the Y direction; and a wafer holder (not shown) holds the wafer 35.

兩個封裝平台12a、封裝平台12b的中心的Y方向位置分別為12c、12d,各封裝平台12a、封裝平台12b的中心的Y方向的距離為W1。另外,於中間平台31的上表面設置有將半導體晶片16放置及拾取的兩個載置台17。兩個載置台17的Y方向的間隔與封裝平台12a、封裝平台12b的Y方向的間隔相同,為W1。The Y-direction positions of the centers of the two packaging platforms 12a and 12b are respectively 12c and 12d, and the Y-direction distance between the centers of the packaging platforms 12a and 12b is W1. In addition, two mounting tables 17 for placing and picking up semiconductor wafers 16 are provided on the upper surface of the intermediate stage 31. The Y-direction interval between the two mounting tables 17 is the same as the Y-direction interval between the packaging platform 12a and the packaging platform 12b, and is W1.

中間平台31是於圖1中由實線表示的第一位置、與由點虛線表示的第二位置之間,於Y方向移動。若中間平台31來到由點虛線表示的第二位置,則兩個載置台17的Y方向位置成為拾取位置13a、拾取位置13b。如上文所說明,兩個載置台17的Y方向的間隔與封裝平台12a、封裝平台12b的Y方向的間隔相同,為W1,因此各拾取位置13a、拾取位置13b與各封裝平台12a、封裝平台12b的各中心的Y方向位置12c、Y方向位置12d之間的各Y方向的距離ΔYc與ΔYd成為相等。The intermediate platform 31 moves in the Y direction between the first position indicated by the solid line in FIG. 1 and the second position indicated by the dotted line. When the intermediate stage 31 reaches the second position indicated by the dotted line, the Y-direction positions of the two mounting tables 17 become the pickup position 13a and the pickup position 13b. As explained above, the Y-direction interval of the two mounting tables 17 is the same as the Y-direction interval of the packaging platform 12a and the packaging platform 12b, which is W1. Therefore, each pickup position 13a, pickup position 13b and each packaging platform 12a, packaging platform The Y-direction distances ΔYc and ΔYd between the Y-direction position 12c and the Y-direction position 12d of each center of 12b are equal.

如圖1所示,於在各基板15的Y方向負側端部封裝半導體晶片16的情況下,將半導體晶片16封裝的Y方向的位置成為封裝位置14a、封裝位置14b。於該情況下,封裝位置14a、封裝位置14b之間的Y方向的距離與兩個載置台17之間的Y方向的距離同樣,成為W1。於該情況下,各拾取位置13a、拾取位置13b與各封裝位置14a、封裝位置14b之間的各Y方向的距離ΔYa與ΔYb成為相等。As shown in FIG. 1, when the semiconductor wafer 16 is packaged at the negative end of the Y-direction of each substrate 15, the Y-direction position where the semiconductor wafer 16 is packaged is a package position 14a and a package position 14b. In this case, the distance in the Y direction between the packaging position 14a and the packaging position 14b is the same as the distance in the Y direction between the two mounting tables 17 and becomes W1. In this case, the distances ΔYa and ΔYb in the Y direction between each pickup position 13a, pickup position 13b, and each packaging position 14a, and packaging position 14b are equal.

各封裝頭21a、封裝頭21b於線性引導件20的其中一側,於Y方向排列而安裝,被線性引導件20引導而於Y方向移動。於各封裝頭21a、封裝頭21b,安裝有將半導體晶片16拾取及封裝的封裝噴嘴22a、封裝噴嘴22b。各封裝頭21a、封裝頭21b於封裝噴嘴22a、封裝噴嘴22b來到載置台17的正上方拾取半導體晶片16的拾取位置13a、拾取位置13b與封裝噴嘴22a、封裝噴嘴22b將半導體晶片16進行封裝的封裝位置14a、封裝位置14b之間,於Y方向移動。The packaging heads 21a and 21b are arranged on one side of the linear guide 20 and installed in the Y direction, and are guided by the linear guide 20 to move in the Y direction. Each of the packaging heads 21a and 21b is mounted with a packaging nozzle 22a and a packaging nozzle 22b for picking up and packaging the semiconductor chip 16. Each of the packaging heads 21a, 21b, and the packaging nozzle 22a and the packaging nozzle 22b come to the mounting table 17 directly above the pickup position 13a, the pickup position 13b, the packaging nozzle 22a, and the packaging nozzle 22b to pick up the semiconductor wafer 16 to package the semiconductor wafer 16 Between the packaging position 14a and the packaging position 14b, it moves in the Y direction.

於拾取頭33,安裝有拾取噴嘴34,所述拾取噴嘴34從晶圓35拾取半導體晶片16且放置於中間平台31的載置台17上。On the pickup head 33, a pickup nozzle 34 is installed. The pickup nozzle 34 picks up the semiconductor wafer 16 from the wafer 35 and places it on the mounting table 17 of the intermediate platform 31.

於各封裝頭21a、封裝頭21b、拾取頭33、中間平台31,安裝有線性馬達(linear motor)等驅動部,各驅動部根據控制部50的指令而運作。控制部50包括於內部包含中央處理單元(Central Processing Unit,CPU)及記憶部的電腦。Drive units such as linear motors are mounted on each of the packaging head 21a, the packaging head 21b, the pickup head 33, and the intermediate platform 31, and each drive unit operates according to instructions from the control unit 50. The control unit 50 includes a computer including a central processing unit (CPU) and a memory unit inside.

接著,一面參照圖2至圖8,一面對接合裝置100的運作進行說明。以下的說明中,如圖1所示,對在各基板15的Y方向負側端部封裝半導體晶片16的情況進行說明。Next, referring to FIGS. 2 to 8, the operation of the bonding device 100 will be described. In the following description, as shown in FIG. 1, a case where the semiconductor wafer 16 is packaged on the negative side end portion of each substrate 15 in the Y direction will be described.

如圖2所示,控制部50使各封裝頭21a、封裝頭21b向初始位置移動,並且使中間平台31向Y方向負側的第一位置移動。而且,控制部50使拾取頭33於X方向移動,利用拾取噴嘴34,從晶圓35拾取半導體晶片16而分別放置於中間平台31的兩個載置台17上。半導體晶片16是以Y方向的距離W1的間隔來放置於中間平台31的兩個載置台17上。As shown in FIG. 2, the control unit 50 moves each of the packaging heads 21 a and 21 b to the initial position, and moves the intermediate stage 31 to the first position on the negative side in the Y direction. In addition, the control unit 50 moves the pickup head 33 in the X direction, and uses the pickup nozzle 34 to pick up the semiconductor wafer 16 from the wafer 35 and place them on the two mounting tables 17 of the intermediate stage 31. The semiconductor wafer 16 is placed on the two mounting tables 17 of the intermediate stage 31 at intervals of a distance W1 in the Y direction.

半導體晶片16的放置結束後,控制部50如圖3所示,使中間平台31於Y方向正側移動至第二位置。若中間平台31向第二位置移動,則放置於各載置台17的各半導體晶片16的Y方向位置分別成為拾取位置13a、拾取位置13b。After the placement of the semiconductor wafer 16 is completed, the control unit 50 moves the intermediate stage 31 to the second position on the positive side in the Y direction as shown in FIG. 3. When the intermediate stage 31 moves to the second position, the Y-direction position of each semiconductor wafer 16 placed on each mounting table 17 becomes a pickup position 13a and a pickup position 13b, respectively.

如圖4所示,控制部50是以各封裝頭21a、封裝頭21b的各封裝噴嘴22a、封裝噴嘴22b的中心成為拾取位置13a、拾取位置13b的方式,使各封裝頭21a、封裝頭21b向Y方向負側移動。此時,控制部50使各封裝頭21a、封裝頭21b同時從初始位置朝向Y方向負側而起動,使各封裝噴嘴22a、封裝噴嘴22b的中心同時到達拾取位置13a、拾取位置13b,使各封裝頭21a、封裝頭21b向Y方向負側的移動同時停止。As shown in FIG. 4, the control unit 50 controls the packaging heads 21a and 21b so that the centers of the packaging nozzles 22a and 22b of the packaging heads 21a and 21b are the pickup positions 13a and 13b. Move to the negative side in the Y direction. At this time, the control unit 50 starts each of the packaging heads 21a and 21b from the initial position toward the negative side of the Y direction at the same time, so that the centers of the packaging nozzles 22a and 22b reach the pickup position 13a and the pickup position 13b at the same time. The movement of the packaging head 21a and the packaging head 21b to the negative side in the Y direction is stopped at the same time.

如圖5所示,控制部50於各封裝頭21a、封裝頭21b的各封裝噴嘴22a、封裝噴嘴22b的前端分別吸附半導體晶片16,而從中間平台31拾取半導體晶片16。拾取結束後,如圖5所示,使各封裝頭21a、封裝頭21b從拾取位置13a、拾取位置13b向封裝位置14a、封裝位置14b移動。此時,控制部50使各封裝頭21a、封裝頭21b同時朝向Y方向正側而起動,使各封裝噴嘴22a、封裝噴嘴22b的中心同時到達封裝位置14a、封裝位置14b,使各封裝頭21a、封裝頭21b向Y方向正側的移動同時停止。As shown in FIG. 5, the control unit 50 sucks the semiconductor wafer 16 on the tip of each packaging head 21a, each packaging nozzle 22a of the packaging head 21b, and packaging nozzle 22b, respectively, and picks up the semiconductor wafer 16 from the intermediate stage 31. After the pickup is completed, as shown in FIG. 5, the respective packaging heads 21a and 21b are moved from the pickup position 13a and the pickup position 13b to the packaging position 14a and the packaging position 14b. At this time, the control unit 50 activates the packaging heads 21a and 21b simultaneously toward the positive side in the Y direction, and causes the centers of the packaging nozzles 22a and 22b to reach the packaging position 14a and the packaging position 14b at the same time, so that the packaging heads 21a , The movement of the packaging head 21b to the positive side in the Y direction is stopped at the same time.

如上文所說明,由於各拾取位置13a、拾取位置13b與各封裝位置14a、封裝位置14b之間的各Y方向的距離ΔYa與ΔYb相等,故而控制部50如圖7所示的虛線a、實線b般,於時刻t0,使各封裝頭21a、封裝頭21b同時起動,以相同的加速度加速至同一速度直至時刻t1,以同一的速度於Y方向移動至時刻t2,以同一減速度減速至速度零直至時刻t3,且於時刻t3同時停止。此時,如圖8的虛線c、實線d所示,各封裝頭21a、封裝頭21b同時到達封裝位置14a、封裝位置14b。圖7中,虛線a、實線b表示各封裝頭21a、封裝頭21b的速度的時間變化,圖8中,虛線c、實線d於各封裝頭21a、封裝頭21b的Y方向位置表示時間變化。As described above, since the Y-direction distances ΔYa and ΔYb between each pickup position 13a, pickup position 13b, and each packaging position 14a, and packaging position 14b are equal, the control unit 50 is shown by the dotted line a and solid line a in FIG. Like the line b, at time t0, the packaging heads 21a and 21b are started at the same time, accelerated to the same speed at the same acceleration until time t1, moved at the same speed in the Y direction to time t2, and decelerated to The speed is zero until time t3, and stops at the same time at time t3. At this time, as shown by the broken line c and the solid line d in FIG. 8, the packaging heads 21 a and 21 b reach the packaging position 14 a and the packaging position 14 b at the same time. In FIG. 7, the dashed line a and the solid line b indicate the time change of the speed of each package head 21a and the package head 21b. In FIG. 8, the dashed line c and the solid line d indicate the time in the Y direction position of each package head 21a and the package head 21b. Variety.

若各封裝頭21a、封裝頭21b向封裝位置14a、封裝位置14b的移動結束,各封裝頭21a、封裝頭21b停止,則控制部50使各封裝噴嘴22a、封裝噴嘴22b下降,將吸附於各封裝噴嘴22a、封裝噴嘴22b的前端的半導體晶片16封裝於各基板15上。When the movement of the packaging heads 21a and 21b to the packaging positions 14a and 14b is completed, and the packaging heads 21a and 21b are stopped, the control unit 50 lowers the packaging nozzles 22a and 22b to attract The semiconductor wafer 16 at the tip of the packaging nozzle 22 a and the packaging nozzle 22 b is packaged on each substrate 15.

在各半導體晶片16於各基板15的封裝完畢後,如圖6所示,控制部50使各封裝頭21a、封裝頭21b向初始位置移動,使中間平台向第一位置移動,繼續進行下一個半導體晶片16的拾取封裝動作。After the packaging of each semiconductor chip 16 on each substrate 15 is completed, as shown in FIG. 6, the control unit 50 moves each packaging head 21a and packaging head 21b to the initial position, moves the intermediate platform to the first position, and continues to the next The semiconductor wafer 16 is picked up and packaged.

於在基板15,將多個半導體晶片16於Y方向排列封裝的情況下,控制部50是以各拾取位置13a、拾取位置13b與各封裝位置14a、封裝位置14b之間的各距離成為相等的方式,使各封裝頭21a、封裝頭21b移動而封裝多個半導體晶片16。例如,如圖1所示,若於各基板15的Y方向負側端部封裝半導體晶片16,則接著,於從最初的封裝位置向Y方向正側分別僅偏移ΔY1的位置封裝半導體晶片16。於該情況下,各封裝位置14a、封裝位置14b之間的Y方向距離為W1,因此拾取位置13a、拾取位置13b與各封裝位置14a、封裝位置14b之間的各距離相等,與上文的說明同樣,藉由使各封裝頭21a、封裝頭21b以同一加速度、同一速度於Y方向移動,可同時起動,同時到達封裝位置14a、封裝位置14b,使各封裝頭21a、封裝頭21b同時停止。In the case where a plurality of semiconductor wafers 16 are arranged and packaged in the Y direction on the substrate 15, the control unit 50 makes the distances between the respective pickup positions 13a, 13b, and the respective packaging positions 14a and 14b equal In this way, each of the packaging heads 21a and 21b is moved to package a plurality of semiconductor wafers 16. For example, as shown in FIG. 1, if the semiconductor chip 16 is packaged on the negative side end of each substrate 15 in the Y direction, next, the semiconductor chip 16 is packaged at positions shifted by ΔY1 from the initial package position to the positive side in the Y direction. . In this case, the Y-direction distance between the packaging positions 14a and 14b is W1. Therefore, the distances between the pickup position 13a and the pickup position 13b and the respective packaging positions 14a and 14b are equal, which is the same as the above In the same way, by moving the packaging heads 21a and 21b in the Y direction at the same acceleration and speed, they can be started at the same time and reach the packaging position 14a and 14b at the same time, so that the packaging heads 21a and 21b are stopped at the same time. .

如以上所說明,本實施方式的接合裝置100中,由於將封裝頭21a、封裝頭21b於線性引導件20的其中一側,於Y方向排列配置,故而可將線性引導件20的未配置封裝頭21a、封裝頭21b的一側的空間作為其他機器的配置空間。因此,可實現設置空間的減少。另外,由於控制部50使各封裝頭21a、封裝頭21b從拾取位置13a、拾取位置13b,朝向同一方向而同時起動,同時到達封裝位置14a、封裝位置14b而同時停止,故而可於其中一個封裝頭21a的拾取動作或者封裝動作中,抑制由其他封裝頭21b的移動所引起的振動產生干擾而對封裝精度造成影響,從而提高封裝精度。As described above, in the bonding device 100 of the present embodiment, since the packaging head 21a and the packaging head 21b are arranged on one side of the linear guide 20 and arranged in the Y direction, the undisposed linear guide 20 can be packaged The space on one side of the head 21a and the packaging head 21b is used as an arrangement space for other devices. Therefore, the installation space can be reduced. In addition, since the control unit 50 causes each of the packaging heads 21a and 21b to start in the same direction from the pick-up position 13a and the pick-up position 13b, and simultaneously reach the packaging position 14a and the packaging position 14b and stop at the same time, it can be packaged in one of them. During the pick-up operation or the packaging operation of the head 21a, vibration caused by the movement of other packaging heads 21b is suppressed to interfere with the packaging accuracy, thereby improving the packaging accuracy.

接著,對各拾取位置13a、拾取位置13b與各封裝位置14a1、封裝位置14b之間的各個距離不同的情況進行說明。Next, the case where each distance between each pick-up position 13a, the pick-up position 13b, and each packaging position 14a1, and the packaging position 14b is different is demonstrated.

如圖9所示,於在Y方向負側(近前側)的基板15的Y方向負側端部、及Y方向正側(裏側)的基板15的Y方向正側端部封裝半導體晶片16的情況下,近前側的封裝位置14b與裏側的封裝位置14a1之間的距離W2大於近前側的拾取位置13b與裏側的拾取位置13a之間的距離W1。於該情況下,裏側的拾取位置13a與裏側的封裝位置14a1的距離ΔYa1大於近前側的拾取位置13b與近前側的封裝位置14b之間的距離ΔYb。於該情況下,控制部50藉由使移動距離短的一方的封裝頭21b的移動速度,較移動距離長的一方的封裝頭21a的移動速度更緩慢,而使各封裝頭21a、封裝頭21b同時起動,使各封裝頭21a、封裝頭21b的各封裝噴嘴22a、封裝噴嘴22b同時到達各封裝位置14a1、封裝位置14b,使各封裝頭21a、封裝頭21b的Y方向的移動同時停止。As shown in FIG. 9, the semiconductor chip 16 is packaged at the Y-direction negative end of the substrate 15 on the negative side (near side) in the Y direction and the Y-direction positive end of the substrate 15 on the positive side (rear side) in the Y direction. In this case, the distance W2 between the packaging position 14b on the near side and the packaging position 14a1 on the back side is greater than the distance W1 between the pickup position 13b on the near side and the pickup position 13a on the back side. In this case, the distance ΔYa1 between the pickup position 13a on the back side and the packaging position 14a1 on the back side is greater than the distance ΔYb between the pickup position 13b on the near side and the packaging position 14b on the near side. In this case, the control unit 50 makes the moving speed of the packaging head 21b of the shorter moving distance slower than the moving speed of the packaging head 21a of the longer moving distance, so that each of the packaging heads 21a and 21b is At the same time, the packaging head 21a, the packaging nozzle 22a, and the packaging nozzle 22b of the packaging head 21b reach the packaging positions 14a1 and 14b at the same time, and the Y-direction movement of the packaging heads 21a and 21b is stopped at the same time.

控制部50如圖11所示,控制各封裝頭21a、封裝頭21b的速度。圖11中,點虛線e、實線b表示各封裝頭21a、封裝頭21b的速度的時間變化,圖12中,點虛線f、實線d於各封裝頭21a、封裝頭21b的Y方向位置表示時間變化。As shown in FIG. 11, the control part 50 controls the speed of each packaging head 21a and the packaging head 21b. In FIG. 11, the dotted line e and the solid line b indicate the time change of the speed of each packaging head 21a and the packaging head 21b. In FIG. 12, the dotted line f and the solid line d are at the Y-direction positions of the packaging heads 21a and 21b. Indicates a change in time.

控制部50如圖11所示的點虛線e、實線b般,於時刻t0,使各封裝頭21a、封裝頭21b同時起動。近前側的封裝頭21b由於移動距離短,故而於時刻t11停止加速,以較裏側的封裝頭21a更緩慢的速度於Y方向等速移動。另一方面,裏側的封裝頭21a與上文的說明同樣,繼續加速至時刻t1,從時刻t1起成為等速移動。而且,裏側的封裝頭21a從時刻t2起開始減速,於時刻t3到達封裝位置14a1,於時刻t3成為速度零。近前側的封裝頭21b繼續等速移動至時刻t12,從時刻t12起開始減速,於時刻t3到達封裝位置14b,於時刻t3成為速度零。The control unit 50, like the dotted dotted line e and the solid line b shown in FIG. 11, simultaneously activates the respective packaging heads 21a and 21b at time t0. The packaging head 21b on the near side stops accelerating at time t11 due to the short moving distance, and moves at a constant speed in the Y direction at a slower speed than the packaging head 21a on the back side. On the other hand, the packaging head 21a on the back side continues to accelerate to time t1, and moves at a constant speed from time t1, as described above. Then, the packaging head 21a on the back side starts to decelerate from time t2, reaches the packaging position 14a1 at time t3, and becomes zero speed at time t3. The packaging head 21b on the near side continues to move at a constant speed to time t12, starts to decelerate from time t12, reaches the packaging position 14b at time t3, and becomes zero speed at time t3.

於時刻t3,各封裝頭21a、封裝頭21b的Y方向的移動停止後,控制部50將各封裝頭21a、封裝頭21b的各封裝噴嘴22a、封裝噴嘴22b所吸附的半導體晶片16封裝於各基板15上。而且,在各半導體晶片16於各基板15的封裝完畢後,如圖10所示,控制部50使各封裝頭21a、封裝頭21b向初始位置移動,使中間平台31向第一位置移動,繼續進行下一個半導體晶片16的拾取封裝動作。At time t3, after the Y-direction movement of the packaging heads 21a and 21b is stopped, the control unit 50 encapsulates the semiconductor wafers 16 sucked by the packaging heads 21a, 21b, and packaging nozzles 22a and 22b in each On the substrate 15. After the packaging of each semiconductor wafer 16 on each substrate 15 is completed, as shown in FIG. 10, the control unit 50 moves each of the packaging heads 21a and 21b to the initial position, moves the intermediate stage 31 to the first position, and continues The pickup and packaging operation of the next semiconductor wafer 16 is performed.

如以上所說明,實施方式的接合裝置100中,於拾取位置13a、拾取位置13b與封裝位置14a1、封裝位置14b之間的各距離ΔYa1、距離ΔYb不同的情況下,使移動距離短的一方的封裝頭21b的移動速度較距離長的一方的封裝頭21a的移動速度更緩慢。藉此,即便於拾取位置13a、拾取位置13b與封裝位置14a1、封裝位置14b之間的各距離ΔYa1、距離ΔYb不同的情況下,亦可使兩個封裝頭21a、封裝頭21b同時起動、停止。可於其中一個封裝頭21a的拾取動作或者封裝動作中,抑制由其他封裝頭21b的移動所引起的振動產生干擾而對封裝精度造成影響,從而提高封裝精度。As described above, in the bonding device 100 of the embodiment, when the distances ΔYa1 and ΔYb between the pick-up position 13a, the pick-up position 13b, and the packaging position 14a1, and the packaging position 14b are different, the one with the shorter moving distance The moving speed of the packaging head 21b is slower than the moving speed of the packaging head 21a of the longer distance. Thereby, even when the distances ΔYa1 and ΔYb between the pickup position 13a, the pickup position 13b, the packaging position 14a1, and the packaging position 14b are different, the two packaging heads 21a and 21b can be started and stopped at the same time . During the pick-up or packaging action of one of the packaging heads 21a, the vibration caused by the movement of the other packaging heads 21b can be suppressed to interfere with the packaging accuracy, thereby improving the packaging accuracy.

接著,參照圖13至圖15,對其他實施方式的接合裝置200進行說明。對與先前參照圖1至圖12來說明的接合裝置100同樣的部位標註同樣的符號,省略說明。Next, referring to FIGS. 13 to 15, a bonding device 200 according to another embodiment will be described. The same parts as those of the joining device 100 previously described with reference to FIGS. 1 to 12 are given the same reference numerals, and the description is omitted.

如圖13所示,接合裝置200將兩根線性引導件20於Y方向平行地配置兩根,對各線性引導件20分別安裝各為兩個的封裝頭21a、封裝頭21b以及封裝頭21c、封裝頭21d。各封裝頭21a、封裝頭21b與封裝頭21c、封裝頭21d是以於兩根線性引導件20之間相向的方式來配置。因此,可將線性引導件20的未配置封裝頭21a、封裝頭21b的一側以及未配置封裝頭21c、封裝頭21d的一側的空間設為用於其他機器的空間,較排列兩台接合裝置100而言,可進一步減少設置空間。As shown in FIG. 13, the bonding device 200 arranges two linear guides 20 in parallel in the Y direction, and respectively mounts two packaging heads 21a, 21b, and 21c to each linear guide 20. Encapsulation head 21d. Each packaging head 21a, packaging head 21b, packaging head 21c, and packaging head 21d are arranged so as to face each other between the two linear guides 20. Therefore, the space on the side of the linear guide 20 where the packaging head 21a and 21b are not provided, and the side where the packaging head 21c and the packaging head 21d are not provided can be set as a space for other machines, which is better than arranging two for bonding For the device 100, the installation space can be further reduced.

另外,於接合裝置200,設置有兩個導軌30以及被各導軌30引導的兩個中間平台31。進而,於向X方向延伸的導架32,安裝有兩個拾取頭33。In addition, the joining device 200 is provided with two guide rails 30 and two intermediate platforms 31 guided by the guide rails 30. Furthermore, two pick-up heads 33 are attached to the guide frame 32 extending in the X direction.

對以所述方式構成的接合裝置200的運作進行說明。The operation of the bonding device 200 configured as described above will be described.

控制部50使兩個拾取頭33於X方向移動,從兩個晶圓35,分別於中間平台31的各載置台17各放置一個、合計四個的半導體晶片16。The control unit 50 moves the two pick-up heads 33 in the X direction, and places four semiconductor wafers 16 in total on each mounting table 17 of the intermediate stage 31 from the two wafers 35.

控制部50是與參照圖4的說明同樣,如圖14所示,以各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d的各封裝噴嘴22a、封裝噴嘴22b、封裝噴嘴22c、封裝噴嘴22d的中心成為拾取位置13a、拾取位置13b的方式,使各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d朝向Y方向負側移動。此時,控制部50使各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d同時從初始位置朝向Y方向負側而起動,使各封裝噴嘴22a、封裝噴嘴22b、封裝噴嘴22c、封裝噴嘴22d的中心同時到達拾取位置13a、拾取位置13b,使各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d向Y方向負側的移動同時停止。而且,於各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d的各封裝噴嘴22a、封裝噴嘴22b、封裝噴嘴22c、封裝噴嘴22d的前端,分別吸附半導體晶片16。The control unit 50 is the same as the description with reference to FIG. 4, and as shown in FIG. 14, each package nozzle 22a, package nozzle 22b, package nozzle 22c, package head 21a, package head 21b, package head 21c, and package head 21d The center of the nozzle 22d becomes the pickup position 13a and the pickup position 13b, and each of the packaging head 21a, the packaging head 21b, the packaging head 21c, and the packaging head 21d is moved toward the negative side in the Y direction. At this time, the control unit 50 activates each of the packaging heads 21a, 21b, 21c, and 21d from the initial position toward the negative side of the Y direction at the same time, and causes each of the packaging nozzles 22a, 22b, 22c, and The center of the nozzle 22d reaches the pickup position 13a and the pickup position 13b at the same time, and the movement of the packaging head 21a, the packaging head 21b, the packaging head 21c, and the packaging head 21d to the negative side in the Y direction is simultaneously stopped. Then, the semiconductor wafer 16 is sucked at the tip of each of the packaging head 21a, the packaging head 21b, the packaging head 21c, and the packaging nozzle 22a, the packaging nozzle 22b, the packaging nozzle 22c, and the packaging nozzle 22d of the packaging head 21d.

控制部50是與先前參照圖5的說明同樣,使各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d從拾取位置13a、拾取位置13b向封裝位置14a、封裝位置14b移動。此時,控制部50使各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d同時朝向Y方向正側而起動,使各封裝噴嘴22a、封裝噴嘴22b、封裝噴嘴22c、封裝噴嘴22d的中心同時到達封裝位置14a、封裝位置14b,使各封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d向Y方向正側的移動同時停止。The control unit 50 moves the packaging head 21a, the packaging head 21b, the packaging head 21c, and the packaging head 21d from the pickup position 13a and the pickup position 13b to the packaging position 14a and the packaging position 14b in the same manner as described above with reference to FIG. At this time, the control unit 50 activates each of the packaging heads 21a, 21b, 21c, and 21d at the same time toward the positive side in the Y direction, so that the packaging nozzles 22a, 22b, 22c, and 22d are The center reaches the packaging position 14a and the packaging position 14b at the same time, and the movement of the packaging head 21a, the packaging head 21b, the packaging head 21c, and the packaging head 21d to the positive side in the Y direction is simultaneously stopped.

若各封裝頭21a、封裝頭21b向封裝位置14a、封裝位置14b的移動結束,各封裝頭21a、封裝頭21b停止,則控制部50使各封裝噴嘴22a、封裝噴嘴22b下降,將吸附於各封裝噴嘴22a、封裝噴嘴22b的前端的半導體晶片16封裝於各基板15上。When the movement of the packaging heads 21a and 21b to the packaging positions 14a and 14b is completed, and the packaging heads 21a and 21b are stopped, the control unit 50 lowers the packaging nozzles 22a and 22b to attract The semiconductor wafer 16 at the tip of the packaging nozzle 22 a and the packaging nozzle 22 b is packaged on each substrate 15.

本實施方式的接合裝置200除了接合裝置100的作用、效果以外,較接合裝置100而言,可進一步減少設置空間,可利用四個封裝頭21a、封裝頭21b、封裝頭21c、封裝頭21d,將四個半導體晶片16同時封裝,因此可進一步加快封裝速度。In addition to the functions and effects of the bonding device 100, the bonding device 200 of this embodiment can further reduce the installation space compared to the bonding device 100. Four package heads 21a, 21b, 21c, and 21d can be used. The four semiconductor chips 16 are packaged at the same time, so the packaging speed can be further increased.

此外,以上的說明中,已對兩個拾取頭33分別從兩個晶圓35拾取半導體晶片16而放置於中間平台31的各載置台17的情況進行說明,但並不限定於此,例如亦可構成為:各拾取頭33分別從一個晶圓35拾取半導體晶片16而放置於各中間平台31的各載置台17。In addition, in the above description, the case where the two pick-up heads 33 pick up the semiconductor wafers 16 from the two wafers 35 and place them on each mounting table 17 of the intermediate stage 31 has been described, but it is not limited to this, for example, It may be configured that each pickup head 33 picks up the semiconductor wafer 16 from one wafer 35 and places it on each mounting table 17 of each intermediate stage 31.

10‧‧‧基座 11a、11b‧‧‧搬送軌道 12a、12b‧‧‧封裝平台 12c、12d‧‧‧Y方向位置 13a、13b‧‧‧拾取位置 14a、14a1、14b‧‧‧封裝位置 15‧‧‧基板 16‧‧‧半導體晶片 17‧‧‧載置台 20‧‧‧線性引導件 21a、21b、21c、21d‧‧‧封裝頭 22a、22b、22c、22d‧‧‧封裝噴嘴 30‧‧‧導軌 31‧‧‧中間平台 32‧‧‧導架 33‧‧‧拾取頭 34‧‧‧拾取噴嘴 35‧‧‧晶圓 50‧‧‧控制部 100、200‧‧‧接合裝置 a、c‧‧‧虛線 b、d‧‧‧實線 e、f‧‧‧點虛線 t0、t1、t2、t3、t11、t12;‧‧‧時刻 X、Y、Z‧‧‧方向 ΔYa、ΔYa1、ΔYb、ΔYc、ΔYd、W1、W2‧‧‧距離10‧‧‧Base 11a, 11b‧‧‧Conveying track 12a, 12b‧‧‧Packaging platform 12c, 12d‧‧‧Y direction position 13a, 13b‧‧‧Pickup position 14a, 14a1, 14b‧‧‧Packaging position 15‧‧‧Substrate 16‧‧‧Semiconductor chip 17‧‧‧Mounting table 20‧‧‧Linear guide 21a, 21b, 21c, 21d‧‧‧Packing head 22a, 22b, 22c, 22d‧‧‧Packing nozzle 30‧‧‧Guide 31‧‧‧Intermediate platform 32‧‧‧Guide frame 33‧‧‧Pickup head 34‧‧‧Pick up nozzle 35‧‧‧wafer 50‧‧‧Control Department 100、200‧‧‧Joint device a, c‧‧‧dotted line b, d‧‧‧Solid line e、f‧‧‧dotted dotted line t0, t1, t2, t3, t11, t12; ‧‧‧ time X, Y, Z‧‧‧direction ΔYa, ΔYa1, ΔYb, ΔYc, ΔYd, W1, W2‧‧‧Distance

圖1是表示實施方式的接合裝置的構成的平面圖。 圖2是表示圖1所示的接合裝置的利用拾取頭的半導體晶片的拾取動作的平面圖。 圖3是表示圖1所示的接合裝置的中間平台的移動動作的平面圖。 圖4是表示圖1所示的接合裝置的封裝頭向拾取位置的移動的平面圖。 圖5是表示圖1所示的接合裝置的封裝頭向封裝位置的移動的平面圖。 圖6是表示利用圖1所示的接合裝置,將半導體晶片封裝於基板之後的封裝頭向初始位置的移動、以及中間平台向第一位置的移動的平面圖。 圖7是表示圖1所示的接合裝置中,各拾取位置與各封裝位置的各距離相等的情況下的各封裝頭的速度的時間變化的圖表。 圖8是表示圖1所示的接合裝置中,各拾取位置與各封裝位置的各距離相等的情況下的各封裝頭的Y方向的位置的時間變化的圖表。 圖9是表示圖1所示的接合裝置中,各拾取位置與各封裝位置的各距離不同的情況下的封裝頭向封裝位置的移動的平面圖。 圖10是表示於圖9所示的封裝頭的移動之後,將半導體晶片封裝於基板之後的封裝頭向初始位置的移動、以及中間平台向第一位置的移動的平面圖。 圖11是表示圖9所示的封裝頭的移動時的各封裝頭的速度的時間變化的圖表。 圖12是表示圖9所示的封裝頭的移動時的各封裝頭的Y方向的位置的時間變化的圖表。 圖13是表示其他實施方式的接合裝置的構成的平面圖。 圖14是表示圖13所示的接合裝置的封裝頭向拾取位置的移動的平面圖。 圖15是表示圖13所示的接合裝置的封裝頭向封裝位置的移動的平面圖。Fig. 1 is a plan view showing the configuration of a bonding device according to an embodiment. Fig. 2 is a plan view showing a pickup operation of a semiconductor wafer by a pickup head of the bonding apparatus shown in Fig. 1. Fig. 3 is a plan view showing a movement operation of an intermediate platform of the joining device shown in Fig. 1. Fig. 4 is a plan view showing movement of the packaging head of the bonding device shown in Fig. 1 to a pick-up position. 5 is a plan view showing the movement of the packaging head of the bonding device shown in FIG. 1 to the packaging position. 6 is a plan view showing the movement of the packaging head to the initial position and the movement of the intermediate stage to the first position after the semiconductor chip is packaged on the substrate using the bonding apparatus shown in FIG. 1. FIG. 7 is a graph showing the time change of the speed of each packaging head when each distance between each pickup position and each packaging position is equal in the bonding apparatus shown in FIG. 1. FIG. 8 is a graph showing the time change of the position of each packaging head in the Y direction when the respective distances between each pickup position and each packaging position are the same in the bonding apparatus shown in FIG. 1. 9 is a plan view showing the movement of the packaging head to the packaging position in the case where the respective distances between the pick-up positions and the packaging positions are different in the bonding device shown in FIG. 1. 10 is a plan view showing the movement of the packaging head to the initial position after the semiconductor chip is packaged on the substrate after the movement of the packaging head shown in FIG. 9 and the movement of the intermediate stage to the first position. FIG. 11 is a graph showing the time change of the speed of each packaging head during the movement of the packaging head shown in FIG. 9. FIG. 12 is a graph showing the time change of the position of each packaging head in the Y direction when the packaging head shown in FIG. 9 is moved. Fig. 13 is a plan view showing the configuration of a bonding device according to another embodiment. Fig. 14 is a plan view showing the movement of the packaging head of the bonding device shown in Fig. 13 to a pickup position. 15 is a plan view showing the movement of the packaging head of the bonding device shown in FIG. 13 to the packaging position.

10‧‧‧基座 10‧‧‧Base

11a、11b‧‧‧搬送軌道 11a, 11b‧‧‧Conveying track

12a、12b‧‧‧封裝平台 12a, 12b‧‧‧Packaging platform

12c、12d‧‧‧Y方向位置 12c, 12d‧‧‧Y direction position

13a、13b‧‧‧拾取位置 13a, 13b‧‧‧Pickup position

14a、14b‧‧‧封裝位置 14a, 14b‧‧‧Packaging position

15‧‧‧基板 15‧‧‧Substrate

16‧‧‧半導體晶片 16‧‧‧Semiconductor chip

17‧‧‧載置台 17‧‧‧Mounting table

20‧‧‧線性引導件 20‧‧‧Linear guide

21a、21b‧‧‧封裝頭 21a, 21b‧‧‧Packing head

22a、22b‧‧‧封裝噴嘴 22a、22b‧‧‧Packing nozzle

30‧‧‧導軌 30‧‧‧Guide

31‧‧‧中間平台 31‧‧‧Intermediate platform

32‧‧‧導架 32‧‧‧Guide frame

33‧‧‧拾取頭 33‧‧‧Pickup head

34‧‧‧拾取噴嘴 34‧‧‧Pick up nozzle

35‧‧‧晶圓 35‧‧‧wafer

50‧‧‧控制部 50‧‧‧Control Department

100‧‧‧接合裝置 100‧‧‧Joint device

X、Y、Z‧‧‧方向 X, Y, Z‧‧‧direction

ΔYa、ΔYb、ΔYc、ΔYd、W1‧‧‧距離 ΔYa, ΔYb, ΔYc, ΔYd, W1‧‧‧Distance

Claims (5)

一種電子零件封裝裝置,是將電子零件封裝於基板或者其他電子零件的電子零件封裝裝置,包括: 線性引導件,於規定方向延伸; 多個封裝頭,於規定方向排列配置,且被所述線性引導件引導而於規定方向移動;以及 控制部,調整所述封裝頭的規定方向的位置;並且 所述控制部使各個所述封裝頭朝向同一方向而同時起動,且使所述各個所述封裝頭同時停止。An electronic component packaging device is an electronic component packaging device that encapsulates electronic components on a substrate or other electronic components, and includes: Linear guide, extending in the specified direction; A plurality of packaging heads are arranged in a predetermined direction and are guided by the linear guide to move in a predetermined direction; and The control part adjusts the position of the packaging head in the specified direction; and The control unit causes each of the packaging heads to face the same direction and simultaneously starts, and causes each of the packaging heads to stop simultaneously. 如申請專利範圍第1項所述的電子零件封裝裝置,其中 各個所述封裝頭安裝有將所述電子零件拾取及封裝的封裝噴嘴,且於所述封裝噴嘴拾取所述電子零件的拾取位置、與所述封裝頭的所述封裝噴嘴將所述電子零件進行封裝的封裝位置之間,於規定方向移動,並且 所述控制部使各個所述封裝頭從各個所述拾取位置或者各個所述封裝位置,朝向同一方向而同時起動,且使各個所述封裝頭同時到達各個所述封裝位置或者各個所述拾取位置而同時停止。The electronic component packaging device as described in item 1 of the scope of patent application, wherein Each of the packaging heads is equipped with a packaging nozzle for picking up and packaging the electronic parts, and the picking position of the electronic parts is picked up at the packaging nozzles, and the packaging nozzles of the packaging heads Between the package positions of the package, move in the specified direction, and The control unit causes each of the packaging heads to start at the same direction from each of the pickup positions or each of the packaging positions at the same time, and causes each of the packaging heads to reach each of the packaging positions or each of the pickup positions at the same time And stop at the same time. 如申請專利範圍第2項所述的電子零件封裝裝置,其中 包含多個封裝平台,於上表面保持封裝所述電子零件的所述基板或者封裝有所述其他電子零件的所述基板;並且 各個所述拾取位置與各個所述封裝平台之間的規定方向的距離相等。The electronic component packaging device as described in item 2 of the scope of patent application, wherein Comprising a plurality of packaging platforms, holding the substrate encapsulating the electronic components or the substrate encapsulating the other electronic components on the upper surface; and The distance between each of the pickup positions and each of the packaging platforms is equal in a predetermined direction. 如申請專利範圍第3項所述的電子零件封裝裝置,其中 所述基板於規定方向封裝有多個所述電子零件,並且 所述控制部是以各個所述拾取位置與各個所述封裝位置之間的各個距離成為相等的方式,使各個所述封裝頭移動而將多個所述電子零件進行封裝。The electronic component packaging device as described in item 3 of the scope of patent application, wherein The substrate is packaged with a plurality of the electronic components in a predetermined direction, and The control unit moves each of the packaging heads to package a plurality of the electronic components so that each distance between each of the pickup positions and each of the packaging positions becomes equal. 如申請專利範圍第2項或第3項所述的電子零件封裝裝置,其中 所述控制部於各個所述拾取位置與各個所述封裝位置之間的各個距離不同的情況下, 使所述距離短的一方的所述封裝頭的移動速度較所述距離長的一方的所述封裝頭的移動速度更緩慢。Such as the electronic component packaging device described in item 2 or item 3 of the scope of patent application, wherein In the case where each distance between each of the pickup positions and each of the packaging positions is different, the control unit The moving speed of the packaging head on the shorter distance is slower than the moving speed of the packaging head on the longer distance.
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