TWI711710B - 結構化披覆源 - Google Patents

結構化披覆源 Download PDF

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Publication number
TWI711710B
TWI711710B TW105134281A TW105134281A TWI711710B TW I711710 B TWI711710 B TW I711710B TW 105134281 A TW105134281 A TW 105134281A TW 105134281 A TW105134281 A TW 105134281A TW I711710 B TWI711710 B TW I711710B
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TW
Taiwan
Prior art keywords
coating
source
scope
patent application
cracks
Prior art date
Application number
TW105134281A
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English (en)
Chinese (zh)
Other versions
TW201736625A (zh
Inventor
彼得 波爾席克
薩比納 沃爾勒
羅尼 伊能維恩爾克
Original Assignee
德商攀時組成物質有限公司
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Application filed by 德商攀時組成物質有限公司 filed Critical 德商攀時組成物質有限公司
Publication of TW201736625A publication Critical patent/TW201736625A/zh
Application granted granted Critical
Publication of TWI711710B publication Critical patent/TWI711710B/zh

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/0635Carbides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/067Borides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3426Material

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
TW105134281A 2015-12-18 2016-10-24 結構化披覆源 TWI711710B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ATGM371/2015U AT15050U1 (de) 2015-12-18 2015-12-18 Beschichtungsquelle mit Strukturierung
ATATGM371/2015 2015-12-18

Publications (2)

Publication Number Publication Date
TW201736625A TW201736625A (zh) 2017-10-16
TWI711710B true TWI711710B (zh) 2020-12-01

Family

ID=57227207

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105134281A TWI711710B (zh) 2015-12-18 2016-10-24 結構化披覆源

Country Status (8)

Country Link
US (1) US20190003036A1 (enExample)
EP (1) EP3390684B1 (enExample)
JP (1) JP7023844B2 (enExample)
KR (1) KR102657632B1 (enExample)
CN (1) CN108391438B (enExample)
AT (1) AT15050U1 (enExample)
TW (1) TWI711710B (enExample)
WO (1) WO2017102069A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102020115914B4 (de) 2020-06-17 2024-03-07 Sindlhauser Materials Gmbh Flächiges Sputtertarget
CN113930744B (zh) * 2021-09-29 2023-12-15 西北核技术研究所 一种具有高发射阈值的梯度涂层及其制备方法
KR20250086259A (ko) 2023-12-06 2025-06-13 이유진 책상의 기능이 내재되어 있는 캐리어

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61291964A (ja) * 1985-06-17 1986-12-22 Anelva Corp スパツタ用樹脂タ−ゲツト
JPS62278261A (ja) * 1986-05-26 1987-12-03 Seiko Epson Corp スパツタ用タ−ゲツトの製造方法
JPH05230642A (ja) * 1992-02-21 1993-09-07 Nissin High Voltage Co Ltd スパッタ・ターゲット
US5612571A (en) * 1990-05-15 1997-03-18 Kabushiki Kaisha Toshiba Sputtered silicide film
US5997704A (en) * 1996-11-01 1999-12-07 Mitsubishi Materials Corporation Sputtering target for depositing ferroelectric film, method for preparing the same, and method for preparing a DRAM using the same
TW200604362A (en) * 2004-04-23 2006-02-01 Starck H C Gmbh Backing plate for sputter targets
US7850829B2 (en) * 2005-01-12 2010-12-14 Tosoh Smd, Inc. Sputter targets with expansion grooves for reduced separation

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63216969A (ja) * 1987-03-05 1988-09-09 Daido Steel Co Ltd 加工方法
JPH05214518A (ja) * 1992-02-04 1993-08-24 Hitachi Metals Ltd スパッタリングターゲットとバッキングプレートの接合体の矯正方法およびスパッタリングターゲット材
JP5928237B2 (ja) * 2012-08-08 2016-06-01 住友金属鉱山株式会社 Cu−Ga合金スパッタリングターゲット及びその製造方法
CN104711525B (zh) * 2013-12-13 2018-01-26 吉坤日矿日石金属株式会社 溅射靶及其制造方法
CN106471151B (zh) 2014-06-27 2019-06-18 攀时复合材料有限公司 溅镀靶

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61291964A (ja) * 1985-06-17 1986-12-22 Anelva Corp スパツタ用樹脂タ−ゲツト
JPS62278261A (ja) * 1986-05-26 1987-12-03 Seiko Epson Corp スパツタ用タ−ゲツトの製造方法
US5612571A (en) * 1990-05-15 1997-03-18 Kabushiki Kaisha Toshiba Sputtered silicide film
JPH05230642A (ja) * 1992-02-21 1993-09-07 Nissin High Voltage Co Ltd スパッタ・ターゲット
US5997704A (en) * 1996-11-01 1999-12-07 Mitsubishi Materials Corporation Sputtering target for depositing ferroelectric film, method for preparing the same, and method for preparing a DRAM using the same
TW200604362A (en) * 2004-04-23 2006-02-01 Starck H C Gmbh Backing plate for sputter targets
US7850829B2 (en) * 2005-01-12 2010-12-14 Tosoh Smd, Inc. Sputter targets with expansion grooves for reduced separation

Also Published As

Publication number Publication date
US20190003036A1 (en) 2019-01-03
EP3390684B1 (de) 2020-03-18
AT15050U1 (de) 2016-11-15
JP7023844B2 (ja) 2022-02-22
KR102657632B1 (ko) 2024-04-15
WO2017102069A1 (de) 2017-06-22
TW201736625A (zh) 2017-10-16
CN108391438A (zh) 2018-08-10
KR20180094910A (ko) 2018-08-24
JP2019502024A (ja) 2019-01-24
CN108391438B (zh) 2020-04-14
EP3390684A1 (de) 2018-10-24

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