TWI573771B - MnZnCo系肥粒鐵 - Google Patents
MnZnCo系肥粒鐵 Download PDFInfo
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- TWI573771B TWI573771B TW099102553A TW99102553A TWI573771B TW I573771 B TWI573771 B TW I573771B TW 099102553 A TW099102553 A TW 099102553A TW 99102553 A TW99102553 A TW 99102553A TW I573771 B TWI573771 B TW I573771B
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- 229910000859 α-Fe Inorganic materials 0.000 title claims description 55
- 230000005291 magnetic effect Effects 0.000 claims description 132
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 79
- 230000035699 permeability Effects 0.000 claims description 73
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 48
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 claims description 32
- 239000000460 chlorine Substances 0.000 claims description 24
- 239000011787 zinc oxide Substances 0.000 claims description 24
- AMWRITDGCCNYAT-UHFFFAOYSA-L hydroxy(oxo)manganese;manganese Chemical compound [Mn].O[Mn]=O.O[Mn]=O AMWRITDGCCNYAT-UHFFFAOYSA-L 0.000 claims description 22
- 229910052796 boron Inorganic materials 0.000 claims description 20
- 239000000292 calcium oxide Substances 0.000 claims description 20
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 claims description 20
- 229910052698 phosphorus Inorganic materials 0.000 claims description 20
- 229910052801 chlorine Inorganic materials 0.000 claims description 18
- 229910052717 sulfur Inorganic materials 0.000 claims description 18
- 229910000420 cerium oxide Inorganic materials 0.000 claims description 17
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 claims description 15
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims description 14
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 14
- 239000011593 sulfur Substances 0.000 claims description 14
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 13
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 13
- 239000012535 impurity Substances 0.000 claims description 13
- 239000011574 phosphorus Substances 0.000 claims description 13
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 11
- 229910000428 cobalt oxide Inorganic materials 0.000 claims description 11
- IVMYJDGYRUAWML-UHFFFAOYSA-N cobalt(ii) oxide Chemical compound [Co]=O IVMYJDGYRUAWML-UHFFFAOYSA-N 0.000 claims description 11
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 claims description 9
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims description 6
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims description 2
- 229910001928 zirconium oxide Inorganic materials 0.000 claims description 2
- 229910052738 indium Inorganic materials 0.000 claims 1
- 239000000843 powder Substances 0.000 description 35
- 238000000034 method Methods 0.000 description 23
- 229910052742 iron Inorganic materials 0.000 description 22
- 239000013078 crystal Substances 0.000 description 16
- 230000002159 abnormal effect Effects 0.000 description 13
- 239000002994 raw material Substances 0.000 description 11
- 238000005469 granulation Methods 0.000 description 10
- 230000003179 granulation Effects 0.000 description 10
- 239000000203 mixture Substances 0.000 description 9
- 230000000052 comparative effect Effects 0.000 description 8
- 238000005259 measurement Methods 0.000 description 6
- 230000002829 reductive effect Effects 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000000696 magnetic material Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000036961 partial effect Effects 0.000 description 5
- 238000004438 BET method Methods 0.000 description 4
- 239000004372 Polyvinyl alcohol Substances 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000010304 firing Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 229920002451 polyvinyl alcohol Polymers 0.000 description 4
- 238000004804 winding Methods 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
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- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
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- 230000005415 magnetization Effects 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 238000010298 pulverizing process Methods 0.000 description 3
- 238000002798 spectrophotometry method Methods 0.000 description 3
- 238000001694 spray drying Methods 0.000 description 3
- 239000011800 void material Substances 0.000 description 3
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- VFLDPWHFBUODDF-FCXRPNKRSA-N curcumin Chemical compound C1=C(O)C(OC)=CC(\C=C\C(=O)CC(=O)\C=C\C=2C=C(OC)C(O)=CC=2)=C1 VFLDPWHFBUODDF-FCXRPNKRSA-N 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- RBTBFTRPCNLSDE-UHFFFAOYSA-N 3,7-bis(dimethylamino)phenothiazin-5-ium Chemical compound C1=CC(N(C)C)=CC2=[S+]C3=CC(N(C)C)=CC=C3N=C21 RBTBFTRPCNLSDE-UHFFFAOYSA-N 0.000 description 1
- MBMLMWLHJBBADN-UHFFFAOYSA-N Ferrous sulfide Chemical compound [Fe]=S MBMLMWLHJBBADN-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- GDFCWFBWQUEQIJ-UHFFFAOYSA-N [B].[P] Chemical compound [B].[P] GDFCWFBWQUEQIJ-UHFFFAOYSA-N 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000000748 compression moulding Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229940109262 curcumin Drugs 0.000 description 1
- 235000012754 curcumin Nutrition 0.000 description 1
- 239000004148 curcumin Substances 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- VFLDPWHFBUODDF-UHFFFAOYSA-N diferuloylmethane Natural products C1=C(O)C(OC)=CC(C=CC(=O)CC(=O)C=CC=2C=C(OC)C(O)=CC=2)=C1 VFLDPWHFBUODDF-UHFFFAOYSA-N 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 239000003337 fertilizer Substances 0.000 description 1
- 230000009422 growth inhibiting effect Effects 0.000 description 1
- 238000000265 homogenisation Methods 0.000 description 1
- 238000005984 hydrogenation reaction Methods 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 235000000396 iron Nutrition 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000005300 metallic glass Substances 0.000 description 1
- 229960000907 methylthioninium chloride Drugs 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- DHRLEVQXOMLTIM-UHFFFAOYSA-N phosphoric acid;trioxomolybdenum Chemical compound O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.O=[Mo](=O)=O.OP(O)(O)=O DHRLEVQXOMLTIM-UHFFFAOYSA-N 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000011802 pulverized particle Substances 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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Description
本發明係關於適用為例如Ethernet(註冊商標)機器之脈衝變壓器用磁芯等的素材用之MnZnCo系肥粒鐵。
Ethernet機器中,在整合輸出入端子的阻抗與保持電絕緣之目的下,係使用脈衝變壓器。該變壓器內部中,磁芯一般係使用軟磁性材料。此外,在該脈衝變壓器中,如美國規格ANSI X3.263-1995[R2000]所規定,在-40~85℃溫度區域中,於施加直流磁場下可期待具有較高的增分磁導率(incremental permeability)μΔ。另外,所謂「增分磁導率μΔ」係指表示在施加磁場狀態下,磁芯被磁化之容易度的值。
該用途所使用的軟磁性材料,一般係MnZn肥粒鐵。該MnZn肥粒鐵係在軟磁性材料中,具有容易獲得高磁導率、高電感,且相較於非晶質金屬等之下係屬於低價等材質特點。所以,適用於該用途的MnZn肥粒鐵開發已然進行中,例如專利文獻1及專利文獻2等。
然而,因為該MnZn肥粒鐵係屬於氧化物磁性材料,因而相較於金屬磁性材料,除了會因溫度變化導致磁氣特性出現大幅變化,磁導率高的材料尚有飽和磁通密度較低的缺點。
所以,在廣範圍溫度帶域(特別係高溫部),會有難以獲得安定磁氣特性的問題。
已知為了改善上述MnZn肥粒鐵的特性溫度依存性,具有正磁力異向性的CoO的添加係屬有效。例如專利文獻1中敘述:關於本用途的MnZnCo肥粒鐵,係可實現約33A/m直流磁場施加下的高磁導率。
再者,發明者等率先針對適用為Ethernet機器的脈衝變壓器用磁芯,開發出:
「一種MnCoZn肥粒鐵,其特徵在於:由基本成分、添加成分及雜質所構成的肥粒鐵,基本成分組成係由Fe2O3:51.0~53.0莫耳%、ZnO:13.0~18.0莫耳%、CoO:0.04~0.60莫耳%、及其餘部分MnO所構成,添加成分係相對於全部肥粒鐵含有SiO2:0.005~0.040質量%及CaO:0.020~0.400質量%,而依雜質形式含有的P與B量係相對於全部肥粒鐵為P:未滿3質量ppm、B:未滿3質量ppm,且平均粉碎粒徑係1.00~1.30μm」,並揭示於專利文獻3中。
藉由該MnZnCo系肥粒鐵的開發,即便在33A/m的直流磁場施加下,於-40℃~85℃的廣範圍溫度域中,可獲得具有2300以上之高增分磁導率的肥粒鐵鐵芯。
然而,本用途所使用之MnZnCo系肥粒鐵鐵芯,係主要使用外徑2~6mm左右之環形鐵芯所代表的閉合磁路小型形狀。此種小型形狀的情況,在成形之際造成模具破損的可能性會提高,因而無法施加較大的成形壓力。所以,對於圖1所示之成形體,利用SEM(掃描式電子顯微鏡)觀察經燒成後的鐵芯表面,便會有如圖2(b)所示,因造粒粉體崩潰不足所引發的空隙殘存情況。
若鐵芯含有此種空隙,磁性體的佔有體積會減少,因而磁通會集中於磁性體部分,且磁通密度會局部性上升。所以,表觀上在磁性體部分會出現與重疊磁場(superimposed magnetic field)上升相同的現象,因而導致增分磁導率降低。結果,在-40℃~85℃的廣範圍溫度域中,難以經常維持2000以上的增分磁導率。
專利文獻1:日本專利特開2004-196632號公報
專利文獻2:日本專利特開2007-197246號公報
專利文獻3:日本專利特開2008-143744號公報
本發明係有利於解決上述問題,目的在於提供:即便成形為外徑2~6mm左右之小型鐵芯的情況,仍具有在33A/m直流磁場施加時的增分磁導率μΔ於-40℃~85℃的廣範圍溫度域中經常為2000以上之優異特性的MnZnCo系肥粒鐵。
即,本發明主旨構成係如下。
1.一種MnZnCo系肥粒鐵,係由基本成分、副成分及不可避免的雜質所構成者,其特徵為,在由氧化鐵(Fe2O3換算):51.0~53.0莫耳%、氧化鋅(ZnO換算):超過12.0莫耳%且18.0莫耳%以下、氧化鈷(CoO換算):0.04~0.60莫耳%及氧化錳(MnO換算):其餘部分所構成之基本成分中,添加作為副成分之氧化矽(SiO2換算):50~400質量ppm及氧化鈣(CaO換算):1000~4000質量ppm,且在不可避免的雜質中,將磷、硼、硫及氯分別抑制為磷:未滿3質量ppm、硼:未滿3質量ppm、硫:未滿5質量ppm及氯:未滿10質量ppm。
2.如上述1所記載之MnZnCo系肥粒鐵,其中,上述副成分係更進一步添加從氧化鋯(ZrO2換算):0.005~0.075質量%、氧化鉭(Ta2O5換算):0.005~0.075質量%、氧化鉿(HfO2換算):0.005~0.075質量%及氧化鈮(Nb2O5換算):0.005~0.075質量%中選擇之1種或2種以上。
根據本發明,可獲得即便成形為外徑:2~6mm左右之小型鐵芯的情況,仍可具有33A/m直流磁場施加時的增分磁導率μΔ在-40℃~85℃廣範圍溫度域中經常在2000以上之優異特性的MnZnCo系肥粒鐵。
發明者等為解決上述問題而深入鑽研,結果獲得下述發現。
即,磁場重疊時,在被磁化的鐵芯內部,磁壁會從磁場重疊前的狀態進行移動,但當鐵芯中存在有一定值以上的雜質成分之情況,在鐵芯內部便會發生異常晶粒成長,其會大幅妨礙磁壁的移動。增分磁導率係表示該鐵芯重疊磁場狀態下被磁化容易度的值,而33A/m磁場重疊係屬於磁化與磁壁移動的主要區域。所以,在異常晶粒內的成分偏析等妨礙磁壁移動狀態下,會導致增分磁導率的值極端降低。由上所述,為了能在33A/m磁場重疊時可獲得更高的增分磁導率,便必需嚴格抑制異常晶粒成長的發生。
在此,經調查抑制該異常晶粒成長的手段,結果首次發現,相較於習知技術,藉由賦予更嚴格的雜質量規範,即便在高磁場重疊下,仍可實現增分磁導率高的MnZnCo系肥粒鐵鐵芯。
本發明係以上述發現為基礎。
以下,針對本發明進行具體說明。
首先,針對將本發明MnZnCo系肥粒鐵的基本成分組成限定於上述範圍內的理由進行說明。
基本成分中,當氧化鐵未滿51.0莫耳%的情況及超過53.0莫耳%的情況,在低溫度域與高溫度域中的直流磁場施加下之增分磁導率μΔ均會降低。所以,氧化鐵含有量依Fe2O3換算計,係設定在51.0~53.0莫耳%範圍內。較佳係依Fe2O3換算計為52.0~53.0莫耳%。
隨氧化鋅的增加,在直流磁場施加下的增分磁導率μΔ會上升。因而,氧化鋅設定為含有超過12.0莫耳%。然而,若氧化鋅含有量超過18.0莫耳%,在低溫度域中,直流磁場施加下的增分磁導率μΔ會降低,且在高溫度域中,強磁性體喪失磁性的居禮溫度會降低,因而仍會導致直流磁場施加下的增分磁導率μΔ降低。所以,氧化鋅含有量係依ZnO換算計設定為超過12.0莫耳%且18.0莫耳%以下的範圍內。較佳係依ZnO換算計設定在14.0~17.0莫耳%範圍內。
藉由適量含有具正磁力異向性的氧化鈷,在-40℃至85℃的廣範圍溫度域中,於直流磁場施加下,均可保持達2000以上的高增分磁導率μΔ。然而,若氧化鈷含有量未滿0.04莫耳%,則缺乏此添加效果,反之,若氧化鈷含有量超過0.60莫耳%,全溫度域中的增分磁導率μΔ值會降低。所以,氧化鈷含有量係依CoO換算計設定在0.04~0.60莫耳%之範圍內。較佳係依CoO換算計設定在0.08~0.50莫耳%之範圍內。
本發明係MnZnCo系肥粒鐵,基本成分組成中的其餘必需設為氧化錳。其理由係藉由含有氧化錳,便無法實現33A/m直流磁場施加下達2000以上的高增分磁導率μΔ。氧化錳的較佳範圍係依MnO換算計為28.0~33.0莫耳%。
另外,基本成分的氧化鐵、氧化鋅、氧化鈷及氧化錳,係依分別換算為Fe2O3、ZnO、CoO及MnO的值之合計量為100莫耳%之方式進行調整。
其次,針對將本發明MnZnCo系肥粒鐵的副成分組成限定於上述範圍內的理由進行說明。
氧化矽係具有藉由減少在結晶粒內的殘留空孔,而提高直流磁場施加下之增分磁導率μΔ的效果。然而,若氧化矽含有量未滿50質量ppm,便缺乏此添加效果,反之,若氧化矽含有量超過400質量ppm,便會出現異常晶粒,導致直流磁場施加下的增分磁導率μΔ值明顯降低。所以,氧化矽含有量係依SiO2換算計設定在50~400質量ppm之範圍內。較佳係依SiO2換算計在100~250質量ppm之範圍內。
氧化鈣係偏析於MnZnCo系肥粒鐵的結晶界,透過抑制結晶粒成長的效果,而使起始磁導率μi值適度降低,對直流磁場施加下的增分磁導率μΔ提升具有效貢獻。然而,若氧化鈣含有量未滿1000質量ppm,便無法獲得充分的晶粒成長抑制效果,反之,若氧化鈣含有量超過4000質量ppm,便會出現異常晶粒,導致直流磁場施加下的增分磁導率μΔ值明顯降低。所以,氧化鈣含有量係依CaO換算計設定在1000~4000質量ppm之範圍內。較佳係依CaO換算計在1000~2000質量ppm之範圍內。
另外,23℃下的起始磁導率μi值較佳係設為3900~5000左右。
再者,本發明中,將肥粒鐵中的雜質(特別係磷、硼、硫及氯)同時限制在以下範圍內,就直流磁場施加時的增分磁導率μΔ提升而言係屬重要。
磷與硼係從原料氧化鐵混入的不可避免之雜質。若磷與硼中任一者的含有量達3質量ppm以上,便會誘發異常晶粒成長,導致33A/m的磁場重疊時會使增分磁導率μΔ明顯降低。所以,磷與硼含有量均限制為未滿3質量ppm。
另外,作為將磷與硼均限制為未滿3質量ppm的方法,可舉例如將磷與硼含有量極少的高純度氧化鐵、氧化鋅及氧化錳,使用作為原料粉。又,相關在混合/粉碎時所使用的球磨機或磨碎器等的介質,亦是為了避免因介質磨損而造成混入的威脅,最好使用磷與硼含有量較少者。
另外,此處所規定的值全部為P成分的分析手法係使用JIS G 1214(1998年)「磷鉬酸鹽萃取分離磷鉬酸藍光吸光光度法」所規定手法進行定量化的值,而B成分係使用JIS G 1227(1999年)「薑黃素吸光光度法」所規定手法進行定量化的值。
硫係從經由硫化鐵所獲得之原料氧化鐵混入的不可避免之雜質。硫含有量達5質量ppm以上的情況,會誘發異常晶粒成長,導致33A/m的大磁場重疊時會使增分磁導率μΔ明顯降低。所以,硫含有量便限制為未滿5質量ppm。且,更佳係將硫含有量限制於未滿4質量ppm。
另外,作為將硫限制於未滿5質量ppm的方法,係有在製造MnZnCo系肥粒鐵之際,藉由拉長在800℃以上的大氣環境下所施行之煅燒步驟時間,使硫與氧充分產生反應,而降低硫含有量的方法。
另外,此處所規定的S值係使用S成分分析手法之JIS G 1215(1994年)「硫化氫氣化分離亞甲藍吸光光度法」所規定手法進行定量化的值。
氯係從經由氯化鐵所獲得之原料氧化鐵混入的不可避免之雜質。氯含有量達10質量ppm以上的情況,會誘發異常晶粒成長,導致直流磁場施加33A/m下的增分磁導率μΔ明顯降低。所以,氯含有量係限制為未滿10質量ppm。且,更佳係將氯含有量限制為未滿8質量ppm。
另外,作為將氯限制為未滿10質量ppm的方法,係有製造MnZnCo系肥粒鐵之際,藉由將原料氧化鐵利用純水進行充分地洗淨,使較容易離子化的氯溶入於純水中,俾降低氯含有量的方法。
另外,此處所規定的Cl值係使用Cl成分分析手法之「硝酸分解-氯化鐵比濁法」進行定量化的值。
另外,上述磷、硼、硫及氯以外的不可避免之雜質含有量,較佳係均抑制在50質量ppm以下,但並非屬特別的限制物。
本發明之MnZnCo系肥粒鐵中,除上述成分之外,可更進一步適當含有下述成分作為副成分。
從氧化鋯(ZrO2換算):0.005~0.075質量%、氧化鉭(Ta2O5換算):0.005~0.075質量%、氧化鉿(HfO2換算):0.005~0.075質量%及氧化鈮(Nb2O5換算):0.005~0.075質量%中選擇之1種或2種以上
該等成分均屬具高熔點的化合物,當含有於MnZnCo系肥粒鐵中的情況,具有使結晶粒縮小的作用,因而會抑制粗大結晶粒的生成,對直流磁場施加下的增分磁導率μΔ提升具有貢獻。此效果係若各成分含有量過於偏少便無法獲得,另一方面,若過於偏多,便會發生異常晶粒成長情形,導致直流磁場施加下的增分磁導率μΔ降低。所以,該等成分分別設定為依上述範圍內含有。
藉由將上述MnZnCo系肥粒鐵使用為原料,即便成形為外徑:2~6mm左右之小型鐵芯的情況,仍可獲得33A/m直流磁場施加時的增分磁導率μΔ於-40℃~85℃廣範圍溫度域中經常在2000以上的優異特性。
又,同時,發明者等發現在實際製造肥粒鐵鐵芯時,若鐵芯製品中含有多數空隙時,便會有未必一定能獲得所期待良好增分磁導率的情況。
在此,針對此情況進行各種探討,結果發現:鐵芯中所含的空隙係成為表面的比表面積增加之數值變化出現,另外,假設鐵芯表面完全平坦的理想狀態,從鐵芯尺寸形狀計算理想比表面積值時,若使實測比表面積/理想比表面積的比滿足下式(1):
實測比表面積/理想比表面積<1500 ‧‧‧ (1)
的關係,鐵芯空隙便會減少,可獲得較佳的增分磁導率。
此處,實測比表面積係依照JIS Z 8830(2001年)的BET法(多點法)所求得的值,單位係m2/g。又,理想比表面積係以肥粒鐵鐵芯的尺寸與質量為基礎,將假設在鐵芯中無空隙的理想狀態所計算得的表面積值,除以鐵芯質量的值,單位係同為m2/g。
為了參考,圖3所示係理想比表面積的計算概要。
即,若假設鐵芯表面係完全平坦的理想狀態,比表面積便可依下式進行計算:
理想比表面積={2×(外徑2-內徑2)/4×π+(外徑+內徑)×π×高度}/鐵芯質量
當出現增分磁導率降低並構成問題的肥粒鐵鐵芯內含有多數空隙的情況,因為在鐵芯表面亦會殘存多數空隙,因而實測比表面積的值會變大。因而,實測比表面積/理想比表面積的比會變大。而,針對該實測比表面積/理想比表面積的比進行調查,結果得知,若可將該比值抑制於未滿1500,增分磁導率便不會降低,即視同獲得鐵芯表面的空隙殘存較少之緻密鐵芯。更佳的(實測比表面積/理想比表面積)比係在1150以下。
另外,當適量含有上述氧化鋯、氧化鉭、氧化鉿及氧化鈮等副成分的情況,可緩和前述(實測比表面積/理想比表面積)比的要件。即,當未含有該等副成分的情況,(實測比表面積/理想比表面積)比必需抑制於未滿1500,但當含有該等副成分的情況,(實測比表面積/理想比表面積)比便如下式(1)'所示:
實測比表面積/理想比表面積≦1850 ‧‧‧ (1)'
,係被緩和至1850以下。且,造粒粉體的壓碎強度亦被緩和至1.30MPa以下。
藉此,製造條件便被緩和,俾可輕易地獲得所需特性的MnZnCo系肥粒鐵鐵芯。
再者,為了將實測比表面積/理想比表面積的比率抑制於未滿1500時,將MnZnCo系肥粒鐵製造步驟中的造粒條件最佳化,俾獲得較軟造粒粉體之事係屬重要。此處,MnZnCo肥粒鐵的製造程序係屬於公知技術,造粒法主要係採用噴霧乾燥法,詳細如文獻:「肥粒鐵」(1986、丸善、平賀、奧谷、尾島)中第52頁等處所記載。
再者,相關造粒粉體的硬度,利用JIS Z 8841(1993年)所規定的造粒粉體壓碎強度測定便可數值化,得知若依照該JIS Z 8841所規定手法施行測定時的壓碎強度在1.10MPa以下,便可將實測比表面積/理想比表面積的比抑制於未滿1500。更佳的壓碎強度係1.00MPa以下。
另外,因為MnCoZn系肥粒鐵的電阻率係未滿102Ωm的偏低值,因而平常係經對表面施行絕緣塗佈處理之後才使用,而本發明所規定的實測比表面積值,係設定為未施行塗佈處理狀態的鐵芯測定值。理由係當有施行塗佈處理的情況,因為表面已被平滑化,因而不可能正確地測定MnZnCo系肥粒鐵的比表面積。
其次,針對本發明MnZnCo系肥粒鐵的較佳粒徑進行說明,如上述,異常晶粒的發生係會導致直流磁場施加下的增分磁導率μΔ降低。所以,平均結晶粒徑較佳設為5~未滿15μm。
其次,針對本發明MnZnCo系肥粒鐵的較佳製造方法進行說明。
首先,依成為既定比率的方式,秤量屬於基本成分的氧化鐵、氧化鋅、氧化鈷及氧化錳之粉末,將該等充分混合後,施行煅燒。接著,將所獲得煅燒粉施行粉碎。且,在添加上述副成分時,將該等依既定比率添加並與煅燒粉同時施行粉碎。在此作業中,必需依所添加成分的濃度不會有偏頗的方式,施行粉末的充分均質化,同時必需將煅燒粉微細化至目標平均粒徑。
依此便可獲得所需組成的MnZnCo系肥粒鐵。
再者,使用上述MnZnCo系肥粒鐵進行肥粒鐵鐵芯的製造時,於所獲得粉末中添加聚乙烯醇等有機物黏結劑,利用噴霧乾燥法等施行造粒,而形成壓碎強度未滿1.10MPa的軟造粒粉體後,再壓縮成形為所需形狀,然後在適當燒成條件下施行燒成。壓縮成形時的加壓力較佳係設為115~120MPa左右,且燒成條件較佳係設為1200~1400℃、18~30小時左右。
在此,作為將造粒粉體的壓碎強度抑制於未滿1.10MPa的手法,降低造粒時的溫度(具體而言係設定為較習知250~300℃更低50~100℃程度的150~200℃左右)係屬有利。
另外,習知依250~300℃施行造粒時,造粒粉體的壓碎強度會成為1.2~1.4MPa左右,此種壓碎強度並無法獲得本發明目標之
實測比表面積/理想比表面積<1500 ‧‧‧ (1)
的情形,係如前述。
依此所獲得的MnZnCo系肥粒鐵鐵芯,可實現習知MnZnCo系肥粒鐵鐵芯所不可能的33A/m之大直流磁場施加下,於-40℃~85℃溫度區域中的增分磁導率μΔ達2000以上之高值。
另外,習知MnZnCo系肥粒鐵鐵芯係在33A/m的直流磁場施加下,於-40℃~85℃的廣範圍溫度域中,增分磁導率μΔ值僅不過為1700左右而已。
將基本成分的氧化鐵、氧化鋅、氧化鈷及氧化錳之組成,依Fe2O3、ZnO、CoO及MnO換算計成為表1所示比率的方式進行秤量之各原料粉末,使用球磨機施行16小時混合後,在空氣中依925℃施行3小時的煅燒。接著,將副成分的氧化矽與氧化鈣依SiO2與CaO換算計同樣成為表1所示比率的方式進行秤量後,再添加於該煅燒粉中,利用球磨機施行12小時粉碎,製得MnZnCo系肥粒鐵粉。
接著,在所獲得之MnZnCo系肥粒鐵粉中添加水而漿化後,再添加聚乙烯醇,並依180℃之溫度施行造粒,經附加118MPa壓力而成形為環形鐵芯。然後,將該成形體裝入於燒成爐中,依最高溫度:1350℃施行燒成,獲得外徑:6.0mm、內徑:3.0mm及高度:4.0mm的燒結體芯。
針對依此所獲得之各試料,施行10圈數的繞線,並使用直流施加裝置(42841A:Agilent Technologies公司製),在對鐵芯施加33A/m直流磁場狀態下,使用LCR儀(4284A:Agilent Technologies公司製),依測定電壓:100mV、測定頻率:100kHz,測定-40℃、0℃、23℃、70℃及85℃下的增分磁導率μΔ。
另外,起始磁導率μi係在23℃下使用LCR儀(4284A)進行測定。
另外,試料製作中,氧化鐵等原料均係使用高純度物,且相關混合、粉碎介質的球磨機,亦是使用磷與硼含有量較低者,煅燒係在充分空氣流下實施,且使用幾乎未含有Cl的純水,因而P、B、S及Cl的最終含有量係在所有的試料中,P、B係2質量ppm、S係3質量ppm、Cl係6質量ppm。
再者,根據JIS Z 8841所測得之造粒粉體的壓碎強度係0.90±0.05MPa,因而肥粒鐵鐵芯表面的空隙殘存較少,所以實測比表面積係0.453~0.493m2/g,且理想比表面積係4.44×10-4m2/g,(實測比表面積/理想比表面積)比係1020~1110,均低於1500。
再者,針對各試料的結晶粒徑,將鐵芯切斷,並使用光學顯微鏡依500倍對破碎面經研磨過物拍攝不同的3度視野,再從針對影像內所含粒子施行測定的粒徑,計算出平均結晶粒徑。
所獲得結果合併記於表1。
如該表所示,屬於發明例的試料編號1-3、1-5、1-9及1-12均可獲得在-40℃~85℃的廣範圍溫度域中施行33A/m直流磁場時的增分磁導率μΔ經常達2000以上的優異特性。
相對於此,Fe2O3多於53.0莫耳%的比較例(試料編號1-1)及Fe2O3未滿51.0莫耳%的比較例(試料編號1-2),在85℃與-40℃中的增分磁導率μΔ值均未滿2000。
再者,關於未含CoO的比較例(試料編號1-4),-40℃與85℃中的增分磁導率μΔ並未到達2000,相反的含有多量的比較例(試料編號1-6),在全溫度域中的增分磁導率μΔ會降低,特別係-40℃與85℃中的增分磁導率μΔ未滿2000。
再者,ZnO超過上限而大量含有的比較例(試料編號1-7),在33A/m直流磁場施加下,-40℃與85℃中的增分磁導率μΔ值未滿2000,相反的,ZnO未滿下限的比較例(試料編號1-8),在全溫度域的增分磁導率μΔ均降低,特別係-40℃與85℃中的增分磁導率μΔ值未滿2000。
再者,若著眼於SiO2及CaO,該等中任一者的含有量少於適當範圍的比較例(試料編號1-10及1-11),起始磁導率μi過度上升,結果全溫度域中的增分磁導率μΔ值較發明例降低,-40℃與85℃中的增分磁導率μΔ值未滿2000。又,相反的,SiO2與CaO其中一者或二者的含有量多於適當範圍而含有的比較例(試料編號1-13、1-14及1-15),會出現異常晶粒情形,結果增分磁導率μΔ係在全溫度域中均大幅劣化。
使用P、B、S及Cl含有量不同的各種氧化鐵原料,依P、B、S、Cl的含有量如表2所示比率的方式進行計算,且將屬於基本成分的氧化鐵、氧化鋅、氧化鈷及氧化錳之組成,依Fe2O3、ZnO、CoO及MnO換算計分別為Fe2O3:52.0莫耳%、ZnO:16.0莫耳%、CoO:0.40莫耳%及MnO:其餘部分的方式,進行原料秤量,使用球磨機施行16小時混合後,在空氣中依925℃施行3小時的煅燒。接著,針對該等煅燒粉其中一部分,添加副成分的氧化矽與氧化鈣依SiO2與CaO換算計分別為SiO2:100質量ppm、CaO:500質量ppm之後,再將所有的原料粉利用球磨機施行12小時粉碎,便製得MnZnCo系肥粒鐵粉。
接著,在所獲得之MnZnCo系肥粒鐵粉中添加水而漿化後,再添加聚乙烯醇,並依180℃溫度施行造粒,經附加118MPa壓力而成形為環形鐵芯。另外,此時,改變各種造粒溫度,使所得之造粒粉體的壓碎強度改變。然後,將該成形體裝入於燒成爐中,依最高溫度:1350℃施行燒成,獲得外徑:6.0mm、內徑:3.0mm及高度:4.0mm的燒結體芯。
針對依此所獲得之各試料,施行10圈數的繞線,使用與實施例相同的直流施加裝置與LCR儀,依施加33A/m直流磁場的狀態,依測定電壓:100mV、測定頻率:100kHz,測定-40℃、0℃、23℃、70℃及85℃下的增分磁導率μΔ。又,根據JIS Z 8841的規定,測定造粒粉體的壓碎強度,且依照JIS Z 8830(2001年)的BET法(多點法)測定實測比表面積,並從以根據JIS C 2560所測得尺寸、重量為基礎而計算得的理想比表面積值(理想比表面積:4.44×10-4m2/g),求取(實測比表面積/理想比表面積)比。另外,起始磁導率μi與平均結晶粒徑的測定方法係如同實施例1的情況。
所獲得結果合併記於表2。
如表2所示,S:未滿5質量ppm、Cl:未滿10質量ppm,且P與B均僅含有未滿3質量ppm的發明例(試料編號1-5與2-1),可獲得在33A/m直流磁場施加下,-40℃~85℃溫度域中的增分磁導率μΔ經常達2000以上的優異特性。
相對於此,即便P、B、S及Cl中之一者的含有量超過適當範圍的比較例(試料編號2-2~2-21),均係在-40℃、0℃、23℃、70℃及85℃之至少任一溫度中的增分磁導率μΔ值會降低至未滿2000。
將與試料編號1-5相同組成的粉碎粉使用作為原料,藉由使利用噴霧乾燥法進行造粒時的溫度條件產生變化,而獲得壓碎強度在0.70~1.40MPa範圍的不同造粒粉體。
接著,將所獲得之造粒粉體在與實施例1相同的條件下進行成形、燒成,獲得外徑:6.0mm、內徑:3.0mm及高度:4.0mm的燒結體芯(理想比表面積:4.44×10-4m2/g)。
針對依此所獲得之各試料,施行10圈數的繞線,使用與實施例相同的直流施加裝置與LCR儀,在對鐵芯施加33A/m直流磁場的狀態下,依測定電壓:100mV、測定頻率:100kHz,測定-40℃、0℃、23℃、70℃及85℃下的增分磁導率μΔ。
又,根據JIS Z 8841的規定,測定造粒粉體的壓碎強度,且依照JIS Z 8830(2001年)的BET法(多點法)測定實測比表面積,並求取(實測比表面積/理想比表面積)比。另外,起始磁導率μi與平均結晶粒徑的測定方法,係如同實施例1的情況。
所獲得結果合併記於表3。
因造粒粉體壓碎強度未滿1.10MPa,結果鐵芯的比表面積降低,實測比表面積/理想比表面積值未滿1500的發明例(試料編號1-5、3-1~3-4),可獲得在33A/m直流磁場施加下,-40℃~85℃溫度域中的增分磁導率μΔ達2500以上的優異特性。
然而,造粒粉體壓碎強度達1.10MPa以上的比較例(試料編號3-5~3-7),因為實測比表面積/理想比表面積的數值達1500以上,即因造粒粉體崩潰不良而造成含有頗多的空隙,因而無法滿足在-40℃~85℃的全部溫度域中之增分磁導率μΔ達2500以上。
使與試料編號1-5相同組成的煅燒粉(但,調整為P:2質量ppm、B:2質量ppm、S:3質量ppm、及Cl:6質量ppm)中,含有作為副成分的氧化鋯、氧化鉭、氧化鉿及氧化鈮,依ZrO2、Ta2O5、HfO2、Nb2O5換算計成為最終組成如表4所示比率,並使用球磨機施行12小時粉碎,獲得MnZnCo系肥粒鐵粉。
接著,在所獲得之MnZnCo系肥粒鐵粉中添加水而漿化後,再添加聚乙烯醇,並依180℃溫度施行造粒,經附加118MPa壓力而成形為環形鐵芯。然後,將該成形體裝入於燒成爐中,依最高溫度:1350℃施行燒成,獲得外徑:6.0mm、內徑:3.0mm及高度:4.0mm的燒結體芯(理想比表面積:4.44×10-4m2/g)。
針對依此所獲得之各試料,施行10圈數的繞線,使用與實施例相同的直流施加裝置與LCR儀,依施加33A/m直流磁場的狀態,依測定電壓:100mV、測定頻率:100kHz,測定-40℃、0℃、23℃、70℃及85℃下的增分磁導率μΔ。又,根據JIS Z 8841的規定,測定造粒粉體的壓碎強度,且依照JIS Z 8830(2001年)的BET法(多點法)測定實測比表面積,並從以根據JIS C 2560所測得尺寸、重量為基礎而計算得的理想比表面積值(理想比表面積:4.44×10-4m2/g),求取(實測比表面積/理想比表面積)比。另外,起始磁導率μi與平均結晶粒徑的測定方法係如同實施例1的情況。
所獲得結果合併記於表4。
由該表中得知,適量添加從ZrO2、Ta2O5、HfO2及Nb2O5中選擇之一種或二種以上的發明例(試料編號4-1~4-15),均呈現33A/m直流磁場施加下的增分磁導率μΔ在-40℃~85℃溫度域中經常達2700以上的優異值,相較於未添加該等成分的發明例(試料編號1-5),可獲得同等級以上的特性值。
然而,即便該等4成分中有1成分超過上限值而含有大量的比較例(試料編號4-16~4-18),會發生異常晶粒成長,33A/m直流磁場施加下的增分磁導率μΔ在全溫度域中呈大幅劣化。
再者,適量添加從ZrO2、Ta2O5、HfO2及Nb2O5中選擇之一種或二種以上的情況,如試料編號4-19~4-23的發明例所示,即便(實測比表面積/理想比表面積)比係1500以上,但若在1850以下,33A/m直流磁場施加下的增分磁導率μΔ於-40℃~85℃溫度域中仍可獲得經常達2200以上的優異特性。另一方面,因為試料編號4-24的ZrO2與Nb2O5添加量達適量以上,因而增分磁導率會降低。
藉由使用本發明的MnZnCo系肥粒鐵,可獲得33A/m直流磁場施加時的增分磁導率μΔ在-40℃~85℃廣範圍溫度域中增分磁導率μΔ經常在2000以上之優異特性MnZnCo系肥粒鐵鐵芯,使用於例如Ethernet機器的脈衝變壓器之磁芯等,係可達優異效果。
圖1為MnZnCo系肥粒鐵鐵芯的空隙觀察切剖圖。
圖2(a)為本發明鐵芯中無殘存空隙的狀態圖。
圖2(b)為習知鐵芯中因造粒粉體的崩潰不足所引發殘存空隙的狀態圖。
圖3為理想比表面積的計算概要圖。
Claims (1)
- 一種MnZnCo系肥粒鐵,係由基本成分、副成分及不可避免的雜質所構成者,其特徵為,在由:氧化鐵(Fe2O3換算):51.0~53.0莫耳%、氧化鋅(ZnO換算):超過12.0莫耳%且18.0莫耳%以下、氧化鈷(CoO換算):0.04~0.60莫耳%及氧化錳(MnO換算):其餘部分所構成基本成分中,添加作為副成分之氧化矽(SiO2換算):50~400質量ppm及氧化鈣(CaO換算):1000~4000質量ppm,更進一步添加氧化鋯(ZrO2換算):0.005~0.075質量%、氧化鉭(Ta2O5換算):0.005~0.075質量%、氧化鉿(HfO2換算):0.005~0.075質量%及氧化鈮(Nb2O5換算):0.005~0.075質量%中選擇之1種或2種以上,且在不可避免的雜質中,將磷、硼、硫及氯分別抑制為磷:未滿3質量ppm、硼:未滿3質量ppm、硫:未滿5質量ppm及氯:未滿10質量ppm;該MnZnCo系肥粒鐵係在成形為外徑2mm~6mm之小型 鐵芯時,在施加33A/m直流磁場時的增分磁導率μΔ於-40℃~85℃之廣範圍溫度域中經常在2000以上。
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