TWI461706B - 電阻抗測定裝置 - Google Patents

電阻抗測定裝置 Download PDF

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Publication number
TWI461706B
TWI461706B TW101133023A TW101133023A TWI461706B TW I461706 B TWI461706 B TW I461706B TW 101133023 A TW101133023 A TW 101133023A TW 101133023 A TW101133023 A TW 101133023A TW I461706 B TWI461706 B TW I461706B
Authority
TW
Taiwan
Prior art keywords
conductive path
potential
electrical
electrical impedance
electrically connected
Prior art date
Application number
TW101133023A
Other languages
English (en)
Chinese (zh)
Other versions
TW201312128A (zh
Inventor
Munehiro Yamashita
Original Assignee
Nidec Read Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp filed Critical Nidec Read Corp
Publication of TW201312128A publication Critical patent/TW201312128A/zh
Application granted granted Critical
Publication of TWI461706B publication Critical patent/TWI461706B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/003—Measuring mean values of current or voltage during a given time interval
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
TW101133023A 2011-09-12 2012-09-10 電阻抗測定裝置 TWI461706B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011198416A JP2013061177A (ja) 2011-09-12 2011-09-12 インピーダンス測定装置

Publications (2)

Publication Number Publication Date
TW201312128A TW201312128A (zh) 2013-03-16
TWI461706B true TWI461706B (zh) 2014-11-21

Family

ID=47927356

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101133023A TWI461706B (zh) 2011-09-12 2012-09-10 電阻抗測定裝置

Country Status (4)

Country Link
JP (1) JP2013061177A (ko)
KR (1) KR101354031B1 (ko)
CN (1) CN102998531B (ko)
TW (1) TWI461706B (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102318031B1 (ko) 2014-10-29 2021-10-27 니혼덴산리드가부시키가이샤 기판 검사 장치, 및 기판 검사 방법
DE202018104044U1 (de) * 2018-07-13 2019-10-15 Wago Verwaltungsgesellschaft Mbh Erdleiter-Überwachung
WO2021163734A1 (en) * 2020-02-13 2021-08-19 Sendyne Corporation Improved functional safety of measurements

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3179880A (en) * 1962-05-18 1965-04-20 Julie Res Lab Inc Impedance measuring apparatus
US3781671A (en) * 1972-02-24 1973-12-25 F Preikschat Impedance measuring bridge circuit
US4283675A (en) * 1979-03-12 1981-08-11 Bell Telephone Laboratories, Incorporated Impedance/admittance measuring circuit
TW200639416A (en) * 2005-05-10 2006-11-16 Picotest Corp Circuit providing steady current with high voltage isolation and resistance measurement apparatus with circuit thereof
TWM341209U (en) * 2007-12-31 2008-09-21 Mei-Hui Wu Universal testing device for precise resistor
US20100109687A1 (en) * 2008-10-30 2010-05-06 Laszlo Otto Drimusz Impedance Measurement System and Method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1477436A (en) * 1975-05-21 1977-06-22 Penzen Politekhn I Devices for measuring parameters of compound electric circuits
JPS6146474U (ja) * 1984-08-29 1986-03-28 関西日本電気株式会社 サ−キツトテスタ
DE4304448C2 (de) * 1993-02-13 1996-01-18 Ita Ingb Testaufgaben Gmbh Guard-Testvorrichtung
CN1310342A (zh) * 2000-02-22 2001-08-29 梅忠恕 网络电阻虚拟分断测试技术及其应用
TW546480B (en) * 2000-03-07 2003-08-11 Sumitomo Metal Ind Circuit, apparatus and method for inspecting impedance
TWI221196B (en) * 2001-09-06 2004-09-21 Tokyo Electron Ltd Impedance measuring circuit, its method, and electrostatic capacitance measuring circuit
TW591236B (en) * 2001-09-06 2004-06-11 Sumitomo Metal Industry Ltd Impedance detector circuit and static capacitance detector circuit

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3179880A (en) * 1962-05-18 1965-04-20 Julie Res Lab Inc Impedance measuring apparatus
US3781671A (en) * 1972-02-24 1973-12-25 F Preikschat Impedance measuring bridge circuit
US4283675A (en) * 1979-03-12 1981-08-11 Bell Telephone Laboratories, Incorporated Impedance/admittance measuring circuit
TW200639416A (en) * 2005-05-10 2006-11-16 Picotest Corp Circuit providing steady current with high voltage isolation and resistance measurement apparatus with circuit thereof
TWM341209U (en) * 2007-12-31 2008-09-21 Mei-Hui Wu Universal testing device for precise resistor
US20100109687A1 (en) * 2008-10-30 2010-05-06 Laszlo Otto Drimusz Impedance Measurement System and Method

Also Published As

Publication number Publication date
CN102998531B (zh) 2015-11-25
KR101354031B1 (ko) 2014-02-04
TW201312128A (zh) 2013-03-16
JP2013061177A (ja) 2013-04-04
KR20130028858A (ko) 2013-03-20
CN102998531A (zh) 2013-03-27

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