TWM341209U - Universal testing device for precise resistor - Google Patents

Universal testing device for precise resistor Download PDF

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Publication number
TWM341209U
TWM341209U TW96222669U TW96222669U TWM341209U TW M341209 U TWM341209 U TW M341209U TW 96222669 U TW96222669 U TW 96222669U TW 96222669 U TW96222669 U TW 96222669U TW M341209 U TWM341209 U TW M341209U
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TW
Taiwan
Prior art keywords
test
point
universal
probe
precision
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TW96222669U
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Chinese (zh)
Inventor
Mei-Hui Wu
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Mei-Hui Wu
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Priority to TW96222669U priority Critical patent/TWM341209U/en
Publication of TWM341209U publication Critical patent/TWM341209U/en

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Description

M341209 八、新型說明: 【新型所屬之技術領域】 本創作係為-種可職精密電阻之萬關試裝置,特別是指 於利用測試盤之導接點與預先定義相對應且獨立之編號萬用測試 機之測成點相連接,在透過依不畴號所製作之轉接盒與測試盤 相組合’使被測試點之概訊號可確實藉由賴部連接至四線式 ,電阻量職(或功能_之電子電路)上進行精密電阻的量測, # 俾達到減少專用測試治具製作成本之目的者。 【先前技術】 广参弟、至4圖所示’按’―般電路板測試用之萬用測試機 針盤A上之複數電子偵測點A1是成點矩陣排列,其整體構造係由M341209 VIII. New description: [New technical field] This creation is a universal test device for working precision resistors, especially for the use of test pads with corresponding pre-defined and independent numbers. Using the test machine's measurement points to connect, the combination of the adapter box and the test panel made by the Dependent No. is 'the signal of the tested point can be connected to the four-wire type by the Lai section. (or the electronic circuit of the function _) the measurement of the precision resistor, # 俾 to achieve the purpose of reducing the cost of the production of special test fixtures. [Prior Art] Guangshendi, the universal tester for the 'press'-like circuit board test shown in Figure 4, the multiple electronic detection points A1 on the dial A are arranged in a dot matrix, and the overall structure is

被測物的被泰是被多糊丨糾顺成,糊丨板B與導引板B 間有間隔支柱B1關-段距離,且治具上面插有線針,該線針被 導引板B導引成垂直或斜斜的導引到萬用測試機的點矩陣電子偵 測點上。 、 而習用之萬用測試機針盤A之電子偵測點ai製作方法大多區 分為下列兩種;其中-種係先製作出—點鱗排列之針盤A 過電線把探針A2與電子偵測卡片c上的偵測點α,形成—透 圖3所示)。另一種製作方法係將電子_卡片C上的偵 製作成點矩陣的排列狀,再將該電子偵測卡 二‘,、、 並相連結組合,藉以形成—更大的排列 域更大面積的點矩陣摘測點(請參圖4 所不)。 4 5 M341209 上述習用萬用測試機雖可測量—般電路板,但並無法量測精 松電阻之原因如下: 口測4精&需使用四線式的測試方法,也就是在一個 爾式點DJlf魏(連接)兩根探針D1,-條導線上具有兩侧 尤沾所以必須扎(連接)四根探針則(如圖5所示)連接至四 線式電阻測量電表E。而現今萬用測試機上之電子偵測點係透過電 晶體來做開關切換,把要量測電阻用之電表或電路透過電晶體開 關F的切換動作’切換到要量測的點上(如圖6所示)。但由於電 ,體的物理特性,會有漏電流現象及阻抗等問題產生,所以電表 畺測到的被測線路阻值就不是很準。 如料從改良萬_試機上來達到可進行量測四線式電阻之 目的’實際上之有相當_度及不便,因為萬用職機上之點矩 陣偵測點在製作時已作好且鎖在機台上,如果要從某些測試點上 來進行四線式電阻量測,需從萬用測試機之機台上的點矩陣_ 點拉線到四線式電阻量測電表(或電路)。惟,而且每個被測料號 的被測點位址都不盡相同,每當測試到不同料號時就必須把㈣ 重複的拆裝’導致在實際上改裝上增加許多_度,所以在業界 幾乎不太可能採取鱗做法,即_财_職機上點矩陣伯 測點把欲㈣之線雜朗四線式量測電表(或電路)。 為解決四線式電阻量測問題則必須依照每組不同之料號 作出專用之測試料,—般測試動作完成後,再將被測物移到四、 線式電阻量财關試治具上來進行峨。但專用測試治 6 M341209 在成本上造成祖當之 測試結構、方法進行 拉或襄作軸本相#高,實際上對於測試業 負擔,為顧翻職料之高縣或對於 改良’實輕業界—個相當重要的課題。 【新型内容】 本創作之主要目的係提供—種可 ★、 3 ^連接至四線式電阻量_進行戦,使該萬用測 、=、=㈣路外亦可測試精密電阻值,俾可大大降低製作專用 測忒治具(設備)之成本。 為,上述目的’本創作係為—種可測試精密電阻之萬用 裝置,其包含有: 一針盤組’係-端與賴設備舰,其針盤組上佈設有矩陣 排列之測試點,每―測試點上係預先定A有獨立編號。 、則式i其上佈设有複數導接點’每-導接點上係預先定 義有獨立編波,用以與針盤組上相同編號之峨點連接。 -轉接盒’其底座設有無賴導接賴應之之轉接部,其 -端係設有峨部’鋪接點與測試部依戦料號之不同而電性 導接。 其中,該針盤組上可進一步設置複數之導引板,每一導引板 間係以間隔支柱來區隔’每—片導引板上係設有對應之孔洞,並 佈設有不同尺寸之線針,用於對應被測物(電路板)上之被測試 M341209 供連接導線及測試 該針盤組上測試點可進一步延伸一探針, 設備用。 在一較佳實施财,該導接點可進—步延伸-探針,供連接 導線至針盤組。且該導接點係為—凹槽或孔·,供轉接盒轉接 點可對應置入結合。 在理想只例中,該轉接部係為一探針或棒狀導電體, 對應導接點置入結合。 、制試部1以外接線材、齡或連接H之其-連接至四線 式電阻篁測機供進行量測。 ' 在-可行實财’該轉接盒其底座外可進—步力礎, 供保護内部線路。 1 為使貴審查委員能瞭解摘作之技_容,及所能達成之功 效,祕合圖式列舉諸較佳實施例詳細說明如後。 【實施方式】 兹為便於貴審查委員能更進一步對本創作 其特徵有想—層,_、·纖人舉2 之實施例,配合圖式詳細說明如下: 码平又1 土 請參考第7至10圖所示,本創作之可㈣精 試裝置,係包含有: 4用測 -針盤組! ’係-端與測試設備連接,其針盤組 陣排列之測試點η,每—測試點u ^有矩 、 工你谀元弋義有獨立編The accommodating object is entangled in a multi-paste, and there is a gap between the baffle plate B and the guide plate B. The distance between the jig and the guide plate B is off, and the wire is inserted into the jig. The needle is guided by the guide plate B. Guided to a vertical or oblique guide to the point matrix electronic detection point of the universal test machine. The conventional electronic test point ai production method of the universal tester dial A is divided into the following two types; among them, the first type is produced - the dial-arranged dial A is connected to the probe A2 and the electronic detect The detection point α on the card c is measured, as shown in FIG. 3). Another method is to make the array on the electronic card C into a matrix of dots, and then combine the two electronic signature cards ',, and, to form a larger area of larger area. Point matrix extraction point (please refer to Figure 4). 4 5 M341209 Although the above-mentioned conventional universal tester can measure the general circuit board, the reason why it can't measure the loose resistance is as follows: Oral test 4 fine & requires a four-wire test method, that is, in one Point DJlf Wei (connect) two probes D1, the strip has two sides on it, so it is necessary to tie (connect) four probes (as shown in Figure 5) to the four-wire resistance measuring meter E. Nowadays, the electronic detection point on the universal test machine is switched by the transistor, and the electric meter or circuit for measuring the resistance is switched to the point to be measured through the switching action of the transistor switch F (eg Figure 6)). However, due to the physical characteristics of electricity and body, there are problems such as leakage current and impedance. Therefore, the measured resistance of the measured line of the meter is not very accurate. If it is expected to be able to measure the four-wire resistance from the improved 10,000 tester, it is actually quite ok and inconvenient, because the dot matrix detection points on the universal machine are already in production and Lock on the machine. If you want to measure the four-wire resistance from some test points, you need to use the dot matrix _ point pull wire on the machine of the universal test machine to the four-wire resistance measuring meter (or circuit). ). However, the location of the measured points of each measured item number is not the same. When testing different item numbers, it is necessary to repeat (4) repeated disassembly and assembly, resulting in a lot of _ degrees in actual modification, so It is almost impossible for the industry to adopt the scale method, that is, the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ In order to solve the four-wire resistance measurement problem, special test materials must be made according to each group of different material numbers. After the general test action is completed, the object to be tested is moved to the fourth line resistance measurement test fixture. Carry out the trick. However, the special test and treatment 6 M341209 in the cost of the ancestral test structure, the method of pulling or smashing the axis of the phase # high, in fact, for the burden of the test industry, for the high county of the turn of the job or for the improvement of the real industry A very important topic. [New content] The main purpose of this creation is to provide a kind of ★, 3 ^ connected to the four-wire resistance _ for 戦, so that the universal measurement, =, = (4) can also test the precision resistance value, Greatly reduce the cost of producing special measuring fixtures (equipment). For the above purpose, the present invention is a universal device capable of testing precision resistors, which comprises: a dial unit 'system-end and a Lai equipment ship, and a set of test points arranged in a matrix on the dial group. Each test point is pre-determined with an independent number. Then, the formula i is provided with a plurality of guiding points. Each of the guiding points is pre-defined with an independent wave for connecting with the same number of points on the dial group. - The transfer box' has a transfer portion for the rogue guide, and the end portion is provided with a crotch portion, and the test portion is electrically connected to the test portion depending on the material number. Wherein, the dial plate group can further be provided with a plurality of guiding plates, each of which is separated by a spacer strut, and each of the guiding plates is provided with a corresponding hole and is provided with different sizes. The wire pin is used to connect the tested M341209 on the test object (circuit board) for connecting the wire and testing the test point on the dial plate group to further extend a probe for the device. In a preferred implementation, the conductive contact can be extended to the probe for connecting the lead to the dial set. And the guiding point is a groove or a hole, and the transfer point of the transfer box can be correspondingly placed and combined. In an ideal example, the adapter is a probe or a rod-shaped conductor, and the junction is placed in correspondence. The wiring material, the age of the test unit 1, or the connection of H is connected to a four-wire resistance measuring machine for measurement. 'In------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- 1 In order to enable your review board to understand the technical features of the abstract and the achievable effects, the detailed description of the preferred embodiments is as follows. [Embodiment] In order to facilitate the examination committee members to further develop the characteristics of this creation, the layer, _, · 纤人举2 embodiment, with the following detailed description: Code level and 1 soil please refer to the 7th to Figure 10 shows that the creation of this (4) fine test device, including: 4 with the test - dial group! The 'system-end is connected to the test equipment, and the test point η of the dial array is arranged. Each test point u ^ has a moment, and the work unit has a separate edit.

-測試盤2,其上佈設有複數導接點21,每 U M341209 預先定義有獨立編號,用以與針盤組丨上相同編號之測試點n連 接0 立一轉接盒3,其底座31設有與測繼2導接點21龍、之之轉 接部31,其—端係設有測試部32,該轉接點η與測試部r依測 試料號之不同而電性導接。 ”中撕盤組1上可進一步設置複數之導引板12,每一導 引板__隔支柱121來區隔,每—㈣丨板12上係設有- Test disc 2, which is provided with a plurality of guiding points 21, each U M341209 is pre-defined with an independent number for connecting with the same number of test points n on the dial group 0 0 vertical transfer box 3, the base 31 The adapter portion 31 is provided with a relay 2 lead, and the end portion is provided with a test portion 32. The transfer point η and the test portion r are electrically connected according to the test item number. The plurality of guiding plates 12 may be further disposed on the middle torn disk group 1, and each of the guiding plates __ is separated by the pillars 121, and each of the (four) sills 12 is provided with

對應之孔洞’並佈設有不同尺寸之線針,祕對應被測物(電路 板)上之被測點(請參考第I2圖所示)。 供連接導線及測試設 该測試點11可進一步延伸一探針 備用。 在-較佳實施例中,該導接點21可進—步延伸一探針22,供 連接導線至針盤組1。且該導接點21係為一凹槽或孔洞狀,供轉 接盒3轉接點311可對應置入結合。 、在-理想實例中,該轉接部311係為—探針或棒狀導電體 以利對應導接點21置入結合。 該測試部32 —端以外接線材、排線或連接ϋ之其-連接至四 線式電阻量測機供進行量測。 _在可订貝例中,轉接盒3其底座31外可進一步加設一外 盍33,供保護内部線路。 本創作於測試前需先組合,其中針盤組i上佈設之測試點U 底部係_導線連接至職設備。為使戦精密餘值時不致發 9 M341209 生測試點誤接之問題’需騎婦_之測試點u預先定義獨立 標號’以避免後續鱗接點a連誠倾接之聲(參後續說明)。Corresponding holes are provided with thread pins of different sizes, which correspond to the points to be measured on the object (circuit board) (please refer to Figure I2). For connecting wires and test equipment, the test point 11 can further extend a probe for standby. In the preferred embodiment, the contact point 21 can extend a probe 22 for connecting the lead to the dial set 1. The guiding point 21 is in the form of a groove or a hole, and the transfer point 311 of the transfer box 3 can be correspondingly placed in combination. In the preferred embodiment, the adapter portion 311 is a probe or a rod-shaped conductor to facilitate the insertion of the corresponding contact point 21. The test unit 32 is connected to a four-wire resistance measuring instrument for measurement by a wiring material, a wire or a connection port. In the case of the bookable case, the outer casing 31 of the transfer box 3 may be further provided with an outer casing 33 for protecting the internal circuit. This creation needs to be combined before testing, in which the bottom of the test point U laid on the dial group i is connected to the equipment. In order to make the precision residual value of the 9 M341209 test points mis-connected, 'the need to ride the woman's test point u pre-defined independent label' to avoid the subsequent scale contact a continuous teardown (see instructions) .

再者,it過測試盤2來連接針盤組j上全部的測試點U,而 測試盤2在製作時需與針 1相對應,其帽戦盤2係包含 複數之導接點2卜該導接點21 方式可用任何方式或態樣排 歹J /、a W界疋出每—關試點的相對位址即可,為使被測試 點導接時不致發生錯誤’可進—步將每辦接點21都編上一獨立 之編號,其目的就是要利用轉拉到針盤組1相同號碼之測試點 jl上’使補測盤2在連接萬用測試機時可以對應到相同之待測 試點,而且適用每個測試料號之待測物。 其範例可參照第8圖所示,針盤組1有複數之戦點Η,舉 =言’將測試點U預先編财卜5、9、13之編號,該測試盤 。上亦具有相同編號之導接點21,利用導線連接使其電性導通(如Furthermore, it passes the test disc 2 to connect all the test points U on the dial group j, and the test disc 2 needs to correspond to the needle 1 in the production, and the brim tray 2 includes a plurality of guide points 2 The way of the junction point 21 can be used in any way or manner, and the relative address of each pilot can be extracted from the J/, a W boundary, so that no error occurs when the tested point is guided. The contact point 21 is coded with an independent number, the purpose of which is to use the test point jl that is pulled to the same number of the dial group 1 to make the test disc 2 correspond to the same waiting when connecting the universal test machine. Test points, and the test object for each test item number is applied. For an example, refer to Figure 8. The dial group 1 has a plurality of points, and the test point U is pre-programmed with the number 5, 9, and 13 of the test disc. The same number of guiding points 21 are also used to electrically connect them by wire connection (such as

圖面表示相同編號之測試點n及導接點21相互連接)。在本實施 =係姻探針m及22以導線作雜導接,且針盤組丨所有測 2 U與測試盤2之導接點21電性導接僅在首次製作時完成該 蜍接動作,無須重複進行。 —般而言,針盤、組1上之的點矩陣排狀測試點u 蜊物睹I @ 至,、見仵母一個測試點11都會被使用,且一般測試時所使用 常、式‘2 11又不見得母一個點都需要進行四線式電阻量測,通 則量四線式電阻制的彳貞靡數沒有針盤組1上所佈設的測 ♦ m那麼多,有鑑於此,本創作之另一重點係透過轉接盒3 M341209 來針對要進行測四線式電阻量測的待測試點作—轉接動作。 I占請參第9及1〇圖所示,本創作之轉接盒3其目的係用於轉接 trr線式電阻量測的點,因待測物魏不同所需測試之測試 :也曰有差異,所以本案轉接盒3之設計係具有—底座及一覆 盖於底座31上之外蓋32,該底座31上係佈設有但單—料 號之轉接點311。 在本實施例中,其中該測試部32係設置於外蓋33上,以便 ;用來外接^或排麵接至四線式電阻量_ *進行量測,該 -係以以純接至測試部32,軸_時紐訊號導通 之路徑。 但為了對應待測物型號不同,該轉接盒3底座31之轉接點如 之位置及騎應編號需與戦盤2 -致,舉_言如果The drawing shows that the test points n and the contact points 21 of the same number are connected to each other). In this embodiment, the matching probes m and 22 are guided by wires, and the electrical connection between the measuring unit 2 and the guiding point 21 of the test disc 2 is only completed during the first production. No need to repeat. In general, the dial matrix, the dot matrix on the group 1, the test point u, the object 睹I @ to, and the test point 11 of the aunt, will be used, and the general test is used in the formula '2 11 It is not necessary to have a four-wire resistance measurement at one point. The number of turns of the four-wire type resistor is not as much as that of the test set on the dial group 1. In view of this, the creation The other focus is through the transfer box 3 M341209 for the transfer point to be tested for the four-wire resistance measurement. I occupy the picture shown in Figures 9 and 1 and the purpose of this creation of the transfer box 3 is to transfer the point of the trr line resistance measurement, because the test object is different test required test: also 曰There is a difference, so the design of the transfer box 3 of the present case has a base and an outer cover 32 covering the base 31. The base 31 is provided with a transfer point 311 of a single-number. In this embodiment, the test portion 32 is disposed on the outer cover 33 so as to be externally connected or connected to the four-wire resistance _* for measurement, and the system is connected to the test portion. 32, the path of the axis _ when the new signal is turned on. However, in order to correspond to the model of the object to be tested, the transfer point of the base 31 of the transfer box 3, such as the position and the riding number, must be related to the tray 2, if

=則機4_峨谢购♦剛觸用測試機 ▲組1上弟⑽號電性測試點⑴,轉接盒3其轉接點311要斑 測試盤2第则號之導接點21相對應(如圖η所示)。而轉接盒 、一収.卩32則利用外接導線或排線連接至四線式電阻量測機* 進行量測。 由上^可知,轉接盒3會因為測試料號的不同而必需將每 個待爾«都製做—個轉接盒3 (其内線路及測試點都不同》整 體來及’為對絲個制料號而製狀轉接盒3成构大大低於 製作-測量精密電阻之專㈣具或賴機台。 … 明參第11 _示’為本創作轉接盒3與測試盤2組合之示意 -M341209 圖二使在測試過財測試収摘峨,轉接盒3朗試盤2 、、且=係可侧夾具夾固或_雜接零件使轉接盒3緊密結合 於測試盤2 ’使轉接盒3上轉接點311向下對應到測試盤2上導接 點21,例如第1〇0號轉接點阳使其確實接觸到測試盤2上第議 號導接點21位置,方可確保待測點可正確導接。 請配合第12 _示,本創作測試精密電阻之步驟如下. 用測試機針做1的接線會有兩個柯之連接路徑,-條是接往 制測試機切換關5並與電腦7相連接,該切制關5係由電 曰體所衣成的❿另-路㈣接往峨盤2,將萬用測試機針盤组 上相同編號之測試點U與測試盤2上之導接點21贱以導線相 連接,在利用轉接盒3正確導接至測試盤2上,藉由轉接盒3上 之測挪32.外接排線或連接器至四線式電阻量測機* (或有此功 能之電子電路),進而使萬用測試機上之待測點可將電性訊號傳遞 至四線式電阻量測機4。 於測試前需先將複數之導引板12置放於萬用_幾之針盤组 ! ^當被測物8放在導引板12時,測試顏床下壓就把被測物 '、在的與利板12結合在—起,並與線針相接觸(因線針為導 弓|板12上本身即有之導電介面,且非本案之重點,故圖示未緣製, 僅以文字說明之)。在本實施例中,如果要測量被測物8第卜2 號被測點,則電腦7贼控制切換_ 5切換要量測_,使電 表6 (或有此魏之電子電路)的_點透過電、_切換開關5, 再透過導線到萬用測試機針盤組u貞測點u,因為針盤組1 _ M341209 s、:破導引板12上之線針—端接觸爿,而線針的另一端接觸 如此即形成-條可導通之電路,使電表6可以侧到 ^ g ’而電表6偵測完成之結果透過資料傳輸給電腦7 ,此時電 掉―被測點的線右疋斷線,那電腦7即不會再進行四線式電 ^月屬里测之相關動作,若判斷結果線路無斷線現象,則電腦就 、知四線式電阻量峨進行被測物電阻精密量測。 而四線式電阻量測機4的其_點是透過外接排線或連接器 連制轉接盒3之測試部哪過轉接盒3連制測試盤2,利用 則與針滅丨制點u相導接,藉由導引板1之線針接觸 到,則物上之被測點,如此—來即可形成導通通路,供四線式電 阻里測機4來對被_進行電阻精密量測,待量測完之結果透過 資料傳輸至電腦7,供工程人㈣讀。 I、上述’本創作係利用測試盤2之導接點21與萬用測試機針 • 盤組1測試點11相連接,因該導接點21及測試點11已預先定義 •相對應且獨立之編號,而可雜制試點之正確性,在透過依不 同料號所製作之轉接盒3與順盤2她合,使被測試點之電性 Λ號可確貫藉由测試部32連接至四線式電阻量測機^上,來進行 精挽電阻的量測’使制測試機不僅可測試—般電路,亦可同時 用於量測精密電阻,彳村大大減少製作專用賴治具之成本及設 備沿用之目的者。 惟以上所述者,僅為本創作之較佳實施例而已,當不能以此 13 M341209 -限定本創作實施之範圍,即大凡依本創作申請專利範圍及創作說 明書内容所作之簡單的等效變化與修飾,皆應仍屬本創作專利涵 蓋之範圍内。 【圖式簡單說明】 第1圖,係習用萬用測試針盤上之測試點佈設示意圖; 第2圖,係習用萬用測試治具結構示意圖; 第3圖,係習知針盤與電子式偵測卡連接之示意圖;= machine 4_峨谢购 ♦ just touch test machine ▲ group 1 brother (10) electrical test point (1), transfer box 3 transfer point 311 to spot test disk 2 number guide point 21 phase Correspondence (as shown in Figure η). The transfer box and the receiver 32 are connected to the four-wire resistance measuring machine* by external wires or cables. As can be seen from the above, the transfer box 3 will have to be made into a transfer box 3 (with different lines and test points) due to the difference of the test item number. The number of the material number and the shape of the transfer box 3 is much lower than that of the production-measurement precision resistor (four) or the machine table. ... Mingshen 11__' is the combination of the creative transfer box 3 and the test disc 2 Illustrated - M341209 Figure 2 allows the test box 3 to be tested, the transfer box 3 test panel 2, and the = side clamp clamp or _ miscellaneous parts to make the transfer box 3 tightly coupled to the test disc 2 'Let the transfer point 311 on the transfer box 3 correspond downward to the contact point 21 on the test disc 2, for example, the No. 1 transfer point is positive so that it actually contacts the guide point 21 on the test disc 2. The position can be ensured that the point to be tested can be correctly connected. Please cooperate with the 12th _, the steps of testing the precision resistor are as follows. The wiring of the test needle 1 will have two connection paths, and the strip is connected. Switch to the test machine to switch off 5 and connect with the computer 7, the cut off 5 is made of the electric body, the other way (4) is connected to the tray 2, the universal test machine dial unit The same numbered test point U and the test point 2 on the test disc 2 are connected by wires, and are correctly connected to the test disc 2 by the transfer box 3, by the measurement on the transfer box 3. External cable or connector to four-wire resistance measuring machine* (or electronic circuit with this function), so that the point to be tested on the universal testing machine can transmit electrical signals to the four-wire resistance measuring machine 4. Before the test, the plural guide plates 12 should be placed in the universal _ several thimbles! ^ When the measured object 8 is placed on the guide plate 12, the test bed is pressed down to take the measured object' In combination with the board 12, and in contact with the needle (because the needle is the guide bow), the board 12 itself has a conductive interface, and is not the focus of this case, so the illustration is not made, only In the present embodiment, if the measured object 8 is to be measured, the computer 7 thief control switch _ 5 switch to measure _, so that the meter 6 (or have this Wei The electronic circuit) _ point through the power, _ switch 5, and then through the wire to the universal test machine yoke group u 贞 point u, because the dial group 1 _ M341209 s,: break the line on the guide plate 12 - the end contact 爿, and the other end of the line pin contacts the circuit to form a strip, so that the meter 6 can be sideways to ^ g ' and the result of the detection of the meter 6 is transmitted to the computer 7 through the data, at this time ―The line of the measured point is disconnected from the right, and the computer 7 will not carry out the related action of the four-wire type of electricity. If the result is that the line is not broken, the computer will know the four-wire resistance. Quantitative measurement of the resistance of the measured object. The _ point of the four-wire resistance measuring machine 4 is the test part of the transfer box 3 through the external cable or connector. The disk 2 is used to connect with the pin 丨 丨 point u, and the wire on the object of the guiding plate 1 contacts the point to be measured, so that a conduction path can be formed for the four-wire resistor The measuring machine 4 is used to measure the resistance of the _, and the result of the measurement is transmitted to the computer 7 through the data for the engineering person (4) to read. I. The above-mentioned 'creation system is connected with the universal test machine needle•disk group 1 test point 11 by using the guide point 21 of the test disc 2, since the lead point 21 and the test point 11 are pre-defined·corresponding and independent The number is correct, and the correctness of the pilot can be made. The adapter box 3 made by the different item numbers is combined with the order 2, so that the electrical nickname of the tested point can be confirmed by the test part 32. Connected to the four-wire resistance measuring machine ^ to measure the fine-resistance resistance', so that the test machine can not only test the circuit, but also measure the precision resistance at the same time. The cost and the purpose of the equipment. However, the above is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the creation of the creation by this 13 M341209 - that is, the simple equivalent change of the scope of the patent application and the content of the creation specification. And the modifications should still be within the scope of this creation patent. [Simple description of the diagram] Figure 1 is a schematic diagram of the test point layout on the conventional universal test dial; Figure 2 is a schematic diagram of the conventional universal test fixture; Figure 3 is a conventional dial and electronic A schematic diagram of detecting a card connection;

第4圖,係習知電子式偵測卡相互組合連接之示意圖; 第5圖,係習知四線式電阻測量電表之測試示意圖; 第6圖,係習知萬用測試機電表之測試示意圖; 第7圖’係本創作結構之示意圖; 第8圖,係本創作針盤組與測試盤構造及連接之示意圖 第9圖,係本創作測試盤與轉接盒之構造示意圖; 第10圖,係本創作轉接盒之構造示意圖; 第11圖’係本創作轉接盒與測試盤之組合示意圖; 第12圖,係本創作之測試示意圖。 【主要元件符號說明】 Λ - 一'針盤 Α2 -一探針 Β1 一—間隔支柱 C1 一-偵測點 D1 -一探針 A1 —-電子偵測點 B 導引板 C--一電子偵測卡片 D 蜊試點 E—一——四線式電卩且測量電表 14 M341209 F----電晶體開關 1----針盤組 111 --探針 121 --間隔支柱 21 - —導接點 3----轉接盒 - 311 —轉接點 - 33 —-外蓋Figure 4 is a schematic diagram of a conventional electronic detection card in combination with each other; Figure 5 is a schematic diagram of a conventional four-wire resistance measurement meter; Figure 6 is a schematic diagram of a conventional universal test electromechanical meter Figure 7 is a schematic diagram of the creation structure; Figure 8 is a schematic diagram of the construction and connection of the creation dial and the test disc. Figure 9 is a schematic diagram of the construction of the test tray and the transfer box; , is a schematic diagram of the construction of the transfer box; Figure 11 is a schematic diagram of the combination of the creation transfer box and the test disc; Figure 12 is a schematic diagram of the test of the creation. [Main component symbol description] Λ - A 'Pin Α 2 - One probe Β 1 - Interval support C1 One - Detection point D1 - One probe A1 - - Electronic detection point B Guide plate C - An electronic detection Test card D 蜊 Pilot E—one—four-wire electric cymbal and measuring electric meter 14 M341209 F----transistor switch 1----disc group 111-probe 121-spacer strut 21--guide Contact 3----Adapter Box - 311 - Transfer Point - 33 - Cover

I 5——切換開關 7----電月甾 Η——控制電路 11— 測試點 12- --導引板 2—-測試盤 22—探針 31- 一底座 32— 測試部 4----四線式電阻量測機 6----電表 8----被測物I 5——Switch 7----Electronic Lunar New Year——Control Circuit 11—Test Point 12--Guide Plate 2—Test Disc 22—Probe 31- One Base 32—Test Section 4-- --4-wire resistance measuring machine 6----Electric meter 8----Measurement object

1515

Claims (1)

M34l2〇9 申靖專利範圍: … 種可測試精密電阻之萬用測試裝置,其包含有: ί -針盤組,係-端與_設備連接,其針触上佈設有矩 排列之測試點,每—戦點上係預先有獨立編號; 纟上佈②有複數導接點,每—導接點上係預先 又有獨立編號’用以與針盤組上相同編號之測試點連接; 轉接盒,其顧設有制試麟接輯應之轉接點,其 端係設有測試部’該轉接點與測試部依測試料號之不同而電 性導接。 士申凊專利範圍第丨項所述之可職精密鎌之萬用測試裝 置:其中該針盤組上可進—步設置複數之導引板,每一導引板 間係以間隔支柱來區隔,每一片導引板上係設有對應之孔洞, 並佈設有刊尺寸之探針,躲對應被測物上之被測試點。 3如中π專利範圍第1項所述之可測試精密電阻之萬用測試裝 置,其中該測試點可進一步延伸一探針,供連接導線及測試設 備用。 4如中%專利|&圍第丨項所述之可測試精密電阻之萬用測試裝 置’其中該導接點可進一步延伸一探針,供連接導線至針盤組。 5如申μ專利範圍第1項所述之可測試精密電阻之萬用測試裝 置,其中該導接點係為一凹槽或孔洞狀。 6、如申請專利範圍第丨項所述之可測試精密電阻之萬用測試裝 置’其中該轉接點係為一探針或棒狀導電體,以利對應導接點 16 M341209 十 置入結合。 | V 7、 如申料1項所述之可賴精㈣阻之萬用測試^ 置,其中測試部-端以外接線材、排線或連接器之其一連接至 四線式電阻量測機供進行量测。 8、 如中請專纖Μ丨彻述之可測試精密電阻之萬用測試褒 置’其中該轉接盒其底座外可進—步加設一外蓋,供保護内部 線路。 9々申W專她第8蘭述之可測試精密電阻之萬用測試裝 置其中"亥測試部係設置於外蓋,以便於用來外接導線或排線 連接至四線式電卩且量義進行量測。 17M34l2〇9 Shenjing Patent Range: ... A universal test device for testing precision resistors, which comprises: ί - the dial unit, the system-end is connected to the _ device, and the needle touches the test point with the moment arrangement. Each 戦 point has an independent number in advance; 纟上布2 has a plurality of guiding points, each of which has an independent number in advance to be connected with the same numbered test points on the dial group; The box has a transfer point for the test lining, and the end of the box is provided with a test portion 'the transfer point and the test portion are electrically connected according to the test item number. The universal test device for the serviceable precision 所述 described in the scope of the patent application: wherein the dial group can be provided with a plurality of guide plates, each of which is separated by a spacer. Separately, each of the guiding plates is provided with a corresponding hole, and a probe of a size is arranged to hide the tested point on the object to be tested. 3 The universal test device for testing precision resistors as described in item 1 of the π patent scope, wherein the test point can further extend a probe for connecting wires and testing equipment. [4] A universal test device for testing precision resistors as described in the above-mentioned "Patents", wherein the contact point can further extend a probe for connecting wires to the dial group. [5] The universal test device for testing a precision resistor according to the first aspect of the invention, wherein the contact point is a groove or a hole. 6. The universal test device for testing precision resistors as described in the scope of the patent application, wherein the transfer point is a probe or a rod-shaped conductor, so that the corresponding contact point 16 M341209 is placed in combination. . V 7 , as described in Item 1 of the Requirement (4) Resistor Universal Test, where one of the wiring, cable or connector outside the test section is connected to the four-wire resistance measuring machine For measurement. 8. If you want to test the precision resistance of the universal tester, please use the outer cover of the adapter box to provide protection for the internal circuit. 9々申W specializes in her 8th Lanshi testable precision resistance universal test device where the "hai test department is installed on the cover, so that it can be used to connect external wires or cables to the four-wire type The measurement is carried out. 17
TW96222669U 2007-12-31 2007-12-31 Universal testing device for precise resistor TWM341209U (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI461706B (en) * 2011-09-12 2014-11-21 Nidec Read Corp Impedance measurement device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI461706B (en) * 2011-09-12 2014-11-21 Nidec Read Corp Impedance measurement device

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