發明背景： 本發明係一種相對阻抗校正裝置及方法，係/ 治具之連接埠上，分別接 J :在-測試 緣值之參考雷Μ，梭y., 岭通值之麥考電阻及一絕 从考電阻，俾一待測電路板被置於該測 透過一檢測裝置中 口八日可’ 值，检甘$ τ央處理早兀碩取該等參考電阻之阻 阻值、^將待測電路板之導通線路之阻值及絕緣線路之 =值等參考電阻之阻值相比對，若與參考Ϊ; .$ 2付合，則透過一顯示器顯示出該待測電路板為Ρ 好，否則顯示為故障。 崎伋馮良 # η 正$ 本 有 無！ 先前技 按 係設有 具11上 檢測裝 方設有 樞軸1 5 路板置 15向下 板，俾 觸，而 測。 又 在使用 所設之 藝： 般習知之電路板 測試機，請參閱第一圖所 機台1，該機台丨上設有一測試治具丨丨，該測試 古益缸 An “ - 設有複數個探針，該 置相連接（圖中未示 一氣缸1 3，該氣缸1 3 之自由端與一壓板16 入該測試治具11上， 凸伸出，令該樞轴1 5 該待測電路板上所有 與該檢測裝置相導通 荨楝針透過導線與一具電腦 之 機台1在測試治具11上 設有.一向下延伸之樞軸1 5，該 相連接，使用時，將一待測電 再藉由該氣缸1 3作動，使樞軸 帶動該壓板1 6壓該待測電路 之接點，可與該等探針相接 ’以進行導通值及絕緣值檢 該 ’為了忐確定該檢測裝置之準確性，該檢測裝置雷 6個月或一年後，作一次總校正，惟，該檢測裝置 ^ aa ^ 在經過數次測試後，會有逐漸衰老之現！ 479140Background of the invention: The present invention is a relative impedance correction device and method, which are connected to J / J fixture ports, respectively: J: on-test margin reference M, shuttle y., Ridge resistance, and McCorst resistance and a The resistance must be tested. The circuit board to be tested is placed in the test through a test device for eight days. The value can be checked. The value of the resistance of these reference resistors is to be determined. Compare the resistance of the reference circuit such as the resistance value of the conducting circuit of the circuit board and the value of the insulation circuit. If it is in combination with the reference value.;. $ 2, then the display shows that the circuit board under test is P. Good , Otherwise it is displayed as a fault. Qi Ji Feng Liang # η Positive $ This Yes No! In the prior art, the system is equipped with a detection device on the 11th side and a pivot shaft on the 15th side and a 15th side on the 15th side. Also in use of the set art: General known circuit board testing machine, please refer to machine 1 in the first figure, which is equipped with a test jig 丨 丨, this test Guyi cylinder An "-with plural The probes are connected to each other (a cylinder 1 3 is not shown in the figure, and the free end of the cylinder 13 and a pressure plate 16 enter the test fixture 11 and protrude so that the pivot 1 5 should be tested. All the circuit board needles connected to the detection device on the circuit board are provided on the test fixture 11 through a wire and a machine 1 of a computer. A downwardly extending pivot 15 is connected to this phase. The electric power to be tested is then actuated by the cylinder 13 to cause the pivot to drive the pressure plate 16 to press the contacts of the circuit to be tested, which can be connected with the probes to perform the conduction value and insulation value check. Determine the accuracy of the detection device. After 6 months or one year of the detection device, make a total correction, but the detection device ^ aa ^ will gradually aging after several tests! 479140
曰 發生’以致其校正值偏移，造成其測試值不準確 確測試。 修正 無法正 修煩| f請mi 發明綱要： 有，於此’為改進習用之缺點，發明人經過長久努力 研究與貫驗’終於開發設計出本發明之一種相對阻抗校正 裝置及方法。 本發明之一目的，係提供一種相對阻抗校正裝置及方 法，係在測試治具之連接埠之預留插孔上，分別接設有一 導通〒之參考電阻，及一絕緣值之參考電阻 阻並？-電表相連接，肖電表透過一輸入/ 寺置考電 ί測試治具，、2置相連接，俾使用者將一待測電路板置於 讀取該等參考雷阳4 I且處理早兀將 之阻值，及絕緣線；ΓΓ枯俟再將待測電路板之導通線路 相比對，若與參考電刀ϋ。亥專參考電阻之阻值 示出該待測電路板：：m付5，則透過-顯示器顯 障，因此，可；;ί:檢:：二示該待物 配合圖示’詳細說明如下：7 °心减與瞭解’兹舉實施例 詳細說明： 本發明係一種 第二、四圖所示， 年 「相對阻抗校正裝置及方法 係設有-測試治具5，該測試J二參閱 -- 口并！3上分 第5頁 479140 飢丨a JE—_ 月 曰 案號 89120485It happened that its correction value shifted, causing its test value to be inaccurately tested. Correction can not be correct. Annoying outline of the invention: Yes. Here, ‘to improve the shortcomings of conventional practice, the inventor finally developed and designed a relative impedance correction device and method of the present invention after long-term efforts. It is an object of the present invention to provide a relative impedance correction device and method, which are respectively connected to a reserved jack of a port of a test fixture and provided with a reference resistance of a continuity and a reference resistance of an insulation value. ? -The meter is connected, the Xiao meter is connected to the test fixture through an input / temple test test, 2 sets, and the user puts a circuit board under test to read the reference Leiyang 4 I and handles it early. Compare the resistance value and the insulated wire; ΓΓ, then compare the conducting lines of the circuit board under test, if it is compared with the reference electric knife. The reference value of the resistance shows the circuit board under test :: m pays 5, the display is obstructed through the display, so it can be; 7 ° Heart reduction and understanding 'detailed description of the embodiment: The present invention is shown in the second and fourth figures, "the relative impedance correction device and method is provided with-test fixture 5, the test J II see- Merge! 3 on page 5 479140 hungry 丨 a JE—_ Yue Yue Case No. 89120485
五、發明說明（3) 別設有複數個探針5 1及一連接埠5 3，其中 ^ 設於該測試治具5頂面上，而該遠接谊㈠邊等探針51係 一側邊上，該等探針51藉由導線連與 連接埠53透過一排線52與一輸入/輸出裝置“ 接，該 接，該輸入/輸出裝置61並盥一且雷聪夕认 ^ 相連 垃八呤笙俨朴叫兩兮认 具電知之檢測裝置7相連 接，々邊4奴針51與该檢測裝置7相連接，該 預留數個播孔55，且在該等預留插孔55上， 導通值參考電阻56 (於本實施例中該導通 二： 阻值為20 Ω ,但本創作在實際實施時，並不限二$ 56 ^ -絕緣值參考電阻57 (於本實施例中該絕緣值參考電阻二 之阻值為20M Ω，但本創作在實際實施時，並不限於此 )，該等參考電阻56、57並與一電表6相連接，該電 過該輸入/輸出裝置61 (1/0)與該檢測裝置7相連接。 當使用者將-待測電路板置於該測試治具5，進行檢 測時，請參閱第三圖所示，該檢測裝置7之中央處理 將進行如下之步驟： 、 (101 )讀取該導通值參考電阻56之阻值及該絕緣值表 考電阻57之阻值； 〆 (1 02 )判斷是否有電路板被檢測？若是繼續進行下 步驟，否則結束檢測； (1 0 3 )檢測該待測電路板中導通線路；· 修· '正势 有属 ¥示 導通録4 tF且56^2^路，透過一記錄裝置記錄‘V. Description of the invention (3) Do not set a plurality of probes 51 and a port 5 3, of which ^ is provided on the top surface of the test fixture 5, and the probe 51 such as the remote side is on one side On the side, the probes 51 are connected to the port 53 by a wire, and connected to an input / output device through a row of wires 52. The input / output device 61 is connected with Lei Congxi. Ba Ling Sheng Pu called the two detection devices 7 with electrical knowledge, and the slave pin 51 on the side 4 was connected to the detection device 7, and a number of broadcast holes 55 were reserved. On, the on-resistance reference resistance 56 (in this embodiment, the second on-resistance: the resistance value is 20 Ω, but the actual implementation is not limited to two $ 56 ^-insulation value reference resistance 57 (in this embodiment The insulation value of the reference resistance 2 is 20M Ω, but this creation is not limited to this in practice.) These reference resistances 56 and 57 are connected to an electric meter 6, and the electricity passes through the input / output device. 61 (1/0) is connected to the detection device 7. When the user places the circuit board to be tested on the test fixture 5 for testing, please refer to the third figure The central processing of the detection device 7 will perform the following steps: (101) Read the resistance value of the on-resistance reference resistance 56 and the insulation value of the resistance value of the resistance 57; 〆 (1 02) to determine whether there is The circuit board is tested? If you continue to the next step, otherwise the test is terminated; (1 0 3) Test the continuity line in the circuit board under test; Through a recording device '
第6頁 ,、（1 04 )判斷該待測電路板之導通線路，其電阻值是否 為V通之仏準值（即该值等於或小於該導通值參考電阻己已 之阻值）？若是繼續進行下列步驟，否則將不良（大於节 479140Page 6, (1 04) Determine whether the resistance value of the on-circuit of the circuit board under test is the standard value of V-pass (that is, the value is equal to or less than the resistance value of the on-resistance reference resistance)? If you continue with the following steps, otherwise it will be bad (greater than section 479140
五、發明說明（4) 來’並繼續進行下列步驟； (105 )檢測該待測電路板中 (1 06 )判斷該待測電路板之緣雄路， 為絕緣之標準值（即該值算、丄 '，彖線路’其電阻值是否 之阻值）？若是繼續進行下歹^於該絕緣值參考電阻57 Μ值參考電J且5^值）t @”否則將不良（小於望 來，並繼續進行下列步驟； 透過該記錄裝置記錄下 (107 )判斷是否已完成檢驗 路？若是繼續進行下列步驟，路板之所有線 (108)判斷該待測電路板否(102); 電路板之導通線路，大於該導通值線路？若該待測 者，該待測電路板之絕緣線路 > 考電阻56阻值，或 ㈣，則判定該待測電路板為故障於 出該待測電路板為故障，飼再二之以颂不态顯不 則判定該待測電路“良^再=進:丁步驟（1〇1)，·否 測電路板為良好，俾使用者由：3亥顯不器顯示出該待 路板為良好或故障，示器顯示出該待測電 人人丨半喇冉繼續進行步驟（J 〇 J )。 導、雨去本發明係以該絕緣值參考電阻57之阻值，及該 =。=5,6之阻值作為檢測該待測電路板之基準： 檢測後，&二择-:f產生权正值偏移之問題，故每次作 白可獲付準確檢測之數據。 明之t: 上所述’僅為本發明最佳具體實施Μ，惟本發 明之構造特徵並不侷限於此 =不钐 明領域内，可辦易田万夕戀A η 技藝者在本發 案之專利範i 或修飾，皆可涵蓋在以下本 479140 ' 衡，. _案號89120485_年…月日_修正 圖式簡單說明 圖示說明： 第一圖係習用裝置之示意圖。 第二圖係本創作之方塊示意圖。 第三圖係本創作之流程圖。 第四圖係本創作之立體示意圖。 主要元件編"5虎· 測試治具 5 探針 51 連接埠 53 插孑L 55 導通值參考電阻 56 絕緣值參考電阻 57 電表 6 輸入/輸出裝置 61 檢測裝置 7 I kr 煩請委員明示 年'月 曰所提之 备£444^4格變^賢&、内容是否准予修ή。 頁 8 第V. Description of the invention (4) Come 'and continue with the following steps; (105) Detect the circuit board under test (1 06) to determine the edge of the circuit board under test, which is the standard value of insulation (that is, the value is calculated) , 丄 ', 彖 line' is its resistance value)? If it is continued, the reference value of the insulation value is 57 Ω, the reference value is J, and the value is 5 ^ t. Otherwise, it will be bad (less than expected, and continue with the following steps; record (107) judgment through the recording device). Has the inspection circuit been completed? If you continue with the following steps, all the lines of the circuit board (108) determine whether the circuit board under test (102); the conduction line of the circuit board is greater than the conduction value line? The insulation circuit of the circuit board under test> If the resistance value of the resistance 56 is tested, or ㈣, it is judged that the circuit board under test is faulty. The circuit board under test is faulty. The circuit to be tested is “good ^ re: advance: Ding step (101),” if the test circuit board is good, the user indicates that the circuit board under test is good or faulty, and the display shows The person to be tested continues to perform the step (J0J). The present invention uses the resistance value of the insulation value reference resistance 57 and the resistance value of === 5,6 as the Benchmark for testing the circuit board under test: After the test, & alternative-: f produces a problem of weight value offset, so Reproduced data can be paid for accurate detection. Mingzhi t: The above description is only the best specific implementation of the present invention, but the structural characteristics of the present invention are not limited to this. Wan Xi Lian A η The patent scope or modification of the artist in this case can be covered in the following book 479140 'Heng. _ Case No. 89120485_year ... month day _ correction diagram simple illustration diagram description: First The diagram is a schematic diagram of a conventional device. The second diagram is a block diagram of this creation. The third diagram is a flowchart of this creation. The fourth diagram is a three-dimensional diagram of this creation. Pin 51 Port 53 Plug-in L 55 Continuity value reference resistance 56 Insulation value reference resistance 57 Meter 6 Input / output device 61 Detection device 7 I kr Members are kindly requested to indicate the preparation of the year's and month's date £ 444 ^ 4 grid change ^ xian &, whether the content is allowed to repair. Page 8