200928381 » 九、發明說明： 【發明所屬之技術領域】 b本發明係為一種可測試精密電阻之萬用測試裴置，特別是 指於f 用測試盤之導接點與預先定義相對應且獨立之編號萬 用測=機之測試點相連接，在透過依不同料號所製作之轉接盒 盤她合’使被峨點之躲峨可確實藉由測試部g 接至四線式電阻量測機（或功能相同之電子電路）上進行精密 1阻的量測，俾達到減少專用測試治具製作成本之目的者。 【先前技術】 ❹ ❹ 德#it第1至4圖所示，按，一般電路板測試用之萬用測試 i >十盤A上之複數電子偵測點A1是成點矩陣排列，其整體構 造係由被測物的被測點是被多層導引板6所組成，盆/導200928381 » IX. Description of the invention: [Technical field to which the invention pertains] b The present invention is a universal test device for testing precision resistors, in particular, the reference point of the test disk for f is corresponding to the predefined and independent The number of universal test = machine test points are connected, in the transfer box made by different material numbers, she can't be smashed by the test part g to connect to the four-wire resistance The measurement of the precision 1 resistance is performed on the measuring machine (or the electronic circuit with the same function), and the purpose of reducing the manufacturing cost of the special test fixture is achieved. [Prior Art] ❹ ❹ De #it Figure 1 to Figure 4, press, general board test for universal test i > ten disk A on the complex electronic detection point A1 is a dot matrix arrangement, the whole The structure is composed of the multi-layer guide plate 6 from the measured point of the measured object, basin/guide
，:板B間有間隔支柱B1隔開—段麟，上具上 = 反有B 擁沾針被導引板B導引成垂直或斜斜的導引到萬用測試 機的點矩陣電子偵測點上。 而習用之萬用測試機針盤A之電子偵測點A1製作方法大 夕區分為下列兩種；其中一種係先製作出一點矩陣排列之針盤 ，再透過電線把探針A2與電子侧卡片c上的偵測點ci， M rH(如’ 3所示）°另一種製作方法係將電子侦測卡 + Η Γ、u、'則點Ο製作成點矩陣的排列狀，再將該電子偵測 點矩陣侧:片(==組合，藉以形成 精密試機雖可測量-般電路板’但並無法量測,: between the board B is separated by the spacer B1 - paragraph Lin, the upper with the upper = anti-B with the needle is guided by the guiding plate B into a vertical or oblique guide to the point matrix electronic detection of the universal test machine On the measuring point. The electronic detection point A1 of the conventional universal test machine dial A1 is divided into the following two types; one of them is to make a dot matrix array, and then the probe A2 and the electronic side card through the electric wire. The detection points ci, M rH on c (as shown in '3). Another method is to make the electronic detection card + Η Γ, u, ', then the point Ο is arranged into a matrix of points, and then the electron Detection point matrix side: film (== combination, to form a precision test machine, although it can measure - like a circuit board' but can not measure
個測需使用四線式的測試方法’也就是在一 =貝Μ點D上4要扎（連接）兩根探D (it#) 連接至四線式電阻測量電表E。而現 測點係透過電晶體來做_切換，把㈣測電阻狀電表或電 200928381 過，晶體開關F的切換動作，切換到要量測的點上（如圖 等門但由於電晶體的物理特性，會有漏電流現象及阻抗 寻問，產生，所以電表量測到的被測線路阻值就不是很準。 阻之ΐί要ί改良萬關試機上來達财進行量測四線式電 上之有相當困難度及不便，因為萬用測試機上 卜：=:=同電表 == ❹ 電阻量測專用測試治具上來進行測試。但專用: 構擔’為解決專用測試治具之高成本或對於結 【發文良，實為產業界—個相當重要的課題。 躲明之主要目的係提供一種可測試精密電阻之萬用測 轉益連接至四線式電阻量測機進行測試，使該ί用 低密電阻值，俾可大大降 試裝本發明係為一種可測試精密電岐萬用測 陣排系:端與/τ式設備連接，其針盤組上佈設有矩 早排歹i之咐點，母-顧點上係預先定義有獨立編號。 200928381 定義有獨3、二卢其複料接點’每-導接點上係預先 ::财峨部，轉接 ❹ 之被測試點有寸線針’用於對應被測物（電路板）上 試設2盤組上測試點可進—步延伸一探針，供連接導線及測 接導’該導接點可進—步延伸—探針，供連 轉接點可人結=接_為—凹槽或孔膽’供轉接盒 線式材、排線或連接器之其-連接至四 蓋該轉接盒其底座外可進-步加設-外 之功,ί使貝能瞭解本發明之技_容，及所能達成 【實施方_^5 ®相料較佳實施例詳細說明如後。 及查委員能更進—步對本發明之構造、使用 ㈣作綱 用•以:有圖所示’本發明之可測試精密電阻之萬 一針盤M1 ’係—端與測試設備連接，其針盤組1上佈設 200928381 =陣制之職點U，每-測試點u上_先定義有獨立 上_^=猫其上佈設有複數導接點21，每一導接點21 it 職，靠麟缝1幼_號之測試 之轉接盒i，其ΐ座31設有與測試盤2導接點21對應之 之轉接邛31，其一鈿係設有測試部32， 32依測試料號之不同而電性導接。ζ轉接點31與測试部 其中，該針盤組1上可進一步設置 一導引板12間係以間隔支柱121來之f弓」板12每 係設有對紅，並 試設11可進—步延伸—探針111，供連接導線及測 没，組;伸:探針 洞狀，供轉接盒3轉接點311可對應置入結合厂凹曰或孔 在一理想實例中，該轉接部311係為一 體，以利對應導接點21置μ合。㈣^針或棒狀導電 ❹ =試部32 -端以外接線;、排 至四線式電阻量測機供進行量測。 雜益之其連接 冰行實例中，該轉接盒3其紐&外可進-步加讯 一外盍33，供保護内部線路。 I/加5又 本發明於測試前需先組合，豆中針翁 11底部係利用導線連接至：：=ϋ上佈故之測試點 誤接之問題；•每個 避免後續與導接點21連接產生誤接=見 再者，透過測試盤2來連接針盤組1上全部的測試點u， 200928381 而測試盤2在tJ /Λ： η士 t 包含複數之導1相^^中該測試盤2係 - '態樣排列，只需明獻二5 21 f方式可用任何方式或 碰測試叫接母—點献點触對魏即可，為 都總卜接不致發生錯誤，可進—步將每個導接點3 rr考踩夕、目蜀f立之、編號’其目的就是要利用導線拉至情盤电]；te 同號碼之測試點u上 ：：：引紂盤組1相 以對應到相同之待二一、 接萬用測試機時可 待測武點’而且適用母個測試料號之待測物。 兴二_!* '〜照第8圖所示’針盤組1有複數之測勉η 舉例而言，將測試點11預先編號有卜5、9 ❹ :訧=^_接點21，_導iii使ί ί二中係利用探針ηι *22以導線作電 接僅盤:斤有靡式點11與測試盤2之導接點21電性ί 在百·人^作時完成該導接動作，無須重複進行。 nit言’針盤纪1上之的點矩陣排列之測試點11在測 不見得每—個測試點11都會被使用，且—般測^ 鲁 1 電’通常在測量四線式電阻量__點數沒有針盤Ϊ 1上所佈設的測試點in那麼多，有鑑於此，本發明之番 。3來辦料㈣四料電阻量_待測試 請參第9及10圖所示’本發明之轉接盒3其目的係 轉接要偵測四線式電阻量測的點，因待測物型號不同. 之測試點也會有差異，所以本案轉接盒3之設計係具有 ^ ^及-覆蓋於底座31上之外蓋32，該底座31上係佈設有 早一料（型）號之轉接點311。 — 在本實施例中，其中該測試部32係設置於外蓋33上，以 便於用來外接導線或排線連接至四線式電阻量測機4進行量 測，該轉接點311係以導線連接至測試部32 ,形成測試時電 9 200928381 性訊號導通之路徑。 點型號不同，該轉接盒3底座31之轉接 _置及所對應編號需與測試盤2—致，舉例而言如果 4 (或有此功能之電子電路）之第一點要測 ίίί ί機針盤組1上第100號電性測試點出，轉接各3 要與職盤2第1〇〇號之導接點21才目 ‘接至四Uf 5盒3其測試部32則利用外接導線或排線 運接至四線式電阻置測機4進行量測。 Ο 鲁 每個製:接個盒轉7= 同），整體來說，為對岸每個待獅‘制^路及測4點都不 都大大祕上 Λ剌45細製作之轉接盒3成本 ίίίί/ 精密電阻之專用治具或測試機台。 示意圏月圖所示，為本發明轉接盒3與測試盤2組合之 程中測試到正確的訊號，轉接盒3與測 ί_，㈣接盒3上觀㈣1向下貝 Il、a丨^無導接點21，例如第丨〇0號轉接點311使尤確ΐ接魎 兮萬ίΐίΐ 12圖所示’本發明測試精密電阻之步驟如下· Γίΐ ί用測試機切換關5並與電腦7相連ί 換門ΐ 、、=!i體所製成的。而另一路徑係接往測試盤2，將： „針盤組1上相同編號之測試點u與 J j用 :，占21預先以導線相連接，在利用轉接盒確士之，接 2上，藉由轉接盒3上之測試部32外‘，試盤 =電阻量測機4 (或有此功能之電子電路至四線 機上，咖可將電性訊號傳遞至四線式電卩；^_萬4用剩試 於測試前需纽複數之^丨板12置放於萬卿^機 200928381 戦機壓床下壓就 =¾測物8第卜2號被測):⑵== 偵測點透過電=切拖』t 2有功能之電子電路）的 組1债測關再透過導線到萬用測試機針盤 ϊί；Γ^^ ? 測完成可以偵測到被測物，而電表h貞 -次ίί;;ί ==腦7 ’此時電腦7即會進行第 測點的魂甚Li 種’例如連結被測物第卜2被 線’那電腦7即不會再進行四線式電阻精密量 判斷結果線路無崎縣，則電腦就通知Ξ 冤户里測械進行被測物電阻精密量測。 接器崎_働線或連 ❹ 盤2與針盤組1偵測點11相導接，藉 J線:接，到被測物上之被測點，如 ，二四，切阻量測機4來對被測物進 密 置測=結果透過資料傳輸至電腦7,供工程人測待 ，、、不上述，本發明係利用測試盤2之導接點 預測試點11相連接，因該導接點21及測試點^已 疋義相對應且獨立之編號，而可確保被測試點之i减极 在透過依不曝號所製狀轉接盒3制 ϋ ^ =點之電性«可雜藉由測試部32連接至四缘式5電阻L 用=具俾可大大減少製作專 200928381 tMP 所述者，僅為本發明之較佳實施例而已，當不能以 實施之範圍，即大凡依本發日种請專利範圍及創 專2作之簡單的等效變化與修飾，皆應仍屬本發明 寻刑涵盍之範圍内。 【圖式簡單說明】 楚9 : 用萬用測試針盤上之測試點佈§又不恩 ^圖’係制萬關試治具結構示意圖。 ί 4 Ϊ 知針盤與電子式偵測卡連接之示意圖。A four-wire test method is required for each test', that is, four probes (connected) and two probes D (it#) are connected to the four-wire resistance measurement meter E at a = beiguille point D. The current measurement point is _switched through the transistor, and the (four) resistance-resistance meter or electric power 200928381, the switching action of the crystal switch F is switched to the point to be measured (as shown in the figure but due to the physics of the transistor) Characteristics, there will be leakage current phenomenon and impedance seeking, so the measured resistance of the measured line is not very accurate. 阻 要 ί ί ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ It is quite difficult and inconvenient, because the universal test machine is on the test: =:= with the electric meter == 电阻 The special test fixture for resistance measurement is tested. But the special: the construction of the special test fixture Cost or for the knot [favory, it is a very important issue in the industry. The main purpose of hiding is to provide a universal test transfer that can test precision resistors and connect to a four-wire resistance measuring machine for testing. ίUsing low-density resistance value, 俾 can greatly reduce the test. The invention is a testable precision electric 岐 universal array arranging system: end and / τ type device connection, the dial group is provided with a moment early 歹i The point of the mother-point is pre-defined Independently numbered 200928381 Defines a unique 3, 2 Luqi refill contact 'Each-guide point on the pre-:: Department of Finance, transfer ❹ The tested point has an inch needle' for the corresponding object ( On the circuit board, try to set up the test point on the 2-disc group. Step-by-step extension of a probe for connecting the wire and measuring the guide 'The contact point can be extended step--probe, for the connection point can be connected = _ _ for - groove or boring 'for the transfer box wire, cable or connector - it is connected to the four cover贝 能 知 知 知 知 知 知 知 知 知 知 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见 见Use: to have the following figure: 'The testable precision resistor of the present invention, the dial of the M1' is connected to the test equipment, and the dial group 1 is arranged on the 200928381 = the position of the system U, per-test Point u on _ first defined on the independent _ ^ = cat on the cloth with a plurality of guide points 21, each of the guide points 21 it job, relying on the slit 1 child _ test of the transfer box i, its seat 31 There is a transfer port 31 corresponding to the test lead 2 of the test disc 2, and a test unit 32, 32 is electrically connected according to the test item number. The transfer point 31 and the test part are included therein. The dial group 1 can further be provided with a guiding plate 12, which is provided with a spacing post 121. The bowing plate 12 is provided with a pair of red, and a 11-step extension-probe 111 is provided. Connecting wire and measuring, group; stretching: probe hole shape, for the transfer box 3 transfer point 311 can be correspondingly placed in the joint factory recess or hole in an ideal example, the adapter portion 311 is integrated, The corresponding contact point 21 is set to μ. (4) ^ pin or rod-shaped conductive ❹ = test part 32 - terminal wiring;, discharged to the four-wire resistance measuring machine for measurement. In the middle, the transfer box 3 can be further connected to the external port 33 for protecting the internal circuit. I / plus 5 and the invention must be combined before testing, the bottom of the needle in the bean is connected by wires to: := ϋ 布 之 之 之 之 测试 测试 ; ; ; ; ; ; ; ; ; ; ; ; • • • • • • • • • The connection is misconnected = see again, through the test disk 2 to connect all the test points u on the dial group 1, 200928381 and the test disk 2 in tJ / Λ: η士t contains the complex guide 1 phase ^ ^ in the test Disk 2 series - 'Orientation arrangement, only need to offer two 5 21 f way can be used in any way or touch test called the mother - point to point to the Wei can be, for the total connection will not cause errors, you can enter Each guiding point 3 rr is measured on the eve of the eve, the 蜀 立 立 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , In order to correspond to the same to be tested, the test object can be tested when the universal test machine is used, and the test object of the parent test number is applied. Xing Er _!* '~ As shown in Figure 8 'The dial group 1 has a complex number 勉 η For example, the test point 11 is pre-numbered with 5, 9 ❹ : 訧 = ^ _ contact 21, _ Guide iii enables the ί 二 中 利用 利用 利用 η 22 22 22 η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η η The action is not repeated. Nit's test point 11 of the dot matrix arrangement on the pin-count 1 is used in every test point 11 and the measurement is generally measured in the four-wire resistance __ The number of points does not have as many test points as that placed on the dial Ϊ 1 , and in view of this, the present invention. 3 to handle materials (four) four material resistance _ to be tested, please refer to the figures 9 and 10 'The adapter box 3 of the present invention is intended to detect the point of the four-wire resistance measurement, due to the object to be tested The test points of the case are different. Therefore, the design of the transfer box 3 of the present case has a cover cover 32 covering the base 31, and the base 31 is provided with an early material type. Transfer point 311. In the present embodiment, the test portion 32 is disposed on the outer cover 33 so as to be connected to the four-wire resistance measuring machine 4 for measuring the external wire or the cable, and the transfer point 311 is The wire is connected to the test portion 32 to form a path for the test signal to be turned on. The point type is different, the adapter _ base 31 of the adapter box 3 and the corresponding number need to be consistent with the test panel 2, for example, if the first point of 4 (or electronic circuit with this function) is to be ί ί ί On the needle dial group 1, the No. 100 electrical test point is output, and the transfer point of each of the 3 is to be connected to the fourth Uf 5 box 3 and the test part 32 is utilized. The external wires or wires are transported to the four-wire resistance tester 4 for measurement. Ο 鲁 鲁 每个 接 接 接 接 接 接 接 接 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个 每个A special fixture or test machine for precision resistors. As shown in the figure, the correct signal is tested in the process of combining the transfer box 3 and the test disc 2 of the present invention, the transfer box 3 and the test box 3, and (4) the connection box 3 (4) 1 downward shell Il, a丨^ No lead point 21, for example, the No. 0 transfer point 311 makes it possible to connect the ΐ ΐ ΐ ΐ ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' 用The computer 7 is connected to ί and the door ΐ, , =! i body made. The other path is connected to the test disc 2, which will be: „The same number of test points u and J j on the dial group 1 are used: 21% of the wires are connected in advance, and the adapter box is used to determine the number of the conductors. Above, by the test part 32 on the transfer box 3, the test disk = the resistance measuring machine 4 (or the electronic circuit with this function to the four-wire machine, the coffee can transmit the electrical signal to the four-wire type卩; ^ _ 4 4 use the remaining test before the test needs the complex number of the 丨 board 12 placed in Wanqing ^ machine 200928381 戦 machine press down on the = 3⁄4 test object 8 卜 2 is measured): (2) == Detect The measuring point of the measuring point through the electricity = cut and drag "t 2 functional electronic circuit" group 1 debt measurement and then through the wire to the universal test machine dial ϊ ί; Γ ^ ^ ? test can detect the measured object, and the meter H贞-次ίί;;ί == brain 7 'At this time, the computer 7 will carry out the soul of the first measuring point, Li, such as the connection of the measured object, the second line, the computer 7 will not carry out four lines. When the precision resistance judgment result line is in Nosaki Prefecture, the computer informs the 冤 Setou to measure the resistance of the measured object. 接接崎_働线或连❹ Disk 2 and the dial group 1 detection point 11 Phase conduction, borrowing J line : Connect, to the measured point on the object to be tested, for example, 24th, cut resistance measuring machine 4 to test the measured object into the dense test = the result is transmitted to the computer 7 through the data for the engineering personnel to test, In the above, the present invention uses the conduction point of the test disc 2 to predict the connection of the pilot 11 because the contact point 21 and the test point ^ have correspondingly and independently numbered, thereby ensuring the i-deduction of the tested point. In the case of the adapter box 3 made by the unequal number, the electrical conductivity of the point is 藉 ^ can be connected to the four-edge type 5 resistor L by the test section 32, which can greatly reduce the production of 200928381 tMP. The present invention is only a preferred embodiment of the present invention, and should not be implemented in the scope of the invention, that is, the simple equivalent change and modification according to the scope of the present invention and the creation of the patent should still belong to the present invention. Seeking the scope of the sentence. [Simplified description of the diagram] Chu 9: Using the test point on the universal test dial, § 不 不 ^ 图 系 系 系 系 系 万 万 万 万 结构 知 知 知A schematic diagram of the connection of the disc to the electronic detection card.
^岡’知電子式偵測卡相互組合連接之示意圖。 ^ ^ ’係習知四線式電阻測量電表之測試示意圖。 =圖’係習知萬關試機電表之測試示意圖。 第7圖，係本發明結構之示意圖。 ^’ ίίΓ月針盤組與測試盤構造及連接之示意圖 縣H賴1盤與轉接盒之構造示意圖。 弟10圖，係本發明轉接盒之構造示意圖。 係本㈣無盒制馳之組合示意圖。 第12圖，係本發明之測試示意圖。 【主要元件符號說明】 A 針盤 A2一-探針 B1―-間隔支柱 C1—-偵測點 D1—探針 F----電晶體開關 1 針盤組 11卜-探針 121—間隔支柱 21 導接點 3 轉接盒 A1 --電子偵測點 B -~導引板 C 電子偵測卡片 D —測試點 E 一――四線式電阻測量電表 Η —控制電路 11 測試點 12 —導引板 2 -一測試盤 22 —探針 31 --底座 12 200928381 ' 311- 轉接點 32-- 測試部 33— 外蓋 /j^--- 四線式電阻量測機 • 5---- 切換開關 6 — 電表 γ____ 電腦 8 — 被測物^Gang's schematic diagram of the electronic detection card being combined with each other. ^ ^ ' is a schematic diagram of the test of a conventional four-wire resistance measuring meter. = diagram ' is a schematic diagram of the test of the well-known Wanguan test electromechanical meter. Figure 7 is a schematic view showing the structure of the present invention. ^' ίίΓ The schematic diagram of the construction and connection of the dial unit and the test disc. The structure of the county H Lai 1 and the transfer box. Figure 10 is a schematic view showing the construction of the adapter box of the present invention. This is a combination of the four (4) boxless production. Figure 12 is a schematic view of the test of the present invention. [Main component symbol description] A dial A2-probe B1-- spacer strut C1--detection point D1-probe F----transistor switch 1 dial group 11-probe 121-slot pillar 21 lead point 3 transfer box A1 -- electronic detection point B - ~ guide board C electronic detection card D — test point E — four-wire resistance measurement meter Η — control circuit 11 test point 12 — Guide plate 2 - a test disk 22 - probe 31 - base 12 200928381 ' 311 - transfer point 32 - test portion 33 - cover / j ^ - - - four-wire resistance measuring machine • 5--- - Switch 6 - Meter γ____ Computer 8 - Measured object