CN204758649U - Probe detection tool - Google Patents
Probe detection tool Download PDFInfo
- Publication number
- CN204758649U CN204758649U CN201520447950.9U CN201520447950U CN204758649U CN 204758649 U CN204758649 U CN 204758649U CN 201520447950 U CN201520447950 U CN 201520447950U CN 204758649 U CN204758649 U CN 204758649U
- Authority
- CN
- China
- Prior art keywords
- probe
- dials
- spring
- drum
- connector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title claims abstract description 80
- 238000001514 detection method Methods 0.000 title abstract description 13
- 230000000903 blocking effect Effects 0.000 claims abstract description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 239000010949 copper Substances 0.000 claims description 5
- 238000010276 construction Methods 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 230000005611 electricity Effects 0.000 abstract 1
- 238000005303 weighing Methods 0.000 description 3
- 230000004308 accommodation Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a probe detection tool, including circuit -under -test board (1), probe unit (2) and connector (3), probe unit (2) are provided with draw -in groove (7) of blocking probe (5) including dial (4), probe (5) and drum (6) in dial (4), and probe (5) diameter sets up to 0.08mm, and the eighth department of probe (5) lower part is provided with snap ring (8), drum (6) set up in the below of dial (4), are provided with in drum (6) and probe (5) position matched with spring (9), and the bottom and connector (3) the electricity of spring (9) are connected, and probe (5) are through being connected and then opening the short circuit to circuit -under -test board (1) and detect with connector (3) circular telegram in the spring of impressing (9). The utility model discloses reduced the diameter of probe, made it normally detect in high -accuracy PCB's product to it is more stable to make probe fixing get, avoids it to drop.
Description
Technical field
The utility model relates to detection tool application, particularly relates to a kind of probe in detecting tool for PCB open-short circuit.
Background technology
At present, the open-short circuit of existing PCB detects tool and there is following shortcoming: one is that the diameter of minimum test probe in this detection tool is generally 0.15mm, and in the product of high-accuracy PCB, this test probe cannot detect normally because diameter is excessive; Two is that the test probe of this detection tool does not generally possess clasp design accurately, and the black collodion of fixing test probe cannot play stable fixing effect, after black collodion is aging, test probe can be caused to drop, thus cause weighing or damage the product that will test wounded.
2011.07.06 bulletin, notification number is in the Chinese utility model patent of CN20189269U, disclose a kind of probe detection structure of improvement, refer to detect tool needle plate in be provided with detection probe, the elastic parts resetted for probe of predetermined number and transfer to the wire of detection machine for detected value; Wherein, needle plate includes middle board, base plate and panel, they place combination by number axis pin mutually, it is accommodating for elastic parts that this middle board is provided with accommodation hole, this base plate is positioned at below middle board accepts elastic parts, be provided with corresponding with the accommodation hole of middle board also in less perforation, this wire one end is connected to elastic parts one end, and another end is connected to detection machine or joint; It is characterized in that: the elastic sheet that this panel is provided with upper plate, lower plate and is folded between upper and lower plate, the pin hole corresponding with elastic parts is respectively equipped with at upper and lower plate, this probe one end is set to taper, be inserted by the upper plate pin hole of panel, and puncture elastic sheet and be plugged on one end inner diameter location of corresponding elastic parts through lower plate pin hole.The utility model makes and has more simple and easy, convenient and economy, and can make that probe is highdensity is laid in detection tool, and the measured object with the tested measuring point of high density is implemented precisely, Detection results really, thus be more suitable for practicality.
But this detection architecture is the probe arranging more more number in needle plate, realizes with highdensity laying, therefore, it does not still solve the excessive and fixing unstable shortcoming of test probe diameter in existing detection tool.
Summary of the invention
For overcoming above-mentioned shortcoming, the purpose of this utility model is to provide a kind of probe in detecting tool, has reached and has reduced the diameter of test probe, made it normally detect in the product of high-accuracy PCB, and test probe is fixed more stable, avoid the object that it drops.
In order to reach above object, the technical solution adopted in the utility model is: a kind of probe in detecting tool, comprise circuit-under-test plate, probe unit and connector, described probe unit comprises dials, probe and drum, the draw-in groove blocking described probe is provided with in described dials, described probe diameter is set to 0.08mm, and 1/8th places of described probe bottom are provided with snap ring; Described drum is arranged on the below of described dials, the spring matched with described probe location is provided with in described drum, the bottom of described spring is electrically connected with described connector, and described probe is connected by being energized with described connector in press-in spring and then opening short-circuit detecting to circuit-under-test plate.By the diameter of probe is set to 0.08mm, make it can detect normally in the product of high-accuracy PCB, probe can high density distribute, and makes it detect more efficiently; The bottom of probe is provided with snap ring, and snap ring can control the prominent amount of probe preferably, and what probe was fixed is more stable, avoids it to drop, it also avoid the product weighing wounded or damage and will test, effectively improve the yields of test.
Further, described dials is set to the plate construction of storehouse, and it comprises panel, wall, guide layer and gear needle layer, the structure of Multilayer stack taked by dials, substitute traditional black collodion with this, decrease the resistance that probe runs up and down, probe is run more smooth and easy.
Further, described dials also comprises an adjustable plate for subsequent use, with the height regulating probe to expose described panel.
Further, between described dials adjacent two layers, be provided with copper pillar, be connected with copper pillar and closely sealed, make dials more firm, the controlled range of sheet material tolerance also can be made less, ensure that the overhang of probe, effectively control pin trace.
Further, the surface of described spring is coated with a Gold plated Layer, to strengthen the conductance of spring.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present embodiment.
In figure:
1-circuit-under-test plate; 2-probe unit; 3-connector; 4-dials; 5-probe; 6-drum; 7-draw-in groove; 8-snap ring; 9-spring.
Embodiment
Below in conjunction with accompanying drawing, preferred embodiment of the present utility model is described in detail, to make advantage of the present utility model and feature can be easier to be readily appreciated by one skilled in the art, thus more explicit defining is made to protection domain of the present utility model.
Shown in accompanying drawing 1, a kind of probe in detecting tool of the present embodiment, comprise circuit-under-test plate 1, probe unit 2 and connector 3, probe unit 1 comprises dials 4, probe 5 and drum 6, the draw-in groove 7 blocking probe 5 is provided with in dials 4, dials 4 is set to the plate construction of Multilayer stack, can reduce the resistance that probe about 5 runs, and probe 5 is run more smooth and easy; Dials 4 comprises panel, wall, adjustable plate for subsequent use, guide layer and gear needle layer, panel is positioned at top-down ground floor, for test point alignment layers, wall and guide layer are provided with six layers, wall and guide layer intert and arrange, and adjustable plate for subsequent use is arranged between panel and the wall of the top, with the height regulating probe 5 to expose panel, gear needle layer is positioned at orlop, prevents probe 5 from dropping; Be provided with copper pillar between dials 4 adjacent two layers, be connected with copper pillar and closely sealed, make dials 4 more firm, the controlled range of sheet material tolerance also can be made less, ensure that the overhang of probe 5, effectively control pin trace.Probe 5 diameter is set to 0.08mm, makes it can detect normally in the product of high-accuracy PCB, and probe 5 can high density distribute, and makes it detect more efficiently; / 8th places of probe 5 bottom are provided with snap ring 8, and snap ring 8 can control the prominent amount of probe 5 preferably, and what probe 5 was fixed is more stable, avoids it to drop, it also avoid the product weighing wounded or damage and will test, improve the yields of test; Drum 6 is arranged on the below of dials 4, the spring 9 matched with probe 5 position is provided with in drum 6, the surface of spring 9 is coated with a Gold plated Layer, to strengthen the conductance of spring 9, the bottom of spring 9 is electrically connected with connector 3, probe 5 is connected by being energized with connector 3 in press-in spring 9, and then opens short-circuit detecting to circuit-under-test plate 1.
Above embodiment is only for illustrating technical conceive of the present utility model and feature; its object is to allow person skilled in the art understand content of the present utility model and to be implemented; protection domain of the present utility model can not be limited with this; all equivalences done according to the utility model Spirit Essence change or modify, and all should be encompassed in protection domain of the present utility model.
Claims (5)
1. a probe in detecting tool, comprise circuit-under-test plate (1), probe unit (2) and connector (3), it is characterized in that: described probe unit (2) comprises dials (4), probe (5) and drum (6), the draw-in groove (7) blocking described probe (5) is provided with in described dials (4), described probe (5) diameter is set to 0.08mm, and 1/8th places of described probe (5) bottom are provided with snap ring (8); Described drum (6) is arranged on the below of described dials (4), the spring (9) matched with described probe (5) position is provided with in described drum (6), the bottom of described spring (9) is electrically connected with described connector (3), and described probe (5) is connected by being energized with described connector (3) in press-in spring (9) and then opening short-circuit detecting to circuit-under-test plate (1).
2. a kind of probe in detecting tool according to claim 1, it is characterized in that: described dials (4) is set to the plate construction of storehouse, it comprises panel, wall, guide layer and gear needle layer.
3. a kind of probe in detecting tool according to claim 2, is characterized in that: described dials (4) also comprises an adjustable plate for subsequent use, with the height regulating probe to expose described panel.
4. a kind of probe in detecting tool according to claim 3, is characterized in that: be provided with copper pillar between described dials (4) adjacent two layers.
5. a kind of probe in detecting tool according to claim 1, is characterized in that: the surface of described spring (9) is coated with a Gold plated Layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520447950.9U CN204758649U (en) | 2015-06-26 | 2015-06-26 | Probe detection tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520447950.9U CN204758649U (en) | 2015-06-26 | 2015-06-26 | Probe detection tool |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204758649U true CN204758649U (en) | 2015-11-11 |
Family
ID=54473344
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520447950.9U Expired - Fee Related CN204758649U (en) | 2015-06-26 | 2015-06-26 | Probe detection tool |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204758649U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107543943A (en) * | 2016-06-29 | 2018-01-05 | 大族激光科技产业集团股份有限公司 | A kind of compound micropin measurement jig |
| WO2019062207A1 (en) * | 2017-09-30 | 2019-04-04 | 南京协辰电子科技有限公司 | Impedance test probe and pcb impedance test machine |
| CN110297109A (en) * | 2019-07-16 | 2019-10-01 | 苏州奥金斯电子有限公司 | A kind of test fixture core needle plate |
| CN112767864A (en) * | 2021-01-15 | 2021-05-07 | 深圳市韦德勋光电科技有限公司 | Debugging device of LCD logic board control module and use method |
| CN114252838A (en) * | 2021-12-23 | 2022-03-29 | 西安交通大学 | MEMS vertical probe comprehensive test platform and test method |
-
2015
- 2015-06-26 CN CN201520447950.9U patent/CN204758649U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107543943A (en) * | 2016-06-29 | 2018-01-05 | 大族激光科技产业集团股份有限公司 | A kind of compound micropin measurement jig |
| CN107543943B (en) * | 2016-06-29 | 2020-03-17 | 大族激光科技产业集团股份有限公司 | Compound micropin test fixture |
| WO2019062207A1 (en) * | 2017-09-30 | 2019-04-04 | 南京协辰电子科技有限公司 | Impedance test probe and pcb impedance test machine |
| CN110297109A (en) * | 2019-07-16 | 2019-10-01 | 苏州奥金斯电子有限公司 | A kind of test fixture core needle plate |
| CN112767864A (en) * | 2021-01-15 | 2021-05-07 | 深圳市韦德勋光电科技有限公司 | Debugging device of LCD logic board control module and use method |
| CN114252838A (en) * | 2021-12-23 | 2022-03-29 | 西安交通大学 | MEMS vertical probe comprehensive test platform and test method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN204758649U (en) | Probe detection tool | |
| CN103743974A (en) | Reliability test board and CAF resistance performance test method of printed circuit board | |
| CN103983809A (en) | PCB and online testing structure thereof, and manufacturing method of online testing structure | |
| CN203249984U (en) | Tool for detecting open circuit and short circuit of flexible circuit board | |
| CN106597247A (en) | Measuring system for volt-ampere characteristic curve of radiation effect semiconductor device based on four-probe method | |
| CN206450788U (en) | Radiation effect semiconductor devices VA characteristic curve measuring system based on four leads methods | |
| CN204740323U (en) | Automatic insulating four terminal detection tool of probe counterpoint | |
| CN207366636U (en) | Battery pole piece resistance testing device | |
| CN204989253U (en) | Novel probe detection tool | |
| CN105021919B (en) | Capacitance plate test card, test macro | |
| CN203658413U (en) | ICT needle bed | |
| CN203707354U (en) | Terminal row | |
| CN203117344U (en) | On/off tester capable of detecting omitted hole | |
| CN205643569U (en) | Device of test cell -phone card signal | |
| CN205049623U (en) | A test needle bed for circuit board | |
| CN206505106U (en) | A kind of universal fine probe test tool | |
| CN205920191U (en) | PI reinforcement of flexible line way board is leaked and is pasted detection device | |
| CN203859930U (en) | PCB with impedance test circuit | |
| CN205176235U (en) | Battery measurement testing arrangement | |
| CN204807647U (en) | Test panel and testing arrangement are surveyed to cell -phone cassette | |
| CN201355367Y (en) | Test probe | |
| CN201804061U (en) | Current temperature rise detection device for copper foil of circuit board | |
| CN206387895U (en) | A kind of wire rod integration test measuring device | |
| CN204650860U (en) | A kind of modulus electricity experiment table | |
| CN206818812U (en) | The die assembly of calibrating terminal port electric conductivity |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20151111 |