CN105652088B - The test device of external interface contact impedance - Google Patents
The test device of external interface contact impedance Download PDFInfo
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- CN105652088B CN105652088B CN201410641558.8A CN201410641558A CN105652088B CN 105652088 B CN105652088 B CN 105652088B CN 201410641558 A CN201410641558 A CN 201410641558A CN 105652088 B CN105652088 B CN 105652088B
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- external interface
- contact impedance
- male connector
- test
- printed circuit
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Abstract
A kind of test device of external interface contact impedance, it includes:Printed circuit jig plate;Several pads, it is arranged on the printed circuit jig plate in order;At least one male connector end connecting interface, it is fixed on the printed circuit jig plate, and each terminal of male connector end connecting interface is adapted with each pin of external interface to be measured;Some copper conductors, respectively the copper conductor one end electric connection pad, the other end are electrically connected the terminal of male connector end connecting interface.The test device of the external interface contact impedance of the present invention can accurately measure the contact impedance of external interface, and not have the phenomenon of test leakage pin.
Description
【Technical field】
The present invention relates to the measuring technology of contact impedance, and in particular to a kind of test device of external interface contact impedance.
【Background technology】
, it is necessary to test the performance of external interface after the completion of printed circuit board (PCB) (PCB) manufacture, and the contact of external interface hinders
Anti- is one of important detection project, by coordinating male connector end connecting interface to test the contact impedance of external interface, so as to detect
Whether resistance value, conduction between external interface and docking point meet code requirement, whether there is excessive internal intervention or gap.
For example, refering to Figure 1, its be prior art external interface contact impedance test device schematic diagram, surveying
Examination HDMI, Video, e SATA are when external interface 10, it is necessary to coordinate universal male connector end connecting interface 20 to carry out contact impedance
Test, and universal male connector end connecting interface 20 is typically all with cable 22.After adaptation, a spy of microhm tester is used
Pin tests the pin 11 of external interface 10, and another 20 corresponding terminal 21 of probe test male connector end connecting interface, obtains external connect
The contact impedance of 10 pins 11 of mouth, by judging whether contact impedance exceedes Maximum Contact impedance value, so as to judge external interface
It is whether up to specification.
However, when the prior art is tested, universal male connector end connecting interface 20 generally can all have a cable 22, and cable 22
There are larger impedance, impedance to reach more than 30m Ω, increase test result for itself, it is therefore desirable to estimates the resistance of of cable 22 itself
It is anti-, the contact impedance of each pin 11 of external interface 10 is then calculated, test accuracy is not high;And since external interface 10 is each
Pin 11 and each terminal of male connector end connecting interface 20 21 are asymmetric, it is not easy to it is accurate find each pin 11 of external interface 10 pair
The each terminal 21 answered, has the pin 11 of test leakage.
In view of this, it is really necessary to develop a kind of test device of external interface contact impedance, to solve the above problems.
【The content of the invention】
It is therefore an object of the present invention to a kind of test device of external interface contact impedance is provided, external interface contact
The test device of impedance can accurately measure the contact impedance of external interface, and not have the phenomenon of test leakage pin.
In order to achieve the above object, the test device of external interface contact impedance of the present invention, it includes:
Printed circuit jig plate;
Several pads, it is arranged on the printed circuit jig plate in order;
At least one male connector end connecting interface, it is fixed on the printed circuit jig plate, and the male connector end connects
Each terminal of mouth is adapted with each pin of external interface to be measured;
Some copper conductors, respectively the copper conductor one end electric connection pad, the other end are electrically connected the male connector end
The terminal of connecting interface.
It is preferred that the quantity of the pad is 19.
It is preferred that the copper conductor corresponding to different male connector end connecting interfaces is different arranged on the printed circuit jig plate
On insulating layer.
Compared to the prior art, the test device of external interface contact impedance of the invention, by the way that male connector end is connect
Mouth is fixed on printed circuit jig plate, and the terminal of male connector end connecting interface is connected to pad using low-impedance copper conductor
On, copper conductor impedance only has several microhms, and impedance is small, and error is small, and test is accurate;In test, need to only be tested using microhm
One probe test external interface pin of instrument, the corresponding pad of another probe test pin, it is not necessary to find pin again
Corresponding terminal, therefore the pin of test leakage is not had.
【Brief description of the drawings】
Fig. 1 illustrates the test device schematic diagram of prior art external interface contact impedance.
Fig. 2 illustrates the test device schematic diagram of external interface contact impedance of the present invention.
【Embodiment】
Refer to shown in Fig. 2, it depicts the test device schematic diagram of external interface contact impedance of the present invention.
In this present embodiment, the test device of external interface contact impedance of the present invention, it is each for testing external interface 10
The contact impedance of pin 11, the test device of the external interface contact impedance include:
Printed circuit jig plate 100;
Several pads 101, it is arranged on the printed circuit jig plate 100 in order, is tested for convenience, institute
It is larger pad point to state pad 101;
At least one male connector end connecting interface 102, it is fixed on the printed circuit jig plate 100, the male connector end
Each terminal 103 of connecting interface 102 is adapted with each pin 11 of external interface 10 to be measured;
Some copper conductors 104, respectively 104 one end of the copper conductor electric connection pad 101, the other end are electrically connected institute
State the terminal 103 of male connector end connecting interface 102.
Wherein, in order to test different external interfaces 10, such as HDMI is 19 pins, and Video is 15 pins,
USB3.0 is 9 pins, therefore the quantity of the pad 101 is set to 19.
Wherein, the winding displacement on printed circuit jig plate 100 for convenience, corresponding to different male connector end connecting interfaces 102
Copper conductor 104 be arranged on the different insulating layer of the printed circuit jig plate 100.
The test device of the external interface contact impedance of the present invention, common male connector end connecting interface 102 is welded and fixed
On printed circuit jig plate 100, low-impedance copper conductor will be used by each terminal 103 of fixed male connector connecting interface 100
104 draw and are extended down on pad 101.In test, the pin of a probe test external interface 10 of microhm tester need to be only used
11, the corresponding pad 101 of another probe test pin 11.
The present invention external interface contact impedance test device, on business the terminal 103 of head end connecting interface 102 use copper
Conducting wire 104 is connected on pad 101, and 104 impedance of copper conductor only has a few m Ω, and impedance is small, and error is small, and test is accurate;And surveying
During examination, it is not necessary to find the terminal 103 corresponding to the pin 11 of external interface 10 again, therefore do not have the pin 11 of test leakage.
Claims (3)
- A kind of 1. test device of external interface contact impedance, it is characterised in that the test dress of the external interface contact impedance Put including:Printed circuit jig plate;Several pads, it is arranged on the printed circuit jig plate in order;At least one male connector end connecting interface, it is fixed on the printed circuit jig plate, male connector end connecting interface Each terminal is adapted with each pin of external interface to be measured;Some copper conductors, respectively the copper conductor one end electric connection pad, the other end are electrically connected the male connector end connection The terminal of interface;In test, a probe test external interface pin of microhm tester, another probe test pin pair need to be only used The pad answered.
- 2. the test device of external interface contact impedance according to claim 1, it is characterised in that the quantity of the pad For 19.
- 3. the test device of external interface contact impedance according to claim 1, it is characterised in that different male connector ends connects Copper conductor corresponding to connection interface is arranged on the different insulating layer of the printed circuit jig plate.
Priority Applications (1)
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CN201410641558.8A CN105652088B (en) | 2014-11-14 | 2014-11-14 | The test device of external interface contact impedance |
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CN201410641558.8A CN105652088B (en) | 2014-11-14 | 2014-11-14 | The test device of external interface contact impedance |
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CN105652088A CN105652088A (en) | 2016-06-08 |
CN105652088B true CN105652088B (en) | 2018-04-20 |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN112034209A (en) * | 2019-05-15 | 2020-12-04 | 神讯电脑(昆山)有限公司 | USB interface antistatic test fixture |
CN110554240A (en) * | 2019-09-09 | 2019-12-10 | Oppo(重庆)智能科技有限公司 | Impedance detection circuit and method for charging interface and terminal equipment |
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JP2001281282A (en) * | 2000-03-28 | 2001-10-10 | Matsushita Electric Works Ltd | Probe for impedance measurement |
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CN1494659A (en) * | 2001-03-15 | 2004-05-05 | 爱德旺太斯特株式会社 | Universal test interface between device undr test and test head |
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CN202383974U (en) * | 2011-08-29 | 2012-08-15 | 冀雅(廊坊)电子有限公司 | General liquid crystal module test board |
CN202837453U (en) * | 2012-08-16 | 2013-03-27 | 神讯电脑(昆山)有限公司 | Network interface monomer test device |
CN203324437U (en) * | 2013-05-03 | 2013-12-04 | 东信和平科技股份有限公司 | Debugging tool for miniature circuit board and data downloading tool |
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