CN204302384U - The testing arrangement of external interface contact impedance - Google Patents
The testing arrangement of external interface contact impedance Download PDFInfo
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- CN204302384U CN204302384U CN201420679408.1U CN201420679408U CN204302384U CN 204302384 U CN204302384 U CN 204302384U CN 201420679408 U CN201420679408 U CN 201420679408U CN 204302384 U CN204302384 U CN 204302384U
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- 238000012360 testing method Methods 0.000 title claims abstract description 41
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052802 copper Inorganic materials 0.000 claims abstract description 9
- 239000010949 copper Substances 0.000 claims abstract description 9
- 239000004020 conductor Substances 0.000 claims 3
- 230000004888 barrier function Effects 0.000 claims 1
- 150000001879 copper Chemical class 0.000 claims 1
- 229910000679 solder Inorganic materials 0.000 abstract 1
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- 238000010586 diagram Methods 0.000 description 4
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- 238000003032 molecular docking Methods 0.000 description 1
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Abstract
一种外置接口接触阻抗的测试装置,其包括:印刷电路治具板;若干个焊盘,其按顺序排列设于所述印刷电路治具板上;至少一个公头端连接接口,其固定于所述印刷电路治具板上,所述公头端连接接口的各个端子与待测外置接口的各个引脚相适配;若干条铜导线,各该铜导线一端电性连接所述焊盘,另一端电性连接所述公头端连接接口的端子。本实用新型的外置接口接触阻抗的测试装置能够准确测出外置接口的接触阻抗,且不会有漏测引脚的现象。
A test device for contact impedance of an external interface, which includes: a printed circuit fixture board; several pads arranged in sequence on the printed circuit fixture board; at least one male end connected to the interface, which is fixed On the printed circuit fixture board, each terminal of the male end connection interface is adapted to each pin of the external interface to be tested; several copper wires, one end of each copper wire is electrically connected to the solder plate, and the other end is electrically connected to the terminal of the male end connection interface. The test device for the contact impedance of the external interface of the utility model can accurately measure the contact impedance of the external interface, and there is no phenomenon of missing pins.
Description
【技术领域】【Technical field】
本实用新型涉及接触阻抗的测试技术,具体涉及一种外置接口接触阻抗的测试装置。The utility model relates to a testing technology of contact impedance, in particular to a testing device for contact impedance of an external interface.
【背景技术】【Background technique】
在印刷电路板(PCB)制造完成后,需要测试外置接口的性能,而外置接口的接触阻抗是重要的检测项目之一,通过配合公头端连接接口测试外置接口的接触阻抗,从而检测外置接口与对接点间的电阻数值、导通性是否符合规范要求,有无过大的内部干涉或空隙。After the printed circuit board (PCB) is manufactured, it is necessary to test the performance of the external interface, and the contact impedance of the external interface is one of the important detection items. The contact impedance of the external interface is tested by cooperating with the male end connection interface, so that Check whether the resistance value and continuity between the external interface and the docking point meet the specification requirements, and whether there is excessive internal interference or gap.
例如,请参阅图1所示,其为现有技术外置接口接触阻抗的测试装置示意图,在测试HDMI、Video、e SATA等外置接口10时,需要配合通用型公头端连接接口20进行接触阻抗测试,而通用型公头端连接接口20一般都是带线缆22的。适配后,使用微欧姆测试仪的一探针测试外置接口10的引脚11,另一探针测试公头端连接接口20对应的端子21,得到外置接口10引脚11的接触阻抗,通过判断接触阻抗是否超过最大接触阻抗值,从而判断外置接口是否符合规格。For example, please refer to shown in Figure 1, which is a schematic diagram of a testing device for the contact impedance of an external interface in the prior art. When testing external interfaces 10 such as HDMI, Video, and e SATA, it is necessary to cooperate with a universal male end connection interface 20. Contact impedance test, and the general-purpose male end connection interface 20 is generally equipped with a cable 22 . After adaptation, use one probe of the micro-ohm tester to test pin 11 of the external interface 10, and the other probe to test the corresponding terminal 21 of the male end connection interface 20 to obtain the contact impedance of pin 11 of the external interface 10 , by judging whether the contact impedance exceeds the maximum contact impedance value, so as to judge whether the external interface meets the specification.
然而,现有技术测试时,通用型的公头端连接接口20一般都会有线缆22,而线缆22本身存在较大的阻抗,阻抗达30mΩ以上,使测试结果增大,因此需要估算线缆22本身的阻抗,然后计算出外置接口10各引脚11的接触阻抗,测试准确度不高;而且由于外置接口10各引脚11和公头端连接接口20的各端子21不对称,不容易准确找到外置接口10各引脚11所对应的各个端子21,会有漏测的引脚11。However, when testing the prior art, the general-purpose male end connection interface 20 generally has a cable 22, and the cable 22 itself has a relatively large impedance, which can reach more than 30mΩ, which increases the test result, so it is necessary to estimate the cable 22. The impedance of the cable 22 itself, and then calculate the contact impedance of each pin 11 of the external interface 10, the test accuracy is not high; It is not easy to accurately find the respective terminals 21 corresponding to the respective pins 11 of the external interface 10 , and there may be missing pins 11 .
有鉴于此,实有必要开发一种外置接口接触阻抗的测试装置,以解决上述问题。In view of this, it is necessary to develop a test device for external interface contact impedance to solve the above problems.
【发明内容】【Content of invention】
因此,本实用新型的目的是提供一种外置接口接触阻抗的测试装置,该外置接口接触阻抗的测试装置能够准确测出外置接口的接触阻抗,且不会有漏测引脚的现象。Therefore, the purpose of this utility model is to provide a test device for contact impedance of an external interface, which can accurately measure the contact impedance of an external interface without missing pins. .
为了达到上述目的,本实用新型外置接口接触阻抗的测试装置,其包括:In order to achieve the above object, the test device of the external interface contact impedance of the utility model comprises:
印刷电路治具板;Printed circuit fixture board;
若干个焊盘,其按顺序排列设于所述印刷电路治具板上;a plurality of pads arranged in sequence on the printed circuit fixture board;
至少一个公头端连接接口,其固定于所述印刷电路治具板上,所述公头端连接接口的各个端子与待测外置接口的各个引脚相适配;At least one male end connection interface, which is fixed on the printed circuit fixture board, and each terminal of the male end connection interface is adapted to each pin of the external interface to be tested;
若干条铜导线,各该铜导线一端电性连接所述焊盘,另一端电性连接所述公头端连接接口的端子。A plurality of copper wires, one end of each copper wire is electrically connected to the pad, and the other end is electrically connected to the terminal of the male end connection interface.
较佳地,所述焊盘的数量为19个。Preferably, the number of the pads is 19.
较佳地,不同的公头端连接接口所对应的铜导线设于所述印刷电路治具板不同的绝缘层上。Preferably, the copper wires corresponding to different male end connection interfaces are arranged on different insulating layers of the printed circuit fixture board.
相较于现有技术,本实用新型的外置接口接触阻抗的测试装置,通过将公头端连接接口固定在印刷电路治具板上,将公头端连接接口的端子使用低阻抗的铜导线连接至焊盘上,铜导线阻抗只有几微欧姆,阻抗小,误差小,测试准确;在测试时,只需使用微欧姆测试仪的一探针测试外置接口引脚,另一探针测试引脚对应的焊盘即可,不需要重新寻找引脚所对应的端子,因此不会有漏测的引脚。Compared with the prior art, the external interface contact impedance testing device of the present utility model fixes the male end connection interface on the printed circuit fixture board, and uses low-impedance copper wires for the terminals of the male end connection interface. Connected to the pad, the impedance of the copper wire is only a few micro-ohms, the impedance is small, the error is small, and the test is accurate; when testing, you only need to use one probe of the micro-ohm tester to test the external interface pin, and the other probe to test The pads corresponding to the pins are sufficient, and there is no need to search for the terminals corresponding to the pins again, so there will be no missing pins.
【附图说明】【Description of drawings】
图1绘示现有技术外置接口接触阻抗的测试装置示意图。FIG. 1 is a schematic diagram of a test device for contact impedance of an external interface in the prior art.
图2绘示本实用新型外置接口接触阻抗的测试装置示意图。FIG. 2 is a schematic diagram of a test device for contact impedance of an external interface of the present invention.
【具体实施方式】【Detailed ways】
请参阅图2所示,其绘示了本实用新型外置接口接触阻抗的测试装置示意图。Please refer to FIG. 2 , which shows a schematic diagram of a test device for contact impedance of an external interface of the present invention.
于本实施例中,本实用新型外置接口接触阻抗的测试装置,用于测试外置接口10各个引脚11的接触阻抗,所述外置接口接触阻抗的测试装置包括:In this embodiment, the test device of the external interface contact impedance of the utility model is used to test the contact impedance of each pin 11 of the external interface 10, and the test device of the external interface contact impedance includes:
印刷电路治具板100;Printed circuit fixture board 100;
若干个焊盘101,其按顺序排列设于所述印刷电路治具板100上,为了方便测试,所述焊盘101为较大的焊盘点;Several pads 101 are arranged in sequence on the printed circuit fixture board 100, and for the convenience of testing, the pads 101 are larger pad points;
至少一个公头端连接接口102,其固定于所述印刷电路治具板100上,所述公头端连接接口102的各个端子103与待测外置接口10的各个引脚11相适配;At least one male end connection interface 102, which is fixed on the printed circuit fixture board 100, each terminal 103 of the male end connection interface 102 is adapted to each pin 11 of the external interface 10 to be tested;
若干条铜导线104,各该铜导线104一端电性连接所述焊盘101,另一端电性连接所述公头端连接接口102的端子103。A plurality of copper wires 104 , one end of each copper wire 104 is electrically connected to the pad 101 , and the other end is electrically connected to the terminal 103 of the male end connection interface 102 .
其中,为了测试不同的外置接口10,例如HDMI为19个引脚,Video为15个引脚,USB3.0为9个引脚,因此所述焊盘101的数量设为19个。Wherein, in order to test different external interfaces 10 , for example, HDMI has 19 pins, Video has 15 pins, and USB3.0 has 9 pins, so the number of pads 101 is set to 19.
其中,为了方便在印刷电路治具板100上排线,不同的公头端连接接口102所对应的铜导线104设于所述印刷电路治具板100不同的绝缘层上。Wherein, in order to facilitate wiring on the printed circuit fixture board 100 , the copper wires 104 corresponding to different male end connection interfaces 102 are provided on different insulating layers of the printed circuit fixture board 100 .
本实用新型的外置接口接触阻抗的测试装置,将常用的公头端连接接口102焊接固定在印刷电路治具板100上,将被固定的公头连接接口100的各端子103使用低阻抗的铜导线104引延至焊盘101上。在测试时,只需使用微欧姆测试仪的一探针测试外置接口10的引脚11,另一探针测试引脚11对应的焊盘101即可。In the test device for external interface contact impedance of the present utility model, the commonly used male end connection interface 102 is welded and fixed on the printed circuit fixture board 100, and each terminal 103 of the fixed male end connection interface 100 uses a low-impedance The copper wire 104 is extended to the bonding pad 101 . During testing, it is only necessary to use one probe of the micro-ohm tester to test the pin 11 of the external interface 10 , and the other probe to test the pad 101 corresponding to the pin 11 .
本实用新型的外置接口接触阻抗的测试装置,因公头端连接接口102的端子103使用铜导线104连接至焊盘101上,铜导线104阻抗只有几mΩ,阻抗小,误差小,测试准确;而且在测试时,不需要重新寻找外置接口10的引脚11所对应的端子103,因此不会有漏测的引脚11。The external interface contact impedance testing device of the present utility model, because the terminal 103 of the male head end connection interface 102 is connected to the pad 101 by a copper wire 104, the impedance of the copper wire 104 is only a few mΩ, the impedance is small, the error is small, and the test is accurate and during the test, there is no need to search for the terminal 103 corresponding to the pin 11 of the external interface 10 again, so there will be no missing pin 11.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105652088A (en) * | 2014-11-14 | 2016-06-08 | 神讯电脑(昆山)有限公司 | External interface contact impedance test apparatus |
CN110596616A (en) * | 2019-10-12 | 2019-12-20 | 上海泽丰半导体科技有限公司 | Power supply impedance test method and circuit board |
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2014
- 2014-11-14 CN CN201420679408.1U patent/CN204302384U/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105652088A (en) * | 2014-11-14 | 2016-06-08 | 神讯电脑(昆山)有限公司 | External interface contact impedance test apparatus |
CN105652088B (en) * | 2014-11-14 | 2018-04-20 | 神讯电脑(昆山)有限公司 | The test device of external interface contact impedance |
CN110596616A (en) * | 2019-10-12 | 2019-12-20 | 上海泽丰半导体科技有限公司 | Power supply impedance test method and circuit board |
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Granted publication date: 20150429 Termination date: 20191114 |