TWI453429B - 具有極性之電容器之極性辨別裝置及包含其之特性整理系統 - Google Patents
具有極性之電容器之極性辨別裝置及包含其之特性整理系統 Download PDFInfo
- Publication number
- TWI453429B TWI453429B TW100108178A TW100108178A TWI453429B TW I453429 B TWI453429 B TW I453429B TW 100108178 A TW100108178 A TW 100108178A TW 100108178 A TW100108178 A TW 100108178A TW I453429 B TWI453429 B TW I453429B
- Authority
- TW
- Taiwan
- Prior art keywords
- polarity
- capacitor
- voltage
- reverse
- voltages
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 claims description 247
- 238000007599 discharging Methods 0.000 claims description 14
- 238000005259 measurement Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 6
- 230000003321 amplification Effects 0.000 description 5
- 238000003199 nucleic acid amplification method Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000012925 reference material Substances 0.000 description 1
- 235000015096 spirit Nutrition 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/14—Indicating direction of current; Indicating polarity of voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Theoretical Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020100104071A KR101287679B1 (ko) | 2010-10-25 | 2010-10-25 | 유극성 콘덴서의 극성 판별 장치 및 이를 포함하는 특성 선별 시스템 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201217797A TW201217797A (en) | 2012-05-01 |
TWI453429B true TWI453429B (zh) | 2014-09-21 |
Family
ID=46263154
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100108178A TWI453429B (zh) | 2010-10-25 | 2011-03-10 | 具有極性之電容器之極性辨別裝置及包含其之特性整理系統 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5367751B2 (ko) |
KR (1) | KR101287679B1 (ko) |
TW (1) | TWI453429B (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115267617B (zh) * | 2022-08-03 | 2023-06-20 | 深圳市新中元电子有限公司 | 一种铝电解电容器的极性方向判定方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49129608A (ko) * | 1973-04-17 | 1974-12-12 | ||
JPS57128857A (en) * | 1981-02-02 | 1982-08-10 | Matsuo Denki Kk | Detecting method for leakage current and/or polarity of capacitor |
JP2000173880A (ja) * | 1998-12-03 | 2000-06-23 | Okano Denki Kk | 電解コンデンサの極性判定方法および装置 |
TW515897B (en) * | 2000-02-16 | 2003-01-01 | Chroma Ate Inc | Detecting method and device of the object to be tested in DC high-voltage testing system |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59203966A (ja) * | 1983-05-06 | 1984-11-19 | Toshiba Corp | コンデンサの極性判別回路 |
JPS63119216A (ja) * | 1986-11-06 | 1988-05-23 | 日置電機株式会社 | 電解コンデンサの極性判別方法及びその装置 |
JPH0732106B2 (ja) * | 1986-11-20 | 1995-04-10 | 日置電機株式会社 | 有極性コンデンサの極性判別方法 |
JPH05209919A (ja) * | 1991-03-20 | 1993-08-20 | Hitachi Aic Inc | 有極性コンデンサの極性検出方法 |
KR0133067Y1 (ko) * | 1993-04-30 | 1998-12-15 | 김광호 | 전해콘덴서의 극성체크 회로 |
KR950023987A (ko) * | 1994-01-18 | 1995-08-21 | 이대원 | 전해 콘덴서 오삽 판별 장치 및 방법 |
JP3325869B2 (ja) * | 2000-01-24 | 2002-09-17 | アデックス株式会社 | 有極電解コンデンサ極性判定装置 |
-
2010
- 2010-10-25 KR KR1020100104071A patent/KR101287679B1/ko not_active IP Right Cessation
-
2011
- 2011-03-10 TW TW100108178A patent/TWI453429B/zh not_active IP Right Cessation
- 2011-03-31 JP JP2011077567A patent/JP5367751B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49129608A (ko) * | 1973-04-17 | 1974-12-12 | ||
JPS57128857A (en) * | 1981-02-02 | 1982-08-10 | Matsuo Denki Kk | Detecting method for leakage current and/or polarity of capacitor |
JP2000173880A (ja) * | 1998-12-03 | 2000-06-23 | Okano Denki Kk | 電解コンデンサの極性判定方法および装置 |
TW515897B (en) * | 2000-02-16 | 2003-01-01 | Chroma Ate Inc | Detecting method and device of the object to be tested in DC high-voltage testing system |
Also Published As
Publication number | Publication date |
---|---|
TW201217797A (en) | 2012-05-01 |
JP2012094808A (ja) | 2012-05-17 |
KR101287679B1 (ko) | 2013-07-24 |
JP5367751B2 (ja) | 2013-12-11 |
KR20120042390A (ko) | 2012-05-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |